CN111653727B - 一种预锂化硅基薄膜负极材料及其制备方法 - Google Patents
一种预锂化硅基薄膜负极材料及其制备方法 Download PDFInfo
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 72
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 72
- 239000010703 silicon Substances 0.000 title claims abstract description 72
- 239000010409 thin film Substances 0.000 title claims abstract description 32
- 239000007773 negative electrode material Substances 0.000 title claims abstract description 23
- 238000002360 preparation method Methods 0.000 title claims abstract description 11
- 238000006138 lithiation reaction Methods 0.000 title description 4
- 239000010408 film Substances 0.000 claims abstract description 136
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 96
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 73
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims abstract description 56
- 229910052744 lithium Inorganic materials 0.000 claims abstract description 46
- 238000001755 magnetron sputter deposition Methods 0.000 claims abstract description 45
- 229910052751 metal Inorganic materials 0.000 claims abstract description 37
- 239000002184 metal Substances 0.000 claims abstract description 37
- 238000001035 drying Methods 0.000 claims abstract description 13
- 238000000034 method Methods 0.000 claims abstract description 11
- 239000011248 coating agent Substances 0.000 claims abstract description 4
- 238000000576 coating method Methods 0.000 claims abstract description 4
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 claims description 26
- 239000012153 distilled water Substances 0.000 claims description 26
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 26
- 238000000151 deposition Methods 0.000 claims description 25
- 230000008021 deposition Effects 0.000 claims description 24
- 238000004544 sputter deposition Methods 0.000 claims description 24
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 22
- 229910002804 graphite Inorganic materials 0.000 claims description 22
- 239000010439 graphite Substances 0.000 claims description 22
- 229910052802 copper Inorganic materials 0.000 claims description 21
- 239000010949 copper Substances 0.000 claims description 21
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 13
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims description 13
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 11
- 229910000103 lithium hydride Inorganic materials 0.000 claims description 10
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 8
- WMFOQBRAJBCJND-UHFFFAOYSA-M Lithium hydroxide Chemical compound [Li+].[OH-] WMFOQBRAJBCJND-UHFFFAOYSA-M 0.000 claims description 6
- 229910052786 argon Inorganic materials 0.000 claims description 4
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 claims description 4
- 230000001681 protective effect Effects 0.000 claims description 4
- 229910000519 Ferrosilicon Inorganic materials 0.000 claims description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 2
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 claims description 2
- XIXADJRWDQXREU-UHFFFAOYSA-M lithium acetate Chemical compound [Li+].CC([O-])=O XIXADJRWDQXREU-UHFFFAOYSA-M 0.000 claims description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 2
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 2
- 239000012530 fluid Substances 0.000 claims 1
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- 230000000694 effects Effects 0.000 abstract description 3
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- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 3
- 229910001416 lithium ion Inorganic materials 0.000 description 3
- 239000010405 anode material Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
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- 239000002210 silicon-based material Substances 0.000 description 2
- 229910001290 LiPF6 Inorganic materials 0.000 description 1
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- 229910021385 hard carbon Inorganic materials 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- AHADSRNLHOHMQK-UHFFFAOYSA-N methylidenecopper Chemical compound [Cu].[C] AHADSRNLHOHMQK-UHFFFAOYSA-N 0.000 description 1
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Abstract
本发明公开了一种预锂化硅基薄膜负极材料及其制备方法,包括沉积在集流体上的硅基薄膜,所述硅基薄膜和集流体之间沉积有里层碳薄膜,金属锂薄膜沉积在所述硅基薄膜上,所述金属锂薄膜上沉积有外层碳薄膜;本发明制得的硅基薄膜负极材料的体积膨胀效应低、循环性能优异、安全性能优异,并且本发明通过真空磁控溅射技术直接在集流体上一步法制备硅基负极薄膜,省去了传统电极制备过程中制浆,涂覆,辊压,烘干等步骤,有效简化了工艺流程,降低了制造成本和品控风险。
Description
技术领域
本发明属于锂离子电池负极材料技术领域,具体涉及一种预锂化硅基薄膜负极材料及其制备方法。
背景技术
目前市场上的锂离子电池普遍使用石墨类碳材料作负极材料,如人造石墨、天然石墨、中间相碳微球、软碳、硬碳等。但此类碳材料放电比容量较低,高倍率充放电性能较差,难以满足人们对高容量、长寿命锂离子电池的需求。因此,需要一种更高比容量的材料代替石墨类材料。硅负极有着远高于石墨负极的理论比容量(4200mAh/g),有着略高于石墨负极电压平台,使其充电时不会析锂,具有良好的安全性能,成为最有潜力代替石墨负极的材料。但其在充放电过程发生严重的体积变化,导致活性物质膨胀破裂,甚至与集流体分开,电接触变差,导致电池容量迅速下降。同时,巨大的体积变化使得固体电解质膜(SEI)不断地破裂和形成,不断地消耗正极存锂,电池容量不断降低,循环性能变差。
发明内容
针对现有技术的不足,本发明的目的在于提供一种预锂化硅基薄膜负极材料及其制备方法,有效地抑制了纯硅薄膜电极膨胀以及循环性能差的问题,提高了电池的循环性能,同时有效解决了硅基材料首效低的问题,进一步提升了电池的循环性能。
为了达到上述目的,本发明采用的技术方案是一种预锂化硅基薄膜负极材料,包括沉积在集流体上的硅基薄膜,所述硅基薄膜和集流体之间沉积有里层碳薄膜,金属锂薄膜沉积在所述硅基薄膜上,所述金属锂薄膜上沉积有外层碳薄膜。
进一步的,所述预锂化硅基薄膜负极材料的比容量1000~2500mAh/g,首次效率>80%。
本发明还提供一种预锂化硅基薄膜负极材料的制备方法,对集流体进行直流磁控溅射,按照里层碳薄膜、硅基薄膜、金属锂薄膜和外层碳薄膜的沉积顺序依次在集流体上沉积得到硅基薄膜负极材料。
进一步的,进行直流磁控溅射的具体步骤为,在保护气氛下,将石墨靶材、硅基靶材、锂源靶材分别安装在电源靶头上,通电后按照里层碳薄膜、硅基薄膜、金属锂薄膜和外层碳薄膜的顺序依次进行直流磁控溅射,溅射物沉积在集流体上。
进一步的,所述的集流体为铜集流体或涂碳铜集流体,两种集流体中铜集流体的厚度均为6μm~20μm,所述涂碳厚度为1~5μm。
进一步的,当集流体为铜集流体时,在磁控溅射前,先将集流体在超声波中依次用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮进行清洗,然后进行干燥处理,干燥处理后自然冷却至室温。
进一步的,所述保护气氛为高纯氩气,高纯氩气的流量为130~300SCCM,纯度为99.999%;直流磁控溅射所用的溅射腔体的本底真空度为1.0x10-3~3.0x10-3Torr,直流磁控溅射功率为1.8~5.4kW,直流磁控溅射的沉积温度为15℃~50℃。
进一步的,按所述沉积顺序循环1~3次,即形成1~3层交替堆叠层。
进一步的,里层碳薄膜厚度为20~100nm;所述硅基薄膜厚度为60~150nm;所述金属锂薄膜厚度为5~20nm;所述外层碳薄膜厚度为50~200nm。
进一步的,所述石墨靶材为晶体石墨或无定型石墨;所述硅基靶材为单晶硅、多晶硅、氧化亚硅、硅铁和硅铝中的一种;所述锂源靶材为金属锂、氢化锂、氟化锂、醋酸锂和氢氧化锂中至少一种。
与现有技术相比,本发明具有以下有益的技术效果:
本发明提供了一种体积膨胀效应低、循环性能优异和安全性能优异的硅基薄膜负极材料,其比容量1000~2500mAh/g,首次效率>88%,其中,碳薄膜作为弹性缓冲材料和良好的导电剂,有效地解决了纯硅薄膜电极膨胀以及循环性能差的问题,提高了电极的循环稳定性;同时金属锂薄膜实现了极片预锂,有效解决了硅基材料首效低的问题,进一步提升了电池的循环性能;
进一步的,本发明通过真空磁控溅射技术直接在集流体上一步法制备硅基负极薄膜,省去了传统电极制备过程中制浆,涂覆,辊压,烘干等步骤,有效简化了工艺流程,降低了制造成本和品控风险。
进一步的,本发明通过设置里层碳薄膜和外层碳薄膜,可以有效缓解硅脱嵌锂过程中的体积膨胀;本发明中将硅基薄膜沉积在里层碳薄膜上,有利于缓解硅基薄膜因体积膨胀从集流体脱落的情况;将金属锂薄膜沉积在外层碳薄膜下面,避免金属锂薄膜裸露在外,与空气或水分接触发生氧化反应,从而失效的情况。
进一步的,本发明将铜集流体在超声波中依次用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮进行清洗,保证了铜集流体较高的清洁度;当采用涂碳铜集流体时,涂碳铜集流体本身就是洁净的,因此不需要进行清洗步骤,既保证了清洁度也简化了制备负极材料的步骤。
附图说明
图1为本发明实施例1制备材料的结构示意图;
图2为本发明实施例1制备材料的充放电曲线;
图3为本发明实施例1制备材料的循环性能曲线;
具体实施方式
下面结合具体的实施例对本发明做进一步的详细说明,所述实施例仅仅是帮助理解本发明,不应视为对本发明的具体限制。
实施例1
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为60nm,再次沉积金属锂薄膜,沉积厚度为5nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环3次,形成3层交替堆积。
实施例2
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将晶体石墨靶材、单晶硅靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为100nm,其次沉积硅基薄膜,沉积厚度为60nm,再次沉积金属锂薄膜,沉积厚度为5nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环2次,形成2层交替堆积。
实施例3
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、硅铁靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为150nm,再次沉积金属锂薄膜,沉积厚度为5nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环2次,形成2层交替堆积。
实施例4
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材、金属锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为60nm,再次沉积金属锂薄膜,沉积厚度为20nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环2次,形成2层交替堆积。
实施例5
采用涂碳铜箔,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为60nm,再次沉积金属锂薄膜,沉积厚度为5nm,最后沉积外层碳薄膜,沉积厚度为200nm,如此顺序循环2次,形成2层交替堆积。
实施例6
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜和外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为80nm,再次沉积金属锂薄膜,沉积厚度为5nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环2次,形成2层交替堆积。
实施例7
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为50nm,其次沉积硅基薄膜,沉积厚度为60nm,再次沉积金属锂薄膜,沉积厚度为5nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环2次,形成2层交替堆积。
实施例8
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为60nm,再次沉积金属锂薄膜,沉积厚度为10nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环2次,形成2层交替堆积。
实施例9
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为60nm,再次沉积金属锂薄膜,沉积厚度为5nm,最后沉积外层碳薄膜,沉积厚度为100nm,如此顺序循环2次,形成2层交替堆积。
实施例10
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜、金属锂薄膜、外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材、氢化锂靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为60nm,再次沉积金属锂薄膜,沉积厚度为5nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环1次,形成1层交替堆积。
对比例1
第一步,将铜集流体在超声波中分别使用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮按顺序清洗一遍,随后放置干燥箱中60℃,干燥4h,然后自然冷却至室温。
第二步,进行磁控溅射,分别制备里层碳薄膜、硅基薄膜和外层碳薄膜,具体步骤为,在流量为150SCCM,纯度为99.999%的高纯氩气气氛下,溅射腔体的本底真空度为1.5×10-3Torr,溅射功率为2kW,将无定型石墨靶材、单晶硅靶材分别安装在电源靶头上,通电依次进行磁控溅射,磁控溅射顺序为先沉积里层碳薄膜,沉积厚度为20nm,其次沉积硅基薄膜,沉积厚度为60nm,最后沉积外层碳薄膜,沉积厚度为50nm,如此顺序循环2次,形成2层交替堆积。
将上述实施例1~10,及对比例所得样品组装全电池,全电池组装测试方法如下:直接将沉积好的硅基薄膜负极片,分切得到负极极片;然后以金属锂为对电极、1mol/L的LiPF6/EC+DMC+EMC(V/V=1:1:1)电解液、Celgard2400隔膜,组装成2025扣式电池。采用武汉金诺电子有限公司LAND电池测试系统常温测试,测试条件:首次充放电I=0.1C,循环I=0.1C,电压范围0.005-2.0VvsLi/Li+。
测试结果如表1所示
通过上表可以看出,对比例1没有进行预锂,所以首次效率比较低,只有86.8%,而实施例1-10均进行了预锂,预锂后电池的首次效率达到>88.6%,比对比例提升了2%;实施例1制备的硅基薄膜负极材料的充放电曲线如图2所示,可以看出该材料具有较高的可逆容量。
通过表中实施例1-10的可以明显看出,120th容量保持率明显高于对比例,实施例1制备的硅基薄膜负极材料的循环性能曲线如图3所示,可以看出该材料具有良好的循环性能,120th容量保持率>95%。
Claims (8)
1.一种预锂化硅基薄膜负极材料的制备方法,其特征在于,对集流体进行直流磁控溅射,按照里层碳薄膜、硅基薄膜、金属锂薄膜和外层碳薄膜的沉积顺序依次在集流体上沉积得到硅基薄膜负极材料;具体步骤为,在保护气氛下,将石墨靶材、硅基靶材、锂源靶材分别安装在电源靶头上,通电后按照里层碳薄膜、硅基薄膜、金属锂薄膜和外层碳薄膜的顺序依次进行直流磁控溅射,溅射物沉积在集流体上;所述的集流体为铜集流体或涂碳铜集流体,两种集流体中铜集流体的厚度均为6μm~20μm,所述涂碳厚度为1~5μm。
2.根据权利要求1所述的一种预锂化硅基薄膜负极材料的制备方法,其特征在于,当集流体为铜集流体时,在磁控溅射前,先将集流体在超声波中依次用蒸馏水、稀盐酸、蒸馏水、无水乙醇以及丙酮进行清洗,然后进行干燥处理,干燥处理后自然冷却至室温。
3.根据权利要求1所述的一种预锂化硅基薄膜负极材料的制备方法,其特征在于,所述保护气氛为高纯氩气,高纯氩气的流量为130~300SCCM,纯度为99.999%;直流磁控溅射所用的溅射腔体的本底真空度为1.0× 10-3~3.0× 10-3Torr,直流磁控溅射功率为1.8~5.4kW,直流磁控溅射的沉积温度为15℃~50℃。
4.根据权利要求1所述的一种预锂化硅基薄膜负极材料的制备方法,其特征在于,按所述沉积顺序循环1~3次,即形成1~3层交替堆叠层。
5.根据权利要求1所述的一种预锂化硅基薄膜负极材料的制备方法,其特征在于,里层碳薄膜厚度为20~100nm;所述硅基薄膜厚度为60~150nm;所述金属锂薄膜厚度为5~20nm;所述外层碳薄膜厚度为50~200nm。
6.根据权利要求1所述的一种预锂化硅基薄膜负极材料的制备方法,其特征在于,所述石墨靶材为晶体石墨或无定型石墨;所述硅基靶材为单晶硅、多晶硅、氧化亚硅、硅铁和硅铝中的一种;所述锂源靶材为金属锂、氢化锂、氟化锂、醋酸锂和氢氧化锂中至少一种。
7.根据权利要求1-6任一项所述的制备方法制得的预锂化硅基薄膜负极材料,其特征在于,包括沉积在集流体上的硅基薄膜,所述硅基薄膜和集流体之间沉积有里层碳薄膜,金属锂薄膜沉积在所述硅基薄膜上,所述金属锂薄膜上沉积有外层碳薄膜。
8.根据权利要求7所述的一种预锂化硅基薄膜负极材料,其特征在于,所述预锂化硅基薄膜负极材料的比容量1000~2500mAh/g,首次效率>80%。
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