[go: up one dir, main page]

FR2712987B1 - Procédé et circuit de test de circuits intégrés. - Google Patents

Procédé et circuit de test de circuits intégrés.

Info

Publication number
FR2712987B1
FR2712987B1 FR9408182A FR9408182A FR2712987B1 FR 2712987 B1 FR2712987 B1 FR 2712987B1 FR 9408182 A FR9408182 A FR 9408182A FR 9408182 A FR9408182 A FR 9408182A FR 2712987 B1 FR2712987 B1 FR 2712987B1
Authority
FR
France
Prior art keywords
period
waveforms
timing generators
bursts
driver
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9408182A
Other languages
English (en)
Other versions
FR2712987A1 (fr
Inventor
Alan Brent Hussey
Edward Anderson Ostertag
Lee Young Song
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Priority to FR9504883A priority Critical patent/FR2716976B1/fr
Publication of FR2712987A1 publication Critical patent/FR2712987A1/fr
Application granted granted Critical
Publication of FR2712987B1 publication Critical patent/FR2712987B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Manipulation Of Pulses (AREA)
FR9408182A 1993-07-01 1994-07-01 Procédé et circuit de test de circuits intégrés. Expired - Fee Related FR2712987B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9504883A FR2716976B1 (fr) 1993-07-01 1995-04-24 Procédé et circuit de test de circuits intégrés.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US8650293A 1993-07-01 1993-07-01

Publications (2)

Publication Number Publication Date
FR2712987A1 FR2712987A1 (fr) 1995-06-02
FR2712987B1 true FR2712987B1 (fr) 1998-01-02

Family

ID=22199005

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9408182A Expired - Fee Related FR2712987B1 (fr) 1993-07-01 1994-07-01 Procédé et circuit de test de circuits intégrés.

Country Status (6)

Country Link
US (1) US5581177A (fr)
JP (1) JP3215265B2 (fr)
CA (1) CA2127192C (fr)
DE (1) DE4423186C2 (fr)
FR (1) FR2712987B1 (fr)
GB (1) GB2280963B (fr)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6067331A (en) * 1996-12-05 2000-05-23 Texas Instruments Incorporated System and method for binary correlation
IL127063A0 (en) * 1997-03-24 1999-09-22 Advantest Corp Method of compressing and expanding data pattern and data pattern compressing and expanding apparatus
JPH10332782A (ja) * 1997-05-30 1998-12-18 Ando Electric Co Ltd Ｉｃテストシステム
JPH11264857A (ja) * 1998-03-19 1999-09-28 Advantest Corp 半導体試験装置
US6661839B1 (en) 1998-03-24 2003-12-09 Advantest Corporation Method and device for compressing and expanding data pattern
US6137346A (en) * 1998-04-27 2000-10-24 Credence Systems Corporation Temperature tracking voltage to current converter
DE19933117B4 (de) * 1999-07-19 2011-07-28 Continental Automotive GmbH, 30165 Verfahren zur Modulation eines Grundtaktes für digitale Schaltungen und Modulator zur Ausführung des Verfahrens
DE19933115A1 (de) 1999-07-19 2001-01-25 Mannesmann Vdo Ag Verfahren zur Modulation eines Grundtaktes für digitale Schaltungen und Taktmodulator zur Ausführung des Verfahrens
US6553529B1 (en) 1999-07-23 2003-04-22 Teradyne, Inc. Low cost timing system for highly accurate multi-modal semiconductor testing
KR100386342B1 (ko) 1999-10-29 2003-06-02 (주)바이오니아 침구를 자외선과 오존으로 살균, 소독하는 방법과 그 장치
US6609077B1 (en) * 2000-05-31 2003-08-19 Teradyne, Inc. ATE timing measurement unit and method
US7143326B2 (en) * 2001-03-20 2006-11-28 Credence Systems Corporation Test system algorithmic program generators
US7278079B2 (en) * 2002-04-12 2007-10-02 Broadcom Corporation Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices
US7174490B2 (en) * 2002-04-12 2007-02-06 Broadcom Corporation Test system rider utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices
US7502326B2 (en) 2002-04-12 2009-03-10 Broadcom Corporation Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices
EP1353189B1 (fr) * 2002-04-12 2006-06-14 Broadcom Corporation Systèmes et procédés pour le contrôle fonctionnel automatique à vitesse élevée de composants à haut nombre de broches et à plusieurs gigabits par seconde
US7363557B2 (en) 2002-04-12 2008-04-22 Broadcom Corporation System for at-speed automated testing of high serial pin count multiple gigabit per second devices
US7005875B1 (en) * 2004-02-09 2006-02-28 Altera Corporation Built-in self-test circuitry for integrated circuits
TWI274166B (en) * 2004-06-18 2007-02-21 Unitest Inc Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices
KR101311405B1 (ko) * 2005-05-19 2013-09-25 넥스테스트 시스템즈 코포레이션 스마트 카드들을 테스트하기 위한 시스템 및 방법
US7685486B1 (en) * 2007-07-19 2010-03-23 Xilinx, Inc. Testing of an embedded multiplexer having a plurality of inputs
US7888947B2 (en) 2007-11-21 2011-02-15 Teradyne, Inc. Calibrating automatic test equipment
JP5211161B2 (ja) * 2008-06-02 2013-06-12 株式会社アドバンテスト 試験装置および試験方法
US10641820B1 (en) 2018-10-19 2020-05-05 Teradyne, Inc. Automated test equipment with relay hot-switch detection
WO2020126019A1 (fr) * 2018-12-20 2020-06-25 Advantest Corporation Appareil et procédé d'essai d'un dispositif à l'essai

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU579691A1 (ru) * 1974-01-10 1977-11-05 Предприятие П/Я Р-6609 Генератор импульсов
US4063308A (en) * 1975-06-27 1977-12-13 International Business Machines Corporation Automatic clock tuning and measuring system for LSI computers
US4231104A (en) * 1978-04-26 1980-10-28 Teradyne, Inc. Generating timing signals
US4564953A (en) * 1983-03-28 1986-01-14 Texas Instruments Incorporated Programmable timing system
GB2144228B (en) * 1983-07-13 1987-08-05 Instrumentation Engineering Digital pin electronics module for computerized automatic diagnostic testing systems
US4849702A (en) * 1983-08-01 1989-07-18 Schlumberger Techologies, Inc. Test period generator for automatic test equipment
JPS6089775A (ja) * 1983-08-01 1985-05-20 フエアチアイルド　カメラ　アンド　インストルメント　コ−ポレ−シヨン 自動テスト装置用のテスト期間発生器
US4789835A (en) * 1983-08-01 1988-12-06 Fairchild Camera & Instrument Corporation Control of signal timing apparatus in automatic test systems using minimal memory
JPS60170949A (ja) * 1984-02-15 1985-09-04 Advantest Corp マルチクロツク発生装置
US4724379A (en) * 1984-03-14 1988-02-09 Teradyne, Inc. Relay multiplexing for circuit testers
US4806852A (en) * 1984-09-07 1989-02-21 Megatest Corporation Automatic test system with enhanced performance of timing generators
US4724378A (en) * 1986-07-22 1988-02-09 Tektronix, Inc. Calibrated automatic test system
US5140688A (en) * 1986-11-10 1992-08-18 Texas Instruments Incorporated GaAs integrated circuit programmable delay line element
GB2200465B (en) * 1987-01-16 1991-10-02 Teradyne Inc Automatic test equipment
US4792932A (en) * 1987-01-16 1988-12-20 Teradyne, Inc. Time measurement in automatic test equipment
US4809221A (en) * 1987-01-28 1989-02-28 Megatest Corporation Timing signal generator
US4779221A (en) * 1987-01-28 1988-10-18 Megatest Corporation Timing signal generator
CA1281385C (fr) * 1987-02-09 1991-03-12 George William Conner Generateur de signaux d'horloge
US5274796A (en) * 1987-02-09 1993-12-28 Teradyne, Inc. Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal
US5058087A (en) * 1987-05-29 1991-10-15 Siemens Aktiengesellschaft Process for determining the electrical duration of signal paths
JP2845438B2 (ja) * 1987-10-19 1999-01-13 株式会社東芝 高速ディジタルｉｃ
GB2214314B (en) * 1988-01-07 1992-01-02 Genrad Ltd Automatic circuit tester
JP2719684B2 (ja) * 1988-05-23 1998-02-25 株式会社アドバンテスト 遅延発生装置
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5124958A (en) * 1990-10-01 1992-06-23 Motorola, Inc. Digital Tau synthesizer
US5369637A (en) * 1991-04-03 1994-11-29 U.S. Philips Corporation Signal transmission system
US5191295A (en) * 1992-03-11 1993-03-02 Ltx Corporation Phase shift vernier for automatic test systems
US5311486A (en) * 1992-09-11 1994-05-10 Ltx Corporation Timing generation in an automatic electrical test system

Also Published As

Publication number Publication date
GB9413315D0 (en) 1994-08-24
DE4423186C2 (de) 2001-02-01
GB2280963B (en) 1997-06-18
JP3215265B2 (ja) 2001-10-02
DE4423186A1 (de) 1995-01-19
US5581177A (en) 1996-12-03
FR2712987A1 (fr) 1995-06-02
GB2280963A (en) 1995-02-15
CA2127192A1 (fr) 1995-01-02
CA2127192C (fr) 1999-09-07
JPH08146088A (ja) 1996-06-07

Similar Documents

Publication Publication Date Title
FR2712987B1 (fr) Procédé et circuit de test de circuits intégrés.
US6263463B1 (en) Timing adjustment circuit for semiconductor test system
EP0366553A3 (fr) Dispositif de test et procédé de test pour le test de dispositif électronique ainsi que dispositif à semi-conducteur incluant ledit dispositif de test
ATE296463T1 (de) Vorrichtung zum parallelen prüfen von halbleiterschaltkreisen
DE3776714D1 (de) Geraet und verfahren zum kalibrieren eines wechselspannungsniveaus.
JPS6484342A (en) Test circuit for integrated circuit
ATE224061T1 (de) Verfahren und vorrichtung zum prüfen von gedruckten leiterplatten
TW346540B (en) Test method of integrated circuit devices by using a dual edge clock technique
ATE245303T1 (de) Vorrichtung und verfahren zum zeitverzögerungsausgleich von einrichtungen
CA2024746A1 (fr) Circuit et methode de mesure de durees d'impulsion
US4802168A (en) Test signal generating circuit
JPS5797466A (en) Testing method for analogically printed board
JPS57169684A (en) Testing system for integrated circuit element
EP0510993A3 (en) Characterization of sequential circuits
SU1557672A1 (ru) Преобразователь длительности фронта импульса в амплитуду
JPS5584093A (en) Bubble memory test equipment
JPS587722Y2 (ja) パルスハツセイソウチ
JPS5560872A (en) Pattern generator
JPS5569860A (en) Clock margin setting system
JPS55163691A (en) Shift register
DE69606129D1 (de) Verfahren und Tester zur Beaufschlagung eines elektronischen Bausteins mit einem Triggerimpuls
JPH0171681U (fr)
SU1504650A1 (ru) Распределитель импульсов
JPS5673354A (en) Testing device for ic
SU640266A1 (ru) Устройство дл контрол прохождени импульсов

Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20090331