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GB1089407A - Improvements in thyristors - Google Patents

Improvements in thyristors

Info

Publication number
GB1089407A
GB1089407A GB43430/65A GB4343065A GB1089407A GB 1089407 A GB1089407 A GB 1089407A GB 43430/65 A GB43430/65 A GB 43430/65A GB 4343065 A GB4343065 A GB 4343065A GB 1089407 A GB1089407 A GB 1089407A
Authority
GB
United Kingdom
Prior art keywords
junction
oct
voltage
bevelled
order
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB43430/65A
Inventor
Albert John Sadler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB43430/65A priority Critical patent/GB1089407A/en
Priority to FR79655A priority patent/FR1496453A/en
Priority to NL6614367A priority patent/NL6614367A/xx
Publication of GB1089407A publication Critical patent/GB1089407A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/103Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
    • H10D62/104Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices having particular shapes of the bodies at or near reverse-biased junctions, e.g. having bevels or moats
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D18/00Thyristors
    • H10D18/241Asymmetrical thyristors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/13Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
    • H10D62/141Anode or cathode regions of thyristors; Collector or emitter regions of gated bipolar-mode devices, e.g. of IGBTs
    • H10D62/142Anode regions of thyristors or collector regions of gated bipolar-mode devices

Landscapes

  • Thyristors (AREA)

Abstract

1,089,407. Semi-conductor devices. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. Oct. 6, 1966 [Oct. 13, 1965], No. 43430/65. Heading H1K. The lateral edges of a silicon thyristor are bevelled so that the parallel planes of the forward blocking junction B and reverse blocking junction C subtend equal acute angles in the range 10-50 degrees with the bevelled edges. The acute angle at the forward blocking junction B lies in the more lightly doped of the two regions 2, 3 comprising the junction, in order to minimize the deleterious surface field at this junction. A further highly-doped N<SP>+</SP>-type region (16), Fig. 2 (not shown), may be included between the P<SP>+</SP> and N regions forming the reverse blocking junction (C), in order to permit a higher forward blocking voltage and to limit the voltage across the junction (C).
GB43430/65A 1965-10-13 1965-10-13 Improvements in thyristors Expired GB1089407A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GB43430/65A GB1089407A (en) 1965-10-13 1965-10-13 Improvements in thyristors
FR79655A FR1496453A (en) 1965-10-13 1966-10-12 Silicon thyratrons
NL6614367A NL6614367A (en) 1965-10-13 1966-10-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB43430/65A GB1089407A (en) 1965-10-13 1965-10-13 Improvements in thyristors

Publications (1)

Publication Number Publication Date
GB1089407A true GB1089407A (en) 1967-11-01

Family

ID=10428720

Family Applications (1)

Application Number Title Priority Date Filing Date
GB43430/65A Expired GB1089407A (en) 1965-10-13 1965-10-13 Improvements in thyristors

Country Status (3)

Country Link
FR (1) FR1496453A (en)
GB (1) GB1089407A (en)
NL (1) NL6614367A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01318263A (en) * 1988-06-20 1989-12-22 Meidensha Corp semiconductor element

Also Published As

Publication number Publication date
FR1496453A (en) 1967-09-29
NL6614367A (en) 1967-04-14

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