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CN105784336B - A kind of transmission of optical fibre device and reflecting properties test device and method - Google Patents

A kind of transmission of optical fibre device and reflecting properties test device and method Download PDF

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CN105784336B
CN105784336B CN201610265283.1A CN201610265283A CN105784336B CN 105784336 B CN105784336 B CN 105784336B CN 201610265283 A CN201610265283 A CN 201610265283A CN 105784336 B CN105784336 B CN 105784336B
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CN105784336A (en
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杨军
梁帅
李创
苑勇贵
彭峰
吴冰
喻张俊
苑立波
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Harbin Engineering University
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    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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Abstract

本发明提供的是一种光纤器件的透射和反射性能同时测试的装置及方法。向待测器件中注入宽谱光,产生能反映其透射和反射性能的两路光信号,并将光信号注入到光学相干域偏振测量技术透射性能测试结构和光学低相干反射技术的反射性能测试结构中,使用共用延迟部件进行扫描,对两路光信号进行测量,同时得到待测光纤器件的透射和反射特征。在使用同一光源和同一延迟部件的情况下,光纤器件的透射和反射性能测试装置可精确测量待测器件的偏振性能、色散特性、损耗特性、相干光谱特性等特征参数。本发明具有集成程度高、测试参数全、抗电磁干扰、器件组成简单等优点,可广泛用于保偏光纤、集成波导调制器等光学器件性能的高精度测量与分析。

The invention provides a device and method for simultaneously testing the transmission and reflection properties of an optical fiber device. Inject broad-spectrum light into the device under test to generate two-way optical signals that can reflect its transmission and reflection performance, and inject the optical signal into the optical coherent domain. In the structure, the common delay component is used for scanning, the two optical signals are measured, and the transmission and reflection characteristics of the optical fiber device to be tested are obtained at the same time. In the case of using the same light source and the same delay component, the transmission and reflection performance test device of optical fiber devices can accurately measure the characteristic parameters of the device under test such as polarization performance, dispersion characteristics, loss characteristics, and coherent spectral characteristics. The invention has the advantages of high integration degree, complete test parameters, anti-electromagnetic interference, simple device composition, etc., and can be widely used in high-precision measurement and analysis of the performance of optical devices such as polarization-maintaining optical fibers and integrated waveguide modulators.

Description

一种光纤器件的透射和反射性能测试装置及方法Device and method for testing transmission and reflection performance of optical fiber device

技术领域technical field

本发明涉及的是一种光纤器件的性能测试装置。本发明还涉及一种光纤器件的性能测试方法。The invention relates to a performance testing device of an optical fiber device. The invention also relates to a performance testing method of the optical fiber device.

背景技术Background technique

分布式光纤传感技术由于具有同时获取器件的空间上被测量分布信息的能力,白光干涉测量原理与技术的一个重要应用即表现在对光学波导与光纤器件的高精度测试与评估方面,一经出现就得到飞速的发展,其中光学相干域偏振测量技术(OCDP)和光学低相干域反射技术(OLCR)是分别针对器件的透射特性和反射特性进行测量的高精度分布式测量技术。Due to the ability of distributed optical fiber sensing technology to obtain the measured distribution information of the device at the same time, an important application of white light interferometry principle and technology is in the high-precision testing and evaluation of optical waveguides and optical fiber devices. It has been developed rapidly. Among them, optical coherent domain polarization measurement technology (OCDP) and optical low coherence domain reflection technology (OLCR) are high-precision distributed measurement technologies for measuring the transmission characteristics and reflection characteristics of devices, respectively.

光学低相干域反射技术(OLCR)是基于光的背向散射进行传感探测的一种分布式测量技术,也使用宽谱光源驱动干涉仪,适用于光学器件与波导内部的微弱反射信息定量化的测量。Optical Low Coherence Domain Reflectometry (OLCR) is a distributed measurement technology based on the backscattering of light for sensing and detection. It also uses a wide-spectrum light source to drive an interferometer, which is suitable for the quantification of weak reflection information inside optical devices and waveguides. Measurement.

光学相干域偏振测量技术(OCDP)基于宽谱光干涉原理,通过扫描式光学干涉仪进行光程补偿,实现不同偏振模式间的干涉,可对偏振串扰的空间位置、偏振耦合信号强度进行高精度的测量与分析,进而获得光学偏振器件的消光比、拍长等重要参数。Optical coherent domain polarization measurement technology (OCDP) is based on the principle of wide-spectrum optical interference. Optical path compensation is performed through a scanning optical interferometer to achieve interference between different polarization modes. It can accurately measure the spatial position of polarization crosstalk and the intensity of polarization coupling signals. The measurement and analysis of the optical polarization device, and then obtain important parameters such as extinction ratio and beat length of the optical polarization device.

分布式光纤传感技术,可真实描述信号光在光纤光路中的透射和反射行为,特别适合于对光纤器件、组件,以及高精度、超高精度干涉型光纤传感光路进行测试和评估。其具有结构简单、空间分辨率高、测量范围大、测量灵敏度高等优点,如:意大利Melloni A等人发展的偏振敏感PS-OLCR,即在传统透射式的OLCR的基础上增加了偏振选择性的光学低相干域反射计;美国通用光电公司(General Photonics Corporation)的姚晓天等人公开的一种用于保偏光纤和光学双折射材料中分布式偏振串扰测量的全光纤测量系统(US20110277552,Measuring Distributed Polarization Crosstalk in PolarizationMaintaining Fiber and Optical Birefringent Material)。Distributed optical fiber sensing technology can truly describe the transmission and reflection behavior of signal light in the optical fiber optical path, and is especially suitable for testing and evaluating optical fiber devices, components, and high-precision and ultra-high-precision interferometric optical fiber sensing optical paths. It has the advantages of simple structure, high spatial resolution, large measurement range, and high measurement sensitivity. For example, the polarization-sensitive PS-OLCR developed by Italian Melloni A et al., that is, the polarization-selective PS-OLCR is added on the basis of the traditional transmission OLCR. Optical low-coherence domain reflectometer; a kind of all-fiber measurement system (US20110277552, Measuring Distributed) for distributed polarization crosstalk measurement in polarization-maintaining optical fiber and optical birefringent material disclosed by Yao Xiaotian et al. of General Photonics Corporation of the United States Polarization Crosstalk in Polarization Maintaining Fiber and Optical Birefringent Material).

在对器件的测试,单独使用OLCR或OCDP时只能得到光束在器件中的反射或透射特性,为得到器件更为详细的信息,需要同时研究其反射和透射特性。另外,为削弱外界干扰对测试的影响,对器件反射和透射特性的同步测量就更为关键。搭建一个可同时测量器件反射和透射特性的分布式装置,对器件全面特性的测试而言具有重要意义。In the test of the device, when OLCR or OCDP is used alone, only the reflection or transmission characteristics of the beam in the device can be obtained. In order to obtain more detailed information of the device, it is necessary to study its reflection and transmission characteristics at the same time. In addition, in order to weaken the impact of external interference on the test, the simultaneous measurement of the reflection and transmission characteristics of the device is even more critical. It is of great significance to build a distributed device that can measure the reflection and transmission characteristics of the device at the same time for the test of the comprehensive characteristics of the device.

发明内容Contents of the invention

本发明的目的在于提供一种精度高、稳定可靠、测量全面的光纤器件的透射和反射性能测试装置。本发明的目的还在于提供一种光纤器件的透射和反射性能测试方法。The object of the present invention is to provide a high-precision, stable and reliable testing device for the transmission and reflection performance of optical fiber devices. The purpose of the present invention is also to provide a method for testing the transmission and reflection performance of the optical fiber device.

本发明的光纤器件的透射和反射性能测试装置包括宽谱光源501、光学相干域偏振测量技术(OCDP)的透射性能测试结构530、光学低相干反射技术(OLCR)的反射性能测试结构540、检测与信号记录装置550、待测器件部分560,宽谱光源501将光束注入待测器件部分560中,待测器件部分560中的待测器件511分别产生透射光束560a和反射光束560b,透射光束560a注入光学相干域偏振测量技术的透射性能测试结构530中、将反射光束560b注入到光学低相干反射技术的反射性能测试结构540中,使用共用延迟部件519进行同时扫描,对两结构中的干涉光信号进行测量,最后同时得到待测光纤器件的透射和反射特征。The transmission and reflection performance testing device of the optical fiber device of the present invention comprises a wide-spectrum light source 501, a transmission performance testing structure 530 of the optical coherent domain polarization measurement technology (OCDP), a reflection performance testing structure 540 of the optical low coherence reflection technology (OLCR), and a detection system. With the signal recording device 550, the device under test part 560, the wide-spectrum light source 501 injects light beams into the device under test part 560, the device under test 511 in the device under test part 560 generates a transmitted beam 560a and a reflected beam 560b respectively, and the transmitted beam 560a Inject into the transmission performance test structure 530 of the optical coherent domain polarization measurement technology, inject the reflected light beam 560b into the reflection performance test structure 540 of the optical low-coherence reflection technology, and use the common delay component 519 to perform simultaneous scanning, and the interference light in the two structures The signal is measured, and finally the transmission and reflection characteristics of the optical fiber device under test are obtained simultaneously.

本发明的光纤器件的透射和反射性能测试装置还可以包括:The transmission and reflection performance testing device of the optical fiber device of the present invention may also include:

1、所述光学相干域偏振测量技术的透射性能测试结构530包括:透射光束560a经过第1检偏器515检偏后,由第1耦合器516分成两束,分别注入光学相干域偏振测量技术的透射性能测试结构的扫描臂524与透射臂525中,所述扫描臂经过第1环行器517与第1准直透镜518连接,经过共用延迟部件519扫描反射,最后两束光在第2耦合器521发生干涉,经过第一探测器522、第二探测器523接收干涉信号。1. The transmission performance test structure 530 of the optical coherent domain polarization measurement technology includes: after the transmitted light beam 560a is analyzed by the first analyzer 515, it is divided into two beams by the first coupler 516, and injected into the optical coherent domain polarization measurement technology respectively. In the scanning arm 524 and the transmission arm 525 of the transmission performance test structure, the scanning arm is connected to the first collimator lens 518 through the first circulator 517, scanned and reflected by the common delay component 519, and the last two beams of light are coupled in the second The detector 521 interferes, and the interference signal is received through the first detector 522 and the second detector 523 .

2、所述光学低相干反射技术的反射性能测试结构540包括:宽谱光源501经过第3耦合器502分成两束,一束在低相干反射技术的反射性能测试结构的透射臂503传输由第2环行器509进入待测器件511,反射光束560b依次经由第2环行器509、第2检偏器510继续在低相干反射技术的反射性能测试结构的透射臂503传播;另一束作为参考光在低相干反射技术的反射性能测试结构的扫描臂508传输,扫描臂经过第3环行器507与第2准直透镜506连接;最后两束光在第4耦合器512发生干涉,通过第三探测器513、第四探测器514接收干涉信号。2. The reflection performance test structure 540 of the optical low-coherence reflection technology includes: the wide-spectrum light source 501 is divided into two beams through the third coupler 502, and one beam is transmitted by the transmission arm 503 of the reflection performance test structure of the low-coherence reflection technology. 2 The circulator 509 enters the device under test 511, and the reflected light beam 560b passes through the second circulator 509 and the second polarizer 510 to continue to propagate in the transmission arm 503 of the reflective performance test structure of the low-coherence reflection technology; the other beam is used as a reference light Transmitted in the scanning arm 508 of the reflection performance test structure of the low-coherence reflection technology, the scanning arm is connected to the second collimator lens 506 through the third circulator 507; the last two beams of light interfere at the fourth coupler 512, and pass through the third detector The detector 513 and the fourth detector 514 receive the interference signal.

3、检测与信号记录装置550由信号处理单元551和电脑终端552构成。3. The detection and signal recording device 550 is composed of a signal processing unit 551 and a computer terminal 552 .

基于本发明的光纤器件的透射和反射性能测试装置的测试方法包括:The testing method of the transmission and reflection performance testing device based on the optical fiber device of the present invention comprises:

(1)对待测器件511的长度lW进行测量,计算待测器件511的最大反射光程差SW1,SW1=lW×nW,nW为待测器件511的折射率;(1) measure the length l W of the device under test 511, calculate the maximum reflected optical path difference S W1 of the device under test 511, S W1 = l W × n W , and n W is the refractive index of the device under test 511;

(2)在不计算延迟线扫描光程S的前提下,测量光学低相干反射技术的反射性能测试结构540中扫描臂508与透射臂503的各自总光程Lc-r和Lc-m(2) Under the premise of not calculating the delay line scanning optical path S, measure the respective total optical paths L cr and L cm of the scanning arm 508 and the transmission arm 503 in the reflective performance test structure 540 of the optical low coherence reflection technology;

(3)对共用延迟部件519引入的扫描光程范围S是否满足S>SW1和S>Lc-m-Lc-r进行判断,如果满足,略过步骤(4)进行步骤(5)的测量;(3) judge whether the scanning optical path range S introduced by the common delay component 519 satisfies S>S W1 and S>L cm -L cr , if satisfied, skip step (4) and carry out the measurement of step (5);

(4)如果不满足条件,则重新截取光学低相干反射技术的反射性能测试结构540的两臂光纤长度,使其满足步骤(3)中所需条件;(4) If the condition is not satisfied, then re-intercept the length of the two-arm optical fiber of the reflection performance test structure 540 of the optical low coherence reflection technology, so that it meets the required conditions in step (3);

(5)对待测器件511前保偏光纤s3、后保偏光纤s4的长度分别进行测试,记为lW-i、lW-o,计算由保偏光纤的快慢轴引入的光程差SL,SL=(lW-i+lW-o)×ΔnL,ΔnL为待测器件511的线性双折射;(5) Test the lengths of the front polarization-maintaining fiber s3 and the rear polarization-maintaining fiber s4 of the device under test 511 respectively, which are denoted as l Wi and l Wo , and calculate the optical path difference SL introduced by the fast and slow axes of the polarization-maintaining fiber, SL =(l Wi +l Wo )×Δn L , Δn L is the linear birefringence of the device under test 511;

(6)在不计算可共用延迟部件519扫描光程范围S的前提下,测量光学相干域偏振测量技术的透射性能测试结构530中扫描臂524与透射臂525的总光程Lt-r和Lt-m,计算快慢轴之间光波的光程差SW2,SW2=lW×ΔnW,ΔnW为光纤器件的线性双折射;(6) Under the premise of not calculating the scanning optical path range S of the common delay component 519, measure the total optical distance L tr and L tm of the scanning arm 524 and the transmission arm 525 in the transmission performance test structure 530 of the optical coherence domain polarization measurement technology , calculate the optical path difference S W2 of light waves between the fast and slow axes, S W2 = l W × Δn W , Δn W is the linear birefringence of the optical fiber device;

(7)对可共用延迟部件519引入的扫描光程范围S是否满足S>Lt-m-Lt-r和S>SW2+SL进行判断,如果满足,略过步骤(8)进行步骤(9)的测量;(7) Judging whether the scanning optical path range S introduced by the common delay component 519 satisfies S>L tm -L tr and S>S W2 +S L , if satisfied, skip step (8) and proceed to step (9) Measurement;

(8)如果不满足条件,则重新截取光学相干域偏振测量技术的透射性能测试结构530的两臂光纤长度,使其满足步骤(7)中所需条件;(8) If the condition is not satisfied, then re-intercept the length of the two-arm optical fiber of the transmission performance test structure 530 of the optical coherence domain polarization measurement technology, so that it meets the required conditions in step (7);

(9)对光纤器件的透射和反射性能测试装置进行连接,开启宽谱光源501,对光纤器件的性能进行测试;(9) Connect the transmission and reflection performance testing device of the optical fiber device, turn on the wide-spectrum light source 501, and test the performance of the optical fiber device;

(10)利用光学相干域偏振测量技术的透射性能测试结构530中各段光纤的长度关系,获得光纤器件的偏振串扰峰的信息;(10) Utilize the transmission performance of the optical coherent domain polarization measurement technology to test the length relationship of each section of optical fiber in the structure 530, and obtain the information of the polarization crosstalk peak of the optical fiber device;

(11)利用光学低相干反射技术的反射性能测试结构540中各段光纤的长度关系,获得光纤器件的反射图谱;(11) Utilize the reflection performance of optical low-coherence reflection technology to test the length relationship of each section of optical fiber in the structure 540, and obtain the reflection spectrum of the optical fiber device;

(12)通过对串扰峰和反射峰的综合分析,得到偏振性能、色散特性、损耗特性、相干光谱特性等信息,完成器件测试。(12) Through comprehensive analysis of crosstalk peaks and reflection peaks, information such as polarization performance, dispersion characteristics, loss characteristics, and coherent spectrum characteristics are obtained, and device testing is completed.

本发明提供了一种光纤器件的透射和反射性能测试装置及方法。通过联合使用OLCR和OCDP技术,全面得到光纤器件的偏振性能、色散特性、损耗特性、相干光谱特性等。本发明具有搭建简单、可同时测量光纤器件的透射和反射性能等优点,可广泛用于高精度光学器件性能测量仪器中。The invention provides a transmission and reflection performance testing device and method of an optical fiber device. Through the joint use of OLCR and OCDP technology, the polarization performance, dispersion characteristics, loss characteristics, and coherent spectrum characteristics of optical fiber devices can be obtained comprehensively. The invention has the advantages of simple construction, simultaneous measurement of transmission and reflection properties of optical fiber devices, and the like, and can be widely used in high-precision optical device performance measuring instruments.

本发明是基于白光干涉原理的一种光纤器件的透射和反射性能测试装置。结合使用OCDP和OLCR两种测试技术,同时对光纤器件的透射光束和反射光束特性进行测试。具有精度高、稳定可靠、测量全面的特点,可用于高精度光学器件性能的测量。The invention is a device for testing transmission and reflection properties of optical fiber devices based on the principle of white light interference. Combining the two testing technologies of OCDP and OLCR, the characteristics of the transmitted beam and reflected beam of the optical fiber device are tested at the same time. It has the characteristics of high precision, stability and reliability, and comprehensive measurement, and can be used to measure the performance of high-precision optical devices.

1.为简单起见,OCDP的工作原理如附图1所示,以保偏光纤的性能测试为例:由宽谱光源发出的高稳定宽谱偏振光101注入到一定长度的保偏光纤120的慢轴(注入到快轴时,原理类似)。由于在偏振器件中并非所有的光都是严格按照保偏轴传输的,会存在非理想的缺陷点或者连接。信号光沿慢轴传输时,当信号光传输到缺陷点111时,慢轴中的一部分光能量就会耦合到正交的快轴中,形成耦合光束103,剩余的传输光束102依旧沿着慢轴传输。光纤存在线性双折射Δn(以5×10-4为例),使慢轴的折射率大于快轴折射率,当光纤的另外一端输出时(传输距离为l),则传输在慢轴的传输光102和传输在快轴的耦合光103之间将产生一个光程差Δnl。1. For the sake of simplicity, the working principle of OCDP is shown in Figure 1, taking the performance test of polarization-maintaining fiber as an example: the highly stable wide-spectrum polarized light 101 emitted by a wide-spectrum light source is injected into the polarization-maintaining fiber 120 of a certain length Slow axis (the principle is similar when injecting into the fast axis). Since not all light is transmitted strictly along the polarization-maintaining axis in a polarizing device, there will be non-ideal defect points or connections. When the signal light is transmitted along the slow axis, when the signal light is transmitted to the defect point 111, a part of the light energy in the slow axis will be coupled into the orthogonal fast axis to form a coupled beam 103, and the remaining transmitted beam 102 is still along the slow axis. shaft transmission. The optical fiber has linear birefringence Δn (take 5×10 -4 as an example), so that the refractive index of the slow axis is greater than the refractive index of the fast axis. When the other end of the fiber is output (the transmission distance is l), the transmission at the slow axis An optical path difference Δnl will be generated between the light 102 and the coupled light 103 traveling on the fast axis.

上述光束通过焊接点或者旋转连接头112、检偏器113,进入光程相关器130中。在光程相关器130中,偏振分束镜131、法拉第旋镜133、移动反射镜136组成一个Michelson干涉仪。光束102和103经过偏振分束镜131后分别进入固定臂132和扫描臂134。固定臂132中传输的光经过法拉第旋镜133进行反射;扫描臂中传输的光经过准直透镜135,由移动反射镜136的反射,两部分光在偏振分束镜131形成白光干涉信号,经过光电探测器114后将光信号转换为电信号。此信号到达检测与信号记录装置140,经过信号解调电路141处理后,送入计算机142中;计算机142还负责控制移动反射镜136实现光程扫描。The above-mentioned light beam enters the optical path correlator 130 through the welding point or the rotary joint 112 and the analyzer 113 . In the optical path correlator 130, the polarization beam splitter 131, the Faraday rotation mirror 133, and the moving mirror 136 form a Michelson interferometer. The light beams 102 and 103 enter the fixed arm 132 and the scanning arm 134 after passing through the polarizing beam splitter 131 . The light transmitted in the fixed arm 132 is reflected by the Faraday rotation mirror 133; the light transmitted in the scanning arm passes through the collimating lens 135, is reflected by the moving mirror 136, and the two parts of the light form a white light interference signal in the polarization beam splitter 131, and pass through The photodetector 114 then converts the optical signal into an electrical signal. The signal reaches the detection and signal recording device 140, and is sent to the computer 142 after being processed by the signal demodulation circuit 141; the computer 142 is also responsible for controlling the moving mirror 136 to realize optical path scanning.

在计算机142的控制下,Michelson干涉仪的移动反射镜136使干涉仪两臂的光程差从-Δnl经过零,扫描至+Δnl,如附图2所示:Under the control of the computer 142, the moving mirror 136 of the Michelson interferometer makes the optical path difference of the two arms of the interferometer pass through zero from -Δnl and scan to +Δnl, as shown in Figure 2:

(1)当光程差等于-Δnl时,扫描臂中光204与固定臂中光201发生匹配,则产生白光干涉信号,其峰值221幅度为它与缺陷点的耦合幅度因子和光源强度成正比。(1) When the optical path difference is equal to -Δnl, the light 204 in the scanning arm matches the light 201 in the fixed arm, and a white light interference signal is generated, and the amplitude of the peak value 221 is It is proportional to the coupling magnitude factor of the defect point and the intensity of the light source.

(2)当光程差等于0时,扫描臂与固定臂中,光205与光201、光206与光202发生匹配,则产生白光干涉信号,其峰值222幅度为Icoupling∝I0,它与光源强度与正比。(2) When the optical path difference is equal to 0, in the scanning arm and the fixed arm, the light 205 matches with the light 201, and the light 206 matches with the light 202, then a white light interference signal is generated, and the amplitude of the peak value 222 is I coupling ∝I 0 , which Proportional to the intensity of the light source.

(3)当光程差等于+Δnl时,扫描臂中光207与固定臂中光202发生匹配,则产生白光干涉信号,其峰值223幅度为它与缺陷点的耦合幅度因子和光源强度成正比。(3) When the optical path difference is equal to +Δnl, the light 207 in the scanning arm matches the light 202 in the fixed arm, and a white light interference signal is generated, and the amplitude of the peak value 223 is It is proportional to the coupling magnitude factor of the defect point and the intensity of the light source.

对干涉信号进行处理,归一化后换算成dB值,通过对干涉峰的以此幅度和距离的检测,即可得到保偏光纤缺点的位置和消光比等重要信息。The interference signal is processed, normalized and converted into a dB value. By detecting the amplitude and distance of the interference peak, important information such as the position of the defect of the polarization-maintaining fiber and the extinction ratio can be obtained.

2.OLCR的工作原理如附图3所示:从宽谱光源301发出的低相干光经过隔离器302,在耦合器303处将光束分为参考光和测量光分别进入干涉仪300的参考臂306和测量臂304;参考臂306经过准直镜307出射,经过参考反射镜308返回的参考光和从被测器件305内部反射(散射)的测量光再次汇合到耦合器303发生干涉,二者的相干信号被光电探测器309所接收,经过信号处理电路和计算机数据采集系统310后,获得待测器件的性能信息。此信号经过信号解调电路312处理后,送入测量计算机311中;测量计算机311另外还要负责控制移动反射镜308实现光程扫描。2. The working principle of OLCR is shown in Figure 3: the low-coherence light emitted from the broadband light source 301 passes through the isolator 302, and the light beam is divided into reference light and measurement light at the coupler 303 and enters the reference arm of the interferometer 300 respectively. 306 and measuring arm 304; the reference arm 306 exits through the collimating mirror 307, and the reference light returned by the reference mirror 308 and the measuring light reflected (scattered) from the inside of the device under test 305 merge into the coupler 303 again to interfere, and the two The coherent signal is received by the photodetector 309, and after passing through the signal processing circuit and the computer data acquisition system 310, the performance information of the device under test is obtained. After the signal is processed by the signal demodulation circuit 312, it is sent to the measurement computer 311; the measurement computer 311 is also responsible for controlling the moving mirror 308 to realize optical path scanning.

振幅敏感型的OLCR技术,测量的白光干涉包络峰值幅度与待测反射率成正比,其包络峰值的扫描位置与被测器件305反射产生的位置相对应。若待测器件中不仅包含单一反射面,而是由一系列在空间上独立的反射面形成时,测量结果如附图4示意所示。附图4中3个干涉峰R1、R2和R3分别表示被测器件305中3个不同位置发生了较大散射情况。In the amplitude-sensitive OLCR technology, the measured white light interference envelope peak amplitude is proportional to the reflectivity to be measured, and the scanning position of the envelope peak corresponds to the position of the reflection of the device under test 305 . If the device under test not only includes a single reflective surface, but is formed by a series of spatially independent reflective surfaces, the measurement result is schematically shown in FIG. 4 . The three interference peaks R 1 , R 2 and R 3 in FIG. 4 respectively indicate that large scattering occurs at three different positions in the device under test 305 .

与现有技术相比,本发明的优点在于:Compared with the prior art, the present invention has the advantages of:

(1)联合使用OLCR测量技术和OCDP测量技术,同时对光纤器件的反射和透射性能进行测量,如光纤器件的偏振性能、色散特性、损耗特性、相干光谱特性等,全面对光纤器件整体性能进行测试评估。(1) Combined use of OLCR measurement technology and OCDP measurement technology to measure the reflection and transmission properties of fiber optic devices at the same time, such as polarization performance, dispersion characteristics, loss characteristics, coherent spectrum characteristics, etc. of fiber optic devices, to comprehensively evaluate the overall performance of fiber optic devices Test evaluation.

(2)采用同一宽谱光源,提高光源出射光束的利用率,避免透射(反射)光束的损失;采用共用扫描机构,实现透射和反射性能的同时测量的同时,简化装置。(2) Use the same wide-spectrum light source to improve the utilization rate of the light source output beam and avoid the loss of the transmitted (reflected) beam; use a shared scanning mechanism to achieve simultaneous measurement of transmission and reflection performance and simplify the device.

(3)采用同时测量的结构,可避免使用不同测量仪器测量时外界环境变化对测量结果的影响。(3) The structure of simultaneous measurement can avoid the influence of external environment changes on the measurement results when different measuring instruments are used for measurement.

附图说明Description of drawings

图1是光学相干域偏振测量技术(OCDP)对单一缺陷点测量的光学原理示意图;Figure 1 is a schematic diagram of the optical principle of optical coherent domain polarization measurement technology (OCDP) for the measurement of a single defect point;

图2是光学相干域偏振测量技术(OCDP)对单一偏振串扰测量形成的干涉信号峰与传输光衰减倍数的对应关系示意图;Figure 2 is a schematic diagram of the corresponding relationship between the interference signal peak and the attenuation factor of the transmitted light formed by the optical coherent domain polarization measurement technology (OCDP) for the single polarization crosstalk measurement;

图3是光学低相干域反射测量(OLCR)技术的光学原理示意图;Fig. 3 is a schematic diagram of the optical principle of the Optical Low Coherence Domain Reflectometry (OLCR) technology;

图4是光学低相干域反射测量(OLCR)技术的测量结果示意图;Fig. 4 is a schematic diagram of the measurement results of the Optical Low Coherence Domain Reflectometry (OLCR) technique;

图5是光纤器件的透射和反射性能测试装置I结构图;Fig. 5 is the structure diagram of transmission and reflection performance testing device 1 of optical fiber device;

图6是光纤器件的透射和反射性能测试装置II结构图;Fig. 6 is the structure diagram of the transmission and reflection performance testing device II of the optical fiber device;

图7是光纤器件的透射和反射性能测试方法流程图。Fig. 7 is a flowchart of a method for testing transmission and reflection performance of an optical fiber device.

具体实施方式Detailed ways

为清楚地说明本发明光纤器件的透射和反射性能测试装置,结合实施例和附图对本发明作进一步说明,但不应以此限制本发明的保护范围。In order to clearly illustrate the transmission and reflection performance testing device of the optical fiber device of the present invention, the present invention will be further described in conjunction with the examples and accompanying drawings, but the protection scope of the present invention should not be limited by this.

图5和图6是本发明的光纤器件的透射和反射性能测试装置的两种结构。其中主要光电器件的选择及其参数如下:Fig. 5 and Fig. 6 are two structures of the transmission and reflection performance testing device of the optical fiber device of the present invention. The selection and parameters of the main optoelectronic devices are as follows:

(1)可调宽谱光源501、601的中心波长1550nm、半谱宽度大于45nm,出纤功率范围0~2mW,消光比大于6dB;(1) The central wavelength of the adjustable broadband light sources 501 and 601 is 1550nm, the half-spectrum width is greater than 45nm, the fiber output power range is 0-2mW, and the extinction ratio is greater than 6dB;

(2)单模耦合器502、512、516、521、613、617工作波长为1550nm,消光比大于20dB,插入损耗小于0.5dB,分光比为50/50;(2) Single-mode couplers 502, 512, 516, 521, 613, and 617 have an operating wavelength of 1550nm, an extinction ratio greater than 20dB, an insertion loss of less than 0.5dB, and a splitting ratio of 50/50;

(3)保偏耦合器603、605、609工作波长为1550nm,消光比为40dB,插入损耗小于0.5dB,分光比为50/50;(3) The working wavelength of the polarization maintaining couplers 603, 605, and 609 is 1550nm, the extinction ratio is 40dB, the insertion loss is less than 0.5dB, and the splitting ratio is 50/50;

(4)偏振器504、510、515、602、612的工作波长为1550nm,消光比为30dB,插入损耗小于1dB;(4) The working wavelength of the polarizers 504, 510, 515, 602, and 612 is 1550 nm, the extinction ratio is 30 dB, and the insertion loss is less than 1 dB;

(5)偏振态控制器505、520、616、620的工作波长为1550nm,插入损耗为0.5dB;(5) The working wavelength of the polarization state controllers 505, 520, 616, and 620 is 1550 nm, and the insertion loss is 0.5 dB;

(6)三端口环形器507、509、517、606、614的工作波长为1550nm,插入损耗为0.8dB,隔离度大于50dB;(6) The operating wavelength of the three-port circulators 507, 509, 517, 606, and 614 is 1550nm, the insertion loss is 0.8dB, and the isolation is greater than 50dB;

(7)自聚焦准直透镜506、518、607、615的工作波长为1550nm,它与共用延迟部件519、608中的双面反射镜(反射率为92%以上)之间的光程扫描距离大约在0~400mm之间变化,平均插入损耗为3.0dB;(7) The operating wavelength of the self-focusing collimating lens 506, 518, 607, 615 is 1550nm, and the optical path scanning distance between it and the double-sided mirror (reflection rate is more than 92%) in the common delay part 519, 608 It varies between 0 and 400mm, and the average insertion loss is 3.0dB;

(8)探测器513、514、522、523、610、611、618、619的光敏材料均为InGaAs,光探测范围为1100~1700nm,如采用New Focus公司的NirvanaTM系列2017型平衡探测器。(8) The photosensitive materials of the detectors 513, 514, 522, 523, 610, 611, 618, and 619 are all InGaAs, and the light detection range is 1100-1700 nm, such as the Nirvana TM series 2017 balanced detector of New Focus Company.

结合图5,本发明的光纤器件的透射和反射性能测试装置的第一种实施方式为:包括宽谱光源501、光学相干域偏振测量技术(OCDP)的透射性能测试结构530、光学低相干反射技术(OLCR)的反射性能测试结构540、检测与信号记录装置550、待测器件部分560,其特征是:宽谱光源501将光束注入待测器件部分560中,其中的待测器件511分别产生透射光束560a和反射光束560b,将透射光束560a注入OCDP透射性能测试结构430、将反射光束560b注入到OLCR反射性能测试结构540中,使用共用延迟部件519进行同时扫描,对两结构中的干涉光信号进行测量,最后同时得到待测光纤器件的透射和反射特征。In conjunction with Fig. 5, the first embodiment of the transmission and reflection performance testing device of the optical fiber device of the present invention is: a transmission performance testing structure 530 including a broadband light source 501, an optical coherent domain polarization measurement technique (OCDP), an optical low coherence reflection Technology (OLCR) reflective performance test structure 540, detection and signal recording device 550, device under test part 560, is characterized in that: wide-spectrum light source 501 injects light beam into the device under test part 560, wherein the device under test 511 respectively produces The transmitted light beam 560a and the reflected light beam 560b, the transmitted light beam 560a is injected into the OCDP transmission performance test structure 430, the reflected light beam 560b is injected into the OLCR reflection performance test structure 540, and the common delay component 519 is used to scan simultaneously, and the interference light in the two structures The signal is measured, and finally the transmission and reflection characteristics of the optical fiber device under test are obtained simultaneously.

所述的OCDP透射性能测试结构530,将透射光束560a经过第1检偏器515检偏后,由第1耦合器516分成两束,分别注入干涉仪的OCDP扫描臂524与OCDP透射臂525中,参考扫描臂经过第1环行器517与第1准直透镜518连接,经过共用延迟部件519扫描反射,最后两束光在第2耦合器521发生干涉,经过探测器522、523接收干涉信号。In the OCDP transmission performance testing structure 530, the transmission light beam 560a is analyzed by the first analyzer 515, and then divided into two beams by the first coupler 516, and injected into the OCDP scanning arm 524 and the OCDP transmission arm 525 of the interferometer respectively. , the reference scanning arm is connected to the first collimator lens 518 through the first circulator 517, scanned and reflected through the common delay component 519, and finally the two beams interfere at the second coupler 521, and receive interference signals through the detectors 522 and 523.

lW为待测器件511的长度,则快慢轴之间光波的光程差SW2(SW2=lW×ΔnW,ΔnW为待测器件511的线性双折射);由待测器件511前后保偏光纤s3、s4快慢轴引入的光程差为SL。对于由共用延迟部件519引入的扫描光程范围S,以上参数需满足:l W is the length of the device under test 511, then the optical path difference S W2 of light waves between the fast and slow axes (S W2 = l W × Δn W , Δn W is the linear birefringence of the device under test 511); by the device under test 511 The optical path difference introduced by the fast and slow axes of front and back polarization maintaining fibers s3 and s4 is S L . For the scanning optical path range S introduced by the common delay component 519, the above parameters need to satisfy:

S>SW2+SL (1)S>S W2 +S L (1)

在不计算共用延迟部件519扫描光程范围S的前提下,在OCDP透射性能测试结构530中,OCDP扫描臂524与OCDP透射臂525的总光程分别是Lt-r和Lt-m,以上参数需满足:Under the premise of not calculating the scanning optical path range S of the common delay component 519, in the OCDP transmission performance test structure 530, the total optical paths of the OCDP scanning arm 524 and the OCDP transmission arm 525 are L tr and L tm respectively, and the above parameters need to satisfy :

S>Lt-m-Lt-r (2)S>L tm -L tr (2)

条件(1)(2)使光程扫描范围S覆盖光纤器件的整个范围,以获得完全的透射性能干涉图谱。Conditions (1) and (2) make the optical path scanning range S cover the entire range of the optical fiber device, so as to obtain a complete interference spectrum of the transmission performance.

所述的OLCR反射性能测试结构540,由宽谱光源501经过第3耦合器502分成两束:其中一束在OLCR透射臂503传输由第2环行器509进入待测器件511,反射光束560b依次经由第2环行器509、第2检偏器510继续在OLCR透射臂503传播;另一束作为参考光在OLCR扫描臂508传输,参考扫描臂经过第3环行器507与第2准直透镜506连接;最后两束光在第4耦合器512发生干涉,通过探测器513、514接收干涉信号。The OLCR reflection performance test structure 540 is divided into two beams by the broadband light source 501 through the third coupler 502: one beam is transmitted in the OLCR transmission arm 503 and enters the device under test 511 by the second circulator 509, and the reflected beam 560b is sequentially Continue to propagate in the OLCR transmission arm 503 via the second circulator 509 and the second analyzer 510; another beam is transmitted as a reference light in the OLCR scanning arm 508, and the reference scanning arm passes through the third circulator 507 and the second collimator lens 506 connection; the last two beams of light interfere at the fourth coupler 512, and receive interference signals through detectors 513 and 514.

待测器件511产生的最大反射光程差为SW1(SW1=lW×nW,nW为待测器件511的折射率)。对于由共用延迟部件519引入的扫描光程范围S须满足:The maximum reflected optical path difference generated by the device under test 511 is S W1 (S W1 =l W ×n W , where n W is the refractive index of the device under test 511 ). For the scanning optical path range S introduced by the common delay component 519, it must satisfy:

S>SW1 (3)S>S W1 (3)

在不计算共用延迟部件519扫描光程范围S的前提下,在OLCR反射性能测试结构540中,OLCR扫描臂508与OLCR透射臂503的各自总光程Lc-r和Lc-m,需满足:On the premise of not calculating the scanning optical path range S of the common delay component 519, in the OLCR reflection performance test structure 540, the respective total optical paths L cr and L cm of the OLCR scanning arm 508 and the OLCR transmission arm 503 need to satisfy:

S>Lc-m-Lc-r (4)S>L cm -L cr (4)

条件(3)(4)使光程扫描范围S覆盖光纤器件的整个范围,以获得完全的反射性能干涉图谱。Conditions (3) and (4) make the optical path scanning range S cover the entire range of the optical fiber device, so as to obtain a complete interference spectrum of reflection performance.

所述的检测与信号记录装置550,由信号处理单元551和电脑终端552构成。The detection and signal recording device 550 is composed of a signal processing unit 551 and a computer terminal 552 .

所述的待测器件部分560,测试光束利用了OLCR反射性能测试结构540的透射臂503部分:由宽谱光源501发出的宽谱光依次经过第2耦合器503、起偏器504、第2环行器509到达待测器件511。In the device under test part 560, the test beam utilizes the transmission arm 503 part of the OLCR reflective performance test structure 540: the wide-spectrum light emitted by the wide-spectrum light source 501 passes through the second coupler 503, the polarizer 504, the second The circulator 509 reaches the device under test 511 .

结合图7,基于光纤器件的透射和反射性能测试装置的测量方法如下:Combining with Figure 7, the measurement method of the transmission and reflection performance test device based on the optical fiber device is as follows:

(1)对待测光纤器件511的长度lW进行测量,计算光纤器件的最大反射光程差SW1(SW1=lW×nW,nW光纤器件的折射率)。(1) Measure the length l W of the optical fiber device 511 to be tested, and calculate the maximum reflected optical path difference S W1 of the optical fiber device (S W1 = l W ×n W , the refractive index of the n W optical fiber device).

(2)在不计算延迟线扫描光程S的前提下,测量OLCR反射性能测试结构中参考扫描臂与透射测量臂的各自总光程Lc-r和Lc-m(2) Without calculating the delay line scanning optical path S, measure the respective total optical paths L cr and L cm of the reference scanning arm and the transmission measuring arm in the OLCR reflective performance test structure.

(3)对共用延迟部件519引入的扫描光程范围S是否满足S>SW1和S>Lc-m-Lc-r进行判断,如果满足测进行下一步测量;如果不满足条件,则需要重新截取OLCR反射性能测试结构的两臂光纤长度,使其满足需要条件。(3) Judging whether the scanning optical path range S introduced by the common delay component 519 satisfies S>S W1 and S>L cm -L cr , and if it is satisfied, proceed to the next step of measurement; if it does not meet the conditions, it is necessary to re-intercept OLCR The length of the two-arm optical fibers of the reflection performance test structure makes it meet the required conditions.

(4)对光纤器件511输入、输出尾纤s3、s4的长度分别进行测试lW-i、lW-o,测试第2环行器509的输出光纤长度lL9-o及起偏器515的输入光纤s7长度lL15-i,并计算由保偏光纤快慢轴引入的光程差SL(SL=(lW-i+lW-o+lW+lL9-o+lL15-i)×ΔnL,ΔnL保偏光纤的线性双折射)。(4) Test the lengths lWi and lWo of the input and output pigtails s3 and s4 of the optical fiber device 511 respectively, and test the output optical fiber length lL9-o of the second circulator 509 and the input optical fiber s7 length of the polarizer 515 l L15-i , and calculate the optical path difference S L introduced by the fast and slow axis of the polarization-maintaining fiber (S L =(l Wi +l Wo +l W +l L9-o +l L15-i )×Δn L ,Δn L linear birefringence in polarization-maintaining fibers).

(5)在不计算可移动双面反射镜扫描光程范围S的前提下,测量OCDP透射性能测试结构中参考扫描臂与透射测量臂的总光程Lt-r和Lt-m,计算快慢轴之间光波的光程差SW2(SW2=lW×ΔnW,ΔnW光纤器件的线性双折射)。(5) Without calculating the scanning optical path range S of the movable double-sided mirror, measure the total optical path L tr and L tm of the reference scanning arm and the transmission measurement arm in the OCDP transmission performance test structure, and calculate the distance between the fast and slow axes The optical path difference S W2 of the light wave (S W2 = l W × Δn W , the linear birefringence of Δn W fiber optic device).

(6)对共用延迟部件519引入的扫描光程范围S是否满足S>Lt-m-Lt-r和S>SW2+SL进行判断,如果满足测进行下一步测量;如果不满足条件,则需要重新截取OCDP透射性能测试结构的两臂光纤长度,使其满足需要条件。(6) Judging whether the scanning optical path range S introduced by the common delay component 519 satisfies S>L tm -L tr and S>S W2 +S L , and if it is satisfied, the next step of measurement is carried out; if the condition is not satisfied, then it is required Re-cut the length of the two-arm optical fibers of the OCDP transmission performance test structure to meet the required conditions.

(7)对光纤器件的透射和反射性能测试装置进行连接,开启宽谱光源501,对光纤器件的性能进行测试。(7) Connect the transmission and reflection performance testing device of the optical fiber device, turn on the wide-spectrum light source 501, and test the performance of the optical fiber device.

(8)利用lL9-o、lW-i、lW、lW-o、lL15-i的长度,获得光纤器件的偏振串扰峰的信息。(8) Use the lengths of l L9-o , l Wi , l W , l Wo , and l L15-i to obtain the information of the polarization crosstalk peak of the optical fiber device.

(9)利用lL9-o、lW-i、lW的长度,获得光纤器件的反射峰信息,通过对串扰峰和反射峰的综合分析,得到偏振性能、色散特性、损耗特性、相干光谱特性等信息,完成器件测试。(9) Use the lengths of l L9-o , l Wi , and l W to obtain reflection peak information of optical fiber devices, and obtain polarization performance, dispersion characteristics, loss characteristics, coherent spectrum characteristics, etc. through comprehensive analysis of crosstalk peaks and reflection peaks information to complete the device test.

结合6,本发明的光纤器件的透射和反射性能测试装置的第二种实施方式为:宽谱光源601经过依次经过45起偏器602、1×2保偏耦合器603,将光束注入待测器件604中;由待测器件604分别产生透射光束660a和反射光束660b,将透射光束660a注入OCDP透射性能测试结构630、将反射光束660b注入到OLCR反射性能测试结构640中,使用共用延迟部件608进行同时扫描;对两结构中的干涉光信号进行测量,分别在探测器618、619得到待测光纤器件的透射信息,在探测器610、611得到待测光纤器件的反射信息,最后在检测与信号记录装置650处进行分析。Combined with 6, the second embodiment of the transmission and reflection performance testing device of the optical fiber device of the present invention is: the wide-spectrum light source 601 passes through the 45 polarizer 602 and the 1×2 polarization maintaining coupler 603 in sequence, and injects the light beam into the test device In the device 604: the transmitted light beam 660a and the reflected light beam 660b are respectively generated by the device under test 604, the transmitted light beam 660a is injected into the OCDP transmission performance test structure 630, and the reflected light beam 660b is injected into the OLCR reflection performance test structure 640, using a common delay component 608 Carry out simultaneous scanning; measure the interfering light signals in the two structures, obtain the transmission information of the optical fiber device to be tested at the detectors 618 and 619 respectively, and obtain the reflection information of the optical fiber device to be tested at the detectors 610 and 611, and finally obtain the The signal is analyzed at recording device 650 .

其测量方法如下:Its measurement method is as follows:

(1)对待测光纤器件604的长度lW进行测量,计算光纤器件的最大反射光程差SW1(SW1=lW×nW,nW光纤器件的折射率)。(1) Measure the length l W of the optical fiber device 604 to be tested, and calculate the maximum reflected optical path difference S W1 of the optical fiber device (S W1 = l W ×n W , the refractive index of the n W optical fiber device).

(2)在不计算延迟线扫描光程S的前提下,OLCR反射性能测试结构的反射测量臂包含1×2耦合器603的a1端与a3端、待测光纤器件的a2端、三端口环形器606的3段尾纤、自聚焦透镜607、共用延迟部件608中的可移动双面反射镜、偏振态控制器620、2×2耦合器609的a6端;OLCR反射性能测试结构的参考臂包含1×2耦合器603的a1端与a3端、待测光纤器件的a2端与a7端、1×2耦合器605的a8端与a9端、2×2耦合器609的a10端。测量OLCR反射性能测试结构中参考臂与反射测量臂的各自总光程为Lc-r和Lc-m,两路干涉光经过2×2耦合器609形成干涉信号,由探测器610和611实现探测。(2) Under the premise of not calculating the delay line scanning optical path S, the reflection measurement arm of the OLCR reflection performance test structure includes the a1 end and a3 end of the 1×2 coupler 603, the a2 end of the optical fiber device to be tested, and the three-port ring The 3-section pigtail of the device 606, the self-focusing lens 607, the movable double-sided mirror in the common delay part 608, the polarization state controller 620, the a6 end of the 2×2 coupler 609; the reference arm of the OLCR reflective performance test structure It includes terminal a1 and terminal a3 of 1×2 coupler 603 , terminal a2 and terminal a7 of the optical fiber device to be tested, terminal a8 and terminal a9 of 1×2 coupler 605 , and terminal a10 of 2×2 coupler 609 . The total optical distances of the reference arm and the reflection measurement arm in the test structure for measuring OLCR reflection performance are L cr and L cm , and the two paths of interference light pass through the 2×2 coupler 609 to form an interference signal, which is detected by detectors 610 and 611 .

(3)对共用延迟部件608中的可移动双面反射镜引入的扫描光程范围S是否满足S>SW1和S>Lc-m-Lc-r进行判断,如果满足测进行下一步测量;如果不满足条件,则需要重新截取OLCR反射性能测试结构的两臂光纤长度,使其满足需要条件。(3) Judging whether the scanning optical path range S introduced by the movable double-sided mirror in the common delay component 608 satisfies S>S W1 and S>L cm -L cr , and if it is satisfied, proceed to the next step of measurement; if not If the conditions are met, it is necessary to re-cut the length of the two-arm optical fibers of the OLCR reflection performance test structure to meet the required conditions.

(4)对光纤器件604输入、输出尾纤a2、a7的长度分别进行测试lW-i、lW-o,测试1×2偏振耦合器605的输出光纤长度lL5-o及起偏器612的输入光纤a11长度lL12-i,并计算由保偏光纤快慢轴引入的光程差SL(SL=(lW-i+lW-o+lW+lL5-o+lL12-i)×ΔnL,ΔnL保偏光纤的线性双折射)。(4) Test the lengths of the input and output pigtails a2 and a7 of the optical fiber device 604 respectively lWi and lWo , and test the length lL5-o of the output fiber of the 1×2 polarization coupler 605 and the input fiber of the polarizer 612 a11 length l L12-i , and calculate the optical path difference S L introduced by the fast and slow axis of the polarization maintaining fiber (S L =(l Wi +l Wo +l W +l L5-o +l L12-i )×Δn L , Δn L the linear birefringence of a polarization-maintaining fiber).

(5)在不计算可移动双面反射镜扫描光程范围S的前提下,OCDP透射性能测试结构由1×2偏振耦合器613、三端口环形器614、自聚焦透镜615、共用延迟部件608中的可移动双面反射镜、偏振态控制器616、2×2耦合器617构成。测量OCDP透射性能测试结构中参考扫描臂与透射测量臂的总光程Lt-r和Lt-m,计算快慢轴之间光波的光程差SW2(SW2=lW×ΔnW,ΔnW光纤器件的线性双折射)。(5) Without calculating the scanning optical path range S of the movable double-sided mirror, the OCDP transmission performance test structure consists of a 1×2 polarization coupler 613, a three-port circulator 614, a self-focusing lens 615, and a common delay component 608 The movable double-sided mirror, the polarization state controller 616, and the 2×2 coupler 617 are constituted. Measure the total optical path L tr and L tm of the reference scanning arm and the transmission measuring arm in the OCDP transmission performance test structure, and calculate the optical path difference S W2 of the light wave between the fast and slow axes (S W2 = l W × Δn W , Δn W fiber optic device linear birefringence).

(6)对共用延迟部件608中的可移动双面反射镜引入的扫描光程范围S是否满足S>Lt-m-Lt-r和S>SW2+SL进行判断,如果满足测进行下一步测量;如果不满足条件,则需要重新截取OCDP透射性能测试结构的两臂光纤长度,使其满足需要条件。(6) Judging whether the scanning optical path range S introduced by the movable double-sided mirror in the common delay component 608 satisfies S>L tm -L tr and S>S W2 +S L , if it meets the test, proceed to the next step of measurement ; If the conditions are not met, it is necessary to re-cut the lengths of the two-arm optical fibers of the OCDP transmission performance test structure to meet the required conditions.

(7)对光纤器件的透射和反射性能测试装置进行连接,开启宽谱光源601,对光纤器件的性能进行测试。(7) Connect the transmission and reflection performance testing device of the optical fiber device, turn on the wide-spectrum light source 601, and test the performance of the optical fiber device.

(8)利用lL9-o、lW-i、lW、lW-o、lL15-i的长度,获得光纤器件的偏振串扰峰的信息。(8) Use the lengths of l L9-o , l Wi , l W , l Wo , and l L15-i to obtain the information of the polarization crosstalk peak of the optical fiber device.

(9)利用lL9-o、lW-i、lW的长度,获得光纤器件的反射峰信息,通过对串扰峰和反射峰的综合分析,得到偏振性能、色散特性、损耗特性、相干光谱特性等信息,完成器件测试。(9) Use the lengths of l L9-o , l Wi , and l W to obtain reflection peak information of optical fiber devices, and obtain polarization performance, dispersion characteristics, loss characteristics, coherent spectrum characteristics, etc. through comprehensive analysis of crosstalk peaks and reflection peaks information to complete the device test.

Claims (4)

1. a kind of transmission of optical fibre device and reflecting properties test device, it is characterized in that:Including wide spectrum light source (501), optics phase The reflection of the transmission performance test structure (530), optics Low coherence reflection technology (OLCR) of dry domain polarimetry technology (OCDP) Performance test structure (540), detection and signal recording apparatus (550), device under test part (560), wide spectrum light source (501) is by light In beam injection device under test part (560), the device under test (511) in device under test part (560) generates transmitted light beam respectively (560a) and the reflected beams (560b), the transmission performance test of transmitted light beam (560a) injection optics coherent field polarimetry technology The reflecting properties test structure (540) of optics Low coherence reflection technology is injected into structure (530), by the reflected beams (560b) In, it is scanned, the interference light signal in two structures is measured, simultaneously simultaneously using shared delay unit (519) progress finally Obtain transmission and the reflectance signature of testing fiber device.
2. the transmission of optical fibre device according to claim 1 and reflecting properties test device, it is characterized in that the optics phase The transmission performance test structure (530) of dry domain polarimetry technology includes:Transmitted light beam (560a) passes through the 1st analyzer (515) After analyzing, two beams are divided by the 1st coupler (516), are injected separately into the transmission performance test of optical coherence domain polarimetry technology The scan arm (524) of structure is with transmiting in arm (525), and the scan arm is by the 1st circulator (517) and the 1st collimation lens (518) connect, by sharing delay unit (519) scanning reflection, last two-beam is interfered in the 2nd coupler (521), is passed through Cross the first detector (522), the second detector (523) receives interference signal.
3. the transmission of optical fibre device according to claim 1 or 2 and reflecting properties test device, it is characterized in that the optics The reflecting properties test structure (540) of Low coherence reflection technology includes:Wide spectrum light source (501) is divided by the 3rd coupler (502) Two beams, the transmission arm (503) of a branch of reflecting properties test structure in Low coherence reflection technology are transmitted by the 2nd circulator (509) Into device under test (511), the reflected beams (560b) continue via the 2nd circulator (509), the 2nd analyzer (510) low successively The transmission arm (503) of the reflecting properties test structure of coherent reflection technology is propagated;Another beam is used as to be reflected with reference to light in Low coherence Scan arm (508) transmission of the reflecting properties test structure of technology, scan arm are saturating by the 3rd circulator (507) and the 2nd collimation Mirror (506) connects;Last two-beam is interfered in the 4th coupler (512), passes through the 3rd detector (513), the 4th detector (514) interference signal is received.
4. a kind of test method of transmission and reflecting properties test device based on optical fibre device described in claim 1, special Sign is:
(1) the length l of device under test (511)WIt measures, calculates the maximum reflection optical path difference S of device under test (511)W1, SW1 =lW×nW, nWFor the refractive index of device under test (511);
(2) on the premise of delay line scanning light path S is not calculated, the reflecting properties test knot of measurement optics Low coherence reflection technology The respective total optical path L of scan arm (508) and transmission arm (503) in structure (540)c-rAnd Lc-m
(3) whether the scanning light path scope S introduced to sharing delay unit (519) meets S>SW1And S>Lc-m-Lc-rJudged, If it is satisfied, skip over the measurement that step (4) carries out step (5);
(4) if being unsatisfactory for condition, the two of the reflecting properties test structure (540) of optics Low coherence reflection technology is intercepted again Arm fiber lengths make it meet required condition in step (3);
(5) device under test (511) preceding polarization maintaining optical fibre (s3), the length of rear polarization maintaining optical fibre (s4) are tested respectively, are denoted as lW-i、lW-o, calculate by the optical path difference S of the fast and slow axis introducing of polarization maintaining optical fibreL, SL=(lW-i+lW-o)×ΔnL, Δ nLFor device under test (511) linear birefrigence;
(6) on the premise of not calculating and can share delay unit (519) scanning light path scope S, measurement optical coherence domain polarization is surveyed The total optical path L of scan arm (524) and transmission arm (525) in the transmission performance test structure (530) of amount technologyt-rAnd Lt-m, calculate The optical path difference S of light wave between fast and slow axisW2, SW2=lW×ΔnW, Δ nWFor the linear birefrigence of optical fibre device;
(7) whether the scanning light path scope S that couple can share delay unit (519) introducing meets S>Lt-m-Lt-rAnd S>SW2+SLIt carries out Judge, if it is satisfied, skipping over the measurement that step (8) carries out step (9);
(8) if being unsatisfactory for condition, the transmission performance test structure (530) of optical coherence domain polarimetry technology is intercepted again Two-arm fiber lengths, it is made to meet required condition in step (7);
(9) transmission to optical fibre device and reflecting properties test device are attached, and wide spectrum light source (501) are opened, to optical fiber device The performance of part is tested;
(10) closed using the length of each section of optical fiber in the transmission performance test structure (530) of optical coherence domain polarimetry technology System obtains the information at the polarization interference peak of optical fibre device;
(11) using the length relation of each section of optical fiber in the reflecting properties test structure (540) of optics Low coherence reflection technology, obtain Obtain the reflection collection of illustrative plates of optical fibre device;
(12) by the comprehensive analysis to crosstalk peak and reflection peak, polarization property, dispersion characteristics, loss characteristic, coherent light are obtained The information such as spectral property complete device detection.
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