CN108830914A - Multi-platform micrometering system based on straight line measurement - Google Patents
Multi-platform micrometering system based on straight line measurement Download PDFInfo
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- CN108830914A CN108830914A CN201810619487.XA CN201810619487A CN108830914A CN 108830914 A CN108830914 A CN 108830914A CN 201810619487 A CN201810619487 A CN 201810619487A CN 108830914 A CN108830914 A CN 108830914A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/80—Creating or modifying a manually drawn or painted image using a manual input device, e.g. mouse, light pen, direction keys on keyboard
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Abstract
The present invention is based on the multi-platform micrometering systems of straight line measurement, including：Image capture module：Image can be acquired from TWAIN standard microscope equipment, image is acquired from DSHOW standard microscope equipment or acquire image from SDK agreement microscope device；The MIcrosope image measurement module being connected to image capture module：And the data storage module being used cooperatively with MIcrosope image measurement module；MIcrosope image measurement module includes being equipped on Image selection module in user interface, Measurement Algorithm selecting module, measurement module；Measurement module refers to that Measurement Algorithm module, Measurement Algorithm are straight line estimation algorithm.
Description
Technical field
The present invention relates to automatic measuring system, in particular to a kind of multi-platform micrometering system based on straight line measurement
System.
Background technique
It is common to be measured microscopically tool software, it is usually provided by microscope manufacturer, such tool can only connect
The equipment of single type has stringent limitation, does not have the expansibility of software；Plurality of devices is used when needing to connect
When, it is necessary to installing other software could use, serious waste human resources and reduction working efficiency.
It solves the above problems therefore, it is necessary to provide a kind of multi-platform micrometering system based on straight line measurement.
Summary of the invention
The object of the present invention is to provide a kind of multi-platform micrometering systems based on straight line measurement.
Technical solution is as follows：
A kind of multi-platform micrometering system based on straight line measurement, including：
Image capture module：Image can be acquired from TWAIN standard microscope equipment, acquired and schemed from DSHOW standard microscope equipment
As or from SDK agreement microscope device acquires image；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；
MIcrosope image measurement module includes being equipped on Image selection module in user interface, Measurement Algorithm selecting module, measurement
Module；Measurement module refers to that Measurement Algorithm module, Measurement Algorithm are straight line estimation algorithm.
Further, data storage module is micro- for reading setting data, log-on data, such as when last time closing software
Mirror multiplying power；For reading measurement record etc.；Data, log-on data are set for saving, such as microscope when last time closing software
Multiplying power；For saving measurement record etc..
Further, user interface is used for：The reading of visualization device attribute, set interface, the attributes such as including resolution ratio；It can
Interface, including paintbrush thickness, pattern, color etc. are preset depending on changing paintbrush；LnkTools interface is visualized, including deduced image, is led
Table etc. out；Visualization measurement interface, including manual measurement, scribing line etc.；It shows measurement result, measures information interface, including institute
There is measurement comment etc..
Further, equipped with equipment setup module in user interface.
Further, in user interface equipped with paintbrush presetting module, paintbrush it is default mainly to paintbrush type such as solid line,
Dotted line, paintbrush thickness such as 5pt, 10pt, the brush style such as Song typeface, black matrix, the attributes such as paintbrush size are configured, when for measuring
The attribute for waiting paintbrush is preset.
Further, equipped with LnkTools module in user interface, LnkTools includes following functions, starting correction,
Cross hairs setting, magnifying glass, DEMO measurement, export word, export excel, export measurement result etc..
Further, equipped with measurement information module in user interface, what measurement information indicated is n times metrical information, packet
It includes every time such as dotted line measurement of use the color of measurement, the type of measurement or middle line measures in parallel, choose each measurement result, it can be with
Check detailed measurement data, such as center point coordinate X and Y and the length of experiment curv etc..
Further, equipment setup module for connecting equipment automatically, and can open properties dialog by user, checks and sets
The parameters such as back-up resolution, equipment id, equipment exposure rate, white balance, have once in a while partial parameters read less than the case where, then only show
Show the parameter normally read；Or parameter setting is issued, change current microscope running parameter.
Compared with prior art, the microscope interfaces of multiple general-purpose platforms are integrated into the same software by the present invention, are being adopted
Operation is measured with line measurement algorithm in the image basis collected, reaches and supports the micrometering operation of kinds of platform equipment
Purpose.
Detailed description of the invention
Fig. 1 is one of structural schematic diagram of the invention.
Fig. 2 is second structural representation of the invention.
Specific embodiment
Embodiment：
Fig. 1 to Fig. 2 is please referred to, the present embodiment shows a kind of multi-platform micrometering system based on straight line measurement, including：
Image capture module：Image can be acquired from TWAIN standard microscope equipment, acquired and schemed from DSHOW standard microscope equipment
As or from SDK agreement microscope device acquires image；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；
MIcrosope image measurement module includes being equipped on Image selection module in user interface, Measurement Algorithm selecting module, measurement
Module；Measurement module refers to that Measurement Algorithm module, Measurement Algorithm are straight line estimation algorithm.
Data storage module is for reading setting data, log-on data, such as microscope multiplying power when last time closing software；With
Record etc. is measured in reading；Data, log-on data are set for saving, such as microscope multiplying power when last time closing software；For
Save measurement record etc..
User interface is used for：The reading of visualization device attribute, set interface, the attributes such as including resolution ratio；Visualize paintbrush
Default interface, including paintbrush thickness, pattern, color etc.；Visualize LnkTools interface, including deduced image, export table etc.；
Visualization measurement interface, including manual measurement, scribing line etc.；It shows measurement result, measures information interface, including all measurement explanations
Text etc..
Equipped with equipment setup module in user interface.
Equipped with paintbrush presetting module in user interface, paintbrush is default mainly to paintbrush type such as solid line, dotted line, paintbrush
Thickness such as 5pt, 10pt, the brush style such as Song typeface, black matrix, the attributes such as paintbrush size are configured, paintbrush when for measuring
Attribute is preset.
Equipped with LnkTools module in user interface, LnkTools includes following functions, and starting correction, cross hairs are set
It sets, magnifying glass, DEMO measurement, export word, export excel, export measurement result etc..
Equipped with measurement information module in user interface, what measurement information indicated is n times metrical information, including is measured every time
Such as dotted line measurement of used color, the type of measurement or parallel middle line measurement, choose each measurement result, can check detailed
Measurement data, such as center point coordinate X and Y and the length of experiment curv etc..
Equipment setup module and can open properties dialog by user for connecting equipment automatically, check device resolution,
The parameters such as equipment id, equipment exposure rate, white balance, have once in a while partial parameters read less than the case where, then only display is normal reads
The parameter got；Or parameter setting is issued, change current microscope running parameter.
Measurement procedure is as follows：
S1) image capture module real-time image acquisition data；
S2 selection microscope device) is operated by subscriber interface module to be attached, while can be checked by equipment setup module
Device attribute or setting device attribute, can also by paintbrush presetting module be arranged paintbrush, wait all be measurement before preparation；
S3）It is measured using straight line estimation algorithm；
S4）By LnkTools module export measurement structure, by data storage module store current measurement structure or other
Parameter；
S5）Measurement result details are checked by measuring information module.
It is worth noting that, straight line estimation algorithm is one of the embodiment of the present embodiment, can also be：Point measurement, circle
The Measurement Algorithms such as measurement, triangle measurement, two line angle measurements, two-point measurement, arc measuring, point to line measurement.
In such a way that standard interface and proprietary protocol SDK combine, more traditional measuring tool software has the present embodiment
Stronger compatibility, traditional measuring tool can only support single factory microscope device to access, and the present invention can support 2 big marks
The access of quasi- and proprietary protocol SDK microscope.Traditional measuring tool software only has simple measurement function, and the present invention is not only
Measurement is completed, and measurement data can be saved, checks that measurement data details, function are more perfect.The present invention is compatible on the whole expands
Malleability is strong, service efficiency is high, perfect in shape and function, can greatly improve and is measured microscopically working efficiency.
Above-described is only some embodiments of the present invention.For those of ordinary skill in the art, not
Under the premise of being detached from the invention design, various modifications and improvements can be made, these belong to protection model of the invention
It encloses.
Claims (8)
1. a kind of multi-platform micrometering system based on straight line measurement, it is characterised in that：Including：
Image capture module：Image can be acquired from TWAIN standard microscope equipment, acquired and schemed from DSHOW standard microscope equipment
As or from SDK agreement microscope device acquires image；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；
MIcrosope image measurement module includes being equipped on Image selection module in user interface, Measurement Algorithm selecting module, measurement
Module；Measurement module refers to that Measurement Algorithm module, Measurement Algorithm are straight line estimation algorithm.
2. a kind of multi-platform micrometering system based on straight line measurement according to claim 1, it is characterised in that：Data
Storage module is for reading setting data, log-on data, such as microscope multiplying power when last time closing software；For reading measurement note
Record etc.；Data, log-on data are set for saving, such as microscope multiplying power when last time closing software；For saving measurement record
Deng.
3. a kind of multi-platform micrometering system based on straight line measurement according to claim 2, it is characterised in that：User
Interface is used for：The reading of visualization device attribute, set interface, the attributes such as including resolution ratio；It visualizes paintbrush and presets interface, including
Paintbrush thickness, pattern, color etc.；Visualize LnkTools interface, including deduced image, export table etc.；Visualization measurement circle
Face, including manual measurement, scribing line etc.；Show measurement result, measurement information interface, including all measurement comments etc..
4. a kind of multi-platform micrometering system based on straight line measurement according to claim 3, it is characterised in that：User
Equipped with equipment setup module on interface.
5. a kind of multi-platform micrometering system based on straight line measurement according to claim 4, it is characterised in that：User
Equipped with paintbrush presetting module on interface, paintbrush is default mainly to paintbrush type such as solid line, dotted line, paintbrush thickness such as 5pt,
10pt, the brush style such as Song typeface, black matrix, the attributes such as paintbrush size are configured, and the attribute of paintbrush is set in advance when for measuring
It sets.
6. a kind of multi-platform micrometering system based on straight line measurement according to claim 5, it is characterised in that：User
Equipped with LnkTools module on interface, LnkTools includes following functions, starting correction, cross hairs setting, magnifying glass, DEMO
Measurement, export word, export excel, export measurement result etc..
7. a kind of multi-platform micrometering system based on straight line measurement according to claim 6, it is characterised in that：User
On interface equipped with measurement information module, measurement information indicate be n times metrical information, including measure every time used color,
Such as dotted line measurement of the type of measurement or parallel middle line measurement, choose each measurement result, can check detailed measurement data, than
Such as center point coordinate X and Y and the length of experiment curv etc..
8. a kind of multi-platform micrometering system based on straight line measurement according to claim 7, it is characterised in that：Equipment
Setup module can open properties dialog by user for connecting equipment automatically, check device resolution, equipment id, equipment
The parameters such as exposure rate, white balance, have once in a while partial parameters read less than the case where, then only show the parameter normally read；
Or parameter setting is issued, change current microscope running parameter.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108445618A (en) * | 2018-06-14 | 2018-08-24 | 苏州富莱智能科技有限公司 | DSHOW standard micrometering systems and measurement method |
| CN108662981A (en) * | 2018-06-14 | 2018-10-16 | 苏州富莱智能科技有限公司 | Customize micrometering system and measurement method |
| CN108827146A (en) * | 2018-06-14 | 2018-11-16 | 苏州富莱智能科技有限公司 | TWAIN standard micrometering system and measurement method |
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Application publication date: 20181116 |