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DE69226337D1 - Schutzstruktur gegen elektrostatische Entladungen - Google Patents

Schutzstruktur gegen elektrostatische Entladungen

Info

Publication number
DE69226337D1
DE69226337D1 DE69226337T DE69226337T DE69226337D1 DE 69226337 D1 DE69226337 D1 DE 69226337D1 DE 69226337 T DE69226337 T DE 69226337T DE 69226337 T DE69226337 T DE 69226337T DE 69226337 D1 DE69226337 D1 DE 69226337D1
Authority
DE
Germany
Prior art keywords
electrostatic discharge
protective structure
structure against
against electrostatic
protective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69226337T
Other languages
English (en)
Other versions
DE69226337T2 (de
Inventor
William A Bishop
Mehdi Zamanian
Tsiu C Chan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics lnc USA
Original Assignee
SGS Thomson Microelectronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics Inc filed Critical SGS Thomson Microelectronics Inc
Application granted granted Critical
Publication of DE69226337D1 publication Critical patent/DE69226337D1/de
Publication of DE69226337T2 publication Critical patent/DE69226337T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
DE69226337T 1991-11-19 1992-11-18 Schutzstruktur gegen elektrostatische Entladungen Expired - Fee Related DE69226337T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/794,488 US5272371A (en) 1991-11-19 1991-11-19 Electrostatic discharge protection structure

Publications (2)

Publication Number Publication Date
DE69226337D1 true DE69226337D1 (de) 1998-08-27
DE69226337T2 DE69226337T2 (de) 1998-12-03

Family

ID=25162775

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69226337T Expired - Fee Related DE69226337T2 (de) 1991-11-19 1992-11-18 Schutzstruktur gegen elektrostatische Entladungen

Country Status (4)

Country Link
US (1) US5272371A (de)
EP (1) EP0546698B1 (de)
JP (1) JP3221942B2 (de)
DE (1) DE69226337T2 (de)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2685817B1 (fr) * 1991-12-31 1994-03-11 Sgs Thomson Microelectronics Sa Protection generale d'un circuit integre contre les surcharges permanentes et decharges electrostatiques.
FR2690786A1 (fr) * 1992-04-30 1993-10-29 Sgs Thomson Microelectronics Sa Dispositif de protection d'un circuit intégré contre les décharges électrostatiques.
US5440151A (en) * 1993-04-09 1995-08-08 Matra Mhs Electrostatic discharge protection device for MOS integrated circuits
US5473169A (en) * 1995-03-17 1995-12-05 United Microelectronics Corp. Complementary-SCR electrostatic discharge protection circuit
US5604373A (en) * 1995-04-03 1997-02-18 Motorola, Inc. Circuit and method of reverse voltage protection using a lateral transistor having a collector ring surrounding its base region
US5572394A (en) * 1995-04-06 1996-11-05 Industrial Technology Research Institute CMOS on-chip four-LVTSCR ESD protection scheme
US5754380A (en) * 1995-04-06 1998-05-19 Industrial Technology Research Institute CMOS output buffer with enhanced high ESD protection capability
JP3121618B2 (ja) * 1995-04-06 2001-01-09 インダストリアル テクノロジー リサーチ インスティチュート 多重セルトランジスタのためのn辺多角形セルレイアウト
US5637900A (en) * 1995-04-06 1997-06-10 Industrial Technology Research Institute Latchup-free fully-protected CMOS on-chip ESD protection circuit
KR100496362B1 (ko) * 1995-07-11 2006-05-02 텍사스 인스트루먼츠 인코포레이티드 기판트리거된래터럴npn을이용한집적esd보호회로
US5714784A (en) * 1995-10-19 1998-02-03 Winbond Electronics Corporation Electrostatic discharge protection device
US6469353B1 (en) 1996-07-01 2002-10-22 Texas Instruments Incorporated Integrated ESD protection circuit using a substrate triggered lateral NPN
SE512494C2 (sv) * 1997-09-02 2000-03-27 Ericsson Telefon Ab L M Skyddskrets
US5852541A (en) * 1997-10-22 1998-12-22 Winbond Electronics Corp. Early trigger of ESD protection device by an oscillation circuit
US6043967A (en) * 1997-10-22 2000-03-28 Winbond Electronics Corp. Early trigger of ESD protection device by a voltage pump circuit
US5870268A (en) * 1997-10-22 1999-02-09 Winbond Electronics Corp. Early trigger of ESD protection device by a current spike generator
US6091593A (en) * 1997-10-22 2000-07-18 Winbond Electronics Corp. Early trigger of ESD protection device by a negative voltage pump circuit
US5985705A (en) * 1998-06-30 1999-11-16 Lsi Logic Corporation Low threshold voltage MOS transistor and method of manufacture
SE9900439D0 (sv) * 1999-02-09 1999-02-09 Ericsson Telefon Ab L M Electrostatic discharge protection of integrated circuits
US20010043449A1 (en) * 2000-05-15 2001-11-22 Nec Corporation ESD protection apparatus and method for fabricating the same
US7629210B2 (en) * 2000-05-15 2009-12-08 Nec Corporation Method for fabricating an ESD protection apparatus for discharging electric charge in a depth direction
EP2395620B1 (de) 2001-03-16 2015-06-17 Sofics BVBA Strukturen zum Schutz vor elektrostatischen Entladungen für Hochgeschwindigkeitstechnologien mit gemischten und Ultraniederspannungsversorgungen
US7589944B2 (en) * 2001-03-16 2009-09-15 Sofics Bvba Electrostatic discharge protection structures for high speed technologies with mixed and ultra-low voltage supplies
US6455919B1 (en) 2001-03-19 2002-09-24 International Business Machines Corporation Internally ballasted silicon germanium transistor
KR20020082400A (ko) * 2001-04-19 2002-10-31 닛본 덴기 가부시끼가이샤 Esd보호장치 및 그것의 제조방법
KR100401507B1 (ko) * 2001-05-10 2003-10-17 주식회사 하이닉스반도체 반도체 메모리 장치의 입력 캐패시턴스의 미세조정 회로및 그 제조방법
US6770938B1 (en) 2002-01-16 2004-08-03 Advanced Micro Devices, Inc. Diode fabrication for ESD/EOS protection
US6635931B1 (en) * 2002-04-02 2003-10-21 Illinois Institute Of Technology Bonding pad-oriented all-mode ESD protection structure
US6927345B2 (en) * 2002-05-16 2005-08-09 Taiwan Semiconductor Manufacturing Co., Ltd Guard ring having electrically isolated lightening bars
US7244992B2 (en) * 2003-07-17 2007-07-17 Ming-Dou Ker Turn-on-efficient bipolar structures with deep N-well for on-chip ESD protection
JP4000096B2 (ja) * 2003-08-04 2007-10-31 株式会社東芝 Esd保護回路
DE10348446B4 (de) * 2003-10-14 2011-12-15 Zentrum Mikroelektronik Dresden Ag Anordnung für eine ESD-Schutzschaltung
JP4094012B2 (ja) * 2005-02-21 2008-06-04 松下電器産業株式会社 半導体装置
JP4955222B2 (ja) 2005-05-20 2012-06-20 ルネサスエレクトロニクス株式会社 半導体装置の製造方法
JP5132077B2 (ja) * 2006-04-18 2013-01-30 オンセミコンダクター・トレーディング・リミテッド 半導体装置
US8648386B2 (en) * 2011-08-31 2014-02-11 Macronix International Co., Ltd. Semiconductor structure and manufacturing method for the same and ESD circuit
JP5749616B2 (ja) * 2011-09-27 2015-07-15 セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー 半導体装置
JP2013172085A (ja) * 2012-02-22 2013-09-02 Asahi Kasei Electronics Co Ltd 半導体装置の製造方法及び半導体装置
US9716016B2 (en) * 2012-12-20 2017-07-25 Taiwan Semiconductor Manufacturing Company Limited Electrostatic discharge (ESD) clamp
US9343369B2 (en) * 2014-05-19 2016-05-17 Qualcomm Incorporated Three dimensional (3D) integrated circuits (ICs) (3DICs) and related systems
TWI661530B (zh) * 2018-02-13 2019-06-01 力晶積成電子製造股份有限公司 靜電放電保護元件
KR20210071134A (ko) * 2019-12-05 2021-06-16 삼성전자주식회사 반도체 장치

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE269946C (de) *
US3787717A (en) * 1971-12-09 1974-01-22 Ibm Over voltage protection circuit lateral bipolar transistor with gated collector junction
US4476476A (en) * 1979-04-05 1984-10-09 National Semiconductor Corporation CMOS Input and output protection circuit
JPS60233856A (ja) * 1984-05-02 1985-11-20 Hitachi Ltd 半導体装置
US4692781B2 (en) * 1984-06-06 1998-01-20 Texas Instruments Inc Semiconductor device with electrostatic discharge protection
JPS6236867A (ja) * 1985-08-09 1987-02-17 Mitsubishi Electric Corp 入力保護回路
US4987465A (en) * 1987-01-29 1991-01-22 Advanced Micro Devices, Inc. Electro-static discharge protection device for CMOS integrated circuit inputs
US4819047A (en) * 1987-05-15 1989-04-04 Advanced Micro Devices, Inc. Protection system for CMOS integrated circuits
US4855620A (en) * 1987-11-18 1989-08-08 Texas Instruments Incorporated Output buffer with improved ESD protection
FR2624655B1 (fr) * 1987-12-14 1990-05-11 Sgs Thomson Microelectronics Structure de protection d'un acces a un circuit integre
US4896243A (en) * 1988-12-20 1990-01-23 Texas Instruments Incorporated Efficient ESD input protection scheme
US5043782A (en) * 1990-05-08 1991-08-27 David Sarnoff Research Center, Inc. Low voltage triggered snap-back device
DE3918090A1 (de) * 1989-06-02 1990-12-06 Siemens Ag Schutzschaltung gegen ueberspannungen fuer mos-bauelemente
FR2649830B1 (fr) * 1989-07-13 1994-05-27 Sgs Thomson Microelectronics Structure de circuit integre cmos protege contre les decharges electrostatiques
JPH065705B2 (ja) * 1989-08-11 1994-01-19 株式会社東芝 半導体集積回路装置

Also Published As

Publication number Publication date
US5272371A (en) 1993-12-21
JPH05259394A (ja) 1993-10-08
EP0546698A1 (de) 1993-06-16
JP3221942B2 (ja) 2001-10-22
DE69226337T2 (de) 1998-12-03
EP0546698B1 (de) 1998-07-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee