BRPI0812099A2 - Dispositivo apresentado uma estrutura em membrana para detenção de radiação térmica, método de produção e uso do dispositivo. - Google Patents
Dispositivo apresentado uma estrutura em membrana para detenção de radiação térmica, método de produção e uso do dispositivo.Info
- Publication number
- BRPI0812099A2 BRPI0812099A2 BRPI0812099A BRPI0812099A2 BR PI0812099 A2 BRPI0812099 A2 BR PI0812099A2 BR PI0812099 A BRPI0812099 A BR PI0812099A BR PI0812099 A2 BRPI0812099 A2 BR PI0812099A2
- Authority
- BR
- Brazil
- Prior art keywords
- production
- thermal radiation
- membrane structure
- presented
- detention
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0205—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0225—Shape of the cavity itself or of elements contained in or suspended over the cavity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0225—Shape of the cavity itself or of elements contained in or suspended over the cavity
- G01J5/023—Particular leg structure or construction or shape; Nanotubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/041—Mountings in enclosures or in a particular environment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/04—Casings
- G01J5/041—Mountings in enclosures or in a particular environment
- G01J5/045—Sealings; Vacuum enclosures; Encapsulated packages; Wafer bonding structures; Getter arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
- G01J5/14—Electrical features thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J5/22—Electrical features thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/34—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J2005/202—Arrays
- G01J2005/204—Arrays prepared by semiconductor processing, e.g. VLSI
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/20—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
- H10N30/204—Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators using bending displacement, e.g. unimorph, bimorph or multimorph cantilever or membrane benders
- H10N30/2047—Membrane type
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
- Micromachines (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE200710024902 DE102007024902B8 (de) | 2007-05-29 | 2007-05-29 | Vorrichtung mit Membranstruktur zur Detektion von Wärmestrahlung, Verfahren zum Herstellen und Verwendung der Vorrichtung |
DE102007024902.2 | 2007-05-29 | ||
PCT/EP2008/004246 WO2008145353A1 (de) | 2007-05-29 | 2008-05-28 | Vorrichtung mit membranstruktur zur detektion von wärmestrahlung, verfahren zum herstellen und verwendung der vorrichtung |
Publications (2)
Publication Number | Publication Date |
---|---|
BRPI0812099A2 true BRPI0812099A2 (pt) | 2014-11-25 |
BRPI0812099B1 BRPI0812099B1 (pt) | 2018-06-19 |
Family
ID=39708794
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0812099-4A BRPI0812099B1 (pt) | 2007-05-29 | 2008-05-28 | Dispositivo apresentado uma estrutura em membrana para detecção de radiação térmica, método de produção e uso do dispositivo. |
Country Status (10)
Country | Link |
---|---|
US (1) | US9279730B2 (pt) |
EP (1) | EP2153187B1 (pt) |
JP (1) | JP2010528300A (pt) |
KR (1) | KR101612400B1 (pt) |
CN (1) | CN101688810B (pt) |
AU (1) | AU2008256413B2 (pt) |
BR (1) | BRPI0812099B1 (pt) |
DE (1) | DE102007024902B8 (pt) |
RU (1) | RU2468346C2 (pt) |
WO (1) | WO2008145353A1 (pt) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102009017845B4 (de) | 2009-04-17 | 2011-07-21 | Pyreos Ltd. | Infrarotlichtsensor mit hoher Signalspannung und hohem Signal-Rausch-Verhältnis, sowie Infrarotlichtdetektor mit dem Infrarotlichtsensor |
DE102009060217B3 (de) * | 2009-12-23 | 2011-06-22 | Pyreos Ltd. | Verfahren zum Herstellen eines Infrarotlichtdetektors |
DE102010012701B4 (de) | 2010-03-24 | 2013-10-17 | Bundesrepublik Deutschland, vertr.d.d. Bundesministerium für Wirtschaft und Technologie, d.vertr.d.d. Präsidenten der Physikalisch-Technischen Bundesanstalt | Mikrokraftsensor |
DE102012216618A1 (de) | 2012-09-18 | 2014-03-20 | Robert Bosch Gmbh | Anordnung von mindestens zwei Wafern zum Detektieren von elektromagnetischer Strahlung und Verfahren zum Herstellen der Anordnung |
DE102012217881A1 (de) * | 2012-10-01 | 2014-04-03 | Siemens Aktiengesellschaft | Sensoranordnung und Herstellungsverfahren |
DE102013204763A1 (de) * | 2013-03-19 | 2014-09-25 | Robert Bosch Gmbh | Mikromechanische Sensorvorrichtung und entsprechendes Herstellungsverfahren |
CN107771272B (zh) * | 2015-06-01 | 2021-04-27 | 首尔伟傲世有限公司 | 光检测元件以及电子装置 |
CN108827676B (zh) * | 2018-04-25 | 2020-12-11 | 合肥美的电冰箱有限公司 | 散热测量系统及其方法、控制装置 |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
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US4044251A (en) * | 1976-05-18 | 1977-08-23 | Minnesota Mining And Manufacturing Company | Electromagnetic radiation detector with large area sensing medium |
JPH01308927A (ja) * | 1988-06-07 | 1989-12-13 | Matsushita Electric Ind Co Ltd | 焦電形赤外検出素子アレイ、焦電形赤外検出器およびその製法 |
GB9009117D0 (en) * | 1990-04-24 | 1990-08-08 | Emi Plc Thorn | Pyroelectric detector and method of manufacturing the same |
JP3200657B2 (ja) * | 1992-04-30 | 2001-08-20 | テルモ株式会社 | 赤外線センサ |
JPH07128140A (ja) * | 1993-10-29 | 1995-05-19 | Matsushita Electric Works Ltd | 赤外線検出素子 |
JPH09506712A (ja) * | 1993-12-13 | 1997-06-30 | ハネウエル・インコーポレーテッド | 赤外線デバイス用集積シリコン真空マイクロパッケージ |
DE19525071A1 (de) | 1995-07-10 | 1997-01-16 | Siemens Ag | Pyroelektrisches Bauelement und Verfahren zur Herstellung |
JP3399399B2 (ja) * | 1999-04-14 | 2003-04-21 | 株式会社村田製作所 | 赤外線センサ及びその製造方法 |
DE19932308C2 (de) * | 1999-07-10 | 2001-10-25 | Bosch Gmbh Robert | Sensor, insbesondere Thermosensor |
DE10004216C2 (de) | 2000-02-01 | 2002-09-19 | Siemens Ag | Vorrichtung zur Detektion von Wärmestrahlung und Verwendung der Vorrichtung |
JP2001326367A (ja) * | 2000-05-12 | 2001-11-22 | Denso Corp | センサおよびその製造方法 |
DE10042945A1 (de) | 2000-08-31 | 2002-03-28 | Siemens Ag | Bauelement für Sensoren mit integrierter Elektronik und Verfahren zu seiner Herstellung, sowie Sensor mit integrierter Elektronik |
DE10058861A1 (de) * | 2000-11-27 | 2002-06-13 | Siemens Ag | Infrarotsensor für hochauflösende Infrarot-Detektoranordnungen und Verfahren zu seiner Herstellung |
JP3519720B2 (ja) | 2001-06-11 | 2004-04-19 | 松下電器産業株式会社 | 電子デバイス |
JP3604130B2 (ja) * | 2001-12-04 | 2004-12-22 | 株式会社アイ・エイチ・アイ・エアロスペース | 熱型赤外線検出素子およびその製造方法ならびに熱型赤外線検出素子アレイ |
JP2004093535A (ja) * | 2002-09-04 | 2004-03-25 | Mitsubishi Electric Corp | 熱型赤外線固体撮像装置およびその製造方法 |
US6902759B2 (en) * | 2002-09-12 | 2005-06-07 | Innovaquartz Incorporated | Technique for coating or marking glass strands |
FR2844635B1 (fr) * | 2002-09-16 | 2005-08-19 | Commissariat Energie Atomique | Dispositif detecteur de rayonnement electromagnetique avec boitier integre comportant deux detecteurs superposes |
JP2004239708A (ja) * | 2003-02-05 | 2004-08-26 | Mitsubishi Electric Corp | 赤外線検出装置およびその製造方法 |
KR100538996B1 (ko) * | 2003-06-19 | 2005-12-27 | 한국전자통신연구원 | 적외선 흡수층으로 실리콘 산화막을 사용한 적외선 센서및 그 제조 방법 |
DE10327694A1 (de) * | 2003-06-20 | 2005-01-05 | Robert Bosch Gmbh | Optische Sensoranordnung und entsprechendes Herstellungsverfahren |
RU2258207C1 (ru) * | 2004-01-09 | 2005-08-10 | Федеральное государственное унитарное предприятие "Научно-производственное предприятие "Исток" | Болометрический резистивный элемент |
JP2005241457A (ja) * | 2004-02-26 | 2005-09-08 | Hamamatsu Photonics Kk | 赤外線センサ及びその製造方法 |
FR2867273B1 (fr) * | 2004-03-04 | 2006-09-08 | Commissariat Energie Atomique | Procede de realisation d'un dispositif pour la detection thermique d'un rayonnement comportant un microbolometre actif et un microbolometre passif |
JP4385255B2 (ja) * | 2004-06-10 | 2009-12-16 | 日本電気株式会社 | ボロメータ型赤外線検出器及び残像の低減方法 |
JP2005043381A (ja) * | 2004-10-18 | 2005-02-17 | Nec Corp | 熱型赤外線検出器およびその製造方法 |
US7718967B2 (en) * | 2005-01-26 | 2010-05-18 | Analog Devices, Inc. | Die temperature sensors |
FR2883417B1 (fr) * | 2005-03-16 | 2007-05-11 | Ulis Soc Par Actions Simplifie | Detecteur bolometrique, dispositif de detection infrarouge mettant en oeuvre un tel detecteur et procede de fabrication de ce detecteur |
JP2008544263A (ja) * | 2005-06-27 | 2008-12-04 | エイチエル−プラナー・テクニク・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング | 電磁波検出用装置及びそのような装置製造のための方法 |
WO2007054111A1 (de) * | 2005-11-10 | 2007-05-18 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Sensor zum erfassen einer elektromagnetischen strahlung |
-
2007
- 2007-05-29 DE DE200710024902 patent/DE102007024902B8/de not_active Expired - Fee Related
-
2008
- 2008-05-28 EP EP20080758829 patent/EP2153187B1/de not_active Not-in-force
- 2008-05-28 US US12/601,556 patent/US9279730B2/en not_active Expired - Fee Related
- 2008-05-28 JP JP2010509728A patent/JP2010528300A/ja active Pending
- 2008-05-28 BR BRPI0812099-4A patent/BRPI0812099B1/pt not_active IP Right Cessation
- 2008-05-28 AU AU2008256413A patent/AU2008256413B2/en not_active Ceased
- 2008-05-28 RU RU2009144001/28A patent/RU2468346C2/ru not_active IP Right Cessation
- 2008-05-28 KR KR1020097027210A patent/KR101612400B1/ko not_active Expired - Fee Related
- 2008-05-28 CN CN2008800235048A patent/CN101688810B/zh not_active Expired - Fee Related
- 2008-05-28 WO PCT/EP2008/004246 patent/WO2008145353A1/de active Application Filing
Also Published As
Publication number | Publication date |
---|---|
DE102007024902A1 (de) | 2008-12-11 |
DE102007024902B4 (de) | 2010-08-26 |
EP2153187A1 (de) | 2010-02-17 |
US20110006211A1 (en) | 2011-01-13 |
CN101688810B (zh) | 2013-09-18 |
DE102007024902B8 (de) | 2010-12-30 |
BRPI0812099B1 (pt) | 2018-06-19 |
RU2468346C2 (ru) | 2012-11-27 |
RU2009144001A (ru) | 2011-07-10 |
WO2008145353A1 (de) | 2008-12-04 |
AU2008256413B2 (en) | 2013-09-12 |
KR101612400B1 (ko) | 2016-04-14 |
KR20100023007A (ko) | 2010-03-03 |
US9279730B2 (en) | 2016-03-08 |
AU2008256413A1 (en) | 2008-12-04 |
JP2010528300A (ja) | 2010-08-19 |
EP2153187B1 (de) | 2013-01-16 |
CN101688810A (zh) | 2010-03-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
B16A | Patent or certificate of addition of invention granted [chapter 16.1 patent gazette] | ||
B21F | Lapse acc. art. 78, item iv - on non-payment of the annual fees in time |
Free format text: REFERENTE A 12A ANUIDADE. |
|
B24J | Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12) |
Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2594 DE 24-09-2020 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |