CN108593105A - The Hyperspectral imaging devices and its imaging method of birefringent polarizing interference-type - Google Patents
The Hyperspectral imaging devices and its imaging method of birefringent polarizing interference-type Download PDFInfo
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Abstract
本发明公开了一种双折射偏振干涉型的高光谱成像装置及其成像方法,包括沿光路方向依次放置的前置成像物镜、光阑、准直物镜、起偏器、双折射剪切板、双折射补偿板、检偏器、后置成像物镜和面阵探测器。来自目标的入射光经过偏振干涉系统后,在面阵探测器上产生干涉信息。经过系统整体扫描,面阵探测器获取目标在不同光程差调制状态下的干涉图像信息,最后经过傅立叶变换光谱复原处理后得到目标的光谱信息。本发明中双折射偏振干涉型的高光谱成像装置只采用了两个双折射晶体,不仅能够较好地解决光程差的非线性问题,而且具有结构紧凑、复杂度低的优点,适用于轻小型、高精度高光谱成像应用。
The invention discloses a birefringent polarization interference type hyperspectral imaging device and an imaging method thereof, comprising a front imaging objective lens, a diaphragm, a collimating objective lens, a polarizer, a birefringent shearing plate, Birefringence compensation plate, analyzer, rear imaging objective lens and area array detector. After the incident light from the target passes through the polarization interference system, interference information is generated on the area array detector. After the overall scanning of the system, the area array detector obtains the interference image information of the target under different optical path difference modulation states, and finally obtains the spectral information of the target after Fourier transform spectral restoration processing. The hyperspectral imaging device of the birefringent polarization interference type in the present invention only uses two birefringent crystals, which not only can better solve the nonlinear problem of optical path difference, but also has the advantages of compact structure and low complexity, and is suitable for light Small, high-precision hyperspectral imaging applications.
Description
技术领域technical field
本发明涉及光学成像领域,具体涉及一种双折射偏振干涉型的高光谱成像装置及其成像方法。The invention relates to the field of optical imaging, in particular to a birefringent polarization interference hyperspectral imaging device and an imaging method thereof.
背景技术Background technique
干涉型高光谱成像技术是用于光谱细分成像的重要技术手段之一,近年来逐渐发展出多种干涉仪方案,主要有基于Michelson干涉仪、Sagnac干涉仪、Mach‐Zehnder干涉仪、Fabry‐Perot干涉仪,以及基于Wollaston棱镜和Savart棱镜的双折射干涉仪等。这些高光谱成像技术在遥感探测、环境监测、生物医学等领域得到了重要应用。Interferometric hyperspectral imaging technology is one of the important technical means for spectral subdivision imaging. In recent years, a variety of interferometer schemes have been gradually developed, mainly based on Michelson interferometer, Sagnac interferometer, Mach-Zehnder interferometer, Fabry- Perot interferometer, and birefringent interferometer based on Wollaston prism and Savart prism, etc. These hyperspectral imaging technologies have been widely used in remote sensing detection, environmental monitoring, biomedicine and other fields.
其中,双折射偏振干涉型高光谱成像仪由于其结构紧凑和光路简单的优点,研究人员对其展开了深入研究。中国专利01213109.1提出了一种《超小型稳态偏振干涉成像光谱仪》(如图3所示),其为基于传统Savart板的双折射偏振干涉型高光谱成像仪,结构特征如下:双折射干涉仪由两片厚度相同的双折射晶体组成;第一片双折射晶体的光轴与X轴正方向夹角为45°,与Y轴负方向夹角为45°,与Z轴正方向夹角为45°;第二片双折射晶体的光轴方向与X轴正方向夹角为45°,与Y轴正方向夹角为45°,与Z轴正方向夹角为45°;起偏器和检偏器的透光轴均与X轴平行。剪切光束特征如下:两条光线在通过晶体1和晶体2后,均沿着Z轴方向传播,两条出射光束组成的平面与YOZ平面平行,并且两条出射光束关于XOZ平面对称。干涉机理为:由于两片双折射晶体的厚度相等,因此两片双折射晶体都引入等量的横向剪切,而且能够消除常数项光程差,将零级条纹调整到视场中心。然而,两片双折射晶体的平方项光程差组合后仍引入具有差异的纵向视场线性光程差。因此,传统Savart方案产生的同一波长的纵向视场总光程差量值存在较大的差异。由于总光程差量值与光谱分辨率互为倒数比例关系,总光程差量值差异会导致不同成像位置的光谱分辨率和波数位置不相同,不利于三维光谱数据立方体的切片表示。Among them, the birefringent polarization interference hyperspectral imager has been intensively studied by researchers because of its compact structure and simple optical path. Chinese patent 01213109.1 proposes an "ultra-small steady-state polarization interference imaging spectrometer" (as shown in Figure 3), which is a birefringent polarization interference hyperspectral imager based on a traditional Savart plate. The structural features are as follows: birefringence interferometer It consists of two birefringent crystals with the same thickness; the angle between the optical axis of the first birefringent crystal and the positive direction of the X-axis is 45°, the angle between the optical axis of the first birefringent crystal and the negative direction of the Y-axis is 45°, and the angle between the optical axis of the first birefringent crystal and the positive direction of the Z-axis is 45°; the angle between the optical axis direction of the second birefringent crystal and the positive direction of the X-axis is 45°, the angle between the positive direction of the Y-axis is 45°, and the angle between the positive direction of the Z-axis is 45°; the polarizer and The transmittance axis of the analyzer is parallel to the X axis. The characteristics of the sheared beam are as follows: after passing through crystal 1 and crystal 2, the two rays propagate along the Z-axis direction, the plane formed by the two outgoing beams is parallel to the YOZ plane, and the two outgoing beams are symmetrical about the XOZ plane. The interference mechanism is as follows: Since the thickness of the two birefringent crystals is equal, the two birefringent crystals both introduce the same amount of transverse shear, and can eliminate the constant term optical path difference, and adjust the zero-order fringe to the center of the field of view. However, the combination of the square-term optical path differences of the two birefringent crystals still introduces a linear optical path difference with a difference in the longitudinal field of view. Therefore, there are large differences in the total optical path difference value of the longitudinal field of view at the same wavelength produced by the traditional Savart scheme. Since the total optical path difference value and the spectral resolution are reciprocally proportional to each other, the difference in the total optical path difference value will lead to different spectral resolutions and wavenumber positions at different imaging positions, which is not conducive to the slice representation of the three-dimensional spectral data cube.
本发明提出一种新的双折射干涉仪,其结构特征为:由剪切板和补偿板两片厚度不相等的双折射晶体平板组成,双折射剪切板的光轴垂直于X轴,且与Y轴夹角为45°,双折射补偿板的光轴平行于X轴,双折射剪切板的厚度比双折射补偿板的大;起偏器和检偏器的透光轴均与X轴夹角为45°。其剪切光束特征:一束光线沿原光路传播;另一束光线在经过双折射剪切板时向Y轴负方向传播,在经过双折射补偿板时沿着Z轴方向传播;两条出射光线组成的平面与YOZ平面重合,并且有一条光线与Z轴重合。在经过其干涉机理为:剪切板引入与视场角相关的光程差,实现入射光束的宽波段横向剪切干涉。补偿板对剪切板的常数项光程差和平方项光程差进行补偿,实现对零级条纹的位置调整和总光程差的差异校正。采用这种双片式的结构,能够有效解决传统Savart方案中光程差的非线性问题。The present invention proposes a new birefringent interferometer, which is characterized in that it is composed of two birefringent crystal plates with unequal thicknesses, a shearing plate and a compensating plate, the optical axis of the birefringent shearing plate is perpendicular to the X axis, and The included angle with the Y axis is 45°, the optical axis of the birefringent compensation plate is parallel to the X axis, the thickness of the birefringent shear plate is larger than that of the birefringent compensation plate; the transmission axes of the polarizer and the analyzer are both in line with the X axis The included axis angle is 45°. Its shear beam characteristics: one beam of light propagates along the original optical path; the other beam of light propagates in the negative direction of the Y axis when passing through the birefringent shear plate, and propagates along the direction of the Z axis when passing through the birefringent compensation plate; The plane formed by the rays coincides with the YOZ plane, and one ray coincides with the Z axis. The interference mechanism is as follows: the shear plate introduces the optical path difference related to the viewing angle, and realizes the wide-band transverse shear interference of the incident beam. The compensation plate compensates the constant-term optical path difference and the square-term optical path difference of the shearing plate, so as to realize the position adjustment of the zero-order fringe and the difference correction of the total optical path difference. This double-chip structure can effectively solve the nonlinear problem of optical path difference in the traditional Savart scheme.
发明内容Contents of the invention
本发明的目的在于提供一种双折射偏振干涉型的高光谱成像装置及其成像方法,解决传统Savart干涉系统中各纵向视场总光程差不一致的技术问题。The purpose of the present invention is to provide a birefringent polarization interference type hyperspectral imaging device and its imaging method, which solves the technical problem of inconsistency in the total optical path difference of each vertical field of view in the traditional Savart interference system.
实现本发明目的的技术解决方案为:一种双折射偏振干涉型的高光谱成像装置,包括沿光轴依次放置的前置成像物镜、光阑、准直物镜、起偏器、双折射剪切板、双折射补偿板、检偏器、后置成像物镜和面阵探测器;前置成像物镜的成像面与准直物镜的前焦面重合,光阑处于前置成像物镜的成像面处;起偏器的透光轴与X轴的夹角为45°,检偏器的透光轴与X轴的夹角为45°;双折射剪切板的光轴垂直于X轴,且与Y轴夹角为45°;双折射补偿板的光轴平行于X轴。The technical solution to realize the object of the present invention is: a hyperspectral imaging device of birefringent polarization interference type, comprising a front imaging objective lens, a diaphragm, a collimating objective lens, a polarizer, a birefringent shearing plate, birefringence compensation plate, analyzer, rear imaging objective lens and area array detector; the imaging plane of the front imaging objective lens coincides with the front focal plane of the collimating objective lens, and the aperture is at the imaging surface of the front imaging objective lens; The angle between the transmission axis of the polarizer and the X-axis is 45°, the angle between the transmission axis of the analyzer and the X-axis is 45°; the optical axis of the birefringent shear plate is perpendicular to the X-axis, and The angle between the axes is 45°; the optical axis of the birefringence compensation plate is parallel to the X axis.
一种基于双折射偏振干涉型的高光谱成像装置的成像方法,方法步骤如下:An imaging method based on a birefringent polarization interference type hyperspectral imaging device, the method steps are as follows:
第一步、入射光束通过前置成像物镜成像在光阑上,随后经过准直物镜,形成准直光束,以准直光束形式入射到起偏器,起偏器把准直光束变为线偏振光;In the first step, the incident beam is imaged on the diaphragm through the front imaging objective lens, and then passes through the collimating objective lens to form a collimated beam, which enters the polarizer in the form of a collimated beam, and the polarizer converts the collimated beam into linear polarization Light;
第二步、上述线偏振光经过双折射剪切板后,被分解为振动方向互相正交的o光和e光,由于双折射剪切板的光轴与双折射补偿板的光轴正交,双折射剪切板中的o光在双折射补偿板中变为e光,将该光束即为oe光,同样另外一束偏振光即为eo光;这两束偏振光经过双折射补偿板后变成两束平行出射的正交偏振光束,其中一束光线沿原光路传播,另一束光线在经过双折射剪切板时向Y轴负方向传播,在经过双折射补偿板时沿着Z轴方向传播;两条出射光线组成的平面与YOZ平面重合,并且有一条光线与Z轴重合。In the second step, the above-mentioned linearly polarized light is decomposed into o light and e light whose vibration directions are orthogonal to each other after passing through the birefringent shear plate, because the optical axis of the birefringent shear plate is orthogonal to the optical axis of the birefringent compensation plate , the o light in the birefringent shearing plate becomes e light in the birefringent compensation plate, and this beam is oe light, and the other polarized light is eo light; these two beams of polarized light pass through the birefringent compensation plate Afterwards, it turns into two beams of orthogonally polarized light beams that emerge in parallel, one of which propagates along the original optical path, and the other beam propagates in the negative direction of the Y axis when passing through the birefringent shear plate, and along the Propagate in the Z-axis direction; the plane composed of two outgoing rays coincides with the YOZ plane, and one ray coincides with the Z-axis.
第三步、这两条出射光线经过检偏器后,变成偏振方向相同,且具有一定光程差的两条光束。Step 3: After the two outgoing rays pass through the analyzer, they become two beams with the same polarization direction and a certain optical path difference.
第四步、具有一定光程差的两条光束经过后置成像物镜后会聚于面阵探测器靶面上并发生干涉。In the fourth step, the two light beams with a certain optical path difference converge on the target surface of the area array detector after passing through the post-imaging objective lens and interfere.
第五步、由于成像面上不同的位置对应着不同的光程差,因此面阵探测器所得到的图像是经过光程差调制的干涉图像,在窗扫模式下,每一个像点的光强在不同时刻被不同的光程差调制,提取干涉图像序列探测目标各点的干涉信息并进行光谱复原,即可获得每个目标点的光谱信息。Step 5. Since different positions on the imaging surface correspond to different optical path differences, the image obtained by the area array detector is an interference image modulated by the optical path difference. In the window scan mode, the light of each image point The intensity is modulated by different optical path differences at different times, and the spectral information of each target point can be obtained by extracting the interference information of each point of the detection target in the interference image sequence and performing spectral restoration.
本发明与现有技术相比,其显著优点在于:(1)能够抑制同一波长不同纵向视场的线性总光程差差异,较好地保证了成像面上不同位置复原光谱的光谱分辨率和波数位置的一致性;(2)能够抑制不同波长相同纵向视场的线性总光程差差异,在抑制色散效应引起的波数分辨率差异方面效果优异。Compared with the prior art, the present invention has significant advantages in that: (1) it can suppress the difference in linear total optical path difference in different longitudinal fields of view at the same wavelength, and better ensure the spectral resolution and spectral resolution of the restored spectra at different positions on the imaging surface. Consistency of wavenumber position; (2) It can suppress the difference of linear total optical path difference in the same longitudinal field of view at different wavelengths, and has an excellent effect in suppressing the difference in wavenumber resolution caused by the dispersion effect.
附图说明Description of drawings
图1为本发明的双折射偏振干涉型的高光谱成像装置的结构示意图。FIG. 1 is a schematic structural diagram of a birefringent polarization interference type hyperspectral imaging device of the present invention.
图2为本发明的双折射干涉仪部分的结构示意图。Fig. 2 is a schematic structural diagram of the birefringence interferometer part of the present invention.
图3为背景技术中的双折射干涉仪部分的结构示意图。Fig. 3 is a schematic structural diagram of the birefringent interferometer part in the background art.
具体实施方式Detailed ways
下面结合附图对本发明作进一步详细描述。The present invention will be described in further detail below in conjunction with the accompanying drawings.
结合图1和图2,一种双折射偏振干涉型的高光谱成像装置,包括沿光轴依次放置的前置成像物镜1、光阑2、准直物镜3、起偏器4、双折射剪切板5、双折射补偿板6、检偏器7、后置成像物镜8和面阵探测器9。Combining Figures 1 and 2, a birefringent polarization interference type hyperspectral imaging device includes a front imaging objective lens 1, a diaphragm 2, a collimating objective lens 3, a polarizer 4, and a birefringent shear placed in sequence along the optical axis. Cutting plate 5 , birefringent compensation plate 6 , analyzer 7 , rear imaging objective lens 8 and area array detector 9 .
前置成像物镜1的成像面与准直物镜3的前焦面重合,光阑2处于前置成像物镜1的成像面处。起偏器4和检偏器7的透光轴均与X轴夹角为45°。双折射剪切板5的光轴垂直于X轴,且与Y轴夹角为45°,双折射补偿板6的光轴平行于X轴。The imaging plane of the front imaging objective lens 1 coincides with the front focal plane of the collimating objective lens 3 , and the diaphragm 2 is located at the imaging plane of the front imaging objective lens 1 . Both the transmission axes of the polarizer 4 and the analyzer 7 have an included angle of 45° with the X axis. The optical axis of the birefringent shear plate 5 is perpendicular to the X-axis and has an included angle of 45° with the Y-axis, and the optical axis of the birefringent compensation plate 6 is parallel to the X-axis.
所述双折射剪切板5的厚度大于双折射补偿板6的厚度。The thickness of the birefringent shear plate 5 is greater than that of the birefringent compensation plate 6 .
所述双折射剪切板5和双折射补偿板6均采用双折射晶体制成。Both the birefringent shear plate 5 and the birefringent compensation plate 6 are made of birefringent crystals.
所述双折射剪切板5和双折射补偿板6采用的双折射晶体为单轴晶体。The birefringent crystals used in the birefringent shear plate 5 and the birefringent compensating plate 6 are uniaxial crystals.
所述双折射剪切板5和双折射补偿板6均为正晶体或均为负晶体。Both the birefringent shear plate 5 and the birefringent compensation plate 6 are positive crystals or negative crystals.
一种基于双折射偏振干涉型的高光谱成像装置的成像方法,方法步骤如下:An imaging method based on a birefringent polarization interference type hyperspectral imaging device, the method steps are as follows:
第一步、入射光束通过前置成像物镜1成像在光阑2上,随后经过准直物镜3,形成准直光束,以准直光束形式入射到起偏器4,起偏器4把准直光束变为线偏振光;In the first step, the incident beam is imaged on the diaphragm 2 through the front imaging objective lens 1, and then passes through the collimating objective lens 3 to form a collimated beam, which is incident on the polarizer 4 in the form of a collimated beam, and the polarizer 4 collimates The light beam becomes linearly polarized light;
第二步、上述线偏振光经过双折射剪切板5后,被分解为振动方向互相正交的o光和e光。由于双折射剪切板5的光轴与双折射补偿板6的光轴正交,双折射剪切板5中的o光在双折射补偿板6中变为e光,将该光束即为oe光,同样另外一束偏振光即为eo光。这两束偏振光经过双折射补偿板6后变成两束平行出射的正交偏振光束。一束光线沿原光路传播;另一束光线在经过双折射剪切板时向Y轴负方向传播,在经过双折射补偿板时沿着Z轴方向传播;两条出射光线组成的平面与YOZ平面重合,并且有一条光线与Z轴重合;In the second step, the above-mentioned linearly polarized light is decomposed into o light and e light whose vibration directions are orthogonal to each other after passing through the birefringent shear plate 5 . Since the optical axis of the birefringent shearing plate 5 is perpendicular to the optical axis of the birefringent compensation plate 6, the o light in the birefringent shearing plate 5 becomes e light in the birefringent compensation plate 6, and the light beam is oe light, and another beam of polarized light is eo light. After the two beams of polarized light pass through the birefringence compensation plate 6, they become two beams of orthogonally polarized beams that exit in parallel. A beam of light propagates along the original optical path; another beam of light propagates in the negative direction of the Y axis when passing through the birefringent shear plate, and propagates along the direction of the Z axis when passing through the birefringent compensation plate; the plane formed by the two outgoing rays is the same as the YOZ The planes coincide, and there is a ray coincident with the Z axis;
第三步、这两条光束经过检偏器7后,变成偏振方向相同,且具有一定光程差的两条光束;In the third step, after the two light beams pass through the analyzer 7, they become two light beams with the same polarization direction and a certain optical path difference;
第四步、具有一定光程差的两条光束经过后置成像物镜8后会聚于面阵探测器9靶面上并发生干涉;In the fourth step, the two light beams with a certain optical path difference converge on the target surface of the area array detector 9 after passing through the post-imaging objective lens 8 and interfere;
第五步、由于成像面上不同的位置对应着不同的光程差,因此面阵探测器9所得到的图像是经过光程差调制的干涉图像。在窗扫模式下,每一个像点的光强在不同时刻被不同的光程差调制。提取干涉图像序列探测目标各点的干涉信息并进行光谱复原,即可获得每个目标点的光谱信息。In the fifth step, since different positions on the imaging surface correspond to different optical path differences, the image obtained by the area array detector 9 is an interference image modulated by the optical path difference. In the window scan mode, the light intensity of each image point is modulated by different optical path differences at different times. The spectral information of each target point can be obtained by extracting the interference information of each point of the detection target in the interference image sequence and performing spectral restoration.
实施例1Example 1
设定系统的光谱范围为400~1000nm,中心波长700nm处波数分辨率为91.2cm-1。前置成像物镜1、准直物镜3、后置成像物镜8的焦距均为75mm,面阵探测器9采样像素数为1024×1024,像素大小为6.5μm。本发明中双折射晶体均采用冰洲石材料,其中双折射剪切板5的厚度为11.55mm,双折射补偿板6的厚度为6.24mm。传统Savart方案采用的双折射晶体厚度均为8.17mm。The spectral range of the system is set to be 400-1000 nm, and the wavenumber resolution at the central wavelength of 700 nm is 91.2 cm -1 . The focal lengths of the pre-imaging objective lens 1, the collimating objective lens 3, and the rear imaging objective lens 8 are all 75 mm, and the number of sampling pixels of the area array detector 9 is 1024×1024, and the pixel size is 6.5 μm. In the present invention, the birefringent crystals are all made of iceland stone, wherein the thickness of the birefringent shear plate 5 is 11.55 mm, and the thickness of the birefringent compensation plate 6 is 6.24 mm. The thickness of the birefringent crystals used in the traditional Savart scheme is 8.17mm.
表1给出了两种方案在400nm、700nm和1000nm处,像面上不同行位置(第1、512和1024行)的总光程差量值。从表1可以看出,传统Savart方案的上方视场的总光程差明显大于下方视场的总光程差,在400nm处的总光程差的最大差异为5.232μm,700nm处的总光程差的最大差异为4.868μm,1000nm处的总光程差的最大差异为4.743μm。本发明方案总光程差的最大差异为0.116μm,由此可见本发明方案光程差的差异有明显改善。Table 1 shows the total optical path difference values at different row positions (lines 1, 512 and 1024) on the image plane at 400nm, 700nm and 1000nm for the two schemes. It can be seen from Table 1 that the total optical path difference of the upper field of view of the traditional Savart scheme is significantly greater than that of the lower field of view, and the maximum difference of the total optical path difference at 400nm is 5.232μm, and the total optical path difference at 700nm The maximum difference in path difference is 4.868 μm, and the maximum difference in total optical path difference at 1000 nm is 4.743 μm. The maximum difference of the total optical path difference of the solution of the present invention is 0.116 μm, so it can be seen that the difference of the optical path difference of the solution of the present invention is significantly improved.
表1两种方案在像面上不同行位置的总光程差(μm)Table 1 The total optical path difference (μm) of the two schemes at different row positions on the image plane
表2给出了两种方案在像面上不同行位置的光谱分辨率。传统Savart方案的上方视场的光谱分辨率明显高于下方视场的光谱分辨率,在400nm处的光谱分辨率相差0.060nm,700nm处的光谱分辨率相差0.199nm,1000nm处的光谱分辨率相差0.417nm。本发明方案的光谱分辨率最大相差0.009nm,由此可见本发明方案光谱分辨率的一致性更好。Table 2 shows the spectral resolutions of the two schemes at different row positions on the image plane. The spectral resolution of the upper field of view of the traditional Savart scheme is significantly higher than that of the lower field of view. The spectral resolution at 400nm differs by 0.060nm, the spectral resolution at 700nm differs by 0.199nm, and the spectral resolution at 1000nm differs. 0.417nm. The spectral resolution of the solution of the present invention has a maximum difference of 0.009 nm, which shows that the spectral resolution of the solution of the present invention has better consistency.
表2两种方案在像面上不同行位置的光谱分辨率(nm)Table 2 Spectral resolution (nm) of the two schemes at different row positions on the image plane
表3给出了两种方案在像面上不同行位置的复原光谱的波长位置。传统Savart方案在400nm处的波长位置最大相差16.16nm,700nm处的波长位置最大相差28.59nm,1000nm处的波长位置最大相差41.14nm。本发明方案的波长位置最大相差0.85nm,由此可见本发明方案波长位置一致性更好。Table 3 shows the wavelength positions of the restored spectra at different row positions on the image plane for the two schemes. In the traditional Savart scheme, the maximum wavelength difference at 400nm is 16.16nm, the maximum wavelength difference at 700nm is 28.59nm, and the maximum wavelength difference at 1000nm is 41.14nm. The wavelength position of the solution of the present invention has a maximum difference of 0.85 nm, which shows that the wavelength position of the solution of the present invention has better consistency.
表3两种方案在像面上不同行位置的复原光谱的波长位置(nm)Table 3 The wavelength position (nm) of the restored spectrum of the two schemes at different row positions on the image plane
由于双折射材料的折射率具有很强的波长依赖性,导致不同波长的总光程差存在差异。短波的总光程差明显大于长波的总光程差,导致不同波长处的波数分辨率产生较大差异。传统Savart方案的波数分辨率最大相差13.248cm-1,本发明方案的波数分辨率最大相差9.377cm-1。因此,在抑制色散效应引起的波数分辨率差异方面,本发明方案要优于传统Savart方案。Due to the strong wavelength dependence of the refractive index of birefringent materials, there are differences in the total optical path difference at different wavelengths. The total optical path difference of the short wavelength is significantly larger than that of the long wavelength, resulting in a large difference in the wavenumber resolution at different wavelengths. The maximum difference in wavenumber resolution of the traditional Savart scheme is 13.248cm -1 , and the maximum difference in wavenumber resolution of the scheme of the present invention is 9.377cm -1 . Therefore, the scheme of the present invention is better than the traditional Savart scheme in suppressing the wavenumber resolution difference caused by the dispersion effect.
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011093794A1 (en) * | 2010-01-29 | 2011-08-04 | Dso National Laboratories | Hyperspectral imaging device |
CN105547480A (en) * | 2015-12-24 | 2016-05-04 | 南京理工大学 | High-throughput birefringence interference imaging spectrum device |
-
2017
- 2017-12-14 CN CN201711344354.8A patent/CN108593105A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011093794A1 (en) * | 2010-01-29 | 2011-08-04 | Dso National Laboratories | Hyperspectral imaging device |
CN105547480A (en) * | 2015-12-24 | 2016-05-04 | 南京理工大学 | High-throughput birefringence interference imaging spectrum device |
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