US5461417A
(en)
*
|
1993-02-16 |
1995-10-24 |
Northeast Robotics, Inc. |
Continuous diffuse illumination method and apparatus
|
JP3369695B2
(ja)
*
|
1994-01-19 |
2003-01-20 |
パイオニア株式会社 |
電子部品位置合せ用カメラの調整装置
|
US5761540A
(en)
*
|
1994-10-31 |
1998-06-02 |
Northeast Robotics, Inc. |
Illumination device with microlouver for illuminating an object with continuous diffuse light
|
US5842060A
(en)
*
|
1994-10-31 |
1998-11-24 |
Northeast Robotics Llc |
Illumination device with curved beam splitter for illumination an object with continuous diffuse light
|
US5764874A
(en)
*
|
1994-10-31 |
1998-06-09 |
Northeast Robotics, Inc. |
Imaging system utilizing both diffuse and specular reflection characteristics
|
US5694482A
(en)
*
|
1994-11-08 |
1997-12-02 |
Universal Instruments Corporation |
System and method for locating solder bumps on semiconductor chips or chip carriers
|
US5713661A
(en)
|
1995-10-23 |
1998-02-03 |
Northeast Robotics, Inc. |
Hockey puck shaped continuous diffuse illumination apparatus and method
|
AU2261297A
(en)
*
|
1996-02-06 |
1997-08-28 |
Northeast Robotics, Inc. |
Surface marking system and method of viewing marking indicia
|
SG70586A1
(en)
*
|
1996-02-21 |
2000-02-22 |
Samsung Aerospace Ind |
Video overhead display system
|
US6298149B1
(en)
*
|
1996-03-21 |
2001-10-02 |
Cognex Corporation |
Semiconductor device image inspection with contrast enhancement
|
US5859924A
(en)
*
|
1996-07-12 |
1999-01-12 |
Robotic Vision Systems, Inc. |
Method and system for measuring object features
|
US6075883A
(en)
|
1996-11-12 |
2000-06-13 |
Robotic Vision Systems, Inc. |
Method and system for imaging an object or pattern
|
US6135350A
(en)
*
|
1997-02-05 |
2000-10-24 |
Northeast Robotics Llc |
Surface marking system and method of viewing marking indicia
|
US6236747B1
(en)
|
1997-02-26 |
2001-05-22 |
Acuity Imaging, Llc |
System and method for image subtraction for ball and bumped grid array inspection
|
US6201892B1
(en)
|
1997-02-26 |
2001-03-13 |
Acuity Imaging, Llc |
System and method for arithmetic operations for electronic package inspection
|
US5926557A
(en)
*
|
1997-02-26 |
1999-07-20 |
Acuity Imaging, Llc |
Inspection method
|
US5828449A
(en)
*
|
1997-02-26 |
1998-10-27 |
Acuity Imaging, Llc |
Ring illumination reflective elements on a generally planar surface
|
US5943125A
(en)
*
|
1997-02-26 |
1999-08-24 |
Acuity Imaging, Llc |
Ring illumination apparatus for illuminating reflective elements on a generally planar surface
|
US6118524A
(en)
*
|
1997-02-26 |
2000-09-12 |
Acuity Imaging, Llc |
Arc illumination apparatus and method
|
JPH10290321A
(ja)
|
1997-04-14 |
1998-10-27 |
Nikon Corp |
画像読取装置および透過原稿アダプタ
|
JPH1172717A
(ja)
*
|
1997-08-29 |
1999-03-16 |
Nikon Corp |
顕微鏡デジタル写真撮影システム
|
EP1044565A4
(de)
*
|
1997-10-10 |
2001-02-28 |
Northeast Robotics Inc |
Bildaufnahmeverfahren und-vorrichtung mit länglicher inspektionszone
|
US6170973B1
(en)
|
1997-11-26 |
2001-01-09 |
Cognex Corporation |
Method and apparatus for wide-angle illumination in line-scanning machine vision devices
|
US6275256B1
(en)
*
|
1997-12-03 |
2001-08-14 |
Eastman Kodak Company |
Digital camera illuminator for the imaging of specular objects
|
US6271963B1
(en)
*
|
1998-01-16 |
2001-08-07 |
Daniel Freifeld |
Microscope illuminator for cylindrical objects
|
EP0935134B1
(de)
*
|
1998-02-05 |
2000-09-27 |
Wacker Siltronic Gesellschaft für Halbleitermaterialien Aktiengesellschaft |
Vorrichtung und Verfahren zur Inspektion der Mikrotextur am Umfang einer Halbleiterscheibe
|
US20040114035A1
(en)
*
|
1998-03-24 |
2004-06-17 |
Timothy White |
Focusing panel illumination method and apparatus
|
US6661521B1
(en)
*
|
1998-09-11 |
2003-12-09 |
Robotic Vision Systems, Inc. |
Diffuse surface illumination apparatus and methods
|
US6273338B1
(en)
|
1998-09-22 |
2001-08-14 |
Timothy White |
Low cost color-programmable focusing ring light
|
GB9826802D0
(en)
*
|
1998-12-04 |
1999-01-27 |
Vdrs Limited |
Vehicle inspection system
|
US6687402B1
(en)
|
1998-12-18 |
2004-02-03 |
Cognex Corporation |
Machine vision methods and systems for boundary feature comparison of patterns and images
|
US6633338B1
(en)
*
|
1999-04-27 |
2003-10-14 |
Gsi Lumonics, Inc. |
Programmable illuminator for vision system
|
US6788411B1
(en)
*
|
1999-07-08 |
2004-09-07 |
Ppt Vision, Inc. |
Method and apparatus for adjusting illumination angle
|
US6341878B1
(en)
*
|
1999-08-31 |
2002-01-29 |
Cognex Corporation |
Method and apparatus for providing uniform diffuse illumination to a surface
|
US6593705B1
(en)
|
2000-01-07 |
2003-07-15 |
Cyberoptics Corporation |
Rapid-firing flashlamp discharge circuit
|
US6750899B1
(en)
*
|
2000-01-07 |
2004-06-15 |
Cyberoptics Corporation |
Solder paste inspection system
|
US6549647B1
(en)
|
2000-01-07 |
2003-04-15 |
Cyberoptics Corporation |
Inspection system with vibration resistant video capture
|
KR100729290B1
(ko)
|
2000-01-07 |
2007-06-25 |
사이버옵틱스 코포레이션 |
텔레센트릭 프로젝터를 갖춘 위상 형상 측정 시스템
|
FR2806478B1
(fr)
*
|
2000-03-14 |
2002-05-10 |
Optomachines |
Dispositif et procede de controle optique de pieces de vaisselle comme des assiettes emaillees ou tout produit ceramique emaille
|
US6373520B1
(en)
*
|
2000-04-14 |
2002-04-16 |
Philip Morris Incorporated |
System and method for visually inspecting a cigarette packaging process
|
DE10022597B4
(de)
*
|
2000-05-10 |
2004-10-14 |
Erhardt + Leimer Gmbh |
Vorrichtung zum Erfassen der Randkante und/oder einer Markierung einer laufenden Warenbahn
|
US6552783B1
(en)
*
|
2000-06-28 |
2003-04-22 |
Teradyne, Inc. |
Optical system
|
US6507395B1
(en)
*
|
2000-07-11 |
2003-01-14 |
Maxsys Technologies Corporation |
Illumination head
|
WO2002027267A1
(en)
*
|
2000-09-29 |
2002-04-04 |
Bernd Sommer |
Optical ball height measurement of ball grid arrays
|
WO2002085091A2
(en)
*
|
2000-12-15 |
2002-10-24 |
Cyberoptics Corporation |
Camera with improved illuminator
|
US7006669B1
(en)
|
2000-12-31 |
2006-02-28 |
Cognex Corporation |
Machine vision method and apparatus for thresholding images of non-uniform materials
|
DE10128476C2
(de)
*
|
2001-06-12 |
2003-06-12 |
Siemens Dematic Ag |
Optische Sensorvorrichtung zur visuellen Erfassung von Substraten
|
US6614596B2
(en)
*
|
2001-07-25 |
2003-09-02 |
Mitutoyo Corporation |
Systems and methods for increasing illumination density within a field of view of an imaging system
|
FR2829344B1
(fr)
*
|
2001-08-29 |
2004-10-01 |
Oreal |
Dispositif d'acquisition d'au moins une image d'au moins une partie du visage ou de la chevelure d'une personne
|
US6749310B2
(en)
*
|
2001-09-07 |
2004-06-15 |
Contrast Lighting Services, Inc. |
Wide area lighting effects system
|
US7604361B2
(en)
|
2001-09-07 |
2009-10-20 |
Litepanels Llc |
Versatile lighting apparatus and associated kit
|
US7331681B2
(en)
*
|
2001-09-07 |
2008-02-19 |
Litepanels Llc |
Lighting apparatus with adjustable lenses or filters
|
JP2003098093A
(ja)
*
|
2001-09-25 |
2003-04-03 |
Ccs Inc |
検査用照明装置
|
US7083298B2
(en)
*
|
2001-10-03 |
2006-08-01 |
Led Pipe |
Solid state light source
|
US20030067774A1
(en)
*
|
2001-10-04 |
2003-04-10 |
Nanovia, L.P. |
Illumination systems and methods employing diffractive holographic optical elements
|
DE10162270B4
(de)
*
|
2001-12-18 |
2004-05-13 |
Siemens Ag |
Optische Sensorvorrichtung
|
JP3878023B2
(ja)
*
|
2002-02-01 |
2007-02-07 |
シーケーディ株式会社 |
三次元計測装置
|
JP3629244B2
(ja)
*
|
2002-02-19 |
2005-03-16 |
本多エレクトロン株式会社 |
ウエーハ用検査装置
|
JP4251312B2
(ja)
*
|
2002-03-08 |
2009-04-08 |
日本電気株式会社 |
画像入力装置
|
JP3580299B2
(ja)
*
|
2002-04-04 |
2004-10-20 |
アイシン・エンジニアリング株式会社 |
コード読取装置
|
US7105848B2
(en)
*
|
2002-04-15 |
2006-09-12 |
Wintriss Engineering Corporation |
Dual level out-of-focus light source for amplification of defects on a surface
|
US20070258085A1
(en)
*
|
2006-05-02 |
2007-11-08 |
Robbins Michael D |
Substrate illumination and inspection system
|
US8598557B2
(en)
*
|
2002-06-21 |
2013-12-03 |
Pressco Technology Inc. |
Method and apparatus for providing patterned illumination fields for machine vision systems
|
JP4139743B2
(ja)
*
|
2003-06-12 |
2008-08-27 |
日本軽金属株式会社 |
アルミニウムにおける非金属介在物の測定装置
|
US20050046739A1
(en)
*
|
2003-08-29 |
2005-03-03 |
Voss James S. |
System and method using light emitting diodes with an image capture device
|
NL1024619C2
(nl)
*
|
2003-10-24 |
2005-04-27 |
Staalkat Internat B V |
Inrichting voor het inspecteren van objecten.
|
US9070031B2
(en)
|
2003-10-24 |
2015-06-30 |
Cognex Technology And Investment Llc |
Integrated illumination assembly for symbology reader
|
US7823783B2
(en)
|
2003-10-24 |
2010-11-02 |
Cognex Technology And Investment Corporation |
Light pipe illumination system and method
|
US7874487B2
(en)
|
2005-10-24 |
2011-01-25 |
Cognex Technology And Investment Corporation |
Integrated illumination assembly for symbology reader
|
US7823789B2
(en)
|
2004-12-21 |
2010-11-02 |
Cognex Technology And Investment Corporation |
Low profile illumination for direct part mark readers
|
US7604174B2
(en)
|
2003-10-24 |
2009-10-20 |
Cognex Technology And Investment Corporation |
Method and apparatus for providing omnidirectional lighting in a scanning device
|
US9536124B1
(en)
|
2003-10-24 |
2017-01-03 |
Cognex Corporation |
Integrated illumination assembly for symbology reader
|
US20070103581A1
(en)
*
|
2003-11-14 |
2007-05-10 |
Sick, Inc. |
Scanning imaging system and method for imaging articles using same
|
US7593593B2
(en)
|
2004-06-16 |
2009-09-22 |
Microsoft Corporation |
Method and system for reducing effects of undesired signals in an infrared imaging system
|
GB2447166B
(en)
*
|
2004-06-28 |
2009-01-07 |
Carglass Luxembourg Sarl Zug |
Investigation of vehicle glazing panels
|
US20060027657A1
(en)
|
2004-08-04 |
2006-02-09 |
Laurens Ninnink |
Method and apparatus for high resolution decoding of encoded symbols
|
US7646896B2
(en)
*
|
2005-08-02 |
2010-01-12 |
A4Vision |
Apparatus and method for performing enrollment of user biometric information
|
US8238661B2
(en)
*
|
2004-08-12 |
2012-08-07 |
Bioscrypt, Inc. |
Device for contactlessly controlling the surface profile of objects
|
EP1788348A4
(de)
*
|
2004-08-12 |
2008-10-22 |
A4 Vision S A |
Einrichtung zur biometrischen steuerung einer flächenoberfläche
|
US20060081135A1
(en)
*
|
2004-08-16 |
2006-04-20 |
Britton Douglas F |
Industrial overline imaging system and method
|
US7175090B2
(en)
|
2004-08-30 |
2007-02-13 |
Cognex Technology And Investment Corporation |
Methods and apparatus for reading bar code identifications
|
US7617984B2
(en)
|
2004-12-16 |
2009-11-17 |
Cognex Technology And Investment Corporation |
Hand held symbology reader illumination diffuser
|
US9292724B1
(en)
|
2004-12-16 |
2016-03-22 |
Cognex Corporation |
Hand held symbology reader illumination diffuser with aimer optics
|
US7963448B2
(en)
|
2004-12-22 |
2011-06-21 |
Cognex Technology And Investment Corporation |
Hand held machine vision method and apparatus
|
US9552506B1
(en)
|
2004-12-23 |
2017-01-24 |
Cognex Technology And Investment Llc |
Method and apparatus for industrial identification mark verification
|
DE102005013614A1
(de)
*
|
2005-03-24 |
2006-10-05 |
OBE OHNMACHT & BAUMGäRTNER GMBH & CO. KG |
Vorrichtung zur optischen Formerfassung von Gegenständen und Oberflächen
|
US7808644B2
(en)
*
|
2005-03-24 |
2010-10-05 |
Obe Ohnmacht & Baumgartner Gmbh & Co. Kg |
Device for optically measuring the shapes of objects and surfaces
|
US7545971B2
(en)
*
|
2005-08-22 |
2009-06-09 |
Honeywell International Inc. |
Method and apparatus for measuring the crepe of a moving sheet
|
US7911444B2
(en)
|
2005-08-31 |
2011-03-22 |
Microsoft Corporation |
Input method for surface of interactive display
|
US20070047774A1
(en)
*
|
2005-08-31 |
2007-03-01 |
Artiom Yukhin |
Method and apparatus for performing enrollment of 2D and 3D face biometrics
|
US7639861B2
(en)
|
2005-09-14 |
2009-12-29 |
Cognex Technology And Investment Corporation |
Method and apparatus for backlighting a wafer during alignment
|
US8111904B2
(en)
|
2005-10-07 |
2012-02-07 |
Cognex Technology And Investment Corp. |
Methods and apparatus for practical 3D vision system
|
US7372556B2
(en)
*
|
2005-10-31 |
2008-05-13 |
The Boeing Company |
Apparatus and methods for inspecting a composite structure for inconsistencies
|
WO2007056090A1
(en)
|
2005-11-02 |
2007-05-18 |
Siemens Energy & Automation, Inc. |
Illuminator-especially for cylindrical curved surfaces
|
US7792419B2
(en)
*
|
2005-11-02 |
2010-09-07 |
Microscan Systems, Inc. |
Illuminator-especially for cylindrical curved surfaces
|
DE102005061834B4
(de)
|
2005-12-23 |
2007-11-08 |
Ioss Intelligente Optische Sensoren & Systeme Gmbh |
Vorrichtung und Verfahren zum optischen Prüfen einer Oberfläche
|
US7614563B1
(en)
|
2005-12-29 |
2009-11-10 |
Cognex Technology And Investment Corporation |
System and method for providing diffuse illumination in a symbology reader
|
US7630002B2
(en)
*
|
2007-01-05 |
2009-12-08 |
Microsoft Corporation |
Specular reflection reduction using multiple cameras
|
AT503193B1
(de)
*
|
2006-02-08 |
2007-10-15 |
Fronius Int Gmbh |
Band zum schutz der elektroden einer punktschweisszange
|
US20090116727A1
(en)
*
|
2006-05-02 |
2009-05-07 |
Accretech Usa, Inc. |
Apparatus and Method for Wafer Edge Defects Detection
|
US7508504B2
(en)
*
|
2006-05-02 |
2009-03-24 |
Accretech Usa, Inc. |
Automatic wafer edge inspection and review system
|
US20090122304A1
(en)
*
|
2006-05-02 |
2009-05-14 |
Accretech Usa, Inc. |
Apparatus and Method for Wafer Edge Exclusion Measurement
|
AT503559B1
(de)
*
|
2006-06-02 |
2007-11-15 |
Fronius Int Gmbh |
Vorrichtung zum auswerten von abbildern von schweisspunkten auf einem trägermaterial
|
US8108176B2
(en)
*
|
2006-06-29 |
2012-01-31 |
Cognex Corporation |
Method and apparatus for verifying two dimensional mark quality
|
US8162584B2
(en)
|
2006-08-23 |
2012-04-24 |
Cognex Corporation |
Method and apparatus for semiconductor wafer alignment
|
US7856939B2
(en)
*
|
2006-08-28 |
2010-12-28 |
Transitions Optical, Inc. |
Recirculation spin coater with optical controls
|
US7850338B1
(en)
|
2006-09-25 |
2010-12-14 |
Microscan Systems, Inc. |
Methods for directing light
|
US7852564B2
(en)
*
|
2006-09-27 |
2010-12-14 |
Microscan Systems, Inc. |
Devices and/or systems for illuminating a component
|
US20080106794A1
(en)
*
|
2006-09-27 |
2008-05-08 |
Messina Michael C |
Co-axial diffuse light methods
|
US7978970B2
(en)
*
|
2006-09-29 |
2011-07-12 |
Microscan Systems, Inc. |
Systems and/or devices for providing diffuse light
|
US8374498B2
(en)
|
2006-09-29 |
2013-02-12 |
Microscan Systems, Inc. |
Systems and/or devices for camera-based inspections
|
US20080137323A1
(en)
*
|
2006-09-29 |
2008-06-12 |
Pastore Timothy M |
Methods for camera-based inspections
|
US8032017B2
(en)
*
|
2006-09-29 |
2011-10-04 |
Microscan Systems, Inc. |
Methods for providing diffuse light
|
US8016199B2
(en)
*
|
2006-12-14 |
2011-09-13 |
Cognex Corporation |
Illumination devices for image acquisition systems
|
US8169478B2
(en)
|
2006-12-14 |
2012-05-01 |
Cognex Corporation |
Method and apparatus for calibrating a mark verifier
|
US20080149853A1
(en)
*
|
2006-12-20 |
2008-06-26 |
Micron Technology, Inc. |
Light shaping apparatus
|
WO2008086016A1
(en)
*
|
2007-01-10 |
2008-07-17 |
Cyberoptics Corporation |
Inspection system
|
US8212857B2
(en)
|
2007-01-26 |
2012-07-03 |
Microsoft Corporation |
Alternating light sources to reduce specular reflection
|
DE102007025910B4
(de)
*
|
2007-06-01 |
2013-08-29 |
Windmöller & Hölscher Kg |
Hintergrundbeleuchtung
|
US7877003B2
(en)
*
|
2007-06-20 |
2011-01-25 |
Microscan Systems, Inc. |
Devices, systems, and methods regarding images
|
US8011583B2
(en)
*
|
2007-07-02 |
2011-09-06 |
Microscan Systems, Inc. |
Systems, devices, and/or methods for managing data matrix lighting
|
DE102007043609B4
(de)
|
2007-09-13 |
2014-05-28 |
Ioss Intelligente Optische Sensoren & Systeme Gmbh |
Integrierte Beleuchtungsvorrichtung für einen optischen Codeleser
|
US9734376B2
(en)
|
2007-11-13 |
2017-08-15 |
Cognex Corporation |
System and method for reading patterns using multiple image frames
|
WO2009094489A1
(en)
*
|
2008-01-23 |
2009-07-30 |
Cyberoptics Corporation |
High speed optical inspection system with multiple illumination imagery
|
US8059280B2
(en)
|
2008-01-31 |
2011-11-15 |
Cyberoptics Corporation |
Method for three-dimensional imaging using multi-phase structured light
|
TWI382176B
(zh)
*
|
2008-02-19 |
2013-01-11 |
Utechzone Co Ltd |
Optical detection device
|
JP2009229158A
(ja)
*
|
2008-03-21 |
2009-10-08 |
Laser Solutions Co Ltd |
撮像装置
|
US7631979B1
(en)
|
2008-06-14 |
2009-12-15 |
Brown Richard D |
Universal lighting system for computer web camera
|
US8000594B2
(en)
*
|
2009-07-02 |
2011-08-16 |
Microscan Systems, Inc. |
Diffuse reflective illuminator
|
US8107808B2
(en)
*
|
2009-07-10 |
2012-01-31 |
Microscan Systems, Inc. |
Combination dark field and bright field illuminator
|
US8768159B2
(en)
|
2009-07-10 |
2014-07-01 |
Microscan Systems, Inc. |
Combination dark field and bright field illuminator
|
IT1395116B1
(it)
*
|
2009-07-29 |
2012-09-05 |
Utpvision S R L |
Sistema di rilevamento ottico di difetti superficiali
|
DE102009028149B4
(de)
|
2009-07-31 |
2011-12-08 |
Leica Instruments (Singapore) Pte. Ltd. |
Beleuchtungseinrichtung für ein Mikroskop
|
JP5263082B2
(ja)
*
|
2009-08-28 |
2013-08-14 |
Jfeスチール株式会社 |
リング照明装置およびリング照明装置を用いた表面検査装置
|
US8872912B2
(en)
*
|
2009-09-22 |
2014-10-28 |
Cyberoptics Corporation |
High speed distributed optical sensor inspection system
|
US8670031B2
(en)
|
2009-09-22 |
2014-03-11 |
Cyberoptics Corporation |
High speed optical inspection system with camera array and compact, integrated illuminator
|
US8894259B2
(en)
*
|
2009-09-22 |
2014-11-25 |
Cyberoptics Corporation |
Dark field illuminator with large working area
|
US8388204B2
(en)
*
|
2009-09-22 |
2013-03-05 |
Cyberoptics Corporation |
High speed, high resolution, three dimensional solar cell inspection system
|
US8681211B2
(en)
*
|
2009-09-22 |
2014-03-25 |
Cyberoptics Corporation |
High speed optical inspection system with adaptive focusing
|
IT1396723B1
(it)
*
|
2009-11-04 |
2012-12-14 |
Sacmi |
Apparato per la rilevazione di difetti di elementi da esaminare, in particolare coperchi metallici, impianto di rilevazione di difetti provvisto di tale apparato e metodo di funzionamento relativo.
|
FI20096192L
(fi)
|
2009-11-17 |
2011-05-18 |
Optomed Oy |
Kohteen valaiseminen
|
US8890946B2
(en)
*
|
2010-03-01 |
2014-11-18 |
Eyefluence, Inc. |
Systems and methods for spatially controlled scene illumination
|
JP5615604B2
(ja)
*
|
2010-06-30 |
2014-10-29 |
第一実業ビスウィル株式会社 |
チップled検査装置
|
DE102010032469B4
(de)
|
2010-07-28 |
2014-12-04 |
Ioss Intelligente Optische Sensoren & Systeme Gmbh |
Verfahren und Vorrichtung zum Lesen von Codes auf Solarzellen-Wafern
|
KR101245148B1
(ko)
*
|
2011-03-10 |
2013-03-19 |
주식회사 미르기술 |
영상 선명도가 개선된 비전검사장치
|
JP2014517914A
(ja)
|
2011-04-18 |
2014-07-24 |
イスメカ セミコンダクター ホールディング エス アー |
検査装置
|
HUE063638T2
(hu)
*
|
2011-04-29 |
2024-01-28 |
Siemens Healthcare Diagnostics Inc |
Nagy fényáramú kollimált megvilágító és eljárás egyenletes megvilágításra
|
US9752869B2
(en)
|
2011-08-15 |
2017-09-05 |
The Trustees Of Columbia University In The City Of New York |
Systems and methods for performing machine vision using diffuse structured light
|
US9219885B2
(en)
*
|
2011-08-24 |
2015-12-22 |
Delta Design, Inc. |
Imaging system with defocused and aperture-cropped light sources for detecting surface characteristics
|
FI125320B
(en)
*
|
2012-01-05 |
2015-08-31 |
Helmee Imaging Oy |
ORGANIZATION AND SIMILAR METHOD FOR OPTICAL MEASUREMENTS
|
TW201415077A
(zh)
*
|
2012-08-28 |
2014-04-16 |
Kla Tencor Corp |
用於一顯微鏡之多方向照明及顯微鏡
|
DE102013006996A1
(de)
*
|
2013-04-19 |
2014-10-23 |
Carl Zeiss Microscopy Gmbh |
Verfahren zur Beleuchtung eines Objektes in einem digitalen Lichtmikroskop, digitales Lichtmikroskop und Hellfeld-Auflichtbeleuchtungsvorrichtung für ein digitales Lichtmikroskop
|
US10126252B2
(en)
|
2013-04-29 |
2018-11-13 |
Cyberoptics Corporation |
Enhanced illumination control for three-dimensional imaging
|
US9467609B2
(en)
*
|
2013-05-10 |
2016-10-11 |
Mettler-Toledo, LLC |
Machine vision inspection systems and methods and aperture covers for use therewith
|
WO2014196010A1
(ja)
*
|
2013-06-03 |
2014-12-11 |
ヤマハ発動機株式会社 |
外観検査装置
|
US9353928B2
(en)
|
2013-08-28 |
2016-05-31 |
Lifetouch Inc. |
Reflective lighting system
|
CN104568859B
(zh)
*
|
2013-10-22 |
2017-10-13 |
承奕科技股份有限公司 |
具多组异角度光源的荧光观测装置、基架及荧光显微镜
|
JP6287249B2
(ja)
*
|
2014-01-22 |
2018-03-07 |
大日本印刷株式会社 |
外観検査装置、外観検査方法、およびプログラム
|
WO2015153564A2
(en)
*
|
2014-04-04 |
2015-10-08 |
Bio-Rad Laboratories, Inc. |
Annular illumination structure
|
WO2015171459A1
(en)
*
|
2014-05-05 |
2015-11-12 |
Alcoa Inc. |
Apparatus and methods for weld measurement
|
CN105222095B
(zh)
*
|
2014-05-28 |
2018-01-05 |
赛尔富电子有限公司 |
一种双排led条形灯
|
KR101659302B1
(ko)
*
|
2015-04-10 |
2016-09-23 |
주식회사 고영테크놀러지 |
3차원 형상 측정장치
|
JPWO2016194209A1
(ja)
*
|
2015-06-04 |
2018-03-22 |
オリンパス株式会社 |
撮像システム
|
JP6760283B2
(ja)
*
|
2015-07-08 |
2020-09-23 |
コニカミノルタ株式会社 |
画像読取装置及びインクジェット記録装置
|
JP6532325B2
(ja)
*
|
2015-07-09 |
2019-06-19 |
キヤノン株式会社 |
被計測物の形状を計測する計測装置
|
CN105277561B
(zh)
*
|
2015-10-26 |
2017-11-28 |
镇江苏仪德科技有限公司 |
基于机器视觉的硅片和电池片整齐度检测装置及检测方法
|
CN107782731B
(zh)
|
2016-08-31 |
2021-08-03 |
西门子能源有限公司 |
用于维护零部件表面受损的机械设备的方法
|
CN106323987A
(zh)
*
|
2016-09-30 |
2017-01-11 |
厦门威芯泰科技有限公司 |
一种用于检测高反射表面缺陷的照明光源
|
WO2018068009A1
(en)
*
|
2016-10-07 |
2018-04-12 |
Hutchinson Technology Incorporated |
On-axis and diffuse illumination for inspection systems
|
JP6499139B2
(ja)
*
|
2016-10-14 |
2019-04-10 |
矢崎総業株式会社 |
検査装置
|
HUE055404T2
(hu)
*
|
2017-06-06 |
2021-11-29 |
Sicpa Holding Sa |
Megvilágító berendezés egy olvasókészülék optikai rendszeréhez
|
US11280744B2
(en)
|
2017-09-28 |
2022-03-22 |
Nidec Corporation |
Appearance inspection apparatus and appearance inspection method
|
US11481568B1
(en)
*
|
2017-12-29 |
2022-10-25 |
Cognex Corporation |
Dome illuminator for vision system camera and method for using the same
|
US10527557B2
(en)
|
2017-12-29 |
2020-01-07 |
Radiant Vision Systems, LLC |
Adaptive diffuse illumination systems and methods
|
US10628646B1
(en)
|
2017-12-29 |
2020-04-21 |
Cognex Corporation |
Off-axis dual-sensor vision system camera and method for using the same
|
JP7187782B2
(ja)
*
|
2018-03-08 |
2022-12-13 |
オムロン株式会社 |
画像検査装置
|
KR102099729B1
(ko)
*
|
2018-10-26 |
2020-04-10 |
세메스 주식회사 |
기판 처리 장치
|
US10578951B1
(en)
*
|
2019-03-19 |
2020-03-03 |
Erik Espinosa |
Apparatus that enables the photographing of highly reflective, objects without reflections
|
CN111766748A
(zh)
*
|
2019-04-02 |
2020-10-13 |
苏州正方格自动化技术有限公司 |
一种组合光源
|
CN110286134A
(zh)
*
|
2019-07-26 |
2019-09-27 |
上海御微半导体技术有限公司 |
一种缺陷检测装置及其方法
|
JP7559768B2
(ja)
*
|
2019-11-15 |
2024-10-02 |
東洋製罐株式会社 |
撮像装置、検査装置及び検査方法
|
JP7501104B2
(ja)
*
|
2020-05-22 |
2024-06-18 |
富士フイルムビジネスイノベーション株式会社 |
読取装置、出力装置及び画像形成装置
|
US11836912B2
(en)
*
|
2020-09-22 |
2023-12-05 |
Future Dial, Inc. |
Grading cosmetic appearance of a test object based on multi-region determination of cosmetic defects
|
EP4260140A1
(de)
*
|
2020-12-14 |
2023-10-18 |
Hayoun, Denis |
Gleichmässige beleuchtungsbox für photographische oder kamera-bildgebung
|
CN114001295B
(zh)
*
|
2021-07-22 |
2024-07-26 |
北京波瑞芯工程技术研究院 |
一种gis隔离开关触头分合状态监测用补光装置及方法
|
IT202100019766A1
(it)
*
|
2021-07-23 |
2023-01-23 |
Istituto Naz Di Geofisica E Vulcanologia |
Metodo e apparato per acquisire immagini di oggetti tridimensionali reali o virtuali e visualizzare gli oggetti acquisiti su schermi fisici o in ambiente virtuale
|
US12242047B2
(en)
|
2023-06-29 |
2025-03-04 |
Mitutoyo Corporation |
Metrology system utilizing annular optical configuration
|