CN113101985B - Detection chip and detection system - Google Patents
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Abstract
一种检测芯片和检测系统,该检测芯片包括样品注入结构、样品检测结构和样品过滤结构。样品注入结构用于注入被检测样品,样品检测结构用于使得所述被检测样品可以被检测,样品过滤结构在所述样品注入结构和所述样品检测结构之间且分别与所述样品注入结构和所述样品检测结构连通,以将注入的所述被检测样品以侧向层析的方式过滤且将过滤后的所述被检测样品传输至所述样品检测结构。该检测芯片可以通过样品过滤结构使被检测样品更纯净,从而使检测结果更精确,且有利于实现检测芯片的薄型化。
A detection chip and a detection system include a sample injection structure, a sample detection structure and a sample filter structure. The sample injection structure is used to inject the sample to be tested, the sample detection structure is used to make the tested sample can be detected, and the sample filter structure is between the sample injection structure and the sample detection structure and is respectively connected with the sample injection structure communicated with the sample detection structure, so as to filter the injected sample to be tested by lateral chromatography and transmit the filtered sample to be tested to the sample detection structure. The detection chip can make the detected sample purer through the sample filtering structure, so that the detection result is more accurate, and it is beneficial to realize the thinning of the detection chip.
Description
技术领域technical field
本公开的实施例涉及一种检测芯片和检测系统。Embodiments of the present disclosure relate to a detection chip and a detection system.
背景技术Background technique
微流控芯片技术把生物、化学和医学等领域中所涉及的样品制备、反应、分离、检测等基本操作单元集成到一块具有微米尺度微通道的芯片上,自动完成反应和分析的全过程。该过程所使用的芯片叫做微流控芯片,也可称为芯片实验室(Lab-on-a-chip)。微流控芯片技术具有样本用量少,分析速度快,便于制成便携式仪器,适用于即时、现场分析等优点,已广泛应用于生物、化学和医学等诸多领域。Microfluidic chip technology integrates basic operation units such as sample preparation, reaction, separation, detection, etc. involved in the fields of biology, chemistry, and medicine into a chip with micron-scale microchannels, and automatically completes the entire process of reaction and analysis. The chip used in this process is called a microfluidic chip, also known as a Lab-on-a-chip. Microfluidic chip technology has the advantages of less sample consumption, fast analysis speed, easy to make into a portable instrument, suitable for instant and on-site analysis, etc., and has been widely used in many fields such as biology, chemistry and medicine.
发明内容SUMMARY OF THE INVENTION
本公开至少一实施例提供一种检测芯片,该检测芯片包括样品注入结构、样品检测结构和样品过滤结构。样品注入结构用于注入被检测样品,样品检测结构用于使得所述被检测样品可以被检测,样品过滤结构在所述样品注入结构和所述样品检测结构之间且分别与所述样品注入结构和所述样品检测结构连通,以将注入的所述被检测样品以侧向层析的方式过滤且将过滤后的所述被检测样品传输至所述样品检测结构。At least one embodiment of the present disclosure provides a detection chip, which includes a sample injection structure, a sample detection structure, and a sample filter structure. The sample injection structure is used for injecting the sample to be detected, the sample detection structure is used to make the detected sample can be detected, and the sample filtering structure is between the sample injection structure and the sample detection structure and is respectively connected with the sample injection structure communicated with the sample detection structure, so as to filter the injected sample to be tested by lateral chromatography and transmit the filtered sample to be tested to the sample detection structure.
例如,本公开至少一实施例提供的检测芯片中,所述样品过滤结构包括过滤层,所述过滤层配置为在第一侧接收来自所述样品注入结构的所述被检测样品,在沿所述过滤层所在平面内过滤所述被检测样品,在与所述第一侧相对的第二侧输出过滤后的所述被检测样品。For example, in the detection chip provided in at least one embodiment of the present disclosure, the sample filtering structure includes a filtering layer, and the filtering layer is configured to receive the detected sample from the sample injection structure on the first side, and the sample filtering structure is configured to receive the detected sample from the sample injection structure on the first side. The tested sample is filtered in the plane where the filter layer is located, and the filtered tested sample is output on a second side opposite to the first side.
例如,本公开至少一实施例提供的检测芯片中,所述样品注入结构和所述样品过滤结构通过第一通道连接,所述样品过滤结构和所述样品检测结构通过第二通道连接。For example, in the detection chip provided by at least one embodiment of the present disclosure, the sample injection structure and the sample filter structure are connected through a first channel, and the sample filter structure and the sample detection structure are connected through a second channel.
例如,本公开至少一实施例提供的检测芯片中,在所述过滤层的所述第一侧,所述第一通道与所述过滤层在垂直于所述过滤层所在平面的方向上至少部分重叠相接,以将来自所述样品注入结构的所述被检测样品注入所述过滤层以进行过滤。For example, in the detection chip provided by at least one embodiment of the present disclosure, on the first side of the filter layer, the first channel and the filter layer are at least partially in a direction perpendicular to the plane where the filter layer is located. overlapping to inject the tested sample from the sample injection structure into the filter layer for filtration.
例如,本公开至少一实施例提供的检测芯片中,在所述过滤层的所述第二侧,所述第二通道与所述过滤层在垂直于所述过滤层所在平面的方向上至少部分重叠相接,以接收过滤后的所述被检测样品。For example, in the detection chip provided by at least one embodiment of the present disclosure, on the second side of the filter layer, the second channel and the filter layer are at least partially in a direction perpendicular to the plane where the filter layer is located. overlapping to receive the tested sample after filtering.
例如,本公开至少一实施例提供的检测芯片中,在垂直于所述过滤层所在平面的方向上,所述第一通道和所述第二通道分别连接于所述过滤层的不同层表面或相同层表面。For example, in the detection chip provided by at least one embodiment of the present disclosure, in a direction perpendicular to the plane where the filter layer is located, the first channel and the second channel are respectively connected to different layer surfaces or surfaces of the filter layer. same layer surface.
例如,本公开至少一实施例提供的检测芯片中,所述样品过滤结构还包括容纳所述过滤层的过滤腔,所述过滤腔包括第一开口和第二开口,所述第一开口用于输入所述被检测样品,所述第二开口用于输出被过滤的所述被检测样品,其中,所述第二开口连接所述第二通道的第一端,所述样品检测结构连接所述第二通道的第二端。For example, in the detection chip provided in at least one embodiment of the present disclosure, the sample filtering structure further includes a filter cavity for accommodating the filter layer, the filter cavity includes a first opening and a second opening, and the first opening is used for The detected sample is input, and the second opening is used for outputting the filtered detected sample, wherein the second opening is connected to the first end of the second channel, and the sample detection structure is connected to the the second end of the second channel.
例如,本公开至少一实施例提供的检测芯片还包括第一基板和粘结层,其中,所述过滤腔设置在所述第一基板上,且所述粘结层贴附在所述第一基板的表面上且将所述过滤层固定在所述过滤腔中。For example, the detection chip provided by at least one embodiment of the present disclosure further includes a first substrate and an adhesive layer, wherein the filter cavity is provided on the first substrate, and the adhesive layer is attached to the first substrate on the surface of the substrate and fix the filter layer in the filter cavity.
例如,本公开至少一实施例提供的检测芯片中,所述第一通道和所述第二通道设置在所述第一基板中。For example, in the detection chip provided by at least one embodiment of the present disclosure, the first channel and the second channel are provided in the first substrate.
例如,本公开至少一实施例提供的检测芯片中,所述样品注入结构以及所述样品检测结构设置在所述第一基板上。For example, in the detection chip provided by at least one embodiment of the present disclosure, the sample injection structure and the sample detection structure are disposed on the first substrate.
例如,本公开至少一实施例提供的检测芯片还包括第二基板,其中,所述第二基板与所述第一基板层叠,且通过所述粘结层结合,所述粘结层限定所述过滤腔的所述第一开口和所述第二开口,所述第一通道和所述第二通道形成在所述第二基板中,且分别与所述第一开口和所述第二开口连通。For example, the detection chip provided by at least one embodiment of the present disclosure further includes a second substrate, wherein the second substrate is laminated with the first substrate and combined by the adhesive layer, the adhesive layer defines the the first opening and the second opening of the filter cavity, the first channel and the second channel are formed in the second substrate and communicate with the first opening and the second opening, respectively .
例如,本公开至少一实施例提供的检测芯片中,所述样品注入结构以及样品检测结构设置在所述第二基板上。For example, in the detection chip provided by at least one embodiment of the present disclosure, the sample injection structure and the sample detection structure are disposed on the second substrate.
例如,本公开至少一实施例提供的检测芯片中,所述样品检测结构包括多个检测单元以及多个第一检测流道,至少一个所述检测单元通过对应的第一检测流道连通于所述样品过滤结构。For example, in the detection chip provided by at least one embodiment of the present disclosure, the sample detection structure includes a plurality of detection units and a plurality of first detection flow channels, and at least one of the detection units is communicated with all the first detection flow channels through a corresponding first detection flow channel. The sample filter structure is described.
例如,本公开至少一实施例提供的检测芯片中,所述第一检测流道的宽度为0.1mm-1mm,深度为0.1mm-1mm。For example, in the detection chip provided by at least one embodiment of the present disclosure, the width of the first detection flow channel is 0.1 mm-1 mm, and the depth is 0.1 mm-1 mm.
例如,本公开至少一实施例提供的检测芯片中,所述第一检测流道的至少部分弯曲延伸。For example, in the detection chip provided by at least one embodiment of the present disclosure, at least part of the first detection flow channel extends in a curved manner.
例如,本公开至少一实施例提供的检测芯片中,所述第一检测流道的所述弯折延伸的至少部分呈折线形或者S形。For example, in the detection chip provided by at least one embodiment of the present disclosure, at least a portion of the bent extension of the first detection flow channel is in the shape of a broken line or an S shape.
例如,本公开至少一实施例提供的检测芯片中,所述第一检测流道的所述弯折延伸的至少部分包括2-20个弯折,相邻的两个所述弯折之间的流道长度为2mm-20mm。For example, in the detection chip provided by at least one embodiment of the present disclosure, at least a portion of the bending extension of the first detection flow channel includes 2-20 bends, and between two adjacent bends The length of the runner is 2mm-20mm.
例如,本公开至少一实施例提供的检测芯片中,当所述第一检测流道的所述弯折延伸的至少部分呈折线形时,所述弯折的弯折角度为5°-120°。For example, in the detection chip provided by at least one embodiment of the present disclosure, when at least a part of the bending extension of the first detection flow channel is in the shape of a folded line, the bending angle of the bending is 5°-120° .
例如,本公开至少一实施例提供的检测芯片中,所述检测单元包括容纳所述被检测样品的检测腔,所述检测腔具有排气孔以及覆盖所述排气孔的透气阻液膜。For example, in the detection chip provided in at least one embodiment of the present disclosure, the detection unit includes a detection chamber for accommodating the sample to be detected, and the detection chamber has an exhaust hole and a gas-permeable liquid-resistance film covering the exhaust hole.
例如,本公开至少一实施例提供的检测芯片中,所述样品注入结构包括采样结构安装部,用于接纳采样结构。For example, in the detection chip provided by at least one embodiment of the present disclosure, the sample injection structure includes a sampling structure mounting portion for receiving the sampling structure.
例如,本公开至少一实施例提供的检测芯片中,所述样品注入结构还包括试剂池,当所述采样结构安装于所述采样结构安装部后,所述采样结构可与所述试剂池连通,并且所述试剂池还配置为可与所述样品过滤结构连通。For example, in the detection chip provided in at least one embodiment of the present disclosure, the sample injection structure further includes a reagent pool, and after the sampling structure is installed in the sampling structure mounting portion, the sampling structure can communicate with the reagent pool , and the reagent pool is also configured to communicate with the sample filter structure.
例如,本公开至少一实施例提供的检测芯片中,所述样品注入结构还包括位于所述试剂池的第一侧的第一密封层,所述第一密封层用于在所述第一侧密封所述试剂池,当所述采样结构安装于所述采样结构安装部后,所述采样结构可戳破所述第一密封层以与所述试剂池连通。For example, in the detection chip provided by at least one embodiment of the present disclosure, the sample injection structure further includes a first sealing layer located on the first side of the reagent cell, and the first sealing layer is used for the first sealing layer on the first side The reagent pool is sealed, and after the sampling structure is installed on the sampling structure mounting portion, the sampling structure can pierce the first sealing layer to communicate with the reagent pool.
例如,本公开至少一实施例提供的检测芯片中,所述样品注入结构还包括位于所述试剂池的第二侧的第二密封层,所述第二密封层用于在所述第二侧密封所述试剂池,且所述试剂池的第一侧与所述试剂池的第二侧彼此正对,当所述第二密封层被戳破后,所述试剂池与所述样品过滤结构连通。For example, in the detection chip provided in at least one embodiment of the present disclosure, the sample injection structure further includes a second sealing layer located on the second side of the reagent cell, and the second sealing layer is used for the second side. The reagent pool is sealed, and the first side of the reagent pool and the second side of the reagent pool face each other, when the second sealing layer is punctured, the reagent pool and the sample filter structure Connected.
例如,本公开至少一实施例提供的检测芯片中,所述样品注入结构还包括位于所述试剂池的第二侧的弹性膜和作用通道,所述第二密封层夹置在所述弹性膜和所述试剂池之间,所述作用通道允许当外力作用在所述弹性膜上使所述弹性膜变形时,能够使外力还作用在所述第二密封层上以戳破所述第二密封层。For example, in the detection chip provided by at least one embodiment of the present disclosure, the sample injection structure further includes an elastic membrane and an action channel located on the second side of the reagent cell, and the second sealing layer is sandwiched between the elastic membrane and the reagent cell, the acting channel allows when an external force acts on the elastic membrane to deform the elastic membrane, the external force can also act on the second sealing layer to pierce the second seal Floor.
例如,本公开至少一实施例提供的检测芯片中,所述弹性膜的材料为复合高分子材料。For example, in the detection chip provided by at least one embodiment of the present disclosure, the material of the elastic film is a composite polymer material.
例如,本公开至少一实施例提供的检测芯片中,还包括第一基板和粘结层,其中,所述采样结构安装部和所述试剂池设置在所述第一基板上,所述粘结层贴附在所述第一基板的表面上且将所述弹性膜固定在所述第一基板上。For example, the detection chip provided in at least one embodiment of the present disclosure further includes a first substrate and an adhesive layer, wherein the sampling structure mounting portion and the reagent cell are disposed on the first substrate, and the adhesive layer A layer is attached to the surface of the first substrate and secures the elastic membrane to the first substrate.
例如,本公开至少一实施例提供的检测芯片中,所述粘结层至少部分露出所述第二密封层,以允许变形的所述弹性膜能够作用在所述第二密封层上以戳破所述第二密封层。For example, in the detection chip provided by at least one embodiment of the present disclosure, the adhesive layer at least partially exposes the second sealing layer, so that the deformed elastic film can act on the second sealing layer to puncture the second sealing layer.
例如,本公开至少一实施例提供的检测芯片还包括第二基板,其中,所述第二基板与所述第一基板层叠,且通过所述粘结层结合,所述第二基板包括基板开口以提供所述作用通道。For example, the detection chip provided by at least one embodiment of the present disclosure further includes a second substrate, wherein the second substrate is laminated with the first substrate and bonded by the adhesive layer, and the second substrate includes a substrate opening to provide the action channel.
例如,本公开至少一实施例提供的检测芯片还包括设置在所述样品注入结构与所述样品过滤结构之间的样品混合腔室。For example, the detection chip provided by at least one embodiment of the present disclosure further includes a sample mixing chamber disposed between the sample injection structure and the sample filter structure.
本公开至少一实施例提供一种检测系统,该检测系统上述任一所述的检测芯片、采样结构和封装结构,其中,所述检测芯片包括采样结构安装部,所述采样结构安装于所述采样结构安装部,所述封装结构用于密封所述采样结构。At least one embodiment of the present disclosure provides a detection system. The detection system includes the detection chip, the sampling structure, and the packaging structure described above, wherein the detection chip includes a sampling structure mounting portion, and the sampling structure is mounted on the sampling structure. A sampling structure mounting part, the packaging structure is used for sealing the sampling structure.
例如,本公开至少一实施例提供的检测系统中,所述封装结构为硅胶帽。For example, in the detection system provided by at least one embodiment of the present disclosure, the packaging structure is a silicone cap.
例如,本公开至少一实施例提供的检测系统中,所述封装结构包括密封部和固定部,所述密封部用于密封所述采样结构,所述固定部用于将所述采样结构固定于所述检测芯片上。For example, in the detection system provided by at least one embodiment of the present disclosure, the packaging structure includes a sealing part and a fixing part, the sealing part is used for sealing the sampling structure, and the fixing part is used for fixing the sampling structure on the on the detection chip.
例如,本公开至少一实施例提供的检测系统还包括可移动的第一顶杆,所述第一顶杆设置在所述封装结构的远离所述采样结构的一侧。For example, the detection system provided by at least one embodiment of the present disclosure further includes a movable first push rod, and the first push rod is disposed on a side of the packaging structure away from the sampling structure.
例如,本公开至少一实施例提供的检测系统中,所述检测芯片还包括试剂池和第二密封层,所述检测系统还包括可移动的第二顶杆,所述第二顶杆用于戳破所述第二密封层。For example, in the detection system provided by at least one embodiment of the present disclosure, the detection chip further includes a reagent pool and a second sealing layer, the detection system further includes a movable second ejector rod, and the second ejector rod is used for The second sealing layer is punctured.
附图说明Description of drawings
为了更清楚地说明本公开实施例的技术方案,下面将对实施例的附图作简单地介绍,显而易见地,下面描述中的附图仅仅涉及本公开的一些实施例,而非对本公开的限制。In order to explain the technical solutions of the embodiments of the present disclosure more clearly, the accompanying drawings of the embodiments will be briefly introduced below. Obviously, the drawings in the following description only relate to some embodiments of the present disclosure, rather than limit the present disclosure. .
图1为本公开至少一实施例提供的检测系统的立体结构透视图;1 is a perspective view of a three-dimensional structure of a detection system provided by at least one embodiment of the present disclosure;
图2为本公开至少一实施例提供的检测芯片的上基板的立体结构透视图;2 is a perspective structural perspective view of an upper substrate of a detection chip provided by at least one embodiment of the present disclosure;
图3为本公开至少一实施例提供的检测芯片的下基板的立体结构图;3 is a perspective structural view of a lower substrate of a detection chip provided by at least one embodiment of the present disclosure;
图4为本公开至少一实施例提供的检测系统的俯视爆炸图;4 is an exploded top view of a detection system provided by at least one embodiment of the present disclosure;
图5为本公开至少一实施例提供的检测系统的仰视爆炸图;5 is a bottom exploded view of a detection system provided by at least one embodiment of the present disclosure;
图6为本公开至少一实施例提供的检测芯片中样品检测结构的平面示意图;6 is a schematic plan view of a sample detection structure in a detection chip provided by at least one embodiment of the present disclosure;
图7为本公开至少一实施例提供的检测系统中采样结构的立体结构透视图;7 is a perspective structural perspective view of a sampling structure in a detection system provided by at least one embodiment of the present disclosure;
图8A为本公开至少一实施例提供的检测系统中封装结构的立体结构透视图;8A is a perspective structural perspective view of a packaging structure in a detection system provided by at least one embodiment of the present disclosure;
图8B为本公开至少一实施例提供的检测系统中封装结构的仰视图;8B is a bottom view of a packaging structure in a detection system provided by at least one embodiment of the present disclosure;
图9为本公开至少一实施例提供的检测系统进行样品混合操作的示意图;9 is a schematic diagram of a sample mixing operation performed by a detection system provided by at least one embodiment of the present disclosure;
图10为本公开至少一实施例提供的检测系统进行样品混合操作的另一示意图;10 is another schematic diagram of a sample mixing operation performed by a detection system provided by at least one embodiment of the present disclosure;
图11为本公开至少一实施例提供的检测系统中被检测样品的流动路径示意图;11 is a schematic diagram of a flow path of a sample to be detected in a detection system provided by at least one embodiment of the present disclosure;
图12为本公开至少一实施例提供的另一种检测系统的立体结构透视图;FIG. 12 is a perspective structural perspective view of another detection system provided by at least one embodiment of the present disclosure;
图13为本公开至少一实施例提供的检测系统的俯视爆炸图;13 is an exploded top view of a detection system provided by at least one embodiment of the present disclosure;
图14为本公开至少一实施例提供的检测系统中被检测样品的流动路径示意图;14 is a schematic diagram of a flow path of a sample to be detected in a detection system provided by at least one embodiment of the present disclosure;
图15为本公开至少一实施例提供的再一种检测系统的俯视爆炸图。FIG. 15 is an exploded top view of still another detection system provided by at least one embodiment of the present disclosure.
具体实施方式Detailed ways
为使本公开实施例的目的、技术方案和优点更加清楚,下面将结合本公开实施例的附图,对本公开实施例的技术方案进行清楚、完整地描述。显然,所描述的实施例是本公开的一部分实施例,而不是全部的实施例。基于所描述的本公开的实施例,本领域普通技术人员在无需创造性劳动的前提下所获得的所有其他实施例,都属于本公开保护的范围。In order to make the purpose, technical solutions and advantages of the embodiments of the present disclosure more clear, the technical solutions of the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present disclosure. Obviously, the described embodiments are some, but not all, embodiments of the present disclosure. Based on the described embodiments of the present disclosure, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the protection scope of the present disclosure.
除非另外定义,本公开使用的技术术语或者科学术语应当为本公开所属领域内具有一般技能的人士所理解的通常意义。本公开中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性,而只是用来区分不同的组成部分。“包括”或者“包含”等类似的词语意指出现该词前面的元件或者物件涵盖出现在该词后面列举的元件或者物件及其等同,而不排除其他元件或者物件。“连接”或者“相连”等类似的词语并非限定于物理的或者机械的连接,而是可以包括电性的连接,不管是直接的还是间接的。“上”、“下”、“左”、“右”等仅用于表示相对位置关系,当被描述对象的绝对位置改变后,则该相对位置关系也可能相应地改变。Unless otherwise defined, technical or scientific terms used in this disclosure shall have the ordinary meaning as understood by one of ordinary skill in the art to which this disclosure belongs. As used in this disclosure, "first," "second," and similar terms do not denote any order, quantity, or importance, but are merely used to distinguish the various components. "Comprises" or "comprising" and similar words mean that the elements or things appearing before the word encompass the elements or things recited after the word and their equivalents, but do not exclude other elements or things. Words like "connected" or "connected" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Up", "Down", "Left", "Right", etc. are only used to represent the relative positional relationship, and when the absolute position of the described object changes, the relative positional relationship may also change accordingly.
在微流控芯片的设计过程中,通常希望尽可能多地将分析检测的各项功能集成到芯片上,以减少芯片对外部操作的依赖,从而实现自动化和集成化。例如,可以将微流控芯片的取样部件、混合部件、过滤部件以及分析检测部件集成在一起,以实现检测过程的自动化。在微流控芯片进行检测的过程中,首先利用取样部件获取样品,然后将样品与检测试剂(或者稀释液等使样品更适用于检测的试剂)在混合部件中进行充分混合,然后进行过滤,以用于下一步检测操作。对样品的过滤操作会提升样品的纯度,对微流控芯片的检测过程以及检测结果都起到至关重要的作用。In the design process of microfluidic chips, it is usually desirable to integrate as many functions of analysis and detection into the chip as possible to reduce the chip's dependence on external operations, thereby achieving automation and integration. For example, the sampling parts, mixing parts, filtering parts, and analysis and detection parts of the microfluidic chip can be integrated to realize the automation of the detection process. During the detection process of the microfluidic chip, the sampling part is first used to obtain the sample, and then the sample is fully mixed with the detection reagent (or the reagent that makes the sample more suitable for detection, such as diluent) in the mixing part, and then filtered. for the next detection operation. The filtering operation of the sample will improve the purity of the sample, which plays a crucial role in the detection process and detection results of the microfluidic chip.
本公开至少一实施例提供一种检测芯片,该检测芯片包括样品注入结构、样品检测结构和样品过滤结构。样品注入结构用于注入被检测样品,样品检测结构用于使得被检测样品可以被检测,样品过滤结构在样品注入结构和样品检测结构之间且分别与样品注入结构和样品检测结构连通,以将注入的被检测样品以侧向层析的方式过滤且将过滤后的被检测样品传输至样品检测结构。At least one embodiment of the present disclosure provides a detection chip, which includes a sample injection structure, a sample detection structure, and a sample filter structure. The sample injection structure is used for injecting the sample to be detected, the sample detection structure is used to make the detected sample detectable, and the sample filter structure is between the sample injection structure and the sample detection structure and communicated with the sample injection structure and the sample detection structure respectively, so as to connect the sample to the sample injection structure and the sample detection structure. The injected test sample is filtered by lateral chromatography and the filtered test sample is transferred to the sample detection structure.
本公开至少一实施例的检测芯片整合了样品注入功能、样品检测功能和样品过滤功能,由此丰富了检测芯片的功能,提高了检测芯片集成度,有助于实现检测芯片的小型化。并且,检测芯片的样品过滤结构将注入的被检测样品以侧向层析的方式过滤,由此又进一步有助于实现检测芯片整体外形的薄型化。小型化以及薄型化的检测芯片又有助于实现便携式检测分析装置。The detection chip of at least one embodiment of the present disclosure integrates the sample injection function, the sample detection function and the sample filtering function, thereby enriching the functions of the detection chip, improving the integration degree of the detection chip, and helping to realize the miniaturization of the detection chip. In addition, the sample filtering structure of the detection chip filters the injected sample to be tested in a lateral chromatographic manner, thereby further contributing to the reduction of the overall shape of the detection chip. The miniaturized and thin detection chip also contributes to the realization of a portable detection and analysis device.
本公开至少一实施例提供一种检测系统,该检测系统上述检测芯片、采样结构和封装结构。检测芯片包括采样结构安装部,采样结构安装于采样结构安装部,封装结构用于密封采样结构。At least one embodiment of the present disclosure provides a detection system, which includes the above-mentioned detection chip, sampling structure, and packaging structure. The detection chip includes a sampling structure mounting portion, the sampling structure is mounted on the sampling structure mounting portion, and the packaging structure is used for sealing the sampling structure.
下面通过几个具体的实施例对本公开的检测芯片和检测系统进行说明。The detection chip and detection system of the present disclosure will be described below through several specific embodiments.
本公开至少一实施例提供一种检测芯片和检测系统,该检测系统包括该检测芯片以及与该检测芯片配套使用的组件。例如,图1示出了该实施例提供的检测系统的立体结构透视图,图2示出了该实施例提供的检测芯片的上基板的立体结构透视图,图3示出了该实施例提供的检测芯片的下基板的立体结构图,图4示出了该检测系统的俯视爆炸图,图5示出了该实施例提供的检测系统的仰视爆炸图。At least one embodiment of the present disclosure provides a detection chip and a detection system, and the detection system includes the detection chip and components used together with the detection chip. For example, FIG. 1 shows a perspective view of a three-dimensional structure of a detection system provided by this embodiment, FIG. 2 shows a perspective view of a three-dimensional structure of an upper substrate of a detection chip provided by this embodiment, and FIG. Figure 4 shows a top exploded view of the detection system, and Figure 5 shows a bottom exploded view of the detection system provided by this embodiment.
如图1-图5所示,检测芯片100包括样品注入结构101、样品检测结构102和样品过滤结构103。样品注入结构101用于注入被检测样品。样品检测结构102用于使得被检测样品可以被检测。例如,样品检测结构102中具有检测试剂,被检测样品在与检测试剂混合后再进行检测操作。例如,在一些示例中,该检测试剂为冻干试剂,被检测样品可将冻干试剂复融,并发生所需的反应,以适用于后续检测操作,这些检测操作根据需要可以为光学检测等,本公开的实施例对此不作限制。例如,样品过滤结构103在样品注入结构101和样品检测结构102之间且分别与样品注入结构101和样品检测结构102连通,以将注入的被检测样品以侧向层析的方式过滤且将过滤后的被检测样品传输至样品检测结构102。侧向层析的过滤方式可以使被检测样品得到充分、均匀的过滤,进而可以使过滤后的被检测样品更纯净,改善了检测效果,同时侧向层析的过滤方式所使用的空间减小且呈薄层状,有助于检测芯片100的薄型化。As shown in FIGS. 1-5 , the
例如,在一些实施例中,样品过滤结构103包括过滤层1031,如图3所示,过滤层1031配置为在第一侧1031A接收来自样品注入结构101的被检测样品,在沿过滤层1031所在平面内过滤被检测样品,并在与第一侧1031A相对的第二侧1031B输出过滤后的被检测样品。由此,被检测样品从过滤层1031的第一侧进入过滤层1031,横向通过过滤层1031后,从过滤层1031的第二侧输出,由于被检测样品的过滤路径为过滤层1031横向尺寸(长度或宽度),大于或远大于过滤层1031的厚度,由此被检测样品可得到充分的过滤。例如,当被检测样品的量较多时,由于被检测样品的过滤路径基本相同,因此被检测样品也可以得到充分、均匀的过滤。For example, in some embodiments, the
例如,在一些实施例中,如图1所示,样品注入结构101和样品过滤结构103通过第一通道104连接,样品过滤结构103和样品检测结构102通过第二通道105连接;或者,在另一些实施例中,样品注入结构101和样品过滤结构103可以直接相接,样品过滤结构103和样品检测结构102可以直接相接。例如,在一些实施例中,第一通道104的连接样品过滤结构103的一端包括第一通道腔1041,以使被检测样品可均匀输入至样品过滤结构103中,并避免被检测样品在第一通道104与过滤结构103的连接处集中。例如,第一通道腔1041例如呈圆形、椭圆形或者水滴形(图中示出的情况)等。For example, in some embodiments, as shown in FIG. 1 , the
例如,在一些实施例中,在过滤层的第一侧1031A,第一通道104与过滤层1031在垂直于过滤层1031所在平面的方向上至少部分重叠相接,以将来自样品注入结构101的被检测样品注入过滤层1031以进行过滤,由此第一通道104与过滤层1031的接触面积较大,由此更便于将检测样品注入过滤层1031。For example, in some embodiments, on the
例如,如图1-图3所示,当检测芯片的上基板与下基板结合后,第一通道104的至少部分,例如第一通道腔1041,与过滤层1031在垂直于过滤层1031所在平面的方向上重叠相接。例如,第一通道腔1041延伸至过滤层1031的上方,从而与过滤层1031重叠相接。由此,第一通道104可沿垂直于过滤层1031所在平面的方向向过滤层1031注入被检测样品,使得被检测样品在进入过滤层1031之前可以被均匀分散,以避免样品集中而造成的过滤效果不佳。另外,第一通道腔1041与过滤层1031的重叠的面积较大,因此有利于被检测样品的分散,避免被检测样品集中在过滤层1031与第一通道104的连接位置。由此,上述过滤结构可以使得被检测样品得到充分、均匀的过滤,进而使过滤后的被检测样品更纯净。For example, as shown in FIG. 1 to FIG. 3 , after the upper substrate of the detection chip is combined with the lower substrate, at least part of the
例如,在一些实施例中,在过滤层的第二侧1031B,第二通道105与过滤层1031在垂直于过滤层1031所在平面的方向上至少部分重叠相接,以接收过滤后的被检测样品。例如,在一些实施例中,第二通道105的至少部分延伸至过滤层1031的上方或者下方,从而与过滤层1031重叠相接。由此,第二通道105可沿垂直于过滤层1031所在平面的方向从过滤层1031输出被检测样品。For example, in some embodiments, on the
例如,在一些实施例中,在垂直于过滤层1031所在平面的方向上,第一通道104和第二通道105分别连接于过滤层1031的不同层表面(即过滤层的长度方向和宽度方向界定的横向表面)或相同层表面。需要注意的是,本公开实施例提到的层表面表示过滤层1031的平行于过滤层1031所在平面的表面,即图中示出的过滤层1031的上表面和下表面。例如,第一通道104和第二通道105分别连接于过滤层1031的上表面和下表面,也可以同时连接于过滤层1031的上表面或下表面。例如,在一些实施例中,也可以第一通道104连接于过滤层1031的层表面,第二通道105连接于过滤层1031的侧表面,侧表面为过滤层1031的上表面和下表面之间的表面。本公开的实施例对第一通道104和第二通道105的具体连接方式不做限定,只要第一通道104可沿垂直于过滤层1031所在平面的方向向过滤层1031注入被检测样品即可。For example, in some embodiments, in the direction perpendicular to the plane of the
例如,在一些实施例中,如图3所示,样品过滤结构103还包括容纳过滤层1031的过滤腔1032。如图1所示,过滤腔1032包括第一开口1032A和第二开口1032B,第一开口1032A用于输入被检测样品,第二开口1032B用于输出被过滤的被检测样品。第二开口1032B连接第二通道105的第一端(例如图中示出的右端),样品检测结构102连接第二通道105的第二端(例如图中示出的左端)。For example, in some embodiments, as shown in FIG. 3 , the
例如,在一些实施例中,检测芯片还包括第一基板和粘结层,过滤腔1032设置在第一基板上,且粘结层贴附在第一基板的表面上且将过滤层1031固定在过滤腔1032中,并且该第一基板还可以用于形成/支撑其他功能结构。例如,检测芯片还包括第二基板,第二基板与第一基板层叠,且通过粘结层结合,并且该第二基板也可以形成/支撑其他功能结构,或者,第一基板和第二基板共同形成/支撑其他功能结构。For example, in some embodiments, the detection chip further includes a first substrate and an adhesive layer, the
例如,在图1-图5示出的实施例中,检测芯片包括上基板100A和下基板100B,下基板100B实现为上述第一基板的示例,上基板100A实现为上述第二基板的示例,上基板100A与下基板100B通过粘结层100C结合。例如,上基板100A的材料可以为聚苯乙烯(PS)或者聚甲基丙烯酸甲酯(PMMA)等,下基板100B的材料也可以为聚苯乙烯(PS)或者聚甲基丙烯酸甲酯(PMMA)等。粘结层100C可以包括丙烯酸类粘结剂等具有粘结性的材料,例如,可以实现为双面胶。例如,上基板100A、粘结层100C与下基板100B具有基本相同的外形,由此可以粘结层100C可以更好地实现上基板100A与下基板100B之间的结合。For example, in the embodiment shown in FIG. 1 to FIG. 5 , the detection chip includes an
例如,粘结层100C限定过滤腔1032的第一开口1032A和第二开口1032B,例如,粘结层100C中具有第一开口和第二开口,粘结层100C贴付在下基板100B表面上将过滤层1031固定在过滤腔1032中,且使得粘结层100C的第一开口和第二开口形成为过滤腔1032的第一开口1032A和第二开口1032B。由此,粘结层100C不但起到粘结的作用,还可以起到密封过滤腔1032的作用,并通过第一开口和第二开口为被检测样品提供流动通道,以利于实现样品过滤结构103的侧向层析过滤功能。For example, the
例如,第一通道104和第二通道105可以均形成在上基板100A中,且分别与第一开口1032A和第二开口1032B连通。例如,样品注入结构101以及样品检测结构102也设置在上基板100A上。由此,在图1-图5示出检测芯片中,例如参考图11,位于上基板100A的样品注入结构101可将被检测样品以垂直于过滤膜1031所在平面的方向,通过第一开口1032A输入至位于下基板100B的样品过滤结构103中,并将过滤后的被检测样品以垂直于过滤膜1031所在平面的方向,通过第二开口1032B输出至位于上基板100A的样品检测结构102中。由此实现样品过滤结构103的侧向层析、垂直进液的功能。For example, the
例如,样品检测结构102包括多个检测单元1021以及多个第一检测流道1022,至少一个检测单元1021通过对应的第一检测流道1022连通于样品过滤结构103。例如,该检测单元1021通过对应的第一检测流道1022连通于第二通道105的第二端(例如图中示出的第二通道105的左端),从而被样品过滤结构103过滤后的被检测样品可从第二通道105以及第一检测流道1022流入检测单元1021。For example, the
例如,每个检测单元1021均通过对应的第一检测流道1022连通于第二通道105的第二端。例如,第二通道105的第二端具有辅助连接结构1051,辅助连接结构1051的延伸方向与第二通道105的延伸方向垂直。例如,第一检测流道1022均通过辅助连接结构1051连通于第二通道105的第二端,由此便于第一检测流道1022的排布,且使得每个第一检测流道1022的长度和形状等基本相同。For example, each
例如,在一些实施例中,如图6所示,第一检测流道1022的宽度W可以为0.1mm-1mm,例如0.3mm、0.5mm或者0.7mm等,第一检测流道1022的深度(即在垂直于上基板100A所在平面方向的尺寸)可以为0.1mm-1mm,例如0.3mm、0.5mm或者0.7mm等。由此,被检测样品可以在第一检测流道1022具有合适的流速和流量。For example, in some embodiments, as shown in FIG. 6 , the width W of the first
例如,第一检测流道1022的至少部分弯曲延伸。例如,第一检测流道1022的弯折延伸的至少部分呈折线形或者S形。例如,第一检测流道1022的弯折延伸的至少部分可以包括2-20个弯折1022A,例如5个、8个、12个、16个等,相邻的两个弯折1022A之间的流道长度L可以为2mm-20mm,例如3mm、5mm、10mm或者15mm等。For example, at least a portion of the first
例如,如图6所示,当第一检测流道1022的弯折延伸的至少部分呈折线形时,弯折1022A的弯折角度α可以为5°-120°,例如30°、60°或者90°等。For example, as shown in FIG. 6 , when at least part of the bending extension of the first
对于上述第一检测流道1022的设计,由于第一检测流道1022具有弯折延伸的部分,一方面,该弯折延伸的部分可以延长被检测样品的流动通道,另一方面,该弯折延伸的部分所具有的弯折1022A还可以增加被检测样品的流动阻力,使得被检测样品不易回流,从而防止多个检测单元1021之中的被检测样品发生串扰,进而防止被检测样发生串扰而导致的检测误差,由此第一检测流道1022的设计可以提高检测精度和检测质量。For the above-mentioned design of the first
例如,在一些实施例中,检测单元1021包括容纳被检测样品的检测腔(例如图中示出的柱状结构),检测腔具有排气孔1021A以及覆盖排气孔1021A的透气阻液膜1021B。当检测腔内流入被检测样品时,检测腔内的压强增大,该排气孔1021A可排出检测腔内的多余空气以平衡气压,透气阻液膜1021B具有透气但不透液的功能,由此可避免被检测样品流出检测腔。在检测单元1021形成在上基板100A中时,该排气孔1021A可以形成在上基板100A的侧面(如图2或图4所示的上基板100A的左端面),透气阻液膜1021B可以被黏贴在上基板100A的侧面上,由此覆盖排气孔1021A。For example, in some embodiments, the
例如,在一些实施例中,多个检测单元1021的覆盖排气孔1021A的透气阻液膜1021B为一体结构。此时,一体结构的透气阻液膜1021B可以以整面的形式覆盖在多个检测单元1021的具有排气孔1021A的一侧(如图4和图5所示),从而可以简化检测芯片的结构和制作难度。例如,透气阻液膜1021B可以为ePTFE(膨体聚四氟乙烯)透气阻液膜,本公开的实施例对此不作限制。For example, in some embodiments, the gas-permeable and liquid-
例如,在一些实施例中,样品注入结构101包括采样结构安装部1011,采样结构安装部1011用于接纳采样结构,例如安装采样结构,采样结构中具有被检测样品。例如,样品注入结构101还包括试剂池1012,试剂池1012用于存储检测试剂或者稀释液等使样品更适用于检测的试剂(后面以试剂池1012存储稀释液作为示例进行介绍),例如,如图4所示,试剂池1012形成在上基板100A之中。当采样结构安装于采样结构安装部1011后,采样结构可与试剂池1012连通,例如采样结构被进一步按压从而与试剂池1012连通,并且试剂池1012还可与样品过滤结构103连通。For example, in some embodiments, the
例如,在一些实施例中,被检测样品与稀释液的混合比例是确定的,例如,试剂池1012中稀释液的体积可以进行选择和调整,以利于获得所需的混合比例。例如,采样结构所获取的样品的总量是可知的(例如采样结构所获取的样品的总量是定值或者可被读取),因此可选择选择试剂池1012中稀释液的体积来控制被检测样品与稀释液的混合比例,实现样品的定量,获得具有一定浓度的样品等。For example, in some embodiments, the mixing ratio of the sample to be tested and the diluent is determined. For example, the volume of the diluent in the
例如,样品注入结构101还可以包括位于试剂池1012的第一侧(图中示出为上侧)的第一密封层1013,第一密封层1013用于在第一侧密封试剂池1012。当采样结构安装于采样结构安装部1011后,采样结构可被按压从而戳破第一密封层1013以与试剂池1012连通。For example, the
例如,样品注入结构101还可以包括位于试剂池1012的第二侧(图中示出为下侧)的第二密封层1014,第二密封层1014用于在第二侧密封试剂池1012,试剂池1012的第一侧与试剂池1012的第二侧彼此正对。当第二密封层1014被戳破后,试剂池1012可以与样品过滤结构103连通。For example, the
例如,第一密封层1013和/或第二密封层1014可以为铝箔,此时,第一密封层1013和/或第二密封层1014可以分别通过热封的方式形成在试剂池1012的两侧,由此形成密闭的试剂存储空间。例如,在其他示例中,第一密封层1013和/或第二密封层1014也可以为聚甲基丙烯酸甲酯(PMMA)、聚丙烯(PP)等具有密封功能的其他材料,此时,第一密封层1013和/或第二密封层1014可以分别通过超声焊的方式形成在试剂池1012的两侧,由此形成密闭的试剂存储空间。本公开的实施例对第一密封层1013和/或第二密封层1014的具体形式不做限定。For example, the
例如,在一些实施例中,样品注入结构101还可以包括位于试剂池1012的第二侧的弹性膜1015和作用通道1016,第二密封层1014夹置在弹性膜1015和试剂池1012之间。粘结层100C夹置在弹性膜1015和第二密封层1014之间,由此将弹性膜1015和第二密封层1014彼此相对粘结固定。同时,参考图4与图5,与作用通道1016对应的,粘结层100C还具有第三开口1001,该第三开口1001也位于弹性膜1015和第二密封层1014彼此正对重叠的区域,例如,第三开口1001完全位于弹性膜1015和第二密封层1014彼此正对重叠的区域内,并且,弹性膜1015和第二密封层1014彼此正对重叠的区域完全通过粘结层100C粘结固定。作用通道1016允许当外力作用在弹性膜1015上使弹性膜1015变形时,变形的弹性膜1015部分通过粘结层100C的第三开口1001,由此在弹性膜1015本身没有被戳破的情形下能够使外力还作用在第二密封层1014上以戳破第二密封层1014,当外力撤去之后,弹性膜1015将基本恢复原状。For example, in some embodiments, the
例如,弹性膜1015的材料为复合高分子材料,例如为聚苯乙烯(PS)和聚对苯二甲酸乙二醇酯(PET)的复合材料。由此,弹性膜1015可以同时具有较好的弹性与强度。弹性膜1015例如通过粘结层100C结合在上基板和下基板之间。例如,在其他示例中,弹性膜1015也可以通过超声波焊接、光敏胶粘接、化学溶剂键合或者激光焊接等的方式结合在上基板和下基板之间,本公开的实施例对此不做限定。For example, the material of the
例如,如上所述,粘结层100C通过第三开口1001至少部分露出第二密封层1014,以允许变形的弹性膜1015能够作用在第二密封层1014上以戳破第二密封层1014。例如,下基板100B包括基板开口以提供作用通道1016,例如,弹性膜1015完全覆盖作用通道1016,粘结层100C的第三开口1001在下基板100B上的投影例如与作用通道1016至少部分重叠,例如完全覆盖作用通道1016。For example, as described above, the
例如,如图1-图5所示,本实施例提供的检测系统除了上述检测芯片外,还包括采样结构110和封装结构111。采样结构110安装于样品注入结构101的采样结构安装部1011,封装结构111用于密封采样结构110。例如,如图4和图5所示,采样结构110可通过垫圈140安装于采样结构安装部1011,垫圈140例如为硅胶材料,从而可以起到密封和缓冲作用。For example, as shown in FIG. 1 to FIG. 5 , the detection system provided in this embodiment further includes a
例如,在一些实施例中,如图7所示,采样结构110可以为具有样品吸取和混合功能的取样针。例如,如图8A和图8B所示,封装结构111可以为硅胶帽。例如,采样结构110和封装结构111可以相互配合完成样品混合功能。For example, in some embodiments, as shown in FIG. 7 , the
例如,图9示出了采样结构110安装于采样结构安装部1011,且封装结构111密封采样结构110时样品注入结构101的截面示意图。如图9所示,采样结构110包括第一吸取通道110A、第二吸取通道110B和腔室110C。第二吸取通道110B内设置有多个分隔柱110D。分隔柱110D与第二吸取通道110B的通道壁之间具有第一间隙,相邻的分隔柱110D之间具有第二间隙。该采样结构的第一吸取通道110A和第二吸取通道110B设置为可通过毛细作用吸取被检测样品(例如血液、体液等),并且第二吸取通道110B中具有的分隔柱110D可以对流经第二吸取通道110B的被检测样品进行分流。在腔室110C之中,当被检测样品与试剂池中的稀释液混合后,该采样结构可以起到样品混合的作用。For example, FIG. 9 shows a schematic cross-sectional view of the
例如,如图8A和图8B所示,封装结构111包括主体部111A和设置在主体部111A周边位置的至少一个排气孔111B,例如多个排气孔111B。例如,这些排气孔111B围绕主体部111A均匀分布。排气孔111B配置为可在主体部111A受到不同的作用力下分别处于打开状态或闭合状态。例如,在一些实施例中,如图8B所示,排气孔111B可以为三棱柱排气孔,当主体部111A受到的作用力大于或等于阈值时,排气孔111B闭合,当主体部111A受到的作用力大小于阈值时,排气孔111B处于打开状态。由此可以通过对封装结构111的主体部111A施加不同的作用力来调节采样结构110的内部压强。For example, as shown in FIGS. 8A and 8B , the
例如,在一些实施例中,检测系统还包括可移动的第一顶杆120,第一顶杆120设置在封装结构111的远离采样结构110的一侧。由此,可通过第一顶杆120在封装结构111的主体部111A上上下移动以向主体部111A施加作用力。例如,第一顶杆120对主体部111A施加的作用力是可调节的,进而可以控制采样结构110内的压强大小。例如,可以通过一个驱动装置(例如步进电机)驱动第一顶杆120的移动。For example, in some embodiments, the detection system further includes a movable
例如,如图8A所示,主体部111A可以包括凹台槽,用于引导第一顶杆120的施力位置。例如,凹台槽与第一顶杆120的形状相同,例如其横截面均为圆形。例如,凹台槽的直径略大于第一顶杆120的直径,且具有台阶,从而有利于对第一顶杆120的施力位置进行引导。For example, as shown in FIG. 8A , the
例如,在一些实施例中,检测系统还可以包括可移动的第二顶杆130,第二顶杆130用于戳破第二密封层1014。例如,第二顶杆130通过作用通道1016向弹性膜1015施加作用力,从而变形的弹性膜1015能够作用在第二密封层1014上以戳破第二密封层1014。例如,可以通过另一个驱动装置(例如步进电机)驱动第二顶杆130的移动。For example, in some embodiments, the detection system may further include a movable
下面,结合图9-图11对上述检测系统的工作过程进行示例性介绍。Hereinafter, the working process of the above detection system will be exemplarily introduced with reference to FIGS. 9-11 .
首先,利用采样结构110吸取被检测样品,此时,被检测样品可通过毛细作用从采样结构110的第一吸取通道110A和第二吸取通道110B吸入。被检测样品例如可以是血液、体液等,本公开的实施例对此不作限制。First, the sample to be detected is sucked by the
然后,将采样结构110安装于检测芯片100上,并采用封装结构111对采样结构110进行固定与密封。例如,在采样结构110安装于检测芯片100后,采样结构110的底部伸入到检测芯片100的试剂池1012中。例如,试剂池1012的上表面具有用于密封的第一密封层1013,在采样结构110安装于检测芯片100上时,采样结构110可戳破该第一密封层1014,从而与试剂池1012相连通,以使被检测样品可与试剂池1012中的稀释液进行混合。在采样结构110与密封结构111安装完成后,检测芯片100中形成两个连通的密封腔,一个是采样结构110形成的第一密封腔,另一个是试剂池1012形成的第二密封腔。Then, the
如图9所示,采用第一顶杆120以第一速度向密封结构111的主体部111A施加作用力,当作用力较弱,小于阈值压力时,密封结构111的排气孔111B处于打开状态,采样结构110可通过排气孔111B排出空气或者溢液等。当施加的作用力逐步增大至大于等于阈值压力时,排气孔111B处于闭合状态,此时,采样结构110内部的压强增加,使得被检测样品从采样结构110中被推出,并进入到试剂池1012中,如图9中的箭头所示。由此,被检测样品可以与试剂池1012中的稀释液进行混合。As shown in FIG. 9 , the
如图10所示,以第二速度将第一顶杆120撤回,此时,主体部111A回弹,试剂池1012中的稀释液和被检测样品的混合液会回吸进入采样结构110。由于在采样结构110中,第二吸取通道110B中具有分隔柱110D,且相邻的分隔柱110D之间以及分隔柱110D与通道壁之间形成有多个狭小的间隙,因此稀释液和被检测样品的混合液经过第一吸取通道110A和第二吸取通道110B后,其流速会加快,进而混合液可以以较大的速度冲入采样结构110的腔室110C,并与采样结构110中的被检测样品形成回旋混合,如图10中的箭头所示,由此可以提升混合效率,并使稀释液和被检测样品混合的更加均匀。此时,一次混合操作进行完毕。As shown in FIG. 10 , the
例如,第一顶杆120向密封结构111的主体部111A施加作用力的第一速度大于第一顶杆120撤回的第二速度,即采用第一顶杆120迅速下压、缓慢抬起的操作,该操作有助于提升采样结构110中被检测样品与稀释液的混合效果。For example, the first speed at which the
例如,上述混合操作可以进行多次,以进一步提高被检测样品与稀释液的混合效果。For example, the above mixing operation can be performed multiple times to further improve the mixing effect of the tested sample and the diluent.
例如,当被检测样品与稀释液得到充分混合后,可驱动第二顶杆130向上移动,以使第二顶杆130通过作用通道1016和弹性膜1015向试剂池1012下方的第二密封层1014施加作用力,以将第二密封层1014戳破。由于弹性膜1015具有弹性,从而可以在撤去外力后恢复原状态。第二密封层1014被戳破后,试剂池1012与样品过滤结构103连通。For example, after the sample to be tested and the diluent are sufficiently mixed, the
例如,图11更详细地示出了被检测样品的流动路径。如图11所示,可继续通过第一顶杆120缓慢持续下压,使被检测样品进入样品过滤结构103(被检测样品例如以垂直于过滤膜1031所在平面的方向输入至过滤膜1031中),过滤后的被检测样品可在第一顶杆120持续下压的过程中,被输送至样品检测结构102(被检测样品例如以垂直于过滤膜1031所在平面的方向输出至样品检测结构102),例如输送至样品检测结构102的检测腔1021内。例如,检测腔1021内具有适用于不同检测项目的冻干试剂,从而被检测样品可与冻干试剂反应后,样品检测结构102开始进行检测,并输出检测结果。例如,在样品检测结构102进行检测的过程中,第一顶杆120始终保持在下压状态,以避免被检测样品回流。For example, Figure 11 shows the flow path of the sample being tested in more detail. As shown in FIG. 11 , the
由此,检测系统可实现自动化检测过程,并且,该检测系统还可以获得更精确的检测结果。Therefore, the detection system can realize an automatic detection process, and the detection system can also obtain more accurate detection results.
例如,在一些实施例中,检测芯片100还可以包括设置在样品注入结构101与样品过滤结构103之间的样品混合腔室(图中未示出)。此时,被检测样品和稀释液还可以在样品混合腔室内进行混合操作。例如,该混合操作可以由采样结构110和样品混合腔室共同完成,或者,在一些实施例中,采样结构110可以只具有采样功能,从而可以仅在样品混合腔室中进行混合操作,本公开的实施例对此不做限定。For example, in some embodiments, the
本公开至少一实施例提供另一种检测芯片和检测系统,该检测系统包括该检测芯片。例如,图12示出了该实施例提供的检测系统的立体结构透视图,图13示出了该检测系统的俯视爆炸图。At least one embodiment of the present disclosure provides another detection chip and a detection system, and the detection system includes the detection chip. For example, FIG. 12 shows a perspective view of the three-dimensional structure of the detection system provided by this embodiment, and FIG. 13 shows an exploded top view of the detection system.
如图12和图13所示,该检测芯片200包括样品注入结构201、样品检测结构202和样品过滤结构203。样品注入结构201用于注入被检测样品,样品检测结构202用于使得被检测样品可以被检测,样品过滤结构203在样品注入结构201和样品检测结构20之间且分别与样品注入结构201和样品检测结构202连通,以将注入的被检测样品以侧向层析的方式过滤且将过滤后的被检测样品传输至样品检测结构202。As shown in FIG. 12 and FIG. 13 , the
例如,在一些实施例中,样品过滤结构203包括过滤层2031,过滤层2031配置为在第一侧2031A接收来自样品注入结构201的被检测样品,在沿过滤层2031所在平面内过滤被检测样品,在与第一侧2031A相对的第二侧2031B输出过滤后的被检测样品,由此过滤层2031可以实现侧向层析过滤功能。For example, in some embodiments, the
例如,样品注入结构201和样品过滤结构203通过第一通道204连接,样品过滤结构203和样品检测结构202通过第二通道205连接。For example, the
例如,在过滤层2031的第一侧2031A,第一通道204与过滤层2031在垂直于过滤层2031所在平面的方向上至少部分重叠相接,以将来自样品注入结构的被检测样品注入过滤层2031以进行过滤。例如,第一通道204在过滤层2031的侧面以及上方均与过滤层2031重叠相接,从而被检测样品可以同时以侧向和垂直于过滤层2031所在平面的方向上向过滤层2031输入被检测样品。由此,被检测样品在进入过滤层2031之前可以被均匀分散,以避免样品集中而造成的过滤效果不佳。For example, on the
例如,第一通道与样品过滤结构203连接的一端还可以具有第一通道腔2041,第一通道腔2041例如在过滤层2031上方和侧面与过滤层2031重叠相接。第一通道腔2041例如呈圆形、椭圆形或者水滴形(图12中示出的情况)等。由于第一通道腔2041与过滤层2031的重叠的面积较大,因此有利于被检测样品的分散,避免被检测样品集中在过滤层2031与第一通道204的连接位置。由此,上述过滤结构可以使得被检测样品得到充分、均匀的过滤,进而使被检测样品更纯净。For example, one end of the first channel connected to the
例如,样品过滤结构203还包括容纳过滤层2031的过滤腔2032,过滤腔2032包括第一开口2032A和第二开口2032B。第一开口2032A用于输入被检测样品,第二开口2032B用于输出被过滤的被检测样品。例如,第二开口2032B连接第二通道205的第一端,样品检测结构202连接第二通道205的第二端。For example, the
例如,检测芯片还包括第一基板和粘结层,过滤腔2032设置在第一基板上,且粘结层贴附在第一基板的表面上且将过滤层2031固定在过滤腔2032中。例如,检测芯片还包括第二基板,第二基板与第一基板层叠,且通过粘结层结合。For example, the detection chip further includes a first substrate and an adhesive layer, the
例如,如图13所示,检测芯片包括上基板200A和下基板200B,上基板200A实现为上述第一基板的示例,下基板200B实现为上述第二基板的示例,上基板200A和下基板200B通过粘结层200C结合。例如,上基板200A、粘结层200C与下基板200B具有基本相同的外形,由此可以粘结层200C可以更好地实现上基板200A与下基板200B之间的结合。上基板200A、下基板200B以及粘结层200C的材料等可参见上述实施例,在此不再赘述。For example, as shown in FIG. 13 , the detection chip includes an
例如,第一通道204和第二通道205设置在上基板200A中。例如,样品注入结构201以及样品检测结构202也设置在上基板200A中。此时,样品注入结构101可将被检测样品从侧向和垂直于过滤膜2031所在平面的方向,通过第一开口2032A输入至样品过滤结构203中,并将过滤后的被检测样品从侧向,通过第二开口1032B输出至样品检测结构102中。由此实现样品过滤结构103的侧向层析、垂直进液的功能。For example, the
例如,样品检测结构202包括多个检测单元2021以及多个第一检测流道2022,至少一个检测单元2021通过对应的第一检测流道2022连通于样品过滤结构203。第一检测流道2022的结构、尺寸参数以及连接方式等可参见上述实施例,在此不再赘述。For example, the
例如,检测单元2021包括容纳被检测样品的检测腔,检测腔具有排气孔2021A以及覆盖排气孔2021A的透气阻液膜2021B。透气阻液膜2021B具有透气但不透液的功能,从而可避免被检测样品从检测腔流出。For example, the
例如,在一些实施例中,多个检测单元2021的覆盖排气孔2021A的透气阻液膜2021B为一体结构,此时,一体结构的透气阻液膜2021B可以以整面的方式覆盖在多个检测单元2021的具有排气孔2021A的一侧(如图13所示),从而可以简化检测芯片的结构和制作难度。For example, in some embodiments, the gas-permeable and liquid-blocking
例如,在一些实施例中,样品注入结构201包括采样结构安装部2011,用于接纳采样结构,例如安装采样结构。例如,样品注入结构201还包括试剂池2012,当采样结构安装于采样结构安装部2011后,采样结构可与试剂池2012连通,并且试剂池2012还可与样品过滤结构203连通。For example, in some embodiments, the
例如,在一些实施例中,样品注入结构201还可以包括位于试剂池2012的第一侧(图中示出为上侧)的第一密封层2013,第一密封层2013用于在第一侧密封试剂池2012。当采样结构安装于采样结构安装部2011后,采样结构可戳破第一密封层2013以与试剂池2012连通。For example, in some embodiments, the
例如,样品注入结构201还可以包括位于试剂池2012的第二侧(图中示出为下侧)的第二密封层2014,第二密封层2014用于在第二侧密封试剂池2012,且试剂池2012的第一侧与试剂池2012的第二侧彼此正对。当第二密封层2014被戳破后,试剂池2012与样品过滤结构203连通。For example, the
例如,在一些实施例中,样品注入结构201还可以包括位于试剂池2012的第二侧的弹性膜2015和作用通道2016,第二密封层2014夹置在弹性膜2015和试剂池2012之间。粘结层100C夹置在弹性膜2015和第二密封层2014之间,由此将弹性膜2015和第二密封层2014彼此相对粘结固定。同时,参考图13,与作用通道2016对应的,粘结层200C还具有开口2001,该开口2001也位于弹性膜2015和第二密封层2014彼此正对重叠的区域,例如,开口2001完全位于弹性膜2015和第二密封层2014彼此正对重叠的区域内,并且,弹性膜2015和第二密封层2014彼此正对重叠的区域完全通过粘结层200C粘结固定。作用通道2016允许当外力作用在弹性膜2015上使弹性膜2015变形时,变形的弹性膜2015部分通过粘结层200C的开口2001,由此在弹性膜2015本身没有被戳破的情形下能够使外力还作用在第二密封层2014上以戳破第二密封层2014,当外力撤去之后,弹性膜2015将基本恢复原状。For example, in some embodiments, the
例如,弹性膜2015的材料可以为复合高分子材料,例如为聚苯乙烯(PS)和聚对苯二甲酸乙二醇酯(PET)的复合材料。由此,弹性膜2015可以同时具有较好的弹性与强度。For example, the material of the
例如,采样结构安装部2011和试剂池2012设置在上基板200A上,粘结层200C贴附在上基板200A的表面(图中示出为下表面)上且将弹性膜2015固定在上基板200A的表面上。例如,下基板200B包括基板开口以提供作用通道2016,例如,弹性膜2015完全覆盖作用通道2016。For example, the sampling
例如,粘结层200C通过开口2001至少部分露出第二密封层2014,以允许变形的弹性膜2015能够作用在第二密封层2014上以戳破第二密封层2014。粘结层200C的第三开口1001在下基板100B上的投影例如与作用通道1016至少部分重叠,例如完全位于作用通道1016内。For example, the
例如,在一些实施例中,如图12所示,检测芯片200还可以包括设置在样品注入结构201与样品过滤结构203之间的样品混合腔室206。样品混合腔室206可用于将被检测样品与试剂池中的稀释液混合。For example, in some embodiments, as shown in FIG. 12 , the
例如,本实施例提供的检测系统除了包括上述检测芯片200外,还包括采样结构210和封装结构211。采样结构210安装于采样结构安装部2011,封装结构211用于密封采样结构210。例如,封装结构211为硅胶帽,从而具有较好的弹性与密封性,并可通过采样结构210和封装结构211的配合实现样品的混合。For example, in addition to the
例如,在一些实施例中,如图12所示,封装结构211包括密封部211A和固定部211B,密封部211A用于密封采样结构210,固定部211B用于将采样结构210固定于检测芯片200上。例如,密封部211A和固定部211B为一体形成的硅胶结构。固定结构211B为环状套接结构。For example, in some embodiments, as shown in FIG. 12 , the
例如,密封部211A也可以具有主体部和排气孔等结构,具体可参见上述实施例提供的封装结构111,在此不再赘述。For example, the sealing
例如,在一些实施例中,检测系统还包括可移动的第一顶杆220,第一顶杆220设置在封装结构211的远离采样结构210的一侧。第一顶杆220可向封装结构211的密封部211A施加作用力。For example, in some embodiments, the detection system further includes a movable
例如,检测系统还可以包括可移动的第二顶杆230,第二顶杆230用于戳破第二密封层2014。例如,第二顶杆230可通过下基板100B中的作用通道2016以及弹性模2015向第二密封层2014施加作用力。For example, the detection system may further include a movable
下面,结合图14对上述检测系统的工作过程进行示例性介绍。Hereinafter, the working process of the above detection system will be exemplarily introduced with reference to FIG. 14 .
首先,利用采样结构210吸取被检测样品。例如,采样结构210可以为任意具有采样功能的结构。被检测样品例如可以是血液、体液等,本公开的实施例对此不作限制。First, the sample to be detected is sucked by the
然后,将采样结构210安装于检测芯片200上,并采用封装结构211对采样结构210进行固定与密封。例如,在采样结构210安装于检测芯片200后,采样结构210的底部伸入到检测芯片200的试剂池2012中。例如,试剂池2012的上表面具有用于密封的第一密封层2013,在采样结构210安装于检测芯片200上时,采样结构210可戳破该第一密封层2014,从而与试剂池2012相连通,以使被检测样品可与试剂池2012中的稀释液进行混合。Then, the
驱动第二顶杆230向上移动,以使第二顶杆230通过作用通道2016和弹性膜2015向试剂池2012下方的第二密封层2014施加作用力,以将第二密封层2014戳破。由于弹性膜2015具有弹性,从而可以在撤去外力后恢复原状态。第二密封层2014被戳破后,试剂池1012与样品混合腔室206连通。The second
采用第一顶杆220以第一速度向密封结构211的密封部211A施加作用力,此时,采样结构210内部的压强增加,使得被检测样品从采样结构210中被推出,并进入到试剂池2012中,进一步地,被检测样品和试剂池2012中的稀释液可混合并可进入到样品混合腔室206中。The
之后,以第二速度将第一顶杆220撤回,此时,密封部211A回弹,稀释液和被检测样品的混合液会回吸进入试剂池2012。由此,稀释液和被检测样品的混合液可在试剂池2012和混合腔室206中往复运动,从而完成混合操作。After that, the
例如,第一顶杆220向密封部211A施加作用力的第一速度小于第一顶杆220撤回的第二速度,即采用第一顶杆220缓慢下压、迅速抬起的操作,该操作有助于提升被检测样品与稀释液的混合效果。For example, the first speed at which the
例如,上述混合操作可以进行多次,使混合液在试剂池2012和混合腔室206中进行多次往复运动,以进一步提高被检测样品与稀释液的混合效果。For example, the above-mentioned mixing operation can be performed for many times, so that the mixed liquid performs multiple reciprocating movements in the
例如,图14示出了上述实施例的检测芯片200中被检测样品的流动路径。如图13所示,可继续通过第一顶杆220的缓慢持续下压操作,使被检测样品进入样品过滤结构203(被检测样品例如同时从侧向和垂直于过滤膜2031所在平面的方向输入至过滤膜2031中),过滤后的被检测样品可在第一顶杆220持续下压的过程中,被输送至样品检测结构202(被检测样品例如从侧向输出至样品检测结构202),最终被输送至样品检测结构202的检测腔2021内。例如,不同的检测腔2021内具有适用于不同检测项目的冻干试剂,从而被检测样品可与冻干试剂反应后,样品检测结构202开始进行检测,并输出检测结果。例如,在样品检测结构202进行检测的过程中,第一顶杆220始终保持在下压状态,以避免被检测样品回流。For example, FIG. 14 shows the flow path of the sample to be detected in the
由此,检测系统可实现自动化检测过程,并且,该检测系统还可以获得更精确的检测结果。Therefore, the detection system can realize an automatic detection process, and the detection system can also obtain more accurate detection results.
例如,在一些实施例中,该检测系统也可以配合具有采集和混合功能的采样结构来使用,例如配合图7、图9-图10示出的采样结构来使用,例如在一些示例中也可以配合图8A和8B示出的密封结构来使用。此时,该检测系统也可以通过类似于上述实施例提供的操作过程进行检测操作。本公开的实施例对检测系统的操作过程不作具体限定。For example, in some embodiments, the detection system can also be used with a sampling structure with acquisition and mixing functions, for example, with the sampling structure shown in FIGS. 7 and 9-10 , for example, in some examples Used in conjunction with the sealing structure shown in Figures 8A and 8B. At this time, the detection system can also perform the detection operation through an operation process similar to that provided in the above-mentioned embodiment. The embodiments of the present disclosure do not specifically limit the operation process of the detection system.
本公开至少一实施例提供再一种检测芯片和检测系统,该检测系统包括该检测芯片。例如,图15示出了该实施例提供的检测系统的俯视爆炸图。该实施例的检测系统的检测芯片为图12和图13所示的检测芯片和检测系统变型,与图12和图13所示的检测芯片和检测系统的区别在于检测芯片仅包括上基板300A而不包括下基板,同时位于试剂池的第二侧(图中下侧)的弹性膜3015覆盖了图中上基板300A下侧表面,而非仅仅覆盖试剂池的及其周边区域,由此弹性膜3015还起到了图12和图13所示的检测芯片中的下基板的作用。图15所示的实施例与图12和图13所示的实施例相同的部分这里不再赘述。At least one embodiment of the present disclosure provides yet another detection chip and a detection system, and the detection system includes the detection chip. For example, FIG. 15 shows an exploded top view of the detection system provided by this embodiment. The detection chip of the detection system of this embodiment is a modification of the detection chip and detection system shown in FIG. 12 and FIG. 13 , and the difference from the detection chip and detection system shown in FIG. 12 and FIG. 13 is that the detection chip only includes the
例如,弹性膜3015的材料可以为复合高分子材料,例如为聚苯乙烯(PS)和聚对苯二甲酸乙二醇酯(PET)的复合材料。由此,弹性膜2015可以同时具有较好的弹性与强度。For example, the material of the
粘结层300C贴附在图中上基板300A下侧表面上且将弹性膜3015固定在上基板300A的下侧表面上,粘结层300C还具有开口3001。顶杆可直接作用弹性模3015,通过粘结层300C的开口3001向试剂池一侧的密封层施加作用力。The
还有以下几点需要说明:There are a few more points to note:
(1)本公开实施例附图只涉及到与本公开实施例涉及到的结构,其他结构可参考通常设计。(1) The accompanying drawings of the embodiments of the present disclosure only relate to the structures involved in the embodiments of the present disclosure, and other structures may refer to general designs.
(2)为了清晰起见,在用于描述本公开的实施例的附图中,层或区域的厚度被放大或缩小,即这些附图并非按照实际的比例绘制。(2) In the drawings for describing the embodiments of the present disclosure, the thicknesses of layers or regions are exaggerated or reduced for clarity, ie, the drawings are not drawn on actual scale.
(3)在不冲突的情况下,本公开的实施例及实施例中的特征可以相互组合以得到新的实施例。(3) The embodiments of the present disclosure and the features in the embodiments may be combined with each other to obtain new embodiments without conflict.
以上所述,仅为本公开的具体实施方式,但本公开的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本公开揭露的技术范围内,可轻易想到变化或替换,都应涵盖在本公开的保护范围之内。因此,本公开的保护范围应以权利要求的保护范围为准。The above are only specific embodiments of the present disclosure, but the protection scope of the present disclosure is not limited to this. should be included within the scope of protection of the present disclosure. Therefore, the protection scope of the present disclosure should be subject to the protection scope of the claims.
Claims (32)
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| CN113115587B (en) * | 2019-11-13 | 2023-06-20 | 京东方科技集团股份有限公司 | Detection chip |
| KR102796383B1 (en) * | 2022-03-08 | 2025-04-18 | 주식회사 유진셀 | Test cartridge |
| CN117420126A (en) * | 2023-09-05 | 2024-01-19 | 深圳市儿童医院 | Immediate visual biological detection kit |
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| WO2021244238A1 (en) | 2021-12-09 |
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