IL82450A0 - Method and apparatus for analyzing sludgy materials - Google Patents
Method and apparatus for analyzing sludgy materialsInfo
- Publication number
- IL82450A0 IL82450A0 IL82450A IL8245087A IL82450A0 IL 82450 A0 IL82450 A0 IL 82450A0 IL 82450 A IL82450 A IL 82450A IL 8245087 A IL8245087 A IL 8245087A IL 82450 A0 IL82450 A0 IL 82450A0
- Authority
- IL
- Israel
- Prior art keywords
- analyzing
- sludgy
- materials
- sludgy materials
- analyzing sludgy
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI862345A FI80524C (fi) | 1986-06-02 | 1986-06-02 | Foerfarande och anordning foer analysering av slamartade material. |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IL82450A0 true IL82450A0 (en) | 1987-11-30 |
Family
ID=8522744
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IL82450A IL82450A0 (en) | 1986-06-02 | 1987-05-07 | Method and apparatus for analyzing sludgy materials |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5107527A (xx) |
| CA (1) | CA1267734C (xx) |
| DE (1) | DE3718245A1 (xx) |
| FI (1) | FI80524C (xx) |
| GB (1) | GB2191284B (xx) |
| IL (1) | IL82450A0 (xx) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4021617C2 (de) * | 1990-07-06 | 1993-12-02 | Kugelfischer G Schaefer & Co | Vorrichtung zum kontinuierlichen Messen des Eisengehaltes in Zinkschichten |
| US5272745A (en) * | 1992-05-14 | 1993-12-21 | A.H.S. Consultants & Engineers, Inc. | Apparatus for analyzing, continuously flowing dry powder samples, by means of X-ray spectroscopy |
| GB9223592D0 (en) * | 1992-11-11 | 1992-12-23 | Fisons Plc | X-ray analysis apparatus |
| DE4304938C2 (de) * | 1993-02-18 | 1996-04-25 | Daimler Benz Ag | Goniometer mit mehreren Achsen |
| JPH08136480A (ja) * | 1994-11-11 | 1996-05-31 | Dkk Corp | 油中硫黄分測定装置 |
| AUPQ893700A0 (en) * | 2000-07-24 | 2000-08-17 | Commonwealth Scientific And Industrial Research Organisation | On-line x-ray diffraction analyser |
| US20030068829A1 (en) * | 2001-06-25 | 2003-04-10 | Symyx Technologies, Inc. | High throughput crystallographic screening of materials |
| US7978820B2 (en) * | 2009-10-22 | 2011-07-12 | Panalytical B.V. | X-ray diffraction and fluorescence |
| JP2011145162A (ja) * | 2010-01-14 | 2011-07-28 | Japan Atomic Energy Agency | 流体中微粒子のｘ線検出法 |
| US11260354B2 (en) | 2016-12-06 | 2022-03-01 | The Boeing Company | Apparatus, system, and method for producing a sealant |
| AU2019268796A1 (en) * | 2018-05-18 | 2020-12-17 | Enersoft Inc. | Systems, devices, and methods for analysis of geological samples |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH476994A (de) * | 1966-07-05 | 1969-08-15 | Mansfeld Kombinat W Pieck Veb | Anordnung zur automatischen Röntgenfluoreszenzanalyse |
| US4134012A (en) * | 1977-10-17 | 1979-01-09 | Bausch & Lomb, Inc. | X-ray analytical system |
| EP0108447A3 (en) * | 1982-11-04 | 1985-07-17 | North American Philips Corporation | Simultaneous collection of diffraction and spectrographic data |
-
1986
- 1986-06-02 FI FI862345A patent/FI80524C/fi not_active IP Right Cessation
-
1987
- 1987-05-07 GB GB8710769A patent/GB2191284B/en not_active Expired - Fee Related
- 1987-05-07 IL IL82450A patent/IL82450A0/xx unknown
- 1987-05-15 CA CA537208A patent/CA1267734C/en not_active Expired - Lifetime
- 1987-05-30 DE DE19873718245 patent/DE3718245A1/de not_active Withdrawn
-
1991
- 1991-03-25 US US07/675,041 patent/US5107527A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| FI80524C (fi) | 1990-06-11 |
| DE3718245A1 (de) | 1987-12-03 |
| CA1267734A (en) | 1990-04-10 |
| CA1267734C (en) | 1990-04-10 |
| US5107527A (en) | 1992-04-21 |
| GB8710769D0 (en) | 1987-06-10 |
| FI862345A0 (fi) | 1986-06-02 |
| FI862345L (fi) | 1987-12-03 |
| GB2191284B (en) | 1990-12-19 |
| GB2191284A (en) | 1987-12-09 |
| FI80524B (fi) | 1990-02-28 |
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