CN103245692B - Steady-state analysis-based method for measuring hemispherical total emissivity and heat conduction coefficient - Google Patents
Steady-state analysis-based method for measuring hemispherical total emissivity and heat conduction coefficient Download PDFInfo
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Abstract
本发明具体公开了一种基于稳态分析的半球向全发射率与导热系数的测量方法,其步骤包括:选取一个细长带状的导体材料样品,在真空环境下通电加热,选取中间的一段区域为测试区,根据稳态量热法稳态能量平衡方程;将半球向全发射率和导热系数分别表示为关于温度的数学函数;在不同稳态温度条件下进行多组稳态测量实验,构造出不同稳态温度条件下的稳态能量平衡方程组;求出方程组中的待定参数,确定样品在不同稳态温度条件下的半球向全发射率和导热系数。本发明适用于导热系数未知情形下各种导体材料的半球向全发射率的测量,同时还可以获得导体材料的导热系数值,避免了未知导热系数给半球向全发射率测量带来的不确定性影响。The invention specifically discloses a method for measuring hemispherical total emissivity and thermal conductivity based on steady-state analysis. The steps include: selecting a long and thin strip-shaped conductor material sample, heating it with electricity in a vacuum environment, and selecting a section in the middle The area is the test area, according to the steady-state energy balance equation of the steady-state calorimetry method; the hemispherical total emissivity and thermal conductivity are expressed as mathematical functions of temperature; multiple sets of steady-state measurement experiments are carried out under different steady-state temperature conditions, Construct the steady-state energy balance equations under different steady-state temperature conditions; find out the undetermined parameters in the equations, and determine the hemispherical total emissivity and thermal conductivity of the sample under different steady-state temperature conditions. The invention is applicable to the measurement of the hemispherical total emissivity of various conductor materials under the condition of unknown thermal conductivity, and can also obtain the thermal conductivity value of the conductive material, avoiding the uncertainty brought by the unknown thermal conductivity to the hemispherical total emissivity measurement sexual influence.
Description
技术领域technical field
本发明涉及导体材料半球向全发射率测量领域,尤其涉及一种基于稳态量热分析的导体材料半球向全发射率与导热系数的同时测量反演方法。The invention relates to the field of hemispherical total emissivity measurement of conductive materials, in particular to a method for simultaneous measurement and inversion of hemispherical total emissivity and thermal conductivity of conductive materials based on steady-state calorimetric analysis.
背景技术Background technique
半球向全发射率是材料的重要热物性参数之一,表征了材料的表面热辐射能力,是研究辐射测量、辐射热传递以及热效率分析的重要基础物性数据。随着新型材料在能源动力和航空航天等高新技术领域的广泛应用,对半球向全发射率的测量提出了更多迫切需求,相比于其他热物性参数而言,半球向全发射率测量方法与技术研究仍不够充分,不同材料的半球向全发射率数据依然缺乏,需要通过精确实验测量获得物体的半球向全发射率。Hemispherical total emissivity is one of the important thermophysical parameters of materials, which characterizes the surface thermal radiation ability of materials, and is an important basic physical property data for the study of radiation measurement, radiation heat transfer and thermal efficiency analysis. With the wide application of new materials in high-tech fields such as energy power and aerospace, more urgent needs have been put forward for the measurement of hemispherical total emissivity. Compared with other thermal physical parameters, the hemispherical total emissivity measurement method The technical research is still insufficient, and the hemispherical full emissivity data of different materials is still lacking, and it is necessary to obtain the hemispherical full emissivity of the object through precise experimental measurement.
目前,材料半球向全发射率的测量方法主要有辐射光谱法和量热法。量热法因其设备结构简单,操作方便,精确度较高被广泛应用,其又可分为瞬态量热法和稳态量热法。稳态量热法的实验原理是通过测量样品在热平衡状态下的换热量和表面温度,计算出材料表面的半球向全发射率,国内外研究者采用了不同的样品规格和加热方式,形成了多种稳态量热技术应用模式。例如:At present, the methods for measuring the hemispherical total emissivity of materials mainly include radiation spectroscopy and calorimetry. Calorimetry is widely used because of its simple equipment structure, convenient operation, and high accuracy. It can be divided into transient calorimetry and steady-state calorimetry. The experimental principle of steady-state calorimetry is to calculate the hemispherical total emissivity of the material surface by measuring the heat transfer and surface temperature of the sample in thermal equilibrium. Researchers at home and abroad have adopted different sample specifications and heating methods to form A variety of steady-state calorimetry application modes have been developed. For example:
a.在真空室中利用加热片对材料底面进行加热,通过测量电流、电压以及材料上表面温度,计算材料的全波长发射率;a. In the vacuum chamber, the heating plate is used to heat the bottom surface of the material, and the full-wavelength emissivity of the material is calculated by measuring the current, voltage and the temperature of the upper surface of the material;
b.将两片样品薄片紧贴在加热片的两面,利用加热片的导线将其悬挂在真空室中,通以电流加热,通过测量电功率以及材料表面温度,求解半球向全发射率;b. Put two sample thin slices on both sides of the heating plate, hang them in the vacuum chamber by the wires of the heating plate, heat them with electric current, and calculate the hemispherical total emissivity by measuring the electric power and the surface temperature of the material;
c.选取细长带状样品在真空环境下通电加热(称之为热丝法),将带状样品的中央温度较均匀的区域视为测试分析区域,进而保证了样品测试分析区域的温度和能量测量的准确性。目前已有人测量出了了氧化和非氧化的铬镍铁合金718样品、304号不锈钢和钼等材料的发射率,但材料的种类数量有限,且必须知道材料的导热系数,这就局限了这种测量方法的测量范围和测量效果。c. Select a slender strip sample to be heated by electricity in a vacuum environment (called hot wire method), and regard the area with a relatively uniform temperature in the center of the strip sample as the test analysis area, thereby ensuring the temperature and energy measurement of the sample test analysis area accuracy. At present, some people have measured the emissivity of oxidized and non-oxidized Inconel 718 samples, 304 stainless steel and molybdenum, but the types of materials are limited, and the thermal conductivity of materials must be known, which limits this method. The measurement range and measurement effect of the measurement method.
在基于稳态量热分析的导体材料半球向全发射率的测量计算模型中,带状样品测试区的导热热损失校正是需考虑的关键环节,然而,当所测试材料的导热系数为未知时,如何解决样品测试区的导热热损失校准将是材料半球向全发射率求解所面临的主要困难之一。因此,针对于导热系数未知情形下的导体材料测试而言,发展一种高温半球向全发射率和导热系数同时测量的方法,将是非常必要的。In the measurement and calculation model of the hemispherical total emissivity of conductive materials based on steady-state calorimetry analysis, the correction of thermal conductivity and heat loss in the strip sample test area is a key link to be considered. However, when the thermal conductivity of the tested material is unknown, How to solve the thermal conduction heat loss calibration of the sample test area will be one of the main difficulties in solving the material hemisphere to full emissivity. Therefore, it is very necessary to develop a method for simultaneous measurement of high-temperature hemispherical total emissivity and thermal conductivity for the testing of conductive materials under the condition of unknown thermal conductivity.
发明内容Contents of the invention
(一)要解决的技术问题(1) Technical problems to be solved
本发明的目的是提供一种基于稳态分析的半球向全发射率与导热系数的测量方法,以克服现有的稳态量热法测量半球向全发射率时,在未知样品导热系数的情况下,无法进行样品测试区导热热损失校准的问题。The purpose of the present invention is to provide a method for measuring the hemispherical total emissivity and thermal conductivity based on steady-state analysis, to overcome the situation of unknown sample thermal conductivity when the existing steady-state calorimetry measures the hemispherical total emissivity In this case, the calibration of heat conduction heat loss in the sample test area cannot be performed.
(二)技术方案(2) Technical solutions
为了解决上述技术问题,本发明提供了一种基于稳态分析的半球向全发射率与导热系数的测量方法,所述方法的步骤包括:In order to solve the above technical problems, the present invention provides a method for measuring hemispherical total emissivity and thermal conductivity based on steady-state analysis, the steps of the method include:
S1.选取一个细长带状的导体材料样品,在真空环境下通电加热,选取所述样品中间的一段区域为测试区,根据稳态量热法建立所述样品的稳态能量平衡方程;S1. Select a slender strip-shaped conductor material sample, heat it under vacuum environment, select a section of the middle area of the sample as the test area, and establish the steady-state energy balance equation of the sample according to the steady-state calorimetry;
S2.将所述样品的半球向全发射率和导热系数分别表示为关于温度的数学函数,以函数中的待定参数来定量表征样品的半球向全发射率与导热系数的特征;S2. Expressing the hemispherical total emissivity and thermal conductivity of the sample as a mathematical function about temperature, quantitatively characterizing the hemispherical total emissivity and thermal conductivity of the sample with undetermined parameters in the function;
S3.在不同稳态温度条件下进行多组稳态测量实验,构造出多个不同稳态温度条件下的稳态能量平衡方程,形成一个稳态能量平衡方程组,样品半球向全发射率函数和导热系数函数中的待定参数为所述方程组中的未知数;S3. Carry out multiple sets of steady-state measurement experiments under different steady-state temperature conditions, construct multiple steady-state energy balance equations under different steady-state temperature conditions, and form a steady-state energy balance equation group, the sample hemisphere to the full emissivity function and the undetermined parameters in the thermal conductivity function are unknowns in the equation system;
S4.利用数值求解算法求出样品半球向全发射率函数和导热系数函数中的待定参数,得到所述样品关于温度的半球向全发射率函数和导热系数函数,从而确定所述样品在不同稳态温度条件下的半球向全发射率和导热系数。S4. Utilize the numerical solution algorithm to obtain the undetermined parameters in the sample hemispherical total emissivity function and thermal conductivity function, obtain the hemispherical total emissivity function and thermal conductivity function of the sample with respect to temperature, thereby determine the sample in different stable Hemispherical total emissivity and thermal conductivity at state temperature.
其中,所述步骤S1中的稳态能量平衡方程为:Wherein, the steady-state energy balance equation in the step S1 is:
式中,Q为样品测试区的加热电功率,通过测量样品测试区两端的电压和电流可获得,为已知量;(T0,T1,T2)分别为样品测试区的左边界、中间、右边界的温度值,通过热电偶测量获得,为已知量;为样品中测试区的平均温度,为已知量;Te为真空水冷壁的温度,为已知量;ε为样品半球向全发射率,为未知量;λ为样品导热系数,为未知量;σ为史蒂芬-波尔兹曼常数,为已知量;样品测试区长度为l、宽度为w、厚度为d、样品横截面积A=w·d、测试区表面积S=2l·(w+d),均为已知量。In the formula, Q is the heating electric power of the sample test area, which can be obtained by measuring the voltage and current at both ends of the sample test area, and is a known quantity; (T 0 , T 1 , T 2 ) are the left boundary and middle , The temperature value of the right boundary, obtained by thermocouple measurement, is a known quantity; is the average temperature of the test area in the sample, is a known quantity; T e is the temperature of the vacuum water wall, which is a known quantity; ε is the hemispherical total emissivity of the sample, which is an unknown quantity; λ is the thermal conductivity of the sample, which is an unknown quantity; σ is the Steven-Boltzmann A constant is a known quantity; the length of the sample test area is l, the width is w, the thickness is d, the cross-sectional area of the sample is A=w d, and the surface area of the test area S=2l (w+d), all of which are known quantities .
其中,所述步骤S2中样品的半球向全发射率函数和导热系数函数为含有有限个待定参数的线性函数、幂指数函数和多项式函数等函数中的一种。Wherein, the hemispherical total emissivity function and the thermal conductivity function of the sample in the step S2 are one of a linear function, a power exponential function and a polynomial function with a finite number of undetermined parameters.
其中,所述步骤S2中样品的半球向全发射率函数和导热系数函数在温度区间带宽ΔT内,可表示为温度的线性函数,所述函数为:Wherein, the hemispherical total emissivity function and thermal conductivity function of the sample in the step S2 can be expressed as a linear function of temperature within the temperature interval bandwidth ΔT, and the function is:
式中,(a1,a2)为半球向全发射率函数中的两个待定参数;(b1,b2)为导热系数函数中的两个待定参数;T为样品测试区的稳态温度。In the formula, (a 1 , a 2 ) are two undetermined parameters in the hemispherical total emissivity function; (b 1 , b 2 ) are two undetermined parameters in the thermal conductivity function; T is the steady state of the sample test area temperature.
其中,所述步骤S3中将半球向全发射率函数和导热系数函数代入稳态能量平衡方程后为:Wherein, after substituting the hemispherical total emissivity function and the thermal conductivity function into the steady-state energy balance equation in the step S3, it is:
式中,Qi为第i组稳态温度下样品测试区的加热电功率,为已知量;(Ti,0,Ti,1,Ti,2)分别是第i组稳态温度状态下的样品测试区的左边界、中间、右边界的温度值,通过热电偶测量获得,为已知量;为第i组稳态温度下样品测试区的平均温度,为已知量。In the formula, Q i is the heating electric power of the sample test area at the i-th steady-state temperature, which is a known quantity; (T i,0 ,T i,1 ,T i,2 ) are the i-th steady-state temperature states The temperature values of the left boundary, the middle and the right boundary of the sample test area below are obtained by thermocouple measurement and are known quantities; is the average temperature of the sample test area at the i-th steady-state temperature, is a known quantity.
其中,在温度区间带宽ΔT内,选取G个不同的稳态温度条件对样品测试区进行稳态测量实验,G大于或等于半球向全发射率函数和导热系数函数的待定参数的数量之和,得到的稳态能量平衡方程组为:Among them, within the temperature interval bandwidth ΔT, select G different steady-state temperature conditions to conduct steady-state measurement experiments on the sample test area, G is greater than or equal to the sum of the undetermined parameters of the hemispherical full emissivity function and thermal conductivity function, The resulting steady-state energy balance equations are:
式中,(a1,a2,b1,b2)为未知的待定系数,通过数值求解算法解所述稳态能量平衡方程组即可求出四个待定参数(a1,a2,b1,b2)的具体数值,从而得到所述样品关于温度的半球向全发射率函数和导热系数函数。In the formula, (a 1 , a 2 , b 1 , b 2 ) are unknown undetermined coefficients, and the four undetermined parameters (a 1 , a 2 , b 1 , b 2 ), so as to obtain the hemispherical total emissivity function and thermal conductivity function of the sample with respect to temperature.
其中,所述细长带状导体材料样品的长度远大于其宽度和厚度。Wherein, the length of the elongated strip conductor material sample is much greater than its width and thickness.
其中,所述样品测试区的温度梯度差小于10℃。Wherein, the temperature gradient difference in the sample testing area is less than 10°C.
其中,所述步骤S1中将细长带状样品两端固定在样品夹具上,放置于具有水冷内壁的真空腔中,将真空腔抽真空,将所述样品两端通电加热到某一稳态温度状态。Wherein, in the step S1, the two ends of the elongated strip-shaped sample are fixed on the sample holder, placed in a vacuum chamber with a water-cooled inner wall, the vacuum chamber is evacuated, and the two ends of the sample are energized and heated to a certain steady state temperature state.
其中,所述步骤S3中的稳态测量实验在一个温度范围内进行Wherein, the steady-state measurement experiment in the step S3 is carried out within a temperature range
(三)有益效果(3) Beneficial effects
本发明通过将导体材料样品的半球向全发射率和导热系数分别表示为关于温度的数学函数,将其带入稳态能量平衡方程中,然后建立不同稳态温度条件下的测量方程组,计算求出方程组中的待定参数,得到样品的半球向全发射率函数和导热系数函数,从而可以计算出样品在不同温度时的半球向全发射率和导热系数,本发明适用于导热系数未知情形下各种导体材料的半球向全发射率的测量,而且在计算求解出导体材料半球向全发射率的同时,也将同时获得导体材料的导热系数值,避免了未知导热系数给半球向全发射率测量带来的不确定性影响。The present invention expresses the hemispherical total emissivity and thermal conductivity of conductor material samples as mathematical functions about temperature respectively, brings them into the steady-state energy balance equation, and then establishes measurement equations under different steady-state temperature conditions to calculate Solve the undetermined parameters in the equation group to obtain the hemispherical total emissivity function and thermal conductivity function of the sample, so that the hemispherical total emissivity and thermal conductivity of the sample at different temperatures can be calculated. The present invention is applicable to the unknown thermal conductivity Under the measurement of the hemispherical total emissivity of various conductor materials, and while calculating and solving the hemispherical total emissivity of the conductive material, the thermal conductivity value of the conductive material will also be obtained at the same time, avoiding the unknown thermal conductivity. Uncertainties brought about by rate measurement.
具体实施方式Detailed ways
下面实施例对本发明的实施方式作进一步详细描述。以下实施例用于说明本发明,但不能用来限制本发明的范围。Embodiments of the present invention are described in further detail in the following examples. The following examples are used to illustrate the present invention, but should not be used to limit the scope of the present invention.
本实施例的基于稳态分析的半球向全发射率与导热系数的测量方法适用于具有较小温度梯度测试区的带状导体材料样品(热丝)的半球向全发射率和导热系数的同时测量,克服了待测试导体材料导热系数未知情形下的半球向全发射率求解的难点问题,其步骤包括:The measurement method of hemispherical total emissivity and thermal conductivity based on steady-state analysis in this embodiment is applicable to the simultaneous measurement of hemispherical total emissivity and thermal conductivity of strip-shaped conductor material samples (hot wires) with a small temperature gradient test area. The measurement overcomes the difficult problem of solving the hemispherical total emissivity under the condition that the thermal conductivity of the conductor material to be tested is unknown. The steps include:
S1.选取一个细长带状的导体材料样品,将样品两端固定在样品夹具上,放置于水冷内壁的真空腔中,将真空腔抽真空至1.0×10-3Pa,将样品两端通电加热到某一稳态温度状态,选取样品中间的一小段区域为测试区的温度梯度较小,其温差小于10℃,所述样品的长度远大于其宽度和厚度,可将样品测试区看作是沿长度方向上的一维稳态导热问题,忽略样品表面测温热电偶导线的导热损失以及真空腔内气体的导热损失,根据稳态量热法建立样品测试区的稳态能量平衡方程为:S1. Select a slender strip-shaped conductor material sample, fix both ends of the sample on the sample holder, place it in a vacuum chamber with a water-cooled inner wall, evacuate the vacuum chamber to 1.0×10 -3 Pa, and energize both ends of the sample Heating to a certain steady-state temperature state, select a small area in the middle of the sample as the test area, the temperature gradient is small, the temperature difference is less than 10°C, the length of the sample is much greater than its width and thickness, the sample test area can be regarded as It is a one-dimensional steady-state heat conduction problem along the length direction, ignoring the heat conduction loss of the thermocouple wire on the surface of the sample and the heat conduction loss of the gas in the vacuum chamber, the steady-state energy balance equation of the sample test area is established according to the steady-state calorimetry method as :
式中,Q为样品测试区的加热电功率,通过测量样品测试区两端的电压和电流可获得,为已知量;(T0,T1,T2)分别为样品测试区的左边界、中间、右边界的温度值,通过热电偶测量获得,为已知量,由于样品测试区温度梯度较小,三点的温度值较接近;为样品中测试区的平均温度,为已知量;Te为真空水冷壁的温度,为已知量;ε为样品半球向全发射率,为未知量;λ为样品导热系数,为未知量;σ为史蒂芬-波尔兹曼常数,为已知量;样品测试区长度为l、宽度为w、厚度为d、样品横截面积A=w·d、测试区表面积S=2l·(w+d),均为已知量。In the formula, Q is the heating electric power of the sample test area, which can be obtained by measuring the voltage and current at both ends of the sample test area, and is a known quantity; (T 0 , T 1 , T 2 ) are the left boundary and middle , The temperature value of the right boundary is obtained by thermocouple measurement and is a known quantity. Since the temperature gradient of the sample test area is small, the temperature values of the three points are relatively close; is the average temperature of the test area in the sample, is a known quantity; T e is the temperature of the vacuum water wall, which is a known quantity; ε is the hemispherical total emissivity of the sample, which is an unknown quantity; λ is the thermal conductivity of the sample, which is an unknown quantity; σ is the Steven-Boltzmann A constant is a known quantity; the length of the sample test area is l, the width is w, the thickness is d, the cross-sectional area of the sample is A=w d, and the surface area of the test area S=2l (w+d), all of which are known quantities .
S2.在一定的温度区间范围内(温度区间带宽ΔT),实际物体的半球向全发射率和导热系数表现形式简单,半球向全发射率和导热系数两个热物性参量通常可以用关于温度的简单数学函数ε(a1,a2,a3,…,aN;T)和λ(b1,b2,b3,…,bM;T)予以描述,半球向全发射率函数中的待定参数(a1,a2,a3,…,aN)表征了半球向全发射率的特征,导热系数函数中的待定参数(b1,b2,b3,…,bM)表征了导热系数的特征,所述数学函数可以为含有有限个待定参数的线性函数、幂指数函数和多项式函数等函数中的一种。S2. Within a certain temperature interval (temperature interval bandwidth ΔT), the hemispherical total emissivity and thermal conductivity of the actual object are simple to express, and the two thermophysical parameters of hemispherical total emissivity and thermal conductivity can usually be used with the temperature Simple mathematical functions ε(a 1 ,a 2 ,a 3 ,…,a N ;T) and λ(b 1 ,b 2 ,b 3 ,…,b M ;T) are described, in the hemispherical total emissivity function The undetermined parameters (a 1 ,a 2 ,a 3 ,…,a N ) characterize the characteristics of the hemispherical total emissivity, and the undetermined parameters in the thermal conductivity function (b 1 ,b 2 ,b 3 ,…,b M ) The characteristic of the thermal conductivity is characterized, and the mathematical function may be one of a linear function, a power exponential function and a polynomial function with finite undetermined parameters.
本实施例在ΔT=200℃温度区间带宽内,采用线性函数来描述导体材料样品的半球向全发射率和导热系数,其函数为:In this embodiment, within the bandwidth of the temperature range of ΔT=200°C, a linear function is used to describe the hemispherical total emissivity and thermal conductivity of the conductor material sample, and the function is:
式中,(a1,a2)为半球向全发射率函数中的两个待定参数;(b1,b2)为导热系数函数中的两个待定参数;T为样品测试区在温度区间带宽ΔT内的一个稳态温度。In the formula, (a 1 , a 2 ) are two undetermined parameters in the hemispherical total emissivity function; (b 1 , b 2 ) are two undetermined parameters in the thermal conductivity function; T is the temperature range of the sample test area A steady-state temperature within the bandwidth ΔT.
S3.将S2中的函数代入到S1中的稳态能量平衡方程,可以看出,(a1,a2,b1,b2)四个待定参数求解的充分必要条件为在ΔT=200℃的温度区间带宽内,至少进行四个不同温度条件下的稳态测量实验,来构造测量方程组,也就是说,至少进行四个不同温度条件下的稳态测量实验来满足待定参数的数学封闭求解需要。S3. Substituting the functions in S2 into the steady-state energy balance equation in S1, it can be seen that the sufficient and necessary conditions for solving the four undetermined parameters (a 1 , a 2 , b 1 , b 2 ) are at ΔT=200℃ Within the bandwidth of the temperature range, at least four steady-state measurement experiments under different temperature conditions are carried out to construct the measurement equation system, that is, at least four steady-state measurement experiments under different temperature conditions are carried out to satisfy the mathematical closure of the undetermined parameters Solving needs.
选取的样品加热温度范围为800℃~1000℃,在此范围内恰好可用一组半球向全发射率函数与导热系数函数,其中的待定参数数目为四个,调整样品的加热功率,在该温度范围内分别将样品加热至五个稳态温度状态点(即 ),此外,在每个稳态温度状态下,样品中间测试区的温度梯度较小,温差均小于10℃,根据上述五个不同稳态温度点进行五组稳态测量实验,构造出五个不同稳态温度条件下的稳态能量平衡方程,形成一个稳态能量平衡方程组,其为:The selected sample heating temperature range is 800°C to 1000°C. In this range, a set of hemispherical total emissivity function and thermal conductivity function can be used. The number of undetermined parameters is four. Adjust the heating power of the sample. At this temperature The samples were heated to five steady-state temperature states within the range (i.e. ), in addition, in each steady-state temperature state, the temperature gradient in the middle test area of the sample is small, and the temperature difference is less than 10°C. According to the above-mentioned five different steady-state temperature points, five sets of steady-state measurement experiments are carried out, and five The steady-state energy balance equations under different steady-state temperature conditions form a steady-state energy balance equation group, which is:
样品半球向全发射率函数和导热系数函数中的待定参数(a1,a2,b1,b2)为上述方程组中的未知数;The undetermined parameters (a 1 , a 2 , b 1 , b 2 ) in the sample hemispherical total emissivity function and thermal conductivity function are unknowns in the above equations;
S4.利用数值求解算法解出S3中稳态能量平衡方程组的四个未知数(a1,a2,b1,b2),反演得到样品关于温度的半球向全发射率函数和导热系数函数,从而确定样品在温度区间(带宽ΔT=200℃)内不同温度条件下的半球向全发射率和导热系数。S4. Use the numerical solution algorithm to solve the four unknowns (a 1 , a 2 , b 1 , b 2 ) of the steady-state energy balance equations in S3, and invert to obtain the hemispherical total emissivity function and thermal conductivity of the sample with respect to temperature function to determine the hemispherical total emissivity and thermal conductivity of the sample under different temperature conditions within the temperature range (bandwidth ΔT=200°C).
本实施例优选的温度范围为300℃~2000℃,如果样品考察的温度范围的带宽大于200℃,例如温度范围800℃~1600℃,则可以按ΔT=200℃划分温度区间为800℃~1000℃、1200℃~1400℃、1400℃~1600℃,在每一个温度区间内,按照上述的测量步骤,以此确定每个区间的半球向全发射率与导热系数函数中的待定参数,进而确定样品半球向全发射率和导热系数数值。The preferred temperature range in this embodiment is 300°C to 2000°C. If the bandwidth of the temperature range for sample investigation is greater than 200°C, for example, the temperature range is 800°C to 1600°C, then the temperature range can be divided into 800°C to 1000°C according to ΔT=200°C ℃, 1200℃~1400℃, 1400℃~1600℃, in each temperature range, follow the above measurement steps to determine the undetermined parameters in the hemispherical total emissivity and thermal conductivity function of each zone, and then determine The sample hemispherical total emissivity and thermal conductivity values.
本发明也可以用其他函数进行求解,将所选的半球向全发射率函数和导热系数函数代入稳态能量平衡方程后为:The present invention can also be solved with other functions, and after substituting the selected hemispherical total emissivity function and thermal conductivity function into the steady-state energy balance equation, it is:
式中,Qi为第i组稳态温度下样品测试区的加热电功率,为已知量;i=1,2,…,G,G为不同温度条件下的稳态测量实验的组数,其大于或等于半球向全发射率函数和导热系数函数的待定参数的数量之和;(Ti,0,Ti,1,Ti,2)分别是第i组稳态温度状态下的样品测试区的左边界、中间、右边界的温度值,通过热电偶测量获得,为已知量,由于样品测试区温度梯度较小,三点的温度值较接近;为第i组稳态温度下样品测试区的平均温度,为已知量。In the formula, Q i is the heating electric power of the sample test area at the steady-state temperature of the i-th group, which is a known quantity; i=1,2,...,G, G is the group number of the steady-state measurement experiment under different temperature conditions, It is greater than or equal to the sum of the number of undetermined parameters of the hemispherical total emissivity function and the thermal conductivity function ; The temperature values of the left boundary, the middle and the right boundary of the test area are obtained by thermocouple measurement and are known quantities. Since the temperature gradient of the sample test area is small, the temperature values of the three points are relatively close; is the average temperature of the sample test area at the i-th steady-state temperature, is a known quantity.
根据上述稳态能量平衡方程、半球向全发射率函数和导热系数函数,通过类似上述实施例的方法,即采用数值求解算法,通过测量已知量,可以计算得到半球向全发射率函数中的待定参数(a1,a2,a3,…,aN)和导热系数函数中的待定参数(b1,b2,b3,…,bM),进而即确定出所考察温度区间内的样品半球向全发射率和导热系数。According to the above-mentioned steady-state energy balance equation, hemispherical total emissivity function and thermal conductivity function, through a method similar to the above-mentioned embodiment, that is, using a numerical solution algorithm, by measuring known quantities, the hemispherical total emissivity function can be calculated. Undetermined parameters (a 1 , a 2 , a 3 ,…,a N ) and undetermined parameters (b 1 ,b 2 ,b 3 ,…,b M ) in the thermal conductivity function, and then determine the Sample hemispherical total emissivity and thermal conductivity.
本发明的实施例是为了示例和描述起见而给出的,而并不是无遗漏的或者将本发明限于所公开的形式。很多修改和变化对于本领域的普通技术人员而言是显而易见的。选择和描述实施例是为了更好说明本发明的原理和实际应用,并且使本领域的普通技术人员能够理解本发明从而设计适于特定用途的带有各种修改的各种实施例。The embodiments of the present invention have been presented for purposes of illustration and description, but are not intended to be exhaustive or to limit the invention to the form disclosed. Many modifications and changes will be apparent to those of ordinary skill in the art. The embodiment was chosen and described in order to better explain the principles of the invention and the practical application, and to enable others of ordinary skill in the art to understand the invention and design various embodiments with various modifications as are suited to the particular use.
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