CN114325357A - DEBUG system, method, device and medium - Google Patents
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Abstract
本申请公开了一种DEBUG系统,包括主控制器和采集器。主控制器与JTAG仿真器连接,主控制器接受JTAG仿真器的访问并对访问信息进行译码,以获取待观测信号所在的IP。主控制器通过JTAG协议与各采集器连接,进行信息的交互。各采集器与芯片内的待观测信号连接,获取待观测信号的数据。主控制器根据待观测信号所在的IP控制对应的目标采集器获取待观测信号的数据。采用本技术方案,待观测信号直连到本系统的采集器,主控制器通过仿真器的访问直接控制采集器获取待观测信号的数据,无需获取其他信号的数据,在对待观测信号进行观测时,减少了资源和时间的浪费。本申请还公开了DEBUG方法、装置以及介质,与上述系统相对应,效果同上。
The present application discloses a DEBUG system, including a main controller and a collector. The main controller is connected with the JTAG emulator, and the main controller accepts the access of the JTAG emulator and decodes the access information to obtain the IP where the signal to be observed is located. The main controller is connected with each collector through the JTAG protocol to exchange information. Each collector is connected to the signal to be observed in the chip, and acquires the data of the signal to be observed. The main controller controls the corresponding target collector to acquire the data of the signal to be observed according to the IP of the signal to be observed. With this technical solution, the signal to be observed is directly connected to the collector of the system, and the main controller directly controls the collector to obtain the data of the signal to be observed through the access of the simulator, without acquiring the data of other signals. , reducing the waste of resources and time. The present application also discloses a DEBUG method, a device and a medium, which correspond to the above system and have the same effects as above.
Description
技术领域technical field
本申请涉及故障排除技术领域,特别是涉及一种DEBUG系统、方法、装置以及介质。The present application relates to the technical field of troubleshooting, and in particular, to a DEBUG system, method, device and medium.
背景技术Background technique
边界扫描测试技术是非常常用的一种用于排除故障(DEBUG)的技术,用于解决印刷电路板块上的芯片的引脚过多而带来的测试困难,也用于芯片之间的连接测试问题和整个系统的测试。边界扫描测试技术是通过在芯片内部逻辑的边界和外部引脚之间增加条扫描链和测试访问端口,测试激励信息,串行传送的测试方法。Boundary scan test technology is a very commonly used technology for troubleshooting (DEBUG), which is used to solve the test difficulties caused by too many pins of chips on a printed circuit board, and is also used for connection testing between chips. problems and testing of the entire system. Boundary scan test technology is a test method of serial transmission by adding a scan chain and a test access port between the boundary of the internal logic of the chip and the external pins, test excitation information, and serial transmission.
但是该方法对芯片信号的观测只能为逐级观测,想要对待观测信号进行观测需要先对前置的信号进行观测,造成了观测资源和时间的浪费。However, this method can only observe the chip signal in a step-by-step manner. To observe the signal to be observed, it is necessary to observe the preceding signal first, resulting in a waste of observation resources and time.
由此可见,如何在对待观测信号进行观测时,减少资源和时间的浪费是本领域技术人员亟待解决的问题。It can be seen that how to reduce the waste of resources and time when observing the signal to be observed is an urgent problem to be solved by those skilled in the art.
发明内容SUMMARY OF THE INVENTION
本申请的目的是提供一种DEBUG系统、方法、装置以及介质,用于在对待观测信号进行观测时,减少资源和时间的浪费。The purpose of this application is to provide a DEBUG system, method, device and medium for reducing the waste of resources and time when observing the signal to be observed.
为解决上述技术问题,本申请提供一种DEBUG系统,包括:In order to solve the above-mentioned technical problems, the application provides a DEBUG system, including:
主控制器1和采集器2;
所述主控制器1与JTAG仿真器3连接,接收所述JTAG仿真器3的访问并进行译码以获取待观测信号所在的IP;The
所述主控制器1通过联合测试工作组(Joint Test Action Group,JTAG)协议与各所述采集器2连接;The
各所述采集器2与芯片内的所述待观测信号连接;Each of the
所述主控制器1根据所述待观测信号所在的IP控制对应的目标采集器获取所述待观测信号的数据。The
为解决上述技术问题,本申请还提供一种DEBUG方法,应用于上述的DEBUG系统,包括:In order to solve the above-mentioned technical problem, the application also provides a kind of DEBUG method, is applied to above-mentioned DEBUG system, comprises:
获取JTAG仿真器发送的待观测信号所在的IP;Obtain the IP of the signal to be observed sent by the JTAG emulator;
根据所述待观测信号所在的IP选择对应的目标采集器;Select the corresponding target collector according to the IP where the signal to be observed is located;
控制所述目标采集器锁存所述待观测信号的数据。The target collector is controlled to latch the data of the signal to be observed.
优选的,在所述控制所述目标采集器锁存所述待观测信号的数据的步骤之前,还包括:Preferably, before the step of controlling the target collector to latch the data of the signal to be observed, the method further includes:
获取所述待观测信号的观测模式,所述观测模式包括直接观测模式和条件观测模式;acquiring an observation mode of the to-be-observed signal, where the observation mode includes a direct observation mode and a conditional observation mode;
进一步的,所述控制所述目标采集器锁存待观测信号的数据包括:根据所述观测模式控制所述目标采集器锁存所述待观测信号的数据。Further, the controlling the target collector to latch the data of the signal to be observed includes: controlling the target collector to latch the data of the signal to be observed according to the observation mode.
优选的,若所述观测模式为直接观测模式,则所述根据所述观测模式控制所述目标采集器锁存所述待观测信号的数据包括:Preferably, if the observation mode is a direct observation mode, the controlling the target collector to latch the data of the to-be-observed signal according to the observation mode includes:
控制所述目标采集器锁存当前时刻的所述待观测信号的数据。The target collector is controlled to latch the data of the signal to be observed at the current moment.
优选的,若所述观测模式为条件观测模式,则所述根据所述观测模式控制所述目标采集器锁存待观测信号的数据包括:Preferably, if the observation mode is a conditional observation mode, the controlling the target collector to latch the data of the signal to be observed according to the observation mode includes:
获取所述待观测信号的各寄存器的地址以及对应的目标数据;Acquire the addresses of each register of the signal to be observed and the corresponding target data;
在所述待观测信号的各寄存器的地址对应的实时数据满足所述目标数据的情况下,控制所述目标采集器锁存满足所述目标数据的实时数据和对应的寄存器的地址。When the real-time data corresponding to the addresses of the registers of the signal to be observed satisfies the target data, the target collector is controlled to latch the real-time data satisfying the target data and the addresses of the corresponding registers.
优选的,还包括:Preferably, it also includes:
查询所述目标采集器的各寄存器的状态是否均为空,若否,则关闭所述采集器。Query whether the state of each register of the target collector is empty, if not, close the collector.
优选的,还包括:Preferably, it also includes:
获取所述目标采集器锁存所述待观测信号的数据时刻的时间信息。Obtain the time information of the data moment at which the target collector latches the signal to be observed.
优选的,还包括:Preferably, it also includes:
获取所述JTAG仿真器发送的观测链信息,所述观测链信息包括观测链上各所述待观测信号所在的IP;Obtain the observation chain information sent by the JTAG emulator, where the observation chain information includes the IP where each of the to-be-observed signals on the observation chain is located;
根据所述观测链信息,控制观测链上全部所述目标采集器锁存对应的所述待观测信号的数据。According to the observation chain information, all the target collectors on the observation chain are controlled to latch the corresponding data of the to-be-observed signal.
为解决上述技术问题,本申请还提供一种DEBUG装置,包括存储器,用于存储计算机程序;In order to solve the above-mentioned technical problems, the application also provides a DEBUG device, comprising a memory for storing a computer program;
处理器,用于执行所述计算机程序时实现如上述的DEBUG方法的步骤。The processor is configured to implement the steps of the above DEBUG method when executing the computer program.
为解决上述技术问题,本申请还提供一种计算机可读存储介质,所述计算机可读存储介质上存储有计算机程序,所述计算机程序被处理器执行时实现如上述的DEBUG方法的步骤。To solve the above technical problem, the present application also provides a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and the computer program implements the steps of the DEBUG method described above when executed by a processor.
本申请所提供的DEBUG系统,包括主控制器和采集器。其中,主控制器与JTAG仿真器连接,当JTAG仿真器发出访问时,主控制器接受访问并对访问信息进行译码,以获取到待观测信号所在的IP。主控制器通过JTAG协议与各采集器连接,进行信息的交互。各采集器与芯片内的待观测信号连接,用于获取待观测信号的数据。主控制器可以根据待观测信号所在的IP控制对应的目标采集器获取待观测信号的数据。相对于当前技术中,芯片的信号需要逐级观测。采用本技术方案,芯片中的待观测信号直连到DEBUG系统的采集器,主控制器通过JTAG仿真器的访问直接控制采集器获取待观测信号的数据,无需获取其他信号的数据,在对待观测信号进行观测时,减少了资源和时间的浪费。The DEBUG system provided in this application includes a main controller and a collector. The main controller is connected with the JTAG emulator, and when the JTAG emulator sends out access, the main controller accepts the access and decodes the access information, so as to obtain the IP where the signal to be observed is located. The main controller is connected with each collector through the JTAG protocol to exchange information. Each collector is connected to the signal to be observed in the chip, and is used to acquire the data of the signal to be observed. The main controller can control the corresponding target collector to acquire the data of the signal to be observed according to the IP where the signal to be observed is located. Compared with the current technology, the signal of the chip needs to be observed step by step. With this technical solution, the signal to be observed in the chip is directly connected to the collector of the DEBUG system, and the main controller directly controls the collector to obtain the data of the signal to be observed through the access of the JTAG emulator, without the need to obtain the data of other signals. When the signal is observed, the waste of resources and time is reduced.
此外,本申请所提供的DEBUG方法、装置以及介质与上述的DEBUG系统相对应,效果同上。In addition, the DEBUG method, device and medium provided in this application correspond to the above DEBUG system, and the effects are the same as above.
附图说明Description of drawings
为了更清楚地说明本申请实施例,下面将对实施例中所需要使用的附图做简单的介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to describe the embodiments of the present application more clearly, the following will briefly introduce the drawings that are used in the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application, which are not relevant to ordinary skills in the art. As far as personnel are concerned, other drawings can also be obtained from these drawings on the premise of no creative work.
图1为本申请实施例提供的一种DEBUG系统的结构图;Fig. 1 is the structural diagram of a kind of DEBUG system that the embodiment of this application provides;
图2为本申请实施例提供的一种主控制器的结构图;2 is a structural diagram of a main controller provided by an embodiment of the present application;
图3为本申请实施例提供的一种采集器的结构图;FIG. 3 is a structural diagram of a collector provided by an embodiment of the present application;
图4为本申请实施例提供的一种DEBUG方法的流程图;Fig. 4 is the flow chart of a kind of DEBUG method that the embodiment of this application provides;
图5为本申请实施例提供的一种DEBUG装置的结构图;5 is a structural diagram of a DEBUG device provided in an embodiment of the present application;
附图标记如下:1为主控制器,2为采集器,3为JTAG仿真器,4为TAP控制器,5为多路选择器,6为信号采集控制器,7为译码器,8为信号锁存器。Reference numerals are as follows: 1 is the main controller, 2 is the collector, 3 is the JTAG emulator, 4 is the TAP controller, 5 is the multiplexer, 6 is the signal acquisition controller, 7 is the decoder, and 8 is the signal latch.
具体实施方式Detailed ways
下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本申请一部分实施例,而不是全部实施例。基于本申请中的实施例,本领域普通技术人员在没有做出创造性劳动前提下,所获得的所有其他实施例,都属于本申请保护范围。The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application without creative work fall within the protection scope of the present application.
边界扫描测试技术是非常常用的一种用于DEBUG的技术,用于解决印刷电路板块上的芯片的引脚过多而带来的测试困难,也用于芯片之间的连接测试问题和整个系统的测试。边界扫描测试技术是通过在芯片内部逻辑的边界和外部引脚之间增加条扫描链和测试访问端口,测试激励信息,串行传送的测试方法。Boundary scan test technology is a very commonly used technology for DEBUG. It is used to solve the test difficulty caused by too many pins of the chip on the printed circuit board, and it is also used for the connection test problem between chips and the whole system. 's test. Boundary scan test technology is a test method of serial transmission by adding a scan chain and a test access port between the boundary of the internal logic of the chip and the external pins, test excitation information, and serial transmission.
但是该方法对芯片信号的观测只能为逐级观测,想要对待观测信号进行观测需要先对前置的信号进行观测,造成了观测资源和时间的浪费。However, this method can only observe the chip signal in a step-by-step manner. To observe the signal to be observed, it is necessary to observe the preceding signal first, resulting in a waste of observation resources and time.
本申请的核心是提供一种DEBUG系统、方法、装置以及介质,用于在对待观测信号进行观测时,减少资源和时间的浪费。The core of the present application is to provide a DEBUG system, method, device and medium for reducing the waste of resources and time when observing the signal to be observed.
为了使本技术领域的人员更好地理解本申请方案,下面结合附图和具体实施方式对本申请作进一步的详细说明。In order to make those skilled in the art better understand the solution of the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.
图1为本申请实施例提供的一种DEBUG系统的结构图,如图1所示,该系统包括:Fig. 1 is a structural diagram of a DEBUG system provided by an embodiment of the present application. As shown in Fig. 1, the system includes:
主控制器1和采集器2;
主控制器1与JTAG仿真器3连接,接收JTAG仿真器3的访问并进行译码以获取待观测信号所在的IP;主控制器1通过JTAG协议与各采集器2连接;各采集器2与芯片内的待观测信号连接;主控制器1根据待观测信号所在的IP控制对应的目标采集器获取待观测信号的数据。The
IP:Intellectual Property的缩写,意为:影响力资产。是一种知识产权,在本实施例中,可以将其理解为芯片的一个模块。每个IP在设计时就规定了一些重要的信号统一连到IP顶层,这些信号即为待观测信号。待观测信号可以是独立的信号或者IP内部寄存器的数据。IP: Abbreviation for Intellectual Property, which means: Influence Assets. It is a kind of intellectual property, and in this embodiment, it can be understood as a module of the chip. When each IP is designed, some important signals are uniformly connected to the top layer of the IP, and these signals are the signals to be observed. The signal to be observed can be an independent signal or the data of the IP internal register.
在本申请实施例中,主控制器1通过JTAG管脚与JTAG仿真器3连接,接收JTAG仿真器3的访问并进行译码以获取到待观测信号所在的IP,并通过IP控制对应的采集器2工作,以获取待观测信号的数据。In the embodiment of the present application, the
图2为本申请实施例提供的一种主控制器的结构图,如图2所示,主控制器1包括TAP控制器4和多路选择器5。其中,TAP控制器4包含JTAG协议状态机以及部分控制逻辑,实现对从JTAG仿真器3的JTAG管脚进来的JTAG协议进行初步解析,选择控制某个采集器2,又或是选择将某一条JTAG链路挂接在JTAG协议的TDI和TDO接口之间,来完成对芯片内部的访问,将选择的信息发送至多路选择器5以实施。多路选择器5根据TAP控制器4的输出解析输出信息,选中某条JTAG链路,将TDI输出给选中的JTAG链,并且将该JTAG链路的输出TDO信号返回给TAP控制器4,实现主控制器1和采集器2的信息交互。FIG. 2 is a structural diagram of a main controller according to an embodiment of the present application. As shown in FIG. 2 , the
图3为本申请实施例提供的一种采集器的结构图,如图3所示,采集器2包括信号采集控制器6、译码器7以及信号锁存器8。其中,信号采集控制器6用于对主控制器1或者其他采集器2传输的JTAG协议进行解析,转化为内部的寄存器读写协议,即将串行的TDI转换为并行的读或写,将读数据转化为串行的TDO输出。同时,信号采集控制器6提供了自定义的控制寄存器组,自定义的控制寄存器组主要实现以下功能:控制采集器2的使能开关;选择寄存器的锁存方式。其中,选择寄存器的锁存方式主要由如下寄存器实现:FIG. 3 is a structural diagram of a collector provided by an embodiment of the present application. As shown in FIG. 3 , the
模式选择寄存器:提供直接锁存模式以及条件锁存两种模式。当配置为直接锁存模式时,在配置信号锁存器8使能后,采集器2将直接锁存当前选中的待观测信号的锁存器值。配置为条件锁存模式的时候,在配置信号锁存器8使能后,将会一直监测配置选中的待观测信号的锁存器,直到其达到配置的目标值后,将IP中的全部待观测信号的锁存器值锁存。Mode selection register: Provides direct latch mode and conditional latch mode. When the configuration is in direct latch mode, after the
锁存寄存器:配置该寄存器后,控制采集器2锁存当前的待观测信号的锁存器值,不再发生实时变动。Latch register: After configuring this register, control the
锁存条件寄存器:锁存的条件包含地址及数据两个条件,当配置的地址所对应的采集器2的信号值达到配置的数据值的时刻进行锁存。Latch condition register: The latch condition includes two conditions of address and data. When the signal value of the
锁存状态寄存器:用来反馈当前选中的信号锁存器8的锁存状态。Latch state register: used to feed back the latch state of the currently selected
采集器2中的译码器7能够根据信号采集控制器6转化的寄存器读写协议的地址,选择对应的偏移地址寄存器,以用于采集待观测信号内具体的某个数据。The
采集器2中的信号锁存器8对接待观测信号,并接收信号采集控制器6的控制信息。在收到锁存信号时实现对待观测信号的锁存,锁存后的信号值不再发生实时变化。The
本申请实施例提供的DEBUG系统,包括主控制器和采集器。其中,主控制器与JTAG仿真器连接,当JTAG仿真器发出访问时,主控制器接受访问并对访问信息进行译码,以获取到待观测信号所在的IP。主控制器通过JTAG协议与各采集器连接,进行信息的交互。各采集器与芯片内的待观测信号连接,用于获取待观测信号的数据。主控制器可以根据待观测信号所在的IP控制对应的目标采集器获取待观测信号的数据。相对于当前技术中,芯片的信号需要逐级观测。采用本技术方案,芯片中的待观测信号直连到DEBUG系统的采集器,主控制器通过JTAG仿真器的访问直接控制采集器获取待观测信号的数据,无需获取其他信号的数据,在对待观测信号进行观测时,减少了资源和时间的浪费。The DEBUG system provided by the embodiments of the present application includes a main controller and a collector. The main controller is connected with the JTAG emulator, and when the JTAG emulator sends out access, the main controller accepts the access and decodes the access information, so as to obtain the IP where the signal to be observed is located. The main controller is connected with each collector through the JTAG protocol to exchange information. Each collector is connected to the signal to be observed in the chip, and is used to acquire the data of the signal to be observed. The main controller can control the corresponding target collector to acquire the data of the signal to be observed according to the IP where the signal to be observed is located. Compared with the current technology, the signal of the chip needs to be observed step by step. With this technical solution, the signal to be observed in the chip is directly connected to the collector of the DEBUG system, and the main controller directly controls the collector to obtain the data of the signal to be observed through the access of the JTAG emulator, without the need to obtain the data of other signals. When the signal is observed, the waste of resources and time is reduced.
在上述实施例中,对于DEBUG系统进行了详细的描述,本申请实施例还提供一种DEBUG方法,应用于上述的DEBUG系统。图4为本申请实施例提供的一种DEBUG方法的流程图,如图4所示,该方法包括:In the above-mentioned embodiments, the DEBUG system is described in detail, and the embodiments of the present application further provide a DEBUG method, which is applied to the above-mentioned DEBUG system. FIG. 4 is a flowchart of a DEBUG method provided by an embodiment of the present application. As shown in FIG. 4 , the method includes:
S10:获取JTAG仿真器3发送的待观测信号所在的IP。S10: Obtain the IP where the signal to be observed sent by the
JTAG仿真器3也称为JTAG调试器,是通过ARM芯片的JTAG边界扫描口进行调试的设备。在步骤S10中,用户通过设置JTAG仿真器3,选择需要观测的芯片的待观测信号,主控制器1通过JTAG管脚获取到JTAG仿真器3发送的信息并解析以得到待观测信号所在的IP。该待观测信号可以是一个,也可以是多个。
S11:根据待观测信号所在的IP选择对应的目标采集器。S11: Select a corresponding target collector according to the IP where the signal to be observed is located.
在具体实施中,每个待观测信号都有对应的采集器2。一条JTAG链上往往有多个采集器2,若多个待观测信号位于同一条JTAG链上,则可以根据JTAG链选择该链上的全部采集器2。In a specific implementation, each signal to be observed has a
S12:控制目标采集器锁存待观测信号的数据。S12: Control the target collector to latch the data of the signal to be observed.
在步骤S12中,主控制器1控制目标采集器锁存待观测信号的数据。锁存的时间可以是目标采集接收到主控制器1的控制信号时立刻锁存,也可以是待观测信号的寄存器的值达到了预先设定的阈值时进行锁存。In step S12, the
本申请实施例提供的DEBUG方法,应用于上述的DEBUG系统。主控制器与JTAG仿真器连接,当JTAG仿真器发出访问时,主控制器获取访问并对访问信息进行译码,以获取到待观测信号所在的IP。主控制器通过JTAG协议与各采集器连接,进行信息的交互。各采集器与芯片内的待观测信号连接,用于获取待观测信号的数据。主控制器可以根据待观测信号所在的IP控制对应的目标采集器获取待观测信号的数据。相对于当前技术中,芯片的信号需要逐级观测。采用本技术方案,芯片中的待观测信号直连到DEBUG系统的采集器,主控制器通过JTAG仿真器的访问直接控制采集器获取待观测信号的数据,无需获取其他信号的数据,在对待观测信号进行观测时,减少了资源和时间的浪费。The DEBUG method provided in the embodiment of the present application is applied to the above DEBUG system. The main controller is connected with the JTAG emulator. When the JTAG emulator sends out access, the main controller obtains the access and decodes the access information, so as to obtain the IP where the signal to be observed is located. The main controller is connected with each collector through the JTAG protocol to exchange information. Each collector is connected to the signal to be observed in the chip, and is used to acquire the data of the signal to be observed. The main controller can control the corresponding target collector to acquire the data of the signal to be observed according to the IP where the signal to be observed is located. Compared with the current technology, the signal of the chip needs to be observed step by step. With this technical solution, the signal to be observed in the chip is directly connected to the collector of the DEBUG system, and the main controller directly controls the collector to obtain the data of the signal to be observed through the access of the JTAG emulator, without the need to obtain the data of other signals. When the signal is observed, the waste of resources and time is reduced.
在具体实施中,对于待观测信号的锁存,对于一些较为简单的DEBUG场景,只需要观测某几个信号的状态即可。而对于复杂度较高的DEBUG场景,技术人员则需要获取特定条件下的某些信号的状态。In a specific implementation, for the latching of the signal to be observed, for some relatively simple DEBUG scenarios, it is only necessary to observe the states of certain signals. For DEBUG scenarios with high complexity, technicians need to obtain the status of certain signals under specific conditions.
因此,在上述实施例的基础上,在本实施例中,在控制目标采集器锁存待观测信号的数据的步骤之前,还包括:Therefore, on the basis of the above embodiment, in this embodiment, before the step of controlling the target collector to latch the data of the signal to be observed, the method further includes:
获取待观测信号的观测模式,观测模式包括直接观测模式和条件观测模式;Obtain the observation mode of the signal to be observed, the observation mode includes direct observation mode and conditional observation mode;
进一步的,控制目标采集器锁存待观测信号的数据包括:根据观测模式控制目标采集器锁存待观测信号的数据。Further, controlling the target collector to latch the data of the signal to be observed includes: controlling the target collector to latch the data of the signal to be observed according to the observation mode.
在本实施例中,观测模式包括直接观测模式和条件观测模式。需要说明的是,当观测模式为直接观测模式时,采集器2锁存当前时刻的待观测信号的数据。当观测模式为条件观测模式时,采集器2会一直监测待观测信号的数据,当待观测信号的数据达到预设值时进行锁存。可以理解的是,待观测信号中有不同的寄存器,当观测模式为条件观测模式时,采集器2会根据待观测信号中各寄存器的地址对各寄存器进行监测,待观测信号中的各寄存器有各自对应的目标数据,当寄存器的数据达到目标数据时,即锁存条件,采集器2会对此刻IP中的全部待观测信号的锁存器值进行锁存,以此使技术人员获取到特定情况下的待观测信号的数据。In this embodiment, the observation mode includes a direct observation mode and a conditional observation mode. It should be noted that when the observation mode is the direct observation mode, the
本申请实施例提供的DEBUG方法,对待观测信号的观测分为直接观测模式和条件观测模式。在直接观测模式时,可以实时的、动态的观测待观测信号。在条件观测模式时,可以获取特殊的、静态的场景下的待观测信号的数据,能更有效更直接地帮助验证人员获取想要获得的芯片内部状态信息。采用本技术方案,技术人员可以根据需求选择不同的观测模式,增加了观测的灵活性。In the DEBUG method provided in the embodiment of the present application, the observation of the signal to be observed is divided into a direct observation mode and a conditional observation mode. In the direct observation mode, the signal to be observed can be observed dynamically in real time. In the conditional observation mode, the data of the signal to be observed in a special and static scene can be obtained, which can more effectively and directly help the verifier to obtain the desired internal state information of the chip. With this technical solution, technicians can choose different observation modes according to their needs, which increases the flexibility of observation.
在上述实施例的基础上,在本实施例中,若观测模式为直接观测模式,则根据观测模式控制目标采集器锁存待观测信号的数据包括:On the basis of the above embodiment, in this embodiment, if the observation mode is the direct observation mode, controlling the target collector to latch the data of the signal to be observed according to the observation mode includes:
控制目标采集器锁存当前时刻的待观测信号的数据。Control the target collector to latch the data of the signal to be observed at the current moment.
本申请实施例提供的DEBUG方法,在观测模式为直接观测模式的情况下,目标采集器锁存当前时刻的待观测信号的各个寄存器的数据,有利于实时的、动态的观测待观测信号。In the DEBUG method provided by the embodiments of the present application, when the observation mode is the direct observation mode, the target collector latches the data of each register of the signal to be observed at the current moment, which is conducive to real-time and dynamic observation of the signal to be observed.
在上述实施例的基础上,在本实施例中,若观测模式为条件观测模式,则根据观测模式控制目标采集器锁存待观测信号的数据包括:On the basis of the above embodiment, in this embodiment, if the observation mode is the conditional observation mode, controlling the target collector to latch the data of the signal to be observed according to the observation mode includes:
获取待观测信号的各寄存器的地址以及对应的目标数据;Obtain the address of each register of the signal to be observed and the corresponding target data;
在待观测信号的各寄存器的地址对应的实时数据满足目标数据的情况下,控制目标采集器的寄存器锁存满足目标数据的实时数据和对应的寄存器的地址。In the case that the real-time data corresponding to the addresses of each register of the signal to be observed satisfies the target data, the registers of the target collector are controlled to latch the real-time data satisfying the target data and the address of the corresponding register.
在本实施例中,当设置待观测信号的各寄存器的地址以及对应的目标数据后,采集器2对各寄存器进行监测。当各寄存器对应的实时数据达到目标数据时,采集器2进行锁存。具体的,采集器2当中的译码器7根据信号采集控制器6转化的寄存器读写协议的地址,选择对应的偏移地址,用寄存器读写协议的地址加上偏移地址即可得出待观测信号的寄存器的地址,以用于采集待观测信号内具体的某个数据。可以理解的是,采集器2在待观测信号中的寄存器中的实时数据达到目标数据时进行锁存,而如果没有达到目标数据,采集器2则继续监测,等待其达到目标数据后进行锁存。In this embodiment, after setting the address of each register of the signal to be observed and the corresponding target data, the
本申请实施例提供的DEBUG方法,在观测模式为条件观测模式的情况下,获取特殊的、静态的场景下的待观测信号的数据,能更有效更直接地帮助验证人员获取想要获得的芯片内部状态信息。The DEBUG method provided in the embodiment of the present application, when the observation mode is the conditional observation mode, acquires the data of the signal to be observed in a special and static scene, which can more effectively and directly help the verifier to obtain the desired chip Internal status information.
在具体实施中,当采集器2内的各寄存器获取到待观测信号的数据后,采集器2便不再使用,但是采集器2仍处于使能状态,造成了资源的浪费。In a specific implementation, after each register in the
在上述实施例的基础上,在本实施例中,还包括:On the basis of the above embodiment, in this embodiment, it also includes:
查询目标采集器的各寄存器的状态是否均为空,若否,则关闭采集器2。Check whether the status of each register of the target collector is empty, if not, turn off
本申请实施例提供的DEBUG方法,查询目标采集器的各寄存器的状态是否均为空,若否,则说明采集器已获取到待观测信号的数据,因此,关闭采集器,减少了资源的浪费。The DEBUG method provided in the embodiment of the present application queries whether the status of each register of the target collector is empty. If not, it means that the collector has acquired the data of the signal to be observed. Therefore, the collector is turned off to reduce the waste of resources. .
TCK作为JTAG的测试时钟输入引脚,可以为JTAG系统加入时间信息。在上述实施例的基础上,在本实施例中,还包括:As the test clock input pin of JTAG, TCK can add time information to the JTAG system. On the basis of the above embodiment, in this embodiment, it also includes:
获取目标采集器锁存待观测信号的数据时刻的时间信息。Obtain the time information of the data moment when the target collector latches the signal to be observed.
本申请实施例提供的DEBUG方法,主控制器获取到时间信息,给每次目标采集器锁存待观测信号的数据添加时间戳,从而可以判断出待观测信号的变化趋势。In the DEBUG method provided by the embodiment of the present application, the main controller acquires time information, and adds a timestamp to the data of the signal to be observed each time the target collector latches, so that the change trend of the signal to be observed can be judged.
需要说明的是,采集器2位于JTAG链上,JTAG链接于主控制器1的TDI和TDO中。一条JTAG链上可能存在很多采集器2,在具体实施中,若想对一条JTAG链上的待观测信号进行观测,则还包括:It should be noted that the
获取JTAG仿真器3发送的观测链信息,观测链信息包括观测链上各待观测信号所在的IP;根据观测链信息,控制观测链上全部采集器2锁存对应的待观测信号的数据。Obtain the observation chain information sent by the
本申请实施例提供的DEBUG方法,根据观测链信息控制一条JTAG链上的全部采集器工作,获取该JTAG链上的全部待观测信号的数据,实现大规模的待观测信号的监测。The DEBUG method provided by the embodiment of the present application controls the operation of all collectors on a JTAG chain according to the observation chain information, acquires data of all the signals to be observed on the JTAG chain, and realizes large-scale monitoring of the signals to be observed.
在上述实施例中,对于DEBUG方法进行了详细描述,本申请还提供DEBUG装置对应的实施例。In the above embodiments, the DEBUG method is described in detail, and the present application also provides the corresponding embodiments of the DEBUG device.
由于装置部分的实施例与方法部分的实施例相互对应,因此装置部分的实施例请参见方法部分的实施例的描述,这里暂不赘述。Since the embodiment of the apparatus part corresponds to the embodiment of the method part, for the embodiment of the apparatus part, please refer to the description of the embodiment of the method part, which will not be repeated here.
图5为本申请实施例提供的一种DEBUG装置的结构图,如图5所示,该装置包括:存储器20,用于存储计算机程序;FIG. 5 is a structural diagram of a DEBUG device provided by an embodiment of the application. As shown in FIG. 5 , the device includes: a memory 20 for storing a computer program;
处理器21,用于执行计算机程序时实现如上述实施例DEBUG方法的步骤。The processor 21 is configured to implement the steps of the DEBUG method in the above-mentioned embodiment when executing the computer program.
本实施例提供的DEBUG装置可以包括但不限于智能手机、平板电脑、笔记本电脑或台式电脑等。The DEBUG device provided in this embodiment may include, but is not limited to, a smart phone, a tablet computer, a notebook computer, or a desktop computer.
其中,处理器21可以包括一个或多个处理核心,比如4核心处理器、8核心处理器等。处理器21可以采用数字信号处理(Digital Signal Processing,DSP)、现场可编程门阵列(Field-Programmable Gate Array,FPGA)、可编程逻辑阵列(Programmable LogicArray,PLA)中的至少一种硬件形式来实现。处理器21也可以包括主处理器和协处理器,主处理器是用于对在唤醒状态下的数据进行处理的处理器,也称中央处理器(CentralProcessing Unit,CPU);协处理器是用于对在待机状态下的数据进行处理的低功耗处理器。在一些实施例中,处理器21可以集成有图像处理器(Graphics Processing Unit,GPU),GPU用于负责显示屏所需要显示的内容的渲染和绘制。一些实施例中,处理器21还可以包括人工智能(Artificial Intelligence,AI)处理器,该AI处理器用于处理有关机器学习的计算操作。The processor 21 may include one or more processing cores, such as a 4-core processor, an 8-core processor, and the like. The processor 21 may be implemented in at least one hardware form among digital signal processing (Digital Signal Processing, DSP), field-programmable gate array (Field-Programmable Gate Array, FPGA), and programmable logic array (Programmable Logic Array, PLA). . The processor 21 may also include a main processor and a coprocessor. The main processor is a processor used to process data in the wake-up state, also called a central processing unit (CPU); A low-power processor for processing data in a standby state. In some embodiments, the processor 21 may be integrated with a graphics processor (Graphics Processing Unit, GPU), and the GPU is responsible for rendering and drawing the content that needs to be displayed on the display screen. In some embodiments, the processor 21 may further include an artificial intelligence (Artificial Intelligence, AI) processor for processing computing operations related to machine learning.
存储器20可以包括一个或多个计算机可读存储介质,该计算机可读存储介质可以是非暂态的。存储器20还可包括高速随机存取存储器,以及非易失性存储器,比如一个或多个磁盘存储设备、闪存存储设备。本实施例中,存储器20至少用于存储以下计算机程序201,其中,该计算机程序被处理器21加载并执行之后,能够实现前述任一实施例公开的DEBUG方法的相关步骤。另外,存储器20所存储的资源还可以包括操作系统202和数据203等,存储方式可以是短暂存储或者永久存储。其中,操作系统202可以包括Windows、Unix、Linux等。数据203可以包括但不限于待观测信号所在的IP、待观测信号的数据、时间信息等。Memory 20 may include one or more computer-readable storage media, which may be non-transitory. Memory 20 may also include high-speed random access memory, as well as non-volatile memory, such as one or more magnetic disk storage devices, flash storage devices. In this embodiment, the memory 20 is at least used to store the following computer program 201, where, after the computer program is loaded and executed by the processor 21, the relevant steps of the DEBUG method disclosed in any of the foregoing embodiments can be implemented. In addition, the resources stored in the memory 20 may also include an operating system 202, data 203, etc., and the storage mode may be short-term storage or permanent storage. The operating system 202 may include Windows, Unix, Linux, and the like. The data 203 may include, but is not limited to, the IP where the signal to be observed is located, the data of the signal to be observed, time information, and the like.
在一些实施例中,DEBUG装置还可包括有显示屏22、输入输出接口23、通信接口24、电源25以及通信总线26。In some embodiments, the DEBUG device may further include a display screen 22 , an input/output interface 23 , a communication interface 24 , a power supply 25 and a communication bus 26 .
本领域技术人员可以理解,图5中示出的结构并不构成对DEBUG装置的限定,可以包括比图示更多或更少的组件。Those skilled in the art can understand that the structure shown in FIG. 5 does not constitute a limitation on the DEBUG device, and may include more or less components than those shown.
本申请实施例提供的DEBUG装置,包括存储器和处理器,处理器在执行存储器存储的程序时,能够实现如下方法:获取JTAG仿真器发送的待观测信号所在的IP;根据待观测信号所在的IP选择对应的目标采集器;控制目标采集器锁存待观测信号的数据。The DEBUG device provided by the embodiment of the present application includes a memory and a processor, and when the processor executes a program stored in the memory, the processor can implement the following method: obtain the IP where the signal to be observed and sent by the JTAG emulator are located; according to the IP where the signal to be observed is located Select the corresponding target collector; control the target collector to latch the data of the signal to be observed.
本申请实施例提供的DEBUG装置,当JTAG仿真器发出访问时,主控制器接受访问并对访问信息进行译码,以获取到待观测信号所在的IP。主控制器通过JTAG协议与各采集器连接,进行信息的交互。各采集器与芯片内的待观测信号连接,用于获取待观测信号的数据。主控制器可以根据待观测信号所在的IP控制对应的目标采集器获取待观测信号的数据。相对于当前技术中,芯片的信号需要逐级观测。采用本技术方案,芯片中的待观测信号直连到DEBUG系统的采集器,主控制器通过JTAG仿真器的访问直接控制采集器获取待观测信号的数据,无需获取其他信号的数据,在对待观测信号进行观测时,减少了资源和时间的浪费。In the DEBUG device provided by the embodiment of the present application, when the JTAG emulator issues an access, the main controller accepts the access and decodes the access information, so as to obtain the IP where the signal to be observed is located. The main controller is connected with each collector through the JTAG protocol to exchange information. Each collector is connected to the signal to be observed in the chip, and is used to acquire the data of the signal to be observed. The main controller can control the corresponding target collector to acquire the data of the signal to be observed according to the IP where the signal to be observed is located. Compared with the current technology, the signal of the chip needs to be observed step by step. With this technical solution, the signal to be observed in the chip is directly connected to the collector of the DEBUG system, and the main controller directly controls the collector to obtain the data of the signal to be observed through the access of the JTAG emulator, without the need to obtain the data of other signals. When the signal is observed, the waste of resources and time is reduced.
最后,本申请还提供一种计算机可读存储介质对应的实施例。计算机可读存储介质上存储有计算机程序,计算机程序被处理器执行时实现如上述方法实施例中记载的步骤。Finally, the present application also provides an embodiment corresponding to a computer-readable storage medium. A computer program is stored on the computer-readable storage medium, and when the computer program is executed by the processor, the steps described in the foregoing method embodiments are implemented.
可以理解的是,如果上述实施例中的方法以软件功能单元的形式实现并作为独立的产品销售或使用时,可以存储在一个计算机可读取存储介质中。基于这样的理解,本申请的技术方案本质上或者说对现有技术做出贡献的部分或者该技术方案的全部或部分可以以软件产品的形式体现出来,该计算机软件产品存储在一个存储介质中,执行本申请各个实施例所述方法的全部或部分步骤。而前述的存储介质包括:U盘、移动硬盘、只读存储器(Read-Only Memory,ROM)、随机存取存储器(Random Access Memory,RAM)、磁碟或者光盘等各种可以存储程序代码的介质。It can be understood that, if the methods in the above embodiments are implemented in the form of software functional units and sold or used as independent products, they may be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the present application can be embodied in the form of software products in essence, or the parts that contribute to the prior art, or all or part of the technical solutions, and the computer software products are stored in a storage medium , execute all or part of the steps of the methods described in the various embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), magnetic disk or optical disk and other media that can store program codes .
本申请实施例提供的计算机可读存储介质,当JTAG仿真器发出访问时,主控制器接受访问并对访问信息进行译码,以获取到待观测信号所在的IP。主控制器通过JTAG协议与各采集器连接,进行信息的交互。各采集器与芯片内的待观测信号连接,用于获取待观测信号的数据。主控制器可以根据待观测信号所在的IP控制对应的目标采集器获取待观测信号的数据。相对于当前技术中,芯片的信号需要逐级观测。采用本技术方案,芯片中的待观测信号直连到DEBUG系统的采集器,主控制器通过JTAG仿真器的访问直接控制采集器获取待观测信号的数据,无需获取其他信号的数据,在对待观测信号进行观测时,减少了资源和时间的浪费。In the computer-readable storage medium provided by the embodiment of the present application, when the JTAG emulator issues an access, the main controller accepts the access and decodes the access information, so as to obtain the IP where the signal to be observed is located. The main controller is connected with each collector through the JTAG protocol to exchange information. Each collector is connected to the signal to be observed in the chip, and is used to acquire the data of the signal to be observed. The main controller can control the corresponding target collector to acquire the data of the signal to be observed according to the IP where the signal to be observed is located. Compared with the current technology, the signal of the chip needs to be observed step by step. With this technical solution, the signal to be observed in the chip is directly connected to the collector of the DEBUG system, and the main controller directly controls the collector to obtain the data of the signal to be observed through the access of the JTAG emulator, without the need to obtain the data of other signals. When the signal is observed, the waste of resources and time is reduced.
以上对本申请所提供的一种DEBUG系统、方法、装置以及介质进行了详细介绍。说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其他实施例的不同之处,各个实施例之间相同相似部分互相参见即可。对于实施例公开的装置而言,由于其与实施例公开的方法相对应,所以描述的比较简单,相关之处参见方法部分说明即可。应当指出,对于本技术领域的普通技术人员来说,在不脱离本申请原理的前提下,还可以对本申请进行若干改进和修饰,这些改进和修饰也落入本申请权利要求的保护范围内。The DEBUG system, method, device and medium provided by the present application have been described in detail above. The various embodiments in the specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same and similar parts between the various embodiments can be referred to each other. As for the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant part can be referred to the description of the method. It should be pointed out that for those of ordinary skill in the art, without departing from the principles of the present application, several improvements and modifications can also be made to the present application, and these improvements and modifications also fall within the protection scope of the claims of the present application.
还需要说明的是,在本说明书中,诸如第一和第二等之类的关系术语仅仅用来将一个实体或者操作与另一个实体或操作区分开来,而不一定要求或者暗示这些实体或操作之间存在任何这种实际的关系或者顺序。而且,术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含,从而使得包括一系列要素的过程、方法、物品或者设备不仅包括那些要素,而且还包括没有明确列出的其他要素,或者是还包括为这种过程、方法、物品或者设备所固有的要素。在没有更多限制的情况下,由语句“包括一个……”限定的要素,并不排除在包括所述要素的过程、方法、物品或者设备中还存在另外的相同要素。It should also be noted that, in this specification, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply these entities or operations. There is no such actual relationship or sequence between operations. Moreover, the terms "comprising", "comprising" or any other variation thereof are intended to encompass non-exclusive inclusion such that a process, method, article or device comprising a list of elements includes not only those elements, but also includes not explicitly listed or other elements inherent to such a process, method, article or apparatus. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in a process, method, article or apparatus that includes the element.
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