ATE525498T1 - Verfahren zum ziehen von beta-ga2o3 einkristallen - Google Patents
Verfahren zum ziehen von beta-ga2o3 einkristallenInfo
- Publication number
- ATE525498T1 ATE525498T1 AT04711454T AT04711454T ATE525498T1 AT E525498 T1 ATE525498 T1 AT E525498T1 AT 04711454 T AT04711454 T AT 04711454T AT 04711454 T AT04711454 T AT 04711454T AT E525498 T1 ATE525498 T1 AT E525498T1
- Authority
- AT
- Austria
- Prior art keywords
- single crystals
- light
- ga2o3 single
- type
- growing beta
- Prior art date
Links
- 239000013078 crystal Substances 0.000 title abstract 3
- 229910005191 Ga 2 O 3 Inorganic materials 0.000 abstract 2
- 239000002019 doping agent Substances 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/34—Single-crystal growth by zone-melting; Refining by zone-melting characterised by the seed, e.g. by its crystallographic orientation
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02414—Oxide semiconducting materials not being Group 12/16 materials, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/02433—Crystal orientation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02565—Oxide semiconducting materials not being Group 12/16 materials, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02631—Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/817—Bodies characterised by the crystal structures or orientations, e.g. polycrystalline, amorphous or porous
- H10H20/818—Bodies characterised by the crystal structures or orientations, e.g. polycrystalline, amorphous or porous within the light-emitting regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Materials Engineering (AREA)
- Power Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Led Devices (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003046552A JP4630986B2 (ja) | 2003-02-24 | 2003-02-24 | β−Ga2O3系単結晶成長方法 |
JP2003066020A JP4565062B2 (ja) | 2003-03-12 | 2003-03-12 | 薄膜単結晶の成長方法 |
JP2003137916A JP4020314B2 (ja) | 2003-05-15 | 2003-05-15 | Ga2O3系発光素子およびその製造方法 |
PCT/JP2004/001653 WO2004074556A2 (ja) | 2003-02-24 | 2004-02-16 | β‐Ga2O3系単結晶成長方法、薄膜単結晶の成長方法、Ga2O3系発光素子およびその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE525498T1 true ATE525498T1 (de) | 2011-10-15 |
Family
ID=32912842
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT04711454T ATE525498T1 (de) | 2003-02-24 | 2004-02-16 | Verfahren zum ziehen von beta-ga2o3 einkristallen |
Country Status (8)
Country | Link |
---|---|
US (4) | US7393411B2 (de) |
EP (3) | EP2273569A3 (de) |
KR (1) | KR100787272B1 (de) |
AT (1) | ATE525498T1 (de) |
CA (1) | CA2517024C (de) |
RU (1) | RU2313623C2 (de) |
TW (3) | TW201242901A (de) |
WO (1) | WO2004074556A2 (de) |
Families Citing this family (68)
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EP2273569A3 (de) * | 2003-02-24 | 2011-03-02 | Waseda University | B-Ga203-lichtemittierende Vorrichtung und Herstellungsverfahren dafür |
JP2005235961A (ja) * | 2004-02-18 | 2005-09-02 | Univ Waseda | Ga2O3系単結晶の導電率制御方法 |
JP4803634B2 (ja) * | 2004-10-01 | 2011-10-26 | 学校法人早稲田大学 | p型Ga2O3膜の製造方法およびpn接合型Ga2O3膜の製造方法 |
US7829444B2 (en) * | 2004-11-10 | 2010-11-09 | Canon Kabushiki Kaisha | Field effect transistor manufacturing method |
JP5003013B2 (ja) * | 2006-04-25 | 2012-08-15 | 株式会社日立製作所 | シリコン発光ダイオード、シリコン光トランジスタ、シリコンレーザー及びそれらの製造方法。 |
JP5529420B2 (ja) * | 2009-02-09 | 2014-06-25 | 住友電気工業株式会社 | エピタキシャルウエハ、窒化ガリウム系半導体デバイスを作製する方法、窒化ガリウム系半導体デバイス、及び酸化ガリウムウエハ |
US8529802B2 (en) * | 2009-02-13 | 2013-09-10 | Samsung Electronics Co., Ltd. | Solution composition and method of forming thin film and method of manufacturing thin film transistor using the solution composition |
KR101664958B1 (ko) | 2009-04-09 | 2016-10-12 | 삼성전자주식회사 | 산화물 박막 형성용 용액 조성물 및 상기 산화물 박막을 포함하는 전자 소자 |
US8319300B2 (en) | 2009-04-09 | 2012-11-27 | Samsung Electronics Co., Ltd. | Solution composition for forming oxide thin film and electronic device including the oxide thin film |
WO2011074407A1 (en) | 2009-12-18 | 2011-06-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR100969127B1 (ko) | 2010-02-18 | 2010-07-09 | 엘지이노텍 주식회사 | 발광 소자, 발광 소자 제조방법 및 발광 소자 패키지 |
US9187815B2 (en) * | 2010-03-12 | 2015-11-17 | United Technologies Corporation | Thermal stabilization of coating material vapor stream |
JP2011061225A (ja) * | 2010-11-01 | 2011-03-24 | Waseda Univ | pn型Ga2O3膜の製造方法 |
EP3088374B1 (de) * | 2010-12-20 | 2018-09-05 | Tosoh Corporation | Galliumnitrid-formartikel und verfahren zur herstellung davon |
USD647870S1 (en) | 2010-12-28 | 2011-11-01 | Samsung Electronics Co., Ltd. | Portable telephone |
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WO2013035845A1 (ja) * | 2011-09-08 | 2013-03-14 | 株式会社タムラ製作所 | Ga2O3系半導体素子 |
WO2013035465A1 (ja) * | 2011-09-08 | 2013-03-14 | 株式会社タムラ製作所 | Ga2O3系単結晶体のドナー濃度制御方法 |
JP5612216B2 (ja) * | 2011-09-08 | 2014-10-22 | 株式会社タムラ製作所 | 結晶積層構造体及びその製造方法 |
US9437689B2 (en) * | 2011-09-08 | 2016-09-06 | Tamura Corporation | Ga2O3 semiconductor element |
US9142623B2 (en) | 2011-09-08 | 2015-09-22 | Tamura Corporation | Substrate for epitaxial growth, and crystal laminate structure |
JP2013102081A (ja) | 2011-11-09 | 2013-05-23 | Tamura Seisakusho Co Ltd | ショットキーバリアダイオード |
JP5491483B2 (ja) * | 2011-11-15 | 2014-05-14 | 株式会社タムラ製作所 | β−Ga2O3系単結晶の成長方法 |
EP2800128A4 (de) * | 2011-11-29 | 2015-02-25 | Tamura Seisakusho Kk | Verfahren zur herstellung eines ga2o3-kristallfilms |
JP5756075B2 (ja) * | 2012-11-07 | 2015-07-29 | 株式会社タムラ製作所 | β−Ga2O3系単結晶の育成方法 |
JP5536920B1 (ja) | 2013-03-04 | 2014-07-02 | 株式会社タムラ製作所 | Ga2O3系単結晶基板、及びその製造方法 |
JP5788925B2 (ja) | 2013-04-04 | 2015-10-07 | 株式会社タムラ製作所 | β−Ga2O3系単結晶の成長方法 |
JP5984069B2 (ja) * | 2013-09-30 | 2016-09-06 | 株式会社タムラ製作所 | β−Ga2O3系単結晶膜の成長方法、及び結晶積層構造体 |
JP5892495B2 (ja) | 2013-12-24 | 2016-03-23 | 株式会社タムラ製作所 | Ga2O3系結晶膜の成膜方法、及び結晶積層構造体 |
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JP5907465B2 (ja) * | 2014-08-29 | 2016-04-26 | 株式会社タムラ製作所 | 半導体素子及び結晶積層構造体 |
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JP2025500012A (ja) | 2021-11-10 | 2025-01-07 | シランナ・ユー・ブイ・テクノロジーズ・プライベート・リミテッド | エピタキシャル酸化物材料、構造、及びデバイス |
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-
2004
- 2004-02-16 EP EP10011746A patent/EP2273569A3/de not_active Withdrawn
- 2004-02-16 KR KR1020057015608A patent/KR100787272B1/ko not_active IP Right Cessation
- 2004-02-16 RU RU2005126721/15A patent/RU2313623C2/ru not_active IP Right Cessation
- 2004-02-16 EP EP10011745.6A patent/EP2267194B1/de not_active Expired - Lifetime
- 2004-02-16 CA CA002517024A patent/CA2517024C/en not_active Expired - Fee Related
- 2004-02-16 AT AT04711454T patent/ATE525498T1/de not_active IP Right Cessation
- 2004-02-16 US US10/546,484 patent/US7393411B2/en not_active Expired - Fee Related
- 2004-02-16 EP EP04711454A patent/EP1598450B1/de not_active Expired - Lifetime
- 2004-02-16 WO PCT/JP2004/001653 patent/WO2004074556A2/ja active Application Filing
- 2004-02-18 TW TW101114968A patent/TW201242901A/zh unknown
- 2004-02-18 TW TW093103898A patent/TWI370804B/zh not_active IP Right Cessation
- 2004-02-18 TW TW100131316A patent/TWI450865B/zh not_active IP Right Cessation
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2008
- 2008-06-12 US US12/155,991 patent/US7713353B2/en active Active
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2010
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Also Published As
Publication number | Publication date |
---|---|
EP1598450A2 (de) | 2005-11-23 |
EP2267194A2 (de) | 2010-12-29 |
RU2313623C2 (ru) | 2007-12-27 |
KR100787272B1 (ko) | 2007-12-20 |
US20120304918A1 (en) | 2012-12-06 |
TW200424128A (en) | 2004-11-16 |
TWI450865B (zh) | 2014-09-01 |
US8262796B2 (en) | 2012-09-11 |
CA2517024A1 (en) | 2004-09-02 |
US8747553B2 (en) | 2014-06-10 |
US20060150891A1 (en) | 2006-07-13 |
US7713353B2 (en) | 2010-05-11 |
TWI370804B (en) | 2012-08-21 |
EP2267194B1 (de) | 2013-04-17 |
EP2273569A3 (de) | 2011-03-02 |
TW201242901A (en) | 2012-11-01 |
RU2005126721A (ru) | 2006-02-10 |
US20100229789A1 (en) | 2010-09-16 |
EP2267194A3 (de) | 2011-10-19 |
CA2517024C (en) | 2009-12-01 |
KR20060007366A (ko) | 2006-01-24 |
EP1598450A4 (de) | 2008-04-23 |
EP2273569A2 (de) | 2011-01-12 |
TW201144227A (en) | 2011-12-16 |
US20080265264A1 (en) | 2008-10-30 |
EP1598450B1 (de) | 2011-09-21 |
US7393411B2 (en) | 2008-07-01 |
WO2004074556A2 (ja) | 2004-09-02 |
WO2004074556A3 (ja) | 2004-11-11 |
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