CN102062793A - Probe Cards with Structurally Reinforced Test Sockets - Google Patents

Abstract

The invention discloses a probe card and a structurally reinforced test socket therein, wherein the structurally reinforced test socket mainly comprises a plurality of test probes, a flat shell, a cover body, a plurality of first locking assemblies, at least one first reinforcing member, at least one second reinforcing member and a plurality of second locking assemblies. The shell is provided with at least one first accommodating space and at least one second accommodating space which are respectively used for arranging a first strengthening member and a second strengthening member, and a plurality of second locking assemblies penetrate through the first strengthening member, the shell and the second strengthening member, so that the shell is firmly clamped between the first strengthening member and the second strengthening member, and the Young coefficients of the first strengthening member and the second strengthening member are higher than that of the shell.

Description

Probe Cards with Structurally Reinforced Test Sockets

technical field

The present invention relates to a probe card and a test socket therein, in particular to a probe card for chip testing and a structurally strengthened test socket therein.

Background technique

Nowadays, in order to make electronic products conform to the consumption trend of multi-functionality and light appearance, semiconductor packaging gradually tends to the technological development of Wafer Level Chip Size Package (WLCSP), which is different from traditional chip size packaging. The difference is that wafer-level chip size packaging is directly packaged on the wafer, and then cut. After cutting, it becomes a single packaged integrated circuit product. The advantage of wafer-level chip size packaging is that the packaged finished product is smaller in size, which can save the production of glue filling, lead frame and substrate, and omit the process of die bonding and wire bonding, thus greatly reducing material and labor costs, and shortening The process time of packaging can be improved and the production yield and production capacity can be improved. However, WLCSP is a miniaturized packaging structure, and its package size is close to or equal to the chip size. Therefore, when performing WLCSP testing, the size and number of chips will also cause testing difficulties.

Take the 128 testing areas (Testing side) of wafer-level chip size package as an example, where each test area can be defined as a single chip (Chip) on a wafer-level chip size package, and each single chip has 8 Therefore, 1024 spring probes need to be installed on the test socket to test 128 chips at the same time, because each contact needs to use 8 spring probes for testing. However, because 1024 contacts are tested at the same time, the distance between the contacts will be reduced, and the distance between the 1024 pins on the test socket will also be reduced. In the case that the diagonal distance of the test range is also reduced, the 1024 spring probes on the test socket will cause the test socket to bend due to the uneven force during the test. In addition, it will also lead to difficulties in the alignment of the test by the operator, and it will take time to align the chip and the test socket. Retesting is necessary, resulting in time and expense. For the industry that values timeliness and wants to reduce costs, there is still room for improvement.

Contents of the invention

In order to solve the unsatisfactory problems of the prior art, the present invention provides a structurally strengthened test socket, which mainly includes a plurality of test probes, a flat shell, a cover and a plurality of first locking components. The casing has a first surface and a second surface, and a recess is provided on the second surface for the cover to accommodate therein, and a plurality of first locking components connect and lock the casing and the cover. The structurally strengthened test socket further includes at least one first strengthening member, at least one second strengthening member and a plurality of second locking components, and the Young's modulus of the first strengthening member and the second strengthening member is higher than that of the shell coefficient. At least one first accommodating space is recessed on the first surface of the casing, and the first accommodating space is used for arranging the first reinforcing member, and prevents the first reinforcing member from protruding from the first surface of the casing. At least one second accommodating space is formed between the casing and the cover, and the second accommodating space is used for arranging the second reinforcing member, and makes the second reinforcing member correspond to the first reinforcing member. The above-mentioned plurality of second locking components penetrate the first reinforcing member, the casing and the second reinforcing member, so that the casing can be firmly clamped between the first reinforcing member and the second reinforcing member and combined with each other. In addition, the above-mentioned multiple test probes penetrate through the casing and the cover simultaneously, one end thereof is used to contact the semiconductor device, and the other end is used to contact the circuit board assembly (PCB assembly).

Therefore, the main purpose of the present invention is to provide a test socket with a strengthened structure, which has a first strengthening member and a second strengthening member, and the second locking component penetrates the first strengthening member, the shell and the second strengthening member, and can The shell is firmly clamped between the first reinforcement member and the second reinforcement member, thereby increasing the strength of the test socket and preventing the test socket from being easily bent.

A secondary purpose of the present invention is to provide a structurally strengthened test socket, which has a first strengthening member and a second strengthening member, and the Young’s modulus of the first strengthening member and the second strengthening member is higher than that of the housing, Therefore, the strength of the test socket can be increased without changing the appearance and volume of the test socket, so that the test socket is not easy to be bent, and the manufacturing cost of the test socket can be reduced.

Another object of the present invention is to provide a structurally strengthened test socket, which has a first strengthening member and a second strengthening member, and the Young’s modulus of the first strengthening member and the second strengthening member is higher than that of the housing, When the number of test probes on the test socket increases, the strength of the test socket can still be maintained, so that the test socket is not easy to be bent, thereby improving the test throughput.

Another object of the present invention is to provide a structurally strengthened test socket, which has a first strengthening member and a second strengthening member. When performing a high temperature or low temperature test, for example, the test temperature is between -40°C and 120°C. The test socket with a strengthened structure can avoid the problem of deformation caused by temperature changes, so that the alignment between the chip under test and the test socket can maintain good electrical contact, and the reliability of test results can be improved.

In addition, the present invention further provides a probe card, which mainly includes a circuit board and a structurally strengthened test socket locked at the center of the circuit board. The structurally strengthened test socket mainly includes a plurality of test probes, a flat shell, a cover and a plurality of first locking components. The casing has a first surface and a second surface, and a recess is provided on the second surface for the cover to accommodate therein, and a plurality of first locking components connect and lock the casing and the cover. The structurally strengthened test socket further includes at least one first strengthening member, at least one second strengthening member and a plurality of second locking components, and the Young's modulus of the first strengthening member and the second strengthening member is higher than that of the shell coefficient. At least one first accommodating space is recessed on the first surface of the casing, and the first accommodating space is used for arranging the first reinforcing member, and prevents the first reinforcing member from protruding from the first surface of the casing. At least one second accommodating space is formed between the casing and the cover, and the second accommodating space is used for arranging the second reinforcing member, and makes the second reinforcing member correspond to the first reinforcing member. The above-mentioned plurality of second locking components penetrate the first reinforcing member, the casing and the second reinforcing member, so that the casing can be firmly clamped between the first reinforcing member and the second reinforcing member and combined with each other.

Therefore, another object of the present invention is to provide a probe card, wherein the structurally strengthened test socket used has a first strengthening member and a second strengthening member, and the second locking component penetrates the first strengthening member, The housing and the second strengthening member can make the housing firmly clamped between the first strengthening member and the second strengthening member, thereby increasing the strength of the test socket and preventing the test socket from being easily bent.

Another object of the present invention is to provide a probe card, wherein the structurally strengthened test socket used has a first strengthening member and a second strengthening member, and the Young’s modulus of the first strengthening member and the second strengthening member is high Due to the characteristics of the Young's modulus of the shell, the test socket can increase the strength of the test socket without changing the appearance and volume, so that the test socket is not easy to be bent, and the production cost of the test socket is reduced.

Another object of the present invention is to provide a probe card, wherein the structurally strengthened test socket used has a first strengthening member and a second strengthening member, and the Young’s modulus of the first strengthening member and the second strengthening member is high Due to the characteristics of the Young's modulus of the shell, when the number of test probes on the test socket increases, the strength of the test socket can still be maintained, so that the test socket is not easy to be bent, thereby improving the test throughput.

Another object of the present invention is to provide a probe card, wherein the structurally strengthened test socket used has a first strengthening member and a second strengthening member. When performing a high temperature or low temperature test, for example, the test temperature is between - Between 40°C and 120°C, this structurally strengthened test socket can avoid the problem of deformation due to temperature changes, so that the alignment between the chip under test and the test socket can maintain good electrical contact and improve the reliability of test results.

Description of drawings

Fig. 1 is an exploded view, according to the first preferred embodiment of the present invention, it is a test socket with strengthened structure;

Fig. 2 is a schematic diagram, according to the first preferred embodiment of the present invention, it is a second icon of a structurally strengthened test socket;

FIG. 3 is a cross-sectional view of a test socket with enhanced structure according to the first preferred embodiment of the present invention.

[Description of main component symbols]

Structurally strengthened test socket 100

Test Probes 1

Housing 2

The first side 21

The first accommodation space 211

Second side 22

Depression 221

Through-hole 23

Cover body 3

The first locking component 4

The first reinforcement component 5

Screw hole 51

Second strengthening member 6

Through hole 61

Second locking component 7

The second storage space 8

Circuit board composition 9

Detailed ways

Since the present invention discloses a probe card required for chip testing and a structurally strengthened test socket therein, the principle of use and basic functions of the probe card and test socket used therein have been known by those with ordinary knowledge in the relevant technical field. It can be understood, so the description below will not describe it completely. At the same time, the following diagrams are used to express the structural representations related to the features of the present invention, which are not and need not be completely drawn according to the actual size, but are described first.

First please refer to FIG. 1 , which is an exploded view of a structurally strengthened test socket 100 according to the first preferred embodiment of the present invention, which mainly includes a plurality of test probes 1 , a flat housing 2 and a cover. The body 3 and a plurality of first locking components 4 , the housing 2 has a first surface 21 and a second surface 22 . Please refer to FIG. 2 , which is the second surface 22 of the housing 2 , wherein a central portion of the second surface 22 of the housing 2 is provided with an elongated recessed portion 221 for the cover 3 to accommodate therein. Please continue to refer to FIG. 1 , the above-mentioned plurality of first locking components 4 are used to connect and lock the housing 2 and the cover 3 , and the materials of the housing 2 and the cover 3 are preferably insulating plastics. A plurality of test probes 1 penetrate through the housing 2 and the cover 3 at the same time, one end of which is used to contact a semiconductor device (not shown), and the other end is used to contact a circuit board assembly 9 (PCB assembly).

In order to avoid that when the test socket is locked on the circuit board (PCB), the force of the spring probe on the test probe will cause the test socket to bend (Bending), making alignment difficult and poor contact. The structurally strengthened test socket 100 of the present invention further includes at least one first strengthening member 5, at least one second strengthening member 6 and a plurality of second locking components 7, wherein the first strengthening member 5 and the second strengthening member 6 The modulus is higher than the Young's modulus of the shell 2, and the material, configuration and size of the first reinforcing member 5 and the second reinforcing member 6 are preferably the same. In this preferred embodiment, the material of the first reinforcing member 5 and the second reinforcing member 6 are both metal and there are two. The first surface 21 of the casing 2 is recessed with at least one first accommodating space 211, and the first accommodating space 211 is an elongated groove for setting the first reinforcing member 5, and making the first reinforcing member 5 does not protrude from the first surface 21 of the housing 2, so that the external dimensions of the test socket 100 with reinforced structure can be maintained and not increased. Please continue to refer to FIG. 2 , at least one second accommodating space 8 is formed between the casing 2 and the cover 3 for setting the second reinforcement member 6 , and the second accommodating space 8 is recessed in the cover 3 facing the casing. 2 (as shown in Figure 2), of course, this second accommodating space 8 can also be recessed on the side of the housing 2 facing the cover 3 (not shown), this second accommodating space 8 is used to set The second reinforcement member 6 .

It should be noted here that the second reinforcing member 6 disposed in the second accommodating space 8 will correspond to the first reinforcing member 5 disposed in the first accommodating space 211 . In this preferred embodiment, the number of the first accommodating space 211 and the second accommodating space 8 are both two, and they are arranged horizontally, and the two first accommodating spaces 211 are relatively The first surface 21 is arranged symmetrically, and the two second accommodating spaces 8 are also arranged symmetrically with respect to the cover body 3. The two first accommodating spaces 211 and the second accommodating spaces 8 are both arranged in multiple test Periphery of Probe 1.

Please refer to FIG. 3 , which is a cross-sectional view along A to A of FIG. 2 . The important feature of the present invention is that a plurality of second locking components 7 are used to penetrate the first reinforcement member 5 , the housing 2 and the second reinforcement member 6 , and pass through This enables the shell 2 to be firmly clamped between the first reinforcement member 5 and the second reinforcement member 6 and combined with each other. In a preferred embodiment, through holes 61 and 23 are provided on the second reinforcement member 6 and the housing 2, screw holes 51 are provided on the first reinforcement member 5, and the second locking component 7 can be a bolt, The second strengthening member 6 and the housing 2 can be passed through and then locked on the first strengthening member 5 , which can increase the strength of the structurally reinforced test socket 100 of the present invention, making the test socket less likely to be bent. And because the Young's modulus of the first reinforcing member 5 and the second reinforcing member 6 is higher than that of the housing, the structurally strengthened test socket 100 of the present invention can be used without changing the appearance and volume. The strength of the test socket is increased to prevent the test socket from being bent, thereby reducing the manufacturing cost of the test socket. If the number of test probes on the test socket is further increased to increase the volume of the test socket housing 2, the structurally strengthened test socket 100 of the present invention can still utilize a plurality of second locking components 7 to penetrate the first The first strengthening member 5, the casing 2 and the second strengthening member 6 maintain a considerable strength, thereby improving the test throughput.

The present invention further provides a second preferred embodiment, which is a probe card, which mainly includes a circuit board component 9 and a structurally strengthened test socket 100 locked on the central part of the circuit board component 9, wherein the structurally strengthened test socket 100 mainly includes a plurality of test probes 1 , a flat housing 2 , a cover 3 and a plurality of first locking components 4 . The casing 2 has a first surface 21 and a second surface 22. The second surface 22 defines a recess 221 for the cover 3 to be accommodated therein, and a plurality of first locking components 4 connect the casing 2 and the cover 3 to each other. The connection is locked. Wherein, other features of the structurally strengthened test socket 100 are as described in the aforementioned first preferred embodiment.

Furthermore, the probe card of the present invention and the structurally strengthened test socket therein, the first accommodating space and the second accommodating space can be arranged around the periphery of the first surface and the second surface of the casing according to requirements. , through which the first reinforcing member and the second reinforcing member can be framed around the casing; or the first accommodating space and the second accommodating space can form an I-shaped or a well-shaped geometric shape or a combination thereof, to respectively Accommodate the first reinforcement member and the second reinforcement member, so that the first reinforcement member and the second reinforcement member can be arranged on the shell in an I-shaped or square shape or a combination thereof, so as to properly arrange the first reinforcement member And the second strengthening member is used for different models or sizes of the probe card and the test socket therein, so as to reduce the chance of deformation of the probe card and the test socket therein.

On the other hand, the probe card of the present invention and the structurally strengthened test socket therein have a first strengthening member and a second strengthening member. When performing a high temperature or low temperature test, for example, the test temperature is between -40°C and 120°C During this period, the structurally strengthened test socket can avoid the problem of deformation due to temperature changes, so that the alignment between the chip under test and the test socket can maintain good electrical contact and improve the reliability of the test results.

The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the scope of rights of the present invention. At the same time, the above description should be clear and implementable by those who are familiar with the technical field. Therefore, other equivalent changes or modifications made without departing from the spirit disclosed by the present invention should be included in the patent scope of the application.

Claims (10)

1. structure-reinforced test jack, the housing, a lid and a plurality of first lock-in component that comprise a plurality of test probes, a flat, this housing has first and second, this second face is offered a depressed part and is installed with wherein for this lid, described a plurality of first lock-in component is that this housing and this lid are connected to each other locking, it is characterized in that:

This structure-reinforced test jack further comprises at least one first reinforcement members, at least one second reinforcement members and a plurality of second lock-in component, and wherein the young's modulus of this first reinforcement members and second reinforcement members is higher than the young's modulus of this housing;

First face of this housing is concaved with at least one first accommodation space, and this first accommodation space is in order to being provided with this first reinforcement members, and makes this first reinforcement members not protrude from first of this housing;

Be formed with at least one second accommodation space between this housing and this lid, this second accommodation space is in order to being provided with this second reinforcement members, and makes this second reinforcement members corresponding to this first reinforcement members;

These a plurality of second lock-in components penetrate this first reinforcement members, this housing and this second reinforcement members, this housing firmly is held between this first reinforcement members and this second reinforcement members, and interosculates; And

Each test probe penetrates this housing and this lid simultaneously, and the one end is in order to contact semiconductor device, and the other end is formed in order to contact a circuit board.

2. according to the described structure-reinforced test jack of claim 1, it is characterized in that this second accommodation space is arranged with in the one side of this lid in the face of this housing.

3. according to the described structure-reinforced test jack of claim 1, it is characterized in that the quantity of this first accommodation space and this second accommodation space is 2 and be horizontal arrangement.

4. according to the described structure-reinforced test jack of claim 3, it is characterized in that, described a plurality of first accommodation space is the setting of symmetry shape with respect to first face of this housing, described a plurality of second accommodation space is the setting of symmetry shape with respect to this lid, and described a plurality of first accommodation spaces and described a plurality of second accommodation space are arranged at the periphery of described a plurality of test probes.

5. according to the described structure-reinforced test jack of claim 1, it is characterized in that this first reinforcement members and this second reinforcement members are metal, and this first reinforcement members is all identical with material, configuration and the size of this second reinforcement members.

6. according to the described structure-reinforced test jack of claim 1, it is characterized in that this housing and this lid are ambroin.

7. according to the described structure-reinforced test jack of claim 1, it is characterized in that, each second lock-in component is a bolt, this first reinforcement members is provided with screw, this second reinforcement members and this housing are equipped with through hole, and each bolt passes this second reinforcement members and this housing and locks in this first reinforcement members.

8. according to the described structure-reinforced test jack of claim 1, it is characterized in that, first of this housing with this periphery of second, cave in respectively forming this first accommodation space and this second accommodation space, with ccontaining this first reinforcement members and this second reinforcement members respectively.

9. according to the described structure-reinforced test jack of claim 1, it is characterized in that, first of this housing with second, cave in respectively to form this first accommodation space and this second accommodation space, and have I font or groined type or and the geometric configuration of combination, with ccontaining this first reinforcement members and this second reinforcement members respectively.

10. probe, include the structure-reinforced test jack that a circuit board is formed and is locked in this circuit board composition central part, this structure-reinforced test jack comprises housing, a lid and a plurality of first lock-in component of a plurality of test probes, a flat, this housing has first and second, this second face is offered a depressed part and is installed with wherein for this lid, described a plurality of first lock-in component is connected to each other locking with this housing and this lid, it is characterized in that:

This structure-reinforced test jack further comprises at least one first reinforcement members, at least one second reinforcement members and a plurality of second lock-in component, and wherein the young's modulus of this first reinforcement members and second reinforcement members is higher than the young's modulus of this housing;

First face of this housing is concaved with at least one first accommodation space, and this first accommodation space is in order to being provided with this first reinforcement members, and makes this first reinforcement members not protrude from first of this housing;

Be formed with at least one second accommodation space between this housing and this lid, this second accommodation space is in order to being provided with this second reinforcement members, and makes this second reinforcement members corresponding to this first reinforcement members;

These a plurality of second lock-in components penetrate this first reinforcement members, this housing and this second reinforcement members, this housing firmly is held between this first reinforcement members and this second reinforcement members, and interosculates; And

Each test probe penetrates this housing and this lid simultaneously, and the one end is in order to contact semiconductor device, and the other end is formed in order to contact this circuit board.

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