CN107590037A - A kind of method that EDPP tests are carried out to server GPU - Google Patents
A kind of method that EDPP tests are carried out to server GPU Download PDFInfo
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Abstract
本发明公开了一种对服务器GPU进行EDPP测试的方法,该方法包括步骤:搭建测试环境;对多个GPU同时进行多次EDPP测试,每次测试均重启测试程序;将测试过程及结果进行记录。与现有技术相比,本发明的测试过程无需人工参与,增强测试结果的可靠性;测试实现对多个GPU同时进行EDPP测试,大大缩短了测试所用的时间,提高工作效率。
The invention discloses a method for performing an EDPP test on a server GPU. The method comprises the steps of: building a test environment; performing multiple EDPP tests on multiple GPUs at the same time, and restarting the test program for each test; recording the test process and results . Compared with the prior art, the test process of the present invention does not require manual participation, which enhances the reliability of test results; the test realizes EDPP test on multiple GPUs at the same time, which greatly shortens the time used for testing and improves work efficiency.
Description
技术领域technical field
本发明涉及服务器GPU测试技术领域,具体地说是一种对服务器GPU进行EDPP测试的方法。The invention relates to the technical field of server GPU testing, in particular to a method for performing EDPP testing on server GPUs.
背景技术Background technique
计算型服务器——PCIE-SWITH(PCIE,全称为peripheral componentinterconnect express,是一种高速串行计算机扩展总线标准;SWITH,是一种服务器)是一种全新架构的服务器,该服务器在中国的整机柜服务器领域能够满足客户对高性能计算服务器的需求。Computing server - PCIE-SWITH (PCIE, full name peripheral component interconnect express, is a high-speed serial computer expansion bus standard; SWITH, is a server) is a server with a new architecture, the server in China The field of cabinet servers can meet customers' needs for high-performance computing servers.
然而在服务器的生产研发阶段,对其图形处理器(英语:Graphics ProcessingUnit,缩写:GPU)的测试是一个重要的环节。由于在测试过程中测试项较多、每个测试项较长,单个loop EDPP(EDPP,英文全称为electrical date peak processing,供电数据峰值处理)测试全程需3个小时左右时间,且为多个节点同时持续必测项,故工作量极大。However, in the production and development stage of the server, the testing of its graphics processing unit (English: Graphics Processing Unit, abbreviation: GPU) is an important link. Due to the large number of test items and the length of each test item during the test, a single loop EDPP (EDPP, English full name is electrical date peak processing, power supply data peak processing) test takes about 3 hours, and it is multi-node At the same time, the required test items are continued, so the workload is huge.
现有测试手段均为手动测试且对GPU逐个进行测试,使用时间长,且需人工选择,增加工作人员的工作负担,工作效率低,且人工选择难免会出现错误和纰漏。Existing testing methods are all manual testing and each GPU is tested one by one. It takes a long time to use and requires manual selection, which increases the workload of the staff. The work efficiency is low, and manual selection will inevitably lead to errors and omissions.
发明内容Contents of the invention
为克服上述现有技术存在的不足,本发明的目的在于提供一种高自动化程度、高测试效率的对服务器GPU进行EDPP测试的方法。In order to overcome the deficiencies in the above-mentioned prior art, the purpose of the present invention is to provide a method for performing EDPP testing on server GPUs with a high degree of automation and high testing efficiency.
本发明解决其技术问题所采用的技术方案是:一种对服务器GPU进行EDPP测试的方法,包括以下步骤:The technical scheme that the present invention adopts to solve the technical problem is: a kind of method that server GPU is carried out EDPP test, comprises the following steps:
搭建测试环境;Set up a test environment;
对多个GPU同时进行多次EDPP测试,每次测试均重启测试程序;Perform multiple EDPP tests on multiple GPUs at the same time, and restart the test program for each test;
将测试过程及结果进行记录。Record the test process and results.
进一步地,所述搭建测试环境的具体过程为:使GPUBOX满配,将PCIE-SWITCH的GPUBOX通过Mini SAS HD连接测试服务器端,并拷贝显卡驱动及测试工具到服务器端的操作系统。Further, the specific process of setting up the test environment is: make the GPUBOX fully configured, connect the GPUBOX of PCIE-SWITCH to the test server through Mini SAS HD, and copy the graphics card driver and test tools to the operating system on the server.
进一步地,所述对多个GPU同时进行多次EDPP测试,每次测试均重启测试程序的具体过程为:Further, the described multiple EDPP tests are carried out simultaneously to multiple GPUs, and the specific process of restarting the test program for each test is as follows:
输入测试节点IP和测试次数变量;Enter the test node IP and test times variables;
判断测试次数变量是否在预设测试次数范围内;Judging whether the test times variable is within the preset test times range;
如果测试次数变量不在预设次数范围内,则结束测试;If the number of tests variable is not within the preset number of times, then end the test;
如果测试次数变量在预设次数范围内,则判断测试次数变量是否为1;If the number of tests variable is within the preset number of times, it is judged whether the number of tests variable is 1;
如果测试次数变量不是1,则关闭正在运行的测试程序,进行下一步的操作;如果测试次数变量是1,则调用与测试工具匹配的显卡驱动,进行下一步的操作;If the variable of the number of tests is not 1, then close the running test program and proceed to the next step; if the variable of the number of tests is 1, then call the graphics card driver matched with the test tool to proceed to the next step;
登入测试节点,使各测试节点同时启动测试程序,选择EDPP测试项进行测试,并输出测试结果,使测试次数变量加1,重复测试。Log in to the test node, make each test node start the test program at the same time, select the EDPP test item to test, and output the test result, add 1 to the test times variable, and repeat the test.
进一步地,所述调用与测试工具匹配的显卡驱动的具体步骤为:Further, the specific steps of calling the graphics card driver matched with the test tool are:
执行驱动程序版本检查命令,根据驱动程序的版本号判断现有显卡驱动是否为测试所需驱动;Execute the driver version check command to judge whether the existing graphics card driver is the driver required for the test according to the driver version number;
如果是测试所需驱动,则直接调用该显卡驱动;If it is the driver required for testing, directly call the graphics card driver;
如果不是测试所需驱动,则卸载该显卡驱动,调用拷贝的显卡驱动。If it is not the driver required for the test, uninstall the graphics card driver and call the copied graphics card driver.
进一步地,通过ssh服务登入测试节点,并记录输出信息,所述输出信息包括每个GPU的负载、编号、GPU使用率、功耗、频率、温度和状态中的一种或多种信息,并通过log文件记录。Further, log in the test node through the ssh service, and record the output information, the output information includes one or more information in the load, number, GPU usage, power consumption, frequency, temperature and state of each GPU, and Recorded through the log file.
进一步地,所述测试结果与输出信息记录在同一log文件内。Further, the test result and the output information are recorded in the same log file.
本发明的有益效果是:The beneficial effects of the present invention are:
1、本发明将PCIE-SWITH整机柜满配,多节点同时对GPU进行EDPP测试,单循环下实现对32个GPU的同时测试,大大缩减了测试时间,提高了工作效率;。1. The present invention fully configures the entire PCIE-SWITH cabinet, and performs EDPP testing on GPUs at the same time with multiple nodes. Simultaneous testing of 32 GPUs is realized in a single cycle, which greatly reduces the testing time and improves work efficiency;
2、本发明将测试的结果及GPU信息记录到同一个log文件中,方便后续对GPU性能的查看和问题的准确定位,避免人工测试和对GPU选择的失误。2. The present invention records the test results and GPU information into the same log file, which facilitates subsequent viewing of GPU performance and accurate positioning of problems, and avoids manual testing and mistakes in GPU selection.
3、本发明的方法将测试次数设为多次,且每次测试均重新启动测试程序,避免上次测试对本次测试造成影响,保证每次测试结果的准确、可靠性。3. In the method of the present invention, the number of tests is set to multiple times, and the test program is restarted for each test, so as to avoid the impact of the last test on this test and ensure the accuracy and reliability of each test result.
附图说明Description of drawings
图1是本发明所述方法的流程示意图。Fig. 1 is a schematic flow chart of the method of the present invention.
图2是本发明中对满配的GPU同时进行多次EDPP测试的流程示意图。FIG. 2 is a schematic flow diagram of performing multiple EDPP tests simultaneously on a fully configured GPU in the present invention.
具体实施方式detailed description
为能清楚说明本方案的技术特点,下面通过具体实施方式,并结合其附图,对本发明进行详细阐述。下文的公开提供了许多不同的实施例或例子用来实现本发明的不同结构。为了简化本发明的公开,下文中对特定例子的部件和设置进行描述。此外,本发明可以在不同例子中重复参考数字和/或字母。这种重复是为了简化和清楚的目的,其本身不指示所讨论各种实施例和/或设置之间的关系。应当注意,在附图中所图示的部件不一定按比例绘制。本发明省略了对公知组件和处理技术及工艺的描述以避免不必要地限制本发明。In order to clearly illustrate the technical features of this solution, the present invention will be described in detail below through specific implementation modes and in conjunction with the accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and/or letters in different instances. This repetition is for the purpose of simplicity and clarity and does not in itself indicate a relationship between the various embodiments and/or arrangements discussed. It should be noted that components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted herein to avoid unnecessarily limiting the present invention.
本发明将PCIE-SWITH整机柜满配并连接测试服务器,通过测试服务器端的测试工具调用GPU,使整机柜的GPU同时进行EDPP测试。In the present invention, the PCIE-SWITH whole cabinet is fully equipped and connected to the test server, and the GPU is called by the test tool on the test server side, so that the GPU of the whole cabinet can perform EDPP test at the same time.
其中测试工具是对GPU进行EDPP测试的测试工具,本发明选用的Nvqual测试工具为NVQual_P40_v4_18,使用该测试工具中的测试工具需要搭配驱动程序方可使用,本发明选用的驱动程序为P40gpu:driver_367.57。Wherein test tool is the test tool that GPU is carried out EDPP test, and the Nvqual test tool that the present invention selects is NVQual_P40_v4_18, uses the test tool in this test tool to need collocation driver to use, and the driver program that the present invention selects is P40gpu:driver_367. 57.
如图1所示,本方法的具体操作步骤为,As shown in Figure 1, the concrete operation steps of this method are,
S1,搭建测试环境;S1, build a test environment;
S2,对多个GPU同时进行多次EDPP测试,每次测试均重启测试程序;S2, performing multiple EDPP tests on multiple GPUs at the same time, and restarting the test program for each test;
S3,将测试过程及结果进行记录。S3, recording the testing process and results.
步骤S1中,对测试环境的搭建包括对硬件测试环境的搭建和软件测试环境的搭建,对硬件测试环境的搭建是指将两台PCIE-SWITCH整机柜的GPUBOX满配与测试服务器(server)用Mini SAS HD线缆连接起来。其中满配是指单个GPUBOX安装16个GPU。一个GPUBOX对应两个server。其中GPUBOX即安装GPU的盒子。对软件环境的搭建通过拷贝显卡驱动及测试工具到服务器端的操作系统来实现。测试开始时,首先开启GPUBOX,1min后开启对应server,保证测试系统的稳定性。In step S1, the setup of the test environment includes the setup of the hardware test environment and the setup of the software test environment. The setup of the hardware test environment refers to fully configuring the GPUBOX of the two PCIE-SWITCH complete cabinets with the test server (server) Connect with Mini SAS HD cable. The full configuration refers to the installation of 16 GPUs on a single GPUBOX. One GPUBOX corresponds to two servers. Among them, GPUBOX is the box where the GPU is installed. The construction of the software environment is realized by copying the graphics card driver and test tools to the operating system on the server side. At the beginning of the test, first turn on the GPUBOX, and turn on the corresponding server after 1 minute to ensure the stability of the test system.
如图2所示,步骤S2中对满配的GPU同时进行多次EDPP测试的具体步骤为:As shown in Figure 2, the specific steps for performing multiple EDPP tests on a fully configured GPU at the same time in step S2 are:
S21,输入测试节点IP和测试次数变量;S21, input test node IP and test times variable;
S22,判断测试次数变量是否在预设测试次数范围内;S22, judging whether the test times variable is within the preset test times range;
S23,如果测试次数变量不在预设次数范围内,则结束测试;S23, if the test number variable is not within the preset number range, then end the test;
S24,如果测试次数变量在预设次数范围内,则判断测试次数变量是否为1;S24, if the test times variable is within the preset times range, then judge whether the test times variable is 1;
S25,如果测试次数变量不是1,则关闭正在运行的测试程序;S25, if the number of tests variable is not 1, then close the running test program;
S26,登入测试节点,使各测试节点同时启动测试程序,选择EDPP测试项进行测试,并输出测试结果,使测试次数变量加1,转到步骤S22;S26, log in the test node, make each test node start the test program at the same time, select the EDPP test item to test, and output the test result, add 1 to the test times variable, and go to step S22;
S27,如果测试次数变量是1,则判断判断现有显卡驱动是否为测试所需驱动;S27, if the number of tests variable is 1, then determine whether the existing graphics card driver is the driver required for the test;
S28,如果是测试所需驱动,则直接调用该显卡驱动,转到步骤S25;S28, if it is the driver required for the test, then directly call the graphics card driver, and go to step S25;
S29,如果不是测试所需驱动,则卸载该显卡驱动,调用拷贝的显卡驱动,转到步骤S25。S29. If the driver is not required for the test, uninstall the graphics card driver, call the copied graphics card driver, and go to step S25.
步骤S21中,在测试程序的命令输入行输入测试节点IP及测试次数变量。本发明输入4个测试节点IP,其中每个测试节点IP对应8个GPU,因此本发明同时对32个GPU进行EDPP测试。步骤S22中,预设次数为多次,本发明选用10次,预设次数即对每32个GPU进行重复测试的次数,多次测试获得的测试结果更加准确,可靠性更强,本发明进行1次测试所用的时间大约为2.5小时,相比于传统的对1个GPU测试需要3小时的速度,大大提高了工作效率。In step S21, input the test node IP and test times variables in the command input line of the test program. The present invention inputs 4 test node IPs, wherein each test node IP corresponds to 8 GPUs, so the present invention performs EDPP test on 32 GPUs at the same time. In step S22, the preset number of times is multiple times, and the present invention selects 10 times, and the preset number of times is the number of repeated tests for every 32 GPUs. The test results obtained by multiple tests are more accurate and more reliable. The time taken for one test is about 2.5 hours, compared with the traditional three-hour test for one GPU, which greatly improves the work efficiency.
步骤S24中,对测试次数是否为1的判断是为了进一步检查并判断server操作系统下是否还存在自带的显卡驱动,如存在自带的显卡驱动,卸载自带的显卡驱动,利用搭建测试环境时新拷贝的显卡驱动。这是由于操作系统自带的显卡驱动无法驱动现有的测试工具,因而无法进行GPU的EDPP测试。In step S24, the judgment of whether the number of tests is 1 is to further check and judge whether there is a built-in graphics card driver under the server operating system. If there is a built-in graphics card driver, uninstall the built-in graphics card driver and use the built-in test environment The newly copied video card driver. This is because the graphics card driver that comes with the operating system cannot drive the existing test tools, so the EDPP test of the GPU cannot be performed.
步骤S25中,为保证测试过程的稳定进行,先关闭正在运行的测试工具,使每一次测试的测试节点重新启动测试程序,避免出现上次测试的测试程序未关闭对本次测试造成的影响,保证每次测试结果的准确性。In step S25, in order to ensure the stability of the test process, first close the running test tool, so that the test node of each test restarts the test program, so as to avoid the impact that the test program of the last test did not close on this test. Guarantee the accuracy of each test result.
步骤S26中,通过ssh服务登入测试节点,记录并输出信息,输出信息包括每个GPU的负载、编号、GPU使用率、功耗、频率、温度、状态中的的信息。并通过log文件记录,以下是对8个GPU输出内容的举例:In step S26, log in to the test node through the ssh service, record and output information, and the output information includes the load, number, GPU usage, power consumption, frequency, temperature, and status of each GPU. And record through the log file, the following is an example of the output content of 8 GPUs:
Current Application Clocks:[1531MHz]Current Application Clocks: [1531MHz]
sgemm Workload-M:3584N:1024K:4096L:100000I:10000P:X:T:60-PASSsgemm Workload-M:3584N:1024K:4096L:100000I:10000P:X:T:60-PASS
index,timestamp,utilization.gpu[%],power.draw[W],clocks.current.graphics[MHz],temperature.gpu,pstate,clocks_throttle_reasons.hw_slowdownindex, timestamp, utilization.gpu[%], power.draw[W], clocks.current.graphics[MHz], temperature.gpu, pstate, clocks_throttle_reasons.hw_slowdown
0,2017/04/01 16:27:42.062,0%,14.00W,544MHz,31,P8,Not Active0,2017/04/01 16:27:42.062,0%,14.00W,544MHz,31,P8,Not Active
1,2017/04/01 16:27:42.077,0%,13.19W,544MHz,30,P8,Not Active1,2017/04/01 16:27:42.077,0%,13.19W,544MHz,30,P8,Not Active
2,2017/04/01 16:27:42.091,0%,12.39W,544MHz,30,P8,Not Active2,2017/04/01 16:27:42.091,0%,12.39W,544MHz,30,P8,Not Active
3,2017/04/01 16:27:42.106,0%,13.38W,544MHz,30,P8,Not Active3,2017/04/01 16:27:42.106,0%,13.38W,544MHz,30,P8,Not Active
4,2017/04/01 16:27:42.121,0%,12.89W,544MHz,31,P8,Not Active4,2017/04/01 16:27:42.121,0%,12.89W,544MHz,31,P8,Not Active
5,2017/04/01 16:27:42.136,0%,12.99W,544MHz,30,P8,Not Active5,2017/04/01 16:27:42.136,0%,12.99W,544MHz,30,P8,Not Active
6,2017/04/01 16:27:42.152,0%,13.40W,544MHz,29,P8,Not Active6,2017/04/01 16:27:42.152,0%,13.40W,544MHz,29,P8,Not Active
7,2017/04/01 16:27:42.167,0%,12.79W,544MHz,33,P8,Not Active。7, 2017/04/01 16:27:42.167, 0%, 12.79W, 544MHz, 33, P8, Not Active.
步骤S26中,选择Nvqual测试工具的EDPP测试项,进行GPU在波动负载压力下供电达到峰值的承受能力,如果通过测试输出Pass,否则测试输出Fail。将测试结果与GPU的输出信息记录在同一log文件下,便于后续对GPU性能的查看和问题的准确定位。In step S26, the EDPP test item of the Nvqual test tool is selected to test the capability of the GPU to supply power to a peak value under fluctuating load pressure. If the test is passed, the test is output as Pass, otherwise the test is output as Fail. Record the test results and the output information of the GPU in the same log file, which is convenient for subsequent viewing of GPU performance and accurate positioning of problems.
步骤S27中,对现有显卡驱动是否为测试所需驱动的判断通过执行驱动程序版本检查命令,根据驱动程序的版本号来实现。其中驱动程序版本检查命令为check_driver="nvidia-smi|grep-i version",其中nvidia-smi是抓取当前GPU信息的指令,grep-iversion是抓区信息里的驱动版本的指令,本发明中,与GPU测试相匹配的显卡驱动的版本为Tesla P40,型号选用367.57。In step S27, the judgment of whether the existing graphics card driver is the driver required for the test is realized according to the version number of the driver program by executing the driver version checking command. Wherein the driver version inspection command is check_driver="nvidia-smi|grep-i version", wherein nvidia-smi is an instruction to grab current GPU information, and grep-iversion is an instruction to grab the driver version in the area information, among the present invention , the version of the graphics card driver matching the GPU test is Tesla P40, and the model is 367.57.
在进行EDPP测试时,对测试节点同时开启压力,使测试节点同时达到最大值,其中压力是GPU单位时间对各种不同大小数据块传输处理的能力。During the EDPP test, the pressure is turned on on the test nodes at the same time, so that the test nodes reach the maximum value at the same time, where the pressure is the ability of the GPU to transmit and process various data blocks of different sizes per unit time.
步骤S3中,对测试过程及结果的记录即通过log文件记录测试结果和GPU的输出信息。In step S3, the recording of the test process and results is to record the test results and the output information of the GPU through a log file.
以上所述只是本发明的优选实施方式,对于本技术领域的普通技术人员来说,在不脱离本发明原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也被视为本发明的保护范围。The above is only a preferred embodiment of the present invention. For those of ordinary skill in the art, without departing from the principle of the present invention, some improvements and modifications can also be made, and these improvements and modifications are also considered as the present invention. protection scope of the invention.
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