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CN101206603A - 基于pci的ad信号接口卡 - Google Patents

基于pci的ad信号接口卡 Download PDF

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Publication number
CN101206603A
CN101206603A CNA2006102013745A CN200610201374A CN101206603A CN 101206603 A CN101206603 A CN 101206603A CN A2006102013745 A CNA2006102013745 A CN A2006102013745A CN 200610201374 A CN200610201374 A CN 200610201374A CN 101206603 A CN101206603 A CN 101206603A
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China
Prior art keywords
pci
signal
interface card
printed circuit
circuit board
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Pending
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CNA2006102013745A
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Inventor
虞恒
何凤龙
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Priority to CNA2006102013745A priority Critical patent/CN101206603A/zh
Priority to US11/862,199 priority patent/US20080155158A1/en
Publication of CN101206603A publication Critical patent/CN101206603A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/40—Bus structure
    • G06F13/4063—Device-to-bus coupling
    • G06F13/409—Mechanical coupling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/11—Printed elements for providing electric connections to or between printed circuits
    • H05K1/117—Pads along the edge of rigid circuit boards, e.g. for pluggable connectors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/14—Structural association of two or more printed circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09—Shape and layout
    • H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/09936—Marks, inscriptions, etc. for information

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

一种基于PCI的AD信号接口卡，包括一印刷电路板及一设于所述印刷电路板一端侧的金手指，所述金手指可与电脑主板上的PCI插槽对插，所述印刷电路板上设有若干信号测试点，每一信号测试点与所述金手指中的对应的传输地址及数据信号的引脚电连接。所述基于PCI的AD信号接口卡可与电脑主板上的PCI插槽对插，在测试时，可通过直接量测所述基于PCI的AD信号接口卡上信号测试点的信号，即可获知电脑主板上南桥的功能是否正常。

Description

基于PCI的AD信号接口卡
技术领域
本发明涉及一种PCI(Peripheral Component Interconnect，周边元件扩展接口)卡，特别涉及一种基于PCI的AD(Address and Data，地址及数据)信号接口卡。
背景技术
PCI插槽是基于PCI局部总线的扩展插槽，其颜色一般为乳白色。其位宽为32位或64位，工作频率为33MHz，最大数据传输率为133MB/sec(32位)和266MB/sec(64位)。可插接显卡、声卡、网卡、内置调制解调器(Modem)、内置ADSL Modem、USB2.0卡、IEEE1394卡、IDE接口卡、RAID卡、电视卡、视频采集卡以及其它种类繁多的扩展卡。PCI插槽是主板的主要扩展插槽，通过插接不同的扩展卡可以获得目前电脑能实现的几乎所有外接功能，因此PCI已成为主板上一个非常重要的接口。
PCI插槽的AD引脚一般都直接与南桥相连，通过测量PCI的AD引脚的信号可以判定南桥是否空焊。在维修和分析主板时，PCI插槽上的AD引脚的信号是经常需要测量的关键信号，一般为32位或64位。但由于PCI插槽引脚数量较多，寻找和量测这些AD信号要花费大量的时间，而且PCI插槽的焊接点都在印刷电路板的背面，更不便于测量。
发明内容
鉴于以上内容，有必要提供一种基于PCI的AD信号接口卡，以方便测量南桥性能。
一种基于PCI的AD信号接口卡，包括一印刷电路板及一设于所述印刷电路板一端侧的金手指，所述金手指可与电脑主板上的PCI插槽对插，所述印刷电路板上设有若干信号测试点，每一信号测试点与所述金手指中的对应的传输地址及数据信号的引脚电连接。
所述印刷电路板上的信号测试点与金手指上对应的传输地址及数据信号的引脚电连接，在测试时，将所述基于PCI的AD信号接口卡插入电脑主板的PCI插槽上，可通过直接量测所述基于PCI的AD信号接口卡上信号测试点的信号，即可获知南桥的功能，相较现有技术在主板上直接测量更简单方便，提高了测试效率。
附图说明
图1是本发明基于PCI的AD信号接口卡的较佳实施方式的示意图
图2是本发明基于PCI的AD信号接口卡的电路连接示意图。
具体实施方式
请参阅图1及图2，本发明基于PCI的AD信号接口卡的较佳实施方式包括一印刷电路板层10及一设于所述印刷电路板10一端侧的金手指20，所述金手指20可与电脑主板上的PCI插槽对插。本实施方式中，所述金手指20包括124根引脚，所述124根引脚分双列排布，第一列包括引脚A1~A62，第二列包括引脚B1~B62，每一引脚A1~A62及B1~B62均依据PCI标准定义，各引脚定义如表1，其中有32根引脚A 58、B 58、A57、B56、A55、B55、A54、B53、B52、A49、B48、A47、B47、A46、B45、A44、A32、B32、A31、B30、A29、B29、A28、B27、A25、B24、A23、B23、A22、B21、A20、B20用于传送地址及数据信号AD0~AD31。所述印刷电路板10上与所述金手指20接触的两端分别设有一凸部12，所述凸部12方便金手指20在电脑主板PCI插槽上的插拔，同时也可保护金手指。所述印刷电路板10上设有32个AD信号测试点1~32，每一AD信号测试点1~32通过印刷电路板10上的走线与所述金手指20中的对应的传输地址及数据信号AD0~AD31的引脚连接。图2示出了金手指20中传输地址及数据信号AD0~AD31的引脚与印刷电路板10中相应信号测试点1~32的电连接示意图。
在使用所述基于PCI的AD信号接口卡测试南桥BGA(Ball Grid Array，球状矩阵排列)的焊接情况时，将所述基于PCI的AD信号接口卡插入电脑主板的PCI插槽上，将万用表调到欧姆档，使万用表的一个表笔固定接地，另一个表笔在所述基于PCI的AD信号接口卡的32个信号测试点1~32上滑行，观察万用表的读数，如果读数与标准值完全相同，表示南桥BGA焊接良好。如果万用表的读数与标准值比较有异常，即可断定南桥BGA焊接不良。
在使用所述基于PCI的AD信号接口卡测试南桥的功能时，将基于PCI的AD信号接口卡插入电脑主板的PCI插槽上，用逻辑分析仪对32个信号测试点1~32同时测量，观察南桥工作时每个AD信号的波形，然后对其结果逐个分析，从而可确定南桥功能是否正常。
所述印刷电路板10上的信号测试点1~32与金手指20上对应的传输地址及数据信号AD0~AD31的引脚电连接，在测试时，将所述基于PCI的AD信号接口卡插入电脑主板的PCI插槽上，通过直接量测所述基于PCI的AD信号接口卡上信号测试点1~32的信号，即可获知南桥的功能，相较现有技术在主板上直接测量更简单方便。
表1金手指的引脚定义
Figure A20061020137400041
Figure A20061020137400051
Figure A20061020137400061

Claims (2)

1.一种基于PCI的AD信号接口卡，包括一印刷电路板及一设于所述印刷电路板一端侧的金手指，所述金手指可与电脑主板上的PCI插槽对插，所述印刷电路板上设有若干信号测试点，每一信号测试点与所述金手指中的对应的传输地址及数据信号的引脚电连接。
2.如权利要求1所述的基于PCI的AD信号接口卡，其特征在于，所述印刷电路板两端分别设有一凸部用来方便所述金手指在电脑主板PCI插槽上的插拔。
CNA2006102013745A 2006-12-22 2006-12-22 基于pci的ad信号接口卡 Pending CN101206603A (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CNA2006102013745A CN101206603A (zh) 2006-12-22 2006-12-22 基于pci的ad信号接口卡
US11/862,199 US20080155158A1 (en) 2006-12-22 2007-09-27 Pci interface card

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CNA2006102013745A CN101206603A (zh) 2006-12-22 2006-12-22 基于pci的ad信号接口卡

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101634962B (zh) * 2008-07-21 2011-11-09 鸿富锦精密工业（深圳）有限公司 Pci 接口测试卡
CN102298085A (zh) * 2010-06-24 2011-12-28 鸿富锦精密工业（深圳）有限公司 负载板
CN102411528A (zh) * 2010-09-21 2012-04-11 鸿富锦精密工业（深圳）有限公司 Mxm接口测试连接卡及具有该测试连接卡的测试系统
CN102735945A (zh) * 2011-04-07 2012-10-17 鸿富锦精密工业（深圳）有限公司 信号测试装置
CN102141952B (zh) * 2010-02-01 2015-03-25 赛恩倍吉科技顾问（深圳）有限公司 系统管理总线测试装置
CN109564254A (zh) * 2016-08-01 2019-04-02 恩德斯+豪斯流量技术股份有限公司 具有接触结构的电路板
CN109992546A (zh) * 2017-12-29 2019-07-09 深圳市优必选科技有限公司 一种串口调试装置及调试方法

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USD637192S1 (en) 2010-10-18 2011-05-03 Apple Inc. Electronic device
CN102692526A (zh) * 2011-03-23 2012-09-26 鸿富锦精密工业（深圳）有限公司 辅助测试装置
CN102692525A (zh) * 2011-03-23 2012-09-26 鸿富锦精密工业（深圳）有限公司 Pci卡辅助测试装置
USD709894S1 (en) 2012-09-22 2014-07-29 Apple Inc. Electronic device
CN103870375A (zh) * 2012-12-11 2014-06-18 鸿富锦精密工业（深圳）有限公司 端口测试装置
DE102016114143A1 (de) 2016-08-01 2018-02-01 Endress+Hauser Flowtec Ag Testsystem zur Überprüfung von elektronischen Verbindungen von Bauteilen mit einer Leiterplatte und Leiterplatte
CN106793487A (zh) * 2016-12-23 2017-05-31 武汉华星光电技术有限公司 显示设备及其柔性电路板
TWD190983S (zh) * 2017-02-17 2018-06-11 三星電子股份有限公司 固態硬碟儲存裝置
USD869470S1 (en) * 2018-04-09 2019-12-10 Samsung Electronics Co., Ltd. SSD storage device
USD869469S1 (en) * 2018-04-09 2019-12-10 Samsung Electronics Co., Ltd. SSD storage device

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US5852725A (en) * 1996-05-10 1998-12-22 Yen; Juei-Hsiang PCI/ISA bus single board computer card/CPU card and backplane using eisa bus connectors and eisa bus slots
US20040024940A1 (en) * 2002-07-30 2004-02-05 Tsai-Sheng Chiu Central processing unit card with accelerated graphic port
US7362589B2 (en) * 2005-01-18 2008-04-22 Hewlett-Packard Development Company, L.P. Circuit board adapted to couple to different types of add-in cards

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101634962B (zh) * 2008-07-21 2011-11-09 鸿富锦精密工业（深圳）有限公司 Pci 接口测试卡
US8081004B2 (en) 2008-07-21 2011-12-20 Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. Testing card for peripheral component interconnect interfaces
CN102141952B (zh) * 2010-02-01 2015-03-25 赛恩倍吉科技顾问（深圳）有限公司 系统管理总线测试装置
CN102298085A (zh) * 2010-06-24 2011-12-28 鸿富锦精密工业（深圳）有限公司 负载板
CN102411528A (zh) * 2010-09-21 2012-04-11 鸿富锦精密工业（深圳）有限公司 Mxm接口测试连接卡及具有该测试连接卡的测试系统
CN102735945A (zh) * 2011-04-07 2012-10-17 鸿富锦精密工业（深圳）有限公司 信号测试装置
CN109564254A (zh) * 2016-08-01 2019-04-02 恩德斯+豪斯流量技术股份有限公司 具有接触结构的电路板
US11002785B2 (en) 2016-08-01 2021-05-11 Endress+Hauser Flowtec Ag Printed circuit board with contacting arrangement
CN109992546A (zh) * 2017-12-29 2019-07-09 深圳市优必选科技有限公司 一种串口调试装置及调试方法
CN109992546B (zh) * 2017-12-29 2021-03-02 深圳市优必选科技有限公司 一种串口调试装置及调试方法

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