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DE60030480D1 - DEVICE AND METHOD FOR THE SELECTIVE COMPRESSION OF TEST RESULTS - Google Patents

DEVICE AND METHOD FOR THE SELECTIVE COMPRESSION OF TEST RESULTS

Info

Publication number
DE60030480D1
DE60030480D1 DE60030480T DE60030480T DE60030480D1 DE 60030480 D1 DE60030480 D1 DE 60030480D1 DE 60030480 T DE60030480 T DE 60030480T DE 60030480 T DE60030480 T DE 60030480T DE 60030480 D1 DE60030480 D1 DE 60030480D1
Authority
DE
Germany
Prior art keywords
compactor
scan chain
enabled
scan
outputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60030480T
Other languages
German (de)
Other versions
DE60030480T2 (en
Inventor
Janusz Rajski
Jerzy Tyszer
Mark Kassab
Nilanjan Mukherjee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mentor Graphics Corp
Original Assignee
Mentor Graphics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mentor Graphics Corp filed Critical Mentor Graphics Corp
Publication of DE60030480D1 publication Critical patent/DE60030480D1/en
Application granted granted Critical
Publication of DE60030480T2 publication Critical patent/DE60030480T2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

A method and apparatus to compact test responses containing unknown values or multiple fault effects in a deterministic test environment. The proposed selective compactor employs a linear compactor with selection circuitry for selectively passing test responses to the compactor. In one embodiment, gating logic is controlled by a control register, a decoder, and flag registers. This circuitry, in conjunction with any conventional parallel test-response compaction scheme, allows control circuitry to selectively enable serial outputs of desired scan chains to be fed into a parallel compactor at a particular clock rate. A first flag register determines whether all, or only some, scan chain outputs are enabled and fed through the compactor. A second flag register determines if the scan chain selected by the selector register is enabled and all other scan chains are disabled, or the selected scan chain is disabled and all other scan chains are enabled. Other embodiments allow selective masking of a variable number of scan chain outputs.
DE60030480T 1999-11-23 2000-11-15 DEVICE AND METHOD FOR THE SELECTIVE COMPRESSION OF TEST RESULTS Expired - Lifetime DE60030480T2 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US16713699P 1999-11-23 1999-11-23
US167136P 1999-11-23
US619988 2000-07-20
US09/619,988 US6557129B1 (en) 1999-11-23 2000-07-20 Method and apparatus for selectively compacting test responses
PCT/US2000/031376 WO2001038889A1 (en) 1999-11-23 2000-11-15 Method and apparatus for selectively compacting test responses

Publications (2)

Publication Number Publication Date
DE60030480D1 true DE60030480D1 (en) 2006-10-12
DE60030480T2 DE60030480T2 (en) 2007-06-06

Family

ID=26862892

Family Applications (2)

Application Number Title Priority Date Filing Date
DE60030480T Expired - Lifetime DE60030480T2 (en) 1999-11-23 2000-11-15 DEVICE AND METHOD FOR THE SELECTIVE COMPRESSION OF TEST RESULTS
DE60043319T Expired - Lifetime DE60043319D1 (en) 1999-11-23 2000-11-15 Method and device for the selective compaction of test reactions

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE60043319T Expired - Lifetime DE60043319D1 (en) 1999-11-23 2000-11-15 Method and device for the selective compaction of test reactions

Country Status (7)

Country Link
US (5) US6557129B1 (en)
EP (3) EP1722246B1 (en)
JP (1) JP4047584B2 (en)
AT (2) ATE448485T1 (en)
DE (2) DE60030480T2 (en)
HK (2) HK1049206B (en)
WO (1) WO2001038889A1 (en)

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