Classifications

• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
  • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
  • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
  • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
  • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
  • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
  • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
  • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
  • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
  • G11C11/412—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
• • H—ELECTRICITY
  • H03—ELECTRONIC CIRCUITRY
  • H03K—PULSE TECHNIQUE
  • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
  • H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
  • H03K19/173—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using elementary logic circuits as components
  • H03K19/1733—Controllable logic circuits
  • H03K19/1735—Controllable logic circuits by wiring, e.g. uncommitted logic arrays
  • H03K19/1736—Controllable logic circuits by wiring, e.g. uncommitted logic arrays in which the wiring can be modified

Landscapes

• Engineering & Computer Science (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Computer Hardware Design (AREA)
• Physics & Mathematics (AREA)
• Computing Systems (AREA)
• General Engineering & Computer Science (AREA)
• Mathematical Physics (AREA)
• Logic Circuits (AREA)
• Semiconductor Integrated Circuits (AREA)
• Design And Manufacture Of Integrated Circuits (AREA)

Applications Claiming Priority (1)

Publications (1)

Family

ID=8230585

Family Applications (1)

Country Status (3)

Families Citing this family (2)

Family Cites Families (8)

• 1997
  • 1997-03-05 DE DE69729275T patent/DE69729275D1/de not_active Expired - Lifetime
  • 1997-03-05 EP EP97830097A patent/EP0863515B1/de not_active Expired - Lifetime
• 1998
  • 1998-03-05 US US09/040,249 patent/US6041428A/en not_active Expired - Fee Related

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