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DE60108044D1 - Laser Mikroskop - Google Patents

Laser Mikroskop

Info

Publication number
DE60108044D1
DE60108044D1 DE60108044T DE60108044T DE60108044D1 DE 60108044 D1 DE60108044 D1 DE 60108044D1 DE 60108044 T DE60108044 T DE 60108044T DE 60108044 T DE60108044 T DE 60108044T DE 60108044 D1 DE60108044 D1 DE 60108044D1
Authority
DE
Germany
Prior art keywords
laser microscope
microscope
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60108044T
Other languages
English (en)
Other versions
DE60108044T2 (de
Inventor
Hiroshi Sasaki
Yoshihiro Shimada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE60108044D1 publication Critical patent/DE60108044D1/de
Application granted granted Critical
Publication of DE60108044T2 publication Critical patent/DE60108044T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Lasers (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE60108044T 2000-10-31 2001-10-29 Laser Mikroskop Expired - Lifetime DE60108044T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000333782A JP4685229B2 (ja) 2000-10-31 2000-10-31 レーザ顕微鏡
JP2000333782 2000-10-31

Publications (2)

Publication Number Publication Date
DE60108044D1 true DE60108044D1 (de) 2005-02-03
DE60108044T2 DE60108044T2 (de) 2006-02-09

Family

ID=18809811

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60108044T Expired - Lifetime DE60108044T2 (de) 2000-10-31 2001-10-29 Laser Mikroskop

Country Status (4)

Country Link
US (1) US7187493B2 (de)
EP (1) EP1202102B1 (de)
JP (1) JP4685229B2 (de)
DE (1) DE60108044T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10233074B4 (de) 2002-07-19 2005-05-19 Leica Microsystems Heidelberg Gmbh Optische Vorrichtung zum Vereinigen von Lichtstrahlen und Scanmikroskop
DE10311286A1 (de) * 2003-03-14 2004-09-23 Leica Microsystems Semiconductor Gmbh Beleuchtungsvorrichtung für ein optisches System
EP1637871B1 (de) 2003-05-30 2011-03-23 Olympus Corporation Messvorrichtung umfassend eine lichtaufnahmeeinheit
JP2005017282A (ja) * 2003-05-30 2005-01-20 Olympus Corp 受光ユニットおよびそれを含む測定装置
JP4615834B2 (ja) * 2003-07-04 2011-01-19 オリンパス株式会社 レーザ変調装置および方法
DE10332064A1 (de) * 2003-07-11 2005-01-27 Carl Zeiss Jena Gmbh Anordnung zur Erfassung der Beleuchtungsstrahlung ineinem Laser-Scanning-Mikroskop
DE102005008197A1 (de) * 2005-02-22 2006-08-31 Leica Microsystems Cms Gmbh Mikroskop
JP4873917B2 (ja) * 2005-09-28 2012-02-08 オリンパス株式会社 走査型レーザ顕微鏡装置
DE102005054184B4 (de) * 2005-11-14 2020-10-29 Carl Zeiss Microscopy Gmbh Multispektrale Beleuchtungsvorrichtung und Messverfahren
JP4290209B2 (ja) * 2007-04-05 2009-07-01 三菱電機株式会社 画像表示装置および画像表示方法
KR101908328B1 (ko) 2016-10-06 2018-12-18 재단법인 아산사회복지재단 다중 내시경 결합 모듈
WO2018066940A1 (ko) * 2016-10-06 2018-04-12 재단법인 아산사회복지재단 다중 내시경 결합 모듈
EP3538941A4 (de) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York Schnelles hochauflösendes bildgebungsverfahren für grosse proben
US11029506B2 (en) * 2018-04-20 2021-06-08 Coluxa Inc. Scanning microscope with multiplexed light sources

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4449821A (en) * 1982-07-14 1984-05-22 E. I. Du Pont De Nemours And Company Process colorimeter
JPH068322B2 (ja) * 1987-02-28 1994-02-02 拓夫 坂井 ペクチンの製造法
FI77736C (fi) * 1987-06-25 1989-04-10 Valtion Teknillinen Foerfarande foer reglering av straolkaella och reglerbar straolkaella.
US4972258A (en) * 1989-07-31 1990-11-20 E. I. Du Pont De Nemours And Company Scanning laser microscope system and methods of use
JP3407893B2 (ja) * 1991-05-27 2003-05-19 パイオニア株式会社 半導体レーザ制御装置
US5886784A (en) * 1993-09-08 1999-03-23 Leica Lasertechink Gmbh Device for the selection and detection of at least two spectral regions in a beam of light
US5684582A (en) * 1994-03-18 1997-11-04 Lucid Technologies, Inc. Spectrophotometry
US5835262A (en) 1994-12-28 1998-11-10 Research Development Corporation Of Japan Multi-wavelength optical microscope
US5793049A (en) * 1995-07-06 1998-08-11 Yale University Optical filtering and spectroscopic imaging
US6167173A (en) * 1997-01-27 2000-12-26 Carl Zeiss Jena Gmbh Laser scanning microscope
ES2313745T3 (es) * 1997-03-19 2009-03-01 Lucid, Inc. Cirugia celular que utiliza microscopia confocal.
JP4754661B2 (ja) * 1997-06-09 2011-08-24 ミリポア・コーポレイション 流体サンプル中のミクロ粒子を検出するための方法及び装置
JPH1194742A (ja) * 1997-09-16 1999-04-09 Olympus Optical Co Ltd 蛍光顕微鏡
JPH11231222A (ja) 1998-01-27 1999-08-27 Carl Zeiss Jena Gmbh 走査ユニット付顕微鏡、そのための配置および操作方法
JP4262319B2 (ja) * 1998-03-23 2009-05-13 オリンパス株式会社 走査型レーザ顕微鏡
DE19827139C2 (de) 1998-06-18 2002-01-31 Zeiss Carl Jena Gmbh Mikroskop mit einem über eine Lichtleitfaser eingekoppelten Kurzpulslaser
US6038023A (en) * 1998-07-31 2000-03-14 The Research Foundation Of State University Of New York Sensors for detection and spectroscopy
EP1164406B1 (de) * 2000-06-17 2019-04-17 Leica Microsystems CMS GmbH Verfahren und Vorrichtung zur Beleuchtung eines Objekts
EP1164402B1 (de) * 2000-06-17 2010-04-28 Leica Microsystems CMS GmbH Scanmikroskop mit mehrbandiger Beleuchtung und optisches Bauelement für ein Scanmikroskop mit mehrbandiger Beleuchtung
DE20122782U1 (de) * 2000-06-17 2007-11-15 Leica Microsystems Cms Gmbh Beleuchtungseinrichtung

Also Published As

Publication number Publication date
JP2002139675A (ja) 2002-05-17
US7187493B2 (en) 2007-03-06
US20020085274A1 (en) 2002-07-04
EP1202102A1 (de) 2002-05-02
JP4685229B2 (ja) 2011-05-18
EP1202102B1 (de) 2004-12-29
DE60108044T2 (de) 2006-02-09

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Legal Events

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