CN108662981A - Customize micrometering system and measurement method - Google Patents
Customize micrometering system and measurement method Download PDFInfo
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- CN108662981A CN108662981A CN201810616296.8A CN201810616296A CN108662981A CN 108662981 A CN108662981 A CN 108662981A CN 201810616296 A CN201810616296 A CN 201810616296A CN 108662981 A CN108662981 A CN 108662981A
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- 238000000691 measurement method Methods 0.000 title claims description 6
- 238000005259 measurement Methods 0.000 claims abstract description 85
- 238000013500 data storage Methods 0.000 claims abstract description 10
- 238000012800 visualization Methods 0.000 claims description 5
- 230000008859 change Effects 0.000 claims description 4
- 238000012937 correction Methods 0.000 claims description 3
- 238000002474 experimental method Methods 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 3
- 210000004209 hair Anatomy 0.000 claims description 3
- 239000011159 matrix material Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 3
- 230000008569 process Effects 0.000 claims description 2
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
Abstract
The present invention customizes micrometering system, including：Image capture module：Image is acquired from SDK agreement microscope devices；The MIcrosope image measurement module being connected to image capture module：And the data storage module being used cooperatively with MIcrosope image measurement module；MIcrosope image measurement module includes being equipped on user interface epigraph selecting module, Measurement Algorithm selecting module, measurement module；Measurement Algorithm includes measurement, straight line measurement, circle measurement, triangle measurement or two line angle measurements etc..
Description
Technical field
The present invention relates to automatic measuring system, more particularly to a kind of customization micrometering system and measurement method.
Background technology
It is common to be measured microscopically tool software, it is usually provided by microscope manufacturer, such tool can only use
What producer provided checks the functions such as image, has stringent limitation, cannot meet client's fundamental measurement demand well, and not
Has the expansibility of software.
Therefore, it is necessary to provide a kind of customization micrometering system and measurement method to solve the above problems.
Invention content
The object of the present invention is to provide a kind of customization micrometering systems.
Technical solution is as follows：
A kind of customization micrometering system, including：
Image capture module：Image is acquired from SDK agreement microscope devices；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；MIcrosope image measurement module includes carrying
In user interface epigraph selecting module, Measurement Algorithm selecting module, measurement module；Measurement Algorithm includes that point measures, straight line is surveyed
Fixed, circle measurement, triangle measurement or two line angle measurements etc..
Further, data storage module was closed micro- when software for reading setting data, log-on data, such as last time
Mirror multiplying power；Record etc. is measured for reading；For preserving setting data, log-on data, such as microscope when last time closing software
Multiplying power；Record etc. is measured for preserving.
Further, user interface is used for：Visualization device attribute reads, interface, the attributes such as including resolution ratio is arranged；It can
Interface, including paintbrush thickness, pattern, color etc. are preset depending on changing paintbrush；It visualizes LnkTools interface, including deduced image, leads
Go out table etc.；Visualization measurement interface, including manual measurement, scribing line etc.；It shows measurement result, measures information interface, including institute
Have and measures comment etc..
Further, equipped with equipment setup module in user interface.
Further, in user interface equipped with paintbrush presetting module, paintbrush it is default mainly to paintbrush type such as solid line,
Dotted line, paintbrush thickness such as 5pt, 10pt, the brush style such as Song typeface, black matrix, the attributes such as paintbrush size are configured, when for measuring
The attribute for waiting paintbrush is pre-set.
Further, equipped with LnkTools module in user interface, LnkTools includes following functions, startup correction,
Cross hairs setting, magnifying glass, DEMO measurements, export word, export excel, export measurement result etc..
Further, equipped with information module is measured in user interface, measure information expression is n times metrical information, packet
It includes and measures use color, the type of measurement such as dotted line measurement or parallel center line measurement every time, choose each measurement result, it can be with
Check detailed measurement data, such as the length etc. of center point coordinate X and Y and experiment curv.
Further, equipment setup module for connecting equipment automatically, and can open properties dialog by user, checks and sets
The parameters such as back-up resolution, equipment id, equipment exposure rate, white balance, have once in a while partial parameters read less than the case where, then only show
Show the parameter normally read；Or parameter setting is issued, change current microscope running parameter.
The present invention also provides a kind of measurement method, measuring process is：
S1) image capture module real-time image acquisition data；
S2) selection microscope device is operated by subscriber interface module to be attached, while can be checked by equipment setup module
Device attribute or setting device attribute, also can by paintbrush presetting module be arranged paintbrush, wait all be measure before preparation；
S3）It is measured using straight line estimation algorithm；
S4）By LnkTools module export measurement structure, by data storage module store current measurement structure or other
Parameter；
S5）Measurement result details are checked by measuring information module.
Compared with prior art, the present invention is in such a way that proprietary protocol SDK is combined, more traditional survey tool software tool
There is stronger compatibility, traditional survey tool can only support the image collecting function that producer provides, and the present invention can not only adopt
Collect image, can also complete to measure function, preserve measurement data, check that measurement details, function are more perfect.It is of the invention on the whole
Autgmentability is strong, service efficiency is high, perfect in shape and function, can greatly improve measurement working efficiency.
Description of the drawings
Fig. 1 is one of the structural schematic diagram of the present invention.
Fig. 2 is the second structural representation of the present invention.
Specific implementation mode
Embodiment：
It please referring to Fig.1 to Fig. 2, the present embodiment shows a kind of multi-platform micrometering system measured based on straight line, including：
Image capture module：Image is acquired from SDK agreement microscope devices；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；
MIcrosope image measurement module includes being equipped on user interface epigraph selecting module, Measurement Algorithm selecting module, measuring
Module；Measurement module refers to that Measurement Algorithm module, Measurement Algorithm are straight line estimation algorithm.
Data storage module is for reading setting data, log-on data, such as microscope multiplying power when last time closing software；With
Record etc. is measured in reading；For preserving setting data, log-on data, such as microscope multiplying power when last time closing software；For
It preserves and measures record etc..
User interface is used for：Visualization device attribute reads, interface, the attributes such as including resolution ratio is arranged；Visualize paintbrush
Default interface, including paintbrush thickness, pattern, color etc.；Visualize LnkTools interface, including deduced image, export table etc.；
Visualization measurement interface, including manual measurement, scribing line etc.；It shows measurement result, measures information interface, including all measurement explanations
Word etc..
Equipped with equipment setup module in user interface.
Equipped with paintbrush presetting module in user interface, paintbrush is default mainly to paintbrush type such as solid line, dotted line, paintbrush
Thickness such as 5pt, 10pt, the brush style such as Song typeface, black matrix, the attributes such as paintbrush size are configured, paintbrush when for measuring
Attribute is pre-set.
Equipped with LnkTools module in user interface, LnkTools includes following functions, starts correction, cross hairs is set
It sets, magnifying glass, DEMO are measured, export word, export excel, export measurement result etc..
Equipped with information module is measured in user interface, measure information expression is n times metrical information, including is measured every time
Used color, the type of measurement such as dotted line measure or parallel center line measures, and choose each measurement result, can check detailed
Measurement data, for example, center point coordinate X and Y and experiment curv length etc..
Equipment setup module and can open properties dialog for connecting equipment automatically by user, check device resolution,
The parameters such as equipment id, equipment exposure rate, white balance, have once in a while partial parameters read less than the case where, then only display is normal reads
The parameter got；Or parameter setting is issued, change current microscope running parameter.
Measurement procedure is as follows：
S1) image capture module real-time image acquisition data；
S2) selection microscope device is operated by subscriber interface module to be attached, while can be checked by equipment setup module
Device attribute or setting device attribute, also can by paintbrush presetting module be arranged paintbrush, wait all be measure before preparation；
S3）It is measured using straight line estimation algorithm；
S4）By LnkTools module export measurement structure, by data storage module store current measurement structure or other
Parameter；
S5）Measurement result details are checked by measuring information module.
It is worth noting that, straight line estimation algorithm is one of the embodiment of the present embodiment, can also be：Point measures, is round
The Measurement Algorithms such as measurement, triangle measurement, two line angle measurements, two-point measurement, arc measuring, point to line measurement.
For the present embodiment in such a way that proprietary protocol SDK is combined, more traditional survey tool software has stronger compatibility
Property, traditional survey tool can only support the image collecting function that producer provides, and the present invention can not only acquire image, also can be complete
At function is measured, measurement data is preserved, checks that measurement details, function are more perfect.Autgmentability of the present invention is strong on the whole, uses
Efficient, perfect in shape and function can greatly improve measurement working efficiency.
Above-described is only some embodiments of the present invention.For those of ordinary skill in the art, not
Under the premise of being detached from the invention design, various modifications and improvements can be made, these belong to the protection model of the present invention
It encloses.
Claims (9)
1. a kind of customization micrometering system, it is characterised in that：
Including：
Image capture module：Image is acquired from SDK agreement microscope devices；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；MIcrosope image measurement module includes carrying
In user interface epigraph selecting module, Measurement Algorithm selecting module, measurement module；Measurement Algorithm includes that point measures, straight line is surveyed
Fixed, circle measurement, triangle measurement or two line angle measurements etc..
2. a kind of customization micrometering system according to claim 1, it is characterised in that：Data storage module is for reading
Take setting data, log-on data, such as microscope multiplying power when last time closing software；Record etc. is measured for reading；For preserving
Data, log-on data, such as microscope multiplying power when last time closing software are set；Record etc. is measured for preserving.
3. a kind of customization micrometering system according to claim 2, it is characterised in that：User interface is used for：Visually
Change device attribute to read, interface, the attributes such as including resolution ratio are arranged；It visualizes paintbrush and presets interface, including paintbrush thickness, sample
Formula, color etc.；Visualize LnkTools interface, including deduced image, export table etc.；Visualization measurement interface, including it is manual
It measures, scribing line etc.；It shows measurement result, measures information interface, including all measurement comments etc..
4. a kind of customization micrometering system according to claim 3, it is characterised in that：Equipped with setting in user interface
Standby setup module.
5. a kind of customization micrometering system according to claim 4, it is characterised in that：Equipped with picture in user interface
Presetting module, paintbrush is default mainly to paintbrush type such as solid line, dotted line, and paintbrush thickness such as 5pt, 10pt, brush style is such as
The Song typeface, black matrix, the attributes such as paintbrush size are configured, and the attribute of paintbrush is pre-set when for measuring.
6. a kind of customization micrometering system according to claim 5, it is characterised in that：Equipped with fast in user interface
Prompt tool model, LnkTools include following functions, start correction, cross hairs setting, magnifying glass, DEMO measurement, export word,
Export excel, export measurement result etc..
7. a kind of customization micrometering system according to claim 6, it is characterised in that：Equipped with survey in user interface
Determine information module, measure information expression is n times metrical information, including measures used color, the type of measurement such as point every time
Line measures or parallel center line measures, and chooses each measurement result, can check detailed measurement data, such as center point coordinate X
And the length etc. of Y and experiment curv.
8. a kind of customization micrometering system according to claim 7, it is characterised in that：Equipment setup module is used for certainly
Dynamic connection equipment, and can properties dialog be opened by user, check device resolution, equipment id, equipment exposure rate, white balance etc.
Parameter, have once in a while partial parameters read less than the case where, then only show the parameter normally read；Or parameter setting is issued,
Change current microscope running parameter.
9. a kind of measurement method is characterized in that it utilizes a kind of customization micrometering system according to any one of claims 8, feature
It is：Measuring process is：
S1) image capture module real-time image acquisition data；
S2) selection microscope device is operated by subscriber interface module to be attached, while can be checked by equipment setup module
Device attribute or setting device attribute, also can by paintbrush presetting module be arranged paintbrush, wait all be measure before preparation；
S3 it) is measured using straight line estimation algorithm；
S4) by LnkTools module export measurement structure, by data storage module store current measurement structure or other
Parameter；
S5 measurement result details) are checked by measuring information module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201810616296.8A CN108662981A (en) | 2018-06-14 | 2018-06-14 | Customize micrometering system and measurement method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201810616296.8A CN108662981A (en) | 2018-06-14 | 2018-06-14 | Customize micrometering system and measurement method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109974580A (en) * | 2019-03-28 | 2019-07-05 | 江苏瑞奇海力科技有限公司 | A kind of measurement method, device, electronic equipment and storage medium |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101144766A (en) * | 2007-11-01 | 2008-03-19 | 复旦大学 | Automatic Microhardness Measuring System |
| CN102289416A (en) * | 2011-07-12 | 2011-12-21 | 信雅达系统工程股份有限公司 | Image Acquisition Method Based on Virtual Hardware Device |
| CN108830914A (en) * | 2018-06-12 | 2018-11-16 | 苏州富莱智能科技有限公司 | Multi-platform micrometering system based on straight line measurement |
-
2018
- 2018-06-14 CN CN201810616296.8A patent/CN108662981A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101144766A (en) * | 2007-11-01 | 2008-03-19 | 复旦大学 | Automatic Microhardness Measuring System |
| CN102289416A (en) * | 2011-07-12 | 2011-12-21 | 信雅达系统工程股份有限公司 | Image Acquisition Method Based on Virtual Hardware Device |
| CN108830914A (en) * | 2018-06-12 | 2018-11-16 | 苏州富莱智能科技有限公司 | Multi-platform micrometering system based on straight line measurement |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109974580A (en) * | 2019-03-28 | 2019-07-05 | 江苏瑞奇海力科技有限公司 | A kind of measurement method, device, electronic equipment and storage medium |
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Application publication date: 20181016 |
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