JP2903814B2 - Manufacturing method of wiring board - Google Patents
Manufacturing method of wiring boardInfo
- Publication number
- JP2903814B2 JP2903814B2 JP32882691A JP32882691A JP2903814B2 JP 2903814 B2 JP2903814 B2 JP 2903814B2 JP 32882691 A JP32882691 A JP 32882691A JP 32882691 A JP32882691 A JP 32882691A JP 2903814 B2 JP2903814 B2 JP 2903814B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- layer
- metal
- copper
- plating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 19
- 229910052751 metal Inorganic materials 0.000 claims description 54
- 239000002184 metal Substances 0.000 claims description 54
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 44
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 30
- 229910052802 copper Inorganic materials 0.000 claims description 27
- 239000010949 copper Substances 0.000 claims description 27
- 238000005530 etching Methods 0.000 claims description 21
- 238000007747 plating Methods 0.000 claims description 21
- 239000000758 substrate Substances 0.000 claims description 19
- 229910052759 nickel Inorganic materials 0.000 claims description 15
- 238000005260 corrosion Methods 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 13
- 239000011888 foil Substances 0.000 claims description 12
- 230000007797 corrosion Effects 0.000 claims description 11
- 238000009713 electroplating Methods 0.000 claims description 4
- 238000010030 laminating Methods 0.000 claims 1
- 239000011889 copper foil Substances 0.000 description 17
- 238000009413 insulation Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 239000002585 base Substances 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 238000005553 drilling Methods 0.000 description 4
- 239000004744 fabric Substances 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000003475 lamination Methods 0.000 description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 229910001431 copper ion Inorganic materials 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
Landscapes
- Parts Printed On Printed Circuit Boards (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、配線板の製造法に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a wiring board.
【0002】[0002]
【従来の技術】従来、配線板の製造には、配線形成性と
銅箔の取り扱い易さの関係から、18〜35μmの厚さ
の銅箔が一般的に用いられてきた。しかし、最近の高密
度化への対応から、2.54mmピッチの部品穴の間に
5本配線も行なわれるようになり、微細配線形成に有利
な5〜12μm厚さの極薄銅箔も検討され始めているこ
とが、日刊工業新聞社発行の雑誌「電子技術」1991
−6月別冊、33、8、P70等により知られている。
特に5〜9μm厚さの極薄銅箔では、取り扱い性の点か
らアルミキャリア付きのものが一般的であることも同雑
誌のP101、表1に記載されている。2. Description of the Related Art Conventionally, copper foils having a thickness of 18 to 35 .mu.m have been generally used in the production of wiring boards from the viewpoint of wiring formability and ease of handling of copper foils. However, in response to recent high densification, five wires are also provided between component holes with a pitch of 2.54 mm, and ultra-thin copper foil with a thickness of 5 to 12 μm, which is advantageous for forming fine wires, is being studied. Is being started to be published in the magazine “Electronic Technology” published by Nikkan Kogyo Shimbun 1991
-June, 33, 8, p.
Particularly, it is described in P101 of the magazine and Table 1 that ultra-thin copper foil having a thickness of 5 to 9 μm is generally provided with an aluminum carrier from the viewpoint of handleability.
【0003】[0003]
【発明が解決しようとする課題】微細配線を形成するた
めに、積層時の銅箔として、アルミキャリア付き銅箔を
用いた場合、表面のアルミを完全に除去する必要があ
る。その方法として、機械的に引き剥して除去する方法
と溶解除去する方法がある。機械的に引き剥して除去す
る場合、完全に除去することが困難であり、酸もしくは
アルカリで溶解除去する場合は、大量の水素が発生し危
険であるという問題点があった。また、アルミキャリア
付き銅箔の場合、基材と接する面の凹凸の大きさが、銅
箔部分の厚さで制限されるため、銅箔厚さを薄くする
程、銅箔の引き剥し強さが低下するという問題があっ
た。また、銅を配線に用いた場合、微細配線を形成した
配線板において、配線から銅イオンが溶けだし、絶縁信
頼性を低下させる課題があった。本発明は、大量の水素
を発生させることなく、銅箔の引き剥がし強さも良好で
あり、絶縁信頼性も高い配線板の製造法を提供するもの
であり、特に、80μm巾以下の微細配線を含む配線板
の製造法を提供することを目的としている。When a copper foil with an aluminum carrier is used as a copper foil at the time of lamination to form fine wiring, it is necessary to completely remove aluminum on the surface. As a method therefor, there are a method of mechanically peeling off and a method of dissolving and removing. When it is mechanically peeled off, it is difficult to completely remove it, and when it is dissolved and removed with an acid or an alkali, a large amount of hydrogen is generated, which is dangerous. In addition, in the case of copper foil with an aluminum carrier, since the size of the irregularities on the surface in contact with the base material is limited by the thickness of the copper foil portion, the thinner the copper foil thickness, the stronger the peeling strength of the copper foil. However, there was a problem that was reduced. Further, when copper is used for the wiring, in a wiring board on which fine wiring is formed, there is a problem that copper ions start to melt from the wiring, thereby lowering insulation reliability. The present invention provides a method for manufacturing a wiring board that does not generate a large amount of hydrogen, has good peeling strength of a copper foil, and has high insulation reliability. It is intended to provide a method for manufacturing a wiring board including the same.
【0004】[0004]
【課題を解決するための手段】本発明の製造法は、エッ
チング条件の異なる2種の金属層と、銅層と、耐電食性
の金属層の4層からなる金属箔を、基材と積層し基板を
作製する工程、選択的エッチングにより前記エッチング
条件の異なる2種の金属層を溶解除去する工程、基板に
穴あけをする工程、基板の穴壁及び基板表面の少なくと
も一部にめっきを行なう工程、基板表面の不要な金属部
分をエッチング除去する工程を含むことを特徴とする。According to the manufacturing method of the present invention, a metal foil composed of four layers of two kinds of metal layers having different etching conditions, a copper layer, and an anti-corrosion metal layer is laminated on a substrate. A step of preparing a substrate, a step of dissolving and removing two kinds of metal layers having different etching conditions by selective etching, a step of drilling a substrate, a step of plating at least a part of a hole wall of the substrate and a surface of the substrate, The method includes a step of etching and removing unnecessary metal portions on the substrate surface.
【0005】図1の実施例により、本発明の詳細な説明
を行なう。金属箔として、選択的エッチングが可能な2
金属層(図中の11、12、)銅層13、耐電食性の金
属層14からなる金属箔1を用意する。選択的エッチン
グが可能な金属層11は、金属箔の支持体の役割と、積
層時の銅箔の接着強度を向上させるための凹凸形状を持
たす役割を担っており、厚さの下限は5μm以上、より
望ましくは10μm以上である。厚さの上限は、経済的
な面から70μm以下、より望ましくは、35μm以下
である。選択的エッチングが可能な金属層12は、選択
的エッチングが可能な金属層11のエッチング時に停止
層の役割を担うと共に、次に銅層13を残して溶解除去
が可能なことが必要である。経済的には厚さは薄い程良
く、最小値はピンホール等の欠陥の有無によって決ま
る。望ましい厚さは、0.1〜5μmであり、より望ま
しくは、0.3〜2μmである。銅層13は、選択的エ
ッチング可能な金属層11、12を除去した後に、その
後の配線層形成のための下地の役割と、基板穴あけ時の
基材保護の役割を担っている。微細配線形成のために
は、銅層13の厚さは薄い程良く、基材保護のためには
厚い方が良い。両者を満たす望ましい厚さは、1〜10
μmであり、より望ましくは、3〜5μmである。耐電
食性の金属層14は、銅に比べ基材中へイオンが移動し
にくい金属の層であり、絶縁信頼性を向上させる役割を
担う。この厚さは、0.1〜1μmの厚さで充分であ
り、それ以上の厚さは不必要である。選択的エッチング
可能な金属層11、12及び耐電食性の金属層14に用
いることのできる材料は、上記に述べた役割を果たしう
る金属の組合せならば制限はないが、11〜14の金属
層が電気めっきによって順次形成できる金属の組合せが
特に適する。従来の銅箔の製造法、及び配線板の製造法
の適合性からすると、選択的エッチング可能な金属層1
1、12としては、この順に銅、ニッケルが適してお
り、耐電食性の金属層14としては、ニッケルが適して
いる。The present invention will be described in detail with reference to the embodiment shown in FIG. Selectable etching 2 as metal foil
A metal foil 1 composed of a metal layer (11, 12 in the figure), a copper layer 13, and an anti-corrosion metal layer 14 is prepared. The metal layer 11 that can be selectively etched has a role of a support of the metal foil and a role of having an uneven shape for improving the adhesive strength of the copper foil at the time of lamination, and the lower limit of the thickness is 5 μm or more. , More preferably 10 μm or more. The upper limit of the thickness is 70 μm or less, more preferably 35 μm or less, from an economic viewpoint. The selectively etchable metal layer 12 must serve as a stop layer when the selectively etchable metal layer 11 is etched, and must be capable of being dissolved and removed while leaving the copper layer 13 next. Economically, the smaller the thickness, the better. The minimum value is determined by the presence or absence of a defect such as a pinhole. Desirable thickness is 0.1-5 μm, more preferably 0.3-2 μm. After removing the metal layers 11 and 12 that can be selectively etched, the copper layer 13 has a role of a base for forming a wiring layer thereafter and a role of protecting the base material when drilling a substrate. The thinner the copper layer 13 is, the better the fine wiring is formed, and the thicker the copper layer 13 is. Desirable thicknesses satisfying both are 1 to 10
μm, and more preferably 3 to 5 μm. The corrosion-resistant metal layer 14 is a metal layer in which ions are less likely to move into the base material than copper, and plays a role in improving insulation reliability. As for this thickness, a thickness of 0.1 to 1 μm is sufficient, and a further thickness is unnecessary. The material that can be used for the selectively etchable metal layers 11 and 12 and the corrosion-resistant metal layer 14 is not limited as long as it is a combination of metals that can play the role described above. Combinations of metals that can be formed sequentially by electroplating are particularly suitable. In view of the compatibility of the conventional copper foil manufacturing method and the wiring board manufacturing method, the selectively etchable metal layer 1
Copper and nickel are suitable for 1 and 12 in this order, and nickel is suitable for the corrosion-resistant metal layer 14.
【0006】上記の金属箔1と基材2を積層する(図
1、(b))。基材2としては、一般的な樹脂系材料な
らば、特に制限はないが、特にガラス布入エポキシ樹脂
や、ガラス布入りポリイミド樹脂が適している。多層配
線を形成する場合には、予め配線加工した内層配線層を
共に積層する。The above-mentioned metal foil 1 and substrate 2 are laminated (FIG. 1, (b)). The substrate 2 is not particularly limited as long as it is a general resin-based material, and particularly, an epoxy resin with a glass cloth and a polyimide resin with a glass cloth are suitable. When forming a multilayer wiring, inner wiring layers that have been processed in advance are laminated together.
【0007】このようにしてできた積層物の選択的エッ
チング可能な金属層11、12の溶解除去(図1
(c)、(d))と穴あけ(図1(e))行なう。な
お、図1では、溶解除去後に穴あけをした例を示してい
るが、先に穴あけをしても良く、また、選択的エッチン
グ可能な金属層11の溶解除去後に穴あけをしても良
い。Dissolution and removal of the selectively etchable metal layers 11 and 12 of the resulting laminate (FIG. 1)
(C), (d)) and drilling (FIG. 1 (e)). Although FIG. 1 shows an example in which holes are formed after dissolving and removing, holes may be formed first, or holes may be formed after dissolving and removing the selectively etchable metal layer 11.
【0008】この後、図1では、パターンめっきを行な
う方法を示しており、有機系レジスト4でパターンを形
成後、銅めっき5と金属系エッチングレジスト6のめっ
きを行なう(図1(g))。金属系エッチングレジスト
としては、はんだや、ニッケル、錫、金を用いることが
できる。Thereafter, FIG. 1 shows a method of performing pattern plating. After a pattern is formed with an organic resist 4, a copper plating 5 and a metal etching resist 6 are plated (FIG. 1 (g)). . As the metal-based etching resist, solder, nickel, tin, or gold can be used.
【0009】この後、有機系レジスト4を除去し、不要
部分の銅層の除去と、耐電食層の除去を行なう(図1
(j))。金属系エッチングレジストは、必要に応じて
除去を行なえば良い。Thereafter, the organic resist 4 is removed, and the copper layer in the unnecessary portions and the corrosion-resistant layer are removed (FIG. 1).
(J)). The metal etching resist may be removed as needed.
【0010】なお、図1は、(f)以下、直接にパター
ンめっきを行なう方法を示したが、穴壁含め、基板全体
にパネルめっきをした後、不要部分をエッチング除去し
ても良いし、パネルめっきとパターンめっきを併用して
も良い。FIG. 1 (f) shows a method in which pattern plating is carried out directly below. However, after performing panel plating on the entire substrate including the hole walls, unnecessary portions may be removed by etching. Panel plating and pattern plating may be used in combination.
【0011】耐電食性をより向上させるためには、上記
の穴壁への銅めっきに先立ち、ニッケルめっきを施して
おくことが良く、その厚さは、0.1μm以上必要であ
り、1μm以下で充分である。In order to further improve the electrolytic corrosion resistance, it is preferable to apply nickel plating before the copper plating on the hole wall, and the thickness is required to be 0.1 μm or more, and 1 μm or less. Is enough.
【0012】[0012]
【作用】細い配線中の配線を形成するためには、最終的
なエッチングの厚さを薄くする必要がある。本発明の場
合、エッチング厚さは、穴壁を含め30μmの厚さのパ
ネルめっきを行なっても、銅層が10μmとしてたかだ
か40μmであり、図1に示したような、パターンめっ
きの場合、エッチング厚さは、銅層13の厚さのみとな
り、10μm以下である。上記文献では80μmの配線
形成には、エッチング厚さが45μm以下の必要がある
が、本発明は、これを満たし、容易に微細な配線が形成
できることがわかる。また、耐電食性の金属層が設けら
れているため、微細な配線間隔でも、配線に用いられて
いる金属のイオン化によるマイグレーションが起こりに
くく、絶縁信頼性の高い配線板が得られる。In order to form a wiring in a thin wiring, it is necessary to reduce the final etching thickness. In the case of the present invention, the etching thickness is at most 40 μm when the copper layer is 10 μm even when the panel plating including the hole walls is performed at a thickness of 30 μm. In the case of the pattern plating as shown in FIG. The thickness is only the thickness of the copper layer 13 and is 10 μm or less. According to the above-mentioned document, an etching thickness of 45 μm or less is required to form a wiring of 80 μm. However, it is understood that the present invention satisfies this requirement and that fine wiring can be easily formed. In addition, since the metal layer having electric corrosion resistance is provided, migration due to ionization of the metal used in the wiring is less likely to occur even at a fine wiring interval, and a wiring board with high insulation reliability can be obtained.
【0013】[0013]
【実施例】図1ににもとづいて説明を行なう。選択的エ
ッチング可能な金属層11、12として、それぞれ、銅
30μm、厚さ、ニッケル(含リン)0.5μm厚さ
を、電気めっきにより形成した。この後、銅層13とし
て銅を5μm、耐電食性の金属層としてニッケル(含リ
ン)0.5μm厚さめっきした。なお、11には8〜1
0μmの凹凸を、13には、1〜3μmの凹凸ができる
ような公知の処理を行なった。この金属箔と、ガラス布
入りエポキシを積層接着した(図1(b))。この積層
物の11の銅及び12のニッケルを、それぞれ公知のア
ルカリエッチャント、トップリップAZ(ニッケル剥離
液、奥野製薬株式会社製、商品名)で溶解除去した(図
1(d))。このものに穴あけ後、フォテック、HF4
50(ドライフィルム、日立化成工業株式会社製、商品
名)でパターン形成後(図1(f))、銅めっきを30
μm厚さ、はんだめっきを8μm厚さでそれぞれ電気め
っきした(図1(f))。フォテックHF450を剥離
後、アルカリエッチャントで不要部の銅を除去し(図1
(i))、トップリップAZで、不要部のニッケルを除
去した(図1(j))。このようにして、配線形成を行
なった結果、60μm巾の配線も形成できた。また、銅
箔の引き剥がし強さを測定した結果、1.4Kgf/c
mであった。DESCRIPTION OF THE PREFERRED EMBODIMENTS An explanation will be given based on FIG. Copper 30 μm, thickness, and nickel (containing phosphorus) 0.5 μm thickness were formed by electroplating as metal layers 11 and 12 which can be selectively etched. Thereafter, copper was plated as a copper layer 13 to a thickness of 5 μm, and nickel (containing phosphorus) was plated to a thickness of 0.5 μm as an anticorrosion metal layer. In addition, 8 is 1 to 11
A well-known process was performed so that the unevenness of 0 μm and the unevenness of 13 to 1 to 3 μm were formed. This metal foil and epoxy containing glass cloth were laminated and bonded (FIG. 1B). Copper and nickel of 11 of this laminate were dissolved and removed with a known alkaline etchant and Top Lip AZ (nickel stripping solution, manufactured by Okuno Pharmaceutical Co., Ltd., respectively) (FIG. 1 (d)). After drilling this product, Photek, HF4
After pattern formation with 50 (dry film, manufactured by Hitachi Chemical Co., Ltd., trade name) (FIG. 1 (f)), copper plating was
A thickness of 8 μm and solder plating were respectively electroplated to a thickness of 8 μm (FIG. 1 (f)). After peeling off the Photek HF450, unnecessary copper is removed with an alkaline etchant (Fig. 1).
(I)) In the top lip AZ, unnecessary portions of nickel were removed (FIG. 1 (j)). As a result of forming the wiring in this manner, a wiring having a width of 60 μm was formed. In addition, as a result of measuring the peel strength of the copper foil, 1.4 kgf / c was obtained.
m.
【0014】[0014]
【発明の効果】本発明により、エッチング条件の異なる
2種の金属層について、金属箔製造時のコスト、エッチ
ング除去時の生産性の最適化をはかるように金属層の組
合わせを選択できる。また、積層時には、金属箔の厚さ
が厚く、取り扱いが容易であり、極薄銅箔付積層板を容
易に得ることができる。また、電気めっきによって形成
すれば、金属箔の製造が容易となり、樹脂層と接着力を
上げるために、現在の銅箔製造で行なわれている凹凸形
状の付与処理を、適用することが容易となる。さらに、
銅層、ニッケル層とすることにより、一般的な銅箔の製
造ラインを適用することが容易となり、生産性が向上
し、配線加工時の製造ラインとの適合性も良い。本発明
により、耐電食性の金属層について、配線板の絶縁信頼
性が向上する。また、ニッケル層を使用することによ
り、比較的低コストで、容易に製造でき、しかも、充分
な耐電食効果を得ることができる。また、穴壁にもニッ
ケルで被覆することにより、配線板のより一層の絶縁信
頼性を得ることができる。According to the present invention, for two types of metal layers having different etching conditions, a combination of metal layers can be selected so as to optimize the cost in manufacturing the metal foil and the productivity in removing the etching. In addition, at the time of lamination, the thickness of the metal foil is large, handling is easy, and a laminate with an ultra-thin copper foil can be easily obtained. Also, if formed by electroplating, the production of metal foil becomes easy, and in order to increase the adhesive strength with the resin layer, it is easy to apply the unevenness imparting treatment currently performed in copper foil production. Become. further,
By using a copper layer and a nickel layer, a general copper foil production line can be easily applied, productivity is improved, and compatibility with the production line at the time of wiring processing is good. According to the present invention, the insulation reliability of the wiring board is improved with respect to the metal layer having corrosion resistance. In addition, by using the nickel layer, it is possible to manufacture easily at a relatively low cost, and it is possible to obtain a sufficient anti-corrosion effect. Further, by covering the hole walls with nickel, it is possible to obtain further insulation reliability of the wiring board.
【図1】本発明の一実施例を示す配線板の製造法の各工
程の断面図である。FIG. 1 is a cross-sectional view of each step of a method for manufacturing a wiring board according to an embodiment of the present invention.
1 金属箔 11 選択的エッチングが可能な金属箔 12 選択的エッチングが可能な金属層 13 銅層 14 耐電食性の金属層 2 基材 3 穴 4 有機系めっきレジスト 5 銅めっき 6 金属系エッチングレジスト DESCRIPTION OF SYMBOLS 1 Metal foil 11 Metal foil which can be selectively etched 12 Metal layer which can be selectively etched 13 Copper layer 14 Metal layer of electric corrosion resistance 2 Base material 3 Hole 4 Organic plating resist 5 Copper plating 6 Metal etching resist
───────────────────────────────────────────────────── フロントページの続き (72)発明者 中祖 昭士 茨城県下館市大字小川1500番地 日立化 成工業株式会社 下館研究所内 (56)参考文献 特開 平1−251691(JP,A) 特開 平2−239687(JP,A) 特開 平1−255295(JP,A) (58)調査した分野(Int.Cl.6,DB名) H05K 3/00 - 3/42 H05K 1/09 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor: Shoji Nakaso 1500 Ogawa, Oji, Shimodate City, Ibaraki Prefecture Hitachi Chemical Co., Ltd. Shimodate Research Laboratory (56) References JP-A-1-2511691 (JP, A) JP-A-2-239687 (JP, A) JP-A-1-255295 (JP, A) (58) Fields investigated (Int. Cl. 6 , DB name) H05K 3/00-3/42 H05K 1/09
Claims (5)
銅層と、耐電食性の金属層の4層からなる金属箔を、基
材と積層し基板を作製する工程、選択的エッチングによ
り前記エッチング条件の異なる2種の金属層を溶解除去
する工程、基板に穴あけをする工程、基板の穴壁及び基
板表面の少なくとも一部にめっきを行なう工程、基板表
面の不要な金属部分をエッチング除去する工程を含むこ
とを特徴とする配線板の製造法。1. Two kinds of metal layers having different etching conditions,
A step of forming a substrate by laminating a metal foil composed of four layers of a copper layer and a corrosion-resistant metal layer with a substrate, a step of dissolving and removing two types of metal layers having different etching conditions by selective etching, Forming a hole in a substrate, plating at least a part of a hole wall of the substrate and at least a part of the surface of the substrate, and etching and removing an unnecessary metal portion on the surface of the substrate.
と、銅層と、耐電食性の金属層の4層を、順次、電気め
っきによって形成した金属層であることを特徴とする請
求項1に記載の配線板の製造法。2. A metal layer formed by sequentially electroplating two types of metal layers having different etching conditions, a copper layer, and a corrosion-resistant metal layer. 3. The method for producing a wiring board according to item 1.
が、前記積層した基板の表面から、順に、銅層、ニッケ
ル層となっていることを特徴とする請求項1または2に
記載の配線板の製造法。3. The wiring according to claim 1, wherein the two types of metal layers having different etching conditions are a copper layer and a nickel layer in order from the surface of the laminated substrate. The method of manufacturing the board.
ることを特徴とする請求項1〜3のうちいずれかに記載
の配線板の製造法。4. The method for manufacturing a wiring board according to claim 1, wherein said metal layer having electrical corrosion resistance is a nickel layer.
一部に行なうめっきが、ニッケルめっきと銅めっきの複
層めっきであることを特徴とする請求項1〜4のうちい
ずれかに記載の配線板の製造法。5. The plating method according to claim 1, wherein the plating performed on at least a part of the hole wall of the substrate and the surface of the substrate is a multi-layer plating of nickel plating and copper plating. Manufacturing method of wiring board.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32882691A JP2903814B2 (en) | 1991-12-12 | 1991-12-12 | Manufacturing method of wiring board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32882691A JP2903814B2 (en) | 1991-12-12 | 1991-12-12 | Manufacturing method of wiring board |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH05167220A JPH05167220A (en) | 1993-07-02 |
JP2903814B2 true JP2903814B2 (en) | 1999-06-14 |
Family
ID=18214519
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP32882691A Expired - Lifetime JP2903814B2 (en) | 1991-12-12 | 1991-12-12 | Manufacturing method of wiring board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2903814B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003101218A (en) * | 2001-09-21 | 2003-04-04 | Hitachi Chem Co Ltd | Method for manufacturing printed circuit board |
JP2003101194A (en) * | 2001-09-21 | 2003-04-04 | Hitachi Chem Co Ltd | Production method for printed wiring board |
JP4736703B2 (en) * | 2005-10-14 | 2011-07-27 | 宇部興産株式会社 | Method for producing copper wiring polyimide film |
-
1991
- 1991-12-12 JP JP32882691A patent/JP2903814B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH05167220A (en) | 1993-07-02 |
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