CN108052462A - A kind of oled substrate identifying system and method - Google Patents
A kind of oled substrate identifying system and method Download PDFInfo
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- CN108052462A CN108052462A CN201711384209.2A CN201711384209A CN108052462A CN 108052462 A CN108052462 A CN 108052462A CN 201711384209 A CN201711384209 A CN 201711384209A CN 108052462 A CN108052462 A CN 108052462A
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- 238000000034 method Methods 0.000 title claims abstract description 15
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- 230000002159 abnormal effect Effects 0.000 description 2
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- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
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Abstract
The invention discloses a kind of oled substrate identifying system, including：Console controller, serial data bus and at least one substrate, the console controller, serial data bus and at least one substrate form substrate link, wherein described console controller reads the substrate link information using the serial data bus, and the substrate configuration information of at least one substrate of the substrate chain road is read by the serial data bus according to the substrate link information, the substrate configuration information of each substrate with default substrate configuration information in the console controller is compared, and exports result.Embodiment disclosed by the invention provides a kind of oled substrate identifying system and method, it can realize the online recognition of the chain base board to being used to drive oled panel, avoid occurring invalid test caused by substrate is mismatched with test program in oled panel test process, and the substrate caused by test by mistake or measured panel are damaged, so as to improve the efficiency of panel test.
Description
Technical field
The present invention relates to display technology field, more particularly to a kind of oled substrate identifying system and method.
Background technology
In current Organic Light Emitting Diode (Organic Light-Emitting Diode, OLED) panel detection, it is
Generalization, modular requirement are adapted to, usually by picture and sequential generating unit point, general host is designed as, reserves highdensity
Connector is as external interface, the surveys such as the variety classes included for oled panel to be measured, interface type, sequential, electrical parameter
Examination requirement, using different mainframe programs, and replaces using corresponding types ROM substrates, corresponding drive signal is generated, through rear class
Expansion substrate, interposer substrate etc. are connected on oled panel to be measured, carry out panel test.
With the increase of test oled panel species, the species such as ROM substrates, expansion substrate used in test site are more next
More, the correspondence between program and substrate is complicated；And the substrate of close type, input, output connector shape are identical, it is interior
The circuit in portion is different；Substrate model name difference is little, sometimes only one or two of character difference.
At detection scene, the oled panel type of frequent switching detection, sometimes because of various factors above, drop-in
Substrate or program misuse, cause the type of substrate of mainframe program and outside to mismatch, and main program output is a kind of behaviour of substrate
Make mode, what is actually connected is another substrate, and output result is unexpected, and panel detection is abnormal, even results in base sometimes
Plate and measured panel damage.
The content of the invention
At least one to solve the above-mentioned problems, first aspect present invention provides a kind of oled substrate identifying system, including：
Console controller, serial data bus and at least one substrate, the console controller, serial data bus and institute
It states at least one substrate and forms substrate link, wherein
The console controller reads the substrate link information using the serial data bus, and according to the substrate
The substrate that link information reads at least one substrate of the substrate chain road by the serial data bus matches somebody with somebody confidence
Breath, the substrate configuration information of each substrate and default substrate configuration information in the console controller are compared
It is right, and export result.
Further, the substrate link information includes substrate chain road described in the link sum of series of the substrate chain road
The substrate model of each node.
Further, the substrate configuration information includes the configuration bit information of the substrate, for identifying the substrate
Hardware state, is the hardware circuit formation and line identifier of the substrate, is turned described and line identifier by serioparallel exchange unit
It is changed to serial data.
Further, the configuration bit information is identified using 8bit, and effective range is [0x01,0xFE].
Further, the substrate configuration information further includes the parameter information of the substrate, for identifying the substrate
Application state, for the serial data being stored in the substrate stocker.
Further, the parameter information is identified using multiple bytes, if the multiple byte be 0x00 or
0xFF, then the parameter information is invalid.
Second aspect of the present invention provides a kind of oled substrate recognition methods, using any one of claim 1-6
Substrate identifying system, including：
S101：The console controller reads substrate link using the serial data bus from the substrate link to be believed
Breath；
S103：The console controller reads the base according to the substrate link information by the serial data bus
The substrate configuration information of plate chain road at least one substrate, by the substrate configuration information of each substrate and the master
Default substrate configuration information is compared in machine controller, and identification and output error message are terminated if inconsistent, is otherwise jumped
It goes in S105；
S105：At least one substrate configuration information of the substrate chain road is correct, end of identification.
Further, the substrate link information includes substrate chain road described in the link sum of series of the substrate chain road
The substrate model of each node.
Further, the substrate configuration information includes the configuration bit information and parameter information of the substrate；The configuration
The hardware state of substrate described in the message identification of position；The parameter information is used to identify the application state of the substrate；The S103
It specifically includes：
S201：The link series in the substrate link information reads the configuration bit letter of the substrate in order
Breath；
S203：Judge whether the configuration bit information of the substrate is effective, effectively then jumps to S205, otherwise output error is believed
Breath, terminates this identification；
S205：The link series in the substrate link information reads the parameter letter of the substrate in order
Breath；
S207：Judge whether the parameter information of the substrate is effective, and it is S209 effectively then to redirect, otherwise output error is believed
Breath, terminates this identification；
S209：Judge the substrate configuration bit information and parameter information whether with default base in the console controller
Plate accordant configuration information unanimously then jumps to S211, otherwise output error message, terminates this identification；
S211：The link series in the substrate link information judges whether identified all substrates, if
It is to jump to S105, otherwise jumps to S201 and continue to identify substrate described in next stage.
Further, after the substrate of the link series of the substrate chain road correctly identifies, described
It is further included between S211 and S105：
S301：The next stage substrate of the link series is identified, the configuration bit information of the substrate is read, sentences
It is disconnected that with the presence or absence of redundancy substrate, the output error message if the data returned fall in the effective range terminates this identification,
Otherwise S105 is jumped to.
Beneficial effects of the present invention are as follows：
In the oled substrate identifying system of the present invention, the console controller is used described in serial data bus reading
The substrate configuration information of at least one substrate of substrate chain road is carried out with the substrate configuration information of console controller internal preset
It compares, the type of substrate that the present invention can be on automatic identification signal link avoids incorrect link caused by various factors, eliminates master
Substrate and measured panel damage caused by substrate model mismatch in machine program and signal link.
Description of the drawings
The specific embodiment of the present invention is described in further detail below in conjunction with the accompanying drawings.
Fig. 1 shows the structure diagram of the oled substrate identifying system of one embodiment of the present of invention；
Fig. 2 shows the flow chart of the oled substrate recognition methods of one embodiment of the present of invention；
Fig. 3 shows the flow chart of the oled substrate recognition methods of an alternative embodiment of the invention；
Fig. 4 shows the flow chart of the oled substrate recognition methods of an alternative embodiment of the invention.
Specific embodiment
In order to illustrate more clearly of the present invention, the present invention is done further with reference to preferred embodiments and drawings
It is bright.Similar component is indicated with identical reference numeral in attached drawing.It will be appreciated by those skilled in the art that institute is specific below
The content of description is illustrative and be not restrictive, and should not be limited the scope of the invention with this.
As shown in Figure 1, An embodiment provides a kind of oled substrate identifying system, including：Host computer control
Device, serial data bus and at least one substrate, the console controller, serial data bus and at least one substrate structure
Into substrate link, wherein the console controller reads the substrate link information using the serial data bus, and according to
The substrate link information reads the base of at least one substrate of the substrate chain road by the serial data bus
Plate configuration information, by default substrate configuration information in the substrate configuration information of each substrate and the console controller
It is compared, and exports result.
Further, the substrate link information includes substrate chain road described in the link sum of series of the substrate chain road
The substrate model of each node.
The console controller reads the substrate link information using the serial data bus, reads the substrate chain
The circuit engineering of road, i.e., the substrate model of each node of the quantity of substrate to be measured and substrate chain road.
The console controller starts to know each substrate according to the quantity of substrate chain road substrate to be measured
Not.
Further, the substrate configuration information includes the configuration bit information of the substrate, for identifying the substrate
Hardware state, is the hardware circuit formation and line identifier of the substrate, is turned described and line identifier by serioparallel exchange unit
It is changed to serial data.
As shown in Figure 1, the configuration bit information is realized by hardware circuit.Each configuration bit permutation and combination, it is corresponding a kind of
Substrate model, such as interposer, interposer substrate or contact substrate etc..Resistor network can be used in the substrate model, to every
A configuration bit is pulled down or pulled up, and is at " 0 " or " 1 " different conditions.The configuration bit information is matched somebody with somebody for parallel hardware
Set by serioparallel exchange chip, by parallel configuration bit network lineup, is converted to serial data, console controller can pass through
Serial data line reads this hardware identifier.The serioparallel exchange chip circuit is small, and integrated level is high, and price is low, being capable of basis
Base plate type number amount increases, and is formed and the one-to-one parallel configuration bit information of substrate model.
Parallel number of configuration bits provided in this embodiment is 8, and it is all low level (0x00) or institute to forbid all configuration bits
Configuration bit is all the situation of high level (0xFF), therefore can identify 254 kinds of substrate models, effective range for [0x01,
0xFE], the type of substrate that can meet in most cases distinguishes needs.Think base if " the hard mark " read is 0x00 or 0xFF
Plate is not attached to serial data bus.It should be noted that the number of configuration bits of the present embodiment can be according to base plate type number amount
How much, flexibly increased and decreased, it will be understood by a person skilled in the art that details are not described herein.
As shown in Figure 1, the substrate configuration information further includes the parameter information of the substrate, for identifying the substrate
Application state, the parameter information are the serial data being stored in the substrate stocker, and the title including the substrate is surveyed
Examination number and functional information.
In the present embodiment, the parameter information is serial data, and each substrate is independent slave device, and console controller is only
Need seldom pin, you can read the identification information of multiple substrates.The parameter information includes substrate title, tester substrate is compiled
Number, on substrate functional chip relevant parameter (initial code, correction parameter etc.), substrate package debug complete when, burning
In substrate stocker.
In the present embodiment, the parameter information is identified using multiple bytes, if the multiple byte is 0x00
Or 0xFF, then the parameter information is invalid." blank " data that general chip is given tacit consent to when dispatching from the factory, may be 0x00, it is also possible to be
0xFF shows storage chip without storing effective information, and the chip is unusable at this time.If the parameter information therefore read out is complete
Portion is 0x00 or 0xFF, illustrates that the data in the storage unit of the substrate are acknowledged without examining, the parameter information is invalid
In the present embodiment, the console controller reads the configuration bit information and parameter information of each piece of substrate respectively, and
It is compared with information substrate predetermined inside the console controller, only recognizes when configuration bit information is consistent with parameter information
Correctly to identify current trial base to be measured, otherwise it is assumed that substrate mistake, the output of host shutoff signal, substrate chain road is not provided not
The abnormal prompt information matched somebody with somebody.
As shown in Fig. 2, an alternative embodiment of the invention provides a kind of oled substrate recognition methods, above-mentioned OLED is utilized
Substrate identifying system, including：
S101：The console controller reads substrate link using the serial data bus from the substrate link to be believed
Breath；
S103：The console controller reads the base according to the substrate link information by the serial data bus
The substrate configuration information of plate chain road at least one substrate, by the substrate configuration information of each substrate and the master
Default substrate configuration information is compared in machine controller, and identification and output error message are terminated if inconsistent, is otherwise jumped
It goes in S105；
S105：At least one substrate configuration information of the substrate chain road is correct, end of identification.
Further, as shown in figure 3, the substrate link information is included described in the link sum of series of the substrate chain road
The substrate model of each node in substrate chain road, the substrate configuration information include the configuration bit information of the substrate and parameter letter
Breath；The hardware state of substrate described in the configuration bit message identification；The parameter information is used to identify the software shape of the substrate
State, title, test No. and functional information including the substrate；The S103 is specifically included：
S201：The link series in the substrate link information reads the configuration bit letter of the substrate in order
Breath；
S203：Judge whether the configuration bit information of the substrate is effective, effectively then jumps to S205, otherwise output error is believed
Breath, terminates this identification；
S205：The link series in the substrate link information reads the parameter letter of the substrate in order
Breath；
S207：Judge whether the parameter information of the substrate is effective, effectively then jumps to S209, otherwise output error is believed
Breath, terminates this identification；
S209：Judge the substrate configuration bit information and parameter information whether with default base in the console controller
Plate accordant configuration information unanimously then jumps to S211, otherwise output error message, terminates this identification；
S211：The link series in the substrate link information judges whether identified all substrates, if
It is to jump to S105, otherwise jumps to S201 and continue to identify substrate described in next stage.
Further, as shown in figure 4, the substrate of the link series of the substrate chain road correctly identifies
Afterwards, further included between the S211 and S105：
S301：The next stage substrate of the link series is identified, the configuration bit information of the substrate is read, sentences
It is disconnected that with the presence or absence of redundancy substrate, the output error message if the data returned fall in the effective range terminates this identification,
Otherwise S105 is jumped to.
In a specific example, as shown in figure 4, console controller uses the serial data bus from the substrate
Link reads substrate link information, includes the substrate model of each node in substrate chain road described in link sum of series respectively, i.e., current
The number of substrates and substrate model of substrate chain road connection.
Console controller is successively identified substrate to be measured according to the information, and first, console controller passes through the string
Row data/address bus reads the configuration bit information of No. 1 substrate, and it is wrong to think that No. 1 substrate exists if configuration bit information is 0x00 or 0xFF
By mistake, output error message terminates this identification.If configuration bit information, in effective range, console controller passes through the string
Row data/address bus reads the parameter information of No. 1 substrate, and it is wrong to think that No. 1 substrate exists if parameter information is all 0x00 or 0xFF
By mistake, output error message terminates this identification.If parameter information in effective range, judges the configuration bit information of No. 1 substrate
Whether matched with parameter information, if it is consistent with default information substrate in console controller, think correctly if consistent
Identify No. 1 substrate, No. 1 substrate state is normal.
According to the link series that console controller is read, judge whether the substrate chain road also has base to be identified
Plate has, and cycles execution above-mentioned steps, until identifying all several substrates of link level.Specific identification process is with foregoing, herein not
It repeats again
After afterbody substrate is identified, to prevent still there is redundancy substrate connection on substrate chain road, continue to attempt to
The next stage substrate of the link series (assuming that current ink series is M) is identified, that is, passes through universal serial bus, host control
Device processed reads the configuration bit information of the M+1 grades of substrates in substrate chain road：
Illustrate that still incorrect link has redundancy substrate on substrate chain road at this time if the data returned fall in effective range, it is defeated
Malfunction false information, terminates this identification.If the data returned are 0x00 or 0xFF, illustrate rear class at this time and not connected redundancy base
Plate, so far all substrates identification of the substrate link are completed, this end of identification.
In the above embodiment of the present invention, console controller by serial data bus, believe by the configuration bit for reading each substrate
Breath and parameter information, and be compared with the default information substrate of console controller, it is respectively saved in substrate link described in automatic identification
Whether each function substrate used in point meets test request, can improve testing efficiency, avoid invalid test, avoids unexpected
Substrate damage or measured panel damage.
Obviously, the above embodiment of the present invention is only intended to clearly illustrate example of the present invention, and is not pair
The restriction of embodiments of the present invention for those of ordinary skill in the art, may be used also on the basis of the above description
To make other variations or changes in different ways, all embodiments can not be exhaustive here, it is every to belong to this hair
The obvious changes or variations that bright technical solution is extended out is still in the row of protection scope of the present invention.
Claims (10)
1. a kind of oled substrate identifying system, which is characterized in that including：Console controller, serial data bus and at least one
Substrate, the console controller, serial data bus and at least one substrate form substrate link, wherein
The console controller reads the substrate link information using the serial data bus, and according to the substrate link
Information reads the substrate configuration information of at least one substrate of the substrate chain road by the serial data bus, will
The substrate configuration information of each substrate is compared with default substrate configuration information in the console controller, and defeated
Go out result.
2. substrate identifying system according to claim 1, which is characterized in that the substrate link information includes the substrate
The substrate model of each node in substrate chain road described in the link sum of series of chain road.
3. substrate identifying system according to claim 1, which is characterized in that the substrate configuration information includes the substrate
Configuration bit information, for identifying the hardware state of the substrate, be the substrate hardware circuit formed and line identifier, lead to
It crosses serioparallel exchange unit and described and line identifier is converted into serial data.
4. substrate identifying system according to claim 3, which is characterized in that the configuration bit information uses 8bit into rower
Know, effective range is [0x01,0xFE].
5. substrate identifying system according to claim 3, which is characterized in that the substrate configuration information further includes the base
The parameter information of plate, for identifying the application state of the substrate, for the serial data being stored in the substrate stocker.
6. substrate identifying system according to claim 5, which is characterized in that the parameter information is carried out using multiple bytes
Mark, if the multiple byte is 0x00 or 0xFF, the parameter information is invalid.
7. a kind of oled substrate recognition methods, which is characterized in that identify system using the substrate any one of claim 1-6
System, including：
S101：The console controller reads substrate link information using the serial data bus from the substrate link；
S103：The console controller reads the substrate chain according to the substrate link information by the serial data bus
The substrate configuration information of at least one substrate on the road, by the substrate configuration information of each substrate and the host control
Default substrate configuration information is compared in device processed, and identification and output error message are terminated if inconsistent, is otherwise jumped to
In S105；
S105：At least one substrate configuration information of the substrate chain road is correct, end of identification.
8. substrate recognition method according to claim 7, which is characterized in that the substrate link information includes the substrate
The substrate model of each node in substrate chain road described in the link sum of series of chain road.
9. substrate recognition method according to claim 7, which is characterized in that the substrate configuration information includes the substrate
Configuration bit information and parameter information；The hardware state of substrate described in the configuration bit message identification；The parameter information is used for
Identify the application state of the substrate；The S103 is specifically included：
S201：The link series in the substrate link information reads the configuration bit information of the substrate in order；
S203：Judge whether the configuration bit information of the substrate is effective, effectively then jumps to S205, otherwise output error message,
Terminate this identification；
S205：The link series in the substrate link information reads the parameter information of the substrate in order；
S207：Judge whether the parameter information of the substrate is effective, and it is S209 effectively then to redirect, otherwise output error message, eventually
Only this is identified；
S209：Whether the configuration bit information and parameter information for judging the substrate match somebody with somebody with default substrate in the console controller
Confidence breath is consistent, unanimously then jumps to S211, otherwise output error message, terminates this identification；
S211：The link series in the substrate link information judges whether identified all substrates, if then
S105 is jumped to, S201 is otherwise jumped to and continues to identify substrate described in next stage.
10. substrate recognition method according to claim 9, which is characterized in that the link level of the substrate chain road
After several substrates correctly identifies, further included between the S211 and S105：
S301：The next stage substrate of the link series is identified, reads the configuration bit information of the substrate, judgement is
It is no there are redundancy substrate, the output error message if the data returned fall in the effective range terminates this identification, otherwise
Jump to S105.
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| CN201711384209.2A CN108052462B (en) | 2017-12-20 | 2017-12-20 | OLED substrate identification system and method |
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|---|---|---|---|
| CN201711384209.2A CN108052462B (en) | 2017-12-20 | 2017-12-20 | OLED substrate identification system and method |
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| CN1877666A (en) * | 2005-06-10 | 2006-12-13 | 三星电子株式会社 | Display substrate and device and method for testing display panel with the display substrate |
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| CN102099847A (en) * | 2008-07-23 | 2011-06-15 | 夏普株式会社 | Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device |
| US20160104402A1 (en) * | 2014-10-13 | 2016-04-14 | Samsung Display Co., Ltd. | Organic light-emitting display panel and test method |
-
2017
- 2017-12-20 CN CN201711384209.2A patent/CN108052462B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1877666A (en) * | 2005-06-10 | 2006-12-13 | 三星电子株式会社 | Display substrate and device and method for testing display panel with the display substrate |
| CN101251565A (en) * | 2008-04-08 | 2008-08-27 | 友达光电股份有限公司 | Panel Test Circuit Structure |
| CN102099847A (en) * | 2008-07-23 | 2011-06-15 | 夏普株式会社 | Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device |
| CN101609635A (en) * | 2009-07-24 | 2009-12-23 | 友达光电（苏州）有限公司 | Liquid crystal panel test module and liquid crystal panel failure mode analysis method |
| US20160104402A1 (en) * | 2014-10-13 | 2016-04-14 | Samsung Display Co., Ltd. | Organic light-emitting display panel and test method |
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