CN102193849A - Keyboard testing system - Google Patents

Abstract

A keyboard testing system, used for testing the keyboard function of a motherboard, which includes: a control unit, used to output an execution instruction; a microprocessor, used to receive the execution instruction, and sequentially output according to the execution instruction A number of control signals; a keyboard switch unit, including a number of electronic switches, which are used to respectively receive a number of control signals output by the microprocessor and conduct them sequentially; a keyboard interface, connected to a number of electronic switches of the keyboard switch unit; and a main board , including a keyboard interface circuit, the keyboard interface circuit is connected to a plurality of electronic switches of the keyboard switch unit through the keyboard interface, and when the plurality of electronic switches in the keyboard unit are sequentially turned on, the main board sequentially outputs the coding information of the corresponding keys. The keyboard testing system of the present invention does not need to manually tap all the keys on the keyboard for detection, so the detection efficiency and speed can be improved, and labor costs can be saved.

Description

Keyboard Test System

【Technical field】

The invention relates to a test system, in particular to a keyboard test system applied to a portable electronic product such as a notebook computer.

【Background technique】

The keyboard is the main input device of the computer, and it is essential in the field of computer manufacturing to perform a functional test on the keyboard to ensure that the keyboard can input normally.

The keyboard is mainly composed of internal control circuit and external keys. The key wiring inside the keyboard is generally arranged in a matrix, consisting of row signal lines and column signal lines. By setting a switch to be selectively turned on, each switch corresponds to a key on the outside of the keyboard. When a key on the keyboard is pressed, its corresponding switch is turned on, thus the corresponding row and column signal lines are short-circuited, and then the coded information of the key is obtained through the keyboard scanning circuit.

The keyboard control circuit of the notebook computer is arranged on the main board, and the keyboard function is realized by the main board. At present, various notebook computer manufacturers generally still adopt a manual method to test the keyboard of the notebook computer, that is, the operator presses all the keys on the keyboard one by one to test. The keyboard of a general notebook computer is composed of 84 keys. If it takes 1 second to hit a key, it will take more than 80 seconds to test the entire keyboard of the notebook computer. Therefore, the detection efficiency is not high; and manual detection is easy because of detection The negligence of personnel leads to detection errors, so the detection accuracy is not high; in addition, manual detection requires a lot of manpower, and the loss of keyboards will be incurred during the detection process, so the cost is relatively high.

【Content of invention】

In view of this, the object of the present invention is to provide a keyboard testing system with relatively high detection efficiency and detection accuracy and relatively low cost.

In order to achieve the above object, the keyboard testing system of the present invention is used to detect the keyboard function of a main board, and it is characterized in that, the keyboard testing system comprises:

a control unit for outputting an execution command;

A microprocessor, connected to the control unit, is used to receive the execution instruction and sequentially output several control signals according to the execution instruction;

A keyboard switch unit connected to the microprocessor, the keyboard switch unit includes a plurality of electronic switches, the plurality of electronic switches respectively receive a plurality of control signals output by the microprocessor and are turned on sequentially;

a keyboard interface, connected to a plurality of electronic switches of the keyboard switch unit; and

A main board, including a keyboard interface circuit, the keyboard interface circuit is connected to a plurality of electronic switches of the keyboard switch unit through the keyboard interface, when the plurality of electronic switches in the keyboard switch unit are turned on in sequence, the main board outputs the codes of the corresponding keys in sequence information.

Compared with the prior art, the keyboard testing system provided by the present invention controls several electronic switches in the keyboard switch unit to conduct sequentially through the microprocessor, so that the main board outputs the coding information of the corresponding keys in sequence, thereby judging according to the coding information output by the main board. Whether the keyboard function of the motherboard is normal. The keyboard test system of the present invention does not need to manually tap all the keys on the keyboard for detection, so the detection efficiency and detection speed are relatively high, and the cost is reduced due to saving manpower and keyboard wear and tear.

【Description of drawings】

FIG. 1 is a schematic diagram of key wiring inside a conventional keyboard.

FIG. 2 is a schematic diagram showing the appearance of a notebook computer used in the keyboard testing system of the present invention.

FIG. 3 shows an internal block diagram of a preferred embodiment of the keyboard testing system of the present invention.

FIG. 4 is a circuit diagram of a preferred embodiment of the testing unit in the keyboard testing system of the present invention.

【Detailed ways】

The present invention will be described in further detail below in conjunction with accompanying drawing description and preferred embodiment:

Please refer to FIG. 2 and FIG. 3 , the preferred embodiment of the keyboard testing system of the present invention is used for functional testing of the keyboard 2 of a notebook computer 1 . The keyboard testing system includes a testing unit 100 , a main board 200 , a comparing unit 300 and an indicating unit 400 . The test unit 100 includes a control unit 110 , a microprocessor 120 , a keyboard switch unit 130 and a keyboard interface 140 . The motherboard 200 includes a keyboard interface circuit 210 . The motherboard 200 is set in the notebook computer 1 .

Please refer to FIG. 4 , the control unit 110 includes a control switch SW1 , two resistors R1 , R2 and two capacitors C1 , C2 . In this preferred embodiment, the control switch SW1 is a key switch. The first terminal 1 of the control switch SW1 is grounded and connected to the second terminal 2 through the capacitor C1. The second terminal 2 of the control switch SW1 is connected to a power supply VCC through the resistor R1, and connected to the microprocessor 120 through the resistor R2. The second terminal 2 of the control switch SW1 is also grounded through the capacitor C2.

The microprocessor 120 is a programmable integrated circuit control chip, such as a model 80C51 control chip. The microprocessor 120 includes a first set of input and output pins P1.0-P1.7, a second set of input and output pins P2.0-P2.7 and a third set of input and output pins P3.0. The third I/O pin P3.0 of the microprocessor 120 is connected to the second terminal 2 of the control switch SW1 through the resistor R2. The first set of I/O pins P1.0-P1.7 and the second set of I/O pins P2.0-P2.7 of the microprocessor 120 are connected to the keyboard switch unit 130 . In addition, in order to ensure that the microprocessor 120 can work normally, the microprocessor 120 should also include other pins such as power supply pins, ground pins, and clock pins, as well as circuits connected to these pins, such as power supply pins. circuits, clock circuits, etc., which are prior art and will not be repeated here.

The keyboard switch unit 130 includes sixteen MOS (Metal Oxide Semiconductor, Metal Oxide Semiconductor) field effect transistors Q1-Q16. The gates of each MOS field effect transistor Q1-Q16 are respectively connected to the first group of input and output pins P1.0-P1.7 and the second group of input and output pins P2.0-P1.7, and are respectively connected through A resistor R3 is connected to its corresponding source. The sources of each MOS field effect transistor Q1 - Q16 are respectively connected to an input pin corresponding to the keyboard interface 140 . The drains of each MOS field effect transistor Q1-Q16 are respectively connected to an output pin corresponding to the keyboard interface 140 through a resistor R4. In other implementation manners, the sixteen MOS field effect transistors Q1-Q16 can also be other electronic switches, such as triodes, or a combination of different electronic switches such as MOS field effect transistors and triodes.

The keyboard interface 140 can be a connector, which includes eight input pins KI0-KI7 and sixteen output pins KO0-KO15. The input pins KI0 - KI7 and the output pins KO0 - KO15 of the keyboard interface 140 are connected to the keyboard interface circuit 210 of the motherboard 200 . In this preferred implementation mode, the source and drain electrodes of each MOS field effect transistor Q1-Q16 all correspond to an input pin and an output pin of the keyboard interface 140, but any two MOS field effect transistors The input pin and the output pin of the keyboard interface 140 that the drain and the source are connected are not identical, that is, if the source electrodes of two MOS field effect transistors are connected to the same input pin of the keyboard interface 140, then the The output pins of the keyboard interface 140 connected to the drains of the two MOS field effect transistors must be different, so as to control different keys on the keyboard 2 of the notebook computer 1 .

Please refer to FIG. 1 again. FIG. 1 is an example of a 4×4 keyboard matrix arrangement, in which key layout lines are composed of four row signal lines P1-P4 and four column signal lines L1-L4. The 4*4 arrangement produces sixteen intersections in total, and each intersection is provided with a key switch. Now take the row signal lines P1, P12 and column signal lines L1, L2 as an example, a key switch K1 is arranged at the intersection of the row signal line P1 and the column signal line L1, and a key switch K1 is arranged at the intersection of the row signal line P2 and the column signal line L2. A key switch K2 is provided. According to the analysis in Figure 1, if the key switch K1 works normally, it can be determined that the row signal line P1 and the column signal line L1 are working normally; if the key switch K2 works normally, it can be determined that the row signal line 21 and the column signal line 22 works fine. Therefore, in FIG. 1 , it is only necessary to confirm that the key switches K1 , K2 , K3 , and K4 are working normally to determine that other keys in FIG. 1 can also work normally, because there is no need to detect each key.

Based on the above analysis and in combination with the internal button wiring form of the notebook computer 1, it is known that the END key, HOME key, left SHIFT key, { key, % key, (key, F9 key, * Key, @ key, E key, left WIN key, left ALT key, right WIN key, right CTRL key, F1 key, FN key and other sixteen keys in the key cable are located in the same position as the key switch in Figure 1 K1, K2, K3, and K4 are consistent. Therefore, it is only necessary to test the above sixteen keys to determine whether the entire keyboard 2 can work normally, without testing all the keys on the keyboard 2 of the notebook computer 1 one by one.

Therefore, the keyboard testing system of the present invention controls the END key, HOME key, left SHIFT key, { key, % key, (key, F9 key, * key, @ key, E key, left WIN key, left ALT key, right WIN key, right CTRL key, F1 key, FN key and other sixteen keys, that is, sixteen MOS field effect transistors Q1- Q16 simulates the situation in which the above sixteen keys are pressed. For example, when the MOS field effect transistor Q1 is used to control the END key on the keyboard 2, then when the MOS transistor Q1 is turned on, it means If the END key is pressed, the row signal line and the column signal line where the END key is located are short-circuited, thereby outputting the key code information of the END key.

Therefore, the microprocessor 120 in the keyboard test system of the present invention also stores a corresponding test program, so that the first group of output pins P1.0-P1.7 and the second group of input and output pins P2.0 and P2.7 can Sequentially output high-level control signals to control the corresponding MOS field effect transistors Q1-Q16 to conduct sequentially, so that the row and column signal lines corresponding to the above-mentioned sixteen keys on the motherboard 200 are sequentially short-circuited to output the above-mentioned sixteen keys. Encoding information for the key.

The comparison unit 300 is used to store a standard encoding information, that is, when the END key, HOME key, left SHIFT key, { key, % key, ( key, F9 key, * key, @ key, E key, The encoded information output by sixteen keys such as the left WIN key, the left ALT key, the right WIN key, the right CTRL key, the F1 key, and the FN key during normal operation. The comparison unit 300 is also used to output the main board 200 during the test The key coding information of the key is compared with the standard coding information to confirm whether the keyboard function of the motherboard 200 is normal, and output an indication signal to the indication unit 400 according to the comparison result. The indication unit 400 indicates according to the indication signal to indicate Whether the keyboard function of the main board 200 is normal. Wherein, the indication unit 400 can be a buzzer or an indicator light.

The specific working process of the keyboard testing system of the present invention is as follows: in general, the third input and output pin P3.0 of the microprocessor 120 is pulled to a high level by the power supply VCC. When the keyboard 2 of the notebook computer 1 is to be functionally tested, press the control switch SW1 in the control unit 100 to make the input and output pin P3.0 of the microprocessor 120 grounded through the resistor R2, thereby providing a low level signal Provide the third input and output pin P3.0 of this microprocessor 120 as execution instruction, this microprocessor 120 just starts to execute the test program stored in its interior after receiving this execution instruction, the first of this microprocessor 120 The first group of input and output pins P1.0-P1.7 and the second group of input and output pins P2.0-P2.7 will sequentially output high-level control signals to control sixteen MOS field effect transistors Q1-Q16 to conduct sequentially , so that the main board 200 sequentially outputs the END key, HOME key, left SHIFT key, { key, % key, ( key, F9 key, * key, @ key, E key, left WIN key, left ALT key, right WIN key , Right CTRL key, F1 key, FN key and other sixteen key coding information.

After the execution of the test program inside the microprocessor 120 is completed, the comparison unit 300 compares the coded information output by the main board 200 with the standard coded information stored inside, and if the key coded information output by the main board 200 is consistent with the standard coded information , the comparison unit 200 outputs an indication signal to the indication unit 400, and the indication unit 400 performs an indication according to the indication signal to indicate that the keyboard of the motherboard 200 is functioning normally. If the encoded information output by the mainboard 200 is inconsistent with the standard encoded information, the comparing unit 200 outputs another indication signal to the indicating unit 400, and the indicating unit 400 indicates according to the other indicating signal to indicate that the keyboard function of the mainboard 200 is not normal .

In other embodiments, the keyboard testing system of the present invention may also include a display screen connected to the main board 200 for displaying the standard coding information and the key coding information output by the main board 200 in the testing process, so as to understand more intuitively The test results of this keyboard test system. Therefore, in other embodiments, the comparing unit 300 and the indicating unit 400 can also be omitted, and it is directly determined whether the keyboard function of the main board 200 is normal according to the key code information output by the main board 200 .

In addition, since the keys of the keyboards of different notebook computers may have different positions in the key cable, in other implementation manners, the sixteen MOS field effect transistors Q1-Q16 can also be used to control another notebook computer Other keys on the keyboard, as long as the positions of these keys in the key line are the same as the END key, HOME key, left SHIFT key, { key, % key, ( key, F9 key of the notebook computer 1 in the present embodiment, , * key, @ key, E key, left WIN key, left ALT key, right WIN key, right CTRL key, F1 key, the same position as the FN key.In addition, the keyboard testing system of the present invention can also be used for testing The keyboard function of the motherboard of other portable electronic products, such as mobile phone, PDA (Personal Digital Assistant, personal work assistant), etc., its test principle is the same as above.

Claims (10)

1. a keyboard test system is used for the keypad function of a mainboard is detected, and it is characterized in that this keyboard test system comprises:

One control module is used to export an execution command;

One microprocessor links to each other with this control module, is used to receive this execution command, and exports some control signals successively according to this execution command;

One keyboard switch unit links to each other with this microprocessor, and this keyboard switch unit comprises some electronic switches, and these some electronic switches are used for receiving respectively the some control signals and the conducting successively of this microprocessor output;

One keyboard interface links to each other with some electronic switches of this keyboard switch unit; And

One mainboard, comprise a keyboard interface circuit, this keyboard interface circuit links to each other with some electronic switches of this keyboard switch unit by this keyboard interface, and this mainboard is exported the coded message of corresponding button successively when the electronic switch in this keyboard switch unit conducting successively.

2. keyboard test system as claimed in claim 1, it is characterized in that: also comprise a comparing unit, link to each other with this mainboard, this comparing unit is used to store a standard code information, and keyboard-coding information and this standard code information of the output of this mainboard compared, and export an indicator signal according to comparison result.

3. keyboard test system as claimed in claim 2 is characterized in that: also comprise an indicating member, link to each other with this comparing unit, be used to receive the indicator signal of this comparing unit output and indicate.

4. keyboard test system as claimed in claim 1 is characterized in that: also comprise a display screen, link to each other with this mainboard, be used to show the coded message of the corresponding button of this mainboard output.

5. keyboard test system as claimed in claim 1 is characterized in that: this control module comprises a gauge tap, the first end ground connection of this gauge tap, and its second end links to each other with this microprocessor by a resistance.

6. keyboard test system as claimed in claim 1 is characterized in that: this keyboard switch unit comprises 16 electronic switches.

7. keyboard test system as claimed in claim 1 is characterized in that: each this electronic switch is a metal oxide semiconductor field effect tube.

8. keyboard test system as claimed in claim 1 is characterized in that: each this electronic switch is a triode.

9. keyboard test system as claimed in claim 1 is characterized in that: these some electronic switches are the combination of metal oxide semiconductor field effect tube and triode.

10. keyboard test system as claimed in claim 1 is characterized in that: corresponding key is END key, HOME key, left SHIFT key, { key, % key, (key, F9 key, * key, @ key, E key, left WIN key, left ALT key, right WIN key, right CTRL key, F1 key and the FN key on the notebook computer on this mainboard.

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