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CN103712781B - The multiple angles of incidence polarization interference measurement mechanism of birefringent wedge optical axis direction and method - Google Patents

The multiple angles of incidence polarization interference measurement mechanism of birefringent wedge optical axis direction and method Download PDF

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CN103712781B
CN103712781B CN201310746711.9A CN201310746711A CN103712781B CN 103712781 B CN103712781 B CN 103712781B CN 201310746711 A CN201310746711 A CN 201310746711A CN 103712781 B CN103712781 B CN 103712781B
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birefringent wedge
polarization interference
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CN103712781A (en
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刘铁根
江俊峰
刘琨
尹金德
邹盛亮
王双
秦尊琪
吴振海
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Abstract

本发明公开了一种双折射光楔光轴方向的多入射角偏振干涉测量装置及方法,该装置包括激光光源(1)、光衰减器(2)、扩束镜(3)、起偏器(4)、双折射光楔(5)、样品测试台(6)、检偏器(7)、面阵探测器(8)以及信号处理系统(9)。与现有技术相比,通过采集三幅不同入射角度下的偏振干涉图,可以快速地实现双折射光楔光轴的三维方向测量,克服了以往没有双折射光楔光轴测量系统和方法的难题;可以通过增加入射角度调整的个数来进一步提高测量精度;同样适合传统的入射平面和出射平面平行的双折射试件,并且误差范围小,保证测量精度,因此适应面广。

The invention discloses a device and method for multi-incident angle polarization interferometry in the direction of the optical axis of a birefringent optical wedge. The device includes a laser light source (1), an optical attenuator (2), a beam expander (3), and a polarizer (4), birefringence wedge (5), sample test bench (6), analyzer (7), area array detector (8) and signal processing system (9). Compared with the existing technology, by collecting three polarization interferograms under different incident angles, the three-dimensional direction measurement of the optical axis of the birefringent wedge can be quickly realized, which overcomes the lack of systems and methods for measuring the optical axis of the birefringent wedge in the past. Difficulties; the measurement accuracy can be further improved by increasing the number of incident angle adjustments; it is also suitable for traditional birefringent specimens with parallel incident planes and exit planes, and the error range is small to ensure measurement accuracy, so it is widely applicable.

Description

双折射光楔光轴方向的多入射角偏振干涉测量装置及方法Multi-incident angle polarization interferometry device and method for birefringent wedge optical axis direction

技术领域technical field

本发明涉及双折射晶体参数检测领域,特别是涉及一种双折射光楔光轴方向的多入射角偏振干涉测量装置。The invention relates to the field of birefringent crystal parameter detection, in particular to a multi-incident angle polarization interferometry device in the optical axis direction of a birefringent light wedge.

背景技术Background technique

晶体光轴是晶体的重要光学参数,其相对于晶体器件入射表面的三维方向的不同会影响晶体器件性能,因此对晶体光轴三维方向的检测技术显得非常重要。The optical axis of the crystal is an important optical parameter of the crystal. The difference in the three-dimensional direction relative to the incident surface of the crystal device will affect the performance of the crystal device. Therefore, the detection technology for the three-dimensional direction of the crystal optical axis is very important.

目前在确定晶体光轴方向上已经存在一些测量方法。M.Laue(FriedrichW,KnippingP,LaueM.Interferenceappearancesinx-rays[J].Ann.Phys.(Berlin),1913,41:971-988.)提出的晶体光轴方向X射线衍射法,测量精度高,但方法复杂,且需要预先知道该晶体的结构参数以及晶面与衍射峰的对应关系;张艺等(张艺,沈为民.单轴晶体锥光干涉的理论与实验研究[J].浙江大学学报(理学报),2005,32(4):403-406.)利用晶体的偏光干涉图确定晶体光轴方向,晶体偏光干涉图通过偏光显微镜来采集,根据光轴出露点(即晶体中平行于光轴方向的折射光线在干涉图中对应的点,也就是黑十字交点)相对于视域中心的位置来测量出光轴方向;D.Su(SuDC,HsuCC.Methodfordeterminingtheopticalaxisand(no,ne)ofabirefringentcrystal[J].Appliedoptics,2002,41(19):3936-3940.)等采用一种共光路干涉型外差法来测定光轴方向;段存丽等(段存丽,韩军,路绍军,等.基于惠更斯原理确定单轴晶体光轴方向的新方法研究[J].光学仪器,2008,30(4):55-59.)采用惠更斯原理分析光波传播方向,依据光轴与晶体表面法线的关系式,实现晶体光轴方向的测量;沈为民等(沈为民,李卫涛,李群,等.CCD图像法测量晶体光轴方向[J].半导体光电,2006,27(4):485-488.)判定晶体表面法线进行光轴方向的测量;邢进华等(邢进华.用布儒斯特角法同时测定单轴晶体的折射率和光轴方向[J].大学物理,2004,23(6):49-50.)通过测定晶体样品三个表面的布儒斯特角来确定单轴晶体的光轴方向。There are already some measurement methods for determining the direction of the crystal optical axis. M.Laue (FriedrichW, KnippingP, LaueM.Interferenceappearancesinx-rays[J].Ann.Phys.(Berlin), 1913,41:971-988.) Proposed crystal optical axis direction X-ray diffraction method, the measurement accuracy is high, but The method is complicated, and it is necessary to know the structural parameters of the crystal and the corresponding relationship between the crystal plane and the diffraction peak; Zhang Yi et al. (Zhang Yi, Shen Weimin. Theoretical and experimental research on uniaxial crystal conoscopic interference[J]. Acta Scientia Sinica), 2005,32(4):403-406.) Use the polarized light interferogram of the crystal to determine the direction of the crystal optical axis. The crystal polarized light interferogram is collected by a polarizing microscope. The corresponding point of the refracted light in the interferogram in the axial direction, that is, the black cross intersection) is used to measure the optical axis direction relative to the center of the field of view; D.Su (SuDC, HsuCC.Method for determining the optical axis and (no, ne) of abirefringent crystal[J] .Appliedoptics, 2002, 41(19): 3936-3940.) etc. used a common optical path interference heterodyne method to measure the direction of the optical axis; Duan Cunli et al. (Duan Cunli, Han Jun, Lu Shaojun, etc. Principle research on a new method to determine the direction of the optical axis of a uniaxial crystal [J]. Optical Instruments, 2008, 30(4): 55-59.) Using the Huygens principle to analyze the direction of light wave propagation, according to the relationship between the optical axis and the normal of the crystal surface Relational formula to realize the measurement of the optical axis direction of the crystal; Shen Weimin et al. Determining the normal line of the crystal surface to measure the direction of the optical axis; Xing Jinhua et al. -50.) Determine the direction of the optical axis of a uniaxial crystal by measuring the Brewster's angles on three surfaces of the crystal sample.

上述方法通常是对加工成标准试件的光轴方向测量,要求试件的入射面和出射面相互平行以保证o光与e光两出射光出射方向相互平行,且要求试件o光与e光有大的折射率差。而双折射光楔的入射面和出射面存在夹角,这导致两出射光(o光与e光)不平行,并且两束光折射率差较小,不易区分开,这都对双折射光楔光轴三维方向的测量带来困难。本发明旨在克服上述困难,实现对双折射光楔光轴的三维方向精确测量。The above method is usually to measure the direction of the optical axis of the standard test piece. It is required that the incident surface and the outgoing surface of the test piece are parallel to each other to ensure that the two outgoing directions of the o light and the e light are parallel to each other, and the o light and the e light of the test piece are required to be parallel to each other. Light has a large refractive index difference. However, there is an angle between the incident surface and the exit surface of the birefringent wedge, which causes the two outgoing lights (o light and e light) to be non-parallel, and the difference in refractive index between the two beams of light is small, and it is difficult to distinguish them. The measurement of the three-dimensional direction of the wedge optical axis brings difficulties. The present invention aims to overcome the above-mentioned difficulties and realize the precise measurement of the three-dimensional direction of the optical axis of the birefringence wedge.

发明内容Contents of the invention

为了克服现有技术存在的问题,本发明针对以上不足,提出了双折射光楔光轴方向的多入射角偏振干涉测量装置及方法,用于双折射光楔光轴的三维方向的测量,同时也能用于其他双折射器件的光轴方位测量。In order to overcome the problems existing in the prior art, the present invention aims at the above deficiencies, and proposes a multi-incident angle polarization interferometry device and method in the direction of the optical axis of the birefringent optical wedge, which is used for the measurement of the three-dimensional direction of the optical axis of the birefringent optical wedge, and at the same time It can also be used to measure the optical axis orientation of other birefringent devices.

本发明提出了一种双折射光楔光轴方向的多入射角偏振干涉测量装置,该装置包括激光光源(1)、光衰减器(2)、扩束镜(3)、起偏器(4)、双折射光楔(5)、样品测试台(6)、检偏器(7)、面阵探测器(8)以及信号处理系统(9)其中:The invention proposes a multi-incident angle polarization interferometry device in the direction of the optical axis of a birefringent wedge, which includes a laser light source (1), an optical attenuator (2), a beam expander (3), and a polarizer (4 ), birefringent wedge (5), sample test bench (6), analyzer (7), area array detector (8) and signal processing system (9) where:

激光光源(1),用于提供该装置的输入光源,采用空间相干性好的可见光波段激光器,包括He-Ne激光器和半导体激光器;The laser light source (1) is used to provide the input light source of the device, using visible light band lasers with good spatial coherence, including He-Ne lasers and semiconductor lasers;

光衰减器(2),用于降低激光能量,控制激光光源功率稳定,避免面阵探测器饱和;The optical attenuator (2) is used to reduce the laser energy, control the power of the laser light source to be stable, and avoid saturation of the area array detector;

扩束镜(3),用于激光扩束,保证激光光源平行出射,获得覆盖双折射光楔横向尺寸的空间相干激光光斑;The beam expander (3) is used for laser beam expansion to ensure that the laser light source exits in parallel to obtain a spatially coherent laser spot covering the transverse dimension of the birefringent wedge;

起偏器(4),用于激光光束起偏,透光轴方向与水平基准成45°;The polarizer (4) is used for polarizing the laser beam, and the direction of the light transmission axis is 45° to the horizontal reference;

样品测试台(6),用于放置待测的双折射光楔(5)和控制双折射光楔入射角,测试台可围绕与放置其平面垂直的轴旋转,实现至少三种不同角度入射至双折射光楔表面产生偏振干涉;The sample test table (6) is used to place the birefringent light wedge (5) to be tested and to control the incident angle of the birefringent light wedge. Birefringent wedge surface produces polarization interference;

检偏器(7),用于实现偏振干涉,透光轴方向与水平基准成45°,同时与起偏器相垂直或平行;The analyzer (7) is used to realize polarization interference, and the direction of the light transmission axis is 45° to the horizontal reference, and is perpendicular or parallel to the polarizer at the same time;

面阵探测器(8),包括CCD和CMOS探测器,用于接收偏振干涉图信号;以及An area array detector (8), including a CCD and a CMOS detector, is used to receive polarization interferogram signals; and

信号处理系统(9),包括图像采集卡和计算机,用于采集偏振干涉图信号,计算机根据测量算法进行处理,计算出双折射光楔光轴三维方向;The signal processing system (9), including an image acquisition card and a computer, is used to collect the polarization interferogram signal, and the computer processes it according to the measurement algorithm to calculate the three-dimensional direction of the optical axis of the birefringent wedge;

激光光源(1)输出激光平行入射,经光衰减器(2)降低激光能量时,控制激光功率稳定避免探测器饱和;扩束镜(3)对激光进行扩束,获得覆盖双折射光楔横向尺寸的空间相干激光光斑,经偏振器(4)起偏,透光轴方向与水平基准成45°,在样品测试台(6)上放置被测双折射光楔5,通过调节样品测试台(6),旋转双折射光楔(5),从而实现不同角度入射光楔表面产生偏振干涉,通过双折射光楔(5)后的光束在检偏器(7)后实现偏振光干涉,采用面阵探测器(8)接收偏振干涉图并传入到信号处理系统9中。The laser light source (1) outputs the laser beam in parallel, and when the laser energy is reduced by the optical attenuator (2), the laser power is controlled to be stable to avoid detector saturation; the beam expander (3) expands the laser beam to obtain a lateral coverage of the birefringent wedge The spatially coherent laser spot of the size is polarized by the polarizer (4), and the direction of the light transmission axis is 45° to the horizontal reference. The birefringent wedge 5 to be tested is placed on the sample test platform (6). By adjusting the sample test platform ( 6), rotate the birefringent wedge (5), so as to realize polarization interference on the surface of the incident wedge at different angles, and the beam passing through the birefringent wedge (5) realizes polarized light interference after the analyzer (7). The array detector (8) receives the polarization interferogram and transmits it to the signal processing system 9.

本发明还提出了一种双折射光楔光轴方向的多入射角偏振干涉测量方法,该方法包括以下步骤:The present invention also proposes a multi-incident angle polarization interferometry method in the optical axis direction of a birefringent optical wedge, the method comprising the following steps:

激光光源(1)输出激光平行入射,经光衰减器(2)降低激光能量时,控制激光功率稳定避免探测器饱和;扩束镜(3)对激光进行扩束,获得覆盖双折射光楔横向尺寸的空间相干激光光斑,经偏振器(4)起偏,透光轴方向与水平基准成45°,在样品测试台(6)上放置被测双折射光楔(5),通过调节样品测试台(6),旋转双折射光楔(5),从而实现不同角度入射光楔表面产生偏振干涉,通过双折射光楔(5)后的光束在检偏器(7)后实现偏振光干涉,采用面阵探测器(8)接收偏振干涉图并传入到信号处理系统(9)中;在每一个入射角下,记录一幅偏振干涉图,当采集得到三个不同入射角的偏振干涉图,在信号处理系统(9)中对偏振干涉信号进行灰度变换和hough变换处理,提取偏振干涉图的亮条纹,计算出干涉条纹间距,通过三个角度入射构成的联立光程差方程组,求解出双折射光楔光轴的三维方向;The laser light source (1) outputs the laser beam in parallel, and when the laser energy is reduced by the optical attenuator (2), the laser power is controlled to be stable to avoid detector saturation; the beam expander (3) expands the laser beam to obtain a lateral coverage of the birefringent wedge The spatially coherent laser spot of the size is polarized by the polarizer (4), and the direction of the light transmission axis is 45° to the horizontal reference. The birefringent wedge (5) to be tested is placed on the sample test platform (6), and the sample is tested by adjusting the The stage (6) rotates the birefringent wedge (5), so as to realize polarization interference on the surface of the incident wedge at different angles, and the beam passing through the birefringent wedge (5) realizes polarization interference after the analyzer (7), The polarization interferogram is received by the area array detector (8) and transmitted to the signal processing system (9); at each incident angle, a polarization interferogram is recorded, and when three polarization interferograms at different incident angles are collected , in the signal processing system (9), the polarization interference signal is processed by grayscale transformation and hough transformation, the bright fringes of the polarization interferogram are extracted, the interference fringe spacing is calculated, and the simultaneous optical path difference equations composed of three incident angles , to solve the three-dimensional direction of the optical axis of the birefringent wedge;

所述双折射光楔通过三个角度入射构成联立光程差方程组的过程如下:The process of forming the simultaneous optical path difference equations through three incident angles of the birefringent wedge is as follows:

建立相邻亮条纹间距h与晶体楔面厚度t对应关系式:Establish the corresponding relationship between the adjacent bright fringe spacing h and the crystal wedge thickness t:

偏振干涉中相邻亮条纹光程差δΔ=λ,从而得到偏振干涉光相邻条纹光程差δΔ公式:The optical path difference of adjacent bright fringes in polarization interference δΔ=λ, thus the formula of optical path difference δΔ between adjacent fringes of polarized interference light is obtained:

δΔδΔ == δdδd ·· nno rere -- sinsin θθ (( δxδx ee -- δzδz ee tanthe tan θθ roro )) -- nno oo δzδz ee coscos θθ roro == λλ -- -- -- (( 11 ))

式(1)中,θ为入射角度,nre为e光光线在其传播方向上的折射率;θro为o光光线与晶体表面法线的夹角;δd为相邻e光在双折射光楔中传播的路程差;δxe为相邻e光在x轴方向上的传播路程差;δze为相邻e光在z轴方向上的传播路程差;In formula (1), θ is the incident angle, n re is the refractive index of the e-ray in its propagation direction; θ ro is the angle between the o-ray and the normal of the crystal surface; δd is the birefringence of the adjacent e-ray The path difference propagated in the optical wedge; δx e is the propagation path difference of adjacent e light in the x-axis direction; δz e is the propagation path difference of adjacent e light in the z-axis direction;

当入射角θ不变时,nre、θro不变,只有δd、δxe、δze改变。When the incident angle θ remains unchanged, n re and θ ro remain unchanged, and only δd, δx e and δz e change.

选取0°、30°、45°三个不同入射角,得到方程组:Select three different incident angles of 0°, 30°, and 45° to obtain the equations:

δΔδΔ 11 == δdδd 11 ·· nno rere 11 -- δxδx ee 11 -- nno oo δzδz ee 11 == λλ δΔδΔ 22 == δdδd 22 ·· nno rere 22 -- 11 22 (( δxδx ee 22 -- 0.390.39 δzδz ee 22 )) -- nno 00 δzδz ee 22 == λλ δΔδΔ 33 == δdδd 33 ·· nno rere 33 -- 22 22 (( δxδx ee 33 -- 0.5140.514 δzδz ee 33 )) -- nno oo δzδz ee 33 == λλ -- -- -- (( 22 ))

and

式(3)中,分别为楔面与x、y、z轴的的夹角,α、β、γ为双折射光楔光轴与x、y、z轴的的夹角,θke为e光光波矢量与晶体表面法线的夹角,M1、M2为相应的系数。In formula (3), are the angles between the wedge plane and the x, y, z axes respectively, α, β, γ are the angles between the birefringent wedge optical axis and the x, y, z axes, θ ke is the e-ray light wave vector and the crystal surface For the included angle of the normal line, M 1 and M 2 are the corresponding coefficients.

与现有技术相比,本发明具有如下积极效果:Compared with the prior art, the present invention has the following positive effects:

1.提出了双折射光楔光轴方向的多入射角偏振干涉测量装置及方法,通过采集三幅不同入射角度下的偏振干涉图,可以快速地实现双折射光楔光轴的三维方向测量,克服了以往没有双折射光楔光轴测量系统和方法的难题;1. A multi-incident angle polarization interferometry device and method for the direction of the optical axis of the birefringent wedge is proposed. By collecting three polarization interferograms at different incident angles, the three-dimensional direction measurement of the optical axis of the birefringent wedge can be quickly realized. Overcome the problem of no birefringent wedge optical axis measurement system and method in the past;

2.提出了双折射光楔光轴方向的多入射角偏振干涉测量装置及方法,可以通过增加入射角度调整的个数来进一步提高测量精度;2. Proposed a multi-incident angle polarization interferometry device and method in the direction of the birefringent wedge optical axis, which can further improve the measurement accuracy by increasing the number of incident angle adjustments;

3.提出的测量装置及方法同样适合传统的入射平面和出射平面平行的双折射试件,因此适应面广。3. The proposed measurement device and method are also suitable for the traditional birefringent specimens whose incident plane and exit plane are parallel, so it can be widely used.

附图说明Description of drawings

图1是本发明中双折射光楔光轴方向的测量系统示意图;Fig. 1 is the schematic diagram of the measurement system of the optical axis direction of the birefringent optical wedge in the present invention;

图2是采集偏振干涉与还原偏振干涉对比图;Figure 2 is a comparison diagram of acquisition polarization interference and restoration polarization interference;

图3是经双折射光楔后产生偏振干涉的偏振方向示意图;Fig. 3 is a schematic diagram of the polarization direction of the polarization interference produced by the birefringent optical wedge;

图4是双光束干涉强度分布对比示意图;Figure 4 is a schematic diagram of the comparison of the two-beam interference intensity distribution;

图中,1、He-Ne激光器,2、光衰减器,3、扩束镜,4、起偏器,5、双折射光楔,6、样品测试台,7、检偏器,8、面阵探测器,9、信号处理系统,10采集偏振干涉图,11、还原偏振干涉图,12、起偏器透光轴方向,13、双折射光楔光轴方向,14、检偏器透光轴方向,15、入射光楔后o光振幅,16、o光通过检偏器的投影振幅,17、入射光的振幅,18、入射光楔后e光振幅,19、e光通过检偏器的投影振幅,20、双折射光楔光轴偏离y轴的角度,21、两偏振器会聚相交点坐标原点,22、起偏器光轴方向与坐标轴x之间的夹角,23、检偏器光轴方向与坐标轴x之间的夹角,24偏振干涉归一化强度变化量ΔI,25、低相干干涉条纹峰值对应的光楔位置的变化量Δx。In the figure, 1. He-Ne laser, 2. Optical attenuator, 3. Beam expander, 4. Polarizer, 5. Birefringent wedge, 6. Sample test bench, 7. Analyzer, 8. Surface Array detector, 9. Signal processing system, 10 Collect polarization interferogram, 11, Restore polarization interferogram, 12, Polarizer light transmission axis direction, 13, Birefringence wedge optical axis direction, 14, Analyzer light transmission Axial direction, 15, amplitude of o light after incident light wedge, 16, projection amplitude of o light passing through analyzer, 17, amplitude of incident light, 18, amplitude of e light after incident light wedge, 19, e light passing through analyzer 20, the angle of the optical axis of the birefringent wedge from the y-axis, 21, the origin of the coordinates of the intersection point of the two polarizers, 22, the angle between the direction of the optical axis of the polarizer and the coordinate axis x, 23, the detector Angle between polarizer optical axis direction and coordinate axis x, 24 polarization interference normalized intensity variation ΔI, 25, variation Δx of optical wedge position corresponding to low coherence interference fringe peak.

具体实施方式detailed description

下面结合附图和实施例,进一步详细说明本发明的具体实施方式。The specific implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings and examples.

实施例1:双折射光楔光轴方向的多入射角偏振干涉测量装置及方法实施过程Embodiment 1: Implementation process of multi-incident angle polarization interferometry device and method in the direction of birefringent wedge optical axis

如图1所示,本发明采取多入射角偏振干涉图实现双折射光楔光轴方向的测量,测量装置由激光光源(1)、光衰减器(2)、扩束镜(3)、起偏器(4)、样品测试台(6)、检偏器(7)、面阵探测器(8)以及信号处理系统(9)组成。As shown in Figure 1, the present invention adopts multi-incident angle polarization interferogram to realize the measurement of the direction of the optical axis of the birefringent wedge. The measuring device consists of a laser light source (1), an optical attenuator (2), a beam expander (3), and Polarizer (4), sample test bench (6), analyzer (7), area detector (8) and signal processing system (9).

He-Ne激光器(1)输出激光,平行入射经光衰减器(2)降低激光能量时,控制激光功率稳定避免探测器饱和;扩束镜(3)对激光进行扩束,获得覆盖双折射光楔横向尺寸的空间相干激光光斑,经偏振器(4)起偏,偏振方向与水平方向成45°,在样品测试台(6)上放置被测双折射光楔(5),通过调节样品测试台,旋转双折射光楔从而实现不同角度入射至光楔表面产生偏振干涉,通过双折射光楔后的光束在检偏器(7)后实现偏振光干涉,采用面阵探测器(8)接收偏振干涉图并传入到信号处理系统(9)中,每一个入射角下,记录一幅偏振干涉图,当采集得到三个不同入射角的偏振干涉图,在信号处理系统中对偏振干涉信号进行灰度变换和hough变换处理,提取偏振干涉图的亮条纹,计算出干涉图条纹间距,通过三个角度入射构成的联立光程差方程组,求解出双折射光楔光轴的三维方向。He-Ne laser (1) outputs laser light, and when the laser energy is reduced through the optical attenuator (2) in parallel, the laser power is controlled to be stable to avoid detector saturation; the beam expander (3) expands the laser beam to obtain covered birefringent light The spatially coherent laser spot of wedge lateral size is polarized by the polarizer (4), and the polarization direction is 45° to the horizontal direction. The measured birefringence wedge (5) is placed on the sample test platform (6). By adjusting the sample test The birefringent wedge is rotated to achieve polarization interference on the surface of the wedge at different angles, and the beam passing through the birefringent wedge achieves polarization interference after the analyzer (7), and is received by an area array detector (8) The polarization interferogram is transmitted to the signal processing system (9). Under each incident angle, a polarization interferogram is recorded. When three polarization interferograms with different incident angles are collected, the polarization interference signal is processed in the signal processing system. Perform grayscale transformation and hough transformation processing to extract the bright fringes of the polarization interferogram, calculate the fringe spacing of the interferogram, and solve the three-dimensional direction of the optical axis of the birefringent wedge through the simultaneous optical path difference equations composed of three incident angles .

实施例2:偏振干涉图条纹间距提取过程具体实施方案Example 2: Specific implementation of the fringe spacing extraction process of the polarization interferogram

采取0°、30°、45°三个不同角度入射到双折射光楔表面,通过面阵探测器(8)采集偏振干涉信号,提取干涉图条纹间距。提取过程为:首先对偏振干涉图进行灰度变换,获取灰度图;再对灰度图进行hough变换,提取偏振干涉图的亮条纹。hough变换后读取亮条纹数N之间的像素值差p=p1-p2,根据面阵探测器每个像素大小ε,计算出干涉条纹间距为h=ε·p/N=ε·(p1-p2)/N。Three different angles of 0°, 30°, and 45° are incident on the surface of the birefringent wedge, and the polarization interference signal is collected by the area array detector (8) to extract the interferogram fringe spacing. The extraction process is as follows: firstly, the grayscale transformation is performed on the polarization interferogram to obtain the grayscale image; then the hough transformation is performed on the grayscale image to extract the bright fringes of the polarization interferogram. After hough transformation, read the pixel value difference p=p1-p2 between the number of bright fringes N. According to the size ε of each pixel of the area array detector, the interference fringe spacing is calculated as h=ε·p/N=ε·(p 1 -p 2 )/N.

实施例3::双折射光楔光轴方向求解的具体过程Example 3: The specific process of solving the direction of the optical axis of the birefringent wedge

干涉条纹间距提取后,理论分析不同角度入射光程差的表达式,相邻亮条纹间距h与晶体楔面厚度差t对应关系式为而相邻亮条纹光程差为δΔ=λ;因此偏振干涉信号相邻条纹光程差公式为:After the interference fringe spacing is extracted, theoretically analyze the expression of the incident optical path difference at different angles. The corresponding relationship between the adjacent bright fringe spacing h and the crystal wedge thickness difference t is as follows: The optical path difference between adjacent bright fringes is δΔ=λ; therefore, the formula for the optical path difference between adjacent fringes of the polarization interference signal is:

δΔδΔ == δdδd ·&Center Dot; nno rere -- sinsin θθ (( δxδx ee -- δzδz ee tanthe tan θθ roro )) -- nno oo δzδz ee coscos θθ roro == λλ -- -- -- (( 11 ))

式中,θ为入射角度,nre为e光光线在其传播方向上的折射率;θro为o光光线与晶体表面法线的夹角;δd为相邻e光在双折射光楔中传播的路程差;δxe为相邻e光在x轴方向上的传播路程差;δze相邻e光在z轴方向上的传播路程差;In the formula, θ is the incident angle, n re is the refractive index of the e-ray in its propagation direction; θ ro is the angle between the o-ray and the normal of the crystal surface; δd is the birefringent wedge of the adjacent e-ray Propagation path difference; δx e is the propagation path difference of adjacent e light in the x-axis direction; δz e is the propagation path difference of adjacent e light in the z-axis direction;

当入射角θ不变时,nre、θro不变,只有δd、δxe、δze改变。When the incident angle θ remains unchanged, n re and θ ro remain unchanged, and only δd, δx e and δz e change.

选取0°、30°、45°三个不同入射角,得到方程组:Select three different incident angles of 0°, 30°, and 45° to obtain the equations:

δΔδΔ 11 == δdδd 11 ·&Center Dot; nno rere 11 -- δxδx ee 11 -- nno oo δzδz ee 11 == λλ δΔδΔ 22 == δdδd 22 ·&Center Dot; nno rere 22 -- 11 22 (( δxδx ee 22 -- 0.390.39 δzδz ee 22 )) -- nno 00 δzδz ee 22 == λλ δΔδΔ 33 == δdδd 33 ·&Center Dot; nno rere 33 -- 22 22 (( δxδx ee 33 -- 0.5140.514 δzδz ee 33 )) -- nno oo δzδz ee 33 == λλ -- -- -- (( 22 ))

and

式(3)中,分别为楔面与x、y、z轴的的夹角,α、β、γ为双折射光楔光轴与x、y、z轴的的夹角,θke为e光光波矢量与晶体表面法线的夹角,M1、M2为相应的系数。In formula (3), are the angles between the wedge plane and the x, y, z axes respectively, α, β, γ are the angles between the birefringent wedge optical axis and the x, y, z axes, θ ke is the e-ray light wave vector and the crystal surface The included angle of the normal line, M 1 and M 2 are the corresponding coefficients.

求解方程组得到方程组的解,即双折射光楔光轴三维方向角度(α、β、γ)。Solve the equations to obtain the solution of the equations, that is, the three-dimensional direction angles (α, β, γ) of the optical axis of the birefringent wedge.

和理想光轴方向进行对比,光轴方向角度误差控制在0.5°内,保证了测量精度。图3为采集偏振干涉与还原偏振干涉对比示意图。其中还原偏振干涉通过求解得到的光轴三维方向角度α、β、γ代入到光程差δΔ的表达式中,依据o光和e光在传播过程中的光程差,得到还原偏振干涉光光强度分布,并与采集偏振干涉对比,表明测量误差范围小,保证了测量精度。Compared with the ideal optical axis direction, the angle error of the optical axis direction is controlled within 0.5°, which ensures the measurement accuracy. Fig. 3 is a schematic diagram of a comparison between acquisition polarization interference and restoration polarization interference. Among them, the three-dimensional direction angles α, β, and γ of the optical axis obtained by the restoration polarization interference are substituted into the expression of the optical path difference δΔ, and the restoration polarization interference light is obtained according to the optical path difference between the o light and the e light during the propagation process The intensity distribution is compared with the acquisition polarization interference, which shows that the measurement error range is small and the measurement accuracy is guaranteed.

实施例4:对压力解调系统影响分析Example 4: Analysis of the impact on the pressure demodulation system

实际情况中,光轴方向不是理想情况(平行于y轴方向)时,会出现一定的偏转角度β,此时偏振光干涉图如图4所示。In actual situations, when the direction of the optical axis is not ideal (parallel to the y-axis direction), there will be a certain deflection angle β. At this time, the polarized light interference diagram is shown in Figure 4.

此时得到e光与o光在检偏器上的投影振幅其中干涉强度为:At this time, the projected amplitude of e light and o light on the analyzer is obtained and where the interference strength is:

II == || EE. ^^ ′′ ++ EE. ^^ ′′ ′′ || 22 == || EE. ^^ ′′ || 22 ++ || EE. ^^ ′′ ′′ || 22 ++ 22 EE. ^^ ′′ ** EE. ^^ ′′ ′′ == aa 22 ·&Center Dot; sinsin 22 22 ββ ++ aa 22 ·&Center Dot; cc osos 22 22 ββ ·&Center Dot; [[ 11 22 (( 11 -- coscos 22 ππ λλ ΔΔ )) ]] -- -- -- (( 44 ))

相关参数如下:β=0.4°The relevant parameters are as follows: β=0.4°

中心波长:λ0=580nm,ν0=5.1724×1014HzCentral wavelength: λ 0 =580nm, ν 0 =5.1724×10 14 Hz

带宽对应波长为:λ1=530nm,λ2=633nm,Δν=0.92167×1014HzThe wavelength corresponding to the bandwidth is: λ 1 =530nm, λ 2 =633nm, Δν=0.92167×10 14 Hz

光楔参数:楔角长L=25mm,宽d1=3mm,d2=6.51mmOptical wedge parameters: wedge angle Length L=25mm, width d 1 =3mm, d 2 =6.51mm

仅考虑双光束干涉中互相干干涉部分实际与理想情况的对比,得到两情况下通过面阵探测器接收到的干涉光强图,归一化之后如图4所示。Only considering the comparison between the actual and ideal conditions of the mutually coherent interference part in the two-beam interference, the interference light intensity diagram received by the area array detector under the two conditions is obtained, which is shown in Figure 4 after normalization.

其中,互相干干涉条纹峰值对应的光楔位置的变化量Δx25:Among them, the change amount Δx25 of the wedge position corresponding to the peak value of the mutual interference fringes:

ΔxΔx == 22 ll ·&Center Dot; (( 11 kk -- 11 kk ′′ )) == 0.7760.776 μmμm -- -- -- (( 55 ))

式(5)中,l为对应腔长长度,理想情况下系数实际情况k′与偏离角度有光。In formula (5), l is the corresponding cavity length, ideally the coefficient The actual situation k' has light with the deviation angle.

互相干干涉峰值对应强度变化量ΔI24:Corresponding intensity variation ΔI24 of mutual interference peak:

ΔIΔI == 11 22 -- 11 22 ·&Center Dot; nno mm == 11 22 (( 11 -- SS )) == 1.99961.9996 ×× 1010 -- 44 -- -- -- (( 66 ))

式(6)中, m = sin 2 2 β + 1 2 cos 2 2 β , n = 1 2 cos 2 2 β , S为双光束干涉条纹的灵敏度。根据分析,互相干干涉条纹峰值对应的光楔位置的变化量与峰值对应强度变化量均较小,因此当偏离角β范围控制在0.5°以内时,可忽略其对双折射光楔解调的影响,在压力解调系统中可以不加以考虑。In formula (6), m = sin 2 2 β + 1 2 cos 2 2 β , no = 1 2 cos 2 2 β , S is the sensitivity of the two-beam interference fringes. According to the analysis, the variation of the wedge position corresponding to the peak of the mutual interference fringe and the variation of the intensity corresponding to the peak are both small, so when the range of the deviation angle β is controlled within 0.5°, its effect on the demodulation of the birefringent wedge can be ignored The influence can be ignored in the pressure regulation system.

Claims (2)

1. the multiple angles of incidence polarization interference measurement mechanism of a birefringent wedge optical axis direction, it is characterized in that, this device comprises LASER Light Source (1), optical attenuator (2), beam expanding lens (3), the polarizer (4), birefringent wedge (5), sample test platform (6), analyzer (7), planar array detector (8) and signal processing system (9); Wherein:
LASER Light Source (1), for providing the input light source of this device, adopting the visible light wave range laser instrument that spatial coherence is good, comprising He-Ne laser instrument and semiconductor laser;
Optical attenuator (2), for reducing laser energy, controls laser light source power and stablizes, avoid planar array detector saturated;
Beam expanding lens (3), for laser beam expanding, ensures LASER Light Source exiting parallel, obtains the spatial coherence laser facula covering birefringent wedge lateral dimension;
The polarizer (4), does up partially for laser light, light transmission shaft direction and horizontal reference at 45 °;
Sample test platform (6), for placing birefringent wedge (5) to be measured and controlling birefringent wedge incident angle, test board can rotate around with the axle placing its plane orthogonal, realizes at least three kinds of different angles and is incident to birefringent wedge surface generation polarization interference;
Analyzer (7), for realizing polarization interference, light transmission shaft direction and horizontal reference at 45 °, simultaneously perpendicular with the polarizer or parallel;
Planar array detector (8), comprises CCD and cmos detector, for receiving polarization interference figure signal;
Signal processing system (9), comprises image pick-up card and computing machine, and for gathering polarization interference figure signal, computing machine processes according to Measurement Algorithm, calculates birefringent wedge optical axis three-dimensional;
The parallel incidence of LASER Light Source (1) Output of laser, when optical attenuator (2) reduces laser energy, controls laser power stability and avoids detector saturated, beam expanding lens (3) expands laser, obtain the spatial coherence laser facula covering birefringent wedge lateral dimension, rise partially through the polarizer (4), light transmission shaft direction and horizontal reference at 45 °, at sample test platform (6) the tested birefringent wedge of upper placement (5), by regulating sample test platform (6), rotating birefringence penetrates wedge (5), thus realize different angles incident wedge surface generation polarization interference, after analyzer (7), polarized light interference is realized by the light beam after birefringent wedge (5), planar array detector (8) is adopted to receive polarization interference figure and be passed in signal processing system (9).
2. a multiple angles of incidence polarization interference measuring method for birefringent wedge optical axis direction, it is characterized in that, the method comprises the following steps:
The parallel incidence of LASER Light Source (1) Output of laser, when optical attenuator (2) reduces laser energy, controls laser power stability and avoids detector saturated, beam expanding lens (3) expands laser, obtain the spatial coherence laser facula covering birefringent wedge lateral dimension, rise partially through the polarizer (4), light transmission shaft direction and horizontal reference at 45 °, at sample test platform (6) the tested birefringent wedge of upper placement (5), by regulating sample test platform (6), rotating birefringence penetrates wedge (5), thus realize different angles incident wedge surface generation polarization interference, after analyzer (7), polarized light interference is realized by the light beam after birefringent wedge (5), planar array detector (8) is adopted to receive polarization interference figure and be passed in signal processing system (9), under each incident angle, record a width polarization interference figure, when collecting the polarization interference figure of three different incidence angles, in signal processing system (9), greyscale transformation and hough conversion process are carried out to polarization interference signal, extract the bright fringes of polarization interference figure, calculate interference fringe spacing, the simultaneous optical path difference system of equations consisted of three angle incidences, solves the three-dimensional of birefringent wedge optical axis,
The process that described birefringent wedge forms simultaneous optical path difference system of equations by three angle incidences is as follows:
Set up adjacent bright fringe spacing h and crystal wedge surface thickness difference δ t corresponding relation formula:
In formula, for the angle of wedge;
Adjacent bright striped optical path difference δ Δ=λ in polarization interference, thus obtain polarization interference light adjacent stripes optical path difference δ Δ formula:
In formula (1), θ is incident angle, n refor the refractive index of e light light on its direction of propagation; θ rofor the angle of o light light and plane of crystal normal; δ d is the path length difference that adjacent e light is propagated in birefringent wedge; δ x efor adjacent e light propagation difference in the direction of the x axis; δ z efor adjacent e light propagation difference in the z-axis direction; n ofor the refractive index of o light light on its direction of propagation;
When incidence angle θ is constant, n re, θ roconstant, only have δ d, δ x e, δ z echange;
Choose 0 °, 30 °, 45 ° three different incidence angles, obtain system of equations:
And
In formula (3), be respectively wedge surface and x, y, z axle angle, α, β, γ be birefringent wedge optical axis and x, y, z axle angle, θ kefor the angle of e light light wave vector and plane of crystal normal, M 1, M 2for corresponding coefficient, n ofor the refractive index of o light light on its direction of propagation.
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