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JPH01239486A - Output response compressor - Google Patents

Output response compressor

Info

Publication number
JPH01239486A
JPH01239486A JP63066500A JP6650088A JPH01239486A JP H01239486 A JPH01239486 A JP H01239486A JP 63066500 A JP63066500 A JP 63066500A JP 6650088 A JP6650088 A JP 6650088A JP H01239486 A JPH01239486 A JP H01239486A
Authority
JP
Japan
Prior art keywords
output
circuit
input
under test
circuit under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63066500A
Other languages
Japanese (ja)
Inventor
Masaaki Yoshida
正昭 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63066500A priority Critical patent/JPH01239486A/en
Publication of JPH01239486A publication Critical patent/JPH01239486A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To obtain fault information more in detail than before by providing a selecting means which inputs the output response from one output line to the initial stage of a multi-input line type feedback shift register selectively. CONSTITUTION:When a control signal C2 is set to a logical level '0', AND gates 10, 11, and 12 output logic '0' regardless of outputs D1, D2 and D3 from a circuit to be tested, so the values of flip-flops 1, 2, and 3 of front stages are only shifted to the flip-flops 2, 3, and 4. At this time, a control signal C1 controls a multiplexer 13 to input only the output of the circuit to the output response compressor so that only one of the outputs D0, D1, D2 and D3 of the circuit is selected. Namely, the output response compressor which compresses one optional output among D0-D3 from the circuit is realized in this case.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は出力応答圧縮器、特に集積回路の論理機能試験
が容易となり、かつ極めて複雑な集積回路でも試験可能
となる様に集積回路自体に組み込まれた出力応答圧縮器
に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention provides an output response compressor, especially an integrated circuit which is designed to facilitate testing of the logic function of an integrated circuit, and to enable testing of even extremely complex integrated circuits. Concerning an embedded output response compressor.

〔従来の技術〕[Conventional technology]

高度に集積1ヒされ、かつ複雑化した集積回路の論理機
能テストを容易にする1つの方法は、テスI・すべき集
積回路内部にテストパターン発生器及びテスト出力評価
部等のテスト機構を組み込んでしまうことである。この
様にすることにより、集積回路内部に埋め込まれて外部
端子から直接アクセスできず、テスI・することが困難
であった部分の回路も、容易に論理機能テストを行なう
ことができる。
One method to facilitate logical function testing of highly integrated and complex integrated circuits is to incorporate test mechanisms such as a test pattern generator and test output evaluation section inside the integrated circuit to be tested. It is something that will happen. By doing so, it is possible to easily perform logic function tests on circuits that are embedded within the integrated circuit and cannot be directly accessed from external terminals, making it difficult to test.

ところで、テスト機構を集積回路に組み込む場合、膨大
な出力応答を逐一期待値と比較することは不可能なので
、出力応答を圧縮し、圧縮した出力応答を期待値と比較
するという方法が採られる。
By the way, when a test mechanism is incorporated into an integrated circuit, it is impossible to compare a huge number of output responses one by one with expected values, so a method is adopted in which the output responses are compressed and the compressed output responses are compared with the expected values.

この出力応答圧縮器はテスI・出力評価部の重要な部分
を占める論理回路ブロックであるが、1979年に開催
された国際テスト会議(InternationalT
est Conference)の論文集37ページ〜
41ページに”BtllLT−IN LOGICBLO
CK 0BSERVATTON TECIINTQUE
S′°と題して報告された論文中に示された多入力符号
解析器が、よく用いられる。
This output response compressor is a logic circuit block that occupies an important part of the test I/output evaluation section.
est Conference) collection of papers page 37~
“BtllLT-IN LOGIC BLO” on page 41
CK 0BSERVATTON TECIINTQUE
The multi-input sign analyzer presented in the paper entitled S'° is often used.

この多入力符号解析器は、線型帰還シフトレジスタの各
段に入力を入れられる様にしたもので、4ビツトの多入
力符号解析器の例の概略プロ・ツク図を示す。
This multi-input code analyzer is designed so that inputs can be input to each stage of a linear feedback shift register, and a schematic diagram of an example of a 4-bit multi-input code analyzer is shown.

第2図は、被テスト回路(図示せず)からの出力がり。Figure 2 shows the output from the circuit under test (not shown).

、Di 、D2 、D3の4ビツトである場合を示して
おり、あるサイクルにおける被テスト回路の各出力り、
、D2.D3は排他的論理和回路(以下EXORゲート
と記す>26.27.28に入力され、フリップフロッ
プ21,22.23の各出力との排他的論理和演算後、
フリップフロップ22.23.24に入力される。また
被テスト回路の出力DoはEXORゲート25に入力さ
れ、フリップフロップ23と24との排他的論理和演算
後、フリップフロ・・lプ21に入力される。
, Di, D2, and D3, each output of the circuit under test in a certain cycle is
, D2. D3 is input to an exclusive OR circuit (hereinafter referred to as EXOR gate), and after exclusive OR operation with each output of flip-flops 21 and 22.23,
It is input to flip-flops 22, 23, and 24. Further, the output Do of the circuit under test is input to an EXOR gate 25, and after an exclusive OR operation between flip-flops 23 and 24, is input to a flip-flop 21.

そして、次のサイクルで被テスト回路の各出力り、、D
、、D2.D3も全く同様にしてフリップフロップ21
,22,23.24に各々入力され、以後同じ動作が繰
り返される。従って、被テスト回路からの出力が何パタ
ーンあっても、結果は4ビツトに圧縮されることになり
、期待値も4ビツトで良く、テストのために付加するハ
ードウェア量が少なくてすむ。
Then, in the next cycle, each output of the circuit under test is
,,D2. D3 also has flip-flop 21 in exactly the same way.
, 22, 23, and 24, respectively, and the same operation is repeated thereafter. Therefore, no matter how many patterns there are output from the circuit under test, the results will be compressed to 4 bits, the expected value will only need to be 4 bits, and the amount of hardware added for testing can be reduced.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、上述の出力応答圧縮器においては、被テ
スト回路からの出力り。、D、、D2゜D3全てを同時
に圧縮しているので、被テスト回路全体の良否の判定は
できても、もつと詳細な故障箇所に関する情報は全く得
られず、不良解析が出来ないという問題点を有する。
However, in the output response compressor described above, the output from the circuit under test. , D, , D2゜D3 are all compressed at the same time, so even though it is possible to judge whether the entire circuit under test is good or bad, it is impossible to obtain any detailed information about the failure location, making failure analysis impossible. Has a point.

本発明の目的は、上記の従来技術の問題点を排除し、よ
り詳細な故障箇所に関する情報が得られる出力応答圧縮
器を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide an output response compressor that eliminates the problems of the prior art described above and provides more detailed information regarding failure locations.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の出力応答圧縮器は、複数の出力線からの出力応
答を同時に圧縮する多入力線型帰還シフトレジスタ型の
出力応答圧縮器において、前記複数の出力線のうちの1
つの出力線からの出力応答を選択的に前記多入力線型帰
還シフトレジスタの初段に入力する第1の選択手段と、
前記複数の出力線から前記任意の1つを除いた残りの出
力線からの出力応答のそれぞれを前記多入力線型帰還シ
フトレジスタの初段以外の各段に入力するか否かをj■
択する第2の選択手段とを設けたことを特徴とする。
The output response compressor of the present invention is a multi-input linear feedback shift register type output response compressor that simultaneously compresses output responses from a plurality of output lines.
first selection means for selectively inputting the output responses from the two output lines to the first stage of the multi-input linear feedback shift register;
It is determined whether each of the output responses from the output lines remaining after removing the arbitrary one from the plurality of output lines is input to each stage other than the first stage of the multi-input linear feedback shift register.
The present invention is characterized in that a second selection means for selecting is provided.

〔作用〕[Effect]

本発明は、上記構成を採用することにより従来技術にお
ける問題点を解消している。すなわち、従来技術は全出
力同時圧縮しかできないので、被テスト回路全体の良否
判定しか出来ないが、本発明は、被テスト回路の各出力
を1つずつ圧縮することも可能にすることで、より詳細
な故障箇所に関する情報が得られる。
The present invention solves the problems in the prior art by employing the above configuration. In other words, since the conventional technology can only compress all outputs simultaneously, it is only possible to judge the quality of the entire circuit under test. However, the present invention makes it possible to compress each output of the circuit under test one by one. Detailed information on the failure location can be obtained.

〔実施例〕〔Example〕

以下、図面を参照しながら本発明の詳細な説明する。 Hereinafter, the present invention will be described in detail with reference to the drawings.

第1図は、本発明の典型的な一実施例を示す構成図であ
る9 本実施例は被テスト回路(図示省略)からの出力が4ビ
ツトで、これを圧縮する出力応答圧縮器の段数も同一で
ある場合を示しているが、本発明はこれに限定されるも
のではなく、出力応答圧縮器の段数が被テスト回路の出
力数よりも多くてもかまわないのは言うまでもない。
FIG. 1 is a block diagram showing a typical embodiment of the present invention.9 In this embodiment, the output from the circuit under test (not shown) is 4 bits, and the number of stages of the output response compressor to compress this is 4 bits. Although the present invention is not limited to this, it goes without saying that the number of stages of the output response compressor may be greater than the number of outputs of the circuit under test.

さて、第1図に示した出力応答圧縮器は、被テスト回路
からの出力り。、D、、D2.D3に対応する4つのフ
リップフロップ1.2,3.4と、各フリップフロップ
に対応する4つのEXORゲート5,6.7.8と、そ
の出力がそれぞれEXOR6,7,8の一方の入力とな
るANDゲート10.11.12と、マルチプレクサ1
3とから成り、制御信号C2を切り換えることにより、
2種類の出力応答圧縮器として動作する。
Now, the output response compressor shown in FIG. 1 responds to the output from the circuit under test. ,D,,D2. Four flip-flops 1.2, 3.4 corresponding to D3, four EXOR gates 5, 6, 7.8 corresponding to each flip-flop, and their outputs are connected to one input of EXOR 6, 7, 8, respectively. AND gates 10, 11, 12 and multiplexer 1
3, and by switching the control signal C2,
It operates as two types of output response compressors.

1つは被テス■・回路からの全出力Do〜D3を同時に
圧縮する従来と同様の出力応答圧縮器であり、もう1つ
は被テスト回路からの出力り。〜D3のうちの任意の1
つの出力のみを圧縮する出力応答圧縮器である。
One is a conventional output response compressor that simultaneously compresses all outputs Do to D3 from the circuit under test, and the other is the output from the circuit under test. Any one of ~D3
It is an output-responsive compressor that compresses only one output.

制御信号C2を論理” 1 ”のレベルに設定すると、
ANDゲート10.11.12は被テスト回路からの出
力り、、D2.D、を出力し、EXORゲー)6,7.
8にそれぞれ入力する。従ってフリップフロップ2,3
.4には前段のフリップフロップ1,2.3と被テスト
回路からの出力り、、D2.D3とのそれぞれ排他的論
理和か入力されることになる。
When the control signal C2 is set to the logic "1" level,
AND gates 10.11.12 output the outputs from the circuit under test, D2. D, and EXOR game) 6, 7.
8 respectively. Therefore flip-flops 2, 3
.. 4 are the outputs from the previous stage flip-flops 1, 2.3 and the circuit under test, D2. The respective exclusive ORs with D3 are input.

そして、この時制御信号C1を、マルチプレクサ13が
被テスト回路からの出力り。、Dl。
At this time, the multiplexer 13 outputs the control signal C1 from the circuit under test. , Dl.

D2.D、のうち出力り。を出力する様に設定すると、
EXORゲート5には被テスト回路からの出力Doが入
力され、フリップフロップ1には、フリップフロップ3
,4と、この出力Doの排他的論理和か入力されること
になる。即ち、この場合には前述の従来例と同様に、被
テスト回路からの出力り。〜D3を全て同時に圧縮する
出力応答圧縮器が実現される。
D2. D, output. If you set it to output,
The EXOR gate 5 receives the output Do from the circuit under test, and the flip-flop 1 receives the output Do from the circuit under test.
, 4, and the exclusive OR of this output Do. That is, in this case, as in the conventional example described above, the output from the circuit under test. An output-responsive compressor is realized that compresses ~D3 all at the same time.

次に制御信号C2を論理“0パのレベルに設定すると、
ANDゲー1−10.11.12は被テスト回路からの
出力り、、D2.D3にかかわらず論理“0′°を出力
するので、フリップフロップ2.3.4は前段のフリッ
プフロップ1,2.3の値がシフトされるだけとなる。
Next, when the control signal C2 is set to the logic “0” level,
AND game 1-10.11.12 is the output from the circuit under test, D2. Since the logic "0'° is outputted regardless of D3, the values of the flip-flops 1 and 2.3 in the previous stage are simply shifted to the flip-flop 2.3.4.

そしてこの時制御信号C1は被テスト回路からの出力D
o、D、。
At this time, the control signal C1 is the output D from the circuit under test.
o, D,.

D2.D3のうちのいずれか1つを選択する様にマルチ
プレクサ13を制御するので、マルチプレクサ13によ
り選択的に出力された被テスト回路からの出力のみが、
出力応答圧縮器に入力されることになる。即ち、この場
合には、被テスト回路からの出力り。〜D3のうちの任
意の1つを圧縮する出力応答圧縮器が実現される。
D2. Since the multiplexer 13 is controlled to select any one of D3, only the output from the circuit under test that is selectively output by the multiplexer 13 is
The output will be input to the response compressor. That is, in this case, the output from the circuit under test. An output response compressor is implemented that compresses any one of ~D3.

この様に、1つの出力応答圧縮器に2つのモードをもた
せることにより、従来例で得られる故障に関する情報よ
り多くの情報が得られる。即ち、最初に被テスト回路の
出力り。〜D、を全て同時に圧縮するモードで動作させ
、被テスト回路のGo、/ N OG Oテストを行な
う。そして、不良と判定された被テスト回路にのみ、1
つの出力だけを選択的に圧縮するモードを適用し、被テ
スト回路の出力を順次本発明による出力応答圧縮器に入
力し、テストすることにより、どの出力が不正出力を出
したのかを容易に検出することができるからである。
In this way, by providing one output response compressor with two modes, more information about failures can be obtained than in the conventional example. That is, first the output of the circuit under test. ~D, are operated in a mode that compresses them all at the same time, and the Go,/NOGO test of the circuit under test is performed. Then, only for the circuit under test that is determined to be defective,
By applying a mode in which only one output is selectively compressed and sequentially inputting the outputs of the circuit under test to the output response compressor according to the present invention and testing, it is easy to detect which output has issued an incorrect output. This is because it can be done.

1つの出力のみを圧縮できるモードでは入カバターンの
何パターン目で故障が検出されたかを検出することもで
き、従来例にくらべて、被テスト回路の故障箇所に関す
る情報が格段に増加することになる。しかも極めてわず
かな論理ゲートの追加で実現できる5 〔発明の効果〕 本発明によれば、以上述べた様な構成を採用することに
より、従来例にくらべより詳細な故障情報が得られるよ
うになる。
In a mode where only one output can be compressed, it is also possible to detect in which pattern of the input pattern a fault was detected, which greatly increases information on the fault location in the circuit under test compared to conventional methods. . Moreover, it can be realized with the addition of a very small number of logic gates.5 [Effects of the Invention] According to the present invention, by adopting the configuration described above, more detailed failure information can be obtained compared to the conventional example. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す構成図であり、第2図
は従来例を示す構成図である。 Do、D、、D2.D3・・・被テスト回路からの出力
、1.2.3,4,21.22.23.24・・・フリ
・ツブフロップ、5,6,7,8,9.25゜26.2
7.28.29・・・排他的論理和回路、10.11,
12.・・・ANDゲート、13・・・マルチプレクサ
、CI、C2・・・制御信号。
FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG. 2 is a block diagram showing a conventional example. Do, D,, D2. D3... Output from the circuit under test, 1.2.3, 4, 21.22.23.24... Free tube flop, 5, 6, 7, 8, 9.25° 26.2
7.28.29...Exclusive OR circuit, 10.11,
12. ...AND gate, 13...multiplexer, CI, C2...control signal.

Claims (1)

【特許請求の範囲】 複数の出力線からの出力応答を同時に圧縮する多入力線
型帰還シフトレジスタ型の出力応答圧縮器において、 前記複数の出力線のうちの1つの出力線からの出力応答
を選択的に前記多入力線型帰還シフトレジスタの初段に
入力する第1の選択手段と、前記複数の出力線から前記
任意の1つを除いた残りの出力線からの出力応答のそれ
ぞれを前記多入力線型帰還シフトレジスタの初段以外の
各段に入力するか否かを選択する第2の選択手段とを設
けたことを特徴とする多入力線型帰還シフトレジスタ型
の出力応答圧縮器。
[Claims] In a multi-input linear feedback shift register type output response compressor that simultaneously compresses output responses from a plurality of output lines, the output response from one of the plurality of output lines is selected. a first selection means that is input to the first stage of the multi-input linear feedback shift register; and output responses from the remaining output lines excluding the arbitrary one from the plurality of output lines, respectively, to the multi-input linear feedback shift register. 1. A multi-input linear feedback shift register type output response compressor, comprising second selection means for selecting whether or not to input to each stage of the feedback shift register other than the first stage.
JP63066500A 1988-03-18 1988-03-18 Output response compressor Pending JPH01239486A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63066500A JPH01239486A (en) 1988-03-18 1988-03-18 Output response compressor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63066500A JPH01239486A (en) 1988-03-18 1988-03-18 Output response compressor

Publications (1)

Publication Number Publication Date
JPH01239486A true JPH01239486A (en) 1989-09-25

Family

ID=13317605

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63066500A Pending JPH01239486A (en) 1988-03-18 1988-03-18 Output response compressor

Country Status (1)

Country Link
JP (1) JPH01239486A (en)

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US7093175B2 (en) 1999-11-23 2006-08-15 Janusz Rajski Decompressor/PRPG for applying pseudo-random and deterministic test patterns
US7111209B2 (en) 1999-11-23 2006-09-19 Janusz Rajski Test pattern compression for an integrated circuit test environment
US7260591B2 (en) 1999-11-23 2007-08-21 Janusz Rajski Method for synthesizing linear finite state machines
US7263641B2 (en) 1999-11-23 2007-08-28 Janusz Rajski Phase shifter with reduced linear dependency
US7302624B2 (en) 2003-02-13 2007-11-27 Janusz Rajski Adaptive fault diagnosis of compressed test responses
US7370254B2 (en) 2003-02-13 2008-05-06 Janusz Rajski Compressing test responses using a compactor
US7437640B2 (en) 2003-02-13 2008-10-14 Janusz Rajski Fault diagnosis of compressed test responses having one or more unknown states
US7478296B2 (en) 1999-11-23 2009-01-13 Janusz Rajski Continuous application and decompression of test patterns to a circuit-under-test
US7493540B1 (en) 1999-11-23 2009-02-17 Jansuz Rajski Continuous application and decompression of test patterns to a circuit-under-test
US7500163B2 (en) 1999-11-23 2009-03-03 Janusz Rajski Method and apparatus for selectively compacting test responses
US7509550B2 (en) 2003-02-13 2009-03-24 Janusz Rajski Fault diagnosis of compressed test responses
US7818644B2 (en) 2006-02-17 2010-10-19 Janusz Rajski Multi-stage test response compactors
US9134370B2 (en) 1999-11-23 2015-09-15 Mentor Graphics Corporation Continuous application and decompression of test patterns and selective compaction of test responses
US9664739B2 (en) 1999-11-23 2017-05-30 Mentor Graphics Corporation Continuous application and decompression of test patterns and selective compaction of test responses

Cited By (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9134370B2 (en) 1999-11-23 2015-09-15 Mentor Graphics Corporation Continuous application and decompression of test patterns and selective compaction of test responses
US7111209B2 (en) 1999-11-23 2006-09-19 Janusz Rajski Test pattern compression for an integrated circuit test environment
US7260591B2 (en) 1999-11-23 2007-08-21 Janusz Rajski Method for synthesizing linear finite state machines
US7263641B2 (en) 1999-11-23 2007-08-28 Janusz Rajski Phase shifter with reduced linear dependency
US10234506B2 (en) 1999-11-23 2019-03-19 Mentor Graphics Corporation Continuous application and decompression of test patterns and selective compaction of test responses
US9664739B2 (en) 1999-11-23 2017-05-30 Mentor Graphics Corporation Continuous application and decompression of test patterns and selective compaction of test responses
US7523372B2 (en) 1999-11-23 2009-04-21 Janusz Rajski Phase shifter with reduced linear dependency
US7478296B2 (en) 1999-11-23 2009-01-13 Janusz Rajski Continuous application and decompression of test patterns to a circuit-under-test
US7493540B1 (en) 1999-11-23 2009-02-17 Jansuz Rajski Continuous application and decompression of test patterns to a circuit-under-test
US7500163B2 (en) 1999-11-23 2009-03-03 Janusz Rajski Method and apparatus for selectively compacting test responses
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