CN107887288A - The continuous inspection method of the electrical characteristics of chip electronic part - Google Patents
The continuous inspection method of the electrical characteristics of chip electronic part Download PDFInfo
- Publication number
- CN107887288A CN107887288A CN201710907630.0A CN201710907630A CN107887288A CN 107887288 A CN107887288 A CN 107887288A CN 201710907630 A CN201710907630 A CN 201710907630A CN 107887288 A CN107887288 A CN 107887288A
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- Prior art keywords
- electronic part
- chip electronic
- electrical characteristics
- electrode
- chip
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- 238000000034 method Methods 0.000 title claims abstract description 53
- 238000007689 inspection Methods 0.000 title abstract description 77
- 230000008569 process Effects 0.000 claims abstract description 17
- 230000005611 electricity Effects 0.000 claims description 12
- 238000003556 assay Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 3
- 208000027418 Wounds and injury Diseases 0.000 description 13
- 239000000523 sample Substances 0.000 description 11
- 239000003990 capacitor Substances 0.000 description 9
- 230000006378 damage Effects 0.000 description 9
- 230000007246 mechanism Effects 0.000 description 6
- 239000003344 environmental pollutant Substances 0.000 description 5
- 231100000719 pollutant Toxicity 0.000 description 5
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 4
- 230000003028 elevating effect Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000000047 product Substances 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 238000010276 construction Methods 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 230000001629 suppression Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical group C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229910001887 tin oxide Inorganic materials 0.000 description 2
- 241000406668 Loxodonta cyclotis Species 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 239000000806 elastomer Substances 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 208000014674 injury Diseases 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000002715 modification method Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000009738 saturating Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- QHGNHLZPVBIIPX-UHFFFAOYSA-N tin(ii) oxide Chemical class [Sn]=O QHGNHLZPVBIIPX-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
- G01R31/016—Testing of capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Manufacturing Cores, Coils, And Magnets (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Sorting Of Articles (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The present invention relates to the continuous inspection method of the electrical characteristics of chip electronic part.Reduced using multiple processes and determining the scratch of electrode surface caused by the electrical characteristics of chip electronic part, while improve the reliability of electrical characteristics determining, the multiple process includes：House chip electronic part temporarily in the open-work of delivery board so that one of end electrodes positioned at top and another is located at bottom, make delivery board along its plate planar movement to electrical characteristics determining position, the electrical characteristics determining comprising circular electrode terminal is contacted with terminal with two electrodes of chip electronic part and apply voltage to two electrodes of chip electronic part to determine the electrical characteristics of chip electronic part, and by making delivery board further move to make chip electronic part be left from electrical characteristics determining position.Chip electronic part moves and when with circular electrode termination contact, make circular electrode terminal position so as to be contacted with a corner of the top electrodes of chip electronic part, after electrical characteristics determining, circular electrode terminal is set to be moved to the direction left from the surface of delivery board in a manner of not contacted with another corner of the top electrodes of chip electronic part.
Description
Technical field
The present invention relates to the chip electronic part using automation to check sorting unit at a high speed and continuously to substantial amounts of core
The method that the electrical characteristics of piece electronic unit are checked.
Background technology
Along with the output of the miniaturized electronics such as portable phone, smart phone, liquid crystal TV set, electronic game machine
Increase, the output that group enters the small chip electronic part into such electronic equipment dramatically increases.Chip electronic portion
Most of each electrode possessed by main part and in two opposite end faces of main part of part is formed.It is used as this
The example of the chip electronic part of the structure of sample, can enumerate chip capacitor（Also referred to as chip capacity）, chip resister
（Include chip varistor）And chip inductance.
In recent years, the further miniaturization and group for entering to have the electronic equipment of chip electronic part in response to group enter to electricity
The increase of the quantity of chip electronic part in sub- equipment, chip electronic part become extremely small.For example, on chip capacity
Device, extremely small size is used in recent years（For example, it is referred to as 0.2mm × 0.2mm × 0.4mm of 0402 chip size）Core
Chip capacitor device, it is such single by tens of thousands of ~ hundreds of thousands of batch that such small chip electronic part leads to undergone mass production
Position and produced.
In order to reduce lacking for the chip electronic part entered in the electronic equipment that group enters to have chip electronic part due to group
The percent defective of sunken electronic equipment, exhaustive test generally is carried out to the chip electronic part largely produced.For example, on as system
The chip capacitor of product, to its total inspection for carrying out the electrical characteristics such as electrostatic capacitance or leakage current.
The inspection of the electrical characteristics of substantial amounts of chip electronic part needs to carry out at high speed, as automatically carrying out the height
The device of the inspection of speed, it is in recent years, usually used to possess the chip electronic part transport discs formed with many open-works（It is discoid
Chip electronic part delivery board）Chip electronic part electrical characteristics inspection automation equipment（That is, chip electronic part
Check device）.In chip electronic part transport discs（After, it is only called transport discs sometimes）In, generally circumferentially with
The many open-works for temporarily housing the chip electronic part for keeping check object are formed in the state of multiple row arrangements more than three row.
Moreover, in chip electronic part inspection sorting unit in use, being in making chip electronic part temporarily house to be held in
After the open-work of transport discs under intermittent rotation, a pair of electrodes terminal for setting up the rotating path along transport discs
（Inspection contact）Contact defined voltage being applied to each electrode of chip electronic part and be held in the transport discs
Chip electronic part, carry out the operation being measured to the electrical characteristics of the chip electronic part.
For example, in the case where carrying out the inspection of electrostatic capacitance of chip capacitor, in electrical characteristics inspection portion, from chip
Electronic unit checks sorting unit possessed detector（Electrical characteristics determining device）Via inspection electrode terminal to chip electricity
Container applies the inspection voltage with defined frequency.Then, using detector to the application due to the inspection voltage and
The current value of caused electric current is detected in chip capacitor, the voltage based on the detection current value and inspection voltage
Value, carry out the measure of the electrostatic capacitance of the chip capacitor of check object.
That is, the check device of the electrical characteristics of above-mentioned chip electronic part can be referred to as including with the chip electronic of lower part
Part electrical characteristics check device：On surface, the chip electronic part of the row of the open-work in concentric circles formed with least three row is defeated
Send disk, the transport discs are entered in a manner of it can carry out its intermittent rotation at the center of the row of the open-work of concentric circles
The base station of row e axle supporting and the chip electronic part supply being respectively configured in the position on the surface along the transport discs house
Portion and the electrical characteristics inspection portion for possessing the electrode tip subgroup comprising circular electrode terminal and fixed electrode terminal.
At the end of the inspection of the chip electronic part kept in transport discs, based on its inspection result, implement sorting
（Or classification）Operation, so as to make chip electronic part be accommodated in defined container from the discharge of the open-works of transport discs.Cause
This, is further attached to point for the chip electronic part after being checked in common chip electronic part check device
Choosing（Or classification）Chip electronic part classification portion（Specification area）, chip electronic part electrical characteristics inspection sorting is turned to by product
The situation of device is more.
The example of sorting unit is checked as above-mentioned chip electronic part, the dress described in patent document 1 can be enumerated
Put.That is, the method for the electrical characteristics for being continuously checked chip electronic part including following process has been recorded in patent document 1
Modification method：Sorting unit is checked using the chip electronic part of above-mentioned structure, is made respectively to show that defined same electricity is special
Property the chip electronic part of check object that is manufactured based on same standard of mode housed and protect with the state configured close to each other
Hold（It is interim to house）In the open-work of transport discs, then, detector is electrically connected with the electrode of chip electronic part, then from inspection
Look into device and inspection voltage is applied to each chip electronic part, using detector to the caused electric current in each chip electronic part
Value is detected.
In the chip electronic part electrical characteristics inspection portion that above-mentioned chip electronic part checks sorting unit generally along
The radial direction of transport discs possesses multigroup electrical characteristics checking tool, and the electrical characteristics checking tool is by the back side of transport discs
Side（Or downside）The fixation probe of configuration（probe）Electrode（Generally, it is referred to only as fixed electrode）With on the surface of transport discs
Side（Or upside）The movable probe electrode of configuration（Generally, it is referred to only as movable electrode）Combine to form.
The chip electronic part electrical characteristics inspection portion possessed of sorting unit is checked as above-mentioned chip electronic part
Movable probe, in the past by the probe distal end portion（The part contacted with the electrode surface of chip electronic part）It is processed as bar-shaped or processing
Rotatable roller is attached to for brush and sac like or at probe tip end, tries to be used to realize probe distal end portion and chip electronic portion
The reliable contact of the electrode of part, still, in recent years, contacted in addition less usually using the abrasion or defect of probe distal end portion
The electrode of chip electronic part damages few circular electrode terminal（The electrode terminal of roller is attached in top ends）.
The electronic unit electrical characteristics inspection portion possessed circular electrode end of sorting unit is checked on chip electronic part
The example of son, describes detailed description in patent document 2 ~ 6 together with the illustration of structure chart.
Among above-mentioned patent document 2 ~ 6 Patent Document 2 discloses chip electronic part to check sorting unit institute
The configuration example of the known circular electrode terminal possessed, describing is carried out and then at two using circular electrode terminal
End possesses the damage of the part for the electrode that chip electronic part is produced during the inspection of the electrical characteristics of the chip electronic part of electrode
（Contact wound）The problem of point.Moreover, it is electrode and circular electrode terminal in chip electronic part to have in patent document 2
The explanation of the contact wound of the electrode of the chip electronic part is produced during contact and when contact releases.In addition, in patent document 2,
As the side for contacting wound caused by electrode of the suppression due to the contact with the circular electrode terminal and in chip electronic part
Case, it is proposed that the elastomer of the ring-type of the top roller section of way roller electrode is set up.
In patent document 5 in addition of patent document 4 of patent document 3 and corresponding International Publication publication as patent document 3
In the patent document 6 as the corresponding International Publication publication of patent document 5, chip electronic part inspection sorting dress is also disclosed that
Put the other configuration example of possessed circular electrode terminal.Moreover, describe for preventing in foregoing chip electronic part
Electrical characteristics inspection caused by electrode damage previous methods.In the previous methods, following methods are illustrated：Defeated
When sending the rotation of disk, circular electrode terminal arrangement is positioned away from from the surface of transport discs so that circular electrode end
The electrode of the sub not chip electronic part with being contained in the open-work of transport discs and being conveyed contacts, and then, is utilizing conveying circle
When chip electronic part in open-work is transported to electrical characteristics inspection portion and rotates stopping by the rotation of disk, by making circular electrode end
Son is mobile（Decline）To be contacted with the electrode of chip electronic part to check electrical characteristics, after the inspection afterwards terminates, this makes
Circular electrode terminal moves in a manner of the electrode from chip electronic part leaves（Rise）, then, carry out the rotation of transport discs
Turn.But indicate in these patent documents and checked in the method due to adding the descending operation of circular electrode terminal
The productivity of operation reduces（Time required for Inspection is elongated）The generation of so the problem of.
Prior art literature
Patent document
Patent document 1：Japanese Unexamined Patent Publication 2015-213121 publications；
Patent document 2：Japanese Unexamined Patent Publication 2008-224418 publications；
Patent document 3：Japanese Unexamined Patent Application Publication 2010-511865 publications；
Patent document 4：WO2008/067129 A2；
Patent document 5：Japanese Unexamined Patent Application Publication 2010-517058 publications；
Patent document 6：WO2008/094831 A1.
The content of the invention
The invention problem to be solved
The inventor of the present invention possesses in patent document 2 as existing using as inspection by the use of the movable probe electrode of contact
The chip electronic part for the circular electrode terminal that technology illustrates checks sorting unit to have carried out the continuous electricity of chip electronic part
The checkout facility of characteristic.As a result, using circular electrode terminal record as prior art in patent document 2
Possess the inspection of the electrical characteristics of the chip electronic part of electrode two ends in the case of, as being recorded citation 2,
The electrode confirmed in chip electronic part produces contact wound.Further, on after the inspection of such electrical characteristics observe
The presence of contact wound in the electrode of chip electronic part, it will check that the chip electronic parts group finished enters using scolding tin（Peace
Dress）Soaking for the scolding tin of the electrode to chip electronic part needed during into printed wiring board easily becomes uneven, turns into
Chip electronic part install when trouble the reason for.Therefore, it is desirable to make the electricity of the chip electronic part of the inspection by electrical characteristics
The contact wound of pole-face is as small as possible.
The inventor of the present invention and then utilize the known method described in patent document 3 ~ 6, i.e. with being contained in open-work
The intermittent rotation of the transport discs of chip electronic part synchronously repeats the retrogressing of circular electrode terminal（From transport discs table
The movement that face is left）And advance（The movement of electrode surface contact to the chip electronic part for the open-work for being contained in transport discs）
Method, also confirm to suppress the generation of the contact wound of the electrode of chip electronic part finished to inspection.But according to
The discussion of the inventor of the present invention, distinguishes：In the inspection for the electrical characteristics for implementing the chip electronic part using the above method
In the case of operation, the tendency for the repeatability that is weak in the inspection result of the electrical characteristics of chip electronic part（That is, determining
Should all non-defective units（Certified products）Although chip electronic part electrical characteristics in the case of original measured value should be on one point
Gather in error range but produce the tendency of many errors in the measured value）.When should be in fixed mistake in original measured value
As being produced in the measurement result of the electrical characteristics of the chip electronic part for the certified products gathered in poor scope during error, turn into nothing
Method ensures the result of the reliability of measured value, the measure side of the electrical characteristics according to the rank of the error as chip electronic part
The qualification of method turns into problem.
That is, according to the discussion before this of the inventor of the present invention, distinguish：On using known to transport discs
Chip electronic part check device, it is difficult to disclosure satisfy that generation that the contact of the electrode of chip electronic part that inspection finishes is hindered
Suppression and inspection result judgement required for electrical characteristics measured value reliability maintenance as it is all important will
Degree that is asking and depositing is realized.
Further, this specification it is explained herein before in, illustrate utilize using transport discs chip electronic portion
The continuous inspection method of the chip electronic part of part check device, still, on the continuous inspection method of chip electronic part,
Know the chip electronic part delivery board using the other shapes for not being disc-shape（After, it is only called delivery board sometimes）It is each
Kind method.
That is, the continuous inspection method of common chip electronic part can be referred to as including under those known inspection methods
The assay method of the electrical characteristics for the chip electronic part stated.
A kind of assay method of the electrical characteristics of chip electronic part, comprising：Received temporarily possessing multiple chip electronic parts
Hold each tool for being housed in two ends toward each other in the interim accepting hole of chip electronic part of the delivery board in hole temporarily
The chip electronic part of standby electrode is so that the electrode of an end is located at top and the electrode of another end is located at bottom
Process；Make planar movement of the delivery board along its surface to the process of electrical characteristics determining position；By making electrical characteristics determining end
Son contacts with each of the electrode at the top of chip electronic part and the electrode of bottom and to the top of chip electronic part
Each of electrode and the electrode of bottom apply voltage to determine the process of the electrical characteristics of chip electronic part；And by making core
Plane of the piece electronic unit delivery board along its surface further move make electrical characteristics determining terminate after chip electronic part
The process departed from from electrical characteristics determining position.
Therefore, problem of the invention is to provide a kind of inspection method of chip electronic part, and methods described can be common
Realize and suppress be used as one using the delivery board for possessing multiple interim accepting holes of chip electronic part and by circular electrode terminal
The chip electronic that easily caused during the use of the chip electronic part check device of individual electrical characteristics determining terminal, inspection finishes
The reliability of the measured value of electrical characteristics required for the generation and the judgement of maintenance inspection result of the contact wound of the electrode of part
Such important requirement.
For solving the scheme of problem
The present invention inventor discussed repeatedly to solve above-mentioned problem as a result, being found that：Utilizing using conveying
Disk and the chip electronic that circular electrode terminal is used as to the movable probe of chip electronic part electrical characteristics inspection portion's possessed
In the inspection method of part check device, the intermittent rotation with transport discs synchronously, by the circular electrode terminal defeated
The position being configured at during the rotation for sending disk near the position that is contacted with the surface of transport discs or surface in transport discs
Put, i.e., electrical characteristics inspection is moved to due to the rotation of transport discs in the chip electronic part for being contained in the open-work of transport discs
The position that the electrode of chip electronic part is contacted with circular electrode terminal when in portion, it is being contained in the chip electricity of transport discs
Subassembly stops the rotation of transport discs after being moved in electrical characteristics inspection portion, with circular electrode terminal and chip electronic portion
It is during the measure of the state progress electrical characteristics of the electrode contact of part is afterwards and transport discs are in halted state that roller is electric
Extreme son then, is moved to from the electrode separation of chip electronic part in chip electronic part due to the rotation of transport discs
After outside electrical characteristics inspection portion, make circular electrode terminal movable so that again return to the contact position of transport discs or
Position near the surface of transport discs, solves above-mentioned problem thereby, it is possible to the degree that disclosure satisfy that in practical level.
Therefore, the continuous inspection method of electrical characteristics of the present invention in following chip electronic parts.
A kind of electrical characteristics determining method of chip electronic part, comprising：
Received temporarily in the interim accepting hole of chip electronic part for the delivery board for possessing multiple interim accepting holes of chip electronic part
Hold two ends toward each other each possess electrode chip electronic part so that an end electrode positioned at top
The process that the electrode of portion and another end is located at bottom；
Make planar movement of the delivery board along its surface to the process of electrical characteristics determining position；
By make electrical characteristics determining terminal and chip electronic part top electrodes and bottom electrode each contact and to
The top electrodes of chip electronic part and each application voltage of bottom electrode（Wherein, with the electrical characteristics of top electrode contact
Measure is circular electrode terminal with terminal）To determine the process of the electrical characteristics of chip electronic part；And
By delivery board is further moved along its plate plane make electrical characteristics determining terminate after chip electronic part from electricity
The process that characteristic measurement position departs from,
The assay method is characterised by,
Chip electronic part moves, its top electrodes start with before the contact of circular electrode terminal, by circular electrode
Terminal arrangement is in the position contacted with top electrodes corner, then after electrical characteristics determining, with not with top electrodes
The mode of another corner contact makes circular electrode terminal be moved to the direction left from the surface of chip delivery board.
Further, chip electronic part transport discs of the present invention in delivery board for the intermittent rotation of progress by axle of center
Chip electronic part electrical characteristics measure when can particularly advantageously utilize.
Invention effect
By using the continuous inspection method of the electrical characteristics of the chip electronic part of the present invention, so as to using transport discs
The contact of the electrode of chip electronic part that inspection finishes is realized with the chip electronic part check device of circular electrode terminal
The maintenance of the high reliability of the measured value of electrical characteristics required for the caused suppression of wound and the judgement of inspection result is so
It is all important requirement and deposit.
Brief description of the drawings
Fig. 1 is to show that chip electronic part checks the front elevation of the integrally-built example of sorting unit.
Fig. 2 is to show to examine the electrical characteristics for being contained in the chip electronic part of the open-work of transport discs by inspection portion
The profile for the state looked into.
Fig. 3 is to show the circular electrode described in patent document 2（roller electrode）The figure of the construction of terminal.
Fig. 4 is to show the chip electronic part for being contained in transport discs and circular electrode terminal shown in patent document 2
The figure of contact condition of the roller portion before and after electrical characteristics inspection.
Fig. 5 is to be contained in transport discs in the continuous inspection method for the electrical characteristics for showing the chip electronic part of the present invention
Chip electronic part and circular electrode terminal contact condition of the roller portion before and after electrical characteristics inspection figure.
Fig. 6 is the circular electrode for illustrating to use in the continuous inspection method of the electrical characteristics of the chip electronic part of the present invention
The elevating mechanism of terminal（In order to which roller is from chip after electrical characteristics inspection from the state that roller contacts with the surface of transport discs
The mechanism that the electrode surface of electronic unit leaves and moved）Example figure.
Embodiment
Initially, on one side referring to the drawings Fig. 1 and Fig. 2 is while illustrate the company in the electrical characteristics of the chip electronic part of the present invention
What is advantageously used in the implementation of continuous inspection method is used as delivery board by transport discs（plate）Chip electronic part inspection point
Screening device（That is, possesses the chip electronic part check device of chip electronic part separation unit）Configuration example.
The chip capacitor of the typical example of the chip electronic part of check object by including dielectric capacitor main body and
In a pair of electrodes that its both ends is oppositely arranged（Or electrode surface）Form.Common chip capacitor is as dielectric by ceramics
Multichip ceramic capacitor.Further, the electrode of currently commonly used chip electronic part is formed by tin, its surface formed with
In the soldering-tin layer that chip electronic part is installed to various substrates.
The chip electronic part of check object is more for the situation of the electronic unit of same manufacture batch, but it is also possible to
The chip electronic part of other batch is mixed with the chip electronic part of such same manufacture batch.But generally,
The chip electronic part of both manufacture batches is to be manufactured in a manner of showing mutually the same electrical characteristics according to same standard
Electronic unit（The electronic unit usually manufactured using for the purpose of being sold as mutually the same product）.
Fig. 1 is the front elevation of the configuration example for the chip electronic part inspection sorting unit for being shown with transport discs.In Fig. 1
Shown chip electronic part is checked in sorting unit 10, in transport discs（Discoid delivery board）Surface on circumferentially
Chip electronic part transport discs of the configuration of arrangement formed with the multiple open-work 11a that can temporarily house chip electronic part
（Hereinafter sometimes referred to simply as transport discs）11 in a manner of it can be rotated along the plane of disk by the e axle supporting of base station 41.
The supply resettlement section of chip electronic part is set with the rotating path of transport discs 11（Supply receiving area）101st, chip
The inspection portion of electronic unit electrical characteristics（Inspection area）102 and the division of chip electronic part（Specification area）103.Examining
Look into portion 102, possess electrical characteristics determining in each open-work 11a of each row with transport discs 11 two opening portion close proximity
Electrode terminal（Electrical characteristics determining terminal）.Detector 14a, 14b are electrically connected with electrode terminal, and is possessed with to inspection
Look into the controller 15 that the mode of the device supply signal related to checking processing electrically connects with detector.Further, the core of check object
Piece electronic unit enters hopper（hopper）47, from chip electronic part supply mouth 31 via scraper bowl（bucket）It is supplied to defeated
Send the open-work of disk 11.
The open-work 11a of transport discs 11 be generally configured in the surface of transport discs, on multiple concentric circles, to the concentric circles
The position after segmentation such as carry out.
In chip electronic part shown in the drawings checks sorting unit 10, it is provided with the center of transport discs 11 and week
What is diametrically arranged between edge adds up to 6 open-works, according to the every of the total 6 chip electronic parts for being contained in each open-work
The inspection of the electrical characteristics of one progress chip electronic part.On between the center of transport discs 11 and periphery diametrically
The quantity of the open-work of arrangement, preferably in the scope of 3 ~ 20, more preferably in the scope of 3 ~ 12.
Transport discs 11 are for example via substrate（Standard station）And central shaft 42 is set in a manner of revolvable（It is fixed）In
Base station 41, by making the rotating driving device 43 for being disposed in its rear side work, so as to intermittently be carried out around central shaft 42
Rotation.
In the open-work 11a of transport discs 11, in chip electronic part supplies resettlement section 101, inspection pair is temporarily housed
The chip electronic part of elephant, to check its electrical characteristics.
As shown in Fig. 2 in inspection portion（Electrical characteristics determining position）In 102, in order to by chip electronic part 19a, 19b,
The electrode at the both ends of each of 19c, 19d, 19e, 19f（22a、22b）Electrically connected with detector, saturating with transport discs 11
Electrode terminal 12a, 13a that hole 11a two opening portion close proximity are each configured with forming in pairs, 12b, 13b, 12c,
13c、12d、13d、12e、13e、12f、13f.The circular electrode terminal used in the present invention equivalent to by 13a, 13b, 13c,
The electrode terminal that 13d, 13e, 13f are represented.
It is not the electrode terminal of a side of circular electrode terminal（It is 12a, other）Via the electrical insulating property being disposed in around it
Cylinder and be fixed in substrate 45.
By making the electrode terminal support plate that pair roller electrode terminal is supported be moved to the side of transport discs 11, so that by
The circular electrode terminal of electrode terminal support plate supporting（It is 13a, other）Also moved simultaneously to the side of transport discs 11.Pass through the rolling
Take turns electrode terminal（It is 13a, other）Movement, chip electronic part is clamped in paired electrode terminal（It is 12a, 13a, other）It
Between and turn into contact condition.Therefore, the electrode of chip electronic part and fixed electrode terminal（It is 12a, other）With circular electrode end
Son（It is 13a, other）Electrical connection.
Moreover, in inspection portion（Electrical characteristics determining position）In 102, for being arranged in the diametric(al) of transport discs 11
Cheng Yilie mode houses 6 chip electronic parts 19a, 19b, 19c, 19d, 19e, 19f of configuration each inspection regulation
Electrical characteristics.
Check that the chip electronic part after electrical characteristics then in rotary moving is sent by the intermittent of transport discs 11
Into the division 103 of the chip electronic part shown in Fig. 1.Carry out the classification of the chip electronic part based on inspection result（Point
Choosing）.
Then, to the operation as feature in the continuous inspection method of the electrical characteristics of chip electronic part of the invention
The movement of circular electrode terminal is described in detail.
First, the figure of the construction for showing circular electrode terminal shown in reference picture 3 illustrates known circular electrode terminal
An example.Further, Fig. 3（a）It is the front elevation of circular electrode terminal,（b）It is the inside for showing the circular electrode terminal
The side view of construction.
Fig. 3's（a）With（b）In the example of illustrated circular electrode terminal, circular electrode terminal 13 includes：Housing
131st, to the connection terminal 132 of detector, circular electrode 133, circular electrode rotary shaft 134, circular electrode support 135, shake
Fulcrum 136, helical spring（coil spring）137th, connecting cable 138.
Fig. 4's（a）、（b）、（c）It is the inspection portion illustrated in the patent document 2 for the document for being shown as showing prior art
（Electrical characteristics determining position）In chip electronic part 19 and circular electrode 133 contact condition change figure.That is, roller electricity
Pole 133 due to transport discs 11 to（a）The movement in the direction of shown arrow and with collecting（It is interim to house）In transport discs 11
The corner of electrode of the chip electronic part 19 at the top of it of open-work contact first, then, turn into and roll on（run
onto）State behind the surface of top electrodes.At the time point, transport discs 11 temporarily cease, during the stopping upwards
Apply voltage between the circular electrode 133 of side and the fixed electrode terminal of downside, the electrical characteristics of chip electronic part 19 are carried out
Measure.Then, after electrometric determination terminates, transport discs 11 move to the direction of arrow again, as a result, circular electrode
133 one side contact in another corner of the electrode at the top of chip electronic part, while gradually getting off from top.Illustrate before
Electrical characteristics determining opening position chip electronic part top electrodes damage（Contact wound）Mainly Fig. 4's（a）With（b）Institute
It is showing with circular electrode contact start（Rolled on to the circular electrode of top electrodes）Produced when departing from contact.
Fig. 5 is the core for showing the electrical characteristics determining opening position in the electrical characteristics determining method of the chip electronic part of the present invention
Piece electronic unit 19 and the figure of the change of the contact condition of circular electrode 133.
Fig. 5's（1）Show the circular electrode 133 of fixed electrode terminal 12 and circular electrode terminal which not with receipts
It is dissolved in transport discs 11 and the state contacted to direction of arrow chip electronic part 19 in rotary moving.In this condition, roll
Wheel electrode 133 is in be contacted or the surface close proximity with transport discs 11 with the surface of transport discs 11.
Fig. 5's（2）It is to show that circular electrode contacts with a corner of the top electrodes of chip electronic part and to roll on
The figure of the state on the surface of the electrode.
Fig. 5's（3）In, circular electrode rolls on the surface of the top electrodes of chip electronic part, carries out in this condition
The measure of the electrical characteristics of chip electronic part.Further, in circular electrode from Fig. 5's（2）State to（3）State movement mistake
Cheng Zhong, in the corner on the surface of the top electrodes of chip electronic part（The right corners of figure）Damage is produced with its periphery（Friction
Wound）.Meanwhile it is partially stripped the metal oxide film in the Surface Creation of the top electrodes of chip electronic part（For example, as electrode
The oxide of the tin of material is tin oxide film）, expose electrode material（For example, tin）.In addition, utilize circular electrode and chip electricity
The contact of the repetition of the top electrodes of subassembly is also partially stripped in metal oxygens such as the tin-oxides of the surface of circular electrode deposition
The non-conductive pollutant such as compound.Therefore, the electricity of the top electrodes and circular electrode that more successfully carry out chip electronic part connects
Touch.
That is, from Fig. 5's（2）State be changed into（3）State during, in the top electrodes of chip electronic part
Damage is produced in the region on one corner and its periphery（Friction injury）, still, while removing is peeled off on the top of chip electronic part
The non-conductive pollutant of portion's electrode generation and the non-conductive pollutant deposited on the surface of circular electrode, therefore, with high
The smoothly electrical contact of the top electrodes and circular electrode of reliable realization chip electronic part.Further, from the Fig. 5's（2）'s
State is changed into（3）State process with from Fig. 4's（a）To（b）Process nature on it is identical.
Fig. 5's（3）In the state of terminate chip electronic part electrical characteristics measure after, circular electrode is such as Fig. 5
（4）The shown direction left like that to the top electrodes from chip electronic part and transport discs（It is top in figure）It is mobile.
Left in the top electrodes of circular electrode from chip electronic part and be changed into Fig. 5's（4）State after, such as Fig. 5
's（5）It is shown like that, transport discs carry out in rotary moving again, and chip electronic part leaves from electrical characteristics determining position.Therefore,
In the case where make use of the electrical characteristics determining method of chip electronic part of the present invention, will not produce Fig. 4's（b）Extremely（c）
In the state of observe chip electronic part electrode surface opposite side corner damage.
When chip electronic part leaves from electrical characteristics determining position, circular electrode declines, as in Fig. 5（6）In see
Like that, again return to and contacted with delivery board or close proximity.Afterwards, repeat from Fig. 5's（1）To（6）Stroke.
As being recorded more than, implement the measure of the electrical characteristics of chip electronic part according to the method for the present invention, thus,
The damage of the electrode of caused chip electronic part before and after the measure operation of electrical characteristics can be reduced（Contact wound）, additionally it is possible to
Carry out in non-conductive pollutants such as the metal oxides of Surface Creation of electrode of chip electronic part or at circular electrode end
The removing of the non-conductive pollutant of the circular electrode deposition of son.Moreover, do not have on the time required for the measure of electrical characteristics yet
Tangible extension.
Fig. 6 is the circular electrode end used in the continuous inspection method to the electrical characteristics of the chip electronic part in the present invention
The elevating mechanism of son（In order to which roller is electric from chip after electrical characteristics inspection from the state that roller contacts with the surface of transport discs
The mechanism that the electrode surface of subassembly leaves and moved）The figure that illustrates of example.（a）Show that circular electrode is in decline
Position（Contacted with transport discs 11 or close proximity）State,（b）Show that circular electrode is in lifting position（From chip electricity
The top electrodes of subassembly position away from）State.
The elevating mechanism of circular electrode terminal shown in Fig. 6 includes：Housing 131, circular electrode 133, circular electrode support
135th, helical spring 137, cam 139.Further, eliminate the diagram of connecting cable or the connection terminal to detector.It is as long as sharp
With the elevating mechanism of Fig. 6 circular electrode terminal, then by making cam 139 fluctuate, so as to control circular electrode 133
Raising and lowering.
Further, in this manual, to configure chip electronic part transport discs to be in vertical direction operated
Chip electronic part check sorting unit exemplified by come illustrate chip electronic part check sorting unit structure explanation and
The action effect of the present invention, still, the chip electronic used in the electrical characteristics determining method of the chip electronic part of the present invention
Part checks that sorting unit can also be chip electronic part transport discs by the device of base station e axle supporting in a slanted state.This
Outside, as described above, even if to have used the conveying moved by straight ahead instead of transport discs in rotary moving
The chip electronic part of plate checks that sorting unit does not also influence.
The explanation of reference
10 chip electronic parts check sorting unit
11 chip electronic part transport discs（Transport discs）
11a open-works
12nd, 12a, 12b, 12c, 12d, 12e, 12f fixed electrode terminal
13 circular electrode terminals
13a, 13b, 13c, 13d, 13e, 13f movable electrode terminal
14a, 14b detector（C meter）
15 controllers
19 chip electronic parts
19a, 19b, 19c, 19d, 19e, 19f chip electronic part
22a, 22b electrode
31 chip electronic part supply mouths
41 base stations
42 central shafts
43 rotating driving devices
45 substrates（Standard station）
133 circular electrodes.
Claims (2)
1. a kind of electrical characteristics determining method of chip electronic part, comprising：
Received temporarily in the interim accepting hole of chip electronic part for the delivery board for possessing multiple interim accepting holes of chip electronic part
Hold two ends toward each other each possess electrode chip electronic part so that an end electrode positioned at top
The process that the electrode of portion and another end is located at bottom；
Make planar movement of the delivery board along its surface to the process of electrical characteristics determining position；
By make electrical characteristics determining terminal and chip electronic part top electrodes and bottom electrode each contact and to
Each of the top electrodes of chip electronic part and bottom electrode apply voltage to determine the electrical characteristics of chip electronic part
Process, wherein, with terminal it is circular electrode terminal with the electrical characteristics determining of top electrode contact；And
By delivery board is further moved along its plate plane make electrical characteristics determining terminate after chip electronic part from electricity
The process that characteristic measurement position departs from,
The assay method is characterised by,
Chip electronic part moves, its top electrodes start with before the contact of circular electrode terminal, by circular electrode
Terminal arrangement is in the position contacted with top electrodes corner, then after electrical characteristics determining, with not with top electrodes
The mode of another corner contact makes circular electrode terminal be moved to the direction left from the surface of chip delivery board.
2. the electrical characteristics determining method of chip electronic part according to claim 1, wherein, delivery board is using center as axle
Carry out the chip electronic part transport discs of intermittent rotation.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016193711A JP6727651B2 (en) | 2016-09-30 | 2016-09-30 | Continuous inspection method for electrical characteristics of chip electronic components |
| JP2016-193711 | 2016-09-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107887288A true CN107887288A (en) | 2018-04-06 |
| CN107887288B CN107887288B (en) | 2023-03-31 |
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| CN201710907630.0A Active CN107887288B (en) | 2016-09-30 | 2017-09-29 | Method for continuously inspecting electrical characteristics of chip electronic component |
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| Country | Link |
|---|---|
| JP (1) | JP6727651B2 (en) |
| KR (1) | KR102297838B1 (en) |
| CN (1) | CN107887288B (en) |
| TW (1) | TWI716629B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111044807A (en) * | 2018-10-15 | 2020-04-21 | 松下知识产权经营株式会社 | Characteristic measuring device and method, and component mounting device and method |
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| JP7157580B2 (en) * | 2018-07-19 | 2022-10-20 | 東京エレクトロン株式会社 | Board inspection method and board inspection apparatus |
| CN110967592B (en) * | 2018-09-27 | 2022-05-13 | 湖南嘉业达电子有限公司 | Measure crystal oscillator element DLD's device |
| JP7075139B2 (en) * | 2020-06-02 | 2022-05-25 | 株式会社ヒューモラボラトリー | Chip electronic component transfer disk for chip electronic component inspection and sorting equipment |
| JP7107589B2 (en) * | 2020-08-28 | 2022-07-27 | 株式会社ヒューモラボラトリー | Equipment with roller electrode contacts for chip electronic component inspection |
| KR102247261B1 (en) * | 2020-12-15 | 2021-04-30 | 김상길 | Contact roller having improved wear resistance and lubricity, probe assembly and inspection device for electronic part including the same |
| TWI800405B (en) * | 2022-06-14 | 2023-04-21 | 國巨股份有限公司 | Test probe and fixing device thereof |
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Also Published As
| Publication number | Publication date |
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| TW201814315A (en) | 2018-04-16 |
| TWI716629B (en) | 2021-01-21 |
| KR102297838B1 (en) | 2021-09-02 |
| CN107887288B (en) | 2023-03-31 |
| JP2018056483A (en) | 2018-04-05 |
| KR20180036566A (en) | 2018-04-09 |
| JP6727651B2 (en) | 2020-07-22 |
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