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FI862345L - Foerfarande och anordning foer analysering av slamartade material. - Google Patents

Foerfarande och anordning foer analysering av slamartade material. Download PDF

Info

Publication number
FI862345L
FI862345L FI862345A FI862345A FI862345L FI 862345 L FI862345 L FI 862345L FI 862345 A FI862345 A FI 862345A FI 862345 A FI862345 A FI 862345A FI 862345 L FI862345 L FI 862345L
Authority
FI
Finland
Prior art keywords
slamartade
analysering
anordning foer
och anordning
foerfarande och
Prior art date
Application number
FI862345A
Other languages
English (en)
Other versions
FI80524C (fi
FI862345A0 (fi
FI80524B (fi
Inventor
Heikki Johannes Sipilae
Marja-Leena Jaervinen
Jouko Aarre Kalevi Koskinen
Original Assignee
Outokumpu Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Outokumpu Oy filed Critical Outokumpu Oy
Priority to FI862345A priority Critical patent/FI80524C/fi
Publication of FI862345A0 publication Critical patent/FI862345A0/fi
Priority to GB8710769A priority patent/GB2191284B/en
Priority to IL82450A priority patent/IL82450A0/xx
Priority to CA537208A priority patent/CA1267734C/en
Priority to DE19873718245 priority patent/DE3718245A1/de
Publication of FI862345L publication Critical patent/FI862345L/fi
Application granted granted Critical
Publication of FI80524B publication Critical patent/FI80524B/fi
Publication of FI80524C publication Critical patent/FI80524C/fi
Priority to US07/675,041 priority patent/US5107527A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI862345A 1986-06-02 1986-06-02 Foerfarande och anordning foer analysering av slamartade material. FI80524C (fi)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI862345A FI80524C (fi) 1986-06-02 1986-06-02 Foerfarande och anordning foer analysering av slamartade material.
GB8710769A GB2191284B (en) 1986-06-02 1987-05-07 Method and apparatus for analyzing sludgy materials
IL82450A IL82450A0 (en) 1986-06-02 1987-05-07 Method and apparatus for analyzing sludgy materials
CA537208A CA1267734C (en) 1986-06-02 1987-05-15 Method and apparatus for analyzing sludgy materials
DE19873718245 DE3718245A1 (de) 1986-06-02 1987-05-30 Verfahren und vorrichtung zum analysieren schlammiger stoffe
US07/675,041 US5107527A (en) 1986-06-02 1991-03-25 Method and apparatus for analyzing sludgy materials

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI862345A FI80524C (fi) 1986-06-02 1986-06-02 Foerfarande och anordning foer analysering av slamartade material.
FI862345 1986-06-02

Publications (4)

Publication Number Publication Date
FI862345A0 FI862345A0 (fi) 1986-06-02
FI862345L true FI862345L (fi) 1987-12-03
FI80524B FI80524B (fi) 1990-02-28
FI80524C FI80524C (fi) 1990-06-11

Family

ID=8522744

Family Applications (1)

Application Number Title Priority Date Filing Date
FI862345A FI80524C (fi) 1986-06-02 1986-06-02 Foerfarande och anordning foer analysering av slamartade material.

Country Status (6)

Country Link
US (1) US5107527A (fi)
CA (1) CA1267734C (fi)
DE (1) DE3718245A1 (fi)
FI (1) FI80524C (fi)
GB (1) GB2191284B (fi)
IL (1) IL82450A0 (fi)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4021617C2 (de) * 1990-07-06 1993-12-02 Kugelfischer G Schaefer & Co Vorrichtung zum kontinuierlichen Messen des Eisengehaltes in Zinkschichten
US5272745A (en) * 1992-05-14 1993-12-21 A.H.S. Consultants & Engineers, Inc. Apparatus for analyzing, continuously flowing dry powder samples, by means of X-ray spectroscopy
GB9223592D0 (en) * 1992-11-11 1992-12-23 Fisons Plc X-ray analysis apparatus
DE4304938C2 (de) * 1993-02-18 1996-04-25 Daimler Benz Ag Goniometer mit mehreren Achsen
JPH08136480A (ja) * 1994-11-11 1996-05-31 Dkk Corp 油中硫黄分測定装置
AUPQ893700A0 (en) * 2000-07-24 2000-08-17 Commonwealth Scientific And Industrial Research Organisation On-line x-ray diffraction analyser
US20030068829A1 (en) * 2001-06-25 2003-04-10 Symyx Technologies, Inc. High throughput crystallographic screening of materials
US7978820B2 (en) * 2009-10-22 2011-07-12 Panalytical B.V. X-ray diffraction and fluorescence
JP2011145162A (ja) * 2010-01-14 2011-07-28 Japan Atomic Energy Agency 流体中微粒子のｘ線検出法
US11260354B2 (en) 2016-12-06 2022-03-01 The Boeing Company Apparatus, system, and method for producing a sealant
AU2019268796A1 (en) * 2018-05-18 2020-12-17 Enersoft Inc. Systems, devices, and methods for analysis of geological samples

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH476994A (de) * 1966-07-05 1969-08-15 Mansfeld Kombinat W Pieck Veb Anordnung zur automatischen Röntgenfluoreszenzanalyse
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
EP0108447A3 (en) * 1982-11-04 1985-07-17 North American Philips Corporation Simultaneous collection of diffraction and spectrographic data

Also Published As

Publication number Publication date
FI80524C (fi) 1990-06-11
DE3718245A1 (de) 1987-12-03
CA1267734A (en) 1990-04-10
CA1267734C (en) 1990-04-10
US5107527A (en) 1992-04-21
IL82450A0 (en) 1987-11-30
GB8710769D0 (en) 1987-06-10
FI862345A0 (fi) 1986-06-02
GB2191284B (en) 1990-12-19
GB2191284A (en) 1987-12-09
FI80524B (fi) 1990-02-28

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Legal Events

Date Code Title Description
MM Patent lapsed

Owner name: OUTOKUMPU OY