CN105204999B - Method for realizing automatic test - Google Patents
Method for realizing automatic test Download PDFInfo
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- CN105204999B CN105204999B CN201510646284.6A CN201510646284A CN105204999B CN 105204999 B CN105204999 B CN 105204999B CN 201510646284 A CN201510646284 A CN 201510646284A CN 105204999 B CN105204999 B CN 105204999B
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- 238000012360 testing method Methods 0.000 title claims abstract description 170
- 238000000034 method Methods 0.000 title claims abstract description 43
- 230000008569 process Effects 0.000 claims abstract description 28
- 238000013461 design Methods 0.000 claims abstract description 8
- 230000009471 action Effects 0.000 claims abstract description 6
- 238000010998 test method Methods 0.000 claims description 5
- 230000005611 electricity Effects 0.000 claims description 4
- 238000009434 installation Methods 0.000 claims description 4
- 230000003111 delayed effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 3
- 238000012938 design process Methods 0.000 abstract description 2
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- 230000008859 change Effects 0.000 description 2
- 230000008676 import Effects 0.000 description 2
- 238000011900 installation process Methods 0.000 description 2
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Abstract
The invention discloses a method for realizing automatic test, which comprises the following specific design processes: the test module is designed and controls the automatic loading and unloading actions of the PDT software for power supply design; preparing a test mainboard and a test fixture, and connecting all the devices according to test requirements; after power-on, opening PDT software, operating a test module, and controlling the PDT software to automatically complete the whole test process by an instruction in the test module; after the test is finished, the test module uniformly records the test data in the document to realize the automatic test. Compared with the prior art, the method for realizing the automatic test has the advantages that the whole test process does not need manual operation, the test process is simple, the whole test process only needs 10 minutes and is far superior to the previous test process for more than 2 hours, the test efficiency is greatly improved, the test flow is simplified, and the work efficiency is improved.
Description
Technical field
The present invention relates to power supply test and voltage conversion technical field, specifically a kind of practical, realization is automatically
Change the method for test.
Background technology
Electronic technology at this stage, no matter in PC fields or even server field, CPU usage that Intel Company is produced
Occuping market share proportion big absolutely always.No matter in technique or technical elements, the CPU that Intel Company is produced is owned by
Unshakable status.In dc source field, the design for CPU power supplies VR is the indispensable technology of each Power Engineer.
CPU is the core of whole mainboard, and the design for the VR of CPU power supplies is equally the difficult point of Power Management Design.Therefore, Intel Company's root
According to the power demands for oneself producing CPU, a series of test report and testing standard are formulated, what research staff designed is
CPU power supplies VR must is fulfilled for corresponding index demand.
In whole Intel test report, Static LL tests are most basic also most important test events.
If Static LL test results can not meet testing standard, other all tests will be unable to continue, Static LL tests
Including：Voltage Load-line is tested and Imon curve accuracy tests.
Common Static LL tests need Test Engineer to control PDT softwares to draw load and unloading manually, draw carry electricity every time
Magnitude of voltage in PDT softwares, Imon values in current value and register are read after stream is stable, and test data filled in manually into
In Intel test report, because test data is relatively more, method of testing is cumbersome, and Test Engineer can not accurately hold drawing
It is balanced to carry time and discharge time, is affected by human factors larger, measuring accuracy is relatively low, and it is small that whole test process lasts about greatly 2
When, testing efficiency is low.
Therefore, the present invention proposes a kind of method for realizing automatic test.
The content of the invention
The present invention technical assignment be to be directed to above weak point, there is provided it is a kind of it is practical, realize automatic test
Method.
A kind of method for realizing automatic test, its specific design process are：
Test module is designed, test module control Power Management Design PDT softwares draw the action carried with unloading automatically；
Setup test mainboard and measurement jig, all devices are connected by test request；
PDT softwares, testing results module are opened after upper electricity, the instruction control PDT softwares in test module are automatically performed whole
Individual test process；
After the completion of test, the unified record of test data in a document, is realized automatic test by test module.
The record document is to automatically generate same Intel test report form identical excel documents：In test module
After end of run, the txt test data documents generated are automatically opened up, and test data in txt test data documents is replicated
Enter in existing excel documents, the same identical test data of Intel test report form automatically generated in excel documents,
Test data in excel is copied in Intel test report.
The specific operating process of test module is：
Initialize installation is carried out first；
PDT is drawn automatically carries corresponding current value；
Magnitude of voltage and current value in PDT are read, is stored in txt documents；
Imon current values in 0X8012 registers are read, are stored in txt documents；
PDT is unloaded automatically；
Detect whether to complete all tests, it is unfinished then continue to test；
Finish test procedure, open txt documents.
The Initialize installation process is：Test module reads numerical value in 06H and 21H registers first, preserves to txt texts
Shelves；Then CPU operating voltages VID and cpu performance state P-state is set.
After the PDT draws load and automatic unloading automatically, it is delayed certain time, the time >=7000ms.
A kind of method for realizing automatic test of the present invention, has advantages below：
A kind of method for realizing automatic test of the present invention, whole test process is without manual operation, test process letter
Clean, whole test process only needs 10 minutes, the test process of far superior to conventional more than 2 hours, greatly improves test effect
Rate, simplify testing process, improve operating efficiency；By finished writing in test script instruction control PDT softwares draw automatically load and
Uninstall action, draw carry and discharge time is fixed every time, reduce influence of the extraneous factor to test data, that improves test data can
By property；There is provided one and automatically generate same Intel test report form identical excel documents, greatly simplify will test number
According to the process of Import Reports, the time is saved, improves testing efficiency, it is practical, it is easy to spread.
Brief description of the drawings
Accompanying drawing 1 is implementation process figure of the invention.
Accompanying drawing 2 is test module operational flowchart of the invention.
Embodiment
The invention will be further described with specific embodiment below in conjunction with the accompanying drawings.
The present invention provides a kind of method for realizing automatic test, only need to be in PDT after equipment is connected（Power
Design Tool）The test script finished writing is run in software, PDT softwares generate the corresponding test event of automatic running
Test data, realize full-automatic test.After script is run, Test Engineer only need to be by the txt documents of generation
Test data is copied in ready excel reports, you can the test data with Intel test report same formats is generated,
Test data is copied in Intel test report, as shown in accompanying drawing 1, Fig. 2, its specific implementation process is：
Test module is designed, test module control Power Management Design PDT softwares draw the action carried with unloading automatically；
Setup test mainboard and measurement jig, all devices are connected by test request；
PDT softwares, testing results module are opened after upper electricity, the instruction control PDT softwares in test module are automatically performed whole
Individual test process；
After the completion of test, the unified record of test data in a document, is realized automatic test by test module.
The record document is to automatically generate same Intel test report form identical excel documents：In test module
After end of run, the txt test data documents generated are automatically opened up, and test data in txt test data documents is replicated
Enter in existing excel documents, the same identical test data of Intel test report form automatically generated in excel documents,
Test data in excel is copied in Intel test report.
The specific operating process of test module is：
Initialize installation is carried out first；
PDT is drawn automatically carries corresponding current value；
Magnitude of voltage and current value in PDT are read, is stored in txt documents；
Imon current values in 0X8012 registers are read, are stored in txt documents；
PDT is unloaded automatically；
Detect whether to complete all tests, it is unfinished then continue to test；
Finish test procedure, open txt documents.
The Initialize installation process is：Test module reads numerical value in 06H and 21H registers first, preserves to txt texts
Shelves；Then CPU operating voltages VID and cpu performance state P-state is set.
After the PDT draws load and automatic unloading automatically, it is delayed certain time, the time >=7000ms.
Whole test process is without manual operation, and after testing results script, the instruction in test script can control PDT softwares
Whole test process is automatically performed, and, simplifies testing process by the unified record of required record data in a document, reducing personnel needs
Ask, realize automatic test.
Whole test process only needs to complete for 10 minutes, the test process of far superior to conventional more than 2 hours, greatly
Testing efficiency is improved, simplifies testing process, improves operating efficiency.
The present invention draws load and uninstall action automatically by having finished writing instruction control PDT softwares in test script, draws carry every time
Fixed with discharge time, reduce influence of the extraneous factor to test data, improve the reliability of test data.
In addition to test script, present invention simultaneously provides one to automatically generate same Intel test report form identical excel
Document, after test script end of run, the txt test data documents generated can be automatically opened up.Only need to be by txt test datas
Test data is copied into existing excel documents in document, and same Intel test report can be automatically generated in excel documents
The identical test data of form, the test data in excel is copied in Intel test report.
It is greatly simplify by this step by the process of test data Import Reports, save the time, improve test
Efficiency.
Above-mentioned embodiment is only the specific case of the present invention, and scope of patent protection of the invention includes but is not limited to
Above-mentioned embodiment, it is any to meet a kind of the claims and any of method for realizing automatic test of the invention
The appropriate change or replacement that the those of ordinary skill of the technical field is done to it, it should all fall into the patent protection model of the present invention
Enclose.
Claims (3)
- A kind of 1. method for realizing automatic test, for realizing CPU voltage automatic tests, it is characterised in that it specifically sets Meter process is：Test module is designed, test module control Power Management Design PDT softwares draw the action carried with unloading automatically；Setup test mainboard and measurement jig, all devices are connected by test request；PDT softwares, testing results module are opened after upper electricity, the instruction control PDT softwares in test module are automatically performed whole survey Examination process；After the completion of test, the unified record of test data in a document, is realized automatic test by test module；The record document is to automatically generate same Intel test report form identical excel documents：Run in test module After end, the txt test data documents generated are automatically opened up, and test data in txt test data documents is copied into In some excel documents, the same identical test data of Intel test report form is automatically generated in excel documents, will Test data in excel is copied in Intel test report；The specific operating process of test module is：Initialize installation is carried out first；PDT is drawn automatically carries corresponding current value；Magnitude of voltage and current value in PDT are read, is stored in txt documents；Imon current values in 0X8012 registers are read, are stored in txt documents；PDT is unloaded automatically；Detect whether to complete all tests, it is unfinished then continue to test；Finish test procedure, open txt documents.
- A kind of 2. method for realizing automatic test according to claim 1, it is characterised in that the Initialize installation mistake Cheng Wei：Test module reads numerical value in 06H and 21H registers first, preserves to txt documents；Then set CPU operating voltages and Cpu performance state P-state.
- 3. a kind of method for realizing automatic test according to claim 1, it is characterised in that the PDT draws load automatically After automatic unloading, it is delayed certain time, the time >=7000ms.
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| CN201510646284.6A CN105204999B (en) | 2015-10-08 | 2015-10-08 | Method for realizing automatic test |
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| CN201510646284.6A CN105204999B (en) | 2015-10-08 | 2015-10-08 | Method for realizing automatic test |
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| CN105204999B true CN105204999B (en) | 2017-11-21 |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110609243B (en) * | 2019-09-05 | 2021-11-19 | 广东浪潮大数据研究有限公司 | Method and system for testing CPU power supply efficiency and related components |
| CN112630678B (en) * | 2020-12-11 | 2022-04-29 | 浪潮电子信息产业股份有限公司 | Test system of mainboard core power supply |
| CN112965907A (en) * | 2021-03-11 | 2021-06-15 | 南京爱奇艺智能科技有限公司 | VR APP automatic test method and device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101650384A (en) * | 2009-09-02 | 2010-02-17 | 浪潮电子信息产业股份有限公司 | Method for testing voltage of CPU load lines based on two-way server system |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7644328B2 (en) * | 2007-03-22 | 2010-01-05 | Intel Corporation | Sharing routing of a test signal with an alternative power supply to combinatorial logic for low power design |
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101650384A (en) * | 2009-09-02 | 2010-02-17 | 浪潮电子信息产业股份有限公司 | Method for testing voltage of CPU load lines based on two-way server system |
Non-Patent Citations (2)
| Title |
|---|
| 基于CAN 总线和LabVIEW的能馈电子负载监控系统;陈雪冰等;《机电工程》;20110831;第28卷(第8期);第954-959页 * |
| 基于Romley平台的X86服务器主板开发;张锋;《中国优秀硕士学位论文全文数据库》;20130515;第54-57页 * |
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