[go: up one dir, main page]

CN1461948A - Method and device for investigating polarization film - Google Patents

Method and device for investigating polarization film Download PDF

Info

Publication number
CN1461948A
CN1461948A CN03138326A CN03138326A CN1461948A CN 1461948 A CN1461948 A CN 1461948A CN 03138326 A CN03138326 A CN 03138326A CN 03138326 A CN03138326 A CN 03138326A CN 1461948 A CN1461948 A CN 1461948A
Authority
CN
China
Prior art keywords
light source
film
polarizing film
light
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN03138326A
Other languages
Chinese (zh)
Other versions
CN100339700C (en
Inventor
篠塚淳彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Publication of CN1461948A publication Critical patent/CN1461948A/en
Application granted granted Critical
Publication of CN100339700C publication Critical patent/CN100339700C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
  • Liquid Crystal (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The present invention provides a method and equipment for detecting a defect, especially a bubble, of a polarization film of a multilayer structure moving continuously, with high accuracy without the effect of a waving phenomenon in the widthwise direction accompanying the movement of the film, vibration (fluttering) of the film during carriage, or the like. The inspection equipment having two sets of inspecting sections provided with a light source section and a detecting section disposed, respectively, on the surface side and the back side of the polarization film moving continuously, and a carry roll abutting/supporting the back side of the film is used. Ether one of the light source section and the light receiving section of the detecting section is provided with a polarization member having a transmission axis making cross Nicol with the absorption axis of the polarization film, and at the inspecting section, the polarization film supported by the carry roll while abutting is irradiated with light from the light source at the light source section and its reflected light is detected.

Description

The inspection method of light polarizing film and testing fixture
Technical field
The present invention particularly checks surface and its inside, the i.e. air blister defect that exists of light polarizing film about a kind of method and device of checking the defective of light polarizing film on the stacked interface of light polarizing film constituent material.
Background technology
Light polarizing film attaches on the two sides of liquid crystal cell and uses, and is used as the part of display panels.Figure 1 shows that the sectional drawing of 1 example of the formation of display panels.Display panels 20 has the formation that light polarizing film of making 1 is fitted in the two sides of liquid crystal cell 21.
Liquid crystal display has can miniaturization, slimming, and the little advantage of power consumption simultaneously is widely used in small-sized video recorder, mobile phone, car steering guidance system, computing machine etc.
The formation of employed light polarizing film has nothing in common with each other according to purposes in the manufacturing that this display panels is used, and for example can be adhesive phase and stacked thereon the lit-par-lit structure of diaphragm are set on the single face of polariscope film itself or two sides.
This light polarizing film is in case on its surface and inner; be that polariscope film, adhesive phase, diaphragm constituent material inside, stacked interface exist bubble; will cause defective, image quality low of image, so be necessary to check such defective in the fabrication phase of light polarizing film.
As the inspection method of the bubble of checking light polarizing film, on the face of light polarizing film to this film along the angle of inclination irradiates light and observe irradiates light on method that its reflected light checks, the face and be well-known from the inspection method that opposing face is observed the light that sees through this film in light polarizing film.
But irradiates light and observe to see through the method that the light of this film is checked, the bubble that exists more detection not go out on a face of light polarizing film from opposing face.And, checking on the position, must light source portion be set at the single face of light polarizing film, and test section be set at its opposing face.So, form the free state of a kind of film therebetween, produce the wave phenomenon, the vibration in the conveyance (rocking) of Width etc., make the precision of image of inspection portion low.Particularly the image quality of LCD improves in recent years, can form bright distinct image.So originally unquestioned little defective also is used as the defective of display.In addition, be so-calledly to have nuclei air bubble to differentiate easily though this method makes bubble around foreign matter and its, have and be difficult to check out that the bubble of not following foreign matter is the problem of so-called no nuclei air bubble.Therefore, need to check out little accuracy of defect in the inspection of light polarizing film, above-mentioned inspection method can not adapt to these requirements.
Relative therewith, on a face of light polarizing film to this film along the angle of inclination irradiates light and observe the method that its reflected light is checked, make no nuclei air bubble by brightness with different former thereby can check out clearly on every side, and in the inspection part of continuously manufactured light polarizing film, a plurality of holes are set as checking substrate on tabular body, slidably attract from inner face, and can suppress rocking, fluctuating of film, improve and check precision.
But this method, in case checking the small gap of generation between substrate and light polarizing film, vacuum suction will be removed comprehensively, generation rocking, fluctuating of film occur and makes the low problem of precision of checking.And there is the problem of causing scar for the film surface in the slip by light polarizing film and inspection substrate.The problem that the width of the vacuum suction that the change of the width that is difficult to the light polarizing film that changes and make accompanies is also arranged in addition.
Summary of the invention
The purpose of this invention is to provide a kind of inspection method and testing fixture; do not followed the influence of the wave phenomenon, the vibration in the conveyance (rocking) etc. of the Width that moves of film; and can check out accurately the polariscope film that moves continuously, adhesive phase, diaphragm the defective, particularly air blister defect of light polarizing film of stacked lit-par-lit structure.
The present invention also provides a kind of inspection method and testing fixture, does not cause scar on the film surface, even there is the change of the width of the light polarizing film of making, also can check out defective accurately.
The present invention is the inspection method that a kind of defective that will be present in the light polarizing film that moves continuously detects according to reflected light.
It is characterized in that: the 2nd light source portion that use the 1st inspection portion have the 1st light source portion that possesses the surface that is configured in this film and the 1st test section and contact the 1st delivery roller of the inner face of supporting this film, possesses the inner face that is configured in this film and the 2nd test section and contact the testing fixture of the 2nd inspection portion of the 2nd delivery roller on the surface of this film of support.On any one light accepting part of the 1st light source portion and the 1st test section, and on any one light accepting part of the 2nd light source portion and the 2nd test section, be provided with to have and check that object is the absorption axes of light polarizing film and the polarisation member that sees through axle that forms crossed nicols.In the 1st inspection portion, light source irradiation by the 1st light source portion is by the light polarizing film of the 1st support that delivery roller contacts, detect its reflected light by the 1st test section, in the 2nd inspection portion, light source irradiation by the 2nd light source portion detects its reflected light by the light polarizing film of the 2nd support that delivery roller contacts by the 2nd test section.
By formation of the present invention, even in the occasion of controlling a plurality of means chien shih testing fixtures actions that light polarizing film transmits, testing fixture is by possessing delivery roller, can not produce the fluctuation of film and rock on the inspection position of film, makes correct defects detection become possibility.
And, check that the light polarizing film of object is checked at the member that is contacted with delivery roller, so, also can carry out the detection of defective accurately even be the very thin crooked light polarizing film of easy generation.
In addition, by on any one light accepting part of the 1st light source portion and the 1st test section, and on any one light accepting part of the 2nd light source portion and the 2nd test section, setting has checks that object is the absorption axes of light polarizing film and the polarisation member that sees through axle that forms crossed nicols, can reduce and even interdict the light that arrives detecting device from the opposition face of the light polarizing film of checking object, prevent from the dust on delivery roller surface, scar etc. are checked out as product defect.
Inspection method of the present invention is carried out to better in the darkroom basically in order to prevent the influence from the scattered light beyond the light source etc.Delivery roller makes the surface ideal for black by reducing the influence of unwanted scattered light at least.
The polarisation member that uses in the testing fixture of the present invention, as long as for obtaining the member of linear polarization light, be not particularly limited the Shi Douke use, but specifically, can exemplifying out polarizing filter, light polarizing film, spreadlight lens, polariscope (polarizer), analyzer (analyzer) etc.
In the present invention, according to the information of the defective of representing to obtain by the 1st test section and the 2nd test section, and the defective locations of mark light polarizing film is preferable.
By above-mentioned formation, can before becoming display, remove the tested rejected region of finding from through the light polarizing film of checking, eliminating in the engineering of bad part.The position of mark also maybe can be with it as the section of least unit and remove except can be when light polarizing film is punched with institute's sizing.
The present invention is a kind of testing fixture in addition, and the defective that is present in the light polarizing film that moves is continuously checked out according to reflected light.
It is characterized in that: have the 1st light source portion that possesses the surface that is configured in this film and the 1st test section and contact the 1st inspection portion, the 2nd light source portion and the 2nd test section that possess the inner face that is configured in this film of the 1st delivery roller of the inner face of supporting this film and contact the 2nd inspection portion of the 2nd delivery roller on the surface of this film of support.
On any one light accepting part of the 1st light source portion and the 1st test section, and on any one light accepting part of the 2nd light source portion and the 2nd test section, be provided with to have and check that object is the absorption axes of light polarizing film and the polarisation member that sees through axle that forms crossed nicols.
The structure that adopts is in the 1st inspection portion, light source irradiation by the 1st light source portion is by the light polarizing film of the 1st support that delivery roller contacts, detect its reflected light by the 1st test section, in the 2nd inspection portion, light source irradiation by the 2nd light source portion detects its reflected light by the light polarizing film of the 2nd support that delivery roller contacts by the 2nd test section.
The use of the testing fixture by above-mentioned formation, even in the occasion of controlling a plurality of means chien shih testing fixtures actions that light polarizing film transmits, testing fixture is by possessing delivery roller, can not produce the fluctuation of film and rock on the inspection position of film, makes correct defects detection become possibility.
And, check that the light polarizing film of object is checked at the member that is contacted with delivery roller, so, also can carry out the detection of defective accurately even be the very thin crooked light polarizing film of easy generation.
Possess the information of with good grounds expression, and the indicia means of the defective locations of mark light polarizing film is preferable by the 1st test section and the resulting defective of the 2nd test section.
Description of drawings
Fig. 1 is the sectional drawing of the configuration example of the expression display panels that uses light polarizing film.
Fig. 2 is the sectional drawing of the example of the formation of light polarizing film of expression 5 layers of structure checking object and defective.
Fig. 3 is the sectional drawing of the example of the formation of light polarizing film of expression 3 layers of structure checking object and defective.
Figure 4 shows that the configuration example of testing fixture of the present invention.
Fig. 5 is the expansion presentation graphs of the inspection portion of testing fixture of the present invention.
1. light polarizing film among the figure, 21. the 1st delivery rollers, 3. light source, 4. slit, 5. polarisation member, 6. detecting device, 12. light polarizing film, 13. diaphragms, 16. adhesive phases, 20. display panels, 21 '. liquid crystal cell, D. test section, E. light source portion.
Embodiment
According to illustrating embodiments of the invention.
In Fig. 2, Fig. 3, about the example of the light polarizing film of lit-par-lit structure and enlarge section, and the air blister defect modelling that should check out is represented.Fig. 2 is the example with light polarizing film 1 of 5 layers of structure that are made of diaphragm 13, adhesive phase 16, polariscope film 12, adhesive phase 16, diaphragm 13.In this film, the air blister defect of light polarizing film that becomes end article and be the defective of display is a, b, c, d.
Fig. 3 is the example with light polarizing film 1 of 3 layers of structure that are made of polariscope film 12, adhesive phase 16, diaphragm 13.In this film, e, f are the tested air blister defect of finding.
Member of formation as light polarizing film is the sub-film of polarisation, can use well-known polariscope film.Be generally the film that dichromatism pigments such as iodine, dichroic dye is adsorbed orientation by the polyvinyl alcohol (PVA) of high polymerization degree specifically.
Generally use triacetyl cellulose (TAC) as diaphragm.Generally use the water soluble resins such as polyvinyl alcohol (PVA) of low polymerization degree etc. as bonding agent.
Figure 4 shows that by by be configured in along the direction of arrow supply with continuously transmission light polarizing film 1 above light source portion E1, the 1st T1 of inspection portion that the delivery roller 21 of test section D1 and contact support below this film 1 forms, by be configured in light polarizing film 1 below light source portion E2, the configuration example of the testing fixture that test section D2 and the 2nd T2 of inspection portion that forms at this delivery roller that contact is supported above film 1 22 constitute.
Check that object is that light polarizing film 1 contacts in the scope of w1 with the 1st delivery roller 21, in the scope of w2, contact with the 2nd delivery roller 22.Light source portion E1 and receives its reflected light by test section D1 on the contact range w1 internal radiation light polarizing film of light polarizing film 1 and the 1st delivery roller 21.Light source portion E2 and receives its reflected light by test section D2 below the contact range w2 internal radiation light polarizing film of light polarizing film 1 and the 2nd delivery roller 22.Light source portion E1, E2 can adopt the formation that suitable slit 4 is set and only shines the necessary inspection area of light polarizing film.
Light source portion E1, E2 are provided with light source 3, and test section D1, D2 are provided with detecting device 6.The type that light source 3 can use fluorescent lamp etc. easily to obtain is if use the big type of width of illuminating part, even then how many film surfaces exists and concavo-convexly also can reduce the influence that brings to check result.The vertical plane angulation θ of the tangent line of light source and light polarizing film 1 is that 30~45 degree are preferable.
By θ being set in above-mentioned scope, even, also can go out defective with extra high accuracy checking using the identical light source portion and the occasion of test section.Test section D1, D2 for example use CCD as detecting device 6, can pass through information from the light of CCD, the detection means that the reflection of light that utilizes bubble is detected as the variation of light and shade and constituting, also can use by information and form image, check out the detection means of bubble, foreign matter by Flame Image Process from the light of CCD.As required, CCD adopts the formation that is provided with many simultaneously and can checks the gamut of Width simultaneously on the Width of film.
The 1st delivery roller the 21, the 2nd delivery roller 22 of testing fixture is a return idler, can produce deflection in case the diameter of delivery roller is too small, makes and checks that precision is low.It is preferable that the external diameter of delivery roller 21,22 is about 100~200 scope.
Fig. 5 represents inspection method expansion of the present invention with modelling.Here be depicted as the 1st inspection portion, check the example of the light polarizing film of 5 layers of structure possessing the formation that has Fig. 2 (adhesive phase omission, on the drawing with 3 layers of expression) at Fig. 4.Also carry out same inspection fully in the 2nd inspection portion.
Checking that from the light that light source portion E1 sends the position is a S position irradiation light polarizing film 1, and the reflected light detected portion D1 from this S position is received.The polariscope film 12 of formation layered polarization film 1 is made of polarisation member 5 and the crossed nicols of test section D1, does not arrive test section so arrive the illumination light on the surface of delivery roller 21.Therefore, bubble P1 (bubble a, b among Fig. 2) though tested finding, the foreign matter on delivery roller surface is not tested to be found.Bubble P3 (bubble c, d among Fig. 2) finds by the 2nd test section is tested.
The mark of defective for example can be enumerated on the transverse direction of light polarizing film with certain spacing a plurality of lettering bodies arranged side by side, and the lettering body that will be equivalent to contain the differentiation of bad part carries out method of lettering etc. by being pressed in the film surface.
Inspection method of the present invention even the protective film of peeling off is stacked in the surface of reflection polarizing plate, also can be checked when the use of the reality of liquid crystal display dish.
As inspection means of the present invention, also can adopt with the formation of light source and a plurality of arrangements of detecting device, with band shape and even the light source of straight tube-like and the formation of a plurality of detector combination of odd number.And, can adopt situation that detecting device is arranged as line sensor and any one of the situation of arranging as area sensor as test section.

Claims (4)

1.一种偏光膜的检查方法,对存在于连续移动的偏光膜内的缺陷根据反射光进行检测,其特征在于:1. A kind of inspection method of polarizing film, detects the defect existing in the polarizing film of continuous movement according to reflected light, is characterized in that: 使用一个检查装置,该检查装置包括:Use an inspection device consisting of: 一个第1检查部,具备配置在该膜的表面的第1光源部和第1检测部及接触支持该膜的内面的第1传送滚轮;以及A first inspection unit comprising a first light source unit and a first detection unit arranged on the surface of the film, and a first transport roller contacting and supporting the inner surface of the film; and 一个第2检查部,具备配置在该膜的内面的第2光源部和第2检测部及接触支持该膜的表面的第2传送滚轮,A 2nd inspection part is equipped with the 2nd light source part and the 2nd detection part that are arranged on the inner surface of the film and the 2nd conveying roller contacting and supporting the surface of the film, 其中在该第1光源部及第1检测部的任意一个受光部上,及该第2光源部及第2检测部的任意一个受光部上,设置具有检查对象即偏光膜的吸收轴和形成正交偏光镜的透过轴的偏光构件,且Wherein, on any one light-receiving part of the first light source part and the first detection part, and on any one light-receiving part of the second light source part and the second detection part, an absorption axis and a positive polarizing film having an inspection object are set. the polarizing member of the transmission axis of the crossed polarizer, and 在该第1检查部,通过该第1光源部的光源照射由该第1传送滚轮所接触支持的偏光膜,由该第1检测部检测其反射光,在该第2检查部,通过该第2光源部的光源照射由该第2传送滚轮所接触支持的偏光膜,由该第2检测部检测其反射光。In the first inspection part, the light source of the first light source part irradiates the polarizing film contacted and supported by the first conveying roller, and the reflected light is detected by the first detection part; The light source of the 2 light source unit irradiates the polarizing film contacted and supported by the second transport roller, and the reflected light is detected by the second detection unit. 2.如权利要求1所述的偏光膜的检查方法,其特征在于:根据表示由该第1检测部及第2检测部得到的缺陷的信息,标记偏光膜的缺陷位置。2. The inspection method of a polarizing film according to claim 1, wherein the position of the defect of the polarizing film is marked based on the information indicating the defect obtained by the first detection unit and the second detection unit. 3.一种偏光膜的检查装置,将存在于连续移动的偏光膜内的缺陷根据反射光而检查出,其特征在于包括:3. A kind of inspection device of polarizing film, will exist in the defect in the polarizing film of continuous movement and check out according to reflected light, it is characterized in that comprising: 一个第1检查部,具备配置在该膜的表面的第1光源部和第1检测部及接触支持该膜的内面的第1传送滚轮;A first inspection unit comprising a first light source unit and a first detection unit disposed on the surface of the film, and a first transport roller contacting and supporting the inner surface of the film; 一个第2检查部,具备配置在该膜的内面的第2光源部和第2检测部及接触支持该膜的表面的第2传送滚轮;A second inspection part, equipped with a second light source part and a second detection part arranged on the inner surface of the film, and a second conveying roller contacting the surface supporting the film; 在该第1光源部及第1检测部的任意一个受光部上,及该第2光源部及第2检测部的受光部的任意一个上,设置具有检查对象即偏光膜的吸收轴和形成正交偏光镜的透过轴的偏光构件,On any one of the light-receiving parts of the first light source part and the first detection part, and on any one of the light-receiving parts of the second light source part and the second detection part, an absorption axis and a positive polarizing film having an inspection object are arranged. The polarizing member of the transmission axis of the crossed polarizer, 其中在该第1检查部,通过该第1光源部的光源照射由该第1传送滚轮所接触支持的偏光膜,由该第1检测部检测其反射光,在该第2检查部,通过该第2光源部的光源照射由该第2传送滚轮所接触支持的偏光膜,由该第2检测部检测其反射光。Wherein in the first inspection section, the light source of the first light source section irradiates the polarizing film contacted and supported by the first conveying roller, and the reflected light is detected by the first detection section; The light source of the second light source unit irradiates the polarizing film contacted and supported by the second transport roller, and the reflected light is detected by the second detection unit. 4.如权利要求3所述的偏光膜的检查装置,其特征在于:根据表示由该第1检测部及第2检测部得到的缺陷的信息,标记偏光膜的缺陷位置。4. The inspection device for a polarizing film according to claim 3, wherein the defect position of the polarizing film is marked based on the information indicating the defect obtained by the first detection unit and the second detection unit.
CNB031383262A 2002-05-31 2003-05-27 Method and device for investigating polarization film Expired - Fee Related CN100339700C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002159669A JP2003344302A (en) 2002-05-31 2002-05-31 Inspection method and inspection equipment for polarizing film
JP2002159669 2002-05-31

Publications (2)

Publication Number Publication Date
CN1461948A true CN1461948A (en) 2003-12-17
CN100339700C CN100339700C (en) 2007-09-26

Family

ID=29773962

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB031383262A Expired - Fee Related CN100339700C (en) 2002-05-31 2003-05-27 Method and device for investigating polarization film

Country Status (4)

Country Link
JP (1) JP2003344302A (en)
KR (1) KR20030093956A (en)
CN (1) CN100339700C (en)
TW (1) TW200307118A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100462777C (en) * 2005-12-05 2009-02-18 恩富技术株式会社 Apparatus and method for inspecting polarizing film
CN100462778C (en) * 2005-12-05 2009-02-18 恩富技术株式会社 Polarizing film inspecting apparatus and method
CN101198859B (en) * 2005-06-21 2012-03-28 郡是株式会社 Film inspection device and film inspection method
CN102395919A (en) * 2010-03-18 2012-03-28 住友化学株式会社 Polarizer bonding precision inspection method and bonding precision inspection device
TWI456188B (en) * 2008-03-31 2014-10-11 Sumitomo Chemical Co System and method for sorting polarization films
CN106353332A (en) * 2015-07-15 2017-01-25 明眼有限公司 Polarizing film testing device utilizing pattern light transmittance sheets
CN104204923B (en) * 2012-04-11 2017-03-08 住友化学株式会社 The production system of optical display means
CN107024482A (en) * 2015-12-15 2017-08-08 住友化学株式会社 Defect inspection filming apparatus and system, film manufacturing device and manufacture method, defect inspection image pickup method, defect detecting method

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006113022A (en) * 2004-10-18 2006-04-27 Toppan Printing Co Ltd Defect detection device and method on antireflection film
KR100694807B1 (en) 2005-02-23 2007-03-14 (주)큐엠씨 Polarizing film inspection method and inspection device
KR100734750B1 (en) 2005-04-28 2007-07-03 에버테크노 주식회사 Jig for large polarizing film inspection
JP2006337630A (en) * 2005-06-01 2006-12-14 Sumitomo Chemical Co Ltd Method for producing laminated optical film
JP4775948B2 (en) 2005-11-17 2011-09-21 日東電工株式会社 Optical display device manufacturing system and manufacturing method thereof
JP4626764B2 (en) * 2005-12-09 2011-02-09 株式会社日立ハイテクノロジーズ Foreign matter inspection apparatus and foreign matter inspection method
JP4979114B2 (en) * 2006-02-02 2012-07-18 株式会社ニレコ Defect detection apparatus for laminate film and defect detection method for laminate film
JP2009192307A (en) * 2008-02-13 2009-08-27 Gunze Ltd Film inspection device
WO2009128115A1 (en) 2008-04-15 2009-10-22 日東電工株式会社 Optical film layered roll and method and device for manufacturing the same
US8593635B2 (en) 2008-10-01 2013-11-26 Hewlett-Packard Development Company, L.P. Camera web support
JP2010262265A (en) 2009-04-10 2010-11-18 Nitto Denko Corp Optical film raw roll and method for manufacturing image display apparatus by using the same
WO2011018840A1 (en) * 2009-08-11 2011-02-17 トヨタ自動車株式会社 Foreign material detecting device and foreign material detecting method
JP4503689B1 (en) * 2009-10-13 2010-07-14 日東電工株式会社 Method and apparatus for continuous production of liquid crystal display elements
JP4503690B1 (en) * 2009-10-13 2010-07-14 日東電工株式会社 Information storage / reading system used in an apparatus for continuously manufacturing liquid crystal display elements, and method and apparatus for manufacturing the information storage / reading system
JP4503691B1 (en) * 2009-10-13 2010-07-14 日東電工株式会社 Method and apparatus for continuous production of liquid layer display element
JP4503692B1 (en) 2009-10-13 2010-07-14 日東電工株式会社 Information storage / read operation system and method for manufacturing information storage / read operation system used in apparatus for continuously manufacturing liquid crystal display elements
JP4503693B1 (en) 2009-10-13 2010-07-14 日東電工株式会社 Continuous roll of cut-lined optical film laminate in the form of a continuous web, its manufacturing method and manufacturing apparatus
KR101868083B1 (en) * 2011-04-13 2018-06-19 삼성디스플레이 주식회사 Jig unit for inspecting a display panel
JP5274622B2 (en) * 2011-06-27 2013-08-28 富士フイルム株式会社 Defect inspection apparatus and method
JP6285658B2 (en) * 2013-08-02 2018-02-28 住友化学株式会社 Defect inspection system and film manufacturing apparatus
CN105158938B (en) * 2015-08-31 2019-04-23 河北冀雅电子有限公司 The choosing method of Polarizer Used for Liquid Crystal Display
KR102469408B1 (en) * 2017-03-03 2022-11-22 스미또모 가가꾸 가부시키가이샤 Defect inspection system, film manufacturing apparatus, film manufacturing method, printing apparatus, and printing method
TWI782086B (en) * 2017-09-13 2022-11-01 日商住友化學股份有限公司 Defect inspection apparatus, defect inspection method, manufacturing method of circular polarizing plate or oval polarizing plate, and manufacturing method of retardation plate
CN112740083B (en) * 2018-07-30 2023-03-14 日本化药株式会社 Marking device, marking method, polarizing plate manufacturing method, and polarizing plate
TWI791971B (en) * 2020-04-08 2023-02-11 財團法人紡織產業綜合研究所 Cloth inspection machine
KR20230046683A (en) * 2021-09-30 2023-04-06 주식회사 엘지화학 System for detecting foreign substance and defect of optical film

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61274244A (en) * 1985-05-17 1986-12-04 Toppan Printing Co Ltd Transparent film inspector
JP3140664B2 (en) * 1995-06-30 2001-03-05 松下電器産業株式会社 Foreign matter inspection method and apparatus
JP3977503B2 (en) * 1998-02-05 2007-09-19 住友化学株式会社 Film inspection method and film inspection apparatus using the same
JP2001056270A (en) * 1999-08-18 2001-02-27 Sumitomo Chem Co Ltd Inspection method for linear polarizing plate and inspection apparatus for linear polarizing plate

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101198859B (en) * 2005-06-21 2012-03-28 郡是株式会社 Film inspection device and film inspection method
CN100462777C (en) * 2005-12-05 2009-02-18 恩富技术株式会社 Apparatus and method for inspecting polarizing film
CN100462778C (en) * 2005-12-05 2009-02-18 恩富技术株式会社 Polarizing film inspecting apparatus and method
TWI456188B (en) * 2008-03-31 2014-10-11 Sumitomo Chemical Co System and method for sorting polarization films
CN102395919A (en) * 2010-03-18 2012-03-28 住友化学株式会社 Polarizer bonding precision inspection method and bonding precision inspection device
CN102395919B (en) * 2010-03-18 2014-04-16 住友化学株式会社 Polarizer bonding precision inspection method and bonding precision inspection device
CN104204923B (en) * 2012-04-11 2017-03-08 住友化学株式会社 The production system of optical display means
CN106353332A (en) * 2015-07-15 2017-01-25 明眼有限公司 Polarizing film testing device utilizing pattern light transmittance sheets
CN106353332B (en) * 2015-07-15 2019-05-28 明眼有限公司 Utilize the polarisation film detection apparatus of pattern light-transmitting plate
CN107024482A (en) * 2015-12-15 2017-08-08 住友化学株式会社 Defect inspection filming apparatus and system, film manufacturing device and manufacture method, defect inspection image pickup method, defect detecting method

Also Published As

Publication number Publication date
KR20030093956A (en) 2003-12-11
CN100339700C (en) 2007-09-26
JP2003344302A (en) 2003-12-03
TW200307118A (en) 2003-12-01

Similar Documents

Publication Publication Date Title
CN1461948A (en) Method and device for investigating polarization film
CN100338456C (en) Method and device for investigating polarization film
TWI463132B (en) Film defect inspection method and device
US7428049B2 (en) Apparatus and method for inspecting film defect
US7420671B2 (en) Defect inspection method and apparatus for transparent plate-like members
KR101369534B1 (en) Test data processing device and test data processing method
JP5051874B2 (en) Laminated film manufacturing method, laminated film defect detection method, laminated film defect detection apparatus
US7408633B2 (en) Apparatus and method for inspecting film defect
KR20140022929A (en) Apparatus for inspecting deffects of sheet-shaped products with optical films, data processing apparatus thereof, cutting apparatus thereof and product system thereof
JP2011226957A (en) Polarizing plate defect inspection method and defect inspection apparatus
JP2016118580A (en) Method for manufacturing optical display panel and system for manufacturing optical display panel
CN1501073A (en) Inspection method and device of display panel
KR20200047262A (en) Method and device for inspecting defect of optical film
KR20090113886A (en) Method and apparatus for illuminating film for automated inspection
JP2012194509A (en) System for continuously manufacturing liquid crystal display panel, method for continuously manufacturing liquid crystal display panel, inspection device, and inspection method
US11806969B2 (en) Method of manufacturing display device
JP7383559B2 (en) Optical film inspection method and optical film manufacturing method
JP2013205091A (en) Film inspection system, and film inspection method
TWI676797B (en) Optical film detecting device and optical film detecting method
CN215117066U (en) Inspection device for circular polarizer defects
US8260028B2 (en) Off-axis sheet-handling apparatus and technique for transmission-mode measurements
KR20180016757A (en) Method and device for inspecting depect of optical film
CN119715399A (en) Retardation film detection device and production line
KR20230147242A (en) Apparatus and method of inspecting display
KR200474087Y1 (en) Apparatus for detecting defects on a film

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20070926

Termination date: 20140527