CN117666693B - High-precision adjustable reference voltage source - Google Patents
High-precision adjustable reference voltage source Download PDFInfo
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- CN117666693B CN117666693B CN202410133895.XA CN202410133895A CN117666693B CN 117666693 B CN117666693 B CN 117666693B CN 202410133895 A CN202410133895 A CN 202410133895A CN 117666693 B CN117666693 B CN 117666693B
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is DC
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices
- G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
- G05F1/567—Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
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- Control Of Voltage And Current In General (AREA)
Abstract
The invention discloses a high-precision adjustable reference voltage source, which belongs to the technical field of signal control and specifically comprises the following components: setting a reference voltage source, controlling a data processing unit to acquire calibration data, and generating a calibration algorithm. Storing configuration data, calibration data, and temperature device errors; reading the stored data, converting the data into fitting data based on the FPGA, and sending the fitting data to a data conversion unit; converting the fitting data to an analog signal using a 16bit DAC; adjusting to a required amplitude interval through a high-precision operational amplifier, and driving output voltage to a device to be tested; using 5 reference power supply chip voltages as calibration voltages; collecting calibration data by using an 18bit ADC, and converting an analog signal into a digital signal; measuring the temperature of the board card, and compensating errors into output signals; the invention meets the reference requirements of high precision and low temperature drift under different voltages, and can dynamically generate various high-precision reference voltage sources.
Description
Technical Field
The invention relates to the technical field of signal control, in particular to a high-precision adjustable reference voltage source.
Background
Reference voltage sources are widely applied to digital circuits and analog circuits, are an important module in integrated circuit testing, are applied to various digital-analog hybrid circuits, and research on voltage references has been an important point in circuit design.
For the reference voltage source, the requirement on the power supply voltage is higher, as the scale of the integrated circuit increases, the characteristic size and the integration level are rapidly developed, the required power supply voltage is different for different chips, a plurality of high-precision power supplies are required to be switched differently for some products, and the performance requirement on the reference is becoming higher. Conventional voltage sources have failed to meet consumer demand.
Disclosure of Invention
The invention aims to provide a high-precision adjustable reference voltage source, which solves the following technical problems:
the required supply voltage is also different for different chips, and some products also need a plurality of high-precision power supplies to be continuously switched, so that the performance requirements for the reference become higher and higher. Conventional voltage sources have failed to meet consumer demand.
The aim of the invention can be achieved by the following technical scheme:
the utility model provides a high accuracy adjustable reference voltage source, includes control unit, data storage unit, data processing unit, data conversion unit, preceding stage drive unit, benchmark unit, temperature compensation unit and data acquisition unit, wherein:
the control unit is used for setting a reference voltage source used by a user, controlling the data processing unit to acquire calibration data of the reference voltage source and generating a corresponding calibration algorithm;
a data storage unit for storing configuration data, calibration data and temperature device errors, the configuration data including a reference voltage value required by a user;
the data processing unit is used for reading the stored data in the data storage unit, converting the stored data into fitting data by using a calibration algorithm based on the FPGA and sending the fitting data to the data conversion unit;
the data conversion unit is used for converting fitting data from a digital signal to an analog signal by taking the 16bit DAC as a digital-to-analog converter;
the front-stage driving unit is used for filtering the converted fitting data through the high-precision operational amplifier opa277, adjusting the fitting data to an amplitude interval required by a user and driving output voltage to a device to be tested;
the reference unit is used for calibrating the data acquisition unit, and the voltage of the 5 reference power supply chips is used as the calibration voltage of the data acquisition unit;
the data acquisition unit is used for acquiring calibration data through an 18bit ADC as an analog-to-digital converter, wherein the calibration data comprises a calibration voltage of a reference unit and an output voltage of a front-stage driving unit, and the calibration data is converted into a digital signal from an analog signal;
and the temperature compensation unit is used for measuring the temperature of the board and compensating the error of the temperature device corresponding to the current temperature of the board into the output signal of the data acquisition unit.
As a further scheme of the invention: the calibration voltages of the reference power supply chip include, but are not limited to, 1.25V, 2.5V, 3.3V, 4.096V, 5V.
As a further scheme of the invention: the control unit adjusts the voltage of the reference unit through the DVM, and any calibration voltage Vr is recorded through the data acquisition unit i Corresponding actual output voltage Vm i I=1,..5, calculating the voltage Gain and Offset between any two actual output voltages, the calculation formula being:
；
；
where j=1,..4, values of the voltage Gain and the voltage Offset for the 4 segments are obtained and applied to the configuration data for multi-segment calibration.
As a further scheme of the invention: the process of generating the temperature device error by the temperature compensation unit comprises the following steps:
drawing a temperature drift curve of the output voltage error of the reference voltage source along with the temperature change, selecting error values corresponding to two interval endpoints of a working temperature interval [ m, n ], and calculating gain K and error B between two endpoint connecting line segments to obtain a temperature compensation formula LSB=K.C+B, wherein C is the actual temperature, and LSB is the temperature device error.
As a further scheme of the invention: the control unit is based on a PC or a server.
As a further scheme of the invention: the reference voltage source is used in the following process:
the user writes the configuration data into the data storage unit through the control unit, and in the operation configuration process, the data processing unit reads the storage data of the storage unit, wherein the storage data comprises the configuration data, the calibration data, the temperature device error and the external data compensation, then the storage data is sent to the data conversion unit, the digital signal is converted into the analog signal, and the output voltage signal is sent to the device to be tested through the driving unit.
The invention has the beneficial effects that:
the invention realizes the preparation of the high-precision reference voltage source by adopting an advanced reference voltage generation technology; on the basis, the reference voltage source can keep stable output under different voltages by dynamically adjusting the voltage generation parameters; the problems of precision drop and temperature drift generated when the voltage of the traditional reference voltage source is changed are effectively solved; the method provided by the invention has higher flexibility, and can generate various different types of reference voltage sources according to actual application scenes and requirements; the characteristic ensures that the invention has wide application prospect, can be widely applied to various electronic equipment, and meets the personalized requirements of different equipment on reference voltage; the invention further carries out intensive research on the stability of the reference voltage source, and provides a series of optimization strategies, which reduce the influence of the temperature change of the reference voltage source on the output voltage by adopting a temperature compensation technology; by optimizing the circuit layout and design, the anti-interference capability of the reference voltage source is improved, so that the reference voltage source can still maintain stable output under severe environment.
Drawings
The invention is further described below with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of the structure of the present invention;
FIG. 2 is a schematic illustration of a multi-stage calibration of the present invention;
fig. 3 is a schematic diagram of the data conversion unit and the pre-stage driving unit of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1-3, the present invention is a high-precision adjustable reference voltage source, which includes a control unit, a data storage unit, a data processing unit, a data conversion unit, a pre-driving unit, a reference unit, a temperature compensation unit and a data acquisition unit, wherein:
the control unit is used for setting a reference voltage source used by a user, controlling the data processing unit to acquire calibration data of the reference voltage source and generating a corresponding calibration algorithm;
a data storage unit for storing configuration data, calibration data and temperature device errors, the configuration data including a reference voltage value required by a user;
the data processing unit is used for reading the stored data in the data storage unit, converting the stored data into fitting data by using a calibration algorithm based on the FPGA and sending the fitting data to the data conversion unit;
the data conversion unit is used for converting fitting data from a digital signal to an analog signal by taking a 16-bit DAC as a digital-to-analog converter and taking the model as DAC 8831;
the front-stage driving unit is used for filtering the converted fitting data through the high-precision operational amplifier opa277, adjusting the fitting data to an amplitude interval required by a user and driving output voltage to a device to be tested;
the reference unit is used for calibrating the data acquisition unit, and the voltage of the 5 reference power supply chips is used as the calibration voltage of the data acquisition unit;
the data acquisition unit is used for acquiring calibration data through an 18bit ADC (analog-to-digital converter) with the model of AD7690, wherein the calibration data comprises a calibration voltage of a reference unit and an output voltage of a front-stage driving unit, and the calibration data is converted into a digital signal from an analog signal;
the temperature compensation unit is used for measuring the temperature of the board, the model is DS18B20U, and the error of the temperature device corresponding to the current temperature of the board is compensated into the output signal of the data acquisition unit.
The invention realizes the preparation of the high-precision reference voltage source by adopting an advanced reference voltage generation technology. The reference voltage source is taken as an important component in the electronic equipment, and plays a vital role in ensuring the stability and the accuracy of the operation of the equipment. The conventional reference voltage source is prone to problems of precision drop and temperature drift when the voltage is changed, so that the overall performance of the device is affected.
In order to solve the problem, the invention provides a new method for enabling a reference voltage source to maintain stable output under different voltages by dynamically adjusting voltage generation parameters. The method effectively improves the precision and stability of the reference voltage source and avoids the performance degradation of the equipment caused by voltage fluctuation.
In addition, the invention has higher flexibility, and can generate a plurality of different types of reference voltage sources according to actual application scenes and requirements. The characteristic of the invention makes the invention have wide application prospect, can be widely applied to various electronic devices, and meets the personalized requirements of different devices on reference voltage.
On the basis of the invention, we have also conducted intensive research on the stability of the reference voltage source, and put forward a series of optimization strategies. The application of the temperature compensation technology reduces the influence of the temperature change of the reference voltage source on the output voltage, and further improves the stability of the reference voltage source. In addition, through optimizing circuit layout and design, the anti-interference capability of the reference voltage source is improved, so that stable output can be maintained under severe environment.
In a word, the invention solves the problems of precision drop and temperature drift generated by the traditional reference voltage source when the voltage is changed, and has higher flexibility and stability. The innovative technology provides powerful support for the development of the electronic equipment industry in China, and is expected to be widely applied to various electronic equipment.
In another preferred embodiment of the invention, the calibration unit is used for calibrating the data acquisition unit; the reference unit uses 5 reference power chips as calibration voltages for the acquisition unit. Model is LTC6655-1.25V, LTC6655-2.5V; LTC6655-3.3V; LTC6655-4.096V; LTC6655-5V.
In another preferred embodiment of the present invention, the control unit adjusts the voltage of the reference unit by means of the DVM and records any calibration voltage Vr by means of the data acquisition unit i Corresponding actual output voltage Vm i I=1,..5, calculating the voltage Gain and Offset between any two actual output voltages, the calculation formula being:
；
；
where j=1,..4, values of the voltage Gain and the voltage Offset for the 4 segments are obtained and applied to the configuration data for multi-segment calibration.
In another preferred embodiment of the present invention, the process of generating the temperature device error by the temperature compensation unit is:
drawing a temperature drift curve of the output voltage error of the reference voltage source along with the temperature change, selecting error values corresponding to two interval endpoints of a working temperature interval [ m, n ], and calculating gain K and error B between two endpoint connecting line segments to obtain a temperature compensation formula LSB=K.C+B, wherein C is the actual temperature, and LSB is the temperature device error.
In another preferred embodiment of the invention, the control unit is based on a PC or a server.
In another preferred embodiment of the present invention, the reference voltage source is used as follows:
the user writes the configuration data into the data storage unit through the control unit, and in the operation configuration process, the data processing unit reads the storage data of the storage unit, wherein the storage data comprises the configuration data, the calibration data, the temperature device error and the external data compensation, then the storage data is sent to the data conversion unit, the digital signal is converted into the analog signal, and the output voltage signal is sent to the device to be tested through the driving unit.
The data processing unit processes the data after receiving the storage data of the storage unit, including integrating and optimizing configuration data, calibration data, temperature device errors and external data compensation, so as to ensure the accuracy and integrity of the data. In the data processing process, the data processing unit can also monitor and analyze the data in real time so as to facilitate subsequent parameter adjustment and optimization.
After the processing is completed, the data conversion unit converts the digital signal into an analog signal. The process mainly converts digital signals into analog signals through conversion of analog circuits and digital circuits, so that the output signals are more approximate to actual physical quantities. In the process, the data conversion unit can select a proper conversion algorithm and circuit design according to different application scenes and requirements so as to improve the transmission efficiency and the accuracy of signals.
Then, the driving unit converts the converted analog signal into a voltage signal, and amplifies the voltage signal to a proper range through an amplifying circuit. The process is mainly used for meeting the working voltage requirement of the device to be tested, and meanwhile, the stability and the reliability of signals are guaranteed. In the process of outputting the voltage signal, the driving unit can also adjust and optimize in real time according to the characteristic parameters and the test requirements of the device to be tested.
Finally, the device to be tested receives the voltage signal output by the driving unit. After receiving the voltage signal, the device to be tested responds and processes correspondingly according to the characteristic parameters of the signal. During this process, the performance parameters of the device under test are detected and recorded in real time for subsequent data analysis and evaluation.
After the whole test process is finished, the data processing unit can sort and collect the test results to generate a final test report. The test report mainly comprises the detailed description of the test process, the performance parameters of the device to be tested, the data analysis and processing results and the like. Finally, the user can evaluate and optimize the performance of the device to be tested according to the test report, thereby improving the product quality and the competitiveness.
In summary, the driving unit can output the voltage signal according with the operation requirement of the device under test through the comprehensive processing of the configuration data, the calibration data, the temperature device error and the external data compensation and the conversion of the digital signal and the analog signal. In the whole testing process, the cooperative work among the units ensures the accuracy and the reliability of the test data, and provides effective product performance evaluation basis for users. On the basis, the user can continuously optimize the product, and the performance and market competitiveness of the product are continuously improved.
The system relies on a T800 test environment, an upper computer is used as a control unit to control a data processing unit, configuration data and calibration data are written into a data storage unit, the data of the storage unit are sent to a data conversion unit and a front-stage driving unit through a control instruction, and the data are output to a circuit to be tested.
The foregoing describes one embodiment of the present invention in detail, but the description is only a preferred embodiment of the present invention and should not be construed as limiting the scope of the invention. All equivalent changes and modifications within the scope of the present invention are intended to be covered by the present invention.
Claims (6)
1. The utility model provides a high accuracy adjustable reference voltage source which characterized in that includes control unit, data storage unit, data processing unit, data conversion unit, preceding drive unit, reference unit, temperature compensation unit and data acquisition unit, wherein:
the control unit is used for setting a reference voltage source used by a user, controlling the data processing unit to acquire calibration data of the reference voltage source and generating a corresponding calibration algorithm;
a data storage unit for storing configuration data, calibration data and temperature device errors, the configuration data including a reference voltage value required by a user;
the data processing unit is used for reading the stored data in the data storage unit, converting the stored data into fitting data by using a calibration algorithm based on the FPGA and sending the fitting data to the data conversion unit;
the data conversion unit is used for converting fitting data from a digital signal to an analog signal by taking the 16bit DAC as a digital-to-analog converter;
the front-stage driving unit is used for filtering the converted fitting data through the high-precision operational amplifier opa277, adjusting the fitting data to an amplitude interval required by a user and driving output voltage to a device to be tested;
the reference unit is used for calibrating the data acquisition unit, and the voltage of the 5 reference power supply chips is used as the calibration voltage of the data acquisition unit;
the data acquisition unit is used for acquiring calibration data through an 18bit ADC as an analog-to-digital converter, wherein the calibration data comprises a calibration voltage of a reference unit and an output voltage of a front-stage driving unit, and the calibration data is converted into a digital signal from an analog signal;
and the temperature compensation unit is used for measuring the temperature of the board and compensating the error of the temperature device corresponding to the current temperature of the board into the output signal of the data acquisition unit.
2. A high precision adjustable reference voltage source as claimed in claim 1 wherein the calibration voltage of the reference power supply chip includes but is not limited to 1.25V, 2.5V, 3.3V, 4.096V, 5V.
3. A high precision adjustable reference voltage source as claimed in claim 1, wherein,
the control unit adjusts the voltage of the reference unit through the DVM, and any calibration voltage Vr is recorded through the data acquisition unit i Corresponding actual output voltage Vm i I=1,..5, calculating the voltage Gain and Offset between any two actual output voltages, the calculation formula being:
；
；
where j=1,..4, values of the voltage Gain and the voltage Offset for the 4 segments are obtained and applied to the configuration data for multi-segment calibration.
4. The high-precision adjustable reference voltage source according to claim 1, wherein the process of generating the temperature device error by the temperature compensation unit is as follows:
drawing a temperature drift curve of the output voltage error of the reference voltage source along with the temperature change, selecting error values corresponding to two interval endpoints of a working temperature interval [ m, n ], and calculating gain K and error B between two endpoint connecting line segments to obtain a temperature compensation formula LSB=K.C+B, wherein C is the actual temperature, and LSB is the temperature device error.
5. A high precision adjustable reference voltage source according to claim 1, characterized in that the control unit is based on a PC or a server.
6. The high precision adjustable reference voltage source according to claim 5, wherein the reference voltage source is used as follows:
the user writes the configuration data into the data storage unit through the control unit, and in the operation configuration process, the data processing unit reads the storage data of the storage unit, wherein the storage data comprises the configuration data, the calibration data, the temperature device error and the external data compensation, then the storage data is sent to the data conversion unit, the digital signal is converted into the analog signal, and the output voltage signal is sent to the device to be tested through the driving unit.
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| CN118316320A (en) * | 2024-04-07 | 2024-07-09 | 河北纳英电子科技有限公司 | Control method for three-phase staggered resonant circuit of switching power supply |
| CN118890046B (en) * | 2024-06-12 | 2024-12-31 | 合肥磐芯电子有限公司 | A calibration method for digital-to-analog converter |
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