CN1658736A - 电路装置 - Google Patents
电路装置 Download PDFInfo
- Publication number
- CN1658736A CN1658736A CN2005100081230A CN200510008123A CN1658736A CN 1658736 A CN1658736 A CN 1658736A CN 2005100081230 A CN2005100081230 A CN 2005100081230A CN 200510008123 A CN200510008123 A CN 200510008123A CN 1658736 A CN1658736 A CN 1658736A
- Authority
- CN
- China
- Prior art keywords
- semiconductor element
- circuit device
- lead
- exposed
- framework
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 110
- 239000000463 material Substances 0.000 claims abstract description 25
- 229920005989 resin Polymers 0.000 claims description 22
- 239000011347 resin Substances 0.000 claims description 22
- 238000004891 communication Methods 0.000 claims description 15
- 239000002184 metal Substances 0.000 claims description 14
- 229910052751 metal Inorganic materials 0.000 claims description 14
- 239000011521 glass Substances 0.000 claims description 12
- 230000003287 optical effect Effects 0.000 claims description 4
- 239000000853 adhesive Substances 0.000 claims description 3
- 230000001070 adhesive effect Effects 0.000 claims description 3
- 239000003990 capacitor Substances 0.000 claims description 3
- 229910000679 solder Inorganic materials 0.000 claims description 3
- 239000012780 transparent material Substances 0.000 claims description 3
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims 4
- 230000002093 peripheral effect Effects 0.000 claims 1
- 239000007767 bonding agent Substances 0.000 description 27
- 239000011148 porous material Substances 0.000 description 19
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 14
- 238000007789 sealing Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 6
- 239000000956 alloy Substances 0.000 description 5
- 229910045601 alloy Inorganic materials 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000009434 installation Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000037361 pathway Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000009736 wetting Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 241001062009 Indigofera Species 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 230000003321 amplification Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- -1 copper Chemical class 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 239000012260 resinous material Substances 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/8506—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/804—Containers or encapsulations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/16—Assemblies consisting of a plurality of semiconductor or other solid state devices the devices being of types provided for in two or more different subclasses of H10B, H10D, H10F, H10H, H10K or H10N, e.g. forming hybrid circuits
- H01L25/167—Assemblies consisting of a plurality of semiconductor or other solid state devices the devices being of types provided for in two or more different subclasses of H10B, H10D, H10F, H10H, H10K or H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/07802—Adhesive characteristics other than chemical not being an ohmic electrical conductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Light Receiving Elements (AREA)
- Led Device Packages (AREA)
Abstract
Description
Claims (28)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP040883/04 | 2004-02-18 | ||
JP2004040883A JP4315833B2 (ja) | 2004-02-18 | 2004-02-18 | 回路装置 |
JP040883/2004 | 2004-02-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1658736A true CN1658736A (zh) | 2005-08-24 |
CN1333459C CN1333459C (zh) | 2007-08-22 |
Family
ID=35007918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005100081230A Expired - Fee Related CN1333459C (zh) | 2004-02-18 | 2005-02-05 | 电路装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7317199B2 (zh) |
JP (1) | JP4315833B2 (zh) |
CN (1) | CN1333459C (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102074543B (zh) * | 2009-11-20 | 2012-08-29 | 中芯国际集成电路制造(上海)有限公司 | 一种半导体封装基座 |
CN106206614A (zh) * | 2016-08-25 | 2016-12-07 | 上海天马微电子有限公司 | 一种柔性显示面板和柔性显示装置 |
JP2019169669A (ja) * | 2018-03-26 | 2019-10-03 | キヤノン株式会社 | 電子モジュールおよび撮像システム |
CN117374014A (zh) * | 2023-12-07 | 2024-01-09 | 潮州三环(集团)股份有限公司 | 一种封装基座及其制备方法 |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007012895A (ja) * | 2005-06-30 | 2007-01-18 | Sanyo Electric Co Ltd | 回路装置およびその製造方法 |
JP4463793B2 (ja) | 2006-10-10 | 2010-05-19 | 浜松ホトニクス株式会社 | 光検出装置 |
JP5132957B2 (ja) * | 2007-03-14 | 2013-01-30 | パナソニック株式会社 | 半導体デバイス、その製造方法および光ピックアップモジュール |
JP2008227233A (ja) * | 2007-03-14 | 2008-09-25 | Matsushita Electric Ind Co Ltd | 半導体デバイスの製造方法、光ピックアップモジュール、および半導体デバイス |
DE102008021091A1 (de) * | 2008-04-28 | 2009-10-29 | Epcos Ag | Drucksensor |
JP5543724B2 (ja) * | 2008-08-28 | 2014-07-09 | セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー | 樹脂封止型半導体装置及びその製造方法 |
JP5363789B2 (ja) * | 2008-11-18 | 2013-12-11 | スタンレー電気株式会社 | 光半導体装置 |
US20100207140A1 (en) * | 2009-02-19 | 2010-08-19 | Koninklijke Philips Electronics N.V. | Compact molded led module |
JP2010245337A (ja) * | 2009-04-07 | 2010-10-28 | Elpida Memory Inc | 半導体装置及びその製造方法 |
JP6051577B2 (ja) * | 2012-04-20 | 2016-12-27 | セイコーエプソン株式会社 | 電子デバイスおよび電子機器 |
JP7362280B2 (ja) * | 2019-03-22 | 2023-10-17 | キヤノン株式会社 | パッケージユニットの製造方法、パッケージユニット、電子モジュール、および機器 |
US11500433B2 (en) * | 2020-01-14 | 2022-11-15 | Au Optronics Corporation | Flexible electronic device |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6021414B2 (ja) * | 1978-12-29 | 1985-05-27 | ソニー株式会社 | テ−プレコ−ダ等のモ−ド切換え装置 |
US4399707A (en) * | 1981-02-04 | 1983-08-23 | Honeywell, Inc. | Stress sensitive semiconductor unit and housing means therefor |
US4843454A (en) * | 1985-11-26 | 1989-06-27 | Nippondenso Co., Ltd. | Semiconductor pressure transducer |
US4732042A (en) * | 1986-04-22 | 1988-03-22 | Motorola Inc. | Cast membrane protected pressure sensor |
US5436492A (en) * | 1992-06-23 | 1995-07-25 | Sony Corporation | Charge-coupled device image sensor |
JPH07263591A (ja) * | 1994-03-22 | 1995-10-13 | Mitsubishi Materials Corp | マイクロ波パッケージ及びその製造方法 |
JPH09222372A (ja) * | 1996-02-19 | 1997-08-26 | Mitsubishi Electric Corp | 半導体式センサ |
JPH10104101A (ja) * | 1996-10-02 | 1998-04-24 | Mitsubishi Electric Corp | 半導体圧力センサ |
FR2764113B1 (fr) * | 1997-05-28 | 2000-08-04 | Motorola Semiconducteurs | Dispositif capteur et son procede de fabrication |
JP3958864B2 (ja) | 1998-05-21 | 2007-08-15 | 浜松ホトニクス株式会社 | 透明樹脂封止光半導体装置 |
US6229190B1 (en) * | 1998-12-18 | 2001-05-08 | Maxim Integrated Products, Inc. | Compensated semiconductor pressure sensor |
JP2001077277A (ja) * | 1999-09-03 | 2001-03-23 | Sony Corp | 半導体パッケージおよび半導体パッケージ製造方法 |
JP4156154B2 (ja) * | 1999-11-26 | 2008-09-24 | 富士フイルム株式会社 | 固体撮像装置 |
JP4020624B2 (ja) * | 2001-11-08 | 2007-12-12 | 三洋電機株式会社 | 半導体装置の製造方法 |
US6680525B1 (en) * | 2003-01-09 | 2004-01-20 | Kingpak Technology Inc. | Stacked structure of an image sensor |
-
2004
- 2004-02-18 JP JP2004040883A patent/JP4315833B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-05 CN CNB2005100081230A patent/CN1333459C/zh not_active Expired - Fee Related
- 2005-02-14 US US11/057,932 patent/US7317199B2/en active Active
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102074543B (zh) * | 2009-11-20 | 2012-08-29 | 中芯国际集成电路制造(上海)有限公司 | 一种半导体封装基座 |
CN106206614A (zh) * | 2016-08-25 | 2016-12-07 | 上海天马微电子有限公司 | 一种柔性显示面板和柔性显示装置 |
CN106206614B (zh) * | 2016-08-25 | 2019-03-12 | 上海天马微电子有限公司 | 一种柔性显示面板和柔性显示装置 |
JP2019169669A (ja) * | 2018-03-26 | 2019-10-03 | キヤノン株式会社 | 電子モジュールおよび撮像システム |
CN117374014A (zh) * | 2023-12-07 | 2024-01-09 | 潮州三环(集团)股份有限公司 | 一种封装基座及其制备方法 |
CN117374014B (zh) * | 2023-12-07 | 2024-03-08 | 潮州三环(集团)股份有限公司 | 一种封装基座及其制备方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2005235886A (ja) | 2005-09-02 |
US7317199B2 (en) | 2008-01-08 |
JP4315833B2 (ja) | 2009-08-19 |
CN1333459C (zh) | 2007-08-22 |
US20050248009A1 (en) | 2005-11-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7391153B2 (en) | Light emitting device provided with a submount assembly for improved thermal dissipation | |
US8193014B2 (en) | Manufacturing method of light-emitting diode | |
US6060729A (en) | Light-emitting device | |
CN1219320C (zh) | 半导体器件 | |
US10177283B2 (en) | LED packages and related methods | |
JP6689363B2 (ja) | レーザ部品およびその製造方法 | |
CN1658736A (zh) | 电路装置 | |
US20070241362A1 (en) | Light emitting diode package and fabrication method thereof | |
CN1825586B (zh) | 发光二极管组件及其制作方法 | |
CN1672269A (zh) | 半导体发光装置及其制法和半导体发光装置用反射器 | |
CN1442902A (zh) | 半导体器件及其制造方法 | |
CN1992365A (zh) | 半导体发光器件及其制造方法 | |
JP2005294736A (ja) | 半導体発光装置の製造方法 | |
CN101675537A (zh) | 半导体发光装置 | |
CN1835222A (zh) | 半导体器件及其制造方法 | |
KR20090028709A (ko) | 발광소자 실장용 기판과 그 제조방법, 발광소자 모듈과 그 제조방법, 표시장치, 조명장치 및 교통 신호기 | |
CN1893035A (zh) | 电路装置及其制造方法 | |
EP2639841B1 (en) | Light-emitting device, and method for manufacturing circuit board | |
JP2006086178A (ja) | 樹脂封止型光半導体装置 | |
US9041022B2 (en) | Light emitting diode package and method for manufacturing the same | |
KR101363980B1 (ko) | 광 모듈 및 그 제조 방법 | |
US9105825B2 (en) | Light source package and method of manufacturing the same | |
CN104103748A (zh) | 发光二极管封装结构及其制造方法 | |
KR100878398B1 (ko) | 고출력 led 패키지 및 그 제조방법 | |
JP2007067452A (ja) | 半導体発光装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Osaka Japan Co-patentee after: A Morimi semiconductor Kwan Tung Co.,Ltd. Patentee after: Sanyo Electric Co.,Ltd. Address before: Osaka Japan Co-patentee before: Kanto Sanyo Semiconductors Co. Patentee before: Sanyo Electric Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20181023 Address after: Arizona, USA Patentee after: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC Address before: Osaka Japan Co-patentee before: A Morimi semiconductor Kwan Tung Co.,Ltd. Patentee before: Sanyo Electric Co.,Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070822 Termination date: 20220205 |