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JP2003304052A - Method and device for removing moisture from substrate - Google Patents

Method and device for removing moisture from substrate

Info

Publication number
JP2003304052A
JP2003304052A JP2002110629A JP2002110629A JP2003304052A JP 2003304052 A JP2003304052 A JP 2003304052A JP 2002110629 A JP2002110629 A JP 2002110629A JP 2002110629 A JP2002110629 A JP 2002110629A JP 2003304052 A JP2003304052 A JP 2003304052A
Authority
JP
Japan
Prior art keywords
substrate
compressed air
moisture
water
wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002110629A
Other languages
Japanese (ja)
Other versions
JP3765568B2 (en
Inventor
Seiji Machida
成司 町田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Miyako Roller Industry Co Ltd
Original Assignee
Miyako Roller Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Miyako Roller Industry Co Ltd filed Critical Miyako Roller Industry Co Ltd
Priority to JP2002110629A priority Critical patent/JP3765568B2/en
Publication of JP2003304052A publication Critical patent/JP2003304052A/en
Application granted granted Critical
Publication of JP3765568B2 publication Critical patent/JP3765568B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Drying Of Solid Materials (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To solve the problem that moisture is hardly removed surely from minute sections and holes of a substrate having a complicated shape. <P>SOLUTION: A moisture removing device is constituted to remove moisture adhering to a substrate by vibrating the moisture by blowing oscillating compressed air (oscillating compressed dry air) upon the substrate. In order to remove the moisture, the moisture removing device is provided with a compressed air generator, a blowing-out jig for blowing out the compressed air generated by means of the generator, and a vibrating apparatus which vibrates the compressed air blown out from the blowing-out jig at a prescribed frequency by vibrating the jig. The device is also provided with an oscillating compressed air generating section having an oscillator which outputs electric signals for driving the vibrating apparatus at the prescribed frequency. <P>COPYRIGHT: (C)2004,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明はプリント基板、積層
基板等の各種基板に付着している水分、特に、基板のホ
ール内に付着している水分、基板に付着している微細な
塵芥をも除去できる水分除去方法と、それに使用される
水分除去装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention can remove moisture adhering to various substrates such as a printed circuit board and a laminated substrate, especially moisture adhering to holes in the substrate and fine dust adhering to the substrate. The present invention relates to a water removal method that can be removed and a water removal apparatus used for the method.

【0002】[0002]

【従来の技術】製造されたプリント基板は、通常は、水
洗い(洗浄)され、洗浄後に乾燥されて水分除去されて
いる。従来は、図7に示すような熱風乾燥や、図8に示
すようなスピンにより水分除去を行なうのが一般的であ
った。図7の熱風乾燥はコンベアDで搬送されるプリン
ト基板Aに40〜100℃の乾燥した熱風を吹きかけて
基板Aに付着している水分を蒸発させるものであり、図
8のスピンによる水分除去はプリント基板Aを高速回転
する回転板Cの上にセットして高速回転させ、遠心力で
プリント基板Aに付着している水を吹き飛ばすものであ
る。
2. Description of the Related Art A printed circuit board produced is usually washed (washed) with water, and then dried to remove water. In the past, it was general to remove the water by hot air drying as shown in FIG. 7 or spin as shown in FIG. The hot air drying of FIG. 7 is to dry the printed board A conveyed by the conveyor D with dry hot air of 40 to 100 ° C. to evaporate the water adhering to the board A. The printed circuit board A is set on a rotating plate C which rotates at high speed and rotated at high speed, and water adhering to the printed circuit board A is blown off by centrifugal force.

【0003】図7の熱風乾燥においては水が乾燥した跡
に水のシミが残るという問題があった。図8のスピンに
よる水分除去においては、図9(a)(b)に示すよう
にプリント基板Aの孔B内や凹凸部に付着している水が
飛ばされにくく、完全な水分除去が難しいという問題が
あった。また、これらの方法によっては、プリント基板
の孔内に付着している微細な塵芥を除去する事は困難で
あった。さらにプリント基板Aを回転板Cにセットしな
ければならないため、流れ作業の一環として水分除去を
行なうことができなかった。
In the hot air drying of FIG. 7, there is a problem that water stains remain after the water is dried. In the water removal by spin in FIG. 8, as shown in FIGS. 9A and 9B, the water adhering to the insides of the holes B of the printed circuit board A and the concavo-convex portion is hardly splashed, and it is difficult to completely remove the water. There was a problem. In addition, it is difficult to remove fine dust adhering to the inside of the holes of the printed circuit board by these methods. Furthermore, since the printed circuit board A must be set on the rotating plate C, it was not possible to remove water as part of the flow work.

【0004】本件発明者は前記課題を解決するため、図
6のような水分除去装置を開発した。これは、乾燥室2
3と、プリント基板22を搬送して乾燥室23内を通過
する搬送体21と、搬送体21により搬送されるプリン
ト基板22に20kHz〜100kHzの音波を当て
て、プリント基板22の表面に付着している水を振動さ
せて除去するスピーカ24とを備えたものである。
The present inventor has developed a water removing device as shown in FIG. 6 in order to solve the above problems. This is the drying room 2
3, the carrier 21 that carries the printed circuit board 22 and passes through the drying chamber 23, and the printed circuit board 22 carried by the carrier 21 is applied with a sound wave of 20 kHz to 100 kHz to adhere to the surface of the printed circuit board 22. And a speaker 24 that vibrates and removes the existing water.

【発明が解決しようとする課題】図6の発明は特に欠点
はないが、より効率良く水分を除去できる水分除去方法
と水分除去装置の開発が望まれている。
Although the invention of FIG. 6 has no particular drawback, it is desired to develop a method and apparatus for removing water capable of removing water more efficiently.

【0005】[0005]

【課題を解決するための手段】本発明は前記要望に応え
るべく、基板の水分を短時間で確実に且つ効率良く除去
できる水分除去方法と水分除去装置を提供することにあ
る。
SUMMARY OF THE INVENTION In order to meet the above demands, the present invention provides a water removing method and a water removing apparatus which can remove the water on a substrate reliably and efficiently in a short time.

【0006】本件出願の請求項1の基板の水分除去方法
は、圧縮空気を所定周波数で振動させた波動圧縮空気
を、搬送体で搬送中の基板に、その上方及び下方から、
又は上方から水分除去部内で吹き付けて、基板に付着し
ている水分を振動させて水分を除去する方法である。
In the method of removing moisture from a substrate according to claim 1 of the present application, the wave compressed air obtained by vibrating the compressed air at a predetermined frequency is applied to the substrate being conveyed by the carrier from above and below the substrate.
Alternatively, it is a method of spraying the moisture from above in the moisture removing portion and vibrating the moisture adhering to the substrate to remove the moisture.

【0007】本件出願の請求項2の基板の水分除去方法
は、請求項1記載の基板の水分除去方法において、波動
圧縮空気を噴出治具から噴出させ、噴出治具を搬送体の
搬送方向と交差する方向に往復移動させて、基板の広い
範囲に波動圧縮空気を吹き付ける方法である。
According to a second aspect of the present invention, in the method of removing moisture of a substrate according to the first aspect of the present invention, the wave compressed air is jetted from the jetting jig, and the jetting jig is set in the carrying direction of the carrier. This is a method of reciprocating in the direction of intersecting and blowing the wave compressed air over a wide area of the substrate.

【0008】本件出願の請求項3の基板の水分除去方法
は、請求項1又は請求項2記載の基板の水分除去方法に
おいて、水分除去部内を除湿する方法である。
A method for removing water from a substrate according to claim 3 of the present application is the method for removing moisture from a substrate according to claim 1 or 2, wherein the inside of the moisture removing portion is dehumidified.

【0009】本件出願の請求項4の基板の水分除去方法
は、請求項1乃至請求項3のいずれかに記載の基板の水
分除去方法において、波動圧縮空気で水分除去した基板
を、赤外線により加熱して基板の水分を除去する方法で
ある。
According to a fourth aspect of the present invention, there is provided a method of removing moisture from a substrate according to any one of the first to third aspects, wherein the substrate, which has been moisture-removed with wave compressed air, is heated by infrared rays. This is a method of removing water from the substrate.

【0010】本件出願の請求項5の基板の水分除去方法
は、請求項1乃至請求項4のいずれかに記載の基板の水
分除去方法において、波動圧縮空気で水分除去される基
板がクラスター水で洗浄され、その後に水切りされたも
のであることを特徴とする方法である。
The method for removing water from a substrate according to claim 5 of the present application is the method for removing water from a substrate according to any one of claims 1 to 4, wherein the substrate from which water is removed by wave compressed air is cluster water. The method is characterized by being washed and then drained.

【0011】本件出願の請求項6の基板の水分除去装置
は、基板を搬送する搬送体と、搬送体で搬送中の基板に
その上方と下方の双方又はいずれか一方から吹き付ける
波動圧縮空気を発生する波動圧縮空気発生部とを備え、
波動圧縮空気発生部は圧縮空気発生機と、それから発生
される圧縮空気を噴出する噴出治具と、噴出治具を振動
させて噴出治具から噴出される圧縮空気を所定周波数で
振動させる振動機器と、振動機器を所定周波数で駆動さ
せるための電気信号を出力する発振器を備えたものであ
る。
According to a sixth aspect of the present invention, there is provided a substrate water removing apparatus which generates a wave carrier compressed air to be blown onto a carrier for carrying the substrate and a substrate being carried by the carrier from above and / or below. And a wave compressed air generating section
The wave compressed air generator is a compressed air generator, a jetting jig for jetting compressed air generated from the generator, and a vibrating device for vibrating the jetting jig to vibrate the compressed air jetted from the jetting jig at a predetermined frequency. And an oscillator that outputs an electric signal for driving the vibrating device at a predetermined frequency.

【0012】[0012]

【発明の実施の形態】本発明の水分除去方法及び水分除
去装置の実施形態を図面に基づいて説明する。本発明の
水分除去方法は図1に示すような作業ラインで実施可能
である。図1に示す作業ラインは、プリント基板、積層
基板等の各種の基板2を搬送することができる搬送体1
を備え、搬送体1の搬送路上に、搬送方向手前より後方
へ順次、基板2を搬送体1の上で洗浄するための洗浄部
3、洗浄された基板2に付着している水分を搬送体1の
上で水切りするための水切り部4、水切りした基板2の
表面(ホール内を含む)に付着している水分を除去する
ための水分除去部5、水分除去された基板2を乾燥させ
るための乾燥部6を備えている。この作業ラインでは、
基板2を搬送体1で搬送する間に、前記の洗浄、水切
り、水分除去、乾燥といった各種作業を連続して行うこ
とができる。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of a water removing method and a water removing apparatus of the present invention will be described with reference to the drawings. The water removal method of the present invention can be carried out in a work line as shown in FIG. The work line shown in FIG. 1 is a carrier 1 capable of carrying various substrates 2 such as a printed circuit board and a laminated substrate.
And a cleaning unit 3 for cleaning the substrate 2 on the carrier 1 sequentially on the carrier path of the carrier 1 from the front to the rear in the carrier direction, and the moisture adhering to the cleaned substrate 2 on the carrier. 1. Draining portion 4 for draining water on 1, drainage portion 5 for removing moisture adhering to the surface (including inside the hole) of drained substrate 2, for drying substrate 2 after moisture removal The drying unit 6 is provided. In this work line,
While the substrate 2 is being transported by the transporting body 1, various operations such as the cleaning, draining, removing water and drying can be continuously performed.

【0013】前記の搬送体1としてはローラコンベア、
ベルトコンベア等の各種コンベアを用いることができ
る。ローラコンベアの場合は、隣接するローラ間の隙間
から洗浄や水分除去が可能であるが、ベルトコンベアの
場合は通常はその下方からの洗浄液が遮断されて通過で
きないため、水分が遮断されないように通水用の孔、
口、溝等を空けてある。搬送体1の搬送速度は水分除去
に適した任意の速さを設定することができるが、毎秒5
m程度とすると水分除去が確実になり、搬送効率も向上
する。
The carrier 1 is a roller conveyor,
Various conveyors such as a belt conveyor can be used. In the case of a roller conveyor, it is possible to clean and remove water from the gap between adjacent rollers, but in the case of a belt conveyor, the cleaning liquid from below is normally blocked and cannot pass through, so it is necessary to prevent water from being blocked. Holes for water,
It has a mouth and a groove. The transport speed of the carrier 1 can be set to any speed suitable for removing moisture,
When it is about m, the water removal is surely performed and the transportation efficiency is improved.

【0014】図1の搬送体1により搬送された基板2
は、先ず洗浄部3へと搬入され、洗浄部3において、超
音波気泡洗浄される。ここで超音波気泡洗浄は洗浄液を
超音波で振動させて基板を洗浄する既存の洗浄方法であ
る。この超音波気泡洗浄では洗浄水としてクラスター水
が使用され、そのクラスター水に超音波気泡ノズルから
超音波が加えられ、その超音波気泡クラスター水で基板
2が洗浄されるようにしてある。この洗浄方法により基
板2を洗浄することによって、基板2の細かい穴(ホー
ル)の中の汚れを洗浄することもできる。洗浄にクラス
ター水を使用することにより水の表面張力が弱まって水
がホール内に付着しにくくなり、また、水がホールから
除去され易くなる。
The substrate 2 carried by the carrier 1 of FIG.
Is first carried into the cleaning unit 3, and ultrasonic bubble cleaning is performed in the cleaning unit 3. Here, the ultrasonic bubble cleaning is an existing cleaning method in which the cleaning liquid is vibrated by ultrasonic waves to clean the substrate. In this ultrasonic bubble cleaning, cluster water is used as cleaning water, ultrasonic waves are applied to the cluster water from an ultrasonic bubble nozzle, and the substrate 2 is cleaned with the ultrasonic bubble cluster water. By cleaning the substrate 2 by this cleaning method, it is possible to clean the dirt in the fine holes of the substrate 2. The use of cluster water for cleaning weakens the surface tension of the water, making it difficult for water to adhere to the inside of the hole and facilitating removal of water from the hole.

【0015】洗浄部3で洗浄を終えた基板2は搬送体1
により水切り部4へ搬入される。水切り部4ではエアー
カッター15から噴出される高圧空気により基板2に付
着している水分の大部分を吹き飛ばして除去する。エア
ーカッター15は搬送体1の搬送方向に間隔をあけて複
数台設置することもできる。エアーカッター15から噴
出される高圧空気の風速は任意に選択できるが毎秒10
m程度にすると水分が除去されやすくなる。水切りは他
の方法によることもできる。エアーカッター15に代え
て他の物、例えば吸水ロールを使用し、それを基板2に
接触させながら回転させて吸水して水切りすることもで
きる。
The substrate 2 that has been cleaned by the cleaning unit 3 is the carrier 1.
It is carried into the water draining section 4. In the water draining section 4, most of the water adhering to the substrate 2 is blown off and removed by the high pressure air ejected from the air cutter 15. A plurality of air cutters 15 may be installed at intervals in the transport direction of the transport body 1. The wind speed of the high-pressure air ejected from the air cutter 15 can be arbitrarily selected, but is 10 per second.
If it is about m, water will be easily removed. Draining can also be done by other methods. Instead of the air cutter 15, another material such as a water absorption roll may be used, which is rotated while being in contact with the substrate 2 to absorb water and drain water.

【0016】水切り部4で水切りを終えた基板2は図2
に示すように搬送体1によって水分除去部5に搬入され
る。図2の水分除去部5は水切りを終えた基板2を搬送
体1により搬入する搬入口7と、水分除去を終えた基板
2を搬送体1により搬出する搬出口8とを有する水分除
去室17内に、波動圧縮空気を噴出する二以上の噴出治
具9と除湿機10を設けてある。除湿機10はその吸引
口が水分除去室17内にあれば除湿機10そのものは水
分除去室17の外に設置することもできる。
The substrate 2 which has been drained by the draining section 4 is shown in FIG.
As shown in FIG. 3, the carrier 1 carries the water into the water removing section 5. The moisture removing section 5 of FIG. 2 has a moisture removing chamber 17 having a carry-in port 7 for carrying in the substrate 2 that has been drained by the carrier 1, and a carry-out port 8 for carrying out the substrate 2 after moisture removal by the carrier 1. Two or more jetting jigs 9 and a dehumidifier 10 for jetting wave compressed air are provided therein. If the suction port of the dehumidifier 10 is in the moisture removing chamber 17, the dehumidifier 10 itself can be installed outside the moisture removing chamber 17.

【0017】前記二以上の噴出治具9は図3に示すよう
にノズル取付けブロック16に取り付けられており、コ
ンプレッサー(圧縮空気発生機)12から送り出された
圧縮空気(圧縮ドライエアー)がそのノズル取付けブロ
ック16へ供給されると、その圧縮空気が各噴出治具9
に分配されて夫々の噴出治具9から噴射されるようにし
てある。図3では噴出治具9にエアーノズルが使用され
ている。前記のノズル取付けブロック16はエアーシリ
ンダ14等の振動機器のピストンロッドに連結されてお
り、ピストンロッドの往復動により所定周期で図4の矢
印a‐a´方向(搬送体1の搬送方向と交差する方向)
へ往復運動するようにしてある。具体的には、発振器1
3から出力された発振信号(電気信号)によりエアーシ
リンダ14のピストンの電磁バルブを開閉させて、エア
ーシリンダ14のピストンロッドを発振信号の周波数で
往復動させ、これによってノズル取付けブロック16を
発振器13の発振周波数で図4中の矢印a‐a´方向へ
往復動させて、各噴出治具9から噴射されるドライエア
ーを振動させ、各噴出治具9から墳射される圧縮空気が
発振周波数で振動されてその周波数の波動圧縮空気(波
動圧縮乾燥空気)となる。発振器13の発振周波数を変
えればノズル取付けブロック16の往復振動数を変える
ことができ、波動圧縮空気の波動(周波数)を代えるこ
とができる。
The two or more jetting jigs 9 are attached to a nozzle mounting block 16 as shown in FIG. 3, and compressed air (compressed dry air) sent from a compressor (compressed air generator) 12 is used for the nozzles. When the compressed air is supplied to the mounting block 16, the compressed air is supplied to each of the ejection jigs 9.
And is jetted from each jetting jig 9. In FIG. 3, an air nozzle is used for the ejection jig 9. The nozzle mounting block 16 is connected to a piston rod of a vibrating device such as the air cylinder 14, and is reciprocally moved by the piston rod in a predetermined cycle in the direction of arrow aa ′ in FIG. 4 (intersecting the conveying direction of the carrier 1). Direction)
It reciprocates to. Specifically, the oscillator 1
The electromagnetic signal of the piston of the air cylinder 14 is opened / closed by the oscillation signal (electrical signal) output from No. 3, and the piston rod of the air cylinder 14 is reciprocated at the frequency of the oscillation signal. 4 is reciprocated in the direction of arrow aa ′ in FIG. 4 to vibrate the dry air jetted from each jetting jig 9, and the compressed air jetted from each jetting jig 9 is oscillated at the oscillation frequency. It is vibrated by and becomes wave compressed air (wave compressed dry air) of that frequency. By changing the oscillation frequency of the oscillator 13, the reciprocating frequency of the nozzle mounting block 16 can be changed, and the wave (frequency) of the wave compressed air can be changed.

【0018】以上のようにして、噴出治具9から波動圧
縮空気を噴出させて基板2に吹き付け、図5(a)
(b)に示すように基板2の表面、スルーホール(貫通
孔)、非貫通孔、凹部等に付着して残っている水分を振
動させて除去する。波動圧縮空気の波動(周波数)は1
Hz〜10Hz程度が適し、このうち7.83Hz前後
が水分除去に効果的である。噴出治具9は複数本使用
し、それらを図4のように千鳥配列に配置して、噴出治
具9から広い範囲に波動圧縮空気が噴出されるようにす
るのが望ましい。エアーノズルの代わりにエアーカッタ
ーを使用することもできる。エアーノズルやエアーカッ
ター等の噴出治具9の噴出口と基板2との距離は任意に
選択できるが2mm〜8mm程度にすると基板2の水分
除去に効果的である。噴出治具9は搬送体の上方又は下
方にだけ設置することも、搬送体の上下両方に設置する
こともできる。基板の孔がスルーホールの場合は上下両
方の噴出治具9から波動圧縮空気を噴出して基板に吹き
付け、基板2の孔が上向きの非貫通孔、凹部等の場合は
上方の噴出治具9から波動圧縮空気を噴出して基板に吹
き付けると水分を確実に除去することができる。基板2
の孔を下向きにして基板2を搬送体1の上にのせた場合
は、波動圧縮空気を下方から噴出して基板に吹き付ける
と水分を確実に除去することができる。水分除去室17
内は除湿機10により水分を回収して除湿して、湿度を
20%〜50%の低湿度に維持できるようにしてある。
As described above, the wave-compressed air is jetted from the jetting jig 9 and blown onto the substrate 2, as shown in FIG.
As shown in (b), the water remaining on the surface of the substrate 2, through holes (through holes), non-through holes, concave portions, etc. is vibrated and removed. Wave The frequency (frequency) of compressed air is 1
About 10 Hz to 10 Hz is suitable, and about 7.83 Hz is effective for removing water. It is desirable to use a plurality of jetting jigs 9 and arrange them in a staggered arrangement as shown in FIG. 4 so that the waved compressed air is jetted from the jetting jig 9 in a wide range. An air cutter can be used instead of the air nozzle. The distance between the ejection port of the ejection jig 9 such as an air nozzle or an air cutter and the substrate 2 can be arbitrarily selected, but it is effective to remove water from the substrate 2 by setting it to about 2 mm to 8 mm. The jetting jig 9 can be installed only above or below the carrier, or both above and below the carrier. When the hole of the substrate is a through hole, wave compressed air is jetted from both upper and lower jetting jigs 9 and blows onto the substrate. When the hole of the substrate 2 is an upward non-through hole, a concave portion or the like, the upper jetting jig 9 is formed. Moisture can be surely removed by ejecting wave-compressed air from the nozzle and spraying it onto the substrate. Board 2
When the substrate 2 is placed on the carrier 1 with the holes facing downward, the water can be reliably removed by ejecting the wave-compressed air from below and blowing it onto the substrate. Moisture removal chamber 17
The inside is dehumidified by recovering moisture by the dehumidifier 10 so that the humidity can be maintained at a low humidity of 20% to 50%.

【0019】水分除去部5での水分除去を終えた基板2
は搬送体1によって水分除去部5から図1に示す加熱乾
燥部6へ搬入される。加熱乾燥部6内では基板2を加熱
乾燥する。加熱乾燥部6内は搬送路上に設置された遠赤
外線ヒーターや近赤外線ヒーター等の赤外線ヒーター1
8により加熱されて乾燥されている。加熱乾燥後の基板
2は搬送路上に設置されている冷却用ファン19により
冷却され、常温状態へ戻される。これにより、いち早く
基板2の温度を常温に近づけることができ、乾燥終了後
すぐに基板2に触れる事ができるので、その後の作業を
迅速に行なうことが出来、作業効率が向上する。前記赤
外線ヒーター18による加熱乾燥の工程は省略すること
もできる。
The substrate 2 which has completed the removal of the moisture in the moisture removing section 5.
Is carried by the carrier 1 from the moisture removing section 5 to the heating / drying section 6 shown in FIG. The substrate 2 is heated and dried in the heating and drying unit 6. An infrared heater 1 such as a far-infrared heater or a near-infrared heater installed on the conveyance path in the heating / drying section 6
It is heated by 8 and dried. The substrate 2 after heating and drying is cooled by the cooling fan 19 installed on the transport path and returned to the room temperature state. As a result, the temperature of the substrate 2 can be quickly brought close to the room temperature, and the substrate 2 can be touched immediately after the completion of drying, so that the subsequent work can be performed quickly and the work efficiency is improved. The step of heating and drying with the infrared heater 18 may be omitted.

【0020】[0020]

【発明の効果】本件出願の請求項1の水分除去方法は次
のような効果がある。 (1)波動圧縮空気(波動圧縮乾燥空気)を基板に吹き
付けて、基板に付着している水分を振動させるので、基
板の孔や凹部に付着している水分が確実に除去される。
また、水分だけでなく、基板に付着している微細な粉や
塵芥も除去される。 (2)熱ではなく、波動圧縮空気の吹き付けによる水分
除去であるため、熱に弱い基板でも安全に水分除去する
ことができる。又、常温環境下での作業となるため、作
業がし易い。また、熱により水分除去する場合は水跡が
基板表面にシミとなって残るが、本発明ではそのような
こともない。 (3)搬送体により基板を搬送しながら水分除去を行う
ため、洗浄から乾燥までを流れ作業で連動的に行うこと
が可能となる。また、本発明の実施のためのラインを他
の製造ライン、他システムの一部として組み込むことが
できる。
The method of removing water according to claim 1 of the present application has the following effects. (1) Since wave-compressed air (wave-compressed dry air) is blown onto the substrate to vibrate the water adhering to the substrate, the water adhering to the holes or recesses of the substrate is surely removed.
Further, not only moisture but also fine powder and dust adhering to the substrate are removed. (2) Since the moisture is removed by blowing the waved compressed air instead of heat, the moisture can be safely removed even by a substrate that is weak against heat. Further, since the work is performed in a room temperature environment, the work is easy. Further, when water is removed by heat, water marks remain as stains on the substrate surface, but this does not occur in the present invention. (3) Since water is removed while the substrate is being transported by the transport body, it is possible to perform the work from cleaning to drying in a linked operation. Further, the line for carrying out the present invention can be incorporated as a part of another manufacturing line or other system.

【0021】本件出願の請求項2の基板の水分除去方法
は、波動圧縮空気を噴出する噴出治具を搬送体の搬送方
向に交差する方向に往復移動させて基板の広い範囲に波
動圧縮空気を吹き付けるようにしたので、一つの噴出治
具で基板の広範囲に波動圧縮空気を吹き付けることがで
き、水分除去効率が向上する。
In the method of removing moisture of a substrate according to claim 2 of the present application, the jetting jig for jetting the waved compressed air is reciprocated in a direction intersecting the conveying direction of the conveyer so that the waved compressed air is spread over a wide area of the substrate. Since it is blown, the wave compressed air can be blown to a wide range of the substrate with one jetting jig, and the moisture removal efficiency is improved.

【0022】本件出願の請求項3の基板の水分除去方法
は、水分除去部内を除湿するので水分除去部内の水分が
少なくなり、基板からの水分除去が効率よく行なわれ
る。
In the method of removing moisture from the substrate according to claim 3 of the present application, the moisture in the moisture removing section is dehumidified, so that the moisture in the moisture removing section is reduced, and the moisture is efficiently removed from the substrate.

【0023】本件出願の請求項4の基板の水分除去方法
は、波動圧縮空気で水分除去した基板を赤外線により加
熱するので、基板から除去し切れなかった水分を確実に
除去することができる。
In the method for removing moisture from a substrate according to claim 4 of the present application, since the substrate from which moisture has been removed by wave compressed air is heated by infrared rays, it is possible to reliably remove the moisture that cannot be completely removed from the substrate.

【0024】本件出願の請求項5の基板の水分除去方法
は、波動圧縮空気で水分除去される基板がクラスター水
で洗浄されているので、水分の表面張力が弱く、基板に
付着している水分、特に、ホール内に残っている水分で
も容易に除去される。さらに、表面張力の低減により、
水の乾燥速度を速めることにもできる。また、クラスタ
ー水や活性水を用いることで、使用後に排水しても自然
環境への悪影響がほとんどない。
In the method of removing moisture from a substrate according to claim 5 of the present application, since the substrate to be moisture-removed by the wave compressed air is washed with cluster water, the surface tension of the moisture is weak and the moisture adhering to the substrate is weakened. Especially, the water remaining in the holes can be easily removed. Furthermore, by reducing the surface tension,
It can also accelerate the drying speed of water. Also, by using cluster water or activated water, there is almost no adverse effect on the natural environment even if drained after use.

【0025】本件出願の請求項6の基板の水分除去装置
は、波動圧縮空気発生部が、圧縮空気発生器、振動機
器、発振器を備えるため、本装置により水分除去に適し
た波動(周波数)の波動圧縮空気を作り出して基板に吹
き付けることができ、効率の良い基板の水分除去が実現
できる。
In the apparatus for removing moisture of a substrate according to claim 6 of the present application, since the undulating compressed air generating section includes a compressed air generator, a vibrating device, and an oscillator, the apparatus removes a wave (frequency) suitable for removing moisture. Wave-compressed air can be generated and blown onto the substrate, and efficient water removal of the substrate can be realized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の水分除去方法を実施するための工程の
一実施形態例を示す概略図。
FIG. 1 is a schematic diagram showing an example of an embodiment of a process for carrying out the water removal method of the present invention.

【図2】波動圧縮空気を吹き付ける水分除去部の構成を
示した説明図。
FIG. 2 is an explanatory diagram showing a configuration of a moisture removing unit which blows wave compressed air.

【図3】水分除去部中の圧縮空気に波動を加えて吹き付
ける機構の構成を示した説明図。
FIG. 3 is an explanatory diagram showing a configuration of a mechanism for applying a wave to and blowing the compressed air in the moisture removing unit.

【図4】水分除去部において基板に波動圧縮空気を吹き
付ける様子を示した平面図。
FIG. 4 is a plan view showing how wave compressed air is blown to the substrate in the moisture removing unit.

【図5】(a)(b)は本発明による水分除去の様子を
示した説明図。
5A and 5B are explanatory views showing a state of water removal according to the present invention.

【図6】従来の水分除去方法の一例を示す概略図。FIG. 6 is a schematic view showing an example of a conventional water removal method.

【図7】従来の水分除去方法の他の例を示す概略図。FIG. 7 is a schematic view showing another example of a conventional water removal method.

【図8】従来の水分除去方法の他の例を示す概略図。FIG. 8 is a schematic view showing another example of a conventional water removal method.

【図9】(a)(b)は従来の水分除去方法における問
題点を示した説明図。
9A and 9B are explanatory views showing problems in the conventional water removal method.

【符号の説明】[Explanation of symbols]

1 搬送体 2 基板 3 洗浄部 4 水切り部 5 水分除去部 6 乾燥部 7 搬入口 8 搬出口 9 噴出治具 10 除湿機 11 ポンプ 12 コンプレッサー 13 発振器 14 エアーシリンダ 15 エアーカッター 16 ノズル取付けブロック 17 水分除去室 18 赤外線ヒーター 19 冷却用ファン 1 carrier 2 substrates 3 cleaning section 4 Drainer 5 Moisture removal section 6 Drying section 7 entrance 8 exits 9 Spouting jig 10 Dehumidifier 11 pumps 12 compressor 13 oscillators 14 Air cylinder 15 Air cutter 16 nozzle mounting block 17 Moisture removal chamber 18 infrared heater 19 Cooling fan

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】圧縮空気を所定周波数で振動させた波動圧
縮空気を、搬送体で搬送中の基板に、その上方及び下方
から、又は上方から水分除去部内で吹き付けて、基板に
付着している水分を振動させて水分を除去することを特
徴とする基板の水分除去方法。
1. A wave-compressed air obtained by vibrating compressed air at a predetermined frequency is sprayed onto a substrate being conveyed by a carrier from above and below, or from above in a moisture removing section, and adheres to the substrate. A method of removing water from a substrate, which comprises removing water by vibrating the water.
【請求項2】請求項1記載の基板の水分除去方法におい
て、波動圧縮空気を噴出治具から噴出させ、噴出治具を
搬送体の搬送方向と交差する方向に往復移動させて、基
板の広い範囲に波動圧縮空気を吹き付けることを特徴と
する基板の水分除去方法。
2. The method for removing water from a substrate according to claim 1, wherein wave compressed air is ejected from the ejection jig, and the ejection jig is reciprocated in a direction intersecting the conveyance direction of the carrier to widen the substrate. A method for removing moisture from a substrate, which comprises spraying wave-compressed air onto the area.
【請求項3】請求項1又は請求項2記載の基板の水分除
去方法において、水分除去部内を除湿することを特徴と
する基板の水分除去方法。
3. A method for removing moisture from a substrate according to claim 1 or 2, wherein the moisture removing section is dehumidified.
【請求項4】請求項1乃至請求項3のいずれかに記載の
基板の水分除去方法において、波動圧縮空気で水分除去
した基板を、赤外線により加熱して基板の水分を除去す
ることを特徴とする基板の水分除去方法。
4. The method for removing moisture from a substrate according to claim 1, wherein the substrate from which moisture has been removed by wave compressed air is heated by infrared rays to remove moisture from the substrate. Method for removing water from a substrate.
【請求項5】請求項1乃至請求項4のいずれかに記載の
基板の水分除去方法において、波動圧縮空気で水分除去
される基板がクラスター水で洗浄され、その後に水切り
されたものであることを特徴とする基板の水分除去方
法。
5. The method for removing moisture from a substrate according to claim 1, wherein the substrate to be moisture-removed with wave compressed air is washed with cluster water and then drained. A method for removing water from a substrate, comprising:
【請求項6】基板を搬送する搬送体と、搬送体で搬送中
の基板にその上方と下方の双方又はいずれか一方から吹
き付ける波動圧縮空気を発生する波動圧縮空気発生部と
を備え、波動圧縮空気発生部は圧縮空気発生機と、それ
から発生される圧縮空気を噴出する噴出治具と、噴出治
具を振動させて噴出治具から噴出される圧縮空気を所定
周波数で振動させる振動機器と、振動機器を所定周波数
で駆動させるための電気信号を出力する発振器を備えた
ことを特徴とする水分除去装置。
6. A wave compression apparatus comprising: a carrier for transferring a substrate; and a wave-compressed air generating section for generating wave-compressed air blown onto the substrate being transferred by the carrier from above and / or below. The air generator is a compressed air generator, a jetting jig for jetting compressed air generated from the generator, a vibrating device for vibrating the jetting jig to vibrate the compressed air jetted from the jetting jig at a predetermined frequency, A water removing device comprising an oscillator that outputs an electric signal for driving a vibrating device at a predetermined frequency.
JP2002110629A 2002-04-12 2002-04-12 Substrate moisture removal method and moisture removal apparatus Expired - Fee Related JP3765568B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002110629A JP3765568B2 (en) 2002-04-12 2002-04-12 Substrate moisture removal method and moisture removal apparatus

Publications (2)

Publication Number Publication Date
JP2003304052A true JP2003304052A (en) 2003-10-24
JP3765568B2 JP3765568B2 (en) 2006-04-12

Family

ID=29393710

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Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3765568B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006205043A (en) * 2005-01-27 2006-08-10 Tetra:Kk Immersion treatment plant
CN102478346A (en) * 2010-11-29 2012-05-30 代芳 Technology for drying printed circuit board by utilizing ultrasonic waves
JP2015192141A (en) * 2014-03-31 2015-11-02 芝浦メカトロニクス株式会社 Substrate drying apparatus and substrate drying method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110440568A (en) * 2019-07-08 2019-11-12 安徽文博纸品印刷有限公司 A kind of paper products continuous drying equipment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006205043A (en) * 2005-01-27 2006-08-10 Tetra:Kk Immersion treatment plant
CN102478346A (en) * 2010-11-29 2012-05-30 代芳 Technology for drying printed circuit board by utilizing ultrasonic waves
JP2015192141A (en) * 2014-03-31 2015-11-02 芝浦メカトロニクス株式会社 Substrate drying apparatus and substrate drying method

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