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DE10192396T1 - Halbleiterprüfsystem und zugehörige Überwachungsvorrichtung - Google Patents

Halbleiterprüfsystem und zugehörige Überwachungsvorrichtung

Info

Publication number
DE10192396T1
DE10192396T1 DE10192396T DE10192396T DE10192396T1 DE 10192396 T1 DE10192396 T1 DE 10192396T1 DE 10192396 T DE10192396 T DE 10192396T DE 10192396 T DE10192396 T DE 10192396T DE 10192396 T1 DE10192396 T1 DE 10192396T1
Authority
DE
Germany
Prior art keywords
monitoring device
test system
semiconductor test
associated monitoring
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE10192396T
Other languages
English (en)
Inventor
Atsushi Sato
Masafumi Nakamura
Tsuyohiro Ihata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE10192396T1 publication Critical patent/DE10192396T1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE10192396T 2000-06-13 2001-06-13 Halbleiterprüfsystem und zugehörige Überwachungsvorrichtung Withdrawn DE10192396T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000182342 2000-06-13
JP2000395040A JP2002071762A (ja) 2000-06-13 2000-12-22 半導体試験装置及びそのモニタ装置
PCT/JP2001/005035 WO2001096892A1 (fr) 2000-06-13 2001-06-13 Appareil testeur de semi-conducteur et son dispositif moniteur

Publications (1)

Publication Number Publication Date
DE10192396T1 true DE10192396T1 (de) 2002-09-12

Family

ID=26594147

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10192396T Withdrawn DE10192396T1 (de) 2000-06-13 2001-06-13 Halbleiterprüfsystem und zugehörige Überwachungsvorrichtung

Country Status (6)

Country Link
US (1) US6671653B2 (de)
JP (1) JP2002071762A (de)
KR (1) KR100447480B1 (de)
CN (1) CN1198147C (de)
DE (1) DE10192396T1 (de)
WO (1) WO2001096892A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7210100B2 (en) * 2000-09-27 2007-04-24 Eizel Technologies, Inc. Configurable transformation of electronic documents
US6898545B2 (en) * 2002-06-28 2005-05-24 Agilent Technologies Inc Semiconductor test data analysis system
US7340364B1 (en) * 2003-02-26 2008-03-04 Advantest Corporation Test apparatus, and control method
JP2007006559A (ja) * 2005-06-21 2007-01-11 Matsushita Electric Ind Co Ltd 保護回路
US20070135956A1 (en) * 2005-12-13 2007-06-14 Taiwan Semiconductor Manufacturing Co., Ltd. Data location systems and methods
KR100736673B1 (ko) * 2006-08-01 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치
JP2008046074A (ja) * 2006-08-21 2008-02-28 Advantest Corp 試験装置
WO2009064285A1 (en) * 2007-11-13 2009-05-22 Testmetrix, Inc. Apparatus and method for testing semiconductor devices
WO2009144837A1 (ja) * 2008-05-30 2009-12-03 株式会社アドバンテスト 試験装置および情報処理システム
US20100070211A1 (en) * 2008-09-12 2010-03-18 Analog Devices, Inc. Rolling average test
JP6200461B2 (ja) 2015-07-14 2017-09-20 ファナック株式会社 ダイナミックブレーキ回路を有するモータ駆動装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0680155A (ja) 1992-08-27 1994-03-22 Nec Yamagata Ltd 半導体装置用エンボスキャリアテープ
JPH075076A (ja) 1993-02-18 1995-01-10 Bridgestone Corp 車両のスタビリティ測定装置及びスタビリティ調整方法
JP2600443Y2 (ja) * 1993-04-23 1999-10-12 安藤電気株式会社 可動部の故障または寿命を表示するオートハンドラ
JP2606089Y2 (ja) * 1993-06-18 2000-09-11 株式会社アドバンテスト Ｉｃ測定用ソケット寿命検出装置
JP3134745B2 (ja) * 1995-10-31 2001-02-13 安藤電気株式会社 リレー制御回路
JPH10332791A (ja) * 1997-05-29 1998-12-18 Ando Electric Co Ltd Ｉｃテスタ
US6181616B1 (en) * 1998-09-03 2001-01-30 Micron Technology, Inc. Circuits and systems for realigning data output by semiconductor testers to packet-based devices under test
US6532561B1 (en) * 1999-09-25 2003-03-11 Advantest Corp. Event based semiconductor test system

Also Published As

Publication number Publication date
CN1198147C (zh) 2005-04-20
US6671653B2 (en) 2003-12-30
WO2001096892A1 (fr) 2001-12-20
US20020165692A1 (en) 2002-11-07
KR100447480B1 (ko) 2004-09-07
CN1383491A (zh) 2002-12-04
JP2002071762A (ja) 2002-03-12
KR20020029916A (ko) 2002-04-20

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8139 Disposal/non-payment of the annual fee