CN105547480A - High-throughput birefringence interference imaging spectrum device - Google Patents
High-throughput birefringence interference imaging spectrum device Download PDFInfo
- Publication number
- CN105547480A CN105547480A CN201510982227.5A CN201510982227A CN105547480A CN 105547480 A CN105547480 A CN 105547480A CN 201510982227 A CN201510982227 A CN 201510982227A CN 105547480 A CN105547480 A CN 105547480A
- Authority
- CN
- China
- Prior art keywords
- light
- prism
- polarized light
- linearly polarized
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 36
- 238000001228 spectrum Methods 0.000 title abstract description 10
- 230000010287 polarization Effects 0.000 claims abstract description 45
- 230000003287 optical effect Effects 0.000 claims abstract description 15
- 238000000701 chemical imaging Methods 0.000 claims 4
- 230000005540 biological transmission Effects 0.000 claims 1
- 230000004907 flux Effects 0.000 abstract description 20
- 230000003595 spectral effect Effects 0.000 abstract description 14
- 208000019300 CLIPPERS Diseases 0.000 description 16
- 208000021930 chronic lymphocytic inflammation with pontine perivascular enhancement responsive to steroids Diseases 0.000 description 16
- 238000005516 engineering process Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000013519 translation Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
- G01J3/453—Interferometric spectrometry by correlation of the amplitudes
- G01J3/4537—Devices with refractive scan
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Polarising Elements (AREA)
Abstract
本发明公开了一种高通量双折射干涉成像光谱装置，包括沿光路方向依次放置的前置成像物镜、准直物镜、组合起偏器、前置半波片、双折射剪切器、后置半波片、组合检偏器、后置成像物镜和探测器。所述组合起偏器和组合检偏器结构相同，包括第一偏振分光棱镜、第二偏振分光棱镜和直角棱镜，第一偏振分光棱镜和第二偏振分光棱镜的分光面相互垂直，直角棱镜的两个直角面镀制高反膜，直角棱镜的斜边与第一偏振分光棱镜的反射光出射面连接，与第二偏振分光棱镜反射光入射面连接。本发明相比于传统的双折射干涉成像光谱系统，光通量由原来的不足25％提高到80％以上。干涉信息的叠加提高了系统信噪比，有利于提高光谱复原精度。
The invention discloses a high-throughput birefringence interference imaging spectrum device, which comprises a front imaging objective lens, a collimating objective lens, a combined polarizer, a front half-wave plate, a birefringence shearer, and a rear imaging objective lens arranged in sequence along the optical path direction. A half-wave plate, a combined analyzer, a post-imaging objective lens and a detector are installed. The combined polarizer and the combined analyzer have the same structure, including a first polarizing beam splitting prism, a second polarizing beam splitting prism and a rectangular prism, the beam splitting planes of the first polarizing beam splitting prism and the second polarizing beam splitting prism are perpendicular to each other, the rectangular prism The two right-angle surfaces are coated with high-reflection film, and the hypotenuse of the right-angle prism is connected with the reflected light exit surface of the first polarization beam splitter prism, and is connected with the reflected light incident surface of the second polarization beam splitter prism. Compared with the traditional birefringence interference imaging spectroscopic system, the invention improves the luminous flux from less than 25% to more than 80%. The superposition of interference information improves the signal-to-noise ratio of the system, which is conducive to improving the accuracy of spectral restoration.
Description
Technical field
The present invention relates to optical target sounding field, relate to a kind of high flux birefringence interference imaging spectral device.
Background technology
High light spectrum image-forming technology is interfered to obtain the interference light intensity information of imageable target by adding interferometer in imaging systems, Fourier transform is utilized to restore the multispectral datacube of imageable target, there is the advantage of high light flux, high spatial resolution and high spectral resolution, in fields such as remotely sensed image, resource exploration, environmental monitorings, there is very large application potential.
In recent years, both at home and abroad such high light spectrum image-forming technology is studied.Wherein, the people such as Israel Cabib have studied the high flux interference imaging spectral technology based on Sagnac interferometer, form interference signal on the detector by lateral shear thought.In such technical scheme, Sagnac interferometer needs the luminous flux losing at least half.The people such as Britain Harvey propose the technical scheme based on Wollaston prism interferometer device, the program is equally based on the thought of lateral shearing interference, due to the light beam shear property of birefringence device, system can realize linear light path structure, but the Sagnac interferometer scheme of light flux ratio also will reduce half.The people such as U.S. Horton propose the technical scheme based on Mach-Zehnder interferometer, form two staggered picture planes, receive formed interference signal by detector by angular shear thought.Such interferometer is called as " as flat interferometer ", its luminous flux phase and the Sagnac interferometer scheme of Israel Cabib similar.The people such as Germany Posselt propose the technical scheme based on Michelson interferometer, and utilize the thought that angular shear is interfered equally, do not need collimated light path structure, luminous flux utilization factor is same not as good as 25%.Studies in China personnel also conduct in-depth research relevant interference imaging method, propose the technical scheme differed from one another respectively, the birefringence mode inteference imaging spectrometer based on Savart prism that the people such as the pure people propose is opened comprising Xi'an Communications University, luminous flux is generally less than 25%, the therefore more difficult lifting of optical-mechanical system signal to noise ratio (S/N ratio).
Summary of the invention
The object of the present invention is to provide a kind of high flux birefringence interference imaging spectral device, solve the technical matters that in traditional double refraction interference imaging spectral technology scheme, luminous flux loss is larger.
The technical solution realizing the object of the invention is: a kind of high flux birefringence interference imaging spectral device, comprise place successively along optical path direction preposition image-forming objective lens, collimator objective, the combination polarizer, preposition half-wave plate, birefringence clipper, rearmounted half-wave plate, combination analyzer, rearmounted image-forming objective lens and detector; All optical elements are contour relative to instrument base planar coaxial; The imaging surface of preposition image-forming objective lens overlaps with the front focal plane of collimator objective.
The described combination polarizer is identical with combination analyzer structure, comprise the first polarization splitting prism, the second polarization splitting prism and right-angle prism, first polarization splitting prism is mutually vertical with the light splitting surface of the second polarization splitting prism, two right-angle surface of right-angle prism are coated with high-reflecting film, the hypotenuse of right-angle prism is connected with the reflected light exit facet of the first polarization splitting prism, is connected with the second polarization splitting prism reflected light plane of incidence.
Incident beam from target is imaged in its image planes by preposition image-forming objective lens, subsequently through collimator objective, form collimated light beam, the combination polarizer is incided with collimated light beam form, equal, the orthogonal transmitted light of direction of vibration of intensity and reflected light is produced through the first polarization splitting prism, transmitted light through the second polarization splitting prism outgoing, is called radioparent polarized light again; Reflected light enters right-angle prism, after two right-angle surface reflect successively, enters the second polarization splitting prism, through the second polarization splitting prism light splitting surface outgoing, is called reflected ray polarized light; Two bunch polarized lights are through preposition half-wave plate, polarization direction rotates 45 °, radioparent polarized light is divided into after entering birefringence clipper that intensity is equal, the orthogonal two bunch polarized lights of direction of vibration, be called the first radioparent polarized light and the second radioparent polarized light, and the first radioparent polarized light and the second radioparent polarized light are laterally cut across incision; Reflected ray polarized light is divided into after entering birefringence clipper that intensity is equal, the orthogonal two bunch polarized lights of direction of vibration, be called the first reflected ray polarized light and the second reflected ray polarized light, and the first reflected ray polarized light and the second reflected ray polarized light are cut by Transverse Shear; Above-mentioned four bunch polarized lights are through rearmounted half-wave plate, and polarization direction all rotates 45 °; Four bunch polarized lights enter combination analyzer respectively, each bunch polarized light enters in combination analyzer, transmitted light and reflected light is produced respectively through the first polarization splitting prism light splitting surface, transmitted light is again through the second polarization splitting prism outgoing, reflected light enters right-angle prism, after two right-angle surface reflect successively, enter the second polarization splitting prism, through the second polarization splitting prism light splitting surface outgoing; Eight bunch polarized lights are after rearmounted image-forming objective lens, converge on detector target surface and produce four groups of interference information, be respectively the transmitted light that the first transmitted light and the second transmitted light produce in combination analyzer mutually to interfere, the reflected light that first transmitted light and the second transmitted light produce in combination analyzer is interfered mutually, the transmitted light that first reflected light and the second reflected light produce in combination analyzer is interfered mutually, and the reflected light that the first reflected light and the second reflected light produce in combination analyzer is interfered mutually; Four groups of interference information are modulated by identical optical path difference, and superposition together, and then obtain the interference image information of target by detector.
Also comprise diaphragm, the imaging surface of described preposition image-forming objective lens is provided with diaphragm; The optical axis direction of preposition half-wave plate and rearmounted half-wave plate and the angle in its incident light polarization direction are 22.5 °; The target surface of detector is positioned at the image planes position of rearmounted image-forming objective lens.
Described birefringence clipper is Savart clipper or two Wollaston clipper.
Compared with prior art, its advantage is in the present invention: (1), compared to traditional birefringence interference imaging spectrum system, luminous flux brings up to more than 80% by original less than 25%.
(2) superposition of interference information improves system signal noise ratio, is conducive to improving spectrum recovering precision.
Accompanying drawing explanation
Fig. 1 is the structural representation of high flux birefringence interference imaging spectral device of the present invention.
Fig. 2 is the structural representation of the combination polarizer of the present invention and combination analyzer.
Fig. 3 is birefringence clipper schematic diagram of the present invention, and wherein (a) is two Wollaston clipper schematic diagram, and (b) is Savart clipper schematic diagram.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in further detail.
Composition graphs 1 ~ Fig. 3, a kind of high flux birefringence interference imaging spectral device, comprise place successively along optical path direction preposition image-forming objective lens 1, collimator objective 2, the combination polarizer 3, preposition half-wave plate 4, birefringence clipper 5, rearmounted half-wave plate 6, combination analyzer 7, rearmounted image-forming objective lens 8 and detector 9; All optical elements are contour relative to instrument base planar coaxial; The imaging surface of preposition image-forming objective lens 1 overlaps with the front focal plane of collimator objective 2.
The described combination polarizer 3 is identical with combination analyzer 7 structure, comprise the first polarization splitting prism 11, second polarization splitting prism 12 and right-angle prism 13, first polarization splitting prism 11 is mutually vertical with the light splitting surface of the second polarization splitting prism 12, two right-angle surface of right-angle prism 13 are coated with high-reflecting film, the hypotenuse of right-angle prism 13 is connected with the reflected light exit facet of the first polarization splitting prism 11, is connected with the second polarization splitting prism 12 reflected light plane of incidence.
Also comprise diaphragm 10, the imaging surface of described preposition image-forming objective lens 1 is provided with diaphragm 10; The optical axis direction of preposition half-wave plate 4 and rearmounted half-wave plate 6 and the angle in its incident light polarization direction are 22.5 °; The target surface of detector 9 is positioned at the image planes position of rearmounted image-forming objective lens 8.
Described birefringence clipper 5 is Savart clipper or two Wollaston clipper.
Incident beam from target is imaged in its image planes by preposition image-forming objective lens 1, parasitic light is removed through diaphragm 10, subsequently through collimator objective 2, form collimated light beam, the combination polarizer 3 is incided with collimated light beam form, produce that intensity is equal through the first polarization splitting prism 11, the orthogonal transmitted light of direction of vibration and reflected light, transmitted light through the second polarization splitting prism 12 outgoing, is called radioparent polarized light again; Reflected light enters right-angle prism 13, after two right-angle surface reflect successively, enters the second polarization splitting prism 12, through the second polarization splitting prism 12 light splitting surface outgoing, is called reflected ray polarized light; Two bunch polarized lights are through preposition half-wave plate 4, polarization direction rotates 45 °, radioparent polarized light is divided into after entering birefringence clipper 5 that intensity is equal, the orthogonal two bunch polarized lights of direction of vibration, be called the first radioparent polarized light and the second radioparent polarized light, and the first radioparent polarized light and the second radioparent polarized light are laterally cut across incision; Reflected ray polarized light is divided into after entering birefringence clipper 5 that intensity is equal, the orthogonal two bunch polarized lights of direction of vibration, be called the first reflected ray polarized light and the second reflected ray polarized light, and the first reflected ray polarized light and the second reflected ray polarized light are cut by Transverse Shear; Above-mentioned four bunch polarized lights are through rearmounted half-wave plate 6, and polarization direction all rotates 45 °; Four bunch polarized lights enter combination analyzer 7 respectively, each bunch polarized light enters in combination analyzer 7, transmitted light and reflected light is produced respectively through the first polarization splitting prism 11 light splitting surface, transmitted light is again through the second polarization splitting prism 12 outgoing, reflected light enters right-angle prism 13, after two right-angle surface reflect successively, enter the second polarization splitting prism 12, through the second polarization splitting prism 12 light splitting surface outgoing; Eight bunch polarized lights are after rearmounted image-forming objective lens 6, converge on detector 9 target surface and produce four groups of interference information, the transmitted light being respectively the first transmitted light and the generation in combination analyzer 7 of the second transmitted light is interfered mutually, the reflected light that first transmitted light and the second transmitted light produce in combination analyzer 7 is interfered mutually, the transmitted light that first reflected light and the second reflected light produce in combination analyzer 7 is interfered mutually, and the reflected light that the first reflected light and the second reflected light produce in combination analyzer 7 is interfered mutually; Four groups of interference information are modulated by identical optical path difference, and superposition together, and then obtain the interference image information of target by detector 9.Can restore the spectral information of target after eventually passing Fourier transform process.
The present invention has two class interferential scanning modes, and the first kind is built-in scan mode, rotates or translation birefringence clipper 5; Equations of The Second Kind is entire scan mode, translation or rotate whole high flux birefringence interference imaging spectral device.Adopt this two kinds of interferential scanning modes, scanning device every translation distance, detector 9 gathers an interference information; After scanning completes, acquisition interference data cube, carries out to these interference signal data the spectral information that spectrum recovering process can obtain the detection of a target.
High flux birefringence interference imaging spectral apparatus and method of the present invention, utilize the optical characteristics of polarization splitting prism, add in interference system and combine (inspection) device partially, adopt the thought of " interference information superposition ", realize the light spectrum image-forming detection of system height throughput.The method has the advantage such as high s/n ratio and high light flux.The present invention is compared to traditional birefringence interference imaging spectrum system, and luminous flux brings up to more than 80% by original less than 25%.The superposition of interference information improves system signal noise ratio, is conducive to improving spectrum recovering precision.
Claims (5)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510982227.5A CN105547480B (en) | 2015-12-24 | 2015-12-24 | High-throughput birefringent interference imaging spectroscopy device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510982227.5A CN105547480B (en) | 2015-12-24 | 2015-12-24 | High-throughput birefringent interference imaging spectroscopy device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105547480A true CN105547480A (en) | 2016-05-04 |
| CN105547480B CN105547480B (en) | 2017-08-04 |
Family
ID=55826831
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510982227.5A Expired - Fee Related CN105547480B (en) | 2015-12-24 | 2015-12-24 | High-throughput birefringent interference imaging spectroscopy device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105547480B (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572143A (en) * | 2017-03-13 | 2018-09-25 | 广西师范学院 | Total Polarization Measurement Microscope |
| CN108593105A (en) * | 2017-12-14 | 2018-09-28 | 南京理工大学 | The Hyperspectral imaging devices and its imaging method of birefringent polarizing interference-type |
| CN110987186A (en) * | 2019-11-21 | 2020-04-10 | 中国科学院西安光学精密机械研究所 | Birefringent interferometer adjusting device and method based on optical path difference indication |
| CN111307761A (en) * | 2019-11-21 | 2020-06-19 | 中国科学院西安光学精密机械研究所 | Hyperspectral imaging device based on bispectral stack interference |
| TWI818606B (en) * | 2022-06-29 | 2023-10-11 | 中國鋼鐵股份有限公司 | System and method for monitoring temperature of carbon brick of furnace |
| CN117434080A (en) * | 2023-12-20 | 2024-01-23 | 深圳市壹倍科技有限公司 | System for inspecting semiconductor and corresponding method |
| CN118913441A (en) * | 2024-10-11 | 2024-11-08 | 山东理工大学 | Hyperspectral imaging device based on double-view-field lamination interference |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3399591A (en) * | 1964-08-13 | 1968-09-03 | Ibm | Interferometer for producing variable spatial frequency fringes |
| JPH08327712A (en) * | 1995-05-29 | 1996-12-13 | Sumitomo Metal Mining Co Ltd | Optical magnetic-field sensor and method for measuring strength of magnetic field using this sensor |
| CN101046409A (en) * | 2007-03-16 | 2007-10-03 | 西安交通大学 | Static birefringent polarizing inteference imaging spectrometer |
| CN102944310A (en) * | 2012-11-23 | 2013-02-27 | 西安交通大学 | Spectral resolution adjustable interference imaging spectrometer |
| CN103822715A (en) * | 2014-02-18 | 2014-05-28 | 哈尔滨工业大学 | Polarizing optical splitter-based snapshot-type imaging spectrograph and imaging method |
| CN104656266A (en) * | 2015-02-10 | 2015-05-27 | 北京理工大学 | Method and device for synthesizing vector light beam through polarization based on Twyman Green interferometer |
-
2015
- 2015-12-24 CN CN201510982227.5A patent/CN105547480B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3399591A (en) * | 1964-08-13 | 1968-09-03 | Ibm | Interferometer for producing variable spatial frequency fringes |
| JPH08327712A (en) * | 1995-05-29 | 1996-12-13 | Sumitomo Metal Mining Co Ltd | Optical magnetic-field sensor and method for measuring strength of magnetic field using this sensor |
| CN101046409A (en) * | 2007-03-16 | 2007-10-03 | 西安交通大学 | Static birefringent polarizing inteference imaging spectrometer |
| CN102944310A (en) * | 2012-11-23 | 2013-02-27 | 西安交通大学 | Spectral resolution adjustable interference imaging spectrometer |
| CN103822715A (en) * | 2014-02-18 | 2014-05-28 | 哈尔滨工业大学 | Polarizing optical splitter-based snapshot-type imaging spectrograph and imaging method |
| CN104656266A (en) * | 2015-02-10 | 2015-05-27 | 北京理工大学 | Method and device for synthesizing vector light beam through polarization based on Twyman Green interferometer |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572143A (en) * | 2017-03-13 | 2018-09-25 | 广西师范学院 | Total Polarization Measurement Microscope |
| CN108572143B (en) * | 2017-03-13 | 2020-12-08 | 南宁师范大学 | Full polarization measuring microscope |
| CN108593105A (en) * | 2017-12-14 | 2018-09-28 | 南京理工大学 | The Hyperspectral imaging devices and its imaging method of birefringent polarizing interference-type |
| CN110987186A (en) * | 2019-11-21 | 2020-04-10 | 中国科学院西安光学精密机械研究所 | Birefringent interferometer adjusting device and method based on optical path difference indication |
| CN111307761A (en) * | 2019-11-21 | 2020-06-19 | 中国科学院西安光学精密机械研究所 | Hyperspectral imaging device based on bispectral stack interference |
| CN111307761B (en) * | 2019-11-21 | 2024-05-31 | 中国科学院西安光学精密机械研究所 | Hyperspectral imaging device based on double-spectrum-section laminated interference |
| TWI818606B (en) * | 2022-06-29 | 2023-10-11 | 中國鋼鐵股份有限公司 | System and method for monitoring temperature of carbon brick of furnace |
| CN117434080A (en) * | 2023-12-20 | 2024-01-23 | 深圳市壹倍科技有限公司 | System for inspecting semiconductor and corresponding method |
| CN117434080B (en) * | 2023-12-20 | 2024-03-01 | 深圳市壹倍科技有限公司 | System for inspecting semiconductor and corresponding method |
| CN118913441A (en) * | 2024-10-11 | 2024-11-08 | 山东理工大学 | Hyperspectral imaging device based on double-view-field lamination interference |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105547480B (en) | 2017-08-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105547480A (en) | High-throughput birefringence interference imaging spectrum device | |
| CN107064001A (en) | Monochromatic light spectrometer polarization domain optical coherence tomography system based on photoswitch | |
| CN104748835B (en) | Amount of interference detaches laser interference vialog nonlinearity erron modification method and device | |
| CN102879097B (en) | Circular polarization hyperspectral image detection system | |
| CN106289527B (en) | A kind of Hyperspectral imaging devices and its imaging method based on polarization interference | |
| CN102297722B (en) | Double-channel differential polarizing interference imaging spectrometer | |
| CN102944310B (en) | Spectral resolution adjustable interference imaging spectrometer | |
| CN206497027U (en) | Polarization-frequency-domain optical coherence tomography system with single spectrometer based on optical switch | |
| CN105157836B (en) | Spectral imaging device and method for synchronously acquiring polarization states | |
| CN108519153A (en) | Two-channel Parallel Swing Mirror Fourier Transform Infrared Spectrometer | |
| CN111208067A (en) | Spectro-Polarization Imaging Measurement System | |
| CN107356337B (en) | Compact miniature fast illuminated channel modulation full polarization imaging detection device and detection method | |
| CN104880253A (en) | High-spatial-resolution snapshot-type imaging method based on polarizing optical splitters | |
| CN106767389A (en) | Striking rope type simultaneous phase-shifting interference testing device based on prismatic decomposition phase shift | |
| CN104748855B (en) | Dual-channel high-throughput interference imaging spectroscopy device and method | |
| CN107462150A (en) | Double-view field digital holographic detection device and method based on One Dimension Periodic grating and point diffraction | |
| CN208060025U (en) | Realize the light path of two width interference patterns of the polarization state and phase that measure arbitrary beam | |
| CN204831550U (en) | Spectral imaging device capable of synchronously acquiring polarization states | |
| CN104913848B (en) | All-Stokes parameter white light double-Sagnac polarization imaging interferometer | |
| CN105387936B (en) | High flux Sagnac inteference imaging spectral apparatus | |
| CN106248195A (en) | The high robust homodyne laser vibration measurer of additional phase shift compensation and four steppings | |
| US9671287B2 (en) | Hyperspectral imaging | |
| CN108613742B (en) | Double-channel large-aperture static interference imaging spectrometer | |
| CN109579995B (en) | A method and device for enhancing spectral resolution of static birefringence interference | |
| CN105675134A (en) | FLC-based hyperspectral all-polarization imaging device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170804 Termination date: 20201224 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |