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JPS5797466A - Testing method for analogically printed board - Google Patents

Testing method for analogically printed board

Info

Publication number
JPS5797466A
JPS5797466A JP55174094A JP17409480A JPS5797466A JP S5797466 A JPS5797466 A JP S5797466A JP 55174094 A JP55174094 A JP 55174094A JP 17409480 A JP17409480 A JP 17409480A JP S5797466 A JPS5797466 A JP S5797466A
Authority
JP
Japan
Prior art keywords
waveform
printed board
output
data
analogically
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55174094A
Other languages
Japanese (ja)
Other versions
JPS6252827B2 (en
Inventor
Nobuhiko Kuribayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55174094A priority Critical patent/JPS5797466A/en
Publication of JPS5797466A publication Critical patent/JPS5797466A/en
Publication of JPS6252827B2 publication Critical patent/JPS6252827B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To discriminate the propriety of an analogically printed board with high precision by finding the expected value of an output voltage level in advance by using a simulating means equivalent to the analogically printed board circuit, and comparing the output voltage of the printed board to be tested with the expected value. CONSTITUTION:Waveform data 3 digitalized by dividing the voltage level of an input waveform by N is inputted to a simulator 10 for a circuit to be tested, composed of an electronic computer, to obtain an output waveform 4, and those input and output waveform data and waveform timing data are stored in a data file 14. For a test, the input waveform data is read out of the data file 14 at waveform timing and made into an input analog waveform by D/A conversion 11, and it is supplied to a printed board 1 to be tested. An output analog waveform the printed board 1 is processed by A/D conversion 12 to output digital waveform data with prescribed timing. This output waveform data is compared 15 with the output waveform data of an expected value obtained by simulation and stored in the data file 14, thus discriminating the propriety of the printed board 1.
JP55174094A 1980-12-10 1980-12-10 Testing method for analogically printed board Granted JPS5797466A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55174094A JPS5797466A (en) 1980-12-10 1980-12-10 Testing method for analogically printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55174094A JPS5797466A (en) 1980-12-10 1980-12-10 Testing method for analogically printed board

Publications (2)

Publication Number Publication Date
JPS5797466A true JPS5797466A (en) 1982-06-17
JPS6252827B2 JPS6252827B2 (en) 1987-11-06

Family

ID=15972542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55174094A Granted JPS5797466A (en) 1980-12-10 1980-12-10 Testing method for analogically printed board

Country Status (1)

Country Link
JP (1) JPS5797466A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57163877A (en) * 1981-03-31 1982-10-08 Jeol Ltd Circuit diagnosing method
JPS61181222A (en) * 1985-02-06 1986-08-13 Yokogawa Hewlett Packard Ltd Measuring device for analog-digital converter
JPS63168576A (en) * 1986-12-30 1988-07-12 Sony Corp Electronic circuit measuring apparatus
JPS63204808A (en) * 1987-02-19 1988-08-24 Fujitsu Ltd Circuit diagnosis method
JPH0196700A (en) * 1987-10-08 1989-04-14 Casio Comput Co Ltd Input control device for electronic musical instruments
JPH0458168A (en) * 1990-06-27 1992-02-25 Fujitsu Ltd Circuit simulation test device and method for testing semiconductor integrated circuits using the device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57163877A (en) * 1981-03-31 1982-10-08 Jeol Ltd Circuit diagnosing method
JPS61181222A (en) * 1985-02-06 1986-08-13 Yokogawa Hewlett Packard Ltd Measuring device for analog-digital converter
JPS63168576A (en) * 1986-12-30 1988-07-12 Sony Corp Electronic circuit measuring apparatus
JPS63204808A (en) * 1987-02-19 1988-08-24 Fujitsu Ltd Circuit diagnosis method
JPH0423442B2 (en) * 1987-02-19 1992-04-22 Fujitsu Ltd
JPH0196700A (en) * 1987-10-08 1989-04-14 Casio Comput Co Ltd Input control device for electronic musical instruments
JPH0458168A (en) * 1990-06-27 1992-02-25 Fujitsu Ltd Circuit simulation test device and method for testing semiconductor integrated circuits using the device

Also Published As

Publication number Publication date
JPS6252827B2 (en) 1987-11-06

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