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ES396891A1 - Dispositivo de carga acoplada. - Google Patents

Dispositivo de carga acoplada.

Info

Publication number
ES396891A1
ES396891A1 ES396891A ES396891A ES396891A1 ES 396891 A1 ES396891 A1 ES 396891A1 ES 396891 A ES396891 A ES 396891A ES 396891 A ES396891 A ES 396891A ES 396891 A1 ES396891 A1 ES 396891A1
Authority
ES
Spain
Prior art keywords
electrode
disposed
insulating coating
pair
coupled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES396891A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of ES396891A1 publication Critical patent/ES396891A1/es
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/891Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D44/00, e.g. integration of charge-coupled devices [CCD] or charge injection devices [CID
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C19/00Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/28Digital stores in which the information is moved stepwise, e.g. shift registers using semiconductor elements
    • G11C19/282Digital stores in which the information is moved stepwise, e.g. shift registers using semiconductor elements with charge storage in a depletion layer, i.e. charge coupled devices [CCD]
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C27/00Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/04Shift registers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D44/00Charge transfer devices
    • H10D44/40Charge-coupled devices [CCD]
    • H10D44/45Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes 
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D44/00Charge transfer devices
    • H10D44/40Charge-coupled devices [CCD]
    • H10D44/45Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes 
    • H10D44/472Surface-channel CCD
    • H10D44/474Two-phase CCD
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D44/00Charge transfer devices
    • H10D44/40Charge-coupled devices [CCD]
    • H10D44/45Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes 
    • H10D44/472Surface-channel CCD
    • H10D44/476Three-phase CCD
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D44/00Charge transfer devices
    • H10D44/40Charge-coupled devices [CCD]
    • H10D44/45Charge-coupled devices [CCD] having field effect produced by insulated gate electrodes 
    • H10D44/472Surface-channel CCD
    • H10D44/478Four-phase CCD
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/17Semiconductor regions connected to electrodes not carrying current to be rectified, amplified or switched, e.g. channel regions
    • H10D62/213Channel regions of field-effect devices
    • H10D62/335Channel regions of field-effect devices of charge-coupled devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/60Electrodes characterised by their materials
    • H10D64/66Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
    • H10D64/661Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of silicon contacting the insulator, e.g. polysilicon having vertical doping variation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/60Electrodes characterised by their materials
    • H10D64/66Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
    • H10D64/665Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes the conductor comprising a layer of elemental metal contacting the insulator, e.g. tungsten or molybdenum
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0198Integrating together multiple components covered by H10D44/00, e.g. integrating charge coupled devices

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)
  • Semiconductor Memories (AREA)
ES396891A 1970-10-29 1971-10-28 Dispositivo de carga acoplada. Expired ES396891A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US8502670A 1970-10-29 1970-10-29

Publications (1)

Publication Number Publication Date
ES396891A1 true ES396891A1 (es) 1974-06-16

Family

ID=22188999

Family Applications (1)

Application Number Title Priority Date Filing Date
ES396891A Expired ES396891A1 (es) 1970-10-29 1971-10-28 Dispositivo de carga acoplada.

Country Status (14)

Country Link
JP (1) JPS5310817B1 (es)
KR (1) KR780000481B1 (es)
BE (1) BE774391A (es)
CA (1) CA1075811A (es)
CH (1) CH569342A5 (es)
DE (1) DE2153675C3 (es)
ES (1) ES396891A1 (es)
FR (1) FR2111924B1 (es)
GB (1) GB1344646A (es)
IE (1) IE35680B1 (es)
IT (1) IT939683B (es)
NL (1) NL163061C (es)
SE (1) SE379111B (es)
ZA (1) ZA717200B (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4646119A (en) * 1971-01-14 1987-02-24 Rca Corporation Charge coupled circuits
GB1444047A (en) * 1973-02-28 1976-07-28 Hitachi Ltd Charge transfer semiconductor devices and methods of fabricating such devices
NL7409793A (nl) * 1973-08-01 1975-02-04 Trw Inc Asymmetrische ladingsoverdrachtsinrichting.
JPS58184760A (ja) * 1982-04-22 1983-10-28 Sony Corp 電荷転送素子
NL8300366A (nl) * 1983-02-01 1984-09-03 Philips Nv Beeldopneeminrichting.
DE3817153A1 (de) * 1988-05-19 1989-11-30 Messerschmitt Boelkow Blohm Halbleiter-bauelement

Also Published As

Publication number Publication date
IE35680L (en) 1972-04-29
ZA717200B (en) 1972-08-30
FR2111924B1 (es) 1976-03-26
NL163061C (nl) 1980-07-15
DE2153675C3 (de) 1980-09-18
AU3398971A (en) 1973-04-05
SE379111B (es) 1975-09-22
BE774391A (fr) 1972-02-14
FR2111924A1 (es) 1972-06-09
IT939683B (it) 1973-02-10
DE2153675B2 (de) 1976-08-12
KR780000481B1 (en) 1978-10-24
DE2153675A1 (de) 1972-05-18
NL7114859A (es) 1972-05-03
NL163061B (nl) 1980-02-15
GB1344646A (en) 1974-01-23
JPS5310817B1 (es) 1978-04-17
CA1075811A (en) 1980-04-15
CH569342A5 (es) 1975-11-14
IE35680B1 (en) 1976-04-28

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