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CN110673022A - Membrane keyboard PCBA testing device and method - Google Patents

Membrane keyboard PCBA testing device and method Download PDF

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Publication number
CN110673022A
CN110673022A CN201911079508.4A CN201911079508A CN110673022A CN 110673022 A CN110673022 A CN 110673022A CN 201911079508 A CN201911079508 A CN 201911079508A CN 110673022 A CN110673022 A CN 110673022A
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test
pcba
fixture
interface
key
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肖国晟
苏冠勳
尹海松
文发慧
许小丽
苏品忠
陈桂林
吴胜堂
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Dongguan Meitai Electronic Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance

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Abstract

本发明公开了一种薄膜键盘PCBA测试装置及方法,包括测试治具,测试治具通过治具探针连接PCBA金手指,并连接上位机;测试治具包括内置测试板,内置测试板包括MCU和若干选通开关单元,治具探针将PCBA键行列分别连接于不同的选通开关单元,选通开关单元的使能端和选通控制端均连接于MCU,MCU控制PCBA键行列的短路导通,薄膜键盘PCBA测试前需开启上位机测试程序,薄膜键盘PCBA微处理单元通过USB通讯或其他无线通讯方式将测试数据同步上传给上位机,上位机测试软件显示测试状态及测试结果。本发明采用一键启动,模拟键盘所有键测试全功能,操作简单,测试效率高。

Figure 201911079508

The invention discloses a film keyboard PCBA test device and method, including a test fixture, the test fixture is connected to the PCBA gold finger through a fixture probe, and is connected to a host computer; the test fixture includes a built-in test board, the built-in test board includes an MCU and a plurality of gate switch units, the fixture probe connects the PCBA key rows to different gate switch units respectively, the enable end and the gate control end of the gate switch unit are both connected to the MCU, the MCU controls the short-circuit conduction of the PCBA key rows, the host computer test program needs to be turned on before the film keyboard PCBA test, the film keyboard PCBA microprocessor unit synchronously uploads the test data to the host computer through USB communication or other wireless communication methods, and the host computer test software displays the test status and test results. The invention adopts one-key start, simulates the full function of all keyboard key tests, is simple to operate, and has high test efficiency.

Figure 201911079508

Description

薄膜键盘PCBA测试装置及方法Membrane keyboard PCBA testing device and method

技术领域technical field

本发明涉及薄膜键盘PCBA测试技术,尤其涉及一种薄膜键盘PCBA测试装置及方法。The invention relates to a membrane keyboard PCBA testing technology, in particular to a membrane keyboard PCBA testing device and method.

背景技术Background technique

键盘作为计算机及各种自动化设备最常用的输入装置,被广泛运用于电脑及各种不同的电子产品设备中进行文本以及命令的输入,其在外设领域有着举足轻重的作用,有效方便了操作人员与设备之间的人机交互。现有市面上键盘占比最大的还是普通的薄膜键盘,在薄膜键盘生产过程中需要安装上盖、下盖、键帽、薄膜开关(Membrane Switch)、PCBA(Printed Circuit Board+Assembly)、橡胶按键模块(Rubber Sheet)、铁压条、脚垫、USB线或电池(有线键盘使用USB线,无线键盘使用电池),其中影响组装良率的关键因素就是键盘印制电路板组件PCBA。As the most commonly used input device for computers and various automation equipment, keyboards are widely used in computers and various electronic products to input text and commands. Human-computer interaction between devices. The largest proportion of keyboards on the market is the ordinary membrane keyboard. In the production process of the membrane keyboard, it is necessary to install the upper cover, lower cover, keycap, membrane switch (Membrane Switch), PCBA (Printed Circuit Board+Assembly), rubber keys Module (Rubber Sheet), iron pressure strip, foot pad, USB cable or battery (wired keyboard uses USB cable, wireless keyboard uses battery), the key factor affecting the assembly yield is the keyboard printed circuit board assembly PCBA.

生产厂家为了保证PCBA生产质量,通常在出货前会用治具对PCBA进行测试,但现有的键盘PCBA测试都是挑选键盘矩阵的18~20个按键进行测试,如图1所示,这种测试方式就是在测试治具上安装18~20个微动开关,逐个按压治具上的微动开关检验 PCBA功能是否完好,测试复杂且效率低。这种测试方式仅仅是针对PCBA上IC贴片或IC Bonding进行断路测试,PCBA加工过程中IC部分I/O短路不良没法检测出来,键盘组装后会造成键盘连键不良,这样不仅影响生产良率,而且拆解重工会造成物料报废。In order to ensure the quality of PCBA production, manufacturers usually test the PCBA with a fixture before shipment, but the existing keyboard PCBA test is to select 18 to 20 keys of the keyboard matrix for testing, as shown in Figure 1. One test method is to install 18 to 20 microswitches on the test fixture, and press the microswitches on the fixture one by one to check whether the PCBA function is intact. The test is complicated and inefficient. This test method is only for the open circuit test of the IC patch or IC Bonding on the PCBA. During the PCBA processing process, the I/O short circuit of the IC part cannot be detected. After the keyboard is assembled, it will cause poor keyboard connection, which not only affects the production quality rate, and dismantling heavy equipment will cause material scrap.

发明内容SUMMARY OF THE INVENTION

发明目的:针对以上问题,本发明提出一种薄膜键盘PCBA测试装置及方法,采用一键启动,模拟键盘所有键测试全功能,操作简单,测试效率高。Purpose of the invention: In view of the above problems, the present invention proposes a membrane keyboard PCBA testing device and method, which uses one key to start, simulates all keys of the keyboard to test full functions, is simple to operate, and has high testing efficiency.

技术方案:为实现本发明的目的,本发明所采用的技术方案是:一种薄膜键盘PCBA测试装置,其特征在于,包括上位机、测试治具和电源;所述测试治具包括内置测试板、电源接口、测试开关、上位机接口和探针接口,电源接口、测试开关和探针接口均连接于内置测试板,上位机接口通过治具探针连接于薄膜键盘PCBA的USB接口探点;所述测试治具通过治具探针连接薄膜键盘PCBA金手指,治具探针连接于探针接口,通过电源接口连接电源,通过上位机接口连接上位机;所述测试治具通过测试开关启动,对 PCBA进行测试,测试数据同步上传给上位机,上位机测试软件显示测试状态及测试结果。Technical solution: In order to achieve the purpose of the present invention, the technical solution adopted in the present invention is: a membrane keyboard PCBA test device, which is characterized in that it includes a host computer, a test fixture and a power supply; the test fixture includes a built-in test board , power interface, test switch, host computer interface and probe interface, the power interface, test switch and probe interface are all connected to the built-in test board, and the host computer interface is connected to the USB interface probe point of the membrane keyboard PCBA through the fixture probe; The test fixture is connected to the gold finger of the film keyboard PCBA through the fixture probe, the fixture probe is connected to the probe interface, the power supply is connected through the power interface, and the host computer is connected through the host computer interface; the test fixture is activated by the test switch , Test the PCBA, upload the test data to the host computer synchronously, and the host computer test software displays the test status and test results.

进一步地,所述内置测试板包括MCU、电源接口连接器、电压转换单元、治具探针连接器和若干选通开关单元;所述测试开关连接于MCU;所述电源接口连接器连接电压转换单元为MCU和若干选通开关单元供电;所述治具探针连接器引脚引出作为探针接口,并将PCBA键行列分别连接于不同的选通开关单元输入端,选通开关单元公共端全部短接在一起;所述选通开关单元的使能端和选通控制端均连接于MCU,MCU控制PCBA键行列的短路导通,测试数据同步上传给上位机,上位机测试软件显示测试状态及测试结果。Further, the built-in test board includes an MCU, a power interface connector, a voltage conversion unit, a fixture probe connector and a plurality of gating switch units; the test switch is connected to the MCU; the power interface connector is connected to a voltage conversion unit The unit supplies power to the MCU and several gating switch units; the pins of the fixture probe connector are drawn out as probe interfaces, and the rows and columns of PCBA keys are respectively connected to the input ends of different gating switch units, and the common end of the gating switch units All are short-circuited together; the enabling terminal and the gating control terminal of the gating switch unit are both connected to the MCU, and the MCU controls the short-circuit conduction of the PCBA key row and column, and the test data is synchronously uploaded to the upper computer, and the upper computer test software displays the test status and test results.

进一步地,所述测试治具还包括固件更新接口,所述内置测试板还包括固件更新接口连接器,连接于MCU。Further, the test fixture further includes a firmware update interface, and the built-in test board further includes a firmware update interface connector, which is connected to the MCU.

一种薄膜键盘PCBA测试方法,包括步骤:A method for testing a membrane keyboard PCBA, comprising the steps:

(1)将电源插入测试治具电源接口;(1) Insert the power supply into the power interface of the test fixture;

(2)测试治具上位机接口连接上位机;(2) The interface of the host computer of the test fixture is connected to the host computer;

(3)测试治具探针接口连接治具探针,治具探针连接PCBA金手指;(3) The test fixture probe interface is connected to the fixture probe, and the fixture probe is connected to the PCBA gold finger;

(4)上位机测试程序打开,再按测试治具上的测试开关进行测试。(4) Open the test program of the host computer, and then press the test switch on the test fixture to test.

进一步地,测试前还包括通过固件更新接口将下位机程序烧录至测试治具的MCU。Further, before the test, it also includes programming the lower computer program to the MCU of the test fixture through the firmware update interface.

进一步地,所述下位机程序包括步骤:Further, the lower computer program comprises the steps:

(1)开始程序,进行初始化;(1) Start the program and initialize it;

(2)判断测试开关是否打开;(2) Determine whether the test switch is turned on;

(3)若是,则运行行列短路程序。(3) If yes, run the row-column short-circuit procedure.

进一步地,所述上位机测试程序包括步骤:Further, the host computer test program comprises the steps:

(1)开始程序,进行初始化;(1) Start the program and initialize it;

(2)判断测试装置接入是否正常;(2) Judging whether the access of the test device is normal;

(3)若是,则运行键检测程序。(3) If yes, run the key detection program.

进一步地,所述键检测程序包括步骤:Further, the key detection program comprises the steps:

(1)运行输入字键时间检测程序;(1) Run the input key time detection program;

(2)接收字键码直至最后检查字键;(2) receive the word key code until the last check word key;

(3)检测字键数是否正确,并返回检测结果,显示测试成功或显示漏字键。(3) Check whether the number of word keys is correct, and return the test result, indicating that the test is successful or the missing word key is displayed.

进一步地,所述输入字键时间检测程序包括步骤:Further, the described input key time detection program comprises the steps:

(1)获取此次字键输入时间;(1) Obtain the input time of this word key;

(2)判断此次字键获取时间是否等于上次字键获取时间,若是,则继续步骤3,若不是,则继续步骤4;(2) judge whether this key acquisition time is equal to the previous key acquisition time, if so, continue to step 3, if not, continue to step 4;

(3)显示字键短路错误,结束程序;(3) Display the short-circuit error of the word key, and end the program;

(4)判断此次字键获取时间减去上次字键获取时间是否大于设定时间阈值;(4) Judging whether the acquisition time of the word key this time minus the acquisition time of the last word key is greater than the set time threshold;

(5)若是,则显示字键输入超时;若不是,则将上次字键获取时间变数存储为此次字键获取时间。(5) If yes, display the word key input timeout; if not, store the variable of the last word key acquisition time as the current word key acquisition time.

有益效果:本发明的测试方法采用一键启动,模拟键盘所有键测试全功能,操作简单,测试效率高。Beneficial effects: The test method of the present invention adopts one-key start, simulates all keys of the keyboard to test full functions, has simple operation and high test efficiency.

附图说明Description of drawings

图1是薄膜键盘矩阵图;Fig. 1 is the matrix diagram of membrane keyboard;

图2是本发明薄膜键盘PCBA测试装置架构图;Fig. 2 is the structure diagram of the membrane keyboard PCBA testing device of the present invention;

图3是内置测试板电路图;Figure 3 is the circuit diagram of the built-in test board;

图4是治具探针连接器示意图;Figure 4 is a schematic diagram of the fixture probe connector;

图5是选通开关单元示意图;5 is a schematic diagram of a gating switch unit;

图6是CD74HC4067真值功能表;Figure 6 is the CD74HC4067 truth function table;

图7是5V电压转换单元示意图;7 is a schematic diagram of a 5V voltage conversion unit;

图8是3.3V电压转换单元示意图;Figure 8 is a schematic diagram of a 3.3V voltage conversion unit;

图9是MCU示意图;Fig. 9 is a schematic diagram of MCU;

图10是固件更新接口连接器示意图;Figure 10 is a schematic diagram of a firmware update interface connector;

图11是下位机程序流程图;Fig. 11 is the flow chart of the lower computer program;

图12是下位机初始化程序流程图;Fig. 12 is the flow chart of the initialization procedure of the lower computer;

图13是行列短路程序流程图;Figure 13 is a flow chart of a row-column short-circuit procedure;

图14是上位机测试程序流程图;Fig. 14 is the flow chart of the test procedure of the upper computer;

图15是上位机测试初始化程序流程图;Figure 15 is the flow chart of the host computer test initialization program;

图16是键检测程序流程图;Fig. 16 is the key detection procedure flow chart;

图17是输入字键时间检测程序流程图;Fig. 17 is the flow chart of input character key time detection program;

图18是模拟键盘显示界面。Fig. 18 is the simulation keyboard display interface.

具体实施方式Detailed ways

下面结合附图和实施例对本发明的技术方案作进一步的说明。The technical solutions of the present invention will be further described below with reference to the accompanying drawings and embodiments.

如图2所示,本发明所述的薄膜键盘PCBA测试装置包括薄膜键盘PCBA测试治具,采用带显示器的测试电脑作为上位机,与测试治具通过USB线材连接;还包括DC9V 电源,为测试治具供电。As shown in Figure 2, the membrane keyboard PCBA test device of the present invention includes a membrane keyboard PCBA test fixture, and a test computer with a display is used as a host computer, which is connected to the test fixture through a USB wire; it also includes a DC9V power supply for testing. Jig power supply.

测试治具包括内置测试板、DC9V电源接口、测试开关S1、上位机接口和探针接口,电源接口、测试开关S1和探针接口均连接于内置测试板,上位机接口通过治具探针连接于PCBA的USB接口探点。如果是2.4G或蓝牙类型的薄膜键盘,需要在测试治具上增加一个免对码接收器,免对码接收器接测试电脑的USB接口。The test fixture includes a built-in test board, DC9V power interface, test switch S1, host computer interface and probe interface. The power interface, test switch S1 and probe interface are all connected to the built-in test board, and the host computer interface is connected through the fixture probe. Probe point on the USB interface of the PCBA. If it is a 2.4G or Bluetooth type membrane keyboard, a code-free receiver needs to be added to the test fixture, and the code-free receiver is connected to the USB interface of the test computer.

测试治具通过治具探针连接PCBA金手指,治具探针连接于探针接口,通过电源接口连接电源,通过上位机接口连接上位机。测试治具通过测试开关启动内置测试板,对PCBA运行测试程序,测试数据同步上传给上位机,上位机测试软件显示测试状态及测试结果。The test fixture is connected to the PCBA gold finger through the fixture probe, the fixture probe is connected to the probe interface, the power supply is connected through the power interface, and the host computer is connected through the host computer interface. The test fixture starts the built-in test board through the test switch, runs the test program on the PCBA, and uploads the test data to the upper computer synchronously, and the upper computer test software displays the test status and test results.

如图3所示,内置测试板包括MCU、电源接口连接器J1、电压转换单元、治具探针连接器CN1和若干选通开关单元。测试开关S1连接于MCU,电源接口连接器J1连接电压转换单元为MCU和若干选通开关单元供电。As shown in Figure 3, the built-in test board includes an MCU, a power interface connector J1, a voltage conversion unit, a fixture probe connector CN1, and several gate switch units. The test switch S1 is connected to the MCU, and the power interface connector J1 is connected to the voltage conversion unit to supply power to the MCU and several gate switch units.

如图4所示,治具探针连接器CN1的引脚引出作为探针接口,并将PCBA键行列分别连接于不同的选通开关单元输入端,选通开关单元公共端全部短接在一起。As shown in Figure 4, the pin of the fixture probe connector CN1 is drawn out as a probe interface, and the rows and columns of the PCBA keys are respectively connected to the input terminals of different gating switch units, and the common terminals of the gating switch units are all short-circuited together .

如图5所示,包括3个选通开关单元,选通开关单元为CD74HC4067,是数字信号控制的16选1开关元件,通过MCU控制行(Row,U1)与列(Column,U2/U3)短路导通,模拟实现键盘全键测试。选通开关单元的使能端和选通控制端均连接于MCU, MCU控制PCBA键行列的短路导通,E1~E3为CD74HC4067使能脚,S10~S13,S20~S23, S30~S33的数字讯号选择Row与Column短路导通。CD74HC4067真值功能表如图6所示。As shown in Figure 5, it includes 3 gate switch units. The gate switch unit is CD74HC4067, which is a 16-to-1 switching element controlled by digital signals. The MCU controls the row (Row, U1) and column (Column, U2/U3) Short-circuit conduction, simulate the full-key test of the keyboard. The enable terminal and the gate control terminal of the gating switch unit are both connected to the MCU. The MCU controls the short-circuit conduction of the PCBA key row and column. E1~E3 are the CD74HC4067 enable pins, S10~S13, S20~S23, and S30~S33 numbers The signal selection Row and Column are short-circuited and turned on. The CD74HC4067 truth function table is shown in Figure 6.

如图7所示,DC9V电源给测试板供电,经电源接口连接器J1经5V电压转换单元,后提供VCC5V电压给CD74HC4067工作。5V电压转换单元采用7805稳压。如图8所示,为3.3V电压转换单元,VCC5V供给XC6503D331的输入端,VCC5V经XC6503D331 降压后提供3.3V给MCU工作,LED1是3.3V电压指示灯。As shown in Figure 7, the DC9V power supply supplies power to the test board, through the power interface connector J1 through the 5V voltage conversion unit, and then provides the VCC5V voltage for the CD74HC4067 to work. The 5V voltage conversion unit adopts 7805 voltage regulator. As shown in Figure 8, it is a 3.3V voltage conversion unit, VCC5V is supplied to the input terminal of XC6503D331, VCC5V is stepped down by XC6503D331 to provide 3.3V for MCU to work, and LED1 is a 3.3V voltage indicator.

如图9所示,MCU连接选通开关单元的选通控制端S10~S13,S20~S23,S30~S33,通过数字讯号选择Row与Column短路导通,同时,MCU连接CD74HC4067使能脚 E1~E3。As shown in Figure 9, the MCU is connected to the gate control terminals S10~S13, S20~S23, S30~S33 of the gate switch unit, and the Row and Column are selected for short-circuit conduction through digital signals. At the same time, the MCU is connected to the CD74HC4067 enable pins E1~ E3.

如图10所示,测试治具还包括固件更新接口,内置测试板还包括固件更新接口连接器J2,连接于MCU。As shown in Figure 10, the test fixture further includes a firmware update interface, and the built-in test board also includes a firmware update interface connector J2, which is connected to the MCU.

待测薄膜键盘PCBA需烧录好出货固件FW,CD74HC4067模拟键盘全键测试的讯号经薄膜键盘PCBA上的MCU处理后,通过USB传输送给上位机系统(Windows/IOS /Google等)处理。The membrane keyboard PCBA to be tested needs to be programmed with the shipped firmware FW. The CD74HC4067 analog keyboard full-key test signal is processed by the MCU on the membrane keyboard PCBA, and then transmitted to the host computer system (Windows/IOS/Google, etc.) through USB for processing.

本发明所述的薄膜键盘PCBA测试方法,包括步骤:The membrane keyboard PCBA testing method of the present invention comprises the steps:

(1)将DC9V电源插入测试治具电源接口,为测试系统供电;(1) Insert the DC9V power supply into the power interface of the test fixture to supply power to the test system;

(2)USB线材一端插入测试电脑的USB接口,将测试治具上位机接口连接上位机,测试治具与测试电脑通讯;(2) Insert one end of the USB cable into the USB interface of the test computer, connect the interface of the host computer of the test fixture to the host computer, and the test fixture communicates with the test computer;

(3)测试治具内置测试板上的测试治具探针接口连接器CN1连接治具探针,治具探针连接PCBA金手指;(3) The test fixture probe interface connector CN1 on the built-in test board of the test fixture is connected to the fixture probe, and the fixture probe is connected to the PCBA gold finger;

(4)测试治具内置测试板上的测试开关S1引线安装到测试治具面板上,测试开关S1是薄膜键盘PCBA换板测试按键;(4) The lead of the test switch S1 on the built-in test board of the test fixture is installed on the panel of the test fixture, and the test switch S1 is the test button of the membrane keyboard PCBA board change;

(5)待测薄膜键盘PCBA上的金手指及测试点焊盘与测试治具的探针一一对应连接;(5) The gold fingers and test point pads on the PCBA of the membrane keyboard to be tested are connected one-to-one with the probes of the test fixture;

(6)待测薄膜键盘PCBA测试前,需要确认治具电源接入,治具USB线材插入测试电脑USB接口,测试电脑端的测试程序(.exe)打开;然后将待测薄膜键盘PCBA放在指定位置,利用治具连杆结构使探针与测试点接触导通,之后再按测试治具上的测试开关S1进行测试。(6) Before testing the PCBA of the membrane keyboard to be tested, it is necessary to confirm that the power supply of the fixture is connected, the USB wire of the fixture is inserted into the USB interface of the test computer, and the test program (.exe) on the test computer side is opened; then the PCBA of the membrane keyboard to be tested is placed on the designated position, use the fixture link structure to make the probe and the test point contact and conduct, and then press the test switch S1 on the test fixture to test.

测试前还包括通过固件更新接口将下位机程序烧录至测试治具的MCU。Before the test, it also includes burning the lower computer program to the MCU of the test fixture through the firmware update interface.

其中,如图11所示,下位机程序包括步骤:Among them, as shown in Figure 11, the lower computer program includes steps:

(1)开始程序,进行初始化,如图12所示;(1) Start the program and initialize it, as shown in Figure 12;

(2)判断测试开关是否打开;(2) Determine whether the test switch is turned on;

(3)若是,则运行行列短路程序,如图13所示。其中,每行运行到最后一列时,进行延时判断,延时100ms再进行列+1,重新进行是否是最后一列的判断。(3) If yes, run the row-column short-circuit procedure, as shown in Figure 13. Among them, when each row runs to the last column, a delay judgment is performed, and after a delay of 100ms, the column + 1 is performed, and the judgment of whether it is the last column is performed again.

其中,如图14所示,上位机测试程序包括步骤:Among them, as shown in Figure 14, the host computer test program includes steps:

(1)开始程序,进行初始化,如图15所示;(1) Start the program and initialize it, as shown in Figure 15;

(2)判断测试装置接入是否正常,包括判断USB是否插入,HID咨询检查;(2) Judging whether the access of the test device is normal, including judging whether the USB is inserted, and HID consulting and checking;

(3)若是,则点亮LED指示灯,运行键检测程序;(3) If yes, light up the LED indicator and run the key detection program;

(4)若HID咨询检查错误,则显示HID错误。(4) If there is an error in the HID consultation check, the HID error will be displayed.

如图16所示,键检测程序包括步骤:As shown in Figure 16, the key detection procedure includes the steps:

(1)运行输入字键时间检测程序;(1) Run the input key time detection program;

(2)接收字键码直至最后检查字键;(2) receive the word key code until the last check word key;

(3)检测字键数是否正确,并返回检测结果,显示测试成功或显示漏字键。(3) Check whether the number of word keys is correct, and return the test result, indicating that the test is successful or the missing word key is displayed.

如图17所示,输入字键时间检测程序包括步骤:As shown in Figure 17, the input character key time detection program includes the steps:

(1)获取此次字键输入时间;(1) Obtain the input time of this word key;

(2)判断此次字键获取时间是否等于上次字键获取时间,若是,则继续步骤3,若不是,则继续步骤4;(2) judge whether this key acquisition time is equal to the previous key acquisition time, if so, continue to step 3, if not, continue to step 4;

(3)显示字键短路错误,结束程序;(3) Display the short-circuit error of the word key, and end the program;

(4)判断此次字键获取时间减去上次字键获取时间是否大于设定时间阈值;(4) judging whether the acquisition time of the word key this time minus the acquisition time of the last word key is greater than the set time threshold;

(5)若是,则显示字键输入超时;若不是,则将上次字键获取时间变数存储为此次字键获取时间。(5) If yes, display the word key input timeout; if not, store the variable of the last word key acquisition time as the current word key acquisition time.

测试时,测试电脑显示界面可以模拟键盘显示界面,如图18所示,并逐个点亮测试键,清楚明了的查看检测结果。During the test, the test computer display interface can simulate the keyboard display interface, as shown in Figure 18, and light up the test keys one by one to check the test results clearly.

Claims (9)

1.一种薄膜键盘PCBA测试装置,其特征在于,包括上位机、测试治具和电源;所述测试治具包括内置测试板、电源接口、测试开关、上位机接口和探针接口,电源接口、测试开关和探针接口均连接于内置测试板,上位机接口通过治具探针连接于薄膜键盘PCBA的USB接口探点;1. a membrane keyboard PCBA test device, is characterized in that, comprises host computer, test fixture and power supply; Described test fixture comprises built-in test board, power supply interface, test switch, host computer interface and probe interface, power supply interface , The test switch and probe interface are connected to the built-in test board, and the host computer interface is connected to the USB interface probe point of the membrane keyboard PCBA through the fixture probe; 所述测试治具通过治具探针连接薄膜键盘PCBA的金手指,治具探针连接于探针接口,通过电源接口连接电源,通过上位机接口连接上位机;所述测试治具通过测试开关启动,对PCBA进行测试,实时将测试数据上传上位机,上位机测试软件显示测试状态及测试结果。The test fixture is connected to the gold finger of the membrane keyboard PCBA through the fixture probe, the fixture probe is connected to the probe interface, the power supply is connected through the power interface, and the upper computer is connected through the host computer interface; the test fixture passes the test switch. Start, test the PCBA, upload the test data to the host computer in real time, and the host computer test software displays the test status and test results. 2.根据权利要求1所述的薄膜键盘PCBA测试装置,其特征在于,所述内置测试板包括MCU、电源接口连接器、电压转换单元、治具探针连接器和若干选通开关单元;2. The membrane keyboard PCBA test device according to claim 1, wherein the built-in test board comprises an MCU, a power interface connector, a voltage conversion unit, a fixture probe connector and several gate switch units; 所述测试开关连接于MCU;The test switch is connected to the MCU; 所述电源接口连接器连接电压转换单元为MCU和若干选通开关单元供电;The power interface connector is connected to the voltage conversion unit to supply power to the MCU and several gating switch units; 所述治具探针连接器引脚引出作为探针接口,并将PCBA键行列分别连接于不同的选通开关单元输入端,选通开关单元公共端全部短接在一起;The pins of the jig probe connector are drawn out as a probe interface, and the rows and columns of the PCBA keys are respectively connected to the input ends of different gating switch units, and the common ends of the gating switch units are all short-circuited together; 所述选通开关单元的使能端和选通控制端均连接于MCU,MCU控制PCBA键行列的短路导通,测试数据同步上传给上位机,上位机测试软件显示测试状态及测试结果。The enabling end and the gating control end of the gating switch unit are both connected to the MCU, the MCU controls the short-circuit conduction of the PCBA key row and column, the test data is synchronously uploaded to the upper computer, and the upper computer test software displays the test status and test results. 3.根据权利要求1所述的薄膜键盘PCBA测试装置,其特征在于,所述测试治具还包括固件更新接口,所述内置测试板还包括固件更新接口连接器,连接于MCU。3 . The membrane keyboard PCBA test device according to claim 1 , wherein the test fixture further comprises a firmware update interface, and the built-in test board further comprises a firmware update interface connector, which is connected to the MCU. 4 . 4.一种薄膜键盘PCBA测试方法,利用权利要求1-3所述的测试装置进行测试,其特征在于,包括步骤:4. a membrane keyboard PCBA test method, utilizes the test device described in claim 1-3 to test, it is characterized in that, comprise the steps: (1)将电源插入测试治具电源接口;(1) Insert the power supply into the power interface of the test fixture; (2)测试治具上位机接口连接上位机;(2) The interface of the host computer of the test fixture is connected to the host computer; (3)测试治具探针接口连接治具探针,治具探针连接PCBA金手指;(3) The test fixture probe interface is connected to the fixture probe, and the fixture probe is connected to the PCBA gold finger; (4)上位机测试程序打开,再按测试治具上的测试开关进行测试。(4) Open the test program of the host computer, and then press the test switch on the test fixture to test. 5.根据权利要求4所述的薄膜键盘PCBA测试方法,其特征在于,测试前还包括通过固件更新接口将下位机程序烧录至测试治具的MCU。5. The method for testing membrane keyboard PCBA according to claim 4, characterized in that, before the test, it further comprises the MCU that burns the lower computer program to the test fixture through the firmware update interface. 6.根据权利要求5所述的薄膜键盘PCBA测试方法,其特征在于,所述下位机程序包括步骤:6. membrane keyboard PCBA testing method according to claim 5, is characterized in that, described lower computer program comprises the steps: (1)开始程序,进行初始化;(1) Start the program and initialize it; (2)判断测试开关是否打开;(2) Determine whether the test switch is turned on; (3)若是,则运行行列短路程序。(3) If yes, run the row-column short-circuit procedure. 7.根据权利要求4所述的薄膜键盘PCBA测试方法,其特征在于,所述上位机测试程序包括步骤:7. membrane keyboard PCBA testing method according to claim 4, is characterized in that, described host computer testing program comprises the steps: (1)开始程序,进行初始化;(1) Start the program and initialize it; (2)判断测试装置接入是否正常;(2) Judging whether the access of the test device is normal; (3)若是,则运行键检测程序。(3) If yes, run the key detection program. 8.根据权利要求7所述的薄膜键盘PCBA测试方法,其特征在于,所述键检测程序包括步骤:8. membrane keyboard PCBA testing method according to claim 7 is characterized in that, described key detection program comprises the steps: (1)运行输入字键时间检测程序;(1) Run the input key time detection program; (2)接收字键码直至最后检查字键;(2) receive the word key code until the last check word key; (3)检测字键数是否正确,并返回检测结果,显示测试成功或显示漏字键。(3) Check whether the number of word keys is correct, and return the test result, indicating that the test is successful or the missing word key is displayed. 9.根据权利要求8所述的薄膜键盘PCBA测试方法,其特征在于,所述输入字键时间检测程序包括步骤:9. membrane keyboard PCBA testing method according to claim 8, is characterized in that, described input character key time detection program comprises the steps: (1)获取此次字键输入时间;(1) Obtain the input time of this word key; (2)判断此次字键获取时间是否等于上次字键获取时间,若是,则继续步骤3,若不是,则继续步骤4;(2) judge whether this key acquisition time is equal to the previous key acquisition time, if so, continue to step 3, if not, continue to step 4; (3)显示字键短路错误,结束程序;(3) Display the short-circuit error of the word key, and end the program; (4)判断此次字键获取时间减去上次字键获取时间是否大于设定时间阈值;(4) Judging whether the acquisition time of the word key this time minus the acquisition time of the last word key is greater than the set time threshold; (5)若是,则显示字键输入超时;若不是,则将上次字键获取时间变数存储为此次字键获取时间。(5) If yes, display the word key input timeout; if not, store the variable of the last word key acquisition time as the current word key acquisition time.
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