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CN101106118A - Chip packaging structure - Google Patents

Chip packaging structure Download PDF

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Publication number
CN101106118A
CN101106118A CNA2006100902932A CN200610090293A CN101106118A CN 101106118 A CN101106118 A CN 101106118A CN A2006100902932 A CNA2006100902932 A CN A2006100902932A CN 200610090293 A CN200610090293 A CN 200610090293A CN 101106118 A CN101106118 A CN 101106118A
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Prior art keywords
chip
contact
bonding
packaging structure
carrier
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CNA2006100902932A
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Chinese (zh)
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CN100511664C (en
Inventor
陈圣雄
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Advanced Semiconductor Engineering Inc
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Advanced Semiconductor Engineering Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05554Shape in top view being square
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4911Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
    • H01L2224/49112Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting a common bonding area on the semiconductor or solid-state body to different bonding areas outside the body, e.g. diverging wires
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

The invention discloses a chip packaging structure, which comprises a loader, a chip, a plurality of first bonding wires, a plurality of second bonding wires and a packaging colloid, wherein the loader is provided with a plurality of first connecting points and at least one second connecting point, and the chip is provided with at least one first bonding pad and at least one second bonding pad. In addition, the first bonding wires are electrically connected with the first bonding pads and the first contacts, and the second bonding wires are electrically connected with the second bonding pads and the second contacts, wherein the first bonding pads are electrically connected with at least two first contacts through at least two first bonding wires, and the second bonding pads are electrically connected with one second contact through one second bonding wire. In addition, the packaging colloid is arranged on the loader to coat the chip, the first bonding wires and the second bonding wires.

Description

芯片封装结构 Chip package structure

技术领域technical field

本发明涉及一种芯片封装结构(Chip package structure),特别是一种打线接合(Wire bonding)的芯片封装结构。The present invention relates to a chip package structure (Chip package structure), in particular to a wire bonding (Wire bonding) chip package structure.

背景技术Background technique

近年来,随着电子技术的日新月异以及半导体产业的兴起,使得更人性化、功能更佳的电子产品不断地推陈出新,并朝向轻、薄、短、小的趋势设计。在半导体产业中,集成电路(Integrated Circuits,IC)的生产主要分为三个阶段:集成电路的设计、集成电路的制作及集成电路的封装(package)等。在集成电路的封装中,裸芯片先经由晶圆(wafer)制作、电路设计、光罩制作以及切割晶圆等步骤而完成,而每一颗由晶圆切割所形成的裸芯片,经由裸芯片上之焊垫(bonding pad)与封装基材(substrate)电性连接,再以封装胶体(encapsulant)将裸芯片加以包覆,其目的在于防止裸芯片受到外界湿度影响及杂尘污染,并提供裸芯片与外部电路之间电性连接的媒介,以构成一芯片封装(Chip Package)结构。In recent years, with the rapid development of electronic technology and the rise of the semiconductor industry, electronic products that are more humane and better in function are constantly being introduced, and are designed towards the trend of light, thin, short and small. In the semiconductor industry, the production of integrated circuits (Integrated Circuits, IC) is mainly divided into three stages: integrated circuit design, integrated circuit production and integrated circuit packaging (package). In the packaging of integrated circuits, the bare chip is first completed through the steps of wafer fabrication, circuit design, photomask fabrication, and wafer cutting, and each bare chip formed by wafer cutting is passed through the bare chip The bonding pad on it is electrically connected to the packaging substrate, and then the bare chip is covered with encapsulant. The purpose is to prevent the bare chip from being affected by external humidity and dust pollution, and to provide The medium for the electrical connection between the bare chip and the external circuit to form a chip package (Chip Package) structure.

请同时参考图1A以及图1B,图1A为现有的一种芯片封装结构的示意图,图1B为图1A的芯片封装结构的俯视图。芯片封装结构100a包括一承载器110、一芯片120、多条焊线130以及一封装胶体140,其中芯片120设置于承载器110的一表面上,而芯片120上的多个焊垫122分别通过焊线130以打线接合的方式电性连接至承载器110上的多个接点112。此外,封装胶体140也设置于承载器110的表面上,且封装胶体140覆盖承载器110的多个接点112、芯片120以及连接接点112与焊垫122的多条焊线130,用以防止芯片120受到外界影响(如湿气、杂尘等),并可保护焊线130免于受到外力的破坏。另外,在承载器110具有多条导线102,其中导线102电性连接于接点112a与接点112b间。然而,当导线102断裂或在线路布局时发生错误,将导致接点112a与接点112b间的电性连接消失,即接点112b无法再从接点112a来获得芯片120所输出的信号。因此,承载座110将因而失去原有的功效。Please refer to FIG. 1A and FIG. 1B at the same time. FIG. 1A is a schematic diagram of a conventional chip packaging structure, and FIG. 1B is a top view of the chip packaging structure in FIG. 1A . The chip packaging structure 100a includes a carrier 110, a chip 120, a plurality of bonding wires 130, and an encapsulant 140, wherein the chip 120 is disposed on a surface of the carrier 110, and the plurality of bonding pads 122 on the chip 120 respectively pass through The bonding wires 130 are electrically connected to the plurality of contacts 112 on the carrier 110 by wire bonding. In addition, the encapsulant 140 is also disposed on the surface of the carrier 110, and the encapsulant 140 covers the plurality of contacts 112 of the carrier 110, the chip 120, and the plurality of bonding wires 130 connecting the contacts 112 and the pads 122 to prevent the chip from 120 is subject to external influences (such as moisture, dust, etc.), and can protect the bonding wire 130 from being damaged by external forces. In addition, the carrier 110 has a plurality of wires 102 , wherein the wires 102 are electrically connected between the contact point 112 a and the contact point 112 b. However, when the wire 102 is broken or an error occurs in the circuit layout, the electrical connection between the contact 112a and the contact 112b will disappear, that is, the contact 112b can no longer obtain the signal output by the chip 120 from the contact 112a. Therefore, the carrying seat 110 will lose its original function.

请接着参考图2,其为现有的另一种芯片封装结构的俯视图。由图1B与图2可知,芯片封装结构100b与上述的芯片封装结构100a类似,其主要差异在于:承载器110上的多个接点112与芯片120上的多个焊垫122的配设位置不同(例如未配设芯片封装结构100a中的接点112b而配设另一位置的接点112c)。在此芯片封装结构100b中,因为应线路布局的须求,须通过一导线104电性连接接点112a与接点112c。然而,接点112a与接点112c分别配设于承载器110上且相对应于芯片120的两侧,即导线104相比于导线102有难度较高的布局线路。换句话说,导线104较易有断裂或是在线路布局时发生错误的情况发生,而使得承载座110无法使用。因此,如何在导线断裂或导线的线路布局发生错误时,使接点间仍保有电性连接关系是一重要课题。Please refer to FIG. 2 , which is a top view of another conventional chip packaging structure. It can be seen from FIG. 1B and FIG. 2 that the chip packaging structure 100b is similar to the above-mentioned chip packaging structure 100a, and the main difference is that the arrangement positions of the plurality of contacts 112 on the carrier 110 and the plurality of pads 122 on the chip 120 are different. (For example, the contact 112b in the chip package structure 100a is not provided but the contact 112c at another position is provided). In the chip package structure 100b, due to the requirements of the circuit layout, a wire 104 must be used to electrically connect the contact 112a and the contact 112c. However, the contacts 112 a and 112 c are respectively disposed on the carrier 110 and correspond to two sides of the chip 120 , that is, the wire 104 has a more difficult layout circuit than the wire 102 . In other words, the wires 104 are more likely to be broken or errors occur in the circuit layout, which makes the supporting seat 110 unusable. Therefore, how to maintain the electrical connection between the contacts when the wire is broken or the wiring layout of the wire is wrong is an important issue.

发明内容Contents of the invention

本发明要解决的技术问题在于提供一种芯片封装结构,其在承载座内部中的导线断裂或导线的线路布局发生错误时,仍保有原本的功效。The technical problem to be solved by the present invention is to provide a chip packaging structure, which can still maintain the original function when the wires inside the carrier are broken or the wiring layout of the wires is wrong.

为解决上述技术问题,本发明提出一种芯片封装结构,其包括一承载器、一芯片、多条第一焊线、多条第二焊线以及一封装胶体,其中承载器具有多个第一接点以及至少一第二接点,而芯片具有至少一第一焊垫以及至少一第二焊垫。此外,第一焊线电性连接第一焊垫与第一接点,而第二焊线电性连接第二焊垫与第二接点,其中第一焊垫通过至少两条第一焊线与至少两个第一接点电性连接,而第二焊垫通过一条第二焊线与一个第二接点电性连接。另外,封装胶体则是设置于承载器上,以包覆芯片、多条第一焊线以及多条第二焊线。In order to solve the above technical problems, the present invention proposes a chip packaging structure, which includes a carrier, a chip, a plurality of first bonding wires, a plurality of second bonding wires and an encapsulant, wherein the carrier has a plurality of first contacts and at least one second contact, and the chip has at least one first pad and at least one second pad. In addition, the first welding wire is electrically connected to the first welding pad and the first contact, and the second welding wire is electrically connected to the second welding pad and the second contact, wherein the first welding pad is connected to at least two first welding pads through at least two first welding wires. The two first contacts are electrically connected, and the second welding pad is electrically connected to a second contact through a second welding wire. In addition, the encapsulation compound is disposed on the carrier to cover the chip, a plurality of first bonding wires and a plurality of second bonding wires.

依照本发明的一实施例所述,承载器例如为一线路基板,且这些第一接点与这些第二接点例如为多个连接垫。According to an embodiment of the present invention, the carrier is, for example, a circuit substrate, and the first contacts and the second contacts are, for example, a plurality of connection pads.

依照本发明的一实施例所述,承载器例如为一导线架,且这些第一接点与这些第二接点例如为多个接脚。According to an embodiment of the present invention, the carrier is, for example, a lead frame, and the first contacts and the second contacts are, for example, a plurality of pins.

依照本发明的一实施例所述,这些第一焊线例如包括一图钉状凸块以及一焊线本体,其中焊线本体例如连接于图钉状凸块上。此外,第一焊线中的图钉状凸块例如是彼此堆叠于第一焊垫上,且焊线本体与图钉状凸块的材质例如是金。According to an embodiment of the present invention, the first bonding wires include, for example, a pushpin-shaped bump and a bonding wire body, wherein the bonding wire body is connected to the pushpin-shaped bump, for example. In addition, the pushpin-shaped bumps in the first bonding wire are, for example, stacked on the first bonding pad, and the material of the bonding wire body and the pushpin-shaped bump is, for example, gold.

本发明还提出一种芯片封装结构,其包括多条焊线以及上述的承载器、芯片与封装胶体。焊线电性连接承载器的接点与芯片的焊垫,其中至少一个焊垫通过至少两条焊线而与至少两个接点电性连接。The present invention also proposes a chip packaging structure, which includes a plurality of bonding wires and the above-mentioned carrier, chip and packaging compound. The bonding wires electrically connect the contacts of the carrier and the bonding pads of the chip, wherein at least one bonding pad is electrically connected to at least two contacts through at least two bonding wires.

综上所述,在本发明的芯片封装结构中,通过至少两条焊线来电性连接至少一个焊垫与至少两个接点,使得当承载座内部中的导线断裂或导线的线路布局发生错误时,可通过焊线来使得焊垫与多个接点间仍具有电性连接,故芯片封装结构仍具有原本的功效。To sum up, in the chip packaging structure of the present invention, at least one pad and at least two contacts are electrically connected by at least two bonding wires, so that when the wire in the carrier is broken or the wiring layout of the wire is wrong , the bonding pad can still be electrically connected to the plurality of contacts through the bonding wire, so the chip packaging structure still has the original function.

采用本发明结构和制程后,由于在本发明的芯片封装结构中,可在芯片的一焊垫上电性连接多条焊线至承载座上的不同的接点,其中每一焊线是以其图钉状凸块来与焊垫相连接。相比于现有技术,本发明具有下列优点:After adopting the structure and manufacturing process of the present invention, in the chip packaging structure of the present invention, a plurality of bonding wires can be electrically connected to different contacts on the carrier on a bonding pad of the chip, wherein each bonding wire is connected with its thumbtack shaped bumps to connect to the pads. Compared with the prior art, the present invention has the following advantages:

1.当承载座内连接两接点的导线断裂或导线的线路布局发生错误时,本发明的芯片封装结构中的焊线连接方式可使得两接点间仍具有电性连接的关系。1. When the wire connecting the two contacts in the carrier is broken or the circuit layout of the wire is wrong, the bonding wire connection method in the chip packaging structure of the present invention can make the two contacts still have an electrical connection.

2.当承载座上两接点间的导线在承载座内有难度较高的线路布局时,通过本发明的芯片封装结构中的焊线连接方式可使两接点间的电性连接简单化。2. When the wiring between the two contacts on the carrier has a difficult circuit layout in the carrier, the electrical connection between the two contacts can be simplified through the bonding wire connection method in the chip packaging structure of the present invention.

3.在本发明的芯片封装结构中,每一条焊线的图钉状凸块彼此堆叠于一焊垫上以使打线机在打线时能顺利地避开芯片或已打线完成的焊线。3. In the chip packaging structure of the present invention, the thumbtack-like bumps of each bonding wire are stacked on a bonding pad so that the wire bonding machine can smoothly avoid the chip or the bonding wire that has been bonded.

附图说明Description of drawings

图1A为现有的一种芯片封装结构的示意图。FIG. 1A is a schematic diagram of a conventional chip packaging structure.

图1B为图1A的芯片封装结构的俯视图。FIG. 1B is a top view of the chip package structure in FIG. 1A .

图2为现有的另一种芯片封装结构的俯视图。FIG. 2 is a top view of another conventional chip packaging structure.

图3A为本发明第一实施例的芯片封装结构的示意图。FIG. 3A is a schematic diagram of a chip packaging structure according to a first embodiment of the present invention.

图3B为图3A的芯片封装结构的俯视图。FIG. 3B is a top view of the chip package structure in FIG. 3A .

图4为本发明第二实施例的芯片封装结构的俯视图。FIG. 4 is a top view of a chip packaging structure according to a second embodiment of the present invention.

图5为本发明第三实施例的芯片封装结构的示意图。FIG. 5 is a schematic diagram of a chip packaging structure according to a third embodiment of the present invention.

其中,附图标记说明如下:Wherein, the reference signs are explained as follows:

100a、100b、300a、300b、500:芯片封装结构100a, 100b, 300a, 300b, 500: chip package structure

102、104、302、304:导线102, 104, 302, 304: wire

110、310、510:承载器110, 310, 510: carrier

112、112a、112b、112c、512:接点112, 112a, 112b, 112c, 512: contacts

120、320、520:芯片120, 320, 520: chip

122、522:焊垫122, 522: welding pad

130、530:焊线130, 530: welding wire

140、350:封装胶体140, 350: encapsulation colloid

312、312a、312b、312c:第一接点312, 312a, 312b, 312c: first contacts

314:第二接点314: second contact

322:第一焊垫322: First welding pad

324:第二焊垫324: Second welding pad

330、330a、330b、330c、330d:第一焊线330, 330a, 330b, 330c, 330d: first welding wire

332:焊线本体332: Welding wire body

334:图钉状凸块334: Pushpin bump

340:第二焊线340: Second welding wire

具体实施方式Detailed ways

请同时参考图3A以及图3B,图3A为本发明第一实施例的芯片封装结构的示意图,图3B为图3A的芯片封装结构的俯视图。由图可知,芯片封装结构300a包括一承载器310、一芯片320、多条第一焊线330(例如是330a与330b)、多条第二焊线340以及一封装胶体350,其中芯片320例如是设置于承载器310上,而封装胶体350也设置于承载器310上,封装胶体350用以包覆芯片320、多条第一焊线330以及多条第二焊线340,以防止芯片320受到外界影响,封装胶体350则同时可保护第一焊线330与第二焊线340免于受到外力的破坏。Please refer to FIG. 3A and FIG. 3B at the same time. FIG. 3A is a schematic diagram of the chip packaging structure of the first embodiment of the present invention, and FIG. 3B is a top view of the chip packaging structure of FIG. 3A . It can be seen from the figure that the chip packaging structure 300a includes a carrier 310, a chip 320, a plurality of first bonding wires 330 (for example, 330a and 330b), a plurality of second bonding wires 340, and an encapsulant 350, wherein the chip 320 is, for example, It is arranged on the carrier 310, and the encapsulant 350 is also arranged on the carrier 310. The encapsulant 350 is used to cover the chip 320, a plurality of first bonding wires 330 and a plurality of second bonding wires 340, so as to prevent the chip 320 from The encapsulation compound 350 can protect the first bonding wire 330 and the second bonding wire 340 from being damaged by external force at the same time.

此外,本实施例的承载器310具有多个第一接点312(例如是第一接点312a与第一接点312b)以及一个或多个第二接点314,而芯片320具有一个或多个第一焊垫322以及一个或多个第二焊垫324。另外,第一焊线330用以电性连接第一焊垫322与第一接点312,而第二焊线340用以电性连接第二焊垫324与第二接点314。在本实施例中,承载器210中具有多条导线302,其中导线302电性连接于第一接点312a与第一接点312b,而第一焊垫322上同时具有第一焊线330a与330b分别电性连接于第一接点312a与第一接点312b,即第一焊垫322分别通过两条或多条第一焊线330与两个或多个第一接点312电性连接。第二焊垫324则是通过一条第二焊线340与一个第二接点314电性连接。In addition, the carrier 310 of this embodiment has a plurality of first joints 312 (such as a first joint 312a and a first joint 312b) and one or more second joints 314, and the chip 320 has one or more first solder joints. pad 322 and one or more second pads 324 . In addition, the first welding wire 330 is used for electrically connecting the first welding pad 322 and the first contact 312 , and the second welding wire 340 is used for electrically connecting the second welding pad 324 and the second contact 314 . In this embodiment, the carrier 210 has a plurality of wires 302, wherein the wires 302 are electrically connected to the first contact 312a and the first contact 312b, and the first welding pad 322 has first welding wires 330a and 330b respectively. It is electrically connected to the first contact 312a and the first contact 312b, that is, the first welding pad 322 is electrically connected to two or more first contact 312 through two or more first welding wires 330 respectively. The second bonding pad 324 is electrically connected to a second contact 314 through a second bonding wire 340 .

因此,由上文可得知,当电性连接第一接点312a与第一接点312b间的导线302断裂或导线302的线路布局发生错误时,仍可通过第一焊线330a与330b分别与第一接点312a与第一接点312b间的电性连接,来使得第一接点312a与第一接点312b间持续保有电性连接的关系。另外,本发明的承载器310也可以为一线路基板,而承载器310上的多个第一接点312与多个第二接点314则可以为多个连接垫。Therefore, it can be seen from the above that when the wire 302 electrically connected between the first contact 312a and the first contact 312b is broken or the wiring layout of the wire 302 is wrong, the first welding wire 330a and 330b can still be connected to the second wire respectively. The electrical connection between the first contact 312a and the first contact 312b is such that the electrical connection between the first contact 312a and the first contact 312b is maintained continuously. In addition, the carrier 310 of the present invention can also be a circuit substrate, and the plurality of first contacts 312 and the plurality of second contacts 314 on the carrier 310 can be a plurality of connection pads.

综上所述,为能了解上述的第一焊线330与第一焊垫322间的连结关系,故将于下文中作详细说明。请参考图3A,本发明的打线方式例如是先在第一焊垫322上形成一图钉状凸块334,接着利用打线机将一焊线本体332打线于第一接点312上,接着打线机向上拉伸一段距离,然后再转向拉线至预先形成于第一焊垫322上的图钉状凸块334,其中焊线本体332与图钉状凸块334的材质例如是金。如此一来,当打线机欲将第一焊线330重复打线于第一焊垫322与第一接点312间时,每一条第一焊线330的图钉状凸块334将彼此堆叠于第一焊垫322上。上述的打线方式将使得打线机在打线时,打线机能顺利地避开其它已打线完成的焊线或是芯片320。To sum up, in order to understand the connection relationship between the above-mentioned first bonding wire 330 and the first bonding pad 322 , it will be described in detail below. Please refer to FIG. 3A , the wire bonding method of the present invention, for example, first forms a pushpin-shaped bump 334 on the first pad 322, and then uses a wire bonding machine to bond a wire body 332 to the first contact 312, and then The wire bonder stretches upwards for a certain distance, and then turns to pull the wire to the thumbtack-shaped bump 334 preformed on the first pad 322 , wherein the bonding wire body 332 and the thumbtack-shaped bump 334 are made of gold, for example. In this way, when the wire bonder intends to repeatedly bond the first bonding wire 330 between the first bonding pad 322 and the first contact 312 , the pushpin-shaped bumps 334 of each first bonding wire 330 will be stacked on top of each other. on a pad 322 . The above wire bonding method will enable the wire bonding machine to smoothly avoid other bonding wires or chips 320 that have been bonded.

请接着参考图4,其为本发明第二实施例的芯片封装结构的俯视图。请同时参考图3B与图4,本实施例芯片封装结构300b与上述的芯片封装结构300a类似,其主要差异在于承载器310上的多个接点与芯片320上的多个焊垫的配设位置不同(例如芯片封装结构300b未配设芯片封装结构300a的第一接点312b而配设有另一位置的第一接点312c)。在芯片封装结构300b中,例如是配合线路布局的须求而通过一导线304电性连接第一接点312a与第一接点312c。第一接点312a与第一接点312c分别配设于承载器310上且相对应于芯片320的两侧,即导线304相较于芯片封装结构300a中的导线302有难度较高的线路布局。在本实施例中,第一焊垫322可通过第一焊线330c与第一焊线330d分别电性连接第一接点312c与312a。换句话说,如第一接点312c与第一接点312a间的导线304断裂或或导线304的线路布局发生错误时,仍可通过第一焊线330c与第一焊线330d来使得第一接点312c与第一接点312a间持续保有电性连接的关系。Please refer to FIG. 4 , which is a top view of a chip package structure according to a second embodiment of the present invention. Please refer to FIG. 3B and FIG. 4 at the same time. The chip packaging structure 300b of this embodiment is similar to the above-mentioned chip packaging structure 300a. The main difference lies in the arrangement positions of the multiple contacts on the carrier 310 and the multiple pads on the chip 320. different (for example, the chip package structure 300b is not provided with the first contact 312b of the chip package structure 300a but is provided with the first contact 312c at another position). In the chip package structure 300b, for example, a wire 304 is used to electrically connect the first contact 312a and the first contact 312c to meet the requirements of the circuit layout. The first contact 312a and the first contact 312c are respectively arranged on the carrier 310 and correspond to two sides of the chip 320 , that is, the wire 304 has a more difficult circuit layout than the wire 302 in the chip package structure 300a. In this embodiment, the first pad 322 can be electrically connected to the first contacts 312c and 312a respectively through the first bonding wire 330c and the first bonding wire 330d. In other words, if the wire 304 between the first contact 312c and the first contact 312a is broken or the wiring layout of the wire 304 is wrong, the first contact 312c can still be connected through the first bonding wire 330c and the first bonding wire 330d. The electrical connection with the first contact 312a is maintained continuously.

上述的芯片封装结构300a与300b通过第一焊线330来电性连接第一接点312与第一焊垫322,以及通过第二焊线340来电性连接第二接点314与第二焊垫324。值得注意的是,在其它种类的芯片封装结构中,可通过一种焊线来电性连接承载器上的接点与芯片上的焊垫。图5为本发明第三实施例的芯片封装结构的示意图。请同时参考图3与图5,芯片封装结构500与第一实施例的芯片封装结构300a类似,惟其主要差异在于:本实施例的芯片封装结构500仅通过一种焊线530来电性连接承载器510上的接点512与芯片520上的焊垫522。因此,芯片封装结构500具有更简单的芯片封装制程。The aforementioned chip packaging structures 300 a and 300 b are electrically connected to the first contact 312 and the first bonding pad 322 through the first bonding wire 330 , and are electrically connected to the second contact 314 and the second bonding pad 324 through the second bonding wire 340 . It should be noted that in other types of chip packaging structures, a bonding wire can be used to electrically connect the contacts on the carrier and the pads on the chip. FIG. 5 is a schematic diagram of a chip packaging structure according to a third embodiment of the present invention. Please refer to FIG. 3 and FIG. 5 at the same time. The chip packaging structure 500 is similar to the chip packaging structure 300a of the first embodiment, but the main difference is that the chip packaging structure 500 of this embodiment only uses a bonding wire 530 to electrically connect the carrier. Contact 512 on chip 510 and bonding pad 522 on chip 520 . Therefore, the chip packaging structure 500 has a simpler chip packaging process.

以上所述仅为本发明其中的较佳实施例而已,并非用来限定本发明的实施范围;即凡依本发明权利要求所作的均等变化与修饰,皆为本发明专利范围所涵盖。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the implementation scope of the present invention; that is, all equivalent changes and modifications made according to the claims of the present invention are covered by the patent scope of the present invention.

Claims (10)

1. a chip-packaging structure is characterized in that, this chip-packaging structure comprises:
One carrier has a plurality of first contacts and at least one second contact;
One chip has at least one first weld pad and at least one second weld pad;
Many first bonding wires, it electrically connects this first weld pad and this first contact, and wherein this first weld pad electrically connects by at least two first bonding wires and two first contacts at least;
Many second bonding wires, it electrically connects this second weld pad and this second contact, and wherein this second weld pad electrically connects by one second bonding wire and one second contact; And
One packing colloid, it is arranged on this carrier, to coat this chip, described first bonding wire and described second bonding wire.
2. chip-packaging structure as claimed in claim 1 is characterized in that, this carrier is a circuit base plate, and described first contact and described second contact are a plurality of connection gaskets (connecting pad).
3. chip-packaging structure as claimed in claim 1 is characterized in that, this carrier is a lead frame, and described first contact and described second contact are a plurality of pins (lead).
4. chip-packaging structure as claimed in claim 1 is characterized in that, described each first bonding wire comprises:
One figure spike projection; And
One bonding wire body is connected on this figure spike projection.
5. chip-packaging structure as claimed in claim 4 is characterized in that, the described figure spike projection in described first bonding wire is stacked on this first weld pad each other.
6. chip-packaging structure as claimed in claim 4 is characterized in that, the material of this figure spike projection comprises gold.
7. chip-packaging structure as claimed in claim 4 is characterized in that the material of this bonding wire body comprises gold.
8. a chip-packaging structure is characterized in that, this chip-packaging structure comprises:
One carrier has a plurality of contacts;
One chip has a plurality of weld pads;
Many bonding wires, it electrically connects described weld pad and described contact, and wherein at least one weld pad electrically connects with at least two contacts by at least two bonding wires; And
One packing colloid, it is arranged on this carrier, to coat this chip and described bonding wire.
9. chip-packaging structure as claimed in claim 8 is characterized in that, this carrier is a circuit base plate, and described contact is a plurality of connection gaskets (connecting pad).
10. chip-packaging structure as claimed in claim 8 is characterized in that, this carrier is a lead frame, and described contact is a plurality of pins (lead).
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Cited By (2)

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Publication number Priority date Publication date Assignee Title
WO2015149462A1 (en) * 2014-04-04 2015-10-08 利亚德光电股份有限公司 Wafer circuit
WO2024012033A1 (en) * 2022-07-12 2024-01-18 天芯互联科技有限公司 Packaging method and package body

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JP3294490B2 (en) * 1995-11-29 2002-06-24 株式会社日立製作所 BGA type semiconductor device
JP3695314B2 (en) * 2000-04-06 2005-09-14 株式会社デンソー Insulated gate type power IC
CN1216423C (en) * 2001-12-26 2005-08-24 矽品精密工业股份有限公司 Semiconductor device and its manufacturing method
TWI224386B (en) * 2003-07-22 2004-11-21 Via Tech Inc Multi-row wire bonding structure for high frequency integrated circuit
TW200520121A (en) * 2003-08-28 2005-06-16 Gct Semiconductor Inc Integrated circuit package having an inductance loop formed from a multi-loop configuration
US7078792B2 (en) * 2004-04-30 2006-07-18 Atmel Corporation Universal interconnect die

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015149462A1 (en) * 2014-04-04 2015-10-08 利亚德光电股份有限公司 Wafer circuit
WO2024012033A1 (en) * 2022-07-12 2024-01-18 天芯互联科技有限公司 Packaging method and package body

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