[go: up one dir, main page]

CN103792498A - Automatic power supply testing method - Google Patents

Automatic power supply testing method Download PDF

Info

Publication number
CN103792498A
CN103792498A CN201410051504.6A CN201410051504A CN103792498A CN 103792498 A CN103792498 A CN 103792498A CN 201410051504 A CN201410051504 A CN 201410051504A CN 103792498 A CN103792498 A CN 103792498A
Authority
CN
China
Prior art keywords
test
power supply
module
electronic load
multimeter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201410051504.6A
Other languages
Chinese (zh)
Inventor
白文记
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IEIT Systems Co Ltd
Original Assignee
Inspur Electronic Information Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inspur Electronic Information Industry Co Ltd filed Critical Inspur Electronic Information Industry Co Ltd
Priority to CN201410051504.6A priority Critical patent/CN103792498A/en
Publication of CN103792498A publication Critical patent/CN103792498A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

本发明提供一种电源自动测试方法,其实现过程为:首先安装自动测试系统,该自动测试系统包括数字电源、示波器、电子负载、万用表、频谱分析仪、微处理器处理模块、存储模块、MiniUSB模块、键盘输入模块、显示模块,其中数字电源单向连接被测电源和示波器,微处理器处理模块则双向通信连接数字电源、示波器、电子负载、万用表、频谱分析仪、存储模块、MiniUSB模块、键盘输入模块、显示模块,被测的电源则单向连接示波器、电子负载、万用表、频谱分析仪,电子负载单向连接示波器,通过该自动测试系统,自动完成键入测试过程。该一种电源自动测试方法和现有技术相比,具有测试速度快、精度高、可以大大减少工作量和提升工作效率等优点;实用性强,易于推广。

The present invention provides a kind of automatic test method of power supply, and its realization process is: first install automatic test system, and this automatic test system comprises digital power supply, oscilloscope, electronic load, multimeter, spectrum analyzer, microprocessor processing module, storage module, MiniUSB modules, keyboard input modules, and display modules, in which the digital power supply is connected to the power supply under test and the oscilloscope in one direction, and the microprocessor processing module is connected to the digital power supply, oscilloscope, electronic load, multimeter, spectrum analyzer, storage module, MiniUSB module, The keyboard input module, display module, and the power supply under test are one-way connected to the oscilloscope, electronic load, multimeter, and spectrum analyzer, and the electronic load is one-way connected to the oscilloscope. Through the automatic test system, the keying test process is automatically completed. Compared with the prior art, the automatic power supply test method has the advantages of fast test speed, high precision, greatly reduced workload, improved work efficiency, etc.; it has strong practicability and is easy to popularize.

Description

一种电源自动测试方法A kind of automatic test method of power supply

技术领域 technical field

本发明涉及电源技术领域,具体的说是一种电源自动测试方法。 The invention relates to the technical field of power supplies, in particular to a power supply automatic testing method.

背景技术 Background technique

     随着电子产品的大量开发,电源是众多电子产品不可或缺的部分,电源的稳定性测试也是电源工程师必须实施的工作,大量的测试都需要采用分立仪器进行测试,并且由电源工程师不断地设置参数、记录参数和处理数据,工作繁琐而且测试工作量大,特别像服务器这种很复杂的电源系统测试效率显得特别低,所以采用一个实用、满足测试条件并且有效率的电源自动测试系统是非常有必要的。 With the development of a large number of electronic products, the power supply is an indispensable part of many electronic products. The stability test of the power supply is also the work that the power supply engineer must implement. A large number of tests need to be tested with discrete instruments, and the power supply engineer is constantly setting up Parameters, recording parameters and processing data, the work is cumbersome and the test workload is heavy, especially the test efficiency of a very complicated power supply system like a server is particularly low, so it is very important to use a practical, efficient and practical power supply automatic test system Necessary.

目前业界有很多电源自动测试系统,他们有一个共性是都采用非常集成的方案,也就是power supply、示波器、电子负载和处理单元都集成在一块,但是有一个弊端就是测试条件不符合,传统的集成方案由于没有非常权威官方认可,许多的测试条件都是要求用业内最高端最权威的仪器,例如Tektronix、agilent、chroma等顶尖的品牌,每个品牌都有他们的独特而又精通的地方,而这些也成了业界的标准,所以那些集成度高的电源测试系统反而成了他们非专业的一个限制。 At present, there are many power supply automatic test systems in the industry, and they all adopt a very integrated solution, that is, power supply, oscilloscope, electronic load and processing unit are all integrated into one piece, but there is a disadvantage that the test conditions do not meet the traditional test conditions. Since there is no very authoritative official approval for the integration solution, many test conditions require the use of the most high-end and most authoritative instruments in the industry, such as Tektronix, agilent, chroma and other top brands. Each brand has its own unique and proficient place. And these have become the standard of the industry, so those highly integrated power supply test systems have become a limitation of their non-professionals.

    基于此,现提供一种电源自动测试方法,采用微处理器通过GPIB等通讯接口设置并侦测测试参数,测试精度和其他参数上完全符合各个电源测试的要求,特别像完成服务器这种很复杂电源系统测试的工作,很好的解决了自动测试、测试精度、效率这些问题,减少了电源工程师的工作量,极大的提高了测试效率。  Based on this, an automatic power supply test method is now provided, which uses a microprocessor to set and detect test parameters through communication interfaces such as GPIB. The test accuracy and other parameters fully meet the requirements of various power supply tests, especially for such a complicated server. The work of power system testing has solved the problems of automatic testing, testing accuracy and efficiency, reduced the workload of power supply engineers, and greatly improved the testing efficiency. the

发明内容 Contents of the invention

本发明的技术任务是解决现有技术的不足,提供一种测试精度高、测试效率高的电源自动测试方法。 The technical task of the present invention is to solve the deficiencies of the prior art and provide an automatic power supply testing method with high testing precision and high testing efficiency.

本发明的技术方案是按以下方式实现的,该一种电源自动测试方法,其实现过程为: The technical solution of the present invention is realized in the following manner, the automatic testing method of this kind of power supply, its realization process is:

首先安装自动测试系统,该自动测试系统包括数字电源、示波器、电子负载、万用表、频谱分析仪、微处理器处理模块、存储模块、Mini USB模块、键盘输入模块、显示模块,其中数字电源单向连接被测电源和示波器,微处理器处理模块则双向通信连接数字电源、示波器、电子负载、万用表、频谱分析仪、存储模块、Mini USB模块、键盘输入模块、显示模块,被测的电源则单向连接示波器、电子负载、万用表、频谱分析仪,电子负载单向连接示波器; First install the automatic test system, the automatic test system includes digital power supply, oscilloscope, electronic load, multimeter, spectrum analyzer, microprocessor processing module, storage module, Mini USB module, keyboard input module, display module, in which the digital power supply is unidirectional Connect the power supply under test and the oscilloscope, and the microprocessor processing module connects the digital power supply, oscilloscope, electronic load, multimeter, spectrum analyzer, storage module, Mini USB module, keyboard input module, and display module in two-way communication, and the power supply under test One-way connection to oscilloscope, electronic load, multimeter, spectrum analyzer, electronic load one-way connection to oscilloscope;

按电源的测试要求将数字电源、示波器、电子负载、万用表、频谱分析仪自带的GPIB接口正确连接测试系统线路,键盘输入要测试的项目、参数及测试条件,启动自动测试; According to the test requirements of the power supply, connect the GPIB interface of the digital power supply, oscilloscope, electronic load, multimeter, and spectrum analyzer to the test system line correctly, input the items to be tested, parameters and test conditions through the keyboard, and start the automatic test;

测试系统自动通过各个仪器的GPIB接口将各个仪表进行初始化设置,预热后检查是否可以用于测试; The test system automatically initializes each instrument through the GPIB interface of each instrument, and checks whether it can be used for testing after preheating;

检查电源的阻抗输入输出要求,准备测试; Check the impedance input and output requirements of the power supply and prepare for testing;

设置数字电源的输出电压电流和OCP值,检查无误后,按照原来设定的测试项目进行测试,根据测试要求设置电子负载的各个参数,并用相关仪表记录响应的参数,记录完成则进行下一项测试,直到测试完成; Set the output voltage, current and OCP value of the digital power supply. After checking that there is no error, conduct the test according to the original set test items, set the parameters of the electronic load according to the test requirements, and record the corresponding parameters with the relevant instruments. After the record is completed, proceed to the next item. Test until the test is complete;

记录每个参数,并把结果填入事先存储在存储模块里面EXCEL格式的报告,在每个测试步骤用显示模块进行显示测试进度和项目; Record each parameter, and fill the results into the EXCEL format report stored in the storage module in advance, and use the display module to display the test progress and items in each test step;

最后完成测试并通过mimi USB读取存储模块内的完整测试报告并且导出。 Finally, complete the test and read the complete test report in the storage module through mimi USB and export it.

所述微处理器处理模块通过GPIB、RS232或RJ45通讯接口与上述万用表、示波器、频谱分析仪连接通信,其通过CPU或ARM高速芯片实现,对自身、存储模块、显示模块、mimi USB接口模块进行寄存器的初始化配置,通过GPIB对上述测试仪器进行初始化设置,之后进行键盘输入测试项目和参数,继而进行测试,然后将测试的结果记录并自动填入存储模块的报告中。 Described microprocessor processing module is connected and communicated with above-mentioned multimeter, oscilloscope, spectrum analyzer by GPIB, RS232 or RJ45 communication interface, it realizes by CPU or ARM high-speed chip, self, storage module, display module, mimi USB interface module carry out The initialization configuration of the registers is to initialize the above-mentioned test instruments through GPIB, then enter the test items and parameters through the keyboard, and then perform the test, and then record the test results and automatically fill them in the report of the storage module.

本发明与现有技术相比所产生的有益效果是: The beneficial effect that the present invention produces compared with prior art is:

本发明的一种电源自动测试方法利用微处理器和分布式专业测试仪器的GPIO接口来整合各种测试参数,对电源的各种参数进行记录,系统可编程更方便测试,相对于传统的人工仪器测试,该发明具有测试速度快、精度高、可以大大减少工作量和提升工作效率等优点;实用性强,易于推广。 A power automatic test method of the present invention uses a microprocessor and the GPIO interface of a distributed professional test instrument to integrate various test parameters and record various parameters of the power supply. The system is programmable and more convenient for testing. Compared with the traditional manual Instrument testing, the invention has the advantages of fast testing speed, high precision, can greatly reduce workload and improve work efficiency; it has strong practicability and is easy to popularize.

附图说明 Description of drawings

附图1为本发明的自动测试系统结构示意图。 Accompanying drawing 1 is the schematic structural diagram of the automatic test system of the present invention.

具体实施方式 Detailed ways

下面结合附图对本发明的一种电源自动测试方法作以下详细说明。 A power automatic test method of the present invention will be described in detail below in conjunction with the accompanying drawings.

一种电源自动测试方法,其实现过程为: A power supply automatic testing method, the realization process of which is as follows:

如附图1所示,首先安装自动测试系统,该自动测试系统包括数字电源、示波器、电子负载、万用表、频谱分析仪、微处理器处理模块、存储模块、Mini USB模块、键盘输入模块、显示模块,其中数字电源单向连接被测电源和示波器,微处理器处理模块则双向通信连接数字电源、示波器、电子负载、万用表、频谱分析仪、存储模块、Mini USB模块、键盘输入模块、显示模块,被测的电源则单向连接示波器、电子负载、万用表、频谱分析仪,电子负载单向连接示波器。 As shown in Figure 1, first install the automatic test system, the automatic test system includes digital power supply, oscilloscope, electronic load, multimeter, spectrum analyzer, microprocessor processing module, storage module, Mini USB module, keyboard input module, display Module, in which the digital power supply is connected to the power supply under test and the oscilloscope in one direction, and the microprocessor processing module is connected to the digital power supply, oscilloscope, electronic load, multimeter, spectrum analyzer, storage module, Mini USB module, keyboard input module, and display module in two-way communication , the power supply under test is unidirectionally connected to the oscilloscope, electronic load, multimeter, and spectrum analyzer, and the electronic load is unidirectionally connected to the oscilloscope.

在上述技术方案中,高精度数字电源、示波器、电子负载、万用表、频谱分析仪为业界专业顶尖的仪器,其都带有GPIB通讯接口,双向通讯,可以通过指令对其进行仪器初始设置、测试的设置,也可以对仪器侦测到的值通过寄存器来读取。 Among the above technical solutions, the high-precision digital power supply, oscilloscope, electronic load, multimeter, and spectrum analyzer are professional and top-notch instruments in the industry, all of which are equipped with GPIB communication interface and two-way communication, and the initial setting and testing of the instrument can be performed through instructions You can also read the value detected by the instrument through the register.

被测电源为设计好待测的电源,其最基础的有输入输出引脚供测试。 The power supply under test is a designed power supply to be tested, and the most basic one has input and output pins for testing.

微处理器处理模块:通过CPU或ARM等高速芯片实现,最初对自身、存储模块、显示模块、mimi US接口模块进行寄存器的初始化配置,通过GPIB对各个测试仪器进行初始化设置,之后进行键盘输入测试项目和参数,继而进行测试,然后将测试的结果记录并自动填入存储模块的报告中。 Microprocessor processing module: realized by high-speed chips such as CPU or ARM, initial configuration of registers for itself, storage module, display module, and mimi US interface module, initial settings for each test instrument through GPIB, and then keyboard input test Items and parameters, and then tested, and then the test results are recorded and automatically filled in the report of the storage module.

存储模块:由大容量TF卡或存储颗粒组成,对微处理器的编程、初始化信息和测试报告信息进行存储,编程及初始化信息由芯片烧录器进行烧录 ,测试报告信息由PC读取存储实现。 Storage module: It is composed of large-capacity TF card or storage particles, and stores the programming, initialization information and test report information of the microprocessor. The programming and initialization information is burned by the chip programmer, and the test report information is read and stored by the PC. accomplish.

Mini USB模块:用来实现PC对微处理器的编程和测试报告的读取。 Mini USB module: It is used to realize the programming of the microprocessor by the PC and the reading of the test report.

键盘输入模块:此键盘可以对测试项目和参数,测试条件进行输入。 Keyboard input module: This keyboard can input test items, parameters and test conditions.

显示模块:由液晶屏组成,用微处理器控制显示目前进行的测试项目、寄存器返回结果和系统状态等信息。 Display module: It is composed of a liquid crystal screen, which is controlled by a microprocessor to display information such as the current test items, register return results, and system status.

按电源的测试要求将数字电源、示波器、电子负载、万用表、频谱分析仪自带的GPIB接口正确连接测试系统线路,键盘输入要测试的项目、参数及测试条件,启动自动测试。 According to the test requirements of the power supply, connect the digital power supply, oscilloscope, electronic load, multimeter, and spectrum analyzer to the GPIB interface of the test system correctly, input the items to be tested, parameters and test conditions through the keyboard, and start the automatic test.

测试系统自动通过各个仪器的GPIB接口将各个仪表进行初始化设置,预热后检查是否可以用于测试。 The test system automatically initializes each instrument through the GPIB interface of each instrument, and checks whether it can be used for testing after warming up.

检查电源的阻抗输入输出要求,准备测试。 Check the impedance input and output requirements of the power supply and prepare for testing.

设置数字电源的输出电压电流和OCP值,检查无误后,按照原来设定的测试项目进行测试,根据测试要求设置电子负载的各个参数,并用相关仪表记录响应的参数,记录完成则进行下一项测试,直到测试完成。 Set the output voltage, current and OCP value of the digital power supply. After checking that there is no error, conduct the test according to the original set test items, set the parameters of the electronic load according to the test requirements, and record the corresponding parameters with the relevant instruments. After the record is completed, proceed to the next item. Test until the test is complete.

记录每个参数,并把结果填入事先存储在存储模块里面EXCEL格式的报告,在每个测试步骤用显示模块进行显示测试进度和项目。 Record each parameter, and fill the result into the EXCEL format report stored in the storage module in advance, and use the display module to display the test progress and items in each test step.

最后完成测试并通过mimi USB读取存储模块内的完整测试报告并且导出。 Finally, complete the test and read the complete test report in the storage module through mimi USB and export it.

所述微处理器处理模块通过GPIB、RS232或RJ45通讯接口与上述万用表、示波器、频谱分析仪连接通信,其通过CPU或ARM高速芯片实现,对自身、存储模块、显示模块、mimi USB接口模块进行寄存器的初始化配置,通过GPIB对上述测试仪器进行初始化设置,之后进行键盘输入测试项目和参数,继而进行测试,然后将测试的结果记录并自动填入存储模块的报告中。 Described microprocessor processing module is connected and communicated with above-mentioned multimeter, oscilloscope, spectrum analyzer by GPIB, RS232 or RJ45 communication interface, it realizes by CPU or ARM high-speed chip, self, storage module, display module, mimi USB interface module carry out The initialization configuration of the registers is to initialize the above-mentioned test instruments through GPIB, then enter the test items and parameters through the keyboard, and then perform the test, and then record the test results and automatically fill them in the report of the storage module.

本测试系统主要由微处理器和分立的各种测试仪器组成,采用微处理器通过GPIB、RS232或RJ45通讯接口直接设置和读取仪器测量到的参数值,可手动或自动输入测试项目和参数,微处理器自动进行测试并输出测试参数和报告。 The test system is mainly composed of a microprocessor and various discrete test instruments. The microprocessor is used to directly set and read the parameter values measured by the instrument through the GPIB, RS232 or RJ45 communication interface, and the test items and parameters can be input manually or automatically. , the microprocessor automatically tests and outputs test parameters and reports.

以上所述仅为本发明的实施例而已,凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。 The above description is only an embodiment of the present invention, and any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims (2)

1. a power supply automatic detecting method, is characterized in that its implementation procedure is:
First Auto-Test System is installed, this Auto-Test System comprises digital power, oscillograph, electronic load, multimeter, spectrum analyzer, microprocessor processes module, memory module, Mini USB module, keyboard load module, display module, the wherein tested power supply of the unidirectional connection of digital power and oscillograph, microprocessor processes module two-way communication connects digital power, oscillograph, electronic load, multimeter, spectrum analyzer, memory module, Mini USB module, keyboard load module, display module, tested power supply is unidirectional connection oscillograph, electronic load, multimeter, spectrum analyzer, the unidirectional connection oscillograph of electronic load,
Gpib interface exact connect ion test macro circuit digital power, oscillograph, electronic load, multimeter, spectrum analyzer being carried by the test request of power supply, project, parameter and test condition that keyboard input will be tested, start test automatically;
Test macro carries out initialization setting by the gpib interface of each instrument by each instrument automatically, and whether after preheating, check can be for test;
Check the impedance input and output requirement of power supply, setup test;
Output voltage electric current and the OCP value of digital power are set, check errorless after, test according to the test event of original setting, the parameters of electronic load is set according to test request, and by the parameter of correlate meter recording responses, record and carried out the next item down test, until tested;
Record each parameter, and result is inserted to the report that is stored in advance memory module the inside EXCEL form, show testing progress and project at each testing procedure with display module;
Finally complete test and read complete test report and the derivation in memory module by mimi USB.
2. a kind of power supply automatic detecting method according to claim 1, it is characterized in that described microprocessor processes module passes through GPIB, RS232 or RJ45 communication interface and above-mentioned multimeter, oscillograph, spectrum analyzer connects communication, it is realized by CPU or ARM high-speed chip, to self, memory module, display module, mimi usb interface module carries out the initial configuration of register, by GPIB, above-mentioned testing tool is carried out to initialization setting, carry out afterwards keyboard input test project and parameter, then test, then the outcome record of test is also inserted in the report of memory module automatically.
CN201410051504.6A 2014-02-14 2014-02-14 Automatic power supply testing method Pending CN103792498A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410051504.6A CN103792498A (en) 2014-02-14 2014-02-14 Automatic power supply testing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410051504.6A CN103792498A (en) 2014-02-14 2014-02-14 Automatic power supply testing method

Publications (1)

Publication Number Publication Date
CN103792498A true CN103792498A (en) 2014-05-14

Family

ID=50668360

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410051504.6A Pending CN103792498A (en) 2014-02-14 2014-02-14 Automatic power supply testing method

Country Status (1)

Country Link
CN (1) CN103792498A (en)

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104035051A (en) * 2014-06-16 2014-09-10 中国科学院长春光学精密机械与物理研究所 Input voltage step response testing method of DC (Direct Current) power converter
CN104459566A (en) * 2014-12-09 2015-03-25 西京学院 Secondary electric power supply testing system and method
CN104635176A (en) * 2015-01-15 2015-05-20 惠州出入境检验检疫局检验检疫综合技术中心 Energy efficiency detection method of power adapter and system thereof
CN104678328A (en) * 2015-03-26 2015-06-03 石家庄迪龙科技有限公司 Full-automatic comprehensive power supply detector
CN105137364A (en) * 2015-07-23 2015-12-09 浪潮电子信息产业股份有限公司 Automatic test system of switching power supply
CN105242218A (en) * 2015-09-24 2016-01-13 浪潮电子信息产业股份有限公司 A DC power supply full coverage automatic test system
CN105699914A (en) * 2016-01-28 2016-06-22 深圳信泰质量技术有限公司 A power supply product energy efficiency automatic test method
CN105912462A (en) * 2016-04-05 2016-08-31 浪潮电子信息产业股份有限公司 Automatic archiving method and device for test results
CN106353696A (en) * 2016-11-02 2017-01-25 郑州云海信息技术有限公司 Efficiency testing system and method of switching power supply
CN108957355A (en) * 2017-05-17 2018-12-07 特克特朗尼克公司 Pass through the modular power monitoring of the attachment interface of test and sensing device
CN109270376A (en) * 2018-09-30 2019-01-25 上海菱沃铂智能技术有限公司 A kind of microcontroller pin automatically testing parameters platform and test method
CN109975722A (en) * 2019-03-17 2019-07-05 江苏神州半导体科技有限公司 A kind of detection method of radio-frequency power supply
CN111273208A (en) * 2020-03-11 2020-06-12 深圳市金锐显数码科技有限公司 Precision automatic correction method and system based on electronic load
CN113702859A (en) * 2021-07-31 2021-11-26 苏州浪潮智能科技有限公司 Power supply testing device
CN114265766A (en) * 2021-12-03 2022-04-01 湖南炬神电子有限公司 Programmable multifunctional test system and method integrating PD rapid charging protocol
CN114325458A (en) * 2021-12-17 2022-04-12 苏州浪潮智能科技有限公司 Testing method, system, device, equipment and storage medium of switching power supply
CN115792477A (en) * 2023-02-06 2023-03-14 北京京瀚禹电子工程技术有限公司 Automatic test system based on high-precision instrument

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101221226A (en) * 2008-01-24 2008-07-16 中兴通讯股份有限公司 Automatic testing method and apparatus of electric power
CN201322790Y (en) * 2008-12-16 2009-10-07 深圳市实益达科技股份有限公司 Testing device for constant-current power panel
CN101819260A (en) * 2010-03-19 2010-09-01 深圳市东辰科技有限公司 Method and system for controlling power supply test and power supply test method
CN102455414A (en) * 2010-10-18 2012-05-16 台达电子工业股份有限公司 Automatic testing system and method
US20130049794A1 (en) * 2010-04-15 2013-02-28 Atc Logistics & Electronics, Inc. Extended systems and methods for testing power supplies
CN103165201A (en) * 2011-12-14 2013-06-19 中国广东核电集团有限公司 Nuclear power station power supply detection system and method
US20130222007A1 (en) * 2012-02-28 2013-08-29 Zhi-Yong Gao Power supply test system
CN103558562A (en) * 2013-11-07 2014-02-05 浙江中控技术股份有限公司 Testing device and method for power module

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101221226A (en) * 2008-01-24 2008-07-16 中兴通讯股份有限公司 Automatic testing method and apparatus of electric power
CN201322790Y (en) * 2008-12-16 2009-10-07 深圳市实益达科技股份有限公司 Testing device for constant-current power panel
CN101819260A (en) * 2010-03-19 2010-09-01 深圳市东辰科技有限公司 Method and system for controlling power supply test and power supply test method
US20130049794A1 (en) * 2010-04-15 2013-02-28 Atc Logistics & Electronics, Inc. Extended systems and methods for testing power supplies
CN102455414A (en) * 2010-10-18 2012-05-16 台达电子工业股份有限公司 Automatic testing system and method
CN103165201A (en) * 2011-12-14 2013-06-19 中国广东核电集团有限公司 Nuclear power station power supply detection system and method
US20130222007A1 (en) * 2012-02-28 2013-08-29 Zhi-Yong Gao Power supply test system
CN103558562A (en) * 2013-11-07 2014-02-05 浙江中控技术股份有限公司 Testing device and method for power module

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104035051A (en) * 2014-06-16 2014-09-10 中国科学院长春光学精密机械与物理研究所 Input voltage step response testing method of DC (Direct Current) power converter
CN104459566A (en) * 2014-12-09 2015-03-25 西京学院 Secondary electric power supply testing system and method
CN104635176A (en) * 2015-01-15 2015-05-20 惠州出入境检验检疫局检验检疫综合技术中心 Energy efficiency detection method of power adapter and system thereof
CN104678328A (en) * 2015-03-26 2015-06-03 石家庄迪龙科技有限公司 Full-automatic comprehensive power supply detector
CN104678328B (en) * 2015-03-26 2018-01-12 石家庄迪龙科技有限公司 Full-automatic power supply comprehensive detector
CN105137364A (en) * 2015-07-23 2015-12-09 浪潮电子信息产业股份有限公司 Automatic test system of switching power supply
CN105242218A (en) * 2015-09-24 2016-01-13 浪潮电子信息产业股份有限公司 A DC power supply full coverage automatic test system
CN105699914A (en) * 2016-01-28 2016-06-22 深圳信泰质量技术有限公司 A power supply product energy efficiency automatic test method
CN105912462A (en) * 2016-04-05 2016-08-31 浪潮电子信息产业股份有限公司 Automatic archiving method and device for test results
CN106353696A (en) * 2016-11-02 2017-01-25 郑州云海信息技术有限公司 Efficiency testing system and method of switching power supply
CN108957355A (en) * 2017-05-17 2018-12-07 特克特朗尼克公司 Pass through the modular power monitoring of the attachment interface of test and sensing device
CN109270376A (en) * 2018-09-30 2019-01-25 上海菱沃铂智能技术有限公司 A kind of microcontroller pin automatically testing parameters platform and test method
CN109975722A (en) * 2019-03-17 2019-07-05 江苏神州半导体科技有限公司 A kind of detection method of radio-frequency power supply
CN109975722B (en) * 2019-03-17 2021-09-14 江苏神州半导体科技有限公司 Detection method of radio frequency power supply
CN111273208A (en) * 2020-03-11 2020-06-12 深圳市金锐显数码科技有限公司 Precision automatic correction method and system based on electronic load
CN113702859A (en) * 2021-07-31 2021-11-26 苏州浪潮智能科技有限公司 Power supply testing device
CN113702859B (en) * 2021-07-31 2024-05-24 苏州浪潮智能科技有限公司 Power supply testing device
CN114265766A (en) * 2021-12-03 2022-04-01 湖南炬神电子有限公司 Programmable multifunctional test system and method integrating PD rapid charging protocol
CN114325458A (en) * 2021-12-17 2022-04-12 苏州浪潮智能科技有限公司 Testing method, system, device, equipment and storage medium of switching power supply
CN114325458B (en) * 2021-12-17 2024-02-09 苏州浪潮智能科技有限公司 A testing method, system, device, equipment and storage medium for switching power supply
CN115792477A (en) * 2023-02-06 2023-03-14 北京京瀚禹电子工程技术有限公司 Automatic test system based on high-precision instrument

Similar Documents

Publication Publication Date Title
CN103792498A (en) Automatic power supply testing method
CN204832267U (en) A chip testing platform
CN104569794B (en) A kind of FPGA In-circiut testers and method of testing based on boundary-scan architecture
CN102169846B (en) Method for writing multi-dimensional variable password in parallel in process of testing integrated circuit wafer
CN104483622A (en) Single-particle irradiation experiment test system and method based on JTAG (joint test action group) interface
CN101865946B (en) Alternating current parameter testing system and method of programmable digital integrated circuit
CN204789908U (en) Circuit board automatic test system based on labVIEW
CN106226679A (en) For detecting frock and the method for testing thereof of embedded pos payment terminal mainboard
CN101916305A (en) Method for verifying complex pin chip
CN104133187B (en) A kind of system and method thereof detecting intelligent electric energy meter
CN202939275U (en) Wafer IC test equipment
CN106199484A (en) Mainboard error of time of day automatic debugging system
CN204129151U (en) Testing touch screen machine
CN105280243A (en) FPGA-based NOR Flash anti-radiation performance test system
CN202916406U (en) Welding spot detecting system based on boundary scan
CN106200623B (en) The semi-physical simulation test device of reactor core measuring system logic module
CN204731379U (en) A kind of SOC chip measurement equipment
CN204269773U (en) Automatic aging test device for integrated circuit chips
CN104569594A (en) Automatic missile resistance testing system
CN209248512U (en) Multichannel flash chip test device
CN108196211A (en) A kind of number table automatic verification system
CN115856750A (en) Device and method for quickly calibrating SOC (System on chip) test system
CN205942434U (en) Reactor core measurement system logic modules's semi -physical simulation testing arrangement
CN204495284U (en) A kind of infrared ray drilling tool length measuring instrument
CN201926737U (en) Universal digital integrated circuit test instrument

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20140514