CN117341370B - Preparation method of soft photolithography stamp capable of fitting curved surface object without external force, product and application thereof - Google Patents
Preparation method of soft photolithography stamp capable of fitting curved surface object without external force, product and application thereof Download PDFInfo
- Publication number
- CN117341370B CN117341370B CN202311221877.9A CN202311221877A CN117341370B CN 117341370 B CN117341370 B CN 117341370B CN 202311221877 A CN202311221877 A CN 202311221877A CN 117341370 B CN117341370 B CN 117341370B
- Authority
- CN
- China
- Prior art keywords
- soft lithography
- stamp
- cross
- polymer material
- lithography stamp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000002360 preparation method Methods 0.000 title claims abstract description 19
- 238000000206 photolithography Methods 0.000 title claims description 18
- 238000002174 soft lithography Methods 0.000 claims abstract description 99
- 229920006037 cross link polymer Polymers 0.000 claims abstract description 43
- 239000002861 polymer material Substances 0.000 claims abstract description 30
- 238000000034 method Methods 0.000 claims abstract description 28
- 229910021645 metal ion Inorganic materials 0.000 claims abstract description 23
- 230000003287 optical effect Effects 0.000 claims abstract description 14
- 239000000126 substance Substances 0.000 claims abstract description 8
- 239000002904 solvent Substances 0.000 claims abstract description 6
- 238000005286 illumination Methods 0.000 claims abstract description 5
- 230000008961 swelling Effects 0.000 claims abstract description 4
- 230000002194 synthesizing effect Effects 0.000 claims abstract description 4
- 238000005530 etching Methods 0.000 claims abstract description 3
- 239000002952 polymeric resin Substances 0.000 claims abstract description 3
- 229920003002 synthetic resin Polymers 0.000 claims abstract description 3
- -1 iron ions Chemical class 0.000 claims description 11
- JFJNVIPVOCESGZ-UHFFFAOYSA-N 2,3-dipyridin-2-ylpyridine Chemical group N1=CC=CC=C1C1=CC=CN=C1C1=CC=CC=N1 JFJNVIPVOCESGZ-UHFFFAOYSA-N 0.000 claims description 8
- 239000002738 chelating agent Substances 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 6
- 229940008075 allyl sulfide Drugs 0.000 claims description 5
- 230000010076 replication Effects 0.000 claims description 4
- 239000001509 sodium citrate Substances 0.000 claims description 4
- NLJMYIDDQXHKNR-UHFFFAOYSA-K sodium citrate Chemical compound O.O.[Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O NLJMYIDDQXHKNR-UHFFFAOYSA-K 0.000 claims description 4
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 3
- 125000003396 thiol group Chemical group [H]S* 0.000 claims description 3
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 claims description 2
- VEQPNABPJHWNSG-UHFFFAOYSA-N Nickel(2+) Chemical compound [Ni+2] VEQPNABPJHWNSG-UHFFFAOYSA-N 0.000 claims description 2
- PTFCDOFLOPIGGS-UHFFFAOYSA-N Zinc dication Chemical compound [Zn+2] PTFCDOFLOPIGGS-UHFFFAOYSA-N 0.000 claims description 2
- 229910001429 cobalt ion Inorganic materials 0.000 claims description 2
- XLJKHNWPARRRJB-UHFFFAOYSA-N cobalt(2+) Chemical compound [Co+2] XLJKHNWPARRRJB-UHFFFAOYSA-N 0.000 claims description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 2
- 229910052742 iron Inorganic materials 0.000 claims description 2
- 229910001453 nickel ion Inorganic materials 0.000 claims description 2
- 229910052726 zirconium Inorganic materials 0.000 claims description 2
- 238000005459 micromachining Methods 0.000 abstract description 6
- 238000001459 lithography Methods 0.000 abstract description 4
- 230000005540 biological transmission Effects 0.000 abstract 1
- 239000000243 solution Substances 0.000 description 27
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 15
- 239000002994 raw material Substances 0.000 description 13
- 239000000463 material Substances 0.000 description 11
- 229920002120 photoresistant polymer Polymers 0.000 description 11
- 239000000047 product Substances 0.000 description 11
- 238000001000 micrograph Methods 0.000 description 10
- 230000008569 process Effects 0.000 description 10
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 9
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 9
- 239000007788 liquid Substances 0.000 description 9
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 7
- 229920002379 silicone rubber Polymers 0.000 description 7
- 239000004945 silicone rubber Substances 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 229920005989 resin Polymers 0.000 description 6
- 239000011347 resin Substances 0.000 description 6
- 239000011521 glass Substances 0.000 description 5
- 239000007787 solid Substances 0.000 description 5
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 4
- HFBMWMNUJJDEQZ-UHFFFAOYSA-N acryloyl chloride Chemical compound ClC(=O)C=C HFBMWMNUJJDEQZ-UHFFFAOYSA-N 0.000 description 4
- 239000003431 cross linking reagent Substances 0.000 description 4
- 238000011161 development Methods 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- 238000003756 stirring Methods 0.000 description 4
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- LEVWYRKDKASIDU-IMJSIDKUSA-N L-cystine Chemical compound [O-]C(=O)[C@@H]([NH3+])CSSC[C@H]([NH3+])C([O-])=O LEVWYRKDKASIDU-IMJSIDKUSA-N 0.000 description 3
- 239000004158 L-cystine Substances 0.000 description 3
- 235000019393 L-cystine Nutrition 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- JOBBTVPTPXRUBP-UHFFFAOYSA-N [3-(3-sulfanylpropanoyloxy)-2,2-bis(3-sulfanylpropanoyloxymethyl)propyl] 3-sulfanylpropanoate Chemical compound SCCC(=O)OCC(COC(=O)CCS)(COC(=O)CCS)COC(=O)CCS JOBBTVPTPXRUBP-UHFFFAOYSA-N 0.000 description 3
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 3
- 229960003067 cystine Drugs 0.000 description 3
- 239000008367 deionised water Substances 0.000 description 3
- 229910021641 deionized water Inorganic materials 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000003822 epoxy resin Substances 0.000 description 3
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 3
- 230000003204 osmotic effect Effects 0.000 description 3
- 229920001610 polycaprolactone Polymers 0.000 description 3
- 239000004632 polycaprolactone Substances 0.000 description 3
- 229920000647 polyepoxide Polymers 0.000 description 3
- 239000002244 precipitate Substances 0.000 description 3
- 238000002791 soaking Methods 0.000 description 3
- YZDWFQPPSSVWAG-YUMQZZPRSA-N (2r)-3-[[(2r)-2-carboxy-2-(prop-2-enoylamino)ethyl]disulfanyl]-2-(prop-2-enoylamino)propanoic acid Chemical compound C=CC(=O)N[C@H](C(=O)O)CSSC[C@H](NC(=O)C=C)C(O)=O YZDWFQPPSSVWAG-YUMQZZPRSA-N 0.000 description 2
- PQUXFUBNSYCQAL-UHFFFAOYSA-N 1-(2,3-difluorophenyl)ethanone Chemical compound CC(=O)C1=CC=CC(F)=C1F PQUXFUBNSYCQAL-UHFFFAOYSA-N 0.000 description 2
- GJKGAPPUXSSCFI-UHFFFAOYSA-N 2-Hydroxy-4'-(2-hydroxyethoxy)-2-methylpropiophenone Chemical compound CC(C)(O)C(=O)C1=CC=C(OCCO)C=C1 GJKGAPPUXSSCFI-UHFFFAOYSA-N 0.000 description 2
- ABZJDNLKVWSLPM-UHFFFAOYSA-N 2-sulfanylethyl prop-2-enoate Chemical compound SCCOC(=O)C=C ABZJDNLKVWSLPM-UHFFFAOYSA-N 0.000 description 2
- VNFYMAPAENTMMO-UHFFFAOYSA-N 5-chloro-2-methylquinoline Chemical compound ClC1=CC=CC2=NC(C)=CC=C21 VNFYMAPAENTMMO-UHFFFAOYSA-N 0.000 description 2
- 206010004966 Bite Diseases 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229940048053 acrylate Drugs 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000006227 byproduct Substances 0.000 description 2
- 238000004132 cross linking Methods 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 239000004205 dimethyl polysiloxane Substances 0.000 description 2
- 235000013870 dimethyl polysiloxane Nutrition 0.000 description 2
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 2
- 230000005012 migration Effects 0.000 description 2
- 238000013508 migration Methods 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- LQNUZADURLCDLV-UHFFFAOYSA-N nitrobenzene Chemical compound [O-][N+](=O)C1=CC=CC=C1 LQNUZADURLCDLV-UHFFFAOYSA-N 0.000 description 2
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 description 2
- 230000008707 rearrangement Effects 0.000 description 2
- 239000012266 salt solution Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229940047670 sodium acrylate Drugs 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 150000003573 thiols Chemical class 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- 239000002023 wood Substances 0.000 description 2
- BWRBVBFLFQKBPT-UHFFFAOYSA-N (2-nitrophenyl)methanol Chemical compound OCC1=CC=CC=C1[N+]([O-])=O BWRBVBFLFQKBPT-UHFFFAOYSA-N 0.000 description 1
- CVTDDZYPSGYVNN-UHFFFAOYSA-N (2-nitrophenyl)methyl prop-2-enoate Chemical compound [O-][N+](=O)C1=CC=CC=C1COC(=O)C=C CVTDDZYPSGYVNN-UHFFFAOYSA-N 0.000 description 1
- PSGCQDPCAWOCSH-UHFFFAOYSA-N (4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl) prop-2-enoate Chemical compound C1CC2(C)C(OC(=O)C=C)CC1C2(C)C PSGCQDPCAWOCSH-UHFFFAOYSA-N 0.000 description 1
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2-(2-cyanopropan-2-yldiazenyl)-2-methylpropanenitrile Chemical compound N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 1
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- FTPMTXAFGKIZOU-UHFFFAOYSA-N 2-hydroxyethyl 2,2-bis(sulfanyl)propanoate Chemical compound CC(S)(S)C(=O)OCCO FTPMTXAFGKIZOU-UHFFFAOYSA-N 0.000 description 1
- RZVINYQDSSQUKO-UHFFFAOYSA-N 2-phenoxyethyl prop-2-enoate Chemical compound C=CC(=O)OCCOC1=CC=CC=C1 RZVINYQDSSQUKO-UHFFFAOYSA-N 0.000 description 1
- FVKFHMNJTHKMRX-UHFFFAOYSA-N 3,4,6,7,8,9-hexahydro-2H-pyrimido[1,2-a]pyrimidine Chemical compound C1CCN2CCCNC2=N1 FVKFHMNJTHKMRX-UHFFFAOYSA-N 0.000 description 1
- DBCAQXHNJOFNGC-UHFFFAOYSA-N 4-bromo-1,1,1-trifluorobutane Chemical compound FC(F)(F)CCCBr DBCAQXHNJOFNGC-UHFFFAOYSA-N 0.000 description 1
- FIHBHSQYSYVZQE-UHFFFAOYSA-N 6-prop-2-enoyloxyhexyl prop-2-enoate Chemical compound C=CC(=O)OCCCCCCOC(=O)C=C FIHBHSQYSYVZQE-UHFFFAOYSA-N 0.000 description 1
- OZAIFHULBGXAKX-VAWYXSNFSA-N AIBN Substances N#CC(C)(C)\N=N\C(C)(C)C#N OZAIFHULBGXAKX-VAWYXSNFSA-N 0.000 description 1
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 1
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 1
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 1
- 101000827703 Homo sapiens Polyphosphoinositide phosphatase Proteins 0.000 description 1
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 1
- CSNNHWWHGAXBCP-UHFFFAOYSA-L Magnesium sulfate Chemical compound [Mg+2].[O-][S+2]([O-])([O-])[O-] CSNNHWWHGAXBCP-UHFFFAOYSA-L 0.000 description 1
- KWYHDKDOAIKMQN-UHFFFAOYSA-N N,N,N',N'-tetramethylethylenediamine Chemical compound CN(C)CCN(C)C KWYHDKDOAIKMQN-UHFFFAOYSA-N 0.000 description 1
- 102100023591 Polyphosphoinositide phosphatase Human genes 0.000 description 1
- 101100012902 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) FIG2 gene Proteins 0.000 description 1
- 101100233916 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) KAR5 gene Proteins 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000002318 adhesion promoter Substances 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- 239000003125 aqueous solvent Substances 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004061 bleaching Methods 0.000 description 1
- 239000012267 brine Substances 0.000 description 1
- 235000012730 carminic acid Nutrition 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000005119 centrifugation Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000009920 chelation Effects 0.000 description 1
- GVPFVAHMJGGAJG-UHFFFAOYSA-L cobalt dichloride Chemical compound [Cl-].[Cl-].[Co+2] GVPFVAHMJGGAJG-UHFFFAOYSA-L 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000000708 deep reactive-ion etching Methods 0.000 description 1
- DKKXSNXGIOPYGQ-UHFFFAOYSA-N diphenylphosphanyl-(2,4,6-trimethylphenyl)methanone Chemical compound CC1=CC(C)=CC(C)=C1C(=O)P(C=1C=CC=CC=1)C1=CC=CC=C1 DKKXSNXGIOPYGQ-UHFFFAOYSA-N 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 238000005323 electroforming Methods 0.000 description 1
- STVZJERGLQHEKB-UHFFFAOYSA-N ethylene glycol dimethacrylate Substances CC(=C)C(=O)OCCOC(=O)C(C)=C STVZJERGLQHEKB-UHFFFAOYSA-N 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000005457 ice water Substances 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910000358 iron sulfate Inorganic materials 0.000 description 1
- BAUYGSIQEAFULO-UHFFFAOYSA-L iron(2+) sulfate (anhydrous) Chemical compound [Fe+2].[O-]S([O-])(=O)=O BAUYGSIQEAFULO-UHFFFAOYSA-L 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 229940057995 liquid paraffin Drugs 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 229940088644 n,n-dimethylacrylamide Drugs 0.000 description 1
- YLGYACDQVQQZSW-UHFFFAOYSA-N n,n-dimethylprop-2-enamide Chemical compound CN(C)C(=O)C=C YLGYACDQVQQZSW-UHFFFAOYSA-N 0.000 description 1
- QNILTEGFHQSKFF-UHFFFAOYSA-N n-propan-2-ylprop-2-enamide Chemical compound CC(C)NC(=O)C=C QNILTEGFHQSKFF-UHFFFAOYSA-N 0.000 description 1
- KBJMLQFLOWQJNF-UHFFFAOYSA-N nickel(ii) nitrate Chemical compound [Ni+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O KBJMLQFLOWQJNF-UHFFFAOYSA-N 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 125000001209 o-nitrophenyl group Chemical group [H]C1=C([H])C(*)=C(C([H])=C1[H])[N+]([O-])=O 0.000 description 1
- CXQXSVUQTKDNFP-UHFFFAOYSA-N octamethyltrisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)O[Si](C)(C)C CXQXSVUQTKDNFP-UHFFFAOYSA-N 0.000 description 1
- CMOAHYOGLLEOGO-UHFFFAOYSA-N oxozirconium;dihydrochloride Chemical compound Cl.Cl.[Zr]=O CMOAHYOGLLEOGO-UHFFFAOYSA-N 0.000 description 1
- 238000004987 plasma desorption mass spectroscopy Methods 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- HPALAKNZSZLMCH-UHFFFAOYSA-M sodium;chloride;hydrate Chemical compound O.[Na+].[Cl-] HPALAKNZSZLMCH-UHFFFAOYSA-M 0.000 description 1
- 230000000638 stimulation Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 238000000233 ultraviolet lithography Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 239000002351 wastewater Substances 0.000 description 1
- NWONKYPBYAMBJT-UHFFFAOYSA-L zinc sulfate Chemical compound [Zn+2].[O-]S([O-])(=O)=O NWONKYPBYAMBJT-UHFFFAOYSA-L 0.000 description 1
- 229910000368 zinc sulfate Inorganic materials 0.000 description 1
- 229960001763 zinc sulfate Drugs 0.000 description 1
- PAPBSGBWRJIAAV-UHFFFAOYSA-N ε-Caprolactone Chemical compound O=C1CCCCCO1 PAPBSGBWRJIAAV-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41K—STAMPS; STAMPING OR NUMBERING APPARATUS OR DEVICES
- B41K1/00—Portable hand-operated devices without means for supporting or locating the articles to be stamped, i.e. hand stamps; Inking devices or other accessories therefor
- B41K1/26—Portable hand-operated devices without means for supporting or locating the articles to be stamped, i.e. hand stamps; Inking devices or other accessories therefor with stamping surfaces adapted for application to non-flat surfaces
- B41K1/28—Portable hand-operated devices without means for supporting or locating the articles to be stamped, i.e. hand stamps; Inking devices or other accessories therefor with stamping surfaces adapted for application to non-flat surfaces flexible
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
技术领域Technical Field
本发明涉及软光刻印章的制造领域,具体涉及一种无外力下贴合曲面物体的软光刻印章的制备方法及其产品和应用。The invention relates to the field of manufacturing soft photolithography stamps, and in particular to a preparation method of a soft photolithography stamp capable of fitting a curved surface object without external force, and a product and application thereof.
背景技术Background technique
微结构加工技术是现代高端制造业的基础,在航空航天、微电子工业、计算机芯片以及光学仪器等领域有着重大需求。Microstructure processing technology is the foundation of modern high-end manufacturing and is in great demand in aerospace, microelectronics, computer chips, optical instruments and other fields.
目前,光刻(photolithography)是普遍采用的微加工技术,具有精度高、通量大的优势。其工艺流程通常包括:(1)光刻胶旋涂;(2)掩膜下区域曝光;(3)显影液显影。如公开号为CN116136651A的中国专利公开了一种改善晶圆显影中光刻胶漂胶的方法,包括下列步骤:(1)将晶圆置于HMDS气氛的烘箱中,在晶圆表面形成厚度为5~30纳米的HMDS粘膜用作为光刻胶增粘剂;(2)在晶圆表面已形成的所述HMDS粘膜上面旋涂光刻胶薄膜,然后烘干固化;(3)用步进扫描式I线光刻机对光刻胶薄膜进行曝光;(4)对晶圆表面旋转水洗、将显影液旋转式布满光刻薄膜表面且予以浸泡、旋转甩去显影液、再次旋转水洗;重复执行步骤(1)和(4)。这种多步骤的过程往往需要花费较长的时间,同时,光刻胶难以流挂在三维曲面上,导致光刻仅适合平面物体的微结构加工。更重要的是,显影过程需要采用显影液不断冲洗光刻表面,以洗去多余的光刻胶,这就不可避免地产生大量废水,对环境造成负面影响,不符合生态文明建设的要求。因此,如何在不利用光刻胶的基础上实现三维曲面的微结构加工成为研究重点。At present, photolithography is a commonly used micro-machining technology with the advantages of high precision and high throughput. Its process flow generally includes: (1) photoresist spin coating; (2) exposure of the area under the mask; (3) development with developer. For example, Chinese patent No. CN116136651A discloses a method for improving photoresist bleaching in wafer development, which includes the following steps: (1) placing the wafer in an oven with HMDS atmosphere to form an HMDS film with a thickness of 5 to 30 nanometers on the surface of the wafer to serve as a photoresist adhesion promoter; (2) spin coating a photoresist film on the HMDS film formed on the surface of the wafer, and then drying and curing it; (3) exposing the photoresist film with a step-and-scan I-line lithography machine; (4) rotating and washing the wafer surface with water, rotating the developer to cover the surface of the photoresist film and soak it, rotating to remove the developer, and rotating and washing again; repeating steps (1) and (4). This multi-step process often takes a long time. At the same time, photoresist is difficult to flow on a three-dimensional curved surface, which makes photolithography only suitable for microstructure processing of flat objects. More importantly, the development process requires the use of developer to continuously rinse the photolithography surface to wash away excess photoresist, which inevitably produces a large amount of wastewater, has a negative impact on the environment, and does not meet the requirements of ecological civilization construction. Therefore, how to achieve microstructure processing of three-dimensional curved surfaces without using photoresist has become a research focus.
软光刻(soft lithography)是一种新兴的微结构加工技术。其材料基础是含微结构的交联硅橡胶(polydimethylsiloxane)印章。该印章能够贴附于目标物体表面,或者灌注上目标树脂液体,实现材料的微结构制造。如公开号为CN1686781A的中国专利公开了一种环氧树脂微结构器件的制备方法,采用硅橡胶(PDMS)弹性材料作为微复制模具,利用其可逆及重复变形而不发生永久性破坏的性能高保真地复制微结构:首先采用紫外光刻、硅深反应离子刻蚀技术或电铸工艺将掩模板上微结构图案转移到光刻胶基片、硅或金属上,获得微复制模板,再将硅橡胶与交联剂按比例混合,利用微复制技术将模板上的微结构图案复制到硅橡胶片上,然后将环氧树脂预聚体与交联剂混合后浇注到硅橡胶模具上,完成环氧树脂微结构的复制。Soft lithography is an emerging microstructure processing technology. Its material basis is a cross-linked silicone rubber (polydimethylsiloxane) stamp containing a microstructure. The stamp can be attached to the surface of a target object, or injected with a target resin liquid to achieve the microstructure manufacturing of the material. For example, the Chinese patent with publication number CN1686781A discloses a method for preparing an epoxy resin microstructure device, which uses silicone rubber (PDMS) elastic material as a micro-replication mold, and uses its reversible and repeated deformation without permanent damage to replicate the microstructure with high fidelity: first, ultraviolet lithography, silicon deep reactive ion etching technology or electroforming process are used to transfer the microstructure pattern on the mask to a photoresist substrate, silicon or metal to obtain a micro-replication template, and then the silicone rubber and the cross-linking agent are mixed in proportion, and the microstructure pattern on the template is copied to the silicone rubber sheet using the micro-replication technology, and then the epoxy resin prepolymer and the cross-linking agent are mixed and poured onto the silicone rubber mold to complete the replication of the epoxy resin microstructure.
可以发现,该技术不再需要液体光刻胶,且无需显影。同时,利用硅橡胶的弹性,印章可以在外力作用下贴附于曲面物体表面,实现非平面基底的微结构制造。然而,一旦撤去外力,弹性印章会由于熵驱动力而迅速回复,导致整个过程需要持续施加外力。另一方面,弹性印章需要通过硅橡胶合成液在含微结构母版(master)上的浇筑、固化、剥离来获得。It can be found that this technology no longer requires liquid photoresist and does not require development. At the same time, by utilizing the elasticity of silicone rubber, the stamp can be attached to the surface of a curved object under the action of external force, realizing the microstructure manufacturing of a non-planar substrate. However, once the external force is removed, the elastic stamp will quickly recover due to the entropy driving force, resulting in the need to continuously apply external force throughout the process. On the other hand, the elastic stamp needs to be obtained by pouring, curing, and peeling off the silicone rubber synthetic liquid on a microstructured master.
但是,母版的制造需要依赖于光刻技术,使得软光刻被认为是现有光刻技术的一种衍生工艺,无法在真正意义上克服光刻所带来的缺点。因此,如何克服弹性印章的制备对光刻技术的依赖,使得软光刻能够成为独立的微加工方法,是目前本领域亟需解决的技术问题。However, the manufacture of the master plate depends on photolithography technology, so soft lithography is considered a derivative process of existing photolithography technology and cannot truly overcome the shortcomings of photolithography. Therefore, how to overcome the dependence of the preparation of elastic stamps on photolithography technology and make soft lithography an independent micro-machining method is a technical problem that needs to be solved in this field.
发明内容Summary of the invention
本发明的目的在于提供一种无外力下贴合曲面物体的软光刻印章的制备方法及其产品和应用,该方法直接用紫外光引发和无需外力作用获得软光刻印章,获得的软光刻印章可重复利用,且可应用于曲面微加工。The purpose of the present invention is to provide a preparation method of a soft lithography stamp that can fit a curved surface object without external force, and a product and application thereof. The method directly uses ultraviolet light to initiate and obtains the soft lithography stamp without the need for external force. The obtained soft lithography stamp can be reused and can be applied to curved surface micromachining.
本发明提供如下技术方案:The present invention provides the following technical solutions:
一种无外力下贴合曲面物体的软光刻印章的制备方法,所述制备方法包括如下步骤:A method for preparing a soft photolithography stamp capable of fitting a curved surface object without external force, the method comprising the following steps:
(1)合成同时含有光敏感结构与可金属离子配位结构的交联高分子材料,并在溶剂中溶胀;(1) synthesizing a cross-linked polymer material containing both a photosensitive structure and a metal ion coordination structure, and swelling it in a solvent;
(2)交联高分子材料的表面覆盖特定透光图案的光学掩模板,并在光照下引起区域化学结构改变,使得交联高分子材料的表面出现微结构,得到软光刻印章。(2) The surface of the cross-linked polymer material is covered with an optical mask with a specific light-transmitting pattern, which causes regional chemical structure changes under light, resulting in microstructures on the surface of the cross-linked polymer material, thereby obtaining a soft lithography stamp.
本发明的主要原理如下:采用同时含有光敏感结构与可金属离子配位结构的交联高分子材料。区域光照引起内部光敏感结构发生改变,导致材料内部网络拓扑结构重排,导致交联密度与渗透压下降,诱导周边液体向曝光区域迁移和富集,从而隆起产生微结构(即,印章表面微结构的产生来自于光诱导下材料内部液体的迁移)。整个过程无需采用光刻母版,并且无外界添加物,也无废弃物,展现出高效、绿色的特点。The main principle of the present invention is as follows: a cross-linked polymer material containing both a photosensitive structure and a metal ion coordination structure is used. Regional illumination causes changes in the internal photosensitive structure, resulting in a rearrangement of the internal network topology of the material, a decrease in the cross-linking density and osmotic pressure, and inducing the surrounding liquid to migrate and enrich to the exposure area, thereby bulging to produce a microstructure (that is, the microstructure on the surface of the seal comes from the migration of the liquid inside the material under light induction). The entire process does not require the use of a photolithography master, and there is no external additive or waste, showing the characteristics of high efficiency and greenness.
在步骤(1)中,所述交联高分子材料中同时含有光敏感结构和可金属离子配位结构,其中,光敏感结构可选自二硫键、烯丙基硫键、邻硝基苯键中的一种或多种;可金属离子配位结构可选自羧基、三联吡啶基、巯基中的一种或多种。In step (1), the cross-linked polymer material contains both a photosensitive structure and a metal ion coordination structure, wherein the photosensitive structure can be selected from one or more of a disulfide bond, an allyl sulfide bond, and an o-nitrobenzene bond; and the metal ion coordination structure can be selected from one or more of a carboxyl group, a terpyridine group, and a thiol group.
作为优选,所使用的含光敏感结构的合成原料可以选用但不限于N,N'-双丙烯酰胱氨酸,2-甲基-丙烷-1,3-双(丙烯酸硫乙酯),丙烯酸邻硝基苄基酯。Preferably, the synthetic raw materials containing the photosensitive structure may be selected from, but not limited to, N,N'-bisacryloylcystine, 2-methyl-propane-1,3-bis(thioethyl acrylate), and o-nitrobenzyl acrylate.
作为优选,所使用的可金属离子配位结构的合成选料可以选用但不限于丙烯酸,三联吡啶基丙烯酰聚己内酯,丙烯酸巯基乙基酯。Preferably, the materials used for the synthesis of the metal ion coordination structure may be selected from, but not limited to, acrylic acid, terpyridyl acryloyl polycaprolactone, and mercaptoethyl acrylate.
在步骤(1)中,溶剂可以选自水或非水溶剂。In step (1), the solvent may be selected from water or a non-aqueous solvent.
作为优选,可以选择水、二甲基亚砜、乙酸乙酯、N,N-二甲基甲酰胺、甘油。Preferably, water, dimethyl sulfoxide, ethyl acetate, N,N-dimethylformamide, and glycerol can be selected.
在步骤(2)中,所述光照的波长选自200-380nm的紫外波段,光照的强度大于10mW/cm2,光照的时间大于5s。In step (2), the wavelength of the light is selected from the ultraviolet band of 200-380 nm, the intensity of the light is greater than 10 mW/cm 2 , and the time of the light is greater than 5 s.
作为优选,光照的波长可以选用254-365nm,光照的强度可选用20-50mW/cm2,光照的时间可选用0.5-1min。Preferably, the wavelength of the light can be 254-365 nm, the intensity of the light can be 20-50 mW/cm 2 , and the time of the light can be 0.5-1 min.
在步骤(2)中,光照下可引起交联高分子材料内光敏感结构的改变,针对不同的光敏感结构的机理为:二硫键或烯丙基硫键在光照下发生共价键重排;邻硝基苯基在光照下发生异构解离。光照下可引起交联高分子材料所含光敏感结构的改变会诱导内部液体向光照区域迁移,从而隆起产生微结构。In step (2), light can cause changes in the photosensitive structure within the cross-linked polymer material. The mechanisms for different photosensitive structures are as follows: disulfide bonds or allyl sulfide bonds undergo covalent bond rearrangement under light; o-nitrophenyl undergoes isomeric dissociation under light. The changes in the photosensitive structure contained in the cross-linked polymer material under light can induce the internal liquid to migrate to the illuminated area, thereby bulging and generating microstructures.
本发明提供的无外力下贴合曲面物体的软光刻印章的制备方法,过程高效、绿色环保,并且为曲面物体表面的软光刻提供了一种新思路。The method for preparing a soft lithography stamp that can fit a curved object without external force provided by the present invention has an efficient process and is green and environmentally friendly, and provides a new idea for soft lithography on the surface of a curved object.
本发明还提供了一种根据上述制备方法得到的软光刻印章。The invention also provides a soft photolithography stamp obtained according to the preparation method.
一种上述制备方法得到的软光刻印章在软光刻上的应用,所述软光刻的方法为:An application of the soft lithography stamp obtained by the above preparation method in soft lithography, wherein the soft lithography method is:
依据目标物体的表面形态,将软光刻印章的初始形状变形成匹配的三维形状,并通过浸泡金属离子溶液进行形状固定,此时软光刻印章能够在无外力下贴合目标物体的表面,实现曲面的结构加工。According to the surface morphology of the target object, the initial shape of the soft lithography stamp is deformed into a matching three-dimensional shape, and the shape is fixed by immersing it in a metal ion solution. At this time, the soft lithography stamp can adhere to the surface of the target object without external force, realizing curved surface structural processing.
进一步地,所述金属离子选自铁离子、锌离子、钴离子、镍离子或锆离子中的一种或多种。Furthermore, the metal ions are selected from one or more of iron ions, zinc ions, cobalt ions, nickel ions or zirconium ions.
作为优选,含金属离子的盐可选自硫酸铁、硫酸锌、氯化钴、硝酸镍、氯化氧锆中的一种或多种。进一步优选,盐溶液浓度可以选自0.001-0.1mol/L。Preferably, the salt containing metal ions can be selected from one or more of iron sulfate, zinc sulfate, cobalt chloride, nickel nitrate, and zirconium oxychloride. Further preferably, the concentration of the salt solution can be selected from 0.001-0.1 mol/L.
进一步地,所述形状固定后的软光刻印章浸泡于含螯合剂的溶液后可回复到软光刻印章的初始形状。Furthermore, the soft lithography stamp with a fixed shape can be restored to its original shape after being immersed in a solution containing a chelating agent.
进一步地,所述螯合剂选自乙二胺四乙酸或柠檬酸钠中的一种或两种。Furthermore, the chelating agent is selected from one or both of ethylenediaminetetraacetic acid and sodium citrate.
进一步优选,螯合剂溶液浓度可以选自0.01-1mol/L。More preferably, the concentration of the chelating agent solution may be selected from 0.01-1 mol/L.
面对曲面物体的微加工需求,本发明提供的上述软光刻的方法能够将含微结构的软光刻印章贴附到目标物体表面,浸泡于含金属离子的盐溶液中,利用配位作用使软光刻印章固定成匹配目标物体表面的形状,使得无需外力就可实现曲面物体的贴合与软光刻。且,固定特定形状/形变后的软光刻印章浸泡于含螯合剂的溶液后,又因配位键的破坏而可回复到固定之前的原始形状,从而可以重复用于具有不同表面形态物体的软光刻/微加工。In response to the demand for micro-machining of curved objects, the soft lithography method provided by the present invention can attach a soft lithography stamp containing a microstructure to the surface of a target object, immerse it in a salt solution containing metal ions, and use coordination to fix the soft lithography stamp into a shape that matches the surface of the target object, so that the alignment and soft lithography of the curved object can be achieved without external force. Moreover, after the soft lithography stamp with a fixed specific shape/deformation is immersed in a solution containing a chelating agent, it can be restored to its original shape before fixation due to the destruction of the coordination bond, so that it can be repeatedly used for soft lithography/micro-machining of objects with different surface morphologies.
本发明还提供了一种上述制备方法得到的软光刻印章在高分子树脂的微结构复刻上的应用。The present invention also provides an application of the soft photolithography stamp obtained by the preparation method in microstructure replication of polymer resin.
本发明还提供了一种上述制备方法得到的软光刻印章在曲面物体表面的区域刻蚀上的应用。The present invention also provides an application of the soft photolithography stamp obtained by the preparation method in regional etching on the surface of a curved object.
本发明利用含有光敏感结构与可金属离子配位结构的交联高分子材料,在紫外光照的作用下引起材料内部拓扑结构的变化,以此来制备软光刻印章。并可以进一步通过浸泡金属离子来固定软光刻印章形状,通过浸泡螯合溶液的螯合作用来回复固定的软光刻印章。本发明提供的方法无需外力作用,无需光刻母版,过程简单易于操作且绿色环保。The present invention utilizes a cross-linked polymer material containing a photosensitive structure and a metal ion coordination structure to cause a change in the internal topological structure of the material under the action of ultraviolet light, thereby preparing a soft lithography stamp. The shape of the soft lithography stamp can be further fixed by soaking in metal ions, and the fixed soft lithography stamp can be restored by soaking in a chelating solution for chelation. The method provided by the present invention does not require external force, does not require a photolithography master, and the process is simple, easy to operate, and is environmentally friendly.
与现有技术相比,本发明的益处体现在:Compared with the prior art, the benefits of the present invention are:
(1)本发明中的弹性印章(软光刻印章)上可以直接用紫外光引发获得,无需外力作用,过程简单;(1) The elastic stamp (soft lithography stamp) of the present invention can be directly obtained by ultraviolet light initiation without the need for external force, and the process is simple;
(2)由于本发明中所使用的交联高分子材料同时含有光敏感结构与可金属离子配位结构,通过反复相互作用,本发明中所制备的软光刻印章可以重复利用;(2) Since the cross-linked polymer material used in the present invention contains both a photosensitive structure and a metal ion coordination structure, the soft lithography stamp prepared in the present invention can be reused through repeated interactions;
(3)本发明中,软光刻印章是通过微结构的自生长得到的,不依赖于其他类型的复刻或光刻,避免了光刻自身所具有的缺点。(3) In the present invention, the soft lithography stamp is obtained by self-growth of microstructures, does not rely on other types of replication or lithography, and avoids the shortcomings of lithography itself.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1为本发明无外力下贴合曲面物体的软光刻印章的制备方法示意图;FIG1 is a schematic diagram of a method for preparing a soft lithography stamp that can fit a curved surface object without external force according to the present invention;
图2为本发明实施例1所制备软光刻印章宏观示意图;FIG2 is a macroscopic schematic diagram of a soft lithography stamp prepared in Example 1 of the present invention;
图3为本发明实施例1所制备软光刻印章表面微结构三维白光干涉显微图;FIG3 is a three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 1 of the present invention;
图4为本发明实施例1所制备软光刻印章无外力贴附于玻璃制品表面宏观图;FIG4 is a macroscopic image of the soft lithography stamp prepared in Example 1 of the present invention being attached to the surface of a glass product without external force;
图5为本发明实施例1所制备软光刻印章无外力再次贴附于木制品表面宏观图;FIG5 is a macroscopic picture of the soft lithography stamp prepared in Example 1 of the present invention being attached to the surface of a wooden product again without external force;
图6为本发明实施例2所制备软光刻印章固定为特定三维形状并回复宏观图;FIG6 is a macroscopic image of the soft lithography stamp prepared in Example 2 of the present invention being fixed into a specific three-dimensional shape and then restored;
图7为本发明实施例2所制备软光刻印章表面微结构三维白光干涉显微图;FIG7 is a three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 2 of the present invention;
图8为本发明实施例3所制备软光刻印章表面微结构三维白光干涉显微图;FIG8 is a three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 3 of the present invention;
图9为本发明实施例4所制备软光刻印章表面微结构三维白光干涉显微图;FIG9 is a three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 4 of the present invention;
图10为本发明实施例5所制备软光刻印章表面微结构三维白光干涉显微图;FIG10 is a three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 5 of the present invention;
图11为本发明实施例5所制备软光刻印章实现光学透明树脂软光刻的显微结构图。FIG. 11 is a microstructure diagram of the soft lithography stamp prepared in Example 5 of the present invention to realize soft lithography of optically transparent resin.
具体实施方式Detailed ways
下面结合附图和实施例对本发明作进一步详细描述,需要指出的是,以下所述实施例旨在便于对本发明的理解,而对其不起任何限定作用。The present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be pointed out that the embodiments described below are intended to facilitate the understanding of the present invention and do not have any limiting effect on the present invention.
如图1所示,本发明提供的无外力贴合曲面的软光刻印章制备的关键在于所用交联高分子材料网络内同时含有光敏感结构和可金属离子配位结构。由基础原理可知,所制备的交联高分子材料由于含有光敏感结构,在外部光源的刺激下,引起材料内部化学拓扑结构重排,进而影响到材料曝光区域的交联密度与渗透压,导致液体向光照区域迁移产生微结构,得到所需软光刻印章。此外,由于交联高分子材料内可金属离子配位结构的存在,所制备的弹性印章可以在无外力下反复贴合具有不同表面形态的物体,实现软光刻目标。As shown in Figure 1, the key to the preparation of the soft lithography stamp that can fit the curved surface without external force provided by the present invention is that the cross-linked polymer material network used contains both a photosensitive structure and a metal ion coordination structure. From the basic principle, it can be seen that the prepared cross-linked polymer material contains a photosensitive structure, which causes the internal chemical topological structure of the material to be rearranged under the stimulation of an external light source, thereby affecting the cross-linking density and osmotic pressure of the exposed area of the material, causing the liquid to migrate to the illuminated area to produce a microstructure, and obtain the desired soft lithography stamp. In addition, due to the presence of the metal ion coordination structure in the cross-linked polymer material, the prepared elastic stamp can repeatedly fit objects with different surface morphologies without external force, thereby achieving the goal of soft lithography.
实施例1(双硫键体系+羧酸配位)Example 1 (disulfide bond system + carboxylic acid coordination)
首先制备含有双硫键的聚合物交联剂——N,N’-双丙烯酰胱氨酸钠,所采用的原料如表1所示:First, a polymer cross-linking agent containing a disulfide bond, N,N'-bisacryloylcystine sodium, was prepared. The raw materials used are shown in Table 1:
表1制备双硫键交联剂所采用的原料Table 1 Raw materials used in the preparation of disulfide bond crosslinking agents
制备方法:Preparation:
步骤1:将10g氢氧化钠溶于350mL甲醇中,得到碱性甲醇溶液;Step 1: Dissolve 10 g of sodium hydroxide in 350 mL of methanol to obtain an alkaline methanol solution;
步骤2:将13.5g L-胱氨酸溶解在碱性甲醇中,充分搅拌使其溶解;Step 2: Dissolve 13.5 g of L-cystine in alkaline methanol and stir thoroughly to dissolve;
步骤3:在冰水浴中,在上述包含L-胱氨酸的碱性溶液中逐滴滴加丙烯酰氯11mL,滴加时间为20min及以上;Step 3: In an ice water bath, add 11 mL of acryloyl chloride dropwise to the alkaline solution containing L-cystine for 20 min or more;
步骤4:反应持续12小时,离心除去固体副产物,保留透明溶液;Step 4: The reaction was continued for 12 hours, and the solid byproducts were removed by centrifugation, and the transparent solution was retained;
步骤5:将透明溶液在无水乙醚中沉淀,并将得到的固体沉淀物从溶液中离心出来,放入真空烘箱中室温干燥一天即得所需物质——N,N’-双丙烯酰胱氨酸钠。Step 5: Precipitate the transparent solution in anhydrous ether, centrifuge the obtained solid precipitate from the solution, and place it in a vacuum oven and dry it at room temperature for one day to obtain the desired substance - sodium N,N'-bisacryloylcystine.
N,N’-双丙烯酰胱氨酸钠(BISS)分子式如下所示:The molecular formula of N,N'-bisacryloylcystine sodium (BISS) is as follows:
表2实施例1制备交联聚合物的原料Table 2 Raw materials for preparing cross-linked polymers in Example 1
制备方法:Preparation:
步骤1:将2.5g丙烯酰胺和1g BISS溶解于25mL去离子水中;Step 1: Dissolve 2.5 g acrylamide and 1 g BISS in 25 mL deionized water;
步骤2:在溶液中加入500μL质量分数为4%的APS水溶液和50μL TEMED,搅拌均匀,迅速转移至模具中,室温下反应24小时使其完全交联,得到交联高分子材料。Step 2: Add 500 μL of 4% APS aqueous solution and 50 μL of TEMED to the solution, stir evenly, quickly transfer to the mold, and react at room temperature for 24 hours to completely cross-link it to obtain a cross-linked polymer material.
步骤3:取出得到的交联高分子材料,将其浸泡于去离子水中一天,除去未完全反应的物质,随后将其浸泡于1mg/mL 2-羟基-4'-(2-羟乙氧基)-2-甲基苯丙酮(I2959)水溶液中保存备用。Step 3: Take out the obtained cross-linked polymer material, soak it in deionized water for one day to remove the unreacted substances, and then soak it in a 1 mg/mL 2-hydroxy-4'-(2-hydroxyethoxy)-2-methylpropiophenone (I2959) aqueous solution for storage.
步骤4:将交联高分子材料表面覆盖特定透光图案的光学掩模板,并在紫外光下光照2min引起区域化学结构改变,使得材料表面出现微结构,得到软光刻印章。Step 4: Cover the surface of the cross-linked polymer material with an optical mask with a specific light-transmitting pattern and irradiate it under ultraviolet light for 2 minutes to cause regional chemical structure changes, resulting in microstructures on the surface of the material, thereby obtaining a soft lithography stamp.
步骤5:将软印章贴合于目标物品表面,使其变形成匹配的三维形状,并通过浸泡0.01mol/L的氯化铁溶液进行固定,其可无外力贴附于玻璃制品表面,实现软光刻;Step 5: The soft stamp is attached to the surface of the target object, deformed into a matching three-dimensional shape, and fixed by soaking in a 0.01 mol/L ferric chloride solution. It can be attached to the surface of the glass product without external force to achieve soft lithography;
步骤6:将使用后的软印章浸泡于0.01mol/L的柠檬酸钠溶液中24h,可以使软印章恢复到原先的形状,并通过再次的离子固定,其可再次贴附于木制品表面,实现软光刻。Step 6: Soak the used soft stamp in 0.01 mol/L sodium citrate solution for 24 hours to restore the soft stamp to its original shape. Through ion fixation again, it can be attached to the surface of the wood product again to achieve soft lithography.
实施例1所制备的软光刻印章如图2所示,制备该软光刻印章所使用的光学掩模版为网格结构,网格所用线不透光,交叉区域透光,并在紫外光照后自生长出微结构。实施例1所制备的软光刻印章的表面微结构三维白光干涉显微图如图3所示,制备该软光刻印章所使用的光学掩模版为等间距条纹。实施例1所制备的软光刻印章无外力贴附于玻璃制品表面如图4所示,左侧为制备好的软光刻印章,将该印章贴附于玻璃制品表面,并将整体浸泡于氯化铁溶液中24h,可以实现右侧软光刻印章的固定。将图4固定后的软光刻印章浸泡于柠檬酸钠溶液中24h,软光刻印章可回复到初始状态,如图5所示,回复到初始状态的软光刻印章无外力再次贴附于木制品表面,并可再次被固定。The soft lithography stamp prepared in Example 1 is shown in Figure 2. The optical mask used to prepare the soft lithography stamp is a grid structure. The lines used in the grid are opaque, the cross-regions are transparent, and microstructures grow by themselves after ultraviolet light. The three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 1 is shown in Figure 3. The optical mask used to prepare the soft lithography stamp is equidistant stripes. The soft lithography stamp prepared in Example 1 is attached to the surface of the glass product without external force as shown in Figure 4. The left side is the prepared soft lithography stamp. The stamp is attached to the surface of the glass product and the whole is immersed in a ferric chloride solution for 24 hours, which can achieve the fixation of the soft lithography stamp on the right. The fixed soft lithography stamp in Figure 4 is immersed in a sodium citrate solution for 24 hours, and the soft lithography stamp can be restored to the initial state. As shown in Figure 5, the soft lithography stamp restored to the initial state is attached to the surface of the wood product again without external force and can be fixed again.
实施例2(烯丙基硫体系+羧酸配位)Example 2 (allyl sulfide system + carboxylic acid coordination)
本实施例制备了一种含有烯丙基硫结构的交联高分子材料,采用的原料如表3所示:This example prepares a cross-linked polymer material containing an allyl sulfide structure, and the raw materials used are shown in Table 3:
表3实施例2制备交联聚合物的原料Table 3 Raw materials for preparing cross-linked polymers in Example 2
季戊四醇四(3-巯基丙酸酯)(PETMP)分子式如下所示:The molecular formula of pentaerythritol tetrakis (3-mercaptopropionate) (PETMP) is as follows:
乙二醇二巯基丙酸酯(EGDMP)分子式如下所示:The molecular formula of ethylene glycol dimercaptopropionate (EGDMP) is as follows:
2-亚甲基-丙烷-1,3-双(丙烯酸硫代乙酯)(MBTA)分子式如下所示:The molecular formula of 2-methylene-propane-1,3-bis(thioethyl acrylate) (MBTA) is as follows:
制备方法:Preparation:
步骤1:将10g PETMP和30g EGDMP溶于100mL甘油中,并将0.5g I819、1g I651溶解于上述溶液中,加入8.5g MBTA和10g丙烯酸钠,得到均质有机溶液;Step 1: Dissolve 10 g PETMP and 30 g EGDMP in 100 mL glycerol, and dissolve 0.5 g I819 and 1 g I651 in the above solution, add 8.5 g MBTA and 10 g sodium acrylate to obtain a homogeneous organic solution;
步骤2:将5g三乙胺加入到上述均质有机溶液中,并搅拌均匀,置于载玻片模具中,固化24h,得到交联聚合物;Step 2: Add 5 g of triethylamine to the above homogeneous organic solution, stir evenly, place in a glass slide mold, and cure for 24 hours to obtain a cross-linked polymer;
步骤3:将所得交联聚合物在1mg/mL I819的甘油溶液中充分溶胀;Step 3: The obtained cross-linked polymer was fully swollen in a 1 mg/mL glycerol solution of I819;
步骤4:将具有特定透光图案的光学掩模板置于所得交联聚合物表面,并用紫外汞灯光照10分钟,通过内部液体迁移得到具有一定表面微结构的软光刻印章;Step 4: placing an optical mask with a specific light-transmitting pattern on the surface of the obtained cross-linked polymer and irradiating it with an ultraviolet mercury lamp for 10 minutes to obtain a soft lithography stamp with a certain surface microstructure through internal liquid migration;
步骤5:将得到的软光刻印章形变成特定形状并浸泡于硫酸锌甘油溶液中进行固定,其可变形成为三维形状。Step 5: The obtained soft lithography stamp is deformed into a specific shape and immersed in a zinc sulfate glycerol solution for fixation, and it can be deformed into a three-dimensional shape.
其中,实施例2所制备软光刻印章固定为特定三维形状并回复如图6所示,首先将软光刻印章裁剪成长方形条状,并弯折成“6”字形,将其浸泡于硫酸锌甘油溶液中以固定形状,该形状可进一步通过螯合溶液使其回复到初始状态。实施例2所制备软光刻印章表面微结构三维白光干涉显微图如图7所示,制备该软光刻印章所使用的光学掩模版为等间距条纹。。Among them, the soft lithography stamp prepared in Example 2 is fixed to a specific three-dimensional shape and restored as shown in Figure 6. First, the soft lithography stamp is cut into rectangular strips and bent into a "6" shape. It is immersed in a zinc sulfate glycerol solution to fix the shape, and the shape can be further restored to its initial state by a chelating solution. The three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 2 is shown in Figure 7. The optical mask used to prepare the soft lithography stamp is an equidistant stripe. .
实施例3(双硫键体系+三联吡啶配位)Example 3 (Disulfide bond system + terpyridine coordination)
本实施例制备了一种含有三联吡啶配位基团的交联高分子材料,采用的原料如表4所示:This example prepares a cross-linked polymer material containing a terpyridine coordination group, and the raw materials used are shown in Table 4:
表4实施例3制备交联聚合物的原料Table 4 Raw materials for preparing cross-linked polymers in Example 3
制备方法:Preparation:
步骤1:将20gε-己内酯,2g 1,5,7三氮杂双环[4.4.0]癸-5-烯,和20g三联吡啶在120℃、氮气气氛下反应10h,将聚合物容易甲苯中并在冷甲醇中沉淀,将所得产物在室温下真空干燥过夜,得到三联吡啶端基的聚己内酯;Step 1: 20 g of ε-caprolactone, 2 g of 1,5,7-triazabicyclo[4.4.0]dec-5-ene, and 20 g of terpyridine were reacted at 120° C. in a nitrogen atmosphere for 10 h, the polymer was easily dissolved in toluene and precipitated in cold methanol, and the obtained product was vacuum dried at room temperature overnight to obtain polycaprolactone with terpyridine terminal groups;
步骤2:将步骤1得到的三联吡啶端基的聚己内酯20g,丙烯酰氯1.08g,三乙胺1.22g共溶在100mL,在80℃下反应20h,将反应后的混合溶液在冷乙醇中沉淀,将所得固体在室温下真空干燥24h,得到所需含三联吡啶基团的可聚合单体TPyA,反应方程式如下;Step 2: Dissolve 20 g of the terpyridine-terminated polycaprolactone obtained in step 1, 1.08 g of acryloyl chloride, and 1.22 g of triethylamine in 100 mL, and react at 80° C. for 20 h. Precipitate the mixed solution after the reaction in cold ethanol, and dry the obtained solid under vacuum at room temperature for 24 h to obtain the desired polymerizable monomer TPyA containing a terpyridine group. The reaction equation is as follows;
步骤3:将0.5g TPyA,10.0g异丙基丙烯酰胺,0.1g BISAC溶解在10g DMF中,随后加入0.1g BPO,在80℃下反应10h。Step 3: 0.5 g TPyA, 10.0 g isopropylacrylamide, and 0.1 g BISAC were dissolved in 10 g DMF, followed by the addition of 0.1 g BPO and the reaction was carried out at 80 °C for 10 h.
N,N’-双丙烯酰胱氨(BISAC)分子式如下所示:The molecular formula of N,N'-bisacryloylcystine (BISAC) is as follows:
步骤4:将所得交联聚合物在含1mg/mL I819的DMF中充分溶胀;Step 4: The obtained cross-linked polymer was fully swollen in DMF containing 1 mg/mL I819;
步骤5:将具有一定透光图案的掩模板置于聚合物上,紫外光照1min,得到软光刻模板。Step 5: Place a mask with a certain light-transmitting pattern on the polymer and irradiate it with ultraviolet light for 1 minute to obtain a soft lithography template.
实施例3所制备软光刻印章表面微结构三维白光干涉显微图如图8所示,制备该软光刻印章所使用的光学掩模版为不透光圆形。The three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 3 is shown in FIG8 . The optical mask used to prepare the soft lithography stamp is an opaque circular shape.
实施例4(邻硝基苯体系+羧酸配位)Example 4 (o-nitrobenzene system + carboxylic acid coordination)
本实施例制备了一种含有邻硝基苯光敏结构的交联高分子材料,采用的原料如表5所示:This example prepares a cross-linked polymer material containing an o-nitrobenzene photosensitive structure, and the raw materials used are shown in Table 5:
表5实施例4制备交联聚合物的原料Table 5 Raw materials for preparing cross-linked polymers in Example 4
制备方法:Preparation:
步骤1:将15g邻硝基苄醇,10g丙烯酸钠溶解在150mL二氯甲烷中,加入14.4mL三乙胺,反应溶液变澄清并冷却至10℃;Step 1: Dissolve 15 g of o-nitrobenzyl alcohol and 10 g of sodium acrylate in 150 mL of dichloromethane, add 14.4 mL of triethylamine, the reaction solution becomes clear and is cooled to 10°C;
步骤2:将8.5mL丙烯酰氯逐滴加入到步骤1所得澄清溶液中,反应在室温下搅拌24h,过滤固体副产物后,分别用去离子水和盐水洗涤上述清夜,并用无水硫酸镁吸收多余的水分,过滤得到清液,通过挥干溶剂,得到最终的浅黄色产物(NA),分子式如下;Step 2: 8.5 mL of acryloyl chloride was added dropwise to the clear solution obtained in step 1, and the reaction was stirred at room temperature for 24 h. After filtering the solid byproducts, the clear solution was washed with deionized water and brine respectively, and the excess water was absorbed with anhydrous magnesium sulfate. The clear solution was filtered to obtain a final light yellow product (NA) by evaporating the solvent. The molecular formula is as follows;
步骤3:将1g NA,5g N,N-二甲基丙烯酰胺,100mg二甲基丙烯酸乙二醇酯,100mgI819和1.6mg光吸收剂胭脂红充分混合并在可见光下固化5分钟,随后将获得的固体聚合物在二甲亚砜中溶胀24h以除去未反应的组分,同时溶胀交联聚合物。Step 3: 1 g NA, 5 g N,N-dimethylacrylamide, 100 mg ethylene glycol dimethacrylate, 100 mg I819 and 1.6 mg light absorber carmine were mixed thoroughly and cured under visible light for 5 min, and then the obtained solid polymer was swollen in dimethyl sulfoxide for 24 h to remove unreacted components and swell the cross-linked polymer.
步骤4:将交联聚合物置于具有一定图案的光掩膜下,紫外光照30min,由于曝光区域渗透压升高,导致周围液体迁移到该区域,最终得到软光刻印章。Step 4: Place the cross-linked polymer under a photomask with a certain pattern and irradiate with ultraviolet light for 30 minutes. Due to the increase in osmotic pressure in the exposed area, the surrounding liquid migrates to this area, and finally a soft lithography stamp is obtained.
实施例4所制备软光刻印章表面微结构三维白光干涉显微图如图9所示,制备该软光刻印章所使用的光学掩模版为“S-S”。The three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 4 is shown in FIG9 . The optical mask used to prepare the soft lithography stamp is “S-S”.
实施例5(双硫键体系+巯基配位)Example 5 (Disulfide bond system + thiol coordination)
本实施例制备含有巯基配位结构的交联高分子材料,其所用原料如表6所示:This example prepares a cross-linked polymer material containing a thiol coordination structure, and the raw materials used are shown in Table 6:
表6实施例5制备交联聚合物的原料Table 6 Raw materials for preparing cross-linked polymers in Example 5
制备方法:Preparation:
步骤1:将25g HEA,2.5g丙烯酸巯基乙基酯,0.25g BISAC,0.25g AIBN加入到烧杯中搅拌均匀;Step 1: Add 25 g HEA, 2.5 g mercaptoethyl acrylate, 0.25 g BISAC, and 0.25 g AIBN into a beaker and stir well;
步骤2:将混合液倒入模具中,在70℃下,聚合5h;Step 2: Pour the mixed solution into a mold and polymerize at 70°C for 5 hours;
步骤3:脱模得到交联聚合物,并将其浸泡于含有2mg/mL I819的液体石蜡内48h;Step 3: demoulding to obtain the cross-linked polymer, and immersing it in liquid paraffin containing 2 mg/mL I819 for 48 h;
步骤4:将具有一定图案的光掩模板置于溶胀后交联聚合物表面,紫外光照60min,得到具有微结构的软光刻模板。Step 4: Place a photomask with a certain pattern on the surface of the swollen cross-linked polymer and irradiate with ultraviolet light for 60 minutes to obtain a soft photolithography template with a microstructure.
步骤5:在所得软光刻印章表面涂覆光学透明树脂前驱液(配方:16g丙烯酸异冰片酯,8g 2-苯氧基乙基丙烯酸酯,0.5g 1,6-己二醇二丙烯酸酯,0.75g 2,4,6-三甲基苯甲酰基-二苯基氧磷),紫外光照2分钟,通过剥离,即可得到表面具有特定微结构的光学透明树脂,能够实现微透镜阵列的制造。Step 5: Coat the surface of the obtained soft lithography stamp with an optically transparent resin precursor solution (formula: 16 g of isobornyl acrylate, 8 g of 2-phenoxyethyl acrylate, 0.5 g of 1,6-hexanediol diacrylate, and 0.75 g of 2,4,6-trimethylbenzoyl-diphenylphosphine), irradiate with ultraviolet light for 2 minutes, and peel off to obtain an optically transparent resin with a specific microstructure on the surface, which can realize the manufacture of a microlens array.
实施例5所制备软光刻印章表面微结构三维白光干涉显微图如图10所示,该软光刻模板通过两次条纹叠加制得,说明本发明所使用的材料可以被叠加使用。实施例5所制备软光刻印章实现光学透明树脂软光刻的显微结构如图11所示,左侧为通过光学掩模板自生长出的具有六边形蜂巢结构的软光刻印章,右侧为通过在该印章上浇铸光学树脂并固化、剥离后得到的软光刻材料。The three-dimensional white light interference micrograph of the surface microstructure of the soft lithography stamp prepared in Example 5 is shown in FIG10 . The soft lithography template is prepared by superimposing two stripes, indicating that the materials used in the present invention can be superimposed and used. The microstructure of the soft lithography stamp prepared in Example 5 for optically transparent resin soft lithography is shown in FIG11 . The left side is a soft lithography stamp with a hexagonal honeycomb structure grown by self-growth through an optical mask, and the right side is a soft lithography material obtained by casting an optical resin on the stamp, curing it, and peeling it off.
Claims (11)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202311221877.9A CN117341370B (en) | 2023-09-21 | 2023-09-21 | Preparation method of soft photolithography stamp capable of fitting curved surface object without external force, product and application thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202311221877.9A CN117341370B (en) | 2023-09-21 | 2023-09-21 | Preparation method of soft photolithography stamp capable of fitting curved surface object without external force, product and application thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
CN117341370A CN117341370A (en) | 2024-01-05 |
CN117341370B true CN117341370B (en) | 2024-04-05 |
Family
ID=89368170
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202311221877.9A Active CN117341370B (en) | 2023-09-21 | 2023-09-21 | Preparation method of soft photolithography stamp capable of fitting curved surface object without external force, product and application thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN117341370B (en) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1397432A (en) * | 2002-08-28 | 2003-02-19 | 中国科学院长春应用化学研究所 | Thermal moulding method for making pattern on high-molecular film |
CN1405008A (en) * | 2001-09-19 | 2003-03-26 | 东南大学 | Polyurethane molecular seal and its making method |
CN1520618A (en) * | 2001-05-23 | 2004-08-11 | Laser parrering of devices | |
CN1702527A (en) * | 2005-07-15 | 2005-11-30 | 清华大学 | Method for preparing oriented layer for LCD through soft lithography |
CN1775380A (en) * | 2005-11-18 | 2006-05-24 | 清华大学 | Formation method of superhydrophobic surface of solid material |
CN1862379A (en) * | 2006-04-18 | 2006-11-15 | 清华大学 | Method for making polymer self-supporting nano-micron-line |
WO2013003412A2 (en) * | 2011-06-30 | 2013-01-03 | 3M Innovative Properties Company | Method for making,inking, and mounting stamps for micro-contact printing |
-
2023
- 2023-09-21 CN CN202311221877.9A patent/CN117341370B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1520618A (en) * | 2001-05-23 | 2004-08-11 | Laser parrering of devices | |
CN1405008A (en) * | 2001-09-19 | 2003-03-26 | 东南大学 | Polyurethane molecular seal and its making method |
CN1397432A (en) * | 2002-08-28 | 2003-02-19 | 中国科学院长春应用化学研究所 | Thermal moulding method for making pattern on high-molecular film |
CN1702527A (en) * | 2005-07-15 | 2005-11-30 | 清华大学 | Method for preparing oriented layer for LCD through soft lithography |
CN1775380A (en) * | 2005-11-18 | 2006-05-24 | 清华大学 | Formation method of superhydrophobic surface of solid material |
CN1862379A (en) * | 2006-04-18 | 2006-11-15 | 清华大学 | Method for making polymer self-supporting nano-micron-line |
WO2013003412A2 (en) * | 2011-06-30 | 2013-01-03 | 3M Innovative Properties Company | Method for making,inking, and mounting stamps for micro-contact printing |
Also Published As
Publication number | Publication date |
---|---|
CN117341370A (en) | 2024-01-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Jung et al. | Designing with light: advanced 2D, 3D, and 4D materials | |
del Barrio et al. | Light to shape the future: from photolithography to 4D printing | |
Blasco et al. | Photochemically driven polymeric network formation: synthesis and applications | |
CN100514185C (en) | Method for making polymer self-supporting nano-micron-line | |
JPH0751061B2 (en) | Manufacturing method of cell array control tool | |
CN112835268B (en) | Bio-based water-soluble negative photoresist and application thereof in femtosecond laser direct writing processing method | |
EP0196324A4 (en) | Post-treatment of cured, radiation sensitive polymerizable resins. | |
CN108047104A (en) | A kind of preparation of polymerizable disulfide for reducing volume contraction and purposes | |
CN103087087A (en) | Sulfhydryl multifunctional group-containing polyhedral oligomeric silsesquioxane compound and composition thereof, and imprinted soft template | |
CN101560061A (en) | Method for preparing patterned polymer brush | |
CN117341370B (en) | Preparation method of soft photolithography stamp capable of fitting curved surface object without external force, product and application thereof | |
CN101957559A (en) | Optical reversible nanoimprint photoresist as well as preparation method and application method thereof | |
CN101157520A (en) | Construction Method of Composite Graphics Simultaneously Having Micron and Nanostructures | |
JP2609073B2 (en) | Cell arrangement control tool and cell arrangement control method | |
JP2022516879A (en) | Liquid photopolymer resin composition for flexographic printing | |
CN111538212A (en) | Method for forming a pattern on a substrate and its application | |
CN105884949A (en) | Photoresist composition with branched photosensitive polystyrene-maleic anhydride as matrix resin | |
JP5571968B2 (en) | Curable composition and cured product thereof | |
JP4244327B2 (en) | Surface graft material and graft pattern forming method using the same | |
CN100347237C (en) | Method for preparing ultraviolet photocureable material for soft printing | |
JP2002293816A (en) | Polymerizable composition | |
CN106054523A (en) | Double response type degradable photoresist as well as preparation method and use method therefor | |
JP2018009086A (en) | Polymer, photosensitive resin composition and method for producing cell culture substrate | |
Sariogullari et al. | Fabrication of a Patterned Scaffold Using Soft Lithography Technique to be Used in Cell Growth Applications | |
CN104744648B (en) | Method for preparing double-stimulation responsive surface through secondary photopolymerization |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |