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Publication number
JP2003175026A5
JP2003175026A5 JP2002289353A JP2002289353A JP2003175026A5 JP 2003175026 A5 JP2003175026 A5 JP 2003175026A5 JP 2002289353 A JP2002289353 A JP 2002289353A JP 2002289353 A JP2002289353 A JP 2002289353A JP 2003175026 A5 JP2003175026 A5 JP 2003175026A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2002289353A
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JP2003175026A (ja
JP4293303B2 (ja
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Priority claimed from US09/975,892 external-priority patent/US6632020B2/en
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Publication of JP2003175026A publication Critical patent/JP2003175026A/ja
Publication of JP2003175026A5 publication Critical patent/JP2003175026A5/ja
Application granted granted Critical
Publication of JP4293303B2 publication Critical patent/JP4293303B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002289353A 2001-10-12 2002-10-02 イメージング・システムを較正する方法及び装置 Expired - Fee Related JP4293303B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/975892 2001-10-12
US09/975,892 US6632020B2 (en) 2001-10-12 2001-10-12 Method and apparatus for calibrating an imaging system

Publications (3)

Publication Number Publication Date
JP2003175026A JP2003175026A (ja) 2003-06-24
JP2003175026A5 true JP2003175026A5 (ja) 2005-11-10
JP4293303B2 JP4293303B2 (ja) 2009-07-08

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Family Applications (1)

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JP2002289353A Expired - Fee Related JP4293303B2 (ja) 2001-10-12 2002-10-02 イメージング・システムを較正する方法及び装置

Country Status (4)

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US (1) US6632020B2 (ja)
JP (1) JP4293303B2 (ja)
DE (1) DE10247535A1 (ja)
FR (1) FR2830741A1 (ja)

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JP7408664B2 (ja) 2018-08-31 2024-01-05 イベックス イノベーションズ エルティーディー Ｘ線撮像システム

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Cited By (1)

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JP7408664B2 (ja) 2018-08-31 2024-01-05 イベックス イノベーションズ エルティーディー Ｘ線撮像システム

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