CN111273170A - Keyboard character key module testing device and method - Google Patents

Abstract

The invention discloses a keyboard character key module testing device and a method, comprising a testing jig, a testing computer and a keyboard character key module to be tested, wherein the testing computer is connected with the testing jig through a USB and supplies power to the testing jig; the test fixture comprises a built-in test board, an upper computer interface and a test interface; the test fixture is connected with the test adapter plate through the test interface and is connected with the keyboard character key module to be tested through the test connecting plate; connecting a test computer through an upper computer interface; the testing computer starts a testing program, the word key modules are tested one by one to conduct impedance, the testing data are uploaded synchronously, and the testing software displays the testing result. The invention can detect the word key impedance value, supports the bar code gun input, is used for scanning the bar code of the word key module to be detected, inputs the bar code into a test computer, and correspondingly stores the test result of each product. And after the test is finished, all test log files are recorded, so that the follow-up query is facilitated.

Description

Keyboard character key module testing device and method

Technical Field

The invention relates to a membrane keyboard testing technology, in particular to a keyboard character key module testing device and a method.

Background

With the continuous development of science and technology and the improvement of living standard of people, desktop computers, notebook computers, tablet computers and other equipment become necessities for office and entertainment of consumers. The keyboard is widely applied to computers and various electronic product devices for inputting texts and commands as the most commonly used matched input device, has the function of playing a very important role in the field of external equipment, and is effectively convenient for human-computer interaction between operators and the devices. The existing computers and keyboards on the market are in various types, but the notebook computer/tablet keyboard is popular with more and more consumers by virtue of the light and thin character key design mode, and one of the core components of the notebook computer and the tablet keyboard is a character key module.

In the current word key module production process, the technical staff is only with the universal meter and simply tests whether each word key of sampling inspection sample presses the on-resistance at the interface end of word key module and is in the specification range, and the product of shipment in batches has not tested word key on-resistance value, and some like this cause the too big module of word key impedance to fail management and control quality because of the production process. The impedance of a single or a plurality of keys on the key module is too large (an over-gauge), the MCU of the notebook computer or the flat keyboard cannot judge whether the keys of the impedance over-gauge are pressed, and the assembled notebook computer or the flat keyboard is a defective product.

Disclosure of Invention

The purpose of the invention is as follows: in view of the above problems, the present invention provides a keyboard key module testing device and method, which test the impedance value of each key on each key module, and effectively control the shipment quality of the key module.

The technical scheme is as follows: in order to realize the purpose of the invention, the technical scheme adopted by the invention is as follows: a keyboard character key module testing device comprises a testing jig, a testing computer and a keyboard character key module to be tested, wherein the testing computer is connected with the testing jig through a USB and supplies power to the testing jig; the test fixture comprises a built-in test board, an upper computer interface and a test interface; the test fixture is connected with the test adapter plate through the test interface and is connected with the keyboard character key module to be tested through the test connecting plate; connecting a test computer through an upper computer interface; the testing computer starts a testing program, the word key modules are tested one by one to conduct impedance, the testing data are uploaded synchronously, and the testing software displays the testing result.

Further, the device also comprises a USB bar code gun which is used for scanning the bar code of the character key module to be tested and inputting the bar code into a test computer.

Furthermore, the built-in test board comprises an ADC conversion chip, a test interface connector, an ADC value dividing resistor, a USB to SPI conversion chip, an upper computer interface circuit and an upper computer interface connector; obtaining a word key impedance value through an ADC value divider resistor, and sending the word key impedance value to an ADC conversion chip for digital-to-analog conversion; after the communication conversion is carried out by the ADC conversion chip, the data is sent to an upper computer interface circuit and is connected with a test computer through an upper computer interface connector; and after the test computer acquires the ADC value, calculating the word key impedance value.

Furthermore, the peripheral circuit of the ADC conversion chip is also provided with a test buzzer and a test indicator light, and in the keyboard key test process, when a single key is pressed and conducted, the test buzzer can call and the test indicator light can be turned on at the same time.

Further, the test interface connector comprises 8 reserved row interfaces R0-R7 and 20 reserved column interfaces S0-S19; the ADC value-taking divider resistors are respectively connected to R0-R7 interfaces, and the ADC conversion chips are connected with row and column interfaces of the test interface connector one by one and communicated through row and column selection resistors.

A keyboard character key module testing method comprises the following steps:

(1) the testing jig, the keyboard character key module to be tested and the testing computer are connected according to the regulations;

(2) opening a test computer to start a test program;

(3) scanning the bar code of the character key module to be tested by using a bar code gun;

(4) clicking a test button on the test interface, pressing the character keys one by one for testing, displaying the impedance values and the corresponding row and column positions, and listing the unqualified impedance values independently;

(5) if the keyboard character key module has unqualified character keys, the keyboard character key module is classified as an unqualified product.

Further, the lower computer program includes:

(1) starting a program and initializing;

(2) scanning line by line, traversing the rows and the columns, conducting the character keys one by one, and judging whether conducting is carried out;

(3) and performing a character key pressing processing program on the conducting character key.

Further, the key depression processing program includes:

(1) when the character key is pressed and conducted, a test buzzer and a test indicator lamp for testing the character key are both triggered;

(2) acquiring a digital impedance value from an ADC conversion chip;

(3) calculating an actual word key impedance value;

(4) and uploading the row and column positions of the keys and the impedance values to an upper computer.

Further, the upper computer program includes:

(1) starting a program and initializing;

(2) receiving the uploaded string data;

(3) analyzing data to obtain the row and column positions and the impedance values of the keys;

(4) carrying out a filtering value processing program;

(5) displaying the row and column positions of the word keys and the average impedance value after filtering processing on a software interface of the upper computer;

(6) judging whether all the keys are received, if so, judging whether all the key impedance values are in a set range, and if so, judging that the product is qualified;

(7) if the word key resistance value is not in the set range, the product is judged to be unqualified.

Further, the filtering value processing program comprises:

(1) storing the actual impedance value converted by the ADC value into a matrix;

(2) averaging all stored values in the matrix;

(3) removing impedance values in the matrix that are far below the average value and far above the average value;

(4) averaging the remaining values in the matrix;

(5) and outputting the filtered average impedance value.

Has the advantages that: the invention can detect the word key impedance value, supports the bar code gun input, is used for scanning the bar code of the word key module to be detected, inputs the bar code into a test computer, and correspondingly stores the test result of each product. During testing, the key conduction is also provided with a buzzer and a test indicator light prompt function. And when the test is finished, recording all test log files, so that the follow-up query is facilitated in the future. The invention can expand and modify functions according to requirements, and has low test cost and strict test result.

Drawings

FIG. 1 is a schematic view of a keyboard key module testing apparatus according to the present invention;

FIG. 2 is a circuit diagram of a built-in test board;

FIG. 3 is a schematic diagram of a host computer interface circuit;

FIG. 4 is a schematic view of a test interface connector;

FIG. 5 is a schematic diagram of an ADC value divider resistor;

FIG. 6 is a schematic diagram of an ADC conversion chip and its peripheral circuits;

FIG. 7 is a schematic diagram of a row and column select resistor;

FIG. 8 is a schematic diagram of a USB to SPI chip;

FIG. 9 is a schematic diagram of a reserved test port;

FIG. 10 is a schematic diagram of the calculation of the word key impedance values;

fig. 11 is a flowchart of the lower computer program;

FIG. 12 is a flowchart of lower computer initialization;

fig. 13 is a flowchart of a key depression processing routine;

FIG. 14 is a flow chart of a host computer program;

FIG. 15 is a flow chart of host computer initialization;

fig. 16 is a flowchart of a filter value processing routine.

Detailed Description

The technical solution of the present invention is further described below with reference to the accompanying drawings and examples.

As shown in fig. 1, the keyboard character key module testing device of the present invention includes a testing fixture, wherein a testing computer with a display is used as an upper computer, and the testing computer is connected with the testing fixture through a USB and supplies power to the testing fixture.

The test fixture comprises a built-in test board, an upper computer interface CN1 and a test interface CN 2. The test fixture is connected with the test adapter plate through a test interface CN2, is connected with the keyboard character key module to be tested through a test connecting plate, and is connected with a test computer through an upper computer interface CN 1. The testing computer starts a testing program, the word key modules are conducted one by one, the conduction impedance is tested, the testing data are uploaded synchronously, and the testing software displays the testing state and the testing result.

The keyboard character key module testing device also comprises a bar code gun connected with the USB, and the bar code gun is used for scanning the bar code of the character key module to be tested, inputting the bar code into a testing computer, and correspondingly storing the testing result of each product.

As shown in fig. 2, the test board circuit includes an ADC conversion chip, a test interface connector CN2, an ADC value divider resistor, a USB to SPI chip, an upper computer interface circuit, and an upper computer interface connector CN 1. And obtaining a word key impedance value through the ADC value-taking voltage-dividing resistor, and sending the word key impedance value to an ADC conversion chip for digital-to-analog conversion. The ADC conversion chip is in serial communication, so that the ADC conversion chip is connected with the USB-to-SPI conversion chip, and after communication conversion, the converted ADC conversion chip is sent to an upper computer interface circuit and is connected with a test computer through an upper computer interface connector CN 1. And after the test computer acquires the ADC value, calculating the word key impedance value.

As shown in fig. 3, during testing, the USB interface is connected to the testing computer for data transmission and power supply. The upper computer interface circuit comprises a data transmission part and a power supply part, wherein the power supply part comprises a 500mA fuse F1, a power indicator lamp D1, a USB connection test computer, and a power indicator lamp D1 which is lighted up to indicate connection. The DATA transmission part comprises D-/DATA and D +/CLK ports and is connected with RC filter in series.

As shown in fig. 4, the testing interface connector CN2 connected to the interface end of the keyboard keypad module includes 8 reserved row interfaces R0-R7, 20 reserved column interfaces S0-S19, and can test 8 × 20 keyboard keypad modules.

As shown in fig. 5, voltage dividing resistors are provided for a plurality of ADCs, and are respectively connected to the interfaces R0-R7, and have the same value of 2K. As shown in fig. 6, the ADC conversion chip and its peripheral circuit adopt a 10-bit ADC chip ATMEGA2560, the ADC conversion chip is connected with the row and column interfaces of the test interface connector CN2 one by one, and is connected through the row and column selection resistors as shown in fig. 7, and different key modules are selected to be short-circuited according to different matrix requirements.

The VCC ports 10PIN/31PIN/61PIN/80PIN/100PIN of the chip ATMEGA2560 are connected with a power supply filter capacitor, and the XTAL1 and XTAL2 ports of the chip ATMEGA2560 are connected with a 16M HZ crystal oscillator Y1. The peripheral circuit of the ADC conversion chip further comprises a test buzzer BZ1 and a word key test indicator lamp D2, and in the process of testing the word keys of the keyboard, when a single word key is pressed and conducted, the buzzer can call and simultaneously the test indicator lamp can light.

As shown in FIG. 8, the USB-to-SPI chip adopts an SN32F263X I chip, and serial SPI communication between the SN32F263X and the MCU ATMEGA2560 is realized through four connection ports MOSI/MISO/SCK/SS. The other end is connected with the D-/DATA and D +/CLK ports of the upper computer interface circuit, and the digital impedance value obtained by the ADC conversion chip is uploaded to an upper computer.

As shown in FIG. 9, the test board of the present invention further reserves test ports TP 1-TP 8.

As shown in fig. 10, after the upper computer obtains the digital impedance value, the word-key impedance value is calculated in the principle that ATMEGA2560 has 10-bit ADC, 2 × 1024, so:

wherein, Value refers to the digital impedance Value after ADC conversion, and Rx refers to the word key impedance Value.

The invention relates to a keyboard character key module testing method, which comprises the following steps:

(1) the testing jig, the keyboard character key module to be tested and the testing computer are connected according to the regulations;

the keyboard character key module to be tested is connected to the test fixture through the test connecting plate, and the test fixture is connected with the test computer through the USB line.

(2) Opening a test computer to start a test program;

(3) scanning the bar code of the character key module to be tested by using a bar code gun;

(4) and clicking a test button on the test interface, pressing the word keys one by one for testing, displaying the impedance value and the corresponding position on the test interface, and listing the unqualified impedance values independently. If only one unqualified character key exists in the keyboard character key module, the keyboard character key module is classified as an unqualified product.

Meanwhile, the test log file is saved for later tracing. The keyboard word key module impedance testing device can also be arranged on automatic equipment, and the keyboard word key is automatically tested by using a connecting rod device.

As shown in fig. 11, the lower computer program includes:

(1) a start routine for initialization, as shown in fig. 12;

(2) scanning line by line, traversing the rows and the columns, conducting the character keys one by one, and judging whether conducting is carried out;

(3) and performing a character key pressing processing program on the conducting character key.

As shown in fig. 13, the key depression processing program includes:

(1) when the character key is pressed and conducted, a test buzzer and a test indicator lamp for testing the character key are both triggered;

(2) acquiring a digital impedance Value from an ADC conversion chip;

(3) calculating an actual word key impedance value;

(4) and uploading the specific row and column positions where the word keys are located and the impedance values to an upper computer.

As shown in fig. 14, the upper computer program includes:

(1) a start program for initialization, as shown in fig. 15;

(2) receiving the uploaded string data;

(3) analyzing data to obtain the row and column positions and the impedance values of the keys;

(4) a filtering value processing program is performed, as shown in fig. 16, for processing the key bounce;

(5) displaying the row and column positions of the word keys and the average impedance value after filtering processing on a software interface of the upper computer;

(6) judging whether all the keys are received, if so, judging whether all the key impedance values are in a set range, and if so, judging that the product is qualified;

(7) if one word key impedance value is not in the set range, the product is judged to be unqualified.

As shown in fig. 16, the filter value processing program includes:

(1) storing the actual impedance value converted by the ADC value into a matrix;

(2) averaging all stored values in the matrix;

(3) removing impedance values far below the average value and far above the average value from the matrix;

(4) averaging the remaining values in the matrix;

(5) and outputting the filtered average impedance value.

Claims (10)

1. A keyboard word key module testing device is characterized by comprising a testing jig, a testing computer and a keyboard word key module to be tested, wherein the testing computer is connected with the testing jig through a USB and supplies power to the testing jig;

the test fixture comprises a built-in test board, an upper computer interface and a test interface; the test fixture is connected with the test adapter plate through the test interface and is connected with the keyboard character key module to be tested through the test connecting plate; connecting a test computer through an upper computer interface;

the testing computer starts a testing program, the word key modules are tested one by one to conduct impedance, the testing data are uploaded synchronously, and the testing software displays the testing result.

2. The keyboard word key module testing device of claim 1, further comprising a USB bar code gun for scanning a bar code of the word key module under test and inputting the bar code into a testing computer.

3. The keyboard word key module testing device of claim 1, wherein the built-in test board comprises an ADC conversion chip, a test interface connector, an ADC value divider resistor, a USB to SPI chip, an upper computer interface circuit and an upper computer interface connector;

obtaining a word key impedance value through an ADC value divider resistor, and sending the word key impedance value to an ADC conversion chip for digital-to-analog conversion; after the communication conversion is carried out by the ADC conversion chip, the data is sent to an upper computer interface circuit and is connected with a test computer through an upper computer interface connector; and after the test computer acquires the ADC value, calculating the word key impedance value.

4. The keyboard key module testing device of claim 3, wherein the peripheral circuit of the ADC conversion chip is further provided with a testing buzzer and a testing indicator light, and in the keyboard key testing process, when a single key is pressed and conducted, the testing buzzer can call and the testing indicator light can be lighted at the same time.

5. The keyboard keypad testing device of claim 3, wherein the testing interface connector comprises 8 reserved row interfaces R0-R7, 20 reserved column interfaces S0-S19; the ADC value-taking divider resistors are respectively connected to R0-R7 interfaces, and the ADC conversion chips are connected with row and column interfaces of the test interface connector one by one and communicated through row and column selection resistors.

6. A keyboard key module testing method, based on the keyboard key module testing device of claims 1-5, characterized by comprising the steps of:

(1) the testing jig, the keyboard character key module to be tested and the testing computer are connected according to the regulations;

(2) opening a test computer to start a test program;

(3) scanning the bar code of the character key module to be tested by using a bar code gun;

(4) clicking a test button on the test interface, pressing the character keys one by one for testing, displaying the impedance values and the corresponding row and column positions, and listing the unqualified impedance values independently;

(5) if the keyboard character key module has unqualified character keys, the keyboard character key module is classified as an unqualified product.

7. The keyboard word key module testing method of claim 6, wherein the lower computer program comprises:

(1) starting a program and initializing;

(2) scanning line by line, traversing the rows and the columns, conducting the character keys one by one, and judging whether conducting is carried out;

(3) and performing a character key pressing processing program on the conducting character key.

8. The keyboard word key module testing method of claim 7, wherein the word key pressing process procedure comprises:

(1) when the character key is pressed and conducted, a test buzzer and a test indicator lamp for testing the character key are both triggered;

(2) acquiring a digital impedance value from an ADC conversion chip;

(3) calculating an actual word key impedance value;

(4) and uploading the row and column positions of the keys and the impedance values to an upper computer.

9. The keyboard word key module testing method of claim 6, wherein the upper computer program comprises:

(1) starting a program and initializing;

(2) receiving the uploaded string data;

(3) analyzing data to obtain the row and column positions and the impedance values of the keys;

(4) carrying out a filtering value processing program;

(5) displaying the row and column positions of the word keys and the average impedance value after filtering processing on a software interface of the upper computer;

(6) judging whether all the keys are received, if so, judging whether all the key impedance values are in a set range, and if so, judging that the product is qualified;

(7) if the word key resistance value is not in the set range, the product is judged to be unqualified.

10. The keyboard word key module testing method of claim 9, wherein the filter value processing procedure comprises:

(1) storing the actual impedance value converted by the ADC value into a matrix;

(2) averaging all stored values in the matrix;

(3) removing impedance values in the matrix that are far below the average value and far above the average value;

(4) averaging the remaining values in the matrix;

(5) and outputting the filtered average impedance value.

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