JP5421629B2 - ウェーハをキャリアに付加しかつ/またはキャリアから分離させるためのデバイスおよび方法 - Google Patents
ウェーハをキャリアに付加しかつ/またはキャリアから分離させるためのデバイスおよび方法 Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
- B28D5/0094—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work the supporting or holding device being of the vacuum type
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating or a hardness or a material
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B43/00—Operations specially adapted for layered products and not otherwise provided for, e.g. repairing; Apparatus therefor
- B32B43/006—Delaminating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67115—Apparatus for thermal treatment mainly by radiation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/14—Semiconductor wafers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68318—Auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
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- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Description
ウェーハの接触表面に平行に位置合わせすることができる、接触表面と少なくとも部分的な接触をするための1つの接触面を備えた変形可能膜と、
規定された様式で制御することができる膜の変形のために、接触面とは逆方向にある変形手段と、
ウェーハを膜に付着させるための付着手段と、を具備してなるデバイスに関する。
吸引トラフ、および吸引トラフを覆う膜により形成される吸引空間と、
吸引空間に接続される真空ポンプと、を備える。
吸引トラフの変形可能底部と、
底部からの膜の間隔規定用の少なくとも1つの、好ましくは複数のスペーサと、を備える。
圧力トラフ、および圧力トラフを覆う底部によって形成される圧力空間と、
圧力空間に接続される圧力ポンプと、を備え得る。
a)変形可能膜の、その接触面がウェーハの接触表面に平行な状態での位置合せ
b)膜とウェーハとの間の接触
c)変形手段による、接触面の方向への膜の凸状に行われる変形および分離
a)膜とウェーハの間の接触、および付着手段によるウェーハの膜への付着と、
b)変形可能膜およびそれに付着しているウェーハと、キャリアとの位置合せと、
c)変形手段による膜およびウェーハの凸状変形、ならびにウェーハのキャリアへの付加と、により付加するために行うこともできる。
2,2' キャリア
3 接続手段
4 ウェーハ
4k 接触表面
4r 縁部
5 膜
5k 接触面
6 スペーサ
6d ボール直径
7 吸引トラフ
7b 底部
7s 端面
7u 周辺壁部
8 圧力空間
9 圧力トラフ
9b 底部
9s 端面
9u 周辺壁部
10 リミッタ
11 圧力ライン
12 吸引ライン
13 孔
14,15 加熱手段
16 負圧固定手段
17 吸引空間
18 グリッパ
19 チップ
20 突出部
Claims (14)
- ウェーハ(4)をキャリア(2)に付加し、かつ/または、それを前記キャリア(2)から分離させるためのデバイスであって、
前記ウェーハ(4)の接触表面(4k)に平行に位置合わせすることができる、接触表面(4k)と少なくとも部分的な接触をするための1つの接触面(5k)を備えた変形可能膜(5)と、
規定された様式で制御することができる前記膜(5)の変形のために、前記接触面(5k)とは逆方向にある変形手段と、
前記ウェーハ(4)を前記膜(5)に付着させるための付着手段であって、吸引トラフ(7)、および前記吸引トラフ(7)を覆う膜(5)により形成される吸引空間(17)と、前記吸引空間(17)に接続される真空ポンプと、を具備してなる付着手段と、
を具備してなり、
前記吸引トラフ(7)が、圧力で変形させることができ、かつ不透過性の変形可能底部(7b)と、周辺壁部(7u)とにより形成されることを特徴とするデバイス。 - 前記膜(5)が、前記膜(5)を貫通する、その数および/または直径が規定された孔(13)によって全透過性であることを特徴とする請求項1に記載のデバイス。
- 前記膜(5)を、前記付着手段により圧力差にさらすことができるようになっていることを特徴とする請求項1または請求項2に記載のデバイス。
- 前記変形手段が、
前記吸引トラフ(7)の前記変形可能底部(7b)と、
前記変形可能底部(7b)からの前記膜(5)の間隔規定用の少なくとも1つのスペーサ(6)と、
を具備してなることを特徴とする請求項1から請求項3のいずれか一項に記載のデバイス。 - 前記スペーサ(6)が、縁部を有さないように作られることを特徴とする請求項4に記載のデバイス。
- 前記変形手段が、
圧力トラフ(9)、および前記圧力トラフ(9)を覆う底部(7b)によって形成される圧力空間(8)と、
前記圧力空間(8)に接続される圧力ポンプと、
を具備してなることを特徴とする請求項1から請求項5のいずれか一項に記載のデバイス。 - 前記吸引トラフ(7)が、変形可能底部(7b)によって形成され、また、前記変形手段が少なくとも1つのリミッタ(10)を有し、それが、前記圧力空間(8)の方向への前記変形可能底部(7b)の変形を、前記変形可能底部(7b)が前記リミッタ(10)に隣接しているときに前記変形可能底部(7b)が平坦であるように制限するように形成されることを特徴とする請求項6に記載のデバイス。
- 前記接触面(5k)の面積が接触表面(4k)の面積よりも小さいことを特徴とする請求項1から請求項7のいずれか一項に記載のデバイス。
- 前記デバイスが加熱手段(14,15)を有することを特徴とする請求項1から請求項8のいずれか一項に記載のデバイス。
- 前記加熱手段(14)が、前記キャリア(2)を保持するための受取ユニット(1)内に一体化されることを特徴とする請求項9に記載のデバイス。
- 前記加熱手段(15)が、前記キャリア(2)を保持するための受取ユニット(1)の下にあることを特徴とする請求項9または請求項10に記載のデバイス。
- 請求項1から請求項11のいずれか一項に記載のデバイスを用いて、ウェーハ(4)をキャリア(2)から分離させるための方法であって、
a)変形可能膜(5)の、その接触面(5k)が前記ウェーハ(4)の接触表面(4k)に平行な状態での位置合せステップと、
b)前記膜(5)と前記ウェーハ(4)との間の接触および前記付着手段による前記ウェーハ(4)の前記膜(5)への付着ステップと、
c)前記変形手段による、前記接触面(5k)の方向への前記膜(5)の凸状に行われる変形および分離ステップと、を具備することを特徴とする方法。 - 前記ウェーハ(4)の分離前の前記キャリア(2)および前記ウェーハ(4)が、前記ウェーハ(4)とキャリア(2)との間にある接続手段(3)を緩ませるために加熱手段(15)により加熱されることを特徴とする請求項12に記載の方法。
- 請求項1から請求項11のいずれか一項に記載のデバイスを用いて、ウェーハ(4)をキャリア(2')に付加するための方法であって、
a)膜(5)と前記ウェーハ(4)との間の接触および付着手段による前記ウェーハ(4)の前記膜(5)への付着ステップと、
b)前記変形可能膜(5)およびそれに付着している前記ウェーハ(4)と、キャリア(2')との位置合せステップと、
c)前記変形手段による前記膜(5)および前記ウェーハ(4)の凸状変形および前記ウェーハ(4)の前記キャリア(2')への付加ステップと、を具備することを特徴とする方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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DE102008018536.1 | 2008-04-12 | ||
DE102008018536.1A DE102008018536B4 (de) | 2008-04-12 | 2008-04-12 | Vorrichtung und Verfahren zum Aufbringen und/oder Ablösen eines Wafers auf einen/von einem Träger |
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JP2009260317A JP2009260317A (ja) | 2009-11-05 |
JP5421629B2 true JP5421629B2 (ja) | 2014-02-19 |
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JP2009070508A Active JP5421629B2 (ja) | 2008-04-12 | 2009-03-23 | ウェーハをキャリアに付加しかつ/またはキャリアから分離させるためのデバイスおよび方法 |
Country Status (4)
Country | Link |
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US (1) | US8157615B2 (ja) |
JP (1) | JP5421629B2 (ja) |
AT (1) | AT506622B1 (ja) |
DE (1) | DE102008018536B4 (ja) |
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JP4201564B2 (ja) * | 2001-12-03 | 2008-12-24 | 日東電工株式会社 | 半導体ウエハ搬送方法およびこれを用いた半導体ウエハ搬送装置 |
US20060245138A1 (en) * | 2003-07-14 | 2006-11-02 | Koh Meng F | Perforated plate for water chuck |
JP2005150453A (ja) * | 2003-11-17 | 2005-06-09 | Taiyo Yuden Co Ltd | 薄型半導体ウェハーの剥離方法及びその装置並びに薄型半導体ウェハーの製造方法 |
US7549833B2 (en) * | 2006-05-04 | 2009-06-23 | David Tang | Unstacking apparatus and method for placing a sheet of glass from an upright glass stack into a tiltable glass frame |
TWI354347B (en) * | 2006-06-02 | 2011-12-11 | Applied Materials Inc | Fast substrate loading on polishing head without m |
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2008
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- 2009-03-12 US US12/402,542 patent/US8157615B2/en active Active
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AT506622A2 (de) | 2009-10-15 |
US8157615B2 (en) | 2012-04-17 |
JP2009260317A (ja) | 2009-11-05 |
AT506622B1 (de) | 2016-01-15 |
DE102008018536B4 (de) | 2020-08-13 |
US20090258583A1 (en) | 2009-10-15 |
DE102008018536A1 (de) | 2009-10-15 |
AT506622A3 (de) | 2012-11-15 |
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