JP5706724B2 - X-ray foreign object detection device - Google Patents

Description

  The present invention relates to an X-ray foreign object detection device that detects foreign substances mixed in an object to be inspected such as meat, fish, processed foods, and pharmaceuticals, and in particular, combines foreign images by synthesizing images from a plurality of X-ray line sensors. The present invention relates to an X-ray foreign matter detection apparatus that employs an energy subtraction method for obtaining an enhanced image.

  In general, an X-ray foreign object detection apparatus irradiates X-rays from X-ray generators on various types of inspection objects (for example, meat, fish, processed foods, pharmaceuticals, etc.) that are sequentially conveyed on a conveyance path at predetermined intervals. The inspection object is inspected for foreign substances such as metal, glass, stones, and bones, and a lack of the inspection object, based on the amount of transmitted X-rays.

  Conventionally, in this type of X-ray foreign object detection device, a low energy and a high energy X-ray image pair, that is, a dual energy X-ray image is acquired using X-ray sources having different tube voltages, and these two X-ray images are synthesized. By using the energy subtraction method, the influence of the thickness of the object to be inspected is reduced, and the image of the object to be inspected is enhanced by increasing the contrast between the object and the foreign object in the object. For example, see Patent Document 1).

JP 2010-91483 A

  However, in the conventional technique described in Patent Document 1, the inspection object conveyance direction is inclined with respect to the two X-ray line sensors according to the processing accuracy of the peripheral length of the conveyance belt. Between the first X-ray image data obtained by the combination of the first X-ray source and the X-ray line sensor and the second X-ray image data obtained by the combination of the second X-ray source and the X-ray line sensor If the position of the image of the object to be inspected is shifted, an unnecessary edge (a change in shading is conspicuous in the boundary portion of the object to be inspected on the composite image obtained by synthesizing the two X-ray images. Part) occurs, and there is a problem that the foreign object detection performance is deteriorated. The positional deviation of the image of the inspection object can be eliminated by adjusting each of the two X-ray line sensors so as to be orthogonal to the inspection object conveyance direction, but the two X-ray line sensors are individually adjusted. There is a problem that adjustment work is difficult because it is necessary.

  Therefore, the present invention has been made to solve the conventional problems as described above, and can reduce the displacement of the inspection object on the composite image and prevent the foreign matter detection ability from being lowered. An object of the present invention is to provide a foreign object detection device.

The X-ray foreign object detection apparatus according to the present invention provides a transport means for transporting an inspection object on the transport surface in the inspection object transport direction, and X-rays having different intensities on the inspection object transported on the transport surface. The first X-ray source and the second X-ray source to be irradiated are disposed at positions facing the first X-ray source and the second X-ray source across the transport surface, First X-ray image data corresponding to X-rays irradiated from the X-ray source and transmitted through the inspection object, and second X-rays corresponding to X-rays irradiated from the second X-ray source and transmitted through the inspection object A first X-ray line sensor and a second X-ray line sensor that respectively output X-ray image data of the first and second X-ray image data, and the first X-ray image data and second X-ray image data, Output as one image data corresponding to the image, and the image combining means outputs Determining means for determining the presence or absence of a foreign substance in the inspection object based on image data, wherein the first X-ray line sensor and the second X-ray line sensor are A single support member configured to be supported in a positional relationship in which both are parallel to each other and adjustable in angle with respect to the inspection object conveyance direction, and an angle of the support member with respect to the inspection object conveyance direction. An angle adjusting member that performs an adjustment operation, a first waveform that is a waveform in the width direction of the inspection object in the first X-ray image data, and a width direction of the inspection object in the second X-ray image data And a second waveform which is a waveform of the first and second waveforms, and an angle adjustment direction of the support member is determined based on a difference between the first waveform and the second waveform, and the first waveform and the second waveform are determined. Based on the difference in the horizontal position of the waveform And determining the angle adjusting decision means for angle adjustment of the support member,
Display means for displaying a determination result by the angle adjustment determination means.

  With this configuration, a single support member that supports the first X-ray line sensor and the second X-ray line sensor according to the angle adjustment direction and the angle adjustment amount determined by the angle adjustment determination unit and displayed on the display unit. By adjusting the angle of the first X-ray line sensor and the second X-ray line sensor at the same time and easily by adjusting the angle of the first X-ray line sensor and the second X-ray line sensor Can be adjusted. Accordingly, it is possible to reduce the displacement of the inspection object on the composite image and prevent the foreign matter detection ability from being lowered.

  In addition, the X-ray foreign object detection device according to the present invention includes a position adjustment member that performs an operation of adjusting the position of the support member in the orthogonal direction orthogonal to the inspection object conveyance direction, and the first X-ray image data. A first waveform that is a waveform in the width direction of the inspection object and a second waveform that is a waveform in the width direction of the inspection object in the second X-ray image data are acquired, and the first waveform and Position adjustment determination means for determining a position adjustment direction of the support member in the orthogonal direction and a position adjustment amount of the support member in the orthogonal direction based on a lateral position of the second waveform, and the display means The determination result by the position adjustment determination means is displayed.

  With this configuration, a single support member that supports the first X-ray line sensor and the second X-ray line sensor according to the position adjustment direction and the position adjustment amount determined by the position adjustment determination unit and displayed on the display unit. The position in the direction orthogonal to the inspection object conveyance direction of the first X-ray line sensor and the second X-ray line sensor is adjusted to be orthogonal to the inspection object conveyance direction by adjusting the position adjusting member. The position in the direction can be adjusted simultaneously and easily.

  In the X-ray foreign object detection device according to the present invention, the first X-ray line sensor includes a first detection unit that detects X-rays, and a first drive circuit that drives the first detection unit. And the second X-ray line sensor includes a second detection unit that detects X-rays and a second drive circuit that drives the second detection unit, and the support member includes: The first detection unit, the first drive circuit, the second drive circuit are mounted by mounting the first detection unit, the first drive circuit, the second detection unit, and the second drive circuit. And a single circuit board that supports the second drive circuit.

  With this configuration, the first X-ray line sensor and the second X-ray line sensor are mounted on a single circuit board as a support member by mounting the first X-ray line sensor and the second X-ray line sensor. The positioning of the line sensor and the second X-ray line sensor can be performed at the same time, and the positioning work of the first X-ray line sensor and the second X-ray line sensor in the subsequent process can be omitted.

  In the X-ray foreign object detection device according to the present invention, the first X-ray line sensor includes a first detection unit that detects X-rays, and a first drive circuit that drives the first detection unit. And a first circuit board on which the first detection unit and the first drive circuit are mounted, and the second X-ray line sensor detects an X-ray. , A second drive circuit for driving the second detection unit, and a second circuit which is mounted on the second detection unit and the second drive circuit and is a separate member from the first circuit board And the support member supports the first circuit board and the second circuit board.

  With this configuration, the first circuit board is supported by supporting the first circuit board of the first X-ray line sensor and the second circuit board of the second X-ray line sensor with a single support member. In the assembling process for supporting the second circuit board on the support member, the X-ray line sensor and the second X-ray line sensor can be positioned.

  In the X-ray foreign object detection device according to the present invention, the support member may be arranged such that the first detection unit and the second detection unit are close to each other, and the first X-ray line sensor and the second X-ray sensor. The X-ray line sensor is supported while maintaining a positional relationship in which both are parallel to each other.

  With this configuration, even when the first X-ray line sensor and the second X-ray line sensor are slightly misaligned with respect to the inspection object conveyance direction, the first detection unit and the second detection unit By disposing the parts close to each other, the displacement of the position of the inspection object on the X-ray image data can be reduced.

  In addition, the X-ray foreign object detection device according to the present invention includes an angle adjustment member drive unit that drives the angle adjustment member, a position adjustment member drive unit that drives the position adjustment member, and an angle determined by the angle adjustment determination unit. An adjustment direction and an angle adjustment amount; and a drive control means for driving and controlling the angle adjustment member drive means and the position adjustment member drive means according to the position adjustment direction and the position adjustment amount determined by the position adjustment determination means. It is characterized by that.

  According to this configuration, the angle adjusting member driving means and the position adjusting member driving by the drive control means according to the angle adjusting direction and the angle adjusting amount determined by the angle adjusting determining means and the position adjusting direction and the position adjusting amount determined by the position adjusting determining means. Since the means is driven and controlled, the angle of the first X-ray line sensor and the second X-ray line sensor with respect to the object conveyance direction and the coverage of the first X-ray line sensor and the second X-ray line sensor. The position in the direction orthogonal to the inspection object conveyance direction can be automatically adjusted.

  The present invention can provide an X-ray foreign object detection apparatus that can reduce the displacement of an object to be inspected on a composite image and prevent a decrease in foreign object detection capability.

It is a perspective view which shows schematic structure of the X-ray foreign material detection apparatus which concerns on one embodiment of this invention. It is a figure which shows the side surface and internal structure of the X-ray foreign material detection apparatus which concern on one embodiment of this invention. It is a top view which shows the X-ray line sensor of the X-ray foreign material detection apparatus which concerns on one embodiment of this invention. It is a side view which shows the X-ray line sensor of the X-ray foreign material detection apparatus which concerns on one embodiment of this invention. It is a top view which shows the other example of the X-ray line sensor of the X-ray foreign material detection apparatus which concerns on one embodiment of this invention. It is a top view which shows the inclination state of the X-ray line sensor of the X-ray foreign material detection apparatus which concerns on one embodiment of this invention. It is a top view which shows the other example of the inclination state of the X-ray line sensor of the X-ray foreign material detection apparatus which concerns on one embodiment of this invention. (A) is sectional drawing of the conveyance surface seen from the to-be-inspected object conveyance direction, (b) is a figure which shows the 1st waveform and 2nd waveform which were acquired from two X-ray line sensors, (C) is a figure which shows the difference of a 1st waveform and a 2nd waveform, (d) is a figure which shows the state which the 1st waveform and the 2nd waveform shifted to the horizontal direction entirely. It is. It is a top view which shows the X-ray line sensor of the X-ray foreign material detection apparatus which concerns on one embodiment of this invention, and is a figure which shows the structure which adjusts the angle of an X-ray line sensor automatically. It is a figure which shows the side surface and internal structure of the X-ray foreign material detection apparatus which concerns on one embodiment of this invention, and is a figure which shows the structure which adjusts the angle of an X-ray line sensor automatically.

  Embodiments of the present invention will be described below with reference to the drawings.

  First, the configuration will be described.

  As shown in FIG. 1, the X-ray foreign object detection device 1 includes a transport unit 2 and a detection unit 3 inside a housing 4, and a display 5 at the upper front of the housing 4.

  The conveyance unit 2 sequentially conveys the inspection object W at a predetermined interval. This conveyance part 2 is comprised by the belt conveyor arrange | positioned horizontally within the housing | casing 4, for example. The transport unit 2 is driven at a transport speed set in advance by the drive motor 6 shown in FIG. 1, and the inspection object W carried in from the transport inlet 7 is moved to the transport outlet 8 side (X direction in the figure) which is the transport direction. On the other hand, it conveys on the belt surface 2a as an upper conveying surface of the endless belt. A space that penetrates the belt surface 2 a from the carry-in port 7 to the carry-out port 8 in the housing 4 forms a transport path 21.

  The detection unit 3 irradiates the inspection object W sequentially conveyed with X-rays in the inspection space 22 in the middle of the conveyance path 21 and detects X-rays transmitted through the inspection object W. 21 includes an X-ray generator 9 disposed at a predetermined height above the examination space 22 in the middle of the 21 and an X-ray detector 10 disposed opposite to the X-ray generator 9 in the transport unit 2. Yes.

  An X-ray generator 9 as an X-ray generation source has a configuration in which a cylindrical X-ray tube 30 provided inside a metal box 11 is immersed in insulating oil (not shown). In the present embodiment, two X-ray tubes 31 and 32 are provided as the X-ray tube 30, and an X-ray is generated by irradiating an anode target with an electron beam from the cathodes of the X-ray tubes 31 and 32. . The X-ray tubes 31 and 32 are arranged such that the longitudinal direction thereof is the conveyance direction (X direction) of the inspection object W. X-rays generated by the X-ray tubes 31 and 32 are irradiated toward the lower X-ray detector 10 so as to cross the transport direction (X direction) in a substantially triangular screen shape by a slit (not shown). It has become so.

  Here, the intensity of the X-rays generated by the X-ray tubes 31 and 32 changes in proportion to the current (tube current) flowing between the anode and the cathode of the X-ray tubes 31 and 32 and the generated X-rays. Is shortened according to the voltage (tube voltage) applied between the anode and cathode of the X-ray tubes 31 and 32, and the transmission power is increased. That is, the quality of X-rays generated from the X-ray tubes 31 and 32 changes according to the tube current and tube voltage of the X-ray tubes 31 and 32. In the present embodiment, the intensity of X-rays generated by the X-ray tube 31 and the intensity of X-rays generated by the X-ray tube 31 are made different. For example, the X-ray tube 31 has a high output (high energy radiation quality). X-ray is output), and the X-ray tube 32 is set to low output (low energy X-ray output is output).

  Note that the intensity of X-rays generated by the X-ray tubes 31 and 32 is not necessarily fixed at a constant value, and the X-ray tube is in accordance with the type of foreign matter to be detected and the inspection object W and the conveyance speed. The tube currents or tube voltages 31 and 32 are adjusted.

  The X-ray detector 10 includes an X-ray line sensor 50 in which a plurality of detection elements are linearly arranged in the Y direction orthogonal to the transport direction on the plane in the transport direction (X direction) of the object W to be transported. ing. In the present embodiment, as the X-ray line sensor 50, two X-ray line sensors 51 and 52 are provided in the conveyance direction of the inspection object W, and the X-ray line sensor 51 is irradiated from the high-power X-ray tube 31. Then, a detection signal (density data image) transmitted through the inspection object W is output, and the X-ray line sensor 52 detects the detection signal (density data) irradiated from the high-output X-ray tube 32 and transmitted through the inspection object W. Image).

  As will be described later, the X-ray line sensors 51 and 52 are detectors 51a and 52a (see FIG. 5) that include a scintillator (not shown) that emits light (fluorescence) upon receiving X-rays and a light receiving element that receives light from the scintillator. 3) and drive circuits 51b and 52b (see FIG. 3) for driving the detectors 51a and 52a. As described above, when the X-ray line sensors 51 and 52 include the detection units 51a and 52a and the drive circuits 51b and 52b, if the detection units 51a and 52a are inclined with respect to the inspection object conveyance direction, the detection unit 51a. , 52a, the X-ray foreign object detection device 1 of the present embodiment will be described later in detail, but the angles of the detection units 51a, 52a The position can be easily adjusted.

  Here, in the present embodiment, the X-ray detector 10 converts the detection signals (luminance value data) of the X-ray line sensors 51 and 52 into digital data by a built-in A / D converter (not shown), and density data. The A / D converter is provided outside the X-ray detector 10, or the luminance value data before A / D conversion is output to the subsequent overall control unit 40, etc. However, it is not an essential requirement to convert it into density data that is digital data.

  The X-ray detector 10 including the X-ray line sensors 51 and 52 outputs X-ray image data necessary for determining whether or not foreign matter is mixed in a general control unit 40 (see FIG. 2) described later. Yes.

  As shown in FIG. 2, X-ray shielding shielding curtains 16 are suspended and arranged at a plurality of locations along the conveyance direction (X direction) on the ceiling portion 21 a in the conveyance path 21. The shielding curtain 16 is composed of a rubber sheet mixed with lead powder that shields X-rays and processed into a good shape (a state in which the upper part is connected and the lower part is divided into strips), and is conveyed from the inspection space 22. This prevents X-rays from leaking outside the housing 4 via the path 21.

  In the present embodiment, two shielding curtains 16 are provided between the carry-in entrance 7 and the inspection space 22 and between the examination space 22 and the carry-out exit 8, respectively. Even when a gap is generated due to elastic deformation due to contact with the inspection object W, the other shielding curtain 16 shields X-rays, so that leakage of X-rays can be prevented without exceeding the leakage reference amount.

  Note that a slit is disposed on the upper surface of the inspection space 22, and the lower surface and side surfaces of the inspection space 22 are substantially closed by a housing 4 or the like for shielding X-rays. An inner space surrounded by the shielding curtain 16, the slit, the housing 4, and the like in the transport path 21 constitutes an inspection space 22.

  The X-ray foreign matter detection apparatus 1 includes a comprehensive control unit 40 that performs comprehensive control including determination of the presence or absence of foreign matter in the inspection object W based on density data received from the X-ray detector 10.

  The comprehensive control unit 40 performs comprehensive control of the X-ray foreign matter detection apparatus 1 and detects density data from the X-ray line sensors 51 and 52 and activates the density data at a predetermined timing, respectively. Detection unit 61, 62, storage unit 43 that stores a plurality of density data from data detection units 61, 62, and an image of density data from X-ray line sensors 51, 52 (hereinafter simply referred to as an image) An image processing unit 44 that performs image processing such as composition processing and filter processing, and an image subjected to image processing by the image processing unit 44 is discriminated from the object W to be inspected to determine whether foreign matter is mixed in. And a determination unit 48 for determination. The determination result by the determination unit 48 is displayed on the display 5.

  The data detection unit 60 includes two data detection units 61 and 62 in the present embodiment, and density data input at a predetermined timing with respect to the density data from the X-ray line sensors 51 and 52, that is, a predetermined level. Only data within the range of data validation input timing is validated.

  The storage unit 43 temporarily stores data validated by the data detection units 61 and 62 among the data output from the X-ray line sensors 51 and 52, and can store and read images at high speed. It consists of possible memory.

  The image processing unit 44 performs image processing such as synthesis processing and filter processing on the density data images from the X-ray line sensors 51 and 52.

  The determination unit 48 detects foreign matter from the inspected object W on the image subjected to the image processing by the image processing unit 44, and determines whether foreign matter is mixed.

  The X-ray foreign object detection apparatus 1 also includes a setting unit 49 that performs an X-ray output of the X-ray generator 9, a conveyance speed of the inspection object W, an inspection parameter setting operation of the X-ray detector 10, and a selection operation. The setting unit 49 is arranged next to the display 5 at the upper front of the housing 4.

  As shown in FIGS. 3 and 4, in the present embodiment, the X-ray line sensor 51 includes a detection unit 51 a that detects X-rays and a drive circuit 51 b that drives the detection unit 51 a, and X-rays The line sensor 52 includes a detection unit 52a that detects X-rays, and a drive circuit 52b that drives the detection unit 52a. The detection units 51a and 52a and the drive circuits 51b and 52b are configured as a single circuit board 71. By being mounted on, it is supported on this circuit board 71. The X-ray line sensor 51 and the X-ray line sensor 52 are supported by the circuit board 71 while maintaining a positional relationship in which both are parallel. In the circuit board 71, each member is disposed so that the detection unit 51a and the detection unit 52a are close to and adjacent to each other, and the drive circuit 51b and the drive circuit 52b are separated from each other. In other words, on the circuit board 71, these are arrange | positioned so that the detection part 51a and the detection part 52a may face each other. For this reason, by arranging the detection unit 51a and the detection unit 52a close to each other, the circuit board 71 is slightly inclined with respect to the inspection object conveyance direction, that is, the extending direction of the detection units 51a and 52a is Even in a state that is not parallel to the direction orthogonal to the inspection object conveyance direction, the difference in position between the detection unit 51a and the detection unit 52a in the direction orthogonal to the inspection object conveyance direction can be reduced.

  The circuit board 71 is configured to be adjustable in angle with respect to the inspection object conveyance direction. Specifically, the circuit board 71 includes a rotation fulcrum 73 that is pivotally supported by a slide member 78 (described later) at a substantially central portion, and rotates about the rotation fulcrum 73 to be inspected. The angle can be adjusted with respect to the object conveying direction. On the side surface side of the corner portion of the circuit board 71, an angle adjustment member 74 that is in contact with the circuit board 71 and adjusts the angle of the circuit board 71 with respect to the inspection object conveyance direction is provided. On the side surface side of the corner portion, a compression spring 75 is provided which contacts the circuit board 71 and presses the circuit board 71 toward the angle adjusting member 74 side. The angle adjustment member 74 has a mechanism similar to that of a micrometer. When the adjustment handle 74a is operated, the position of the corner portion is displaced in the left-right direction in the drawing, whereby the circuit board 71 is moved to the rotation fulcrum 73. The circuit board 71 is rotated around to adjust the angle of the circuit board 71 with respect to the inspection object conveyance direction.

  Further, the circuit board 71 is configured to be position-adjustable with respect to a direction (left-right direction in the drawing) orthogonal to the inspection object conveyance direction. Specifically, the slide member 78 that pivotally supports the rotation fulcrum 73 of the circuit board 71 is provided on the housing 4 so as to be slidable in a direction orthogonal to the inspection object transport direction, and the slide member 78 is displaced. By doing so, the position of the circuit board 71 can be adjusted in a direction perpendicular to the inspection object conveyance direction. A position on one side of the center of the circuit board 71 in the inspection object conveyance direction is a position that contacts the slide member 78 and adjusts the position of the slide member 78 and the circuit board 71 in the direction orthogonal to the inspection object conveyance direction. An adjustment member 76 is provided, and a compression spring 77 that contacts the slide member 78 and presses the slide member 78 and the circuit board 71 toward the position adjustment member 76 is provided on the other side surface side of the circuit board 71. . The position adjustment member 76 has a mechanism similar to that of a micrometer. When the adjustment handle 76a is operated, the position of the slide member 78 and the circuit board 71 in the direction orthogonal to the inspection object conveyance direction is adjusted. It has become.

  As shown in FIG. 5, the X-ray line sensor 51 includes a detection unit 51a, a drive circuit 51b, and a circuit board 51c on which the detection unit 51a and the drive circuit 51b are mounted. The detection unit 52a, the drive circuit 52b, and the circuit board 52c on which the detection unit 52a and the drive circuit 52b are mounted. The X-ray line sensor 51 and the X-ray line sensor 52 include the circuit board 51c and the circuit board 52c. It may be supported by a single support member 72 so as to maintain a positional relationship in which both are parallel.

  As shown in FIG. 2, in the present embodiment, the overall control unit 40 includes an angle adjustment determination unit 91 that determines an adjustment angle and an adjustment amount of the circuit board 71 or the support member 72, and the circuit board 71 or the support member. And a position adjustment determination unit 92 that determines an adjustment direction and an adjustment amount in a direction (orthogonal direction) orthogonal to the inspection object conveyance direction 72, and the display 5 includes an angle adjustment determination unit 91 and a position adjustment determination unit 92. The judgment result is displayed.

  The angle adjustment determination unit 91 includes a first waveform (see FIG. 8A) that is a waveform in the width direction of the inspection object W in the first X-ray image data output from the X-ray line sensor 51, A second waveform (see FIG. 8A) that is a waveform in the width direction of the inspection object W in the second X-ray image data output from the line line sensor 52 is acquired, and the first waveform and the first waveform are obtained. The angle adjustment direction of the circuit board 71 or the support member 72 is determined based on the difference between the two waveforms, and the angle of the circuit board 71 or the support member 72 is determined based on the difference between the horizontal positions of the first waveform and the second waveform. The adjustment amount is determined.

  Specifically, as shown in FIG. 6 or FIG. 7, when the X-ray line sensors 51 and 52 are inclined with respect to the inspection object conveyance direction, from the front side in the inspection object conveyance direction to the back When viewing the side, as shown in FIG. 8A, the position of the X-ray line sensor 51 is shifted to the right side from the position of the X-ray line sensor 52, and as shown in FIG. The second waveform is located on the right side by a separation distance D from the waveform. In this case, in the difference image between the first waveform and the second waveform, as shown in FIG. 8C, the value of the first waveform is the second value at the left end of the first waveform and the second waveform. The edge 100L is generated on the plus side by being larger than the value of the waveform, and the edge 100R is on the minus side at the right end of the first waveform and the second waveform because the value of the first waveform is smaller than the value of the second waveform. Occurs. The angle adjustment determination unit 91 determines the adjustment direction of the circuit board 71 or the support member 72 depending on whether the two edges 100R and 100L in the difference data of the first waveform and the second waveform are the plus side or the minus side, respectively. The adjustment amount of the circuit board 71 or the support member 72 is determined from the lateral distance D between the first waveform and the second waveform. For example, as illustrated in FIG. 8C, the angle adjustment determination unit 91 generates a positive edge 100 </ b> L at the left end of the first waveform and the second waveform, and the right end of the first waveform and the second waveform. When the negative edge 100R is generated, the first waveform moves to the right side and the second waveform moves to the left side so that the edges 100R and 100L disappear, as shown in FIG. In a), the position of the X-ray line sensor 51 should be moved to the left side and moved to the right side from the position of the X-ray line sensor 52. Therefore, the adjustment direction of the circuit board 71 or the support member 72 is counterclockwise. Judge that there is. In this case, for example, “angle adjustment direction: counterclockwise direction, angle adjustment amount: 0.3 °” is displayed on the display 5.

  Further, the position adjustment determination unit 92 acquires the first waveform and the second waveform, and based on the horizontal position of the first waveform and the second waveform, the circuit board 71 or the test object of the support member 72 The position adjustment direction in the orthogonal direction orthogonal to the conveyance direction and the position adjustment amount in the orthogonal direction orthogonal to the inspection object conveyance direction of the circuit board 71 or the support member 72 are determined.

  Specifically, the position adjustment determination unit 92 is as shown in FIG. 8D in a state where the circuit board 71 or the support member 72 is deviated from the center position in the orthogonal direction orthogonal to the inspection object conveyance direction. In addition, even if the first waveform and the second waveform overlap at the same position, the entire position of the first waveform and the second waveform is deviated laterally from the center proper position, which is not preferable. The circuit board 71 or the support member 72 is orthogonal to the inspection object conveyance direction in accordance with the distance from the appropriate position and the displacement direction so that the entire position of the first waveform and the second waveform is the appropriate position in the center. The adjustment direction and adjustment amount of the position in the orthogonal direction are determined. The determination result by the position adjustment determination unit 92 is displayed on the display 5 as, for example, “position adjustment direction: back side, position adjustment amount: 2 mm”.

  As shown in FIG. 9, an angle adjustment member drive motor 81 for driving the angle adjustment member 74 is connected to the adjustment handle 74a, and a position adjustment member drive motor 82 for driving the position adjustment member 76 is connected to the adjustment handle 76a. Furthermore, as shown in FIG. 10, the general control unit 40 may be configured to be provided with a drive control unit 93 that drives and controls the angle adjustment member drive motor 81 and the position adjustment member drive motor 82.

  In the example of FIG. 9, the drive control unit 93 drives and controls the angle adjustment member drive motor 81 according to the angle adjustment direction and the angle adjustment amount determined by the angle adjustment determination unit 91, and the position adjustment direction determined by the position adjustment determination unit 92. The position adjustment member drive motor 82 is driven and controlled according to the position adjustment amount. The angle adjusting member driving motor 81 and the position adjusting member driving motor 82 are composed of a stepping motor that is pulse-driven and a speed reduction mechanism that is not shown. With this configuration, the drive controller 93 controls the angle adjustment member drive motor 81 and the position adjustment member drive motor 82 according to the determined angle adjustment direction, angle adjustment amount, position adjustment direction, and position adjustment amount. The angle and position adjustment work can be automated.

  As described above, the X-ray foreign object detection device 1 according to the present embodiment supports the X-ray line sensor 51 and the X-ray line sensor 52 while maintaining a positional relationship in which both are parallel to each other, and the inspection object conveyance direction. A single circuit board 71 or a support member 72 configured to be angle adjustable with respect to the angle, an angle adjustment member 74 for adjusting an angle of the circuit board 71 or the support member 72 with respect to the inspection object conveyance direction, and a first A first waveform that is a waveform in the width direction of the inspection object W in the X-ray image data and a second waveform that is a waveform in the width direction of the inspection object W in the second X-ray image data; The angle adjustment direction of the circuit board 71 or the support member 72 is determined based on the difference between the first waveform and the second waveform, and the circuit board 71 is determined based on the difference between the lateral positions of the first waveform and the second waveform. Or the corner of the support member 72 And determining the angle adjustment determination section 91 an adjustment amount, a display unit 5 for displaying the determination result by the angle adjustment determination unit 91, and further comprising a.

  With this configuration, the single circuit board 71 or the support member 72 that supports the X-ray line sensors 51 and 52 is determined according to the angle adjustment direction and the angle adjustment amount determined by the angle adjustment determination unit 91 and displayed on the display 5. By adjusting the angle with respect to the inspection object conveyance direction by operating the angle adjusting member 74, the angles of the X-ray line sensor 51 and the X-ray line sensor 52 with respect to the inspection object conveyance direction can be adjusted simultaneously and easily. it can. Therefore, it is possible to reduce the displacement of the inspection object W on the composite image and prevent the foreign matter detection capability from being lowered.

  In addition, the X-ray foreign object detection device 1 according to the present exemplary embodiment includes a position adjustment member 76 that performs an adjustment operation of the position of the circuit board 71 or the support member 72 in the orthogonal direction orthogonal to the inspection object conveyance direction, A first waveform that is a waveform in the width direction of the inspection object W in the X-ray image data and a second waveform that is a waveform in the width direction of the inspection object W in the second X-ray image data are acquired. A position adjustment determination unit that determines the position adjustment direction in the orthogonal direction of the circuit board 71 or the support member 72 and the position adjustment amount in the orthogonal direction of the circuit board 71 or the support member 72 based on the horizontal positions of the first waveform and the second waveform. 92, and the display 5 displays a determination result by the position adjustment determination unit 92.

  With this configuration, the single circuit board 71 that supports the X-ray line sensor 51 and the X-ray line sensor 52 according to the position adjustment direction and the amount of position adjustment determined by the position adjustment determination unit 92 and displayed on the display 5 or By adjusting the position of the support member 72 in the direction orthogonal to the inspection object conveyance direction by operating the position adjusting member 76, the X-ray line sensor 51 and the X-ray line sensor 52 are orthogonal to the inspection object conveyance direction. The position in the direction can be adjusted simultaneously and easily.

  In the X-ray foreign object detection device 1 according to the present embodiment, the X-ray line sensor 51 includes a detection unit 51a that detects X-rays and a drive circuit 51b that drives the detection unit 51a, and an X-ray line. The sensor 52 includes a detection unit 52a that detects X-rays and a drive circuit 52b that drives the detection unit 52a, and the circuit board 71 is mounted with the detection units 51a and 52a and the drive circuits 51b and 52b. The detectors 51a and 52a and the drive circuits 51b and 52b are supported.

  With this configuration, the constituent members of the X-ray line sensor 51 and the X-ray line sensor 52 are mounted on a single circuit board 71 as a support member, so that the X-ray line sensor 51 and the X-ray sensor 51 can be combined with the X-ray line sensor 51 in the mounting process of the circuit board 71. The positioning of the line line sensor 52 can be performed at the same time, and the positioning work of the X-ray line sensor 51 and the X-ray line sensor 52 in the subsequent process can be omitted.

  Further, in the X-ray foreign object detection apparatus 1 according to the present embodiment, the X-ray line sensor 51 includes a detection unit 51a that detects X-rays, a drive circuit 51b that drives the detection unit 51a, a detection unit 51a, and a drive circuit. The circuit board 51c on which the 51b is mounted, the X-ray line sensor 52 detects the X-ray, the detection unit 52a, the drive circuit 52b that drives the detection unit 52a, the detection unit 52a, and the drive circuit The circuit board 52c is mounted on the circuit board 51c, and the support member 72 supports the circuit board 51c and the circuit board 52c.

  With this configuration, the circuit board 51c of the X-ray line sensor 51 and the circuit board 52c of the X-ray line sensor 52 are supported by the single support member 72, whereby the circuit board 51c and the circuit board 52c are supported by the support member 72. In the assembling process to be supported, the X-ray line sensor 51 and the X-ray line sensor 52 can be positioned.

  Further, in the X-ray foreign object detection device 1 according to the present embodiment, the circuit board 71 or the support member 72 is disposed so that the detection unit 51a and the detection unit 52a are close to each other, and the X-ray line sensor 51 and the X-ray line sensor 52 are arranged. Is supported while maintaining a positional relationship in which both are parallel to each other.

  With this configuration, the detection unit 51a and the detection unit 52a are arranged close to each other even when a slight deviation in the angle of the X-ray line sensor 51 and the X-ray line sensor 52 with respect to the inspection object conveyance direction remains. Thereby, the shift | offset | difference of the position of the to-be-inspected object W on X-ray image data can be reduced.

  Further, the X-ray foreign object detection device 1 according to the present embodiment includes an angle adjustment member drive motor 81 that drives the angle adjustment member 74, a position adjustment member drive motor 82 that drives the position adjustment member 76, and an angle adjustment determination unit. A drive control unit that drives and controls the angle adjustment member drive motor 81 and the position adjustment member drive motor 82 according to the angle adjustment direction and the angle adjustment amount determined by 91 and the position adjustment direction and the amount of position adjustment determined by the position adjustment determination unit 92. 93.

  With this configuration, according to the angle adjustment direction and the angle adjustment amount determined by the angle adjustment determination unit 91 and the position adjustment direction and the position adjustment amount determined by the position adjustment determination unit 92, the drive control unit 93 and the angle adjustment member drive motor 81 and Since the position adjustment member drive motor 82 is driven and controlled, the angle of the X-ray line sensor 51 and the X-ray line sensor 52 with respect to the inspection object conveyance direction and the inspection object conveyance of the X-ray line sensor 51 and the X-ray line sensor 52 are controlled. The position in the direction orthogonal to the direction can be automatically adjusted.

  As described above, the X-ray foreign object detection device according to the present invention has the effect of reducing the displacement of the inspection object on the composite image and preventing the foreign object detection capability from being lowered. The present invention is useful as an X-ray foreign object detection apparatus that employs an energy subtraction method that obtains an image in which foreign objects are emphasized by synthesizing images from X-ray line sensors.

DESCRIPTION OF SYMBOLS 1 X-ray foreign material detection apparatus 2 Conveyance part (conveyance means)
2a Belt surface (conveying surface)
3 Detection unit 4 Housing 5 Display (display means)
6 drive motor 7 carry-in port 8 carry-out port 9 X-ray generator 10 X-ray detector 11 box 16 shielding curtain 21 transport path 21a ceiling 22 inspection space 30 X-ray tube 31 X-ray tube (first X-ray source)
32 X-ray tube (second X-ray source)
40 general control unit 43 storage unit 44 image processing unit (image composition means)
48 determination part (determination means)
49 Setting unit 51 X-ray line sensor (first X-ray line sensor)
51a detector (first detector)
51b Drive circuit (first drive circuit)
51c circuit board (first circuit board)
52 X-ray line sensor (second X-ray line sensor)
52a detector (second detector)
52b Drive circuit (second drive circuit)
52c Circuit board (second circuit board)
61, 62 Data detection unit 71 Circuit board (support member)
72 Support member 73 Rotation fulcrum 74 Angle adjustment member 74a, 76a Adjustment handle 75, 77 Compression spring 76 Position adjustment member 91 Angle adjustment determination unit (angle adjustment determination means)
92 Position adjustment determination unit (position adjustment determination means)
93 Drive control unit (drive control means)
W Inspection object

Claims (6)

A transport means for transporting the inspection object in the inspection object transport direction on the transport surface;
A first X-ray source and a second X-ray source for irradiating X-rays having different radiation qualities to the inspection object conveyed on the conveyance surface;
According to the X-rays that are arranged at positions facing the first X-ray source and the second X-ray source across the transport surface and are irradiated from the first X-ray source and pass through the inspection object. A first X-ray line sensor that outputs first X-ray image data and second X-ray image data corresponding to X-rays irradiated from the second X-ray source and transmitted through the inspection object; A second X-ray line sensor;
Image synthesizing means for synthesizing the first X-ray image data and the second X-ray image data and outputting as one image data corresponding to the inspection object;
An X-ray foreign matter detection apparatus comprising: determination means for determining the presence or absence of foreign matter in the inspection object based on image data output by the image composition means;
A single unit configured to support the first X-ray line sensor and the second X-ray line sensor while maintaining a positional relationship in which both are parallel to each other and to be capable of adjusting the angle with respect to the inspection object transport direction. A support member of
An angle adjusting member for adjusting an angle of the support member with respect to the inspection object conveyance direction;
A first waveform that is a waveform in the width direction of the inspection object in the first X-ray image data, and a second waveform that is a waveform in the width direction of the inspection object in the second X-ray image data; And determining the angle adjustment direction of the support member based on the difference between the first waveform and the second waveform, and based on the difference between the lateral positions of the first waveform and the second waveform. Angle adjustment determination means for determining the angle adjustment amount of the support member;
An X-ray foreign matter detection apparatus comprising: display means for displaying a determination result by the angle adjustment determination means. A position adjustment member that performs an adjustment operation of the position of the support member in the orthogonal direction orthogonal to the inspection object conveyance direction;
A first waveform that is a waveform in the width direction of the inspection object in the first X-ray image data, and a second waveform that is a waveform in the width direction of the inspection object in the second X-ray image data; Position adjustment determination for determining the position adjustment direction of the support member in the orthogonal direction and the position adjustment amount of the support member in the orthogonal direction based on the lateral positions of the first waveform and the second waveform Means, and
The X-ray foreign object detection device according to claim 1, wherein the display unit displays a determination result by the position adjustment determination unit. Angle adjusting member driving means for driving the angle adjusting member;
Position adjusting member driving means for driving the position adjusting member;
Drive control of the angle adjustment member driving means and the position adjustment member driving means according to the angle adjustment direction and angle adjustment amount determined by the angle adjustment determination means and the position adjustment direction and position adjustment amount determined by the position adjustment determination means. The X-ray foreign object detection device according to claim 2 , further comprising: a drive control unit that performs the control . The first X-ray line sensor includes a first detection unit that detects X-rays and a first drive circuit that drives the first detection unit, and the second X-ray line sensor includes A second detection unit for detecting X-rays and a second drive circuit for driving the second detection unit,
The first detection unit and the first drive are implemented by mounting the first detection unit, the first drive circuit, the second detection unit, and the second drive circuit on the support member. The X-ray foreign object detection according to any one of claims 1 to 3 , wherein the X-ray foreign object detection is a single circuit board that supports a circuit, the second detection unit, and the second drive circuit. apparatus. The first X-ray line sensor detects an X-ray, a first drive circuit that drives the first detection unit, the first detection unit, and the first drive. A first circuit board on which a circuit is mounted, and the second X-ray line sensor drives a second detector that detects X-rays and the second detector. 2 and a second circuit board that is a member different from the first circuit board on which the second detection unit and the second driving circuit are mounted,
The X-ray foreign object detection device according to any one of claims 1 to 3, wherein the support member supports the first circuit board and the second circuit board . Positional relationship in which both the first X-ray line sensor and the second X-ray line sensor are parallel to each other with the support member disposed so that the first detection unit and the second detection unit are close to each other. The X-ray foreign object detection device according to claim 4 , wherein the X-ray foreign object detection device is supported while being maintained .

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