JP5205240B2 - 分光モジュールの製造方法及び分光モジュール - Google Patents
分光モジュールの製造方法及び分光モジュール Download PDFInfo
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- JP5205240B2 JP5205240B2 JP2008311012A JP2008311012A JP5205240B2 JP 5205240 B2 JP5205240 B2 JP 5205240B2 JP 2008311012 A JP2008311012 A JP 2008311012A JP 2008311012 A JP2008311012 A JP 2008311012A JP 5205240 B2 JP5205240 B2 JP 5205240B2
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- JP
- Japan
- Prior art keywords
- light
- resin layer
- spectroscopic
- detection element
- light detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0202—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0243—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows having a through-hole enabling the optical element to fulfil an additional optical function, e.g. a mirror or grating having a throughhole for a light collecting or light injecting optical fiber
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
- G01J3/0259—Monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0262—Constructional arrangements for removing stray light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49826—Assembling or joining
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49826—Assembling or joining
- Y10T29/49895—Associating parts by use of aligning means [e.g., use of a drift pin or a "fixture"]
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Description
Claims (5)
- 光を透過させる本体部と、前記本体部の所定の面側から前記本体部に入射した光を分光すると共に前記所定の面側に反射する分光部と、前記分光部によって分光された光を検出する光検出素子と、を備える分光モジュールの製造方法であって、
前記分光部に進行する光が通過する光通過孔、及び前記光通過孔を包囲し且つ一部が前記光検出素子の外縁に至るガイド部を有する前記光検出素子を、前記所定の面に形成された配線にフェースダウンボンディングによって電気的に接続する工程と、
前記本体部と前記光検出素子との間に、前記ガイド部に沿うように第1の樹脂層を形成する工程と、
前記本体部と前記光検出素子との間における前記第1の樹脂層の外側に、前記光検出素子の光検出部に対向するように第2の樹脂層を形成する工程と、を含むことを特徴とする分光モジュールの製造方法。 - 前記第2の樹脂層は、前記第1の樹脂層よりも前記本体部との屈折率整合性が高い材料からなることを特徴とする請求項1記載の分光モジュールの製造方法。
- 前記第1の樹脂層は、前記第2の樹脂層よりも光吸収性が高い材料からなることを特徴とする請求項1又は2記載の分光モジュールの製造方法。
- 前記ガイド部の一部は、前記光検出素子において対向する外縁のそれぞれに至っていることを特徴とする請求項1〜3のいずれか一項記載の分光モジュールの製造方法。
- 請求項1〜4のいずれか一項記載の分光モジュールの製造方法によって製造されたことを特徴とする分光モジュール。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008311012A JP5205240B2 (ja) | 2008-05-15 | 2008-12-05 | 分光モジュールの製造方法及び分光モジュール |
US12/464,267 US8027034B2 (en) | 2008-05-15 | 2009-05-12 | Method for manufacturing spectroscopy module, and spectroscopy module |
DE102009021439A DE102009021439A1 (de) | 2008-05-15 | 2009-05-15 | Verfahren zum Herstellen eines Spektroskopiemoduls und Spektroskopiemodul |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008128687 | 2008-05-15 | ||
JP2008128687 | 2008-05-15 | ||
JP2008311012A JP5205240B2 (ja) | 2008-05-15 | 2008-12-05 | 分光モジュールの製造方法及び分光モジュール |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009300416A JP2009300416A (ja) | 2009-12-24 |
JP5205240B2 true JP5205240B2 (ja) | 2013-06-05 |
Family
ID=41268991
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008311012A Active JP5205240B2 (ja) | 2008-05-15 | 2008-12-05 | 分光モジュールの製造方法及び分光モジュール |
Country Status (3)
Country | Link |
---|---|
US (1) | US8027034B2 (ja) |
JP (1) | JP5205240B2 (ja) |
DE (1) | DE102009021439A1 (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5205238B2 (ja) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | 分光モジュール |
JP5205242B2 (ja) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | 分光器の製造方法 |
JP5205243B2 (ja) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | 分光器 |
JP2009300422A (ja) * | 2008-05-15 | 2009-12-24 | Hamamatsu Photonics Kk | 分光モジュール |
JP5207938B2 (ja) * | 2008-05-15 | 2013-06-12 | 浜松ホトニクス株式会社 | 分光モジュール及び分光モジュールの製造方法 |
JP5512961B2 (ja) * | 2008-05-15 | 2014-06-04 | 浜松ホトニクス株式会社 | 分光モジュール及びその製造方法 |
JP2009300417A (ja) * | 2008-05-15 | 2009-12-24 | Hamamatsu Photonics Kk | 分光モジュールの製造方法及び分光モジュール |
JP2009300418A (ja) | 2008-05-15 | 2009-12-24 | Hamamatsu Photonics Kk | 分光モジュール |
JP5415060B2 (ja) | 2008-05-15 | 2014-02-12 | 浜松ホトニクス株式会社 | 分光モジュール |
JP5205241B2 (ja) * | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | 分光モジュール |
WO2011134156A1 (zh) | 2010-04-29 | 2011-11-03 | 晶兆科技股份有限公司 | 具有锥状狭缝的微型光谱仪的光机模块及其狭缝结构 |
JP2015106106A (ja) | 2013-12-02 | 2015-06-08 | セイコーエプソン株式会社 | 電子デバイスおよび電子機器 |
Family Cites Families (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3509131A1 (de) | 1985-03-14 | 1986-09-18 | Fa. Carl Zeiss, 7920 Heidenheim | Verfahren zur justierten montage der optischen bauteile eines optischen geraetes |
JP2592081B2 (ja) | 1987-12-28 | 1997-03-19 | スズキ株式会社 | 自動二輪車等のマフラ |
DE4038638A1 (de) | 1990-12-04 | 1992-06-11 | Zeiss Carl Fa | Diodenzeilen-spektrometer |
JPH04287001A (ja) | 1991-03-15 | 1992-10-12 | Sekinosu Kk | 光回折格子の製造方法 |
JPH06167637A (ja) | 1992-11-30 | 1994-06-14 | Hitachi Ltd | 多芯光コネクタ |
JPH08145794A (ja) | 1994-11-17 | 1996-06-07 | Shimadzu Corp | 分光器 |
US6224912B1 (en) | 1996-04-03 | 2001-05-01 | The Rogo Institute | Cancer-cell proliferation-suppressing material produced by cancer cells restricted by entrapment |
US5995221A (en) | 1997-02-28 | 1999-11-30 | Instruments S.A., Inc. | Modified concentric spectrograph |
US6303934B1 (en) | 1997-04-10 | 2001-10-16 | James T. Daly | Monolithic infrared spectrometer apparatus and methods |
DE19717015A1 (de) | 1997-04-23 | 1998-10-29 | Inst Mikrotechnik Mainz Gmbh | Miniaturisiertes optisches Bauelement sowie Verfahren zu seiner Herstellung |
EP0942267B1 (de) * | 1998-03-11 | 2006-08-30 | Gretag-Macbeth AG | Spektrometer |
DE59913150D1 (de) | 1999-04-01 | 2006-04-27 | Gretag Macbeth Ag Regensdorf | Spektrometer |
JP4287001B2 (ja) | 1999-10-27 | 2009-07-01 | 帝人株式会社 | 透明導電積層体 |
US6538736B1 (en) | 1999-12-01 | 2003-03-25 | Hach Company | Concentric spectrometer with mitigation of internal specular reflections |
WO2002004901A1 (en) | 2000-07-11 | 2002-01-17 | Adc Telecommunications, Inc. | Monitoring apparatus for optical transmission systems |
KR20030026326A (ko) | 2000-07-28 | 2003-03-31 | 오츠카 일렉트로닉스 가부시키가이샤 | 스펙트럼 광 검출장치 |
US6657723B2 (en) | 2000-12-13 | 2003-12-02 | International Business Machines Corporation | Multimode planar spectrographs for wavelength demultiplexing and methods of fabrication |
JP2003139611A (ja) | 2001-11-06 | 2003-05-14 | Olympus Optical Co Ltd | 分光光度計 |
JP3818441B2 (ja) | 2002-02-20 | 2006-09-06 | 日本電信電話株式会社 | 基板実装構造及び半導体装置 |
FR2847978B1 (fr) | 2002-12-02 | 2005-12-02 | Technologie Optique Et Etudes | Spectrometre compact a composant optique monolithique |
JP2004191246A (ja) * | 2002-12-12 | 2004-07-08 | Matsushita Electric Ind Co Ltd | 凹凸検出センサ |
EP1605513B1 (en) * | 2003-03-10 | 2015-01-07 | Hamamatsu Photonics K.K. | Photodiode array, method for manufacturing same, and radiation detector |
JP2004309146A (ja) | 2003-04-02 | 2004-11-04 | Olympus Corp | 分光光度計 |
JP4409860B2 (ja) * | 2003-05-28 | 2010-02-03 | 浜松ホトニクス株式会社 | 光検出器を用いた分光器 |
JP4473665B2 (ja) * | 2004-07-16 | 2010-06-02 | 浜松ホトニクス株式会社 | 分光器 |
WO2006010367A2 (en) | 2004-07-26 | 2006-02-02 | Danmarks Tekniske Universitet | On-chip spectroscopy |
US7330258B2 (en) | 2005-05-27 | 2008-02-12 | Innovative Technical Solutions, Inc. | Spectrometer designs |
JP4811032B2 (ja) | 2006-01-30 | 2011-11-09 | 株式会社島津製作所 | 反射型レプリカ光学素子 |
US7697137B2 (en) | 2006-04-28 | 2010-04-13 | Corning Incorporated | Monolithic Offner spectrometer |
EP1882916A1 (en) | 2006-07-20 | 2008-01-30 | Interuniversitair Microelektronica Centrum | Compact catadioptric spectrometer |
JP5182093B2 (ja) | 2006-09-06 | 2013-04-10 | 株式会社ニコン | 光学装置、露光装置、並びにデバイス製造方法 |
WO2008149939A1 (ja) | 2007-06-08 | 2008-12-11 | Hamamatsu Photonics K.K. | 分光器 |
US8045155B2 (en) * | 2007-06-08 | 2011-10-25 | Hamamatsu Photonics K.K. | Spectroscopic module |
JP4891841B2 (ja) * | 2007-06-08 | 2012-03-07 | 浜松ホトニクス株式会社 | 分光モジュール |
JP5512961B2 (ja) | 2008-05-15 | 2014-06-04 | 浜松ホトニクス株式会社 | 分光モジュール及びその製造方法 |
JP2009300418A (ja) | 2008-05-15 | 2009-12-24 | Hamamatsu Photonics Kk | 分光モジュール |
JP5207938B2 (ja) | 2008-05-15 | 2013-06-12 | 浜松ホトニクス株式会社 | 分光モジュール及び分光モジュールの製造方法 |
JP5415060B2 (ja) | 2008-05-15 | 2014-02-12 | 浜松ホトニクス株式会社 | 分光モジュール |
JP5205243B2 (ja) | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | 分光器 |
JP5205238B2 (ja) | 2008-05-15 | 2013-06-05 | 浜松ホトニクス株式会社 | 分光モジュール |
-
2008
- 2008-12-05 JP JP2008311012A patent/JP5205240B2/ja active Active
-
2009
- 2009-05-12 US US12/464,267 patent/US8027034B2/en not_active Expired - Fee Related
- 2009-05-15 DE DE102009021439A patent/DE102009021439A1/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JP2009300416A (ja) | 2009-12-24 |
DE102009021439A1 (de) | 2009-12-10 |
US20090290154A1 (en) | 2009-11-26 |
US8027034B2 (en) | 2011-09-27 |
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