JP6454599B2 - 研磨装置 - Google Patents
研磨装置 Download PDFInfo
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- JP6454599B2 JP6454599B2 JP2015098931A JP2015098931A JP6454599B2 JP 6454599 B2 JP6454599 B2 JP 6454599B2 JP 2015098931 A JP2015098931 A JP 2015098931A JP 2015098931 A JP2015098931 A JP 2015098931A JP 6454599 B2 JP6454599 B2 JP 6454599B2
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- polishing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
- B24B37/107—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement in a rotary movement only, about an axis being stationary during lapping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68764—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Description
そして、エア供給手段は、エア噴出口からエアを噴出させて桶部に溜まったスラリーを噴き上げるため、研磨パッドの研磨面にスラリーを循環供給することができる。よって、スラリーの使用量を少なくするとともに、効率よくスラリーを循環利用することができる。
桶部51にスラリー45が溜まったら、エア供給手段55がエア噴出口56からエアを噴出させて桶部51に溜まったスラリー45を噴き上げるため、研磨パッド25の研磨面25aにスラリー45を循環供給することができる。
したがって、スラリー45の使用量を必要最小限に抑えて、効率よくスラリー45を循環利用すること可能となる。
また、上記実施形態では、スラリー供給手段40からスラリーを供給し研磨パッドでウエーハを研磨しながら桶部51にスラリーを溜めるとしたが、研磨パッドをウエーハに接触させる前にスラリーを供給して桶部51、71に所定量のスラリーを溜めた後、研磨パッド25をウエーハに接触させエア供給手段55でエアを供給し研磨パッド25の研磨面25aにスラリー45を循環供給させてもよい。
4:モータ 5:回転軸 6:基台 7:コラム 8:加工位置センサ 9:位置決め部
10:Y軸方向送り手段 11:ボールネジ 12:軸受部 13:モータ
14:ガイドレール 15:移動台
20:研磨手段 21:スピンドル 22:ホルダ 23:モータ
24:マウント 25:研磨パッド 25a:研磨面 26:貫通孔
30:研磨送り手段 31:固定部 32:ボールネジ 33:モータ
34:ガイドレール 35:昇降板
40:スラリー供給手段 41:スラリー供給パイプ 42:供給口
43:バルブ 44:スラリー供給源 45:スラリー 45a:液溜まり
50:スラリー循環手段 51:桶部 52:側壁 53:底板 54:内側壁
55:エア供給手段 56:エア噴出口 57:エア供給源 58:バルブ
60:吸引源 61:バルブ
70:スラリー循環手段 71:桶部 72:ジャバラ部 73:底板 74:内側壁
75:昇降シリンダ 750:シリンダ 751:支持部 752:ピストン
76:エア供給手段 77:エア噴出口 78:バルブ 79:エア供給源
Claims (1)
- ウエーハを保持するチャックテーブルと、該チャックテーブルが保持するウエーハを研磨する研磨パッドを回転可能に装着するスピンドルを有し該研磨パッドの研磨面でウエーハを研磨する研磨手段と、該研磨パッドの該研磨面と該チャックテーブルが保持するウエーハの上面とにスラリーを供給するスラリー供給手段と、該チャックテーブルが保持するウエーハの上面に対して接近及び離間する方向に該研磨手段を研磨送りする研磨送り手段と、を備える研磨装置であって、
該チャックテーブルの下側で該スラリーを溜めて該研磨面に該スラリーを循環供給するスラリー循環手段を備え、
該スラリー循環手段は、該チャックテーブルが保持するウエーハに該研磨パッドの該研磨面を接触させた研磨位置における該研磨パッドと該チャックテーブルとを囲繞する側壁と該側壁の下部に連接し中央に該チャックテーブルを露出させる開口を有する底板と該開口の内周縁において立設する内側壁とにより構成される凹形状の桶部と、
該研磨パッドの該研磨面に向けてエアを噴出するエア噴出口を該桶部に溜められたスラリーの中に有するエア供給手段とを備え、
該エア噴出口から噴出するエアが該桶部に溜められた該スラリーを噴き上げて該研磨パッドの該研磨面に循環供給する研磨装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015098931A JP6454599B2 (ja) | 2015-05-14 | 2015-05-14 | 研磨装置 |
TW105110904A TWI665054B (zh) | 2015-05-14 | 2016-04-07 | 硏磨裝置 |
KR1020160057361A KR102305377B1 (ko) | 2015-05-14 | 2016-05-11 | 연마 장치 |
CN201610312950.7A CN106141902B (zh) | 2015-05-14 | 2016-05-12 | 研磨装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015098931A JP6454599B2 (ja) | 2015-05-14 | 2015-05-14 | 研磨装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2016215284A JP2016215284A (ja) | 2016-12-22 |
JP6454599B2 true JP6454599B2 (ja) | 2019-01-16 |
Family
ID=57353095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015098931A Active JP6454599B2 (ja) | 2015-05-14 | 2015-05-14 | 研磨装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6454599B2 (ja) |
KR (1) | KR102305377B1 (ja) |
CN (1) | CN106141902B (ja) |
TW (1) | TWI665054B (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7015667B2 (ja) * | 2017-10-02 | 2022-02-03 | 株式会社ディスコ | 研磨装置 |
JP7045212B2 (ja) * | 2018-02-08 | 2022-03-31 | 株式会社ディスコ | 研削装置 |
JP7032217B2 (ja) * | 2018-04-05 | 2022-03-08 | 株式会社ディスコ | 研磨装置 |
US11400563B2 (en) * | 2018-12-07 | 2022-08-02 | Disco Corporation | Processing method for disk-shaped workpiece |
JP7291056B2 (ja) | 2019-09-30 | 2023-06-14 | 株式会社ディスコ | ウェーハの研磨方法 |
Family Cites Families (22)
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JPS546676B1 (ja) | 1969-04-19 | 1979-03-30 | ||
US4923490A (en) * | 1988-12-16 | 1990-05-08 | General Electric Company | Novel grinding wheels utilizing polycrystalline diamond or cubic boron nitride grit |
JPH0752033A (ja) * | 1993-08-06 | 1995-02-28 | Sumitomo Metal Ind Ltd | 研磨装置 |
JP3384530B2 (ja) | 1996-03-25 | 2003-03-10 | 信越半導体株式会社 | 半導体ウェーハの研磨装置および研磨方法 |
JP3696690B2 (ja) * | 1996-04-23 | 2005-09-21 | 不二越機械工業株式会社 | ウェーハの研磨装置システム |
US5895550A (en) * | 1996-12-16 | 1999-04-20 | Micron Technology, Inc. | Ultrasonic processing of chemical mechanical polishing slurries |
US6152805A (en) * | 1997-07-17 | 2000-11-28 | Canon Kabushiki Kaisha | Polishing machine |
EP1089801A1 (en) * | 1998-06-18 | 2001-04-11 | Lucid Treatment Systems, Inc. | Method and apparatus for recovery of water and slurry abrasives used for chemical and mechanical planarization |
US6203413B1 (en) * | 1999-01-13 | 2001-03-20 | Micron Technology, Inc. | Apparatus and methods for conditioning polishing pads in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies |
EP1052059A3 (en) * | 1999-05-03 | 2001-01-24 | Applied Materials, Inc. | Method for chemical mechanical planarization |
US20020045349A1 (en) * | 2000-03-23 | 2002-04-18 | Rhoades Robert L. | Method for chemical-mechanical-polishing a substrate |
JP2001341063A (ja) * | 2000-06-02 | 2001-12-11 | Saafu System Kk | 平面研磨装置 |
JP4510362B2 (ja) * | 2001-11-30 | 2010-07-21 | 俊郎 土肥 | Cmp装置およびcmp方法 |
TWI235091B (en) * | 2002-10-04 | 2005-07-01 | Grand Plastic Technology Corp | CMP on line slurry recycled method and apparatus |
JP4057444B2 (ja) | 2003-02-26 | 2008-03-05 | Hoya株式会社 | 研磨装置 |
MXPA03006434A (es) * | 2003-07-18 | 2005-01-21 | Univ Mexico Nacional Autonoma | Herramienta hidrodinamica de flujo radial para el pulido y esmerilado de superficies opticas. |
JP2005103696A (ja) * | 2003-09-30 | 2005-04-21 | Disco Abrasive Syst Ltd | 研磨装置 |
KR20090009266A (ko) * | 2006-08-16 | 2009-01-22 | 아사히 가라스 가부시키가이샤 | 연마제 슬러리 폐액으로부터의 연마제 회수 방법 및 장치 |
JP5093650B2 (ja) * | 2007-06-07 | 2012-12-12 | 株式会社ニコン | 研磨装置及び研磨方法 |
JP2010179407A (ja) * | 2009-02-05 | 2010-08-19 | Elpida Memory Inc | Cmp装置 |
US8133097B2 (en) * | 2009-05-07 | 2012-03-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Polishing apparatus |
CN203557250U (zh) * | 2013-10-24 | 2014-04-23 | 株洲众欣科技发展有限责任公司 | 一种具有程序化控制系统的玻璃抛光机 |
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2015
- 2015-05-14 JP JP2015098931A patent/JP6454599B2/ja active Active
-
2016
- 2016-04-07 TW TW105110904A patent/TWI665054B/zh active
- 2016-05-11 KR KR1020160057361A patent/KR102305377B1/ko active Active
- 2016-05-12 CN CN201610312950.7A patent/CN106141902B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
TWI665054B (zh) | 2019-07-11 |
JP2016215284A (ja) | 2016-12-22 |
KR20160134513A (ko) | 2016-11-23 |
KR102305377B1 (ko) | 2021-09-24 |
CN106141902B (zh) | 2019-07-30 |
TW201702002A (zh) | 2017-01-16 |
CN106141902A (zh) | 2016-11-23 |
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