JP5735268B2 - 高周波半導体スイッチ - Google Patents
高周波半導体スイッチ Download PDFInfo
- Publication number
- JP5735268B2 JP5735268B2 JP2010283723A JP2010283723A JP5735268B2 JP 5735268 B2 JP5735268 B2 JP 5735268B2 JP 2010283723 A JP2010283723 A JP 2010283723A JP 2010283723 A JP2010283723 A JP 2010283723A JP 5735268 B2 JP5735268 B2 JP 5735268B2
- Authority
- JP
- Japan
- Prior art keywords
- fet
- terminal side
- contact
- semiconductor switch
- drain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 18
- 239000000758 substrate Substances 0.000 claims description 12
- 230000005669 field effect Effects 0.000 claims description 10
- 230000005540 biological transmission Effects 0.000 description 21
- 238000003780 insertion Methods 0.000 description 8
- 230000037431 insertion Effects 0.000 description 8
- 238000002955 isolation Methods 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
- H04B1/40—Circuits
- H04B1/44—Transmit/receive switching
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Electronic Switches (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Description
20a〜d…スイッチ、
30…アンテナ端子、
40a〜d…RF端子、
100…シリコン基板、
110…絶縁膜、
120…半導体層、
130…ソース領域、
140…ドレイン領域、
150…酸化膜、
160…ゲート、
170…ソース配線、
172…ソースコンタクト、
180…ドレイン配線、
182…ドレインコンタクト。
Claims (1)
- 複数の電界効果型トランジスタを有し、各電界効果型トランジスタのゲートへの電圧印加を切り替えることによって、所望の無線通信を達成するための高周波半導体スイッチであって、
複数の前記電界効果型トランジスタは、それぞれ、基板に間隔を置いて形成されたソース領域およびドレイン領域と、当該間隔上であって前記基板上に形成されたゲートと、前記基板上に形成され前記ソース領域に接続されるソースコンタクトと、前記基板上に形成され前記ドレイン領域に接続されるドレインコンタクトとを含み、
前記複数の電界効果型トランジスタのうち、受信端子側に接続される受信端子側トランジスタのソースコンタクトおよびドレインコンタクト間の距離Lrは、送信端子側に接続される送信端子側トランジスタのソースコンタクトおよびドレインコンタクト間の距離Ltよりも長いことを特徴とする高周波半導体スイッチ。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010283723A JP5735268B2 (ja) | 2010-12-20 | 2010-12-20 | 高周波半導体スイッチ |
KR1020110087275A KR101228652B1 (ko) | 2010-12-20 | 2011-08-30 | 고주파 반도체 스위치 |
US13/355,257 US8482337B2 (en) | 2010-12-20 | 2012-01-20 | High frequency semiconductor switch |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010283723A JP5735268B2 (ja) | 2010-12-20 | 2010-12-20 | 高周波半導体スイッチ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012134252A JP2012134252A (ja) | 2012-07-12 |
JP5735268B2 true JP5735268B2 (ja) | 2015-06-17 |
Family
ID=46233584
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010283723A Expired - Fee Related JP5735268B2 (ja) | 2010-12-20 | 2010-12-20 | 高周波半導体スイッチ |
Country Status (3)
Country | Link |
---|---|
US (1) | US8482337B2 (ja) |
JP (1) | JP5735268B2 (ja) |
KR (1) | KR101228652B1 (ja) |
Families Citing this family (31)
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---|---|---|---|---|
US8262900B2 (en) | 2006-12-14 | 2012-09-11 | Life Technologies Corporation | Methods and apparatus for measuring analytes using large scale FET arrays |
ES2923759T3 (es) | 2006-12-14 | 2022-09-30 | Life Technologies Corp | Aparato para medir analitos utilizando matrices de FET |
US11339430B2 (en) | 2007-07-10 | 2022-05-24 | Life Technologies Corporation | Methods and apparatus for measuring analytes using large scale FET arrays |
US8349167B2 (en) | 2006-12-14 | 2013-01-08 | Life Technologies Corporation | Methods and apparatus for detecting molecular interactions using FET arrays |
US20100137143A1 (en) | 2008-10-22 | 2010-06-03 | Ion Torrent Systems Incorporated | Methods and apparatus for measuring analytes |
US20100301398A1 (en) | 2009-05-29 | 2010-12-02 | Ion Torrent Systems Incorporated | Methods and apparatus for measuring analytes |
US8776573B2 (en) | 2009-05-29 | 2014-07-15 | Life Technologies Corporation | Methods and apparatus for measuring analytes |
US20120261274A1 (en) | 2009-05-29 | 2012-10-18 | Life Technologies Corporation | Methods and apparatus for measuring analytes |
US8858782B2 (en) | 2010-06-30 | 2014-10-14 | Life Technologies Corporation | Ion-sensing charge-accumulation circuits and methods |
CN106449632B (zh) | 2010-06-30 | 2019-09-20 | 生命科技公司 | 阵列列积分器 |
TWI569025B (zh) | 2010-06-30 | 2017-02-01 | 生命技術公司 | 用於測試離子感測場效電晶體(isfet)陣列之裝置及方法 |
US11307166B2 (en) | 2010-07-01 | 2022-04-19 | Life Technologies Corporation | Column ADC |
CN103168341B (zh) | 2010-07-03 | 2016-10-05 | 生命科技公司 | 具有轻度掺杂的排出装置的化学敏感的传感器 |
EP2617061B1 (en) | 2010-09-15 | 2021-06-30 | Life Technologies Corporation | Methods and apparatus for measuring analytes |
US9970984B2 (en) | 2011-12-01 | 2018-05-15 | Life Technologies Corporation | Method and apparatus for identifying defects in a chemical sensor array |
US8786331B2 (en) * | 2012-05-29 | 2014-07-22 | Life Technologies Corporation | System for reducing noise in a chemical sensor array |
US9080968B2 (en) | 2013-01-04 | 2015-07-14 | Life Technologies Corporation | Methods and systems for point of use removal of sacrificial material |
US9841398B2 (en) | 2013-01-08 | 2017-12-12 | Life Technologies Corporation | Methods for manufacturing well structures for low-noise chemical sensors |
US8963216B2 (en) | 2013-03-13 | 2015-02-24 | Life Technologies Corporation | Chemical sensor with sidewall spacer sensor surface |
US9835585B2 (en) | 2013-03-15 | 2017-12-05 | Life Technologies Corporation | Chemical sensor with protruded sensor surface |
WO2014149780A1 (en) | 2013-03-15 | 2014-09-25 | Life Technologies Corporation | Chemical sensor with consistent sensor surface areas |
WO2014149779A1 (en) | 2013-03-15 | 2014-09-25 | Life Technologies Corporation | Chemical device with thin conductive element |
US20140336063A1 (en) | 2013-05-09 | 2014-11-13 | Life Technologies Corporation | Windowed Sequencing |
US10458942B2 (en) | 2013-06-10 | 2019-10-29 | Life Technologies Corporation | Chemical sensor array having multiple sensors per well |
KR101952857B1 (ko) * | 2013-12-20 | 2019-02-27 | 삼성전기주식회사 | 스위칭 회로 및 이를 포함하는 고주파 스위치 |
CN107250784B (zh) | 2014-12-18 | 2020-10-23 | 生命科技公司 | 具有发送器配置的高数据率集成电路 |
US10077472B2 (en) | 2014-12-18 | 2018-09-18 | Life Technologies Corporation | High data rate integrated circuit with power management |
EP3234575B1 (en) | 2014-12-18 | 2023-01-25 | Life Technologies Corporation | Apparatus for measuring analytes using large scale fet arrays |
JP6371724B2 (ja) | 2015-03-13 | 2018-08-08 | 株式会社東芝 | 半導体スイッチ |
KR102727563B1 (ko) | 2020-03-04 | 2024-11-06 | 주식회사 디비하이텍 | 알에프 스위치 소자 |
KR20220001812A (ko) * | 2020-06-30 | 2022-01-06 | 삼성전기주식회사 | Rf 스위치 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3243892B2 (ja) * | 1993-05-21 | 2002-01-07 | ソニー株式会社 | 信号切り替え用スイッチ |
JP3169775B2 (ja) * | 1994-08-29 | 2001-05-28 | 株式会社日立製作所 | 半導体回路、スイッチ及びそれを用いた通信機 |
JP3441236B2 (ja) * | 1995-04-24 | 2003-08-25 | ソニー株式会社 | 半導体集積回路装置 |
JPH09232827A (ja) * | 1996-02-21 | 1997-09-05 | Oki Electric Ind Co Ltd | 半導体装置及び送受信切り替え型アンテナスイッチ回路 |
JP2005038958A (ja) * | 2003-07-17 | 2005-02-10 | Oki Electric Ind Co Ltd | 半導体装置の製造方法及び半導体装置 |
JP2007073815A (ja) * | 2005-09-08 | 2007-03-22 | Toshiba Corp | 半導体装置 |
JP4106376B2 (ja) * | 2005-09-30 | 2008-06-25 | 富士通株式会社 | スイッチ回路及び集積回路 |
JP2009194891A (ja) | 2008-01-15 | 2009-08-27 | Toshiba Corp | 高周波スイッチ回路 |
US20090181630A1 (en) | 2008-01-15 | 2009-07-16 | Kabushiki Kaisha Toshiba | Radio frequency switch circuit |
JP5237842B2 (ja) * | 2009-01-29 | 2013-07-17 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
-
2010
- 2010-12-20 JP JP2010283723A patent/JP5735268B2/ja not_active Expired - Fee Related
-
2011
- 2011-08-30 KR KR1020110087275A patent/KR101228652B1/ko active IP Right Grant
-
2012
- 2012-01-20 US US13/355,257 patent/US8482337B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP2012134252A (ja) | 2012-07-12 |
KR101228652B1 (ko) | 2013-01-31 |
US20120154018A1 (en) | 2012-06-21 |
US8482337B2 (en) | 2013-07-09 |
KR20120069528A (ko) | 2012-06-28 |
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