JP2600040Y2 - Dynamic balance testing machine - Google Patents

Description

[Detailed description of the invention]

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dynamic equilibrium tester which measures the amount of unbalance around the axis of a specimen and removes the amount of unbalance after measurement.

[0002]

2. Description of the Related Art An unbalanced amount and an unbalanced position of a specimen such as a motor rotor around an axis are measured, an unbalanced position is determined after the measurement, and then the specimen is pressed by a notch device to determine the position. After the position is determined, the pressing is released, then the specimen is gripped by hand, transported to the correction device by the transport mechanism, and the specimen is clamped on the correction device, and then the unbalance is removed by the cutter. A testing machine has been conventionally known. Hereinafter, this conventional device is referred to as Conventional Example 1. In addition, the unbalance amount and the unbalance position around the axis of the specimen are measured on the first surface and the second surface, and after the measurement, the unbalance position of the first surface is determined. The specimen is transported to the correction device, the specimen is clamped on the modification device on the first surface, the unbalance of the first surface is removed with a cutter, and the specimen is further transported to the indexing mechanism by the transport mechanism, and the second specimen is transported to the indexing mechanism. Find the unbalanced position of the surface, and then
2. Description of the Related Art A dynamic balancing tester that transports a specimen to a second-side correcting device, clamps the test piece on the second-surface correcting device, and removes unbalance on the second surface with a cutter is conventionally known. Hereinafter, this conventional device is referred to as Conventional Example 2.

[0003]

However, the dynamic balancing tester of the prior art 1 has the following problems.
The notch device interferes with the gripping operation of the hand, so it is necessary to release the pressing of the specimen by the notch device before gripping with the hand. The specimen may move. In addition, since the specimen transported to the correction device is released from the transport mechanism and delivered to the correction device, and then clamped by the correction device, the unbalanced position of the specimen indexed by the measurement device is slightly shifted. Sometimes.

In the dynamic balance tester of the second conventional example, in addition to the same problems as those of the first conventional example on the measuring device and the first and second correction devices, the correction position of the second surface is also improved. A similar problem arises with the indexing mechanism described above. In other words, the conventional indexing device has a configuration in which the specimen is set on a pair of rollers, and the rollers are rotated to determine the corrected position of the second surface of the specimen. It is difficult to determine accurately with force. Therefore, the accumulation error of a slight shift in each device or mechanism becomes large, and accurate unbalance correction cannot be performed. In some cases, the unbalance amount cannot be sufficiently corrected in one measurement and correction process.

It is an object of the present invention to provide a dynamic balance testing machine which prevents a shift of an indexing position when setting a specimen on a correction device or an indexing mechanism.

[0006]

According to a first aspect of the present invention, there is provided a measuring means for measuring an unbalanced amount and an unbalanced position around an axis of a specimen, and calculating the unbalanced position after the measurement. Imbalance correcting means for cutting off the outer peripheral surface of the specimen to remove the unbalanced amount, gripping the specimen with a gripping means, and moving the specimen between the measuring means and the unbalance correcting means. The present invention is applied to a dynamic balance tester having a conveying means for conveying. The above object is achieved by providing a correction means with a correction position fixing means for fixing the specimen gripped by the gripping means on the unbalance correcting means without interfering with the gripping means. The invention of claim 2 is applied to a dynamic balance testing machine that performs unbalance correction of a specimen on the first surface and the second surface. The above-mentioned object is to provide an indexing means for calculating a correction position of the second surface after the correction of the first surface, the test specimen gripped by the gripping means on the indexing means without interfering with the gripping means. This is achieved by providing indexing position fixing means for fixing.

[0007]

According to the present invention, the specimen gripped by the gripping means is fixed by the correction position fixing means on the unbalance correcting means without interfering with the gripping means, and is corrected in that state. Therefore, it is possible to set the unbalance correcting means in the position held by the holding means. According to the second aspect, the specimen gripped by the gripping means after the correction of the first surface is completed is indexed on the indexing means for determining the corrected position of the second surface without interfering with the gripping means. It is fixed by position fixing means. Therefore, the specimen can be set on the indexing means with the position gripped by the gripping means, can be gripped by the gripping means while the position of the specimen after indexing is fixed, and can be accurately positioned on the second correcting means.

[0008]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of a dynamic balance testing machine according to the present invention will be described with reference to FIGS. The specimen used in this embodiment is, for example, a motor rotor W that rotates around a rotation axis as shown in FIG.
As shown in FIG. 2 (b), eight slots S are formed in the axial direction on the outer peripheral surface of the main body MB, a commutator COM is provided on one end side of the main body MB, and a shaft SH1 protrudes from an end face of the commutator COM. The shaft SH2 also protrudes from the other end surface of the main body MB. Motor rotor W shown in FIG.
When there is a certain axial length as shown in FIG.
The unbalance at the point DP1 on the H1 side (referred to as unbalance of the first surface) and the unbalance at the point DP2 on the other shaft SH2 side (referred to as unbalance of the second surface) are measured, and the main body MB is measured. Must be removed to correct the imbalance between the first and second surfaces. Hereinafter, a dynamic balance tester for measuring and correcting the unbalance of the specimen W shown in FIG. 2 will be described with reference to FIGS.

FIG. 1 is a plan view showing the overall configuration of a dynamic balance tester, wherein 100 is a supply device for supplying a specimen W to the dynamic balance tester, and 200 is a device main body. Device body 2
00 measures the unbalance between the transport device 210 that rotates and transports the test object W and the test object W transported by the transport device 210, and after the measurement, sets the unbalance position (correction position) in a predetermined direction (in this embodiment, An unbalance measuring device 230 indexing downward (in the vertical direction), and the transport device 2 with the unbalanced position right below.
The specimen W conveyed at 10 is set, and the specimen W
Correction device 240 having a cutter for cutting off the blade from directly below
And the transfer device 21 after being corrected by the first correction device 240
The specimen W conveyed at 0 is set, and an indexing device 250 for determining a correction position to be corrected by the second correction device 270 right below, and a transport device 210 with the correction position right below.
A second correcting device 270 having a cutter for setting the specimen W conveyed in the above and cutting the specimen W from directly below;
A final measuring device 290 for measuring the unbalance of the specimen W corrected by the second correcting device 270.

The supply device 100 includes a conveyor 110 for transporting the loaded specimen W rightward in the figure, and a conveyor 110.
Is installed at the center position of FIG. 1, and rotates clockwise from P1 to P2 in the illustration to grip the specimen W on the conveyor 110 and carry it into the apparatus main body 200 side, and also, from P2 to P2
3 and a carry-in / carry-out arm 120 that rotates clockwise in the clockwise direction and carries out the specimen W after the test in the apparatus main body 200 onto the conveyor 110.

The transfer device 210 is extended radially, is driven to rotate by a motor (not shown), and is capable of moving up and down as a whole by a cam mechanism (not shown) linked to the rotation.
Arms 211a to 211f, and each arm 211a to 211f
A hand device 220 shown in detail in FIG. 3 provided at the tip of 211f, the arm 211a transports the specimen W from the loading section to the measuring device 230, and the arm 211b moves from the measuring device 230 to the first correcting device 240. The specimen W is transported, the arm 211c transports the specimen W from the first correction device 240 to the indexing device 250, the arm 211d transports the specimen W from the indexing device 250 to the second correction device 270, and the arm 211e Transports the specimen W from the second correction device 270 to the measuring device 290, and the arm 211f transports the specimen W from the measuring device 290 to the loading unit. Arm 2
Reference numerals 11a to 211f reciprocate and rotate between the devices, and move up and down to set the specimen W on each device or take out the specimen W from each device.

FIG. 3 shows a hand 220 device provided on the arm 211b.
Three hands 221a to 221c that move in parallel to open and close to grip the peripheral surface thereof; an actuator 222 that is screwed to the tip of the arm 211 to open and close the hand 221;
A notch claw device 223 that is inserted into and engaged with the slot S of the specimen W to position the specimen W; The notch claw device 223 includes a bracket 223a screwed to the tip of the arm 211, a solenoid 223b fixed to the bracket 223a, and a guide 223 for the bracket 223a.
a notch claw 223d guided by the solenoid c and raised and lowered by a solenoid 223b. The notch claw 223d is engaged between the slots S of the specimen W to position and fix the specimen W so as not to rotate. The specimen W is gripped by the hand 221. 223e is a solenoid 223
a rod for transmitting the telescopic movement of b to the notch claw 223d;
23f is a return spring. Arms 211a, 211c-
The hand device 220 at the tip of 211f is the notch claw device 22.
3 is omitted.

As shown in FIG. 4, the first correction device 240 includes a holding pedestal 241 for the specimen W and a holding pedestal 241.
It has a clamp device 242 for fixing the specimen W above, a cutter 243 that can be moved up and down by a lifting device (not shown) directly below the holding pedestal 241, and a component force shift device 244 shown in FIG. 5. The second correction device 270 is similarly configured. The clamp device 242 includes an actuator 242a which is inclined so that the axis passes through the center of the specimen on the specimen holding support 241 and a clamper 242b which advances and retreats with respect to the specimen W with the actuator 242a. As shown in FIG. 4A, the tip of the clamper 242b is formed in a circular arc surface corresponding to the curvature of the peripheral surface of the main body MB of the specimen W, and is formed in two branches as shown in FIG. 4B. ing. Since the hand 221 is formed in two,
When the clamper 242b is advanced when the specimen W gripped in the step is set on the holding table 241, the hand 21
The specimen 1c is accommodated in the bifurcated space 242c, and the specimen W can be pressed and fixed to the holding table 241 by the clamper 242b while the specimen W is held by the hand 221. An engaging projection 242c as shown in FIG. 4 is provided on the distal end surface of the clamper 242b, and the projection 242c engages with the slot S from the peripheral surface of the specimen W, so that the specimen W is more reliably formed. Positioning and rotational misalignment are attempted. The protrusion 242c
May be omitted.

As shown in FIG. 5, the component force shift device 244 divides and corrects the unbalance expressed as a vector as two vector component forces, and the other vector component component of one of the previously corrected component components is corrected. This is a device for determining the direction of correction of the component force. For example, V1, V in FIG.
2 indicates a vector component force, and the measuring device 230 first determines the direction of V1 to be directly downward, and the first correcting device 240
The component force shift device 244 of FIG.

The component shift device 244 includes a base 244.
a, a bearing mechanism 244b movably provided along a guide rail 244h on a base 244a, an air cylinder 244c for moving the bearing mechanism 244b, and an indexing claw 244 rotatably held by the bearing mechanism 244b.
d, a stepping motor 244e for rotating the indexing claw 244d to determine the angle of the specimen W,
4d, and a positioning stopper 244f at the other end of the test piece W installed oppositely. The indexing claw 244d is shown in FIG.
(B) has legs 244g to be inserted and engaged with four of the eight slots S present on one end surface of the specimen W, and each leg 244g of the indexing claw 244d is connected to each slot on the end surface of the specimen W. The stepping motor 244e is rotated by a predetermined angle in the state where the stepping motor 244e is inserted and engaged with S, whereby the position of the other vector component of the specimen W is determined.

[0016] As shown in FIG.
On the base 251 and the guide rail 251a on the base 251
Bearing mechanism 252 provided movably along the axis, and indexing claw 253 rotatably held by bearing mechanism 252
A step motor 254 for rotating the indexing claw 253 to determine the correction position on the second surface, a positioning stopper 255 at the other end of the specimen W installed facing the indexing claw 253, and a bearing. An air cylinder 256 for moving the mechanism 252 and a holding pedestal 257 for holding the specimen W are provided. The indexing claw 253 is similar to the indexing claw 244d of the component force shift device 244 of the first correction device 240, as shown in FIG.
(B) has legs 253a to be inserted and engaged with four of the eight slots S present on one end surface of the specimen W, and each leg 253a of the indexing claw 253 to each slot on the end surface of the specimen W The step motor 254 is rotated by a predetermined angle in the state of being inserted and engaged with S, whereby the unbalance correction position on the second surface of the specimen W is determined.

The operation of correcting imbalance of the motor rotor W by the dynamic balancing tester having the above-described configuration will be described. The specimen W transported to the position P1 by the supply device 100 is
It is gripped by the carry-in / carry-out arm 120 and rotated to the position P2, released from the arm 120 at the position P2, and carried into the position P4 of the dynamic balance tester main body 200. The test piece W is gripped by the hand device 220 provided at the tip of the transfer arm 211a, and is transferred from the position P4 to the measuring device 230 by ascending transfer (turning) and descending as an integrated operation. Open and transfer the specimen W to the measuring device 230. Then, the transfer arm 211a
The transfer arm 211 waits until the next test piece W is gripped at the position P4 as a series of operations of raising, rotating, and lowering in the counterclockwise rotation direction until is positioned at the loading portion.

The measuring device 230 measures the unbalance amount and the unbalance position by rotating the specimen W in a known manner. After the measurement, the angular position of the specimen W is determined so that the unbalanced position is directed downward, more precisely, the above-described vector component V1 is directed downward. Next, the transfer arm 2
Notch claw 223 provided on hand device 220 of 11b
After engaging d with the slot S, the hand 221 is closed.
Therefore, the specimen W is gripped by the hand 221 with its one slot S facing upward. Transfer arm 21
1b rotates clockwise while ascending, and transports the specimen W to the first correction device 240.

The transfer arm 211b is connected to the first correction device 240
When the specimen W is raised, transported, and lowered, the transport arm 211b is placed on the holding pedestal 241 while holding the specimen W. In this state, the clamper 242b of the clamp device 242 advances and presses and fixes the specimen W to the holding pedestal 241. At this time, since the tip of the clamper 242b is bifurcated, the clamper 242b is
The specimen W can be pressed and fixed to the holding pedestal 241 without interfering with the sample 1c. This means that the hand 211
This means that both the gripping position of the specimen W and the clamp position of the clamper 242b can be set at the center of the specimen W in the longitudinal direction. By gripping and clamping the specimen W at the center thereof, the gripping of the specimen at the time of transport is performed. It prevents misalignment and misalignment during clamping.

Next, the hand 221 is released to raise the hand device 220, and the transfer device 210 is rotated in the counterclockwise direction so that the arm 211b is moved to the measuring device 23.
0 position. At this time, the transfer arm 211 located on the measuring device 230 and the first correction device 240
The b and c hands 221 are lowered while being opened, and wait in a state where the specimen W is positioned between the hands 221.
When the specimen W is set on the holding pedestal 241 as described above, the cutter 243 is raised while rotating, and the two places C sandwiching the slot S as shown in FIG.
U1a and CU1b are cut off by the cutter 243. Cutter 2
The rising end position of 43 is determined according to the unbalance amount.

After cutting off the CU1a and CU1b, the cutter 243 is lowered once, and then the first correction device 24
0, the cylinder 244c of the component shift device 244 is extended, and the indexing pawl 244d is advanced, so that its tip leg 244g is formed.
Is engaged with the slot S on the end face of the specimen W. And
After retracting the clamper 242b once, the stepping motor 2 is engaged with the index claws 244d engaged with the specimen W.
By rotating the specimen W by 90 degrees by rotating 44e, FIG.
The cutouts CU1c and CU1d of the specimen W shown in (b) face the cutter 243. Thereafter, the specimen W is clamped again by the clamper 242b, and further the indexing claws 244d are formed.
Is retracted to the origin position, and then the CU is raised by rotating the cutter 243 to a position corresponding to the unbalance amount.
Cut out 1c and CU1d to make an imbalance correction.

After the correction work of the first surface is corrected in this way, the hand 221 of the transfer arm 211c is closed and the specimen W is gripped. Thereafter, the cylinder 242a of the first correction device 240 is contracted, the clamper 242b is retracted, the clockwise rotation is performed while the transfer arm 211 is raised, and the corrected test specimen W is transferred to the indexing device 250. .

When the specimen W is raised, conveyed, and lowered to the indexing device 250, the specimen W held by the transfer arm 211c is placed on the holding table 257, and the hand W 221 holds the specimen W. Then, the indexing claw 253 is advanced by operating the cylinder 256, and its tip leg 253a is engaged with the slot S on the end face of the specimen W to fix the angular position. Thereafter, the hand 221 of the arm 211c is opened and raised, and the transfer arm 211 is rotated in the counterclockwise direction until the arm 211c faces the first correction device 240,
At this position, the transport arm 211 is lowered to position the specimen W set on the first correction device 240 between the opened hands 211. The corrected position of the second surface of the specimen W set in the indexing device 250 is determined by the rotation of the step motor 254.

After the indexing of the second surface correction position is completed, the hand 221 of the arm 211d is closed and the specimen W is gripped. Then, the indexing claw 253 is retracted to the origin position,
Then, the transport arm 211 is raised, rotated, and lowered to transport the specimen W to the second correction device 270, and the specimen W held by the transport arm 211 is moved to the second correction device 270.
Place on top. The second correction device 2 while holding the specimen W
The specimen W is placed on the holding pedestal 241 by the 70 clamper 242b.
Is pressed and fixed, and then the hand 221 is opened. Thereafter, the transfer arm 211 is moved up, rotated in the counterclockwise direction, and lowered, so that the transfer arm 211d is moved to the indexing device 25.
It waits with the next specimen W positioned between the hands 221 opened at the position of 0. Then, the first correction device 240
First, the vector component V1 is corrected, and then the vector component V2 is corrected.

After the correction by the second correction device 270 is completed, the clamper 242b is retracted, and the specimen W is gripped by the hand 221 of the transfer arm 211e.
The specimen W is conveyed to the final measuring device 290 by raising 1, rotating it clockwise, and lowering it. The imbalance is measured by the final measuring device 290, and if the measurement result is equal to or less than the reference value, the product is carried out from the testing machine main body 200 by the carry-in / carry-out arm 120 as an OK product if the measurement result is higher than the reference value, and as an NG product.

As described above, according to the present embodiment, after the unbalance position is determined after the end of the unbalance measurement,
The specimen W is transported in a state where the angular position is fixed by the notch claw 223d, and when the specimen W is transferred from the hand device 220 to the first correction device 240, the indexing device 250, and the second correction device 270, the hand device 220 Thus, the specimen W is set in each device while the position thereof is fixed, so that the displacement of the specimen W does not occur at the time of transfer from the hand device 220 to each device, and accurate imbalance correction is performed.
In addition, since the notch claw device 223 is integrated with the hand device 220, the positioning of the specimen W by the notch claw and the gripping by the hand 211 can be sequentially performed. There is no need to return to the origin, and the time for unbalance measurement and correction work is reduced.

The present invention is not limited to the embodiment, and can be applied to, for example, a case where the specimen is not so long in the longitudinal direction and one surface is sufficient for correction. In this case, the indexing device 250 and the second correction device 270 become unnecessary. Also,
The notch claw 223d is provided integrally with the hand device 220, but may be provided separately from the hand device 270. further,
In the embodiment, the so-called component force correction method is adopted because the corrected portion of the specimen is formed with grooves in eight core portions at the circumferential position of the specimen. The present invention can be applied to a balance testing machine. However, in this case, the following changes are required for the above embodiment. 1. The tip of the notch claw 223d in FIG. 3 is made flat,
Hold the outer periphery of the specimen. 2. The protrusion 242c of the clamper of each of the first and second correction devices 240 and 270 is omitted. 3. The component force shift device 244 of the correction devices 240 and 270 shown in FIG. 5 is omitted. 4. Since the indexing claw 253 of the angle indexing device 250 in FIG. 1 cannot be attached, another mechanism for indexing is required. For example, a parallel chuck is used to chuck and index the outer periphery of the specimen. To

[0028]

As described above in detail, according to the present invention, the specimen is fixed by the correction position fixing means on the unbalance correction means without interfering with the gripping means. The position of the specimen does not shift at the time of imbalance correction. Further, when the unbalance position on the second surface is determined by the indexing means after the correction of the unbalance on the first surface, the specimen is set on the indexing means while being gripped by the gripping means and then indexed. There is no danger of the specimen shifting when indexing the unbalanced surface. As a result, the accuracy of the unbalance correction is improved, and efficient unbalance correction can be performed.

[Brief description of the drawings]

FIG. 1 is a diagram showing the overall configuration of a dynamic balance tester according to the present invention.

FIGS. 2A and 2B are diagrams illustrating an example of a test piece, wherein FIG. 2A is a view from the front, and FIG. 2B is a view from the side.

FIG. 3 is a view showing one embodiment of a hand device, and FIG.
Is a view from the front, and (b) is a view from the side.

FIG. 4 is a view showing an embodiment of a first correction device, showing a clamping device.

FIG. 5 is a view showing one embodiment of a first correction device, showing a component force shift device.

FIG. 6 is a diagram showing one embodiment of an indexing device.

[Explanation of symbols]

 REFERENCE SIGNS LIST 100 supply device 200 testing machine main body 210 transfer mechanism 211 transfer arm 220 hand device 221 hand 223 notch claw device 223d notch claw 240 first correction device 241 holding cradle 242 clamp device 242b clamper 243 cutter 244 component force shift device 244d indexing Claw 250 Indexing device 253 Indexing claw 270 Second correction device 290 Final correction device

Continuation of the front page (56) References JP-A-56-12529 (JP, A) JP-A-5-215634 (JP, A) JP-A-3-245030 (JP, A) JP-A-3-170827 (JP) JP-A-6-18354 (JP, A) JP-A-58-189944 (JP, U) JP-A-50-37018 (JP, Y1) (58) Fields investigated (Int. Cl. ⁶ , DB (Name) G01M 1/14-1/38

Claims (2)

(57) [Scope of request for utility model registration] 1. A measuring means for measuring an unbalanced amount and an unbalanced position around an axis of a specimen, and determining the unbalanced position after the measurement, and the specimen to remove the measured unbalanced amount. A dynamic balance test having unbalance correcting means for cutting off the outer peripheral surface of the specimen, and transport means for gripping the specimen with gripping means and transporting the specimen between the measuring means and the unbalance correcting means. In the apparatus, the unbalance correcting means includes correction position fixing means for fixing the specimen gripped by the gripping means on the unbalance correcting means without interfering with the gripping means. Testing machine. 2. The amount of unbalance around the axis of a specimen is defined as a first
Measuring means for measuring on the surface and the second surface, and determining the resection position of the first surface after the measurement, the first and second measured positions
First and second unbalance correcting means for cutting off the outer peripheral surface of the specimen so as to remove the unbalance amount of the surface;
Indexing means for determining an unbalance correction position by the second unbalance correction means after the correction by the unbalance correction means of
A dynamic balance comprising: gripping the specimen with the gripping means; and transporting means for transporting the specimen between the measuring means, the first and second unbalance correcting means, and the indexing means. In the test machine, the indexing means includes indexing position fixing means for fixing the specimen gripped by the gripping means on the indexing means without interfering with the gripping means. Balance testing machine.