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JP6937647B2 - 光学表示パネルの損傷検査方法 - Google Patents

光学表示パネルの損傷検査方法 Download PDF

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Publication number
JP6937647B2
JP6937647B2 JP2017187930A JP2017187930A JP6937647B2 JP 6937647 B2 JP6937647 B2 JP 6937647B2 JP 2017187930 A JP2017187930 A JP 2017187930A JP 2017187930 A JP2017187930 A JP 2017187930A JP 6937647 B2 JP6937647 B2 JP 6937647B2
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Japan
Prior art keywords
panel
edge
light
optical display
display panel
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JP2017187930A
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English (en)
Japanese (ja)
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JP2019060823A (ja
Inventor
田村　宜之
宜之 田村
知広 原
知広 原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
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Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to JP2017187930A priority Critical patent/JP6937647B2/ja
Priority to KR1020197037780A priority patent/KR102495565B1/ko
Priority to CN201880048168.6A priority patent/CN110945347B/zh
Priority to PCT/JP2018/004177 priority patent/WO2019064622A1/ja
Priority to TW107122468A priority patent/TWI779055B/zh
Publication of JP2019060823A publication Critical patent/JP2019060823A/ja
Application granted granted Critical
Publication of JP6937647B2 publication Critical patent/JP6937647B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2017187930A 2017-09-28 2017-09-28 光学表示パネルの損傷検査方法 Active JP6937647B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2017187930A JP6937647B2 (ja) 2017-09-28 2017-09-28 光学表示パネルの損傷検査方法
KR1020197037780A KR102495565B1 (ko) 2017-09-28 2018-02-07 광학 표시 패널의 손상 검사 방법
CN201880048168.6A CN110945347B (zh) 2017-09-28 2018-02-07 光学显示面板的损伤检查方法
PCT/JP2018/004177 WO2019064622A1 (ja) 2017-09-28 2018-02-07 光学表示パネルの損傷検査方法
TW107122468A TWI779055B (zh) 2017-09-28 2018-06-29 光學顯示面板的損傷檢查方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017187930A JP6937647B2 (ja) 2017-09-28 2017-09-28 光学表示パネルの損傷検査方法

Publications (2)

Publication Number Publication Date
JP2019060823A JP2019060823A (ja) 2019-04-18
JP6937647B2 true JP6937647B2 (ja) 2021-09-22

Family

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Family Applications (1)

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JP2017187930A Active JP6937647B2 (ja) 2017-09-28 2017-09-28 光学表示パネルの損傷検査方法

Country Status (5)

Country Link
JP (1) JP6937647B2 (zh)
KR (1) KR102495565B1 (zh)
CN (1) CN110945347B (zh)
TW (1) TWI779055B (zh)
WO (1) WO2019064622A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7030914B1 (ja) * 2020-08-27 2022-03-07 花王株式会社 シート状部材の製造方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3025946B2 (ja) * 1995-10-11 2000-03-27 茨城県 物体表面の粗さ測定方法及び装置
JPH11271035A (ja) * 1998-03-24 1999-10-05 Hitachi Metals Ltd 欠陥検査装置及び欠陥検査方法
US6628381B1 (en) * 2000-06-20 2003-09-30 Applied Materials, Inc. Optical inspection method and apparatus utilizing a collection angle design
JP4703911B2 (ja) * 2001-08-10 2011-06-15 日新製鋼株式会社 金属帯の孔状欠陥検査装置
JP2003247953A (ja) * 2002-02-25 2003-09-05 Seiko Epson Corp 液晶パネル外観検査方法及び検査装置
WO2004079352A1 (ja) * 2003-03-04 2004-09-16 Mitsuboshi Diamond Industrial Co. Ltd. 透明基板端面部の検査装置およびその検査方法
KR100418357B1 (ko) 2003-03-31 2004-02-14 (주)에이치아이티에스 엘시디(lcd) 패널의 측면검사장치 및 방법
WO2004088399A1 (en) * 2003-03-31 2004-10-14 Hits Co., Ltd. Lcd cell edge inspection apparatus and method thereof
JP4760029B2 (ja) * 2005-01-31 2011-08-31 アイシン精機株式会社 欠陥検査方法および欠陥検査装置
JP4626982B2 (ja) * 2005-02-10 2011-02-09 セントラル硝子株式会社 ガラス板の端面の欠陥検出装置および検出方法
JP5015824B2 (ja) * 2008-02-29 2012-08-29 日東電工株式会社 粘着フィルム位置検出器および粘着フィルム貼付装置
EP2515072A4 (en) * 2009-12-17 2016-05-11 Nippon Steel & Sumitomo Metal Corp DEVICE AND METHOD FOR TESTING A TUBULAR PRODUCT
JP5561178B2 (ja) * 2010-04-09 2014-07-30 新日鐵住金株式会社 表面欠陥検査装置、表面欠陥検査方法及びプログラム
JP2011257257A (ja) * 2010-06-09 2011-12-22 Panasonic Corp 検査装置、検査方法およびこれらを用いた画像表示用パネルの製造方法
JP6329397B2 (ja) * 2014-03-07 2018-05-23 株式会社ダイヘン 画像検査装置及び画像検査方法
CN204215118U (zh) * 2014-12-02 2015-03-18 北京兆维电子(集团)有限责任公司 液晶屏外观检测装置
JP6344290B2 (ja) * 2015-04-01 2018-06-20 東芝三菱電機産業システム株式会社 平面形状測定装置

Also Published As

Publication number Publication date
KR20200062081A (ko) 2020-06-03
TW201915481A (zh) 2019-04-16
CN110945347A (zh) 2020-03-31
CN110945347B (zh) 2024-01-12
WO2019064622A1 (ja) 2019-04-04
KR102495565B1 (ko) 2023-02-03
JP2019060823A (ja) 2019-04-18
TWI779055B (zh) 2022-10-01

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